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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 29817 occurrences of 7713 keywords
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Results
Found 56580 publication records. Showing 56580 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
37 | Paul Ammann, Jeff Offutt, Wuzhi Xu |
Coverage Criteria for State Based Specifications. |
Formal Methods and Testing |
2008 |
DBLP DOI BibTeX RDF |
|
37 | A. Jefferson Offutt |
The Coupling Effect: Fact or Fiction. |
Symposium on Testing, Analysis, and Verification |
1989 |
DBLP DOI BibTeX RDF |
|
36 | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. |
VTS |
1997 |
DBLP DOI BibTeX RDF |
semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing |
35 | Koushik Sen, Darko Marinov, Gul Agha |
CUTE: a concolic unit testing engine for C. |
ESEC/SIGSOFT FSE |
2005 |
DBLP DOI BibTeX RDF |
data structure testing, explicit path model-checking, random testing, unit testing, testing C programs, concolic testing |
35 | Yuyun Liao, D. M. H. Walker |
Optimal voltage testing for physically-based faults. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
optimal voltage testing, physically-based faults, resistive bridges, gate outputs, pattern sensitive functional faults, transmission gates, fault diagnosis, logic testing, delays, integrated circuit testing, automatic testing, fault coverage, CMOS logic circuits, delay faults, Iddq tests, CMOS circuits, logic gates, test vector, noise margin, selection strategy, low-voltage testing, integrated circuit noise |
35 | Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams |
On the decline of testing efficiency as fault coverage approaches 100%. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
single stuck-at fault model, ISCAS benchmark circuits, nontarget defects, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, manufacturing process, test quality, production testing, testing efficiency, circuit sizes |
35 | Meng-Lieh Sheu, Chung-Len Lee 0001 |
A programmable multiple-sequence generator for BIST applications. |
Asian Test Symposium |
1995 |
DBLP DOI BibTeX RDF |
programmable multiple-sequence generator, BIST applications, two-dimension-like feedback shift register, deterministic sequence, pseudo-random vectors, sequence segmentation method, stuck-open fault testing, logic testing, delays, built-in self test, sequential circuits, shift registers, delay fault testing, binary sequences, sequential circuit testing, regular structure, MCM testing |
35 | Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour |
An approach for system tests design and its application. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
system test design, control testing table, testing processor, correctness problem, polynomial complexity algorithm, software system design, microcode synthesis, CAD system testing, performance evaluation, performance evaluation, program testing, mathematical model, multicomputer systems, computer testing, multi-user systems |
35 | Phyllis G. Frankl, Stewart N. Weiss |
An Experimental Comparison of the Effectiveness of Branch Testing and Data Flow Testing. |
IEEE Trans. Software Eng. |
1993 |
DBLP DOI BibTeX RDF |
error exposing ability, all-edges test data adequacy criteria, software testing experiments, executable edges, definition-use associations, all-uses adequate test sets, program testing, errors, regression analysis, data flow testing, branch testing |
35 | Anthony J. H. Simons |
JWalk: a tool for lazy, systematic testing of java classes by design introspection and user interaction. |
Autom. Softw. Eng. |
2007 |
DBLP DOI BibTeX RDF |
Algebraic testing, Lazy specification, Lazy systematic testing, Operational abstraction, JWalk, Unit testing, Agile methods, JUnit, State-based testing |
35 | Laisa H. O. do Nascimento, PatrÃcia D. L. Machado |
An experimental evaluation of approaches to feature testing in the mobile phone applications domain. |
DOSTA |
2007 |
DBLP DOI BibTeX RDF |
GQM paradigm, exploratory testing, feature testing, software testing, model-based testing |
35 | Chen-Huan Chiang, Sandeep K. Gupta 0001 |
BIST TPG for SRAM cluster interconnect testing at board level. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
SRAM cluster interconnect testing, BIST TPG, static random access memory, board-level interconnects, test pattern generation architecture, IEEE 1149.1 boundary scan architecture, prohibited conditions, testable SRAM cluster interconnect fault detection, logic testing, built-in self test, automatic test pattern generation, test pattern generation, boundary scan testing, integrated circuit interconnections, SRAM chips, printed circuit testing |
35 | Tsong Yueh Chen, Yuen-Tak Yu |
More on the E-measure of Subdomain Testing Strategies. |
Australian Software Engineering Conference |
1996 |
DBLP DOI BibTeX RDF |
subdomain testing, software testing, random testing, Partition testing |
35 | Wei-Kang Huang, Fabrizio Lombardi |
An approach for testing programmable/configurable field programmable gate arrays. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
behavioral characterization, single fault detection, disjoint one-dimensional arrays, unilateral horizontal connections, common vertical input lines, array testing, logic blocks, field programmable gate arrays, field programmable gate arrays, VLSI, logic testing, integrated circuit testing, stuck-at fault, FPGA testing, functional fault, hybrid fault model |
35 | Eckard Bringmann, Andreas Krämer |
Model-Based Testing of Automotive Systems. |
ICST |
2008 |
DBLP DOI BibTeX RDF |
continuous behavior testing, closed loop testing, Model-based testing, test automation, automotive systems |
35 | Bernhard K. Aichernig, Jifeng He 0001 |
Mutation testing in UTP. |
Formal Aspects Comput. |
2009 |
DBLP DOI BibTeX RDF |
Unifying theories of programming, Algebra of programming, Specification-based testing, Mutation testing, Refinement calculus, Fault-based testing |
35 | Lee J. White, Brian Robinson |
Industrial Real-Time Regression Testing and Analysis Using Firewalls. |
ICSM |
2004 |
DBLP DOI BibTeX RDF |
Testing Firewall, Software Testing, Deadlock, Regression Testing, Software Defects, Real-Time Software |
35 | Juichi Takahashi, Yoshiaki Kakuda |
Effective Automated Testing: A Solution of Graphical Object Verification. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
Software testing, automated testing, printing, GUI testing |
35 | Sami Beydeda, Volker Gruhn |
Integrating White- and Black-Box Techniques for Class-Level Regression Testing. |
COMPSAC |
2001 |
DBLP DOI BibTeX RDF |
Integrated White- and Black-Box Testing, Class-level Testing, Regression Testing |
35 | Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Tillmann, VÃctor A. Braberman |
Achieving both model and code coverage with automated gray-box testing. |
A-MOST |
2007 |
DBLP DOI BibTeX RDF |
concolic execution, parameterized unit testing, model-based testing, symbolic execution, test-case generation |
35 | Philip Mayer, Daniel Lübke |
Towards a BPEL unit testing framework. |
TAV-WEB |
2006 |
DBLP DOI BibTeX RDF |
BPELUnit, testing, composition, BPEL, unit testing, orchestration |
35 | Fabiano Cutigi Ferrari, José Carlos Maldonado, Awais Rashid |
Mutation Testing for Aspect-Oriented Programs. |
ICST |
2008 |
DBLP DOI BibTeX RDF |
Aspect-Oriented testing, AO fault types, Mutation testing, mutation operators |
35 | Dick Hamlet |
Subdomain testing of units and systems with state. |
ISSTA |
2006 |
DBLP DOI BibTeX RDF |
persistent state, unit/system testing, testing theory |
35 | Harry M. Sneed |
Testing a Datawarehouse - An Industrial Challenge. |
TAIC PART |
2006 |
DBLP DOI BibTeX RDF |
Datawarehouse Testing, Data Transformation Rules, Post Conditions Assertions, Formal Verification, System Testing |
35 | Tom Chen 0001, Anneliese von Mayrhauser, Amjad Hajjar, Charles Anderson 0001, Mehmet Sahinoglu |
How Much Testing is Enough? Applying Stopping Rules to Behavioral Model Testing. |
HASE |
1999 |
DBLP DOI BibTeX RDF |
Behavioral Model Testing, Compound Poisson, Effort-Domain, Empirical Bayesian Analysis, Negative Binomial Distribution (NBD), Poisson LSD, Testing Strategy, Stopping Rule |
35 | Rupak Majumdar, Koushik Sen |
Hybrid Concolic Testing. |
ICSE |
2007 |
DBLP DOI BibTeX RDF |
directed random testing, concolic testing |
35 | Bixin Li, Yancheng Wang, Lili Yang |
An Integrated Regression Testing Framework to Multi-Threaded Java Programs. |
SET |
2006 |
DBLP DOI BibTeX RDF |
Regression testing, Multi-threaded program, Reachability testing |
35 | Stefan Wappler, Frank Lammermann |
Using evolutionary algorithms for the unit testing of object-oriented software. |
GECCO |
2005 |
DBLP DOI BibTeX RDF |
chaining approach, multi-level optimization, evolutionary testing, object-oriented testing, automated test case generation |
35 | Noritaka Kobayashi, Tatsuhiro Tsuchiya, Tohru Kikuno |
Applicability of Non-Specification-Based Approaches to Logic Testing for Software. |
DSN |
2001 |
DBLP DOI BibTeX RDF |
factor covering design, software testing, logic testing, mutation analysis, boolean specification |
35 | Carlos Pacheco, Shuvendu K. Lahiri, Thomas Ball |
Finding errors in .net with feedback-directed random testing. |
ISSTA |
2008 |
DBLP DOI BibTeX RDF |
random testing |
35 | Lucas Serpa Silva, Maarten van Someren |
Evolutionary testing of object-oriented software. |
SAC |
2010 |
DBLP DOI BibTeX RDF |
genetic algorithms, software testing, evolutionary computing |
35 | Ling Liu, Huaikou Miao, Xuede Zhan |
A Framework for Specification-Based Class Testing. |
ICECCS |
2002 |
DBLP DOI BibTeX RDF |
test class framework, finite state machine (FSM), state transition tree, Object-Z, class testing |
35 | Philippe Cousin |
Interoperabolity Events Complementing Conformance Testing Activities. |
TestCom |
2003 |
DBLP DOI BibTeX RDF |
|
35 | Debra J. Richardson |
TAOS: Testing with Analysis and Oracle Support. |
ISSTA |
1994 |
DBLP DOI BibTeX RDF |
DEBUG |
35 | P. Dhavachelvan, G. V. Uma |
Multi-agent Based Integrated Framework for Intra-class Testing of Object-Oriented Software. |
ISCIS |
2003 |
DBLP DOI BibTeX RDF |
|
35 | Oded Goldreich 0001 |
Reducing Testing Affine Spaces to Testing Linearity of Functions. |
Computational Complexity and Property Testing |
2020 |
DBLP DOI BibTeX RDF |
|
35 | Bruno Legeard |
Model-based Testing: Next Generation Functional Software Testing. |
Practical Software Testing: Tool Automation and Human Factors |
2010 |
DBLP BibTeX RDF |
|
35 | Ido Ben-Eliezer, Tali Kaufman, Michael Krivelevich, Dana Ron |
Comparing the Strength of Query Types in Property Testing: The Case of Testing k-Colorability. |
Property Testing |
2010 |
DBLP DOI BibTeX RDF |
|
35 | Richard J. Linn Jr., J. Stephen Nightingale |
Some Experience with Testing Tools for OSI Protocol Implementations. |
Protocol Specification, Testing, and Verification |
1983 |
DBLP BibTeX RDF |
|
35 | Alfred Gießler |
Testing and Diagnosis Aids for Higher Level Protocols. |
Protocol Specification, Testing, and Verification |
1983 |
DBLP BibTeX RDF |
|
35 | G. W. Cowin, R. W. S. Hale, D. Rayner |
Protocol Product Testing - Some Comparisons and Lessons. |
Protocol Specification, Testing, and Verification |
1983 |
DBLP BibTeX RDF |
|
35 | Sergio Palazzo, P. Fogliata, Gesualdo Le Moli |
A Layer-Independent Architecture for a Testing System of Protocol Implementations. |
Protocol Specification, Testing, and Verification |
1983 |
DBLP BibTeX RDF |
|
35 | Robin M. S. Cork |
The Testing of Protocols in SNA Products - An Overview. |
Protocol Specification, Testing, and Verification |
1983 |
DBLP BibTeX RDF |
|
35 | Robert L. Probert, Hasan Ural |
Requirements for a Test Specification Language for Protocol Implementation Testing. |
Protocol Specification, Testing, and Verification |
1983 |
DBLP BibTeX RDF |
|
35 | Anders Hessel, Kim Guldstrand Larsen, Marius Mikucionis, Brian Nielsen, Paul Pettersson, Arne Skou |
Testing Real-Time Systems Using UPPAAL. |
Formal Methods and Testing |
2008 |
DBLP DOI BibTeX RDF |
|
35 | Angelo Gargantini |
Conformance Testing. |
Model-Based Testing of Reactive Systems |
2004 |
DBLP DOI BibTeX RDF |
|
35 | Verena Wolf |
Testing Theory for Probabilistic Systems. |
Model-Based Testing of Reactive Systems |
2004 |
DBLP DOI BibTeX RDF |
|
35 | Christophe Gaston, Dirk Seifert |
Evaluating Coverage Based Testing. |
Model-Based Testing of Reactive Systems |
2004 |
DBLP DOI BibTeX RDF |
|
35 | Richard G. Hamlet |
Theoretical Comparison of Testing Methods. |
Symposium on Testing, Analysis, and Verification |
1989 |
DBLP DOI BibTeX RDF |
|
35 | Wolfgang Prenninger, Mohammad El-Ramly, Marc Horstmann |
Case Studies. |
Model-Based Testing of Reactive Systems |
2004 |
DBLP DOI BibTeX RDF |
|
35 | Daniel Hoffman, C. Brealey |
Module Test Case Generation. |
Symposium on Testing, Analysis, and Verification |
1989 |
DBLP DOI BibTeX RDF |
|
33 | Mukund Sivaraman, Andrzej J. Strojwas |
Diagnosis of parametric path delay faults. |
VLSI Design |
1996 |
DBLP DOI BibTeX RDF |
parametric path delay faults, chip failure, fabrication process parameter values, path sensitization mechanism, path delay conditions, ISCAS'89 benchmark circuits, path segment, circuit failure, fault diagnosis, logic testing, logic testing, delays, probability, probability, statistical analysis, statistical analysis, integrated circuit testing, failure analysis, diagnosability, delay fault testing, IC testing, production testing |
33 | S. L. Lin, S. Mourad, S. Krishnan |
A BIST methodology for at-speed testing of data communications transceivers. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
data communication equipment, telecommunication equipment testing, BIST methodology, data communications transceivers, data communications chip, 3-port IEEE 1394a system, CMOS implementation, 0.35 micron, 400 Mbit/s, built-in self test, integrated circuit testing, automatic testing, functional testing, CMOS integrated circuits, at-speed testing, transceivers |
33 | Cecilia Metra, Michele Favalli, Bruno Riccò |
Embedded two-rail checkers with on-line testing ability. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
embedded two-rail checkers, online testing ability, self-testing ability, compact structure, VLSI, logic testing, integrated circuit testing, design for testability, error detection, automatic testing, integrated logic circuits, two-rail code |
33 | Udo Mahlstedt, Jürgen Alt, Matthias Heinitz |
CURRENT: a test generation system for IDDQ testing. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
CURRENT test system, test generation system, scan-based circuits, library-based fault modeling strategy, intra-gate shorts, inter-gate shorts, gate-drain shorts, deterministic test generator, test set compaction technique, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault simulator, fault coverage, fault location, CMOS logic circuits, bridging faults, boundary scan testing, I/sub DDQ/ testing, test application time reduction, stuck-on faults, leakage faults |
33 | Peter C. Maxwell |
The use of IDDQ testing in low stuck-at coverage situations. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
stuck-at coverage situations, quality goal, graded coverage, composite metric, fault diagnosis, logic testing, logic tests, integrated circuit testing, automatic testing, application specific integrated circuits, ASIC, CMOS logic circuits, IDDQ testing, IC testing |
33 | Tsong Yueh Chen, Robert G. Merkel |
An upper bound on software testing effectiveness. |
ACM Trans. Softw. Eng. Methodol. |
2008 |
DBLP DOI BibTeX RDF |
failure patterns, failure-causing inputs, testing effectiveness metrics, Software testing, random testing, adaptive random testing |
33 | Tsong Yueh Chen, Fei-Ching Diana Kuo, Robert G. Merkel, Sebastian P. Ng |
Mirror Adaptive Random Testing. |
QSIC |
2003 |
DBLP DOI BibTeX RDF |
Software testing, Random testing, Black box testing, Adaptive Random Testing, Test case selection |
33 | James F. Leathrum, K. A. Liburdy |
A formal approach to requirements based testing in open systems standards. |
ICRE |
1996 |
DBLP DOI BibTeX RDF |
requirements based testing, IEEE POSIX arena, open systems standards, full scale conformance test suite development, executable tests, Clemson Automated Testing System, design taxonomy, IEEE Std 10035-The Ada Language Binding to POSIX, formal specification, testing, systems analysis, open systems, conformance testing, IEEE standards, software standards, automatic translation, test requirements, formal approach |
33 | S. Cremoux, Christophe Fagot, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch |
A new test pattern generation method for delay fault testing. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
test pattern generation method, directed random generation technique, random test vectors, test sequence length, delay fault coverage, learning (artificial intelligence), VLSI, logic testing, delays, built-in self test, integrated circuit testing, BIST, automatic testing, delay fault testing, digital integrated circuits, learning tool, high speed circuits |
33 | Subhrajit Bhattacharya, Sujit Dey |
H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
H-SCAN, parallel register connectivity, on-chip response, sequential test vectors, combinational test vectors, combinational ATPG program, RT-level design, integrated circuit testing, design for testability, automatic testing, fault simulation, fault coverage, test pattern generation, comparator, boundary scan testing, test application time, high-level design, area overhead, testing methodology |
33 | Jeffrey A. Floyd, Matt Perry |
Real-time on-board bus testing. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
on-board bus testing, wide buses, computer buses, board layout, full-fault testing, multiple speeds, pseudo-random pattern generation, characteristic equations, IEEE JTAG protocol, real-time systems, protocols, logic testing, automatic testing, system buses, operating environments, multiple seed, clock speeds |
33 | Sitaran Yadavalli, Irith Pomeranz, Sudhakar M. Reddy |
MUSTC-Testing: Multi-Stage-Combinational Test scheduling at the Register-Transfer Level. |
VLSI Design |
1995 |
DBLP DOI BibTeX RDF |
MUSTC-testing, multi-stage-combinational test, control paths, signal types, module level pre-computed test sets, scheduling, logic testing, integrated circuit testing, combinational circuits, automatic testing, automatic test, register-transfer level, test scheduling, data-paths |
33 | Gregor von Bochmann, Rachida Dssouli, J. R. Zhao |
Trace Analysis for Conformance and Arbitration Testing. |
IEEE Trans. Software Eng. |
1989 |
DBLP DOI BibTeX RDF |
arbitration testing, implementation under test, IUT, communication protocol implementations, distributed test architectures, partial input/output traces, local observers, error-detection power, global knowledge, automated construction, trace analysis modules, reference specification, open systems interconnection, formal specification, protocols, transport protocol, program testing, open systems, conformance testing, conformance testing, OSI |
33 | A. Jefferson Offutt |
An integrated automatic test data generation system. |
J. Syst. Integr. |
1991 |
DBLP DOI BibTeX RDF |
software testing, constraints, unit testing, test data generation, mutation testing, fault-based testing |
33 | Tsong Yueh Chen, Fei-Ching Kuo, Huai Liu, W. Eric Wong |
Does Adaptive Random Testing Deliver a Higher Confidence than Random Testing? |
QSIC |
2008 |
DBLP DOI BibTeX RDF |
Failure-Based Testing, Test Coverage Criteria, Random Testing, Adaptive Random Testing |
33 | Nicos Malevris |
On structurally testing Java programs effectively. |
PPPJ |
2004 |
DBLP DOI BibTeX RDF |
software testing, test data generation, structural testing, dynamic testing, infeasible paths |
33 | Lei Xu 0003, Baowen Xu, Zhenqiang Chen, Jixiang Jiang, Huowang Chen |
Regression Testing for Web Applications Based on Slicing. |
COMPSAC |
2003 |
DBLP DOI BibTeX RDF |
Web testing, Software testing, Web application, Program slicing, Regression testing |
33 | Pramod V. Koppol, Richard H. Carver, Kuo-Chung Tai |
Incremental Integration Testing of Concurrent Programs. |
IEEE Trans. Software Eng. |
2002 |
DBLP DOI BibTeX RDF |
incremental testing, Software testing, concurrent programs, structural testing |
33 | Sami Beydeda, Volker Gruhn, Michael Stachorski |
A Graphical Class Representation for Integrated Black- and White-Box Testing. |
ICSM |
2001 |
DBLP DOI BibTeX RDF |
Class-level testing, integrated black- and white-box testing, selective regression testing, test suite reduction |
33 | Márcio Eduardo Delamaro, José Carlos Maldonado |
Interface Mutation: Assessing Testing Quality at Interprocedural Level. |
SCCC |
1999 |
DBLP DOI BibTeX RDF |
Interface Mutation, Software Testing, Mutation Testing, Software Testing Tool |
33 | Sandeep Pagey |
Fast functional testing of delay-insensitive circuits. |
Asian Test Symposium |
1995 |
DBLP DOI BibTeX RDF |
four-phase handshake signalling, Martin's method, distributed circuit, OR/C blocks, generation of test sequences, program flow graph, logic testing, delays, design for testability, logic CAD, asynchronous circuits, functional testing, testing time, self-timed circuits, delay-insensitive circuits, OR gates |
33 | Elaine J. Weyuker, Bingchiang Jeng |
Analyzing Partition Testing Strategies. |
IEEE Trans. Software Eng. |
1991 |
DBLP DOI BibTeX RDF |
input domain, fault detection capabilities, subdomain modifications, program testing, random testing, partition testing |
33 | Ryan West, Katherine Lehman |
Automated summative usability studies: an empirical evaluation. |
CHI |
2006 |
DBLP DOI BibTeX RDF |
summative testing, automated testing, empirical methods, usability methods, remote testing |
33 | Qurat-ul-ann Farooq, Muhammad Zohaib Z. Iqbal, Zafar I. Malik, Aamer Nadeem |
An approach for selective state machine based regression testing. |
A-MOST |
2007 |
DBLP DOI BibTeX RDF |
UML, model based testing, regression testing |
33 | João Lourenço, Gonçalo Cunha |
Testing patterns for software transactional memory engines. |
PADTAD |
2007 |
DBLP DOI BibTeX RDF |
testing, concurrency, debugging, software transactional memory, testing patterns |
33 | Tamás Horváth 0004, Tibor Sulyán |
A Framework for Testing AIS Implementations. |
TestCom/FATES |
2007 |
DBLP DOI BibTeX RDF |
Application Interface Specification (AIS), Conformance Testing, Functional Testing, Service Availability |
33 | Ira Acharya, Hemendra Kumar Singh |
Testing of 3G 1xEV-DV Stack - A Case Study. |
TestCom |
2003 |
DBLP DOI BibTeX RDF |
testing challenges, IUT, 1xEV-DV, EV-DV, DV, reference implementation, 3GPP2, LAC, RLP, L2, L3, packet data channel, PDCHCF, Message Integrity, simulation, Testing, MAC, queues, behavior, task, video conferencing, SDL, formalism, 3G, Signaling, logging, conformance, test automation, formal description techniques, MSC, timers, protocol stack, test scripts, TTCN |
33 | Ilinca Ciupa, Andreas Leitner, Manuel Oriol, Bertrand Meyer 0001 |
ARTOO: adaptive random testing for object-oriented software. |
ICSE |
2008 |
DBLP DOI BibTeX RDF |
object distance, software testing, adaptive random testing |
33 | Jonas Boberg |
Early fault detection with model-based testing. |
Erlang Workshop |
2008 |
DBLP DOI BibTeX RDF |
model-based testing, system testing |
33 | Nasib Singh Gill, Pradeep Tomar |
CBS testing requirements and test case process documentation revisited. |
ACM SIGSOFT Softw. Eng. Notes |
2007 |
DBLP DOI BibTeX RDF |
component provider, component user, component-based system development, component-based system testing, testing, testability, component-based system |
33 | Robert B. Evans, Alberto Savoia |
Differential testing: a new approach to change detection. |
ESEC/SIGSOFT FSE |
2007 |
DBLP DOI BibTeX RDF |
differential testing, test repair, software maintenance, regression testing, change impact analysis, automated test generation |
33 | Xiaofang Zhang, Changhai Nie, Baowen Xu, Bo Qu |
Test Case Prioritization Based on Varying Testing Requirement Priorities and Test Case Costs. |
QSIC |
2007 |
DBLP DOI BibTeX RDF |
Test Case Prioritization, Software Testing, Regression Testing, Cost, Priority |
33 | Michael Ellims, James Bridges, Darrel C. Ince |
The Economics of Unit Testing. |
Empir. Softw. Eng. |
2006 |
DBLP DOI BibTeX RDF |
Software testing, Unit testing, Test effectiveness, Adequacy criteria |
33 | Johannes Mayer, Tsong Yueh Chen, Dehao Huang |
Adaptive random testing through iterative partitioning revisited. |
SOQUA |
2006 |
DBLP DOI BibTeX RDF |
random testing, adaptive random testing, test case selection |
33 | Vinay Verma, Shantanu Dutt, Vishal Suthar |
Efficient on-line testing of FPGAs with provable diagnosabilities. |
DAC |
2004 |
DBLP DOI BibTeX RDF |
built-in self-tester (BISTer), roving tester (ROTE), FPGAs, functional testing, on-line testing, diagnosability |
33 | Alan A. Jorgensen |
Testing with hostile data streams. |
ACM SIGSOFT Softw. Eng. Notes |
2003 |
DBLP DOI BibTeX RDF |
Adobe Acrobat Reader, software testing, steganography, random testing, buffer overflow, internet security, buffer overrun |
33 | Philip J. Boland, Harshinder Singh, Bojan Cukic |
Comparing Partition and Random Testing via Majorization and Schur Functions. |
IEEE Trans. Software Eng. |
2003 |
DBLP DOI BibTeX RDF |
Schur functions, random testing, Partition testing, software debugging, majorization |
33 | Krishnendu Chakrabarty, John P. Hayes |
Balance testing and balance-testable design of logic circuits. |
J. Electron. Test. |
1996 |
DBLP DOI BibTeX RDF |
built-in self testing, design for testability, fault detection, fault coverage, testing methods |
33 | Heechern Kim, Chisu Wu |
A Class Testing Technique Based on Data Bindings. |
APSEC |
1996 |
DBLP DOI BibTeX RDF |
Software testing, data binding, class testing |
33 | Zuhoor A. Al-Khanjari, Martin R. Woodward, Haider Ali Ramadhan, Narayana Swamy Kutti |
The Efficiency of Critical Slicing in Fault Localization. |
Softw. Qual. J. |
2005 |
DBLP DOI BibTeX RDF |
strong and weak mutations, dead, live and equivalent mutants, static and dynamic slicing, critical slicing, statement deletion (Sdl), Mothra Mutation Testing System, Fortran-77, mutation testing, mutation operator |
32 | Ronny Kolb, Dirk Muthig |
Making testing product lines more efficient by improving the testability of product line architectures. |
ROSATEA |
2006 |
DBLP DOI BibTeX RDF |
evaluation, design, architecture, testing, software product line, testability |
32 | Klaus Haller |
White-box testing for database-driven applications: a requirements analysis. |
DBTest |
2009 |
DBLP DOI BibTeX RDF |
testing, databases, information systems, test coverage |
32 | Venkata Raghunath Vemuri |
Testing Predictive Software in Mobile Devices. |
ICST |
2008 |
DBLP DOI BibTeX RDF |
Predictive software, Mobile Devices, Software testing |
32 | Wei-Tek Tsai, Yinong Chen, Zhibin Cao, Xiaoying Bai, Hai Huang 0011, Raymond A. Paul |
Testing Web Services Using Progressive Group Testing. |
AWCC |
2004 |
DBLP DOI BibTeX RDF |
Web testing, Web Services, Service-Oriented Architecture, Verification and Validation |
32 | Kirill Bogdanov 0002, Mike Holcombe, Florentin Ipate, L. Seed, Salim K. Vanak |
Testing methods for X-machines: a review. |
Formal Aspects Comput. |
2006 |
DBLP DOI BibTeX RDF |
Software testing, Finite state machines, Test set generation, X-machines |
32 | Jing Guan, Jeff Offutt, Paul Ammann |
An industrial case study of structural testing applied to safety-critical embedded software. |
ISESE |
2006 |
DBLP DOI BibTeX RDF |
software testing, embedded software, industrial case study |
32 | Sebastian P. Ng, Tafline Murnane, Karl Reed, D. Grant, Tsong Yueh Chen |
A Preliminary Survey on Software Testing Practices in Australia. |
Australian Software Engineering Conference |
2004 |
DBLP DOI BibTeX RDF |
Software engineering, software testing, survey |
32 | Machiel van der Bijl, Arend Rensink, Jan Tretmans |
Compositional Testing with ioco. |
FATES |
2003 |
DBLP DOI BibTeX RDF |
|
32 | Cheer-Sun D. Yang, Lori L. Pollock |
Towards a Structural Load Testing Tool. |
ISSTA |
1996 |
DBLP DOI BibTeX RDF |
|
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