Search results for "Testing"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
37	Paul Ammann, Jeff Offutt, Wuzhi Xu	Coverage Criteria for State Based Specifications.	Formal Methods and Testing	2008	DBLP DOI BibTeX RDF
37	A. Jefferson Offutt	The Coupling Effect: Fact or Fiction.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
36	Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.	VTS	1997	DBLP DOI BibTeX RDF	semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing
35	Koushik Sen, Darko Marinov, Gul Agha	CUTE: a concolic unit testing engine for C.	ESEC/SIGSOFT FSE	2005	DBLP DOI BibTeX RDF	data structure testing, explicit path model-checking, random testing, unit testing, testing C programs, concolic testing
35	Yuyun Liao, D. M. H. Walker	Optimal voltage testing for physically-based faults.	VTS	1996	DBLP DOI BibTeX RDF	optimal voltage testing, physically-based faults, resistive bridges, gate outputs, pattern sensitive functional faults, transmission gates, fault diagnosis, logic testing, delays, integrated circuit testing, automatic testing, fault coverage, CMOS logic circuits, delay faults, Iddq tests, CMOS circuits, logic gates, test vector, noise margin, selection strategy, low-voltage testing, integrated circuit noise
35	Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams	On the decline of testing efficiency as fault coverage approaches 100%.	VTS	1995	DBLP DOI BibTeX RDF	single stuck-at fault model, ISCAS benchmark circuits, nontarget defects, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, manufacturing process, test quality, production testing, testing efficiency, circuit sizes
35	Meng-Lieh Sheu, Chung-Len Lee 0001	A programmable multiple-sequence generator for BIST applications.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	programmable multiple-sequence generator, BIST applications, two-dimension-like feedback shift register, deterministic sequence, pseudo-random vectors, sequence segmentation method, stuck-open fault testing, logic testing, delays, built-in self test, sequential circuits, shift registers, delay fault testing, binary sequences, sequential circuit testing, regular structure, MCM testing
35	Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour	An approach for system tests design and its application.	VTS	1995	DBLP DOI BibTeX RDF	system test design, control testing table, testing processor, correctness problem, polynomial complexity algorithm, software system design, microcode synthesis, CAD system testing, performance evaluation, performance evaluation, program testing, mathematical model, multicomputer systems, computer testing, multi-user systems
35	Phyllis G. Frankl, Stewart N. Weiss	An Experimental Comparison of the Effectiveness of Branch Testing and Data Flow Testing.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	error exposing ability, all-edges test data adequacy criteria, software testing experiments, executable edges, definition-use associations, all-uses adequate test sets, program testing, errors, regression analysis, data flow testing, branch testing
35	Anthony J. H. Simons	JWalk: a tool for lazy, systematic testing of java classes by design introspection and user interaction.	Autom. Softw. Eng.	2007	DBLP DOI BibTeX RDF	Algebraic testing, Lazy specification, Lazy systematic testing, Operational abstraction, JWalk, Unit testing, Agile methods, JUnit, State-based testing
35	Laisa H. O. do Nascimento, Patrícia D. L. Machado	An experimental evaluation of approaches to feature testing in the mobile phone applications domain.	DOSTA	2007	DBLP DOI BibTeX RDF	GQM paradigm, exploratory testing, feature testing, software testing, model-based testing
35	Chen-Huan Chiang, Sandeep K. Gupta 0001	BIST TPG for SRAM cluster interconnect testing at board level.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	SRAM cluster interconnect testing, BIST TPG, static random access memory, board-level interconnects, test pattern generation architecture, IEEE 1149.1 boundary scan architecture, prohibited conditions, testable SRAM cluster interconnect fault detection, logic testing, built-in self test, automatic test pattern generation, test pattern generation, boundary scan testing, integrated circuit interconnections, SRAM chips, printed circuit testing
35	Tsong Yueh Chen, Yuen-Tak Yu	More on the E-measure of Subdomain Testing Strategies.	Australian Software Engineering Conference	1996	DBLP DOI BibTeX RDF	subdomain testing, software testing, random testing, Partition testing
35	Wei-Kang Huang, Fabrizio Lombardi	An approach for testing programmable/configurable field programmable gate arrays.	VTS	1996	DBLP DOI BibTeX RDF	behavioral characterization, single fault detection, disjoint one-dimensional arrays, unilateral horizontal connections, common vertical input lines, array testing, logic blocks, field programmable gate arrays, field programmable gate arrays, VLSI, logic testing, integrated circuit testing, stuck-at fault, FPGA testing, functional fault, hybrid fault model
35	Eckard Bringmann, Andreas Krämer	Model-Based Testing of Automotive Systems.	ICST	2008	DBLP DOI BibTeX RDF	continuous behavior testing, closed loop testing, Model-based testing, test automation, automotive systems
35	Bernhard K. Aichernig, Jifeng He 0001	Mutation testing in UTP.	Formal Aspects Comput.	2009	DBLP DOI BibTeX RDF	Unifying theories of programming, Algebra of programming, Specification-based testing, Mutation testing, Refinement calculus, Fault-based testing
35	Lee J. White, Brian Robinson	Industrial Real-Time Regression Testing and Analysis Using Firewalls.	ICSM	2004	DBLP DOI BibTeX RDF	Testing Firewall, Software Testing, Deadlock, Regression Testing, Software Defects, Real-Time Software
35	Juichi Takahashi, Yoshiaki Kakuda	Effective Automated Testing: A Solution of Graphical Object Verification.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	Software testing, automated testing, printing, GUI testing
35	Sami Beydeda, Volker Gruhn	Integrating White- and Black-Box Techniques for Class-Level Regression Testing.	COMPSAC	2001	DBLP DOI BibTeX RDF	Integrated White- and Black-Box Testing, Class-level Testing, Regression Testing
35	Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Tillmann, Víctor A. Braberman	Achieving both model and code coverage with automated gray-box testing.	A-MOST	2007	DBLP DOI BibTeX RDF	concolic execution, parameterized unit testing, model-based testing, symbolic execution, test-case generation
35	Philip Mayer, Daniel Lübke	Towards a BPEL unit testing framework.	TAV-WEB	2006	DBLP DOI BibTeX RDF	BPELUnit, testing, composition, BPEL, unit testing, orchestration
35	Fabiano Cutigi Ferrari, José Carlos Maldonado, Awais Rashid	Mutation Testing for Aspect-Oriented Programs.	ICST	2008	DBLP DOI BibTeX RDF	Aspect-Oriented testing, AO fault types, Mutation testing, mutation operators
35	Dick Hamlet	Subdomain testing of units and systems with state.	ISSTA	2006	DBLP DOI BibTeX RDF	persistent state, unit/system testing, testing theory
35	Harry M. Sneed	Testing a Datawarehouse - An Industrial Challenge.	TAIC PART	2006	DBLP DOI BibTeX RDF	Datawarehouse Testing, Data Transformation Rules, Post Conditions Assertions, Formal Verification, System Testing
35	Tom Chen 0001, Anneliese von Mayrhauser, Amjad Hajjar, Charles Anderson 0001, Mehmet Sahinoglu	How Much Testing is Enough? Applying Stopping Rules to Behavioral Model Testing.	HASE	1999	DBLP DOI BibTeX RDF	Behavioral Model Testing, Compound Poisson, Effort-Domain, Empirical Bayesian Analysis, Negative Binomial Distribution (NBD), Poisson LSD, Testing Strategy, Stopping Rule
35	Rupak Majumdar, Koushik Sen	Hybrid Concolic Testing.	ICSE	2007	DBLP DOI BibTeX RDF	directed random testing, concolic testing
35	Bixin Li, Yancheng Wang, Lili Yang	An Integrated Regression Testing Framework to Multi-Threaded Java Programs.	SET	2006	DBLP DOI BibTeX RDF	Regression testing, Multi-threaded program, Reachability testing
35	Stefan Wappler, Frank Lammermann	Using evolutionary algorithms for the unit testing of object-oriented software.	GECCO	2005	DBLP DOI BibTeX RDF	chaining approach, multi-level optimization, evolutionary testing, object-oriented testing, automated test case generation
35	Noritaka Kobayashi, Tatsuhiro Tsuchiya, Tohru Kikuno	Applicability of Non-Specification-Based Approaches to Logic Testing for Software.	DSN	2001	DBLP DOI BibTeX RDF	factor covering design, software testing, logic testing, mutation analysis, boolean specification
35	Carlos Pacheco, Shuvendu K. Lahiri, Thomas Ball	Finding errors in .net with feedback-directed random testing.	ISSTA	2008	DBLP DOI BibTeX RDF	random testing
35	Lucas Serpa Silva, Maarten van Someren	Evolutionary testing of object-oriented software.	SAC	2010	DBLP DOI BibTeX RDF	genetic algorithms, software testing, evolutionary computing
35	Ling Liu, Huaikou Miao, Xuede Zhan	A Framework for Specification-Based Class Testing.	ICECCS	2002	DBLP DOI BibTeX RDF	test class framework, finite state machine (FSM), state transition tree, Object-Z, class testing
35	Philippe Cousin	Interoperabolity Events Complementing Conformance Testing Activities.	TestCom	2003	DBLP DOI BibTeX RDF
35	Debra J. Richardson	TAOS: Testing with Analysis and Oracle Support.	ISSTA	1994	DBLP DOI BibTeX RDF	DEBUG
35	P. Dhavachelvan, G. V. Uma	Multi-agent Based Integrated Framework for Intra-class Testing of Object-Oriented Software.	ISCIS	2003	DBLP DOI BibTeX RDF
35	Oded Goldreich 0001	Reducing Testing Affine Spaces to Testing Linearity of Functions.	Computational Complexity and Property Testing	2020	DBLP DOI BibTeX RDF
35	Bruno Legeard	Model-based Testing: Next Generation Functional Software Testing.	Practical Software Testing: Tool Automation and Human Factors	2010	DBLP BibTeX RDF
35	Ido Ben-Eliezer, Tali Kaufman, Michael Krivelevich, Dana Ron	Comparing the Strength of Query Types in Property Testing: The Case of Testing k-Colorability.	Property Testing	2010	DBLP DOI BibTeX RDF
35	Richard J. Linn Jr., J. Stephen Nightingale	Some Experience with Testing Tools for OSI Protocol Implementations.	Protocol Specification, Testing, and Verification	1983	DBLP BibTeX RDF
35	Alfred Gießler	Testing and Diagnosis Aids for Higher Level Protocols.	Protocol Specification, Testing, and Verification	1983	DBLP BibTeX RDF
35	G. W. Cowin, R. W. S. Hale, D. Rayner	Protocol Product Testing - Some Comparisons and Lessons.	Protocol Specification, Testing, and Verification	1983	DBLP BibTeX RDF
35	Sergio Palazzo, P. Fogliata, Gesualdo Le Moli	A Layer-Independent Architecture for a Testing System of Protocol Implementations.	Protocol Specification, Testing, and Verification	1983	DBLP BibTeX RDF
35	Robin M. S. Cork	The Testing of Protocols in SNA Products - An Overview.	Protocol Specification, Testing, and Verification	1983	DBLP BibTeX RDF
35	Robert L. Probert, Hasan Ural	Requirements for a Test Specification Language for Protocol Implementation Testing.	Protocol Specification, Testing, and Verification	1983	DBLP BibTeX RDF
35	Anders Hessel, Kim Guldstrand Larsen, Marius Mikucionis, Brian Nielsen, Paul Pettersson, Arne Skou	Testing Real-Time Systems Using UPPAAL.	Formal Methods and Testing	2008	DBLP DOI BibTeX RDF
35	Angelo Gargantini	Conformance Testing.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
35	Verena Wolf	Testing Theory for Probabilistic Systems.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
35	Christophe Gaston, Dirk Seifert	Evaluating Coverage Based Testing.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
35	Richard G. Hamlet	Theoretical Comparison of Testing Methods.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
35	Wolfgang Prenninger, Mohammad El-Ramly, Marc Horstmann	Case Studies.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
35	Daniel Hoffman, C. Brealey	Module Test Case Generation.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
33	Mukund Sivaraman, Andrzej J. Strojwas	Diagnosis of parametric path delay faults.	VLSI Design	1996	DBLP DOI BibTeX RDF	parametric path delay faults, chip failure, fabrication process parameter values, path sensitization mechanism, path delay conditions, ISCAS'89 benchmark circuits, path segment, circuit failure, fault diagnosis, logic testing, logic testing, delays, probability, probability, statistical analysis, statistical analysis, integrated circuit testing, failure analysis, diagnosability, delay fault testing, IC testing, production testing
33	S. L. Lin, S. Mourad, S. Krishnan	A BIST methodology for at-speed testing of data communications transceivers.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	data communication equipment, telecommunication equipment testing, BIST methodology, data communications transceivers, data communications chip, 3-port IEEE 1394a system, CMOS implementation, 0.35 micron, 400 Mbit/s, built-in self test, integrated circuit testing, automatic testing, functional testing, CMOS integrated circuits, at-speed testing, transceivers
33	Cecilia Metra, Michele Favalli, Bruno Riccò	Embedded two-rail checkers with on-line testing ability.	VTS	1996	DBLP DOI BibTeX RDF	embedded two-rail checkers, online testing ability, self-testing ability, compact structure, VLSI, logic testing, integrated circuit testing, design for testability, error detection, automatic testing, integrated logic circuits, two-rail code
33	Udo Mahlstedt, Jürgen Alt, Matthias Heinitz	CURRENT: a test generation system for IDDQ testing.	VTS	1995	DBLP DOI BibTeX RDF	CURRENT test system, test generation system, scan-based circuits, library-based fault modeling strategy, intra-gate shorts, inter-gate shorts, gate-drain shorts, deterministic test generator, test set compaction technique, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault simulator, fault coverage, fault location, CMOS logic circuits, bridging faults, boundary scan testing, I/sub DDQ/ testing, test application time reduction, stuck-on faults, leakage faults
33	Peter C. Maxwell	The use of IDDQ testing in low stuck-at coverage situations.	VTS	1995	DBLP DOI BibTeX RDF	stuck-at coverage situations, quality goal, graded coverage, composite metric, fault diagnosis, logic testing, logic tests, integrated circuit testing, automatic testing, application specific integrated circuits, ASIC, CMOS logic circuits, IDDQ testing, IC testing
33	Tsong Yueh Chen, Robert G. Merkel	An upper bound on software testing effectiveness.	ACM Trans. Softw. Eng. Methodol.	2008	DBLP DOI BibTeX RDF	failure patterns, failure-causing inputs, testing effectiveness metrics, Software testing, random testing, adaptive random testing
33	Tsong Yueh Chen, Fei-Ching Diana Kuo, Robert G. Merkel, Sebastian P. Ng	Mirror Adaptive Random Testing.	QSIC	2003	DBLP DOI BibTeX RDF	Software testing, Random testing, Black box testing, Adaptive Random Testing, Test case selection
33	James F. Leathrum, K. A. Liburdy	A formal approach to requirements based testing in open systems standards.	ICRE	1996	DBLP DOI BibTeX RDF	requirements based testing, IEEE POSIX arena, open systems standards, full scale conformance test suite development, executable tests, Clemson Automated Testing System, design taxonomy, IEEE Std 10035-The Ada Language Binding to POSIX, formal specification, testing, systems analysis, open systems, conformance testing, IEEE standards, software standards, automatic translation, test requirements, formal approach
33	S. Cremoux, Christophe Fagot, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch	A new test pattern generation method for delay fault testing.	VTS	1996	DBLP DOI BibTeX RDF	test pattern generation method, directed random generation technique, random test vectors, test sequence length, delay fault coverage, learning (artificial intelligence), VLSI, logic testing, delays, built-in self test, integrated circuit testing, BIST, automatic testing, delay fault testing, digital integrated circuits, learning tool, high speed circuits
33	Subhrajit Bhattacharya, Sujit Dey	H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads.	VTS	1996	DBLP DOI BibTeX RDF	H-SCAN, parallel register connectivity, on-chip response, sequential test vectors, combinational test vectors, combinational ATPG program, RT-level design, integrated circuit testing, design for testability, automatic testing, fault simulation, fault coverage, test pattern generation, comparator, boundary scan testing, test application time, high-level design, area overhead, testing methodology
33	Jeffrey A. Floyd, Matt Perry	Real-time on-board bus testing.	VTS	1995	DBLP DOI BibTeX RDF	on-board bus testing, wide buses, computer buses, board layout, full-fault testing, multiple speeds, pseudo-random pattern generation, characteristic equations, IEEE JTAG protocol, real-time systems, protocols, logic testing, automatic testing, system buses, operating environments, multiple seed, clock speeds
33	Sitaran Yadavalli, Irith Pomeranz, Sudhakar M. Reddy	MUSTC-Testing: Multi-Stage-Combinational Test scheduling at the Register-Transfer Level.	VLSI Design	1995	DBLP DOI BibTeX RDF	MUSTC-testing, multi-stage-combinational test, control paths, signal types, module level pre-computed test sets, scheduling, logic testing, integrated circuit testing, combinational circuits, automatic testing, automatic test, register-transfer level, test scheduling, data-paths
33	Gregor von Bochmann, Rachida Dssouli, J. R. Zhao	Trace Analysis for Conformance and Arbitration Testing.	IEEE Trans. Software Eng.	1989	DBLP DOI BibTeX RDF	arbitration testing, implementation under test, IUT, communication protocol implementations, distributed test architectures, partial input/output traces, local observers, error-detection power, global knowledge, automated construction, trace analysis modules, reference specification, open systems interconnection, formal specification, protocols, transport protocol, program testing, open systems, conformance testing, conformance testing, OSI
33	A. Jefferson Offutt	An integrated automatic test data generation system.	J. Syst. Integr.	1991	DBLP DOI BibTeX RDF	software testing, constraints, unit testing, test data generation, mutation testing, fault-based testing
33	Tsong Yueh Chen, Fei-Ching Kuo, Huai Liu, W. Eric Wong	Does Adaptive Random Testing Deliver a Higher Confidence than Random Testing?	QSIC	2008	DBLP DOI BibTeX RDF	Failure-Based Testing, Test Coverage Criteria, Random Testing, Adaptive Random Testing
33	Nicos Malevris	On structurally testing Java programs effectively.	PPPJ	2004	DBLP DOI BibTeX RDF	software testing, test data generation, structural testing, dynamic testing, infeasible paths
33	Lei Xu 0003, Baowen Xu, Zhenqiang Chen, Jixiang Jiang, Huowang Chen	Regression Testing for Web Applications Based on Slicing.	COMPSAC	2003	DBLP DOI BibTeX RDF	Web testing, Software testing, Web application, Program slicing, Regression testing
33	Pramod V. Koppol, Richard H. Carver, Kuo-Chung Tai	Incremental Integration Testing of Concurrent Programs.	IEEE Trans. Software Eng.	2002	DBLP DOI BibTeX RDF	incremental testing, Software testing, concurrent programs, structural testing
33	Sami Beydeda, Volker Gruhn, Michael Stachorski	A Graphical Class Representation for Integrated Black- and White-Box Testing.	ICSM	2001	DBLP DOI BibTeX RDF	Class-level testing, integrated black- and white-box testing, selective regression testing, test suite reduction
33	Márcio Eduardo Delamaro, José Carlos Maldonado	Interface Mutation: Assessing Testing Quality at Interprocedural Level.	SCCC	1999	DBLP DOI BibTeX RDF	Interface Mutation, Software Testing, Mutation Testing, Software Testing Tool
33	Sandeep Pagey	Fast functional testing of delay-insensitive circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	four-phase handshake signalling, Martin's method, distributed circuit, OR/C blocks, generation of test sequences, program flow graph, logic testing, delays, design for testability, logic CAD, asynchronous circuits, functional testing, testing time, self-timed circuits, delay-insensitive circuits, OR gates
33	Elaine J. Weyuker, Bingchiang Jeng	Analyzing Partition Testing Strategies.	IEEE Trans. Software Eng.	1991	DBLP DOI BibTeX RDF	input domain, fault detection capabilities, subdomain modifications, program testing, random testing, partition testing
33	Ryan West, Katherine Lehman	Automated summative usability studies: an empirical evaluation.	CHI	2006	DBLP DOI BibTeX RDF	summative testing, automated testing, empirical methods, usability methods, remote testing
33	Qurat-ul-ann Farooq, Muhammad Zohaib Z. Iqbal, Zafar I. Malik, Aamer Nadeem	An approach for selective state machine based regression testing.	A-MOST	2007	DBLP DOI BibTeX RDF	UML, model based testing, regression testing
33	João Lourenço, Gonçalo Cunha	Testing patterns for software transactional memory engines.	PADTAD	2007	DBLP DOI BibTeX RDF	testing, concurrency, debugging, software transactional memory, testing patterns
33	Tamás Horváth 0004, Tibor Sulyán	A Framework for Testing AIS Implementations.	TestCom/FATES	2007	DBLP DOI BibTeX RDF	Application Interface Specification (AIS), Conformance Testing, Functional Testing, Service Availability
33	Ira Acharya, Hemendra Kumar Singh	Testing of 3G 1xEV-DV Stack - A Case Study.	TestCom	2003	DBLP DOI BibTeX RDF	testing challenges, IUT, 1xEV-DV, EV-DV, DV, reference implementation, 3GPP2, LAC, RLP, L2, L3, packet data channel, PDCHCF, Message Integrity, simulation, Testing, MAC, queues, behavior, task, video conferencing, SDL, formalism, 3G, Signaling, logging, conformance, test automation, formal description techniques, MSC, timers, protocol stack, test scripts, TTCN
33	Ilinca Ciupa, Andreas Leitner, Manuel Oriol, Bertrand Meyer 0001	ARTOO: adaptive random testing for object-oriented software.	ICSE	2008	DBLP DOI BibTeX RDF	object distance, software testing, adaptive random testing
33	Jonas Boberg	Early fault detection with model-based testing.	Erlang Workshop	2008	DBLP DOI BibTeX RDF	model-based testing, system testing
33	Nasib Singh Gill, Pradeep Tomar	CBS testing requirements and test case process documentation revisited.	ACM SIGSOFT Softw. Eng. Notes	2007	DBLP DOI BibTeX RDF	component provider, component user, component-based system development, component-based system testing, testing, testability, component-based system
33	Robert B. Evans, Alberto Savoia	Differential testing: a new approach to change detection.	ESEC/SIGSOFT FSE	2007	DBLP DOI BibTeX RDF	differential testing, test repair, software maintenance, regression testing, change impact analysis, automated test generation
33	Xiaofang Zhang, Changhai Nie, Baowen Xu, Bo Qu	Test Case Prioritization Based on Varying Testing Requirement Priorities and Test Case Costs.	QSIC	2007	DBLP DOI BibTeX RDF	Test Case Prioritization, Software Testing, Regression Testing, Cost, Priority
33	Michael Ellims, James Bridges, Darrel C. Ince	The Economics of Unit Testing.	Empir. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Software testing, Unit testing, Test effectiveness, Adequacy criteria
33	Johannes Mayer, Tsong Yueh Chen, Dehao Huang	Adaptive random testing through iterative partitioning revisited.	SOQUA	2006	DBLP DOI BibTeX RDF	random testing, adaptive random testing, test case selection
33	Vinay Verma, Shantanu Dutt, Vishal Suthar	Efficient on-line testing of FPGAs with provable diagnosabilities.	DAC	2004	DBLP DOI BibTeX RDF	built-in self-tester (BISTer), roving tester (ROTE), FPGAs, functional testing, on-line testing, diagnosability
33	Alan A. Jorgensen	Testing with hostile data streams.	ACM SIGSOFT Softw. Eng. Notes	2003	DBLP DOI BibTeX RDF	Adobe Acrobat Reader, software testing, steganography, random testing, buffer overflow, internet security, buffer overrun
33	Philip J. Boland, Harshinder Singh, Bojan Cukic	Comparing Partition and Random Testing via Majorization and Schur Functions.	IEEE Trans. Software Eng.	2003	DBLP DOI BibTeX RDF	Schur functions, random testing, Partition testing, software debugging, majorization
33	Krishnendu Chakrabarty, John P. Hayes	Balance testing and balance-testable design of logic circuits.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	built-in self testing, design for testability, fault detection, fault coverage, testing methods
33	Heechern Kim, Chisu Wu	A Class Testing Technique Based on Data Bindings.	APSEC	1996	DBLP DOI BibTeX RDF	Software testing, data binding, class testing
33	Zuhoor A. Al-Khanjari, Martin R. Woodward, Haider Ali Ramadhan, Narayana Swamy Kutti	The Efficiency of Critical Slicing in Fault Localization.	Softw. Qual. J.	2005	DBLP DOI BibTeX RDF	strong and weak mutations, dead, live and equivalent mutants, static and dynamic slicing, critical slicing, statement deletion (Sdl), Mothra Mutation Testing System, Fortran-77, mutation testing, mutation operator
32	Ronny Kolb, Dirk Muthig	Making testing product lines more efficient by improving the testability of product line architectures.	ROSATEA	2006	DBLP DOI BibTeX RDF	evaluation, design, architecture, testing, software product line, testability
32	Klaus Haller	White-box testing for database-driven applications: a requirements analysis.	DBTest	2009	DBLP DOI BibTeX RDF	testing, databases, information systems, test coverage
32	Venkata Raghunath Vemuri	Testing Predictive Software in Mobile Devices.	ICST	2008	DBLP DOI BibTeX RDF	Predictive software, Mobile Devices, Software testing
32	Wei-Tek Tsai, Yinong Chen, Zhibin Cao, Xiaoying Bai, Hai Huang 0011, Raymond A. Paul	Testing Web Services Using Progressive Group Testing.	AWCC	2004	DBLP DOI BibTeX RDF	Web testing, Web Services, Service-Oriented Architecture, Verification and Validation
32	Kirill Bogdanov 0002, Mike Holcombe, Florentin Ipate, L. Seed, Salim K. Vanak	Testing methods for X-machines: a review.	Formal Aspects Comput.	2006	DBLP DOI BibTeX RDF	Software testing, Finite state machines, Test set generation, X-machines
32	Jing Guan, Jeff Offutt, Paul Ammann	An industrial case study of structural testing applied to safety-critical embedded software.	ISESE	2006	DBLP DOI BibTeX RDF	software testing, embedded software, industrial case study
32	Sebastian P. Ng, Tafline Murnane, Karl Reed, D. Grant, Tsong Yueh Chen	A Preliminary Survey on Software Testing Practices in Australia.	Australian Software Engineering Conference	2004	DBLP DOI BibTeX RDF	Software engineering, software testing, survey
32	Machiel van der Bijl, Arend Rensink, Jan Tretmans	Compositional Testing with ioco.	FATES	2003	DBLP DOI BibTeX RDF
32	Cheer-Sun D. Yang, Lori L. Pollock	Towards a Structural Load Testing Tool.	ISSTA	1996	DBLP DOI BibTeX RDF