Search results for "single-event"

Hits ?▲	Authors	Title	Venue	Year	Link
9	S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul	Effect of Temperature on Single Event Latchup Sensitivity.	DTIS	2020	DBLP DOI BibTeX RDF
9	Cheng Gao, Rui Zhang 0044, Jiaoying Huang, Chengcheng Fu	Study of single event transient induced by heavy-ion in NMOS transistor and CMOS inverter.	Concurr. Comput. Pract. Exp.	2019	DBLP DOI BibTeX RDF
9	Sarah Azimi, Boyang Du, Luca Sterpone, David Merodio Codinachs, Raoul Grimoldi, L. Cattaneo	A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs.	Integr.	2019	DBLP DOI BibTeX RDF
9	Jizuo Zhang, Liang Fang, Jianjun Chen, Shen Hou, Xianyu Tong	Single Event Transient Study of pMOS Transistors in 65 nm Technology With and Without a Deep n+ Well Under Particle Striking.	IEEE Access	2019	DBLP DOI BibTeX RDF
9	Aibin Yan, Jun Zhou 0016, Yuanjie Hu, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen	Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets.	IEEE Access	2019	DBLP DOI BibTeX RDF
9	Hyungmin Cho, Kon-Woo Kwon	Modeling Application-Level Soft Error Effects for Single-Event Multi-Bit Upsets.	IEEE Access	2019	DBLP DOI BibTeX RDF
9	Jingyan Xu, Yang Guo, Ruiqiang Song, Bin Liang, Yaqing Chi	Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs.	Symmetry	2019	DBLP DOI BibTeX RDF
9	Jizuo Zhang, Jianjun Chen, Pengcheng Huang, Shouping Li, Liang Fang	The Effect of Deep N+ Well on Single-Event Transient in 65 nm Triple-Well NMOSFET.	Symmetry	2019	DBLP DOI BibTeX RDF
9	Zeynab Mohseni, Pedro Reviriego	Reliability characterization and activity analysis of lowRISC internal modules against single event upsets using fault injection and RTL simulation.	Microprocess. Microsystems	2019	DBLP DOI BibTeX RDF
9	Xuebing Cao, Liyi Xiao, Jie Li 0030, Rongsheng Zhang, Shanshan Liu 0001, Jinxiang Wang 0001	A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs).	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2019	DBLP DOI BibTeX RDF
9	Mingxue Huo, Guoliang Ma, Bin Zhou, Liyi Xiao, Chunhua Qi, Yanqing Zhang 0012, Jianning Ma, Yinghun Piao, Tianqi Wang	Single-event upset prediction in static random access memory cell account for parameter variations.	Sci. China Inf. Sci.	2019	DBLP DOI BibTeX RDF
9	Shuo Cai, Weizheng Wang, Fei Yu 0009, Binyong He	Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits.	J. Electron. Test.	2019	DBLP DOI BibTeX RDF
9	Zheyu Yan, Yiyu Shi 0001, Wang Liao, Masanori Hashimoto, Xichuan Zhou, Cheng Zhuo	When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies.	CoRR	2019	DBLP BibTeX RDF
9	Changyong Liu, Nianlong Liu, Zhiting Lin, Xiulong Wu, Chunyu Peng, Qiang Zhao 0007, Xuan Li, Junning Chen, Xuan Zeng 0001, Xiangdong Hu	A single event upset tolerant latch with parallel nodes.	IEICE Electron. Express	2019	DBLP DOI BibTeX RDF
9	Liewei Xu, Chang Cai, Tianqi Liu, Lingyun Ke, Jun Yu 0010, Chang Wu	Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits.	IEICE Electron. Express	2019	DBLP DOI BibTeX RDF
9	Changyong Liu, Zhiting Lin, Xiulong Wu, Chunyu Peng, Qiang Zhao 0007, Xuan Li, Junning Chen, Xuan Zeng 0001, Xiangdong Hu	An inverter chain with parallel output nodes for eliminating single-event transient pulse.	IEICE Electron. Express	2019	DBLP DOI BibTeX RDF
9	Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen	Characterization of P-hit and N-hit single-event transient using heavy ion microbeam.	IEICE Electron. Express	2019	DBLP DOI BibTeX RDF
9	Qian Di, Zhongxing Zhang, Honglong Li, Zhao Zhang 0004, Peng Feng 0001, Nanjian Wu	Single event upset failure probability evaluation and periodic scrubbing techniques for hierarchical parallel vision processors.	IEICE Electron. Express	2019	DBLP DOI BibTeX RDF
9	Qiang Zhao 0007, Chunyu Peng, Changyong Liu, Xiulong Wu	Physical mechanism study of N-well doping effects on the single-event transient characteristic of PMOS.	IEICE Electron. Express	2019	DBLP DOI BibTeX RDF
9	Rafael B. Schvittz, Denis Teixeira Franco, Leomar Soares, Paulo Francisco Butzen	A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates.	VLSI-SoC	2019	DBLP DOI BibTeX RDF
9	Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa, Paulo F. Butzen	An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults.	VLSI-SoC (Selected Papers)	2019	DBLP DOI BibTeX RDF
9	Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis	Impact of Process Variability and Single Event Transient on FinFET Technology.	VLSI-SoC	2019	DBLP DOI BibTeX RDF
9	Jun Furuta, Yuto Tsukita, Kodai Yamada, Mitsunori Ebara, Kentaro Kojima, Kazutoshi Kobayashi	Impact of Combinational Logic Delay for Single Event Upset on Flip Flops in a 65 nm FDSOI Process.	IRPS	2019	DBLP DOI BibTeX RDF
9	Zhilu Ye, Rui Liu 0005, Hugh J. Barnaby, Shimeng Yu	Evaluation of Single Event Effects in SRAM and RRAM Based Neuromorphic Computing System for Inference.	IRPS	2019	DBLP DOI BibTeX RDF
9	Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill	Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.	IRPS	2019	DBLP DOI BibTeX RDF
9	Kentaro Kojima, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi	An Accurate Device-Level Simulation Method to Estimate Cross Sections of Single Event Upsets by Silicon Thickness in Raised Layer.	IRPS	2019	DBLP DOI BibTeX RDF
9	Xuebing Cao, Liyi Xiao, Linzhe Li, Jie Li 0030, Tianqi Wang	Simulation of Proton Induced Single Event Upsets in Bulk Nano-CMOS SRAMs.	ICICDT	2019	DBLP DOI BibTeX RDF
9	Zhongshan Zheng, Zhentao Li, Bo Li 0051, Jiajun Luo, Zhengsheng Han	Influences of the Source and Drain Resistance of the MOSFETs on the Single Event Upset Hardness of SRAM cells.	ASICON	2019	DBLP DOI BibTeX RDF
9	Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen	A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area.	ASICON	2019	DBLP DOI BibTeX RDF
9	Yu Ma, Dingcheng Jia, Huifan Zhang, Ruoyu Wang 0014, Pingqiang Zhou	A Compact Memory Structure based on 2T1R Against Single-Event Upset in RRAM Arrays.	ASICON	2019	DBLP DOI BibTeX RDF
9	Xiaoyu Zhang, Bin Liang, Ruiqiang Song	Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient.	ASICON	2019	DBLP DOI BibTeX RDF
9	Donald Kline Jr., Stephen Longofono, Rami G. Melhem, Alex K. Jones	Predicting Single Event Effects in DRAM.	DFT	2019	DBLP DOI BibTeX RDF
9	Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone	Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks.	DTIS	2019	DBLP DOI BibTeX RDF
9	Cuiping Shao, Huiyun Li	Identifying Single-Event Transient Location Based on Compressed Sensing.	IEEE Trans. Very Large Scale Integr. Syst.	2018	DBLP DOI BibTeX RDF
9	Robért Glein, Florian Rittner, Albert Heuberger	Adaptive single-event effect mitigation for dependable processing systems based on FPGAs.	Microprocess. Microsystems	2018	DBLP DOI BibTeX RDF
9	Nanditha P. Rao, Madhav P. Desai	Quantification of the likelihood of single event multiple transients in logic circuits in bulk CMOS technology.	Microelectron. J.	2018	DBLP DOI BibTeX RDF
9	David González Ramírez, Sunil Lalchand Khemchandani, Javier del Pino, Daniel Mayor-Duarte, Mario San Miguel-Montesdeoca, Sergio Mateos-Angulo	Single event transients mitigation techniques for CMOS integrated VCOs.	Microelectron. J.	2018	DBLP DOI BibTeX RDF
9	Edward Carlisle, Alan D. George	Dynamic Robust Single-Event Upset Simulator.	J. Aerosp. Inf. Syst.	2018	DBLP DOI BibTeX RDF
9	Mengtian Bao, Ying Wang 0041, Xingji Li, Chaoming Liu, Cheng-Hao Yu, Fei Cao	Simulation study of single event effects in the SiC LDMOS with a step compound drift region.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Lili Ding, Wei Chen, Hongxia Guo, Tan Wang, Rongmei Chen, Yinhong Luo, Fengqi Zhang, Xiaoyu Pan	Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Sarah Azimi, Luca Sterpone, Boyang Du, Luca Boragno	On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Zhizhan Yang, Xiaodong Xie, Xue Fan, Yubo Ren	A novel single-event-hardened charge pump using cascode voltage switch logic gates.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Jizuo Zhang, Jianjun Chen, Pengcheng Huang, Shouping Li, Liang Fang	Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Nilson Maciel, Elaine Crespo Marques, Lirida A. B. Naviner, Hao Cai	Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li 0051, Gang Guo, Li Chen 0001, Sang H. Baeg	A single event upset tolerant latch design.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Jinshun Bi, Yuan Duan, Kai Xi, Bo Li 0051	Total ionizing dose and single event effects of 1 Mb HfO2-based resistive-random-access memory.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Yuanqing Li, Li Chen 0001, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu 0011, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong	Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Wen Zhao, Chaohui He, Wei Chen, Rongmei Chen, Peitian Cong, Fengqi Zhang, Zujun Wang, Chen Shen, Lisang Zheng, Xiaoqiang Guo, Lili Ding	Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
9	Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey	Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature.	Sensors	2018	DBLP DOI BibTeX RDF
9	Changyong Liu, Chunyu Peng, Zhiting Lin, Xiulong Wu, Ziyang Chen, Qiang Zhao 0007, Xuan Li, Junning Chen, Xuan Zeng 0001, Xiangdong Hu	A dual-output hardening design of inverter chain for P-hit single-event transient pulse elimination.	IEICE Electron. Express	2018	DBLP DOI BibTeX RDF
9	Tiehu Li, Yintang Yang, Liang Li, Jia Liu, Junan Zhang	Effectiveness of the layout approach in mitigating single event transients in 65-nm bulk CMOS process.	IEICE Electron. Express	2018	DBLP DOI BibTeX RDF
9	Ne Kyaw Zwa Lwin, H. Sivaramakrishnan, Kwen-Siong Chong, Tong Lin 0001, Wei Shu, Joseph S. Chang	Single-Event-Transient Resilient Memory for DSP in Space Applications.	DSP	2018	DBLP DOI BibTeX RDF
9	Robert G. Pettit IV, Aedan D. Pettit	Detecting Single Event Upsets in Embedded Software.	ISORC	2018	DBLP DOI BibTeX RDF
9	Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae	Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit.	IRPS	2018	DBLP DOI BibTeX RDF
9	Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva	Single-event effects on optical transceiver.	IRPS	2018	DBLP DOI BibTeX RDF
9	Sarah Azimi, Boyang Du, Luca Sterpone	On the mitigation of single event transients on flash-based FPGAs.	ETS	2018	DBLP DOI BibTeX RDF
9	Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa Jr., Paulo F. Butzen	Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults.	ICECS	2018	DBLP DOI BibTeX RDF
9	Sarah Azimi, Boyang Du, Luca Sterpone, David Merodio Codinachs, L. Cattaneo	SETA: A CAD Tool for Single Event Transient Analysis and Mitigation on Flash-Based FPGAs.	SMACD	2018	DBLP DOI BibTeX RDF
9	Juliano Oliveira, Marcilei Aparecida Guazzelli, Marco Antonio Assis, Renato C. Giacomini	Single event effect: Simulations and analysis on 3N163 PMOS transistor.	LATS	2018	DBLP DOI BibTeX RDF
9	Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren	Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels.	DFT	2018	DBLP DOI BibTeX RDF
9	Zhen Gao 0001, Lina Yan, Jinhua Zhu, Ruishi Han, Pedro Reviriego	Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in FPGA Implemented Viterbi Decoders.	DFT	2018	DBLP DOI BibTeX RDF
9	Valentin Gutierrez, Gildas Léger	Single Event Transient injection in large mixed-signal circuits.	DCIS	2018	DBLP DOI BibTeX RDF
9	Austin P. Arechiga, Alan J. Michaels	The Robustness of Modern Deep Learning Architectures against Single Event Upset Errors.	HPEC	2018	DBLP DOI BibTeX RDF
9	Naga Raghuram CH, D. Manohar Reddy, Puli Kishore Kumar, Gaurav Kaushal	Robust SRAM Cell Development for Single-Event Multiple Effects.	VDAT	2018	DBLP DOI BibTeX RDF
9	Ramin Rajaei, Bahar Asgari, Mahmoud Tabandeh, Mahdi Fazeli	Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology.	Turkish J. Electr. Eng. Comput. Sci.	2017	DBLP DOI BibTeX RDF
9	Pasupathy K. Ramaniharan, Bindu Boby	Widening and narrowing of time interval due to single-event transients in 45 nm vernier-type TDC.	IET Circuits Devices Syst.	2017	DBLP DOI BibTeX RDF
9	Tomohiro Harada, Keiki Takadama	Machine-Code Program Evolution by Genetic Programming Using Asynchronous Reference-Based Evaluation Through Single-Event Upset in On-Board Computer.	J. Robotics Mechatronics	2017	DBLP DOI BibTeX RDF
9	Drew Pitney Higginson	A full-angle Monte-Carlo scattering technique including cumulative and single-event Rutherford scattering in plasmas.	J. Comput. Phys.	2017	DBLP DOI BibTeX RDF
9	Alfonso Sánchez-Macián, Pedro Reviriego, Juan Antonio Maestro, Shanshan Liu 0001	Single Event Transient Tolerant Bloom Filter Implementations.	IEEE Trans. Computers	2017	DBLP DOI BibTeX RDF
9	Varadan Savulimedu Veeravalli, Andreas Steininger, Ulrich Schmid 0001	A versatile architecture for long-term monitoring of single-event transient durations.	Microprocess. Microsystems	2017	DBLP DOI BibTeX RDF
9	T. R. Rajalakshmi, R. Sudhakar 0001	Impact of Single Event Upset on Voltage and Current Behaviors of CNTFET SRAM and a Comparison with CMOS SRAM.	J. Circuits Syst. Comput.	2017	DBLP DOI BibTeX RDF
9	Bin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan	Comparison of single-event upset generated by heavy ion and pulsed laser.	Sci. China Inf. Sci.	2017	DBLP DOI BibTeX RDF
9	Peipei Hao, Shuming Chen, Pengcheng Huang, Jianjun Chen, Bin Liang	Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation.	Sci. China Inf. Sci.	2017	DBLP DOI BibTeX RDF
9	Jinxin Zhang, Hongxia Guo, Fengqi Zhang, Chaohui He, Pei Li, Yunyi Yan, Hui Wang, Linxia Zhang	Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.	Sci. China Inf. Sci.	2017	DBLP DOI BibTeX RDF
9	Jiaqi Liu, Yuanfu Zhao, Liang Wang 0024, Dan Wang, Hongchao Zheng, Maoxin Chen, Lei Shu 0001, Tongde Li, Dongqiang Li, Wei Guo	High energy proton and heavy ion induced single event transient in 65-nm CMOS technology.	Sci. China Inf. Sci.	2017	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria	Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits.	J. Electron. Test.	2017	DBLP DOI BibTeX RDF
9	Tengyue Yi, Yi Liu 0060, Yintang Yang	A Study of PN Junction Diffusion Capacitance of MOSFET in Presence of Single Event Transient.	J. Electron. Test.	2017	DBLP DOI BibTeX RDF
9	Jiongjiong Mo, Hua Chen 0003, Liping Wang, Fa-Xin Yu	Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and Passivation.	J. Electron. Test.	2017	DBLP DOI BibTeX RDF
9	Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Yiming Ouyang, Honghui Deng	Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS.	Microelectron. J.	2017	DBLP DOI BibTeX RDF
9	Qifeng Zhao, Guoqing Yang, YongJie Sun, PeiFu Yu, Jianjun Chen, Bin Liang	Research on the effect of single-event transient of an on-chip linear voltage regulator fabricated on 130 nm commercial CMOS technology.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Daniela Munteanu, Jean-Luc Autran, Soilihi Moindjie	Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Rongmei Chen, Wei Chen, Xiaoqiang Guo, Chen Shen, Fengqi Zhang, Lisang Zheng, Wen Zhao, Lili Ding, Yinhong Luo, Hongxia Guo, Yuanming Wang, Yinong Liu	Improved on-chip self-triggered single-event transient measurement circuit design and applications.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Thales E. Becker, Alisson J. C. Lanot, Guilherme Schwanke Cardoso, Tiago R. Balen	Single event transient effects on charge redistribution SAR ADCs.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Muhammad Sajid 0003, Nikolay G. Chechenin, Frank Sill Torres, Usman Ali Gulzari, Muhammad Usman Butt, Zhu Ming, E. U. Khan	Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Xuecheng Du, Shuhuan Liu, Dongyang Luo, Yao Zhang, Xiaozhi Du, Chaohui He, Xiaotang Ren, Weitao Yang, Yuan Yuan	Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Alexis Ramos, Juan Antonio Maestro, Pedro Reviriego	Characterizing a RISC-V SRAM-based FPGA implementation against Single Event Upsets using fault injection.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Ramin Rajaei	Single event double node upset tolerance in MOS/spintronic sequential and combinational logic circuits.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Mélanie Raine, Marc Gaillardin, Thierry Lagutere, Olivier Duhamel, Philippe Paillet	Estimating the Single-Event Upset sensitivity of a memory array using simulation.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné	A calculation method to estimate single event upset cross section.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
9	Mladen Mitrovic, Michael Hofbauer, Bernhard Goll, Kerstin Schneider-Hornstein, Robert Swoboda, Bernhard Steindl, Kay-Obbe Voss, Horst Zimmermann	A DC-to-8.5 GHz 32 : 1 Analog Multiplexer for On-Chip Continuous-Time Probing of Single-Event Transients in a 65-nm CMOS.	IEEE Trans. Circuits Syst. II Express Briefs	2017	DBLP DOI BibTeX RDF
9	Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi	A single event transient detector in SRAM-based FPGAs.	IEICE Electron. Express	2017	DBLP DOI BibTeX RDF
9	Jose Ignacio Serrano, M. Dolores del Castillo, Cristina Bayon, Oscar Ramirez, Sergio Lerma Lara, I. Martínez-Caballero, Eduardo Rocon	BCI-Based Facilitation of Cortical Activity Associated to Gait Onset After Single Event Multi-level Surgery in Cerebral Palsy.	Brain-Computer Interface Research (5)	2017	DBLP DOI BibTeX RDF
9	K. Ben Ali, P. M. Gammon, C. W. Chan, F. Li, V. Pathirana, T. Trajkovic, Farzan Gity, Denis Flandre, Valeria Kilchytska	Single event effects and total ionising dose in 600V Si-on-SiC LDMOS transistors for rad-hard space applications.	ESSDERC	2017	DBLP DOI BibTeX RDF
9	Tingting Yu, Lei Chen 0010, Xuewu Li, Shuo Wang, Jing Zhou	Analyzing the Single Event Upset Sensitivity of Digital Clock Manager in Virtex-5 FPGA.	IEEA	2017	DBLP DOI BibTeX RDF
9	Kalle Ngo, Tage Mohammadat, Johnny Öberg	Towards a single event upset detector based on COTS FPGA.	NORCAS	2017	DBLP DOI BibTeX RDF
9	Eleftherios Kyriakakis, Kalle Ngo, Johnny Öberg	Mitigating single-event upsets in COTS SDRAM using an EDAC SDRAM controller.	NORCAS	2017	DBLP DOI BibTeX RDF
9	Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis 0001	Process and temperature impact on single-event transients in 28nm FDSOI CMOS.	LASCAS	2017	DBLP DOI BibTeX RDF
9	Wenxiong Mo, Zhong Xu, Zhiyuan Ma, Chenyi Li, Wenqing Lu	Estimation of single-event voltage sags using a novel classification method.	IECON	2017	DBLP DOI BibTeX RDF
9	Jia Wang, Ping Li, Xiaomin Wei, Ran Zheng, Yann Hu	A single event transient immune oscillator for DC-DC converter controllers.	ICSPCC	2017	DBLP DOI BibTeX RDF
9	Cuiping Shao, Huiyun Li	Detection of Single Event Transients Based on Compressed Sensing.	TrustCom/BigDataSE/ICESS	2017	DBLP DOI BibTeX RDF