Search results for "yield"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
24	Haile Yu, Qiang Xu 0001, Philip Heng Wai Leong	On Timing Yield Improvement for FPGA Designs Using Architectural Symmetry.	FPL	2011	DBLP DOI BibTeX RDF	Architectural Symmetry, LE swap, FPGA, Timing Yield
24	Jie Zhang 0007, Shashikanth Bobba, Nishant Patil, Albert Lin, H.-S. Philip Wong, Giovanni De Micheli, Subhasish Mitra	Carbon nanotube correlation: promising opportunity for CNFET circuit yield enhancement.	DAC	2010	DBLP DOI BibTeX RDF	CNT correlation, carbon nanotube, yield optimization, CNT
24	Andrew B. Kahng, Chul-Hong Park, Puneet Sharma, Qinke Wang	Lens aberration aware placement for timing yield.	ACM Trans. Design Autom. Electr. Syst.	2009	DBLP DOI BibTeX RDF	Layout, design for manufacturing, lithography, timing yield
24	Jun Xie, Minghui Lu, Hui-zhen Liang, Peng Lin	The Research and Application of BP Network Tracking Model for Forecasting Oil Well Yield.	PACIIA (1)	2008	DBLP DOI BibTeX RDF	oil well yield, Roll Forecasting, Tracking Model, Artificial Neural Network, BP
24	Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko	Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.	DELTA	2008	DBLP DOI BibTeX RDF	wafer testing, reliability, integrated circuits, burn-in, yield modelling
24	Bogdan M. Maziarz, Vijay K. Jain	Automatic Reconfiguration and Yield of the TESH Multicomputer Network.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	TESH, fault-tolerance, routing, VLSI, Interconnection networks, reconfiguration, redundancy, yield, hierarchical networks, manufacturing defects, parallel computing systems, ULSI
24	Dimitris Nikolos, Haridimos T. Vergos	On the Yield of VLSI Processors with On-Chip CPU Cache.	IEEE Trans. Computers	1999	DBLP DOI BibTeX RDF	on-chip CPU caches, partially good chips, Fault tolerance, yield enhancement
24	Charles H. Stapper	Improved Yield Models for Fault-Tolerant Memory Chips.	IEEE Trans. Computers	1993	DBLP DOI BibTeX RDF	fault-tolerant memory chips, defect-monitor data, redundant circuits, failure mechanisms, multivariate distributions, dynamic-random-access-memory, pragmatic approximation, fault tolerant computing, redundancy, DRAM chips, yield modeling, frequency distributions
24	Gurindar S. Sohi	Cache Memory Organization to Enhance the Yield of High-Performance VLSI Processors.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	cache memory organization, high performance VLSI processors, tolerance of defects faults, linear RAMs, trace-driven simulation analysis, storage management chips, VLSI, yield, fault location, buffer storage, performance degradation, random-access storage, integrated memory circuits
24	Michael C. Howells, Vinod K. Agarwal	A Reconfiguration Scheme for Yield Enhancement of Large Area Binary Tree Architectures.	IEEE Trans. Computers	1988	DBLP DOI BibTeX RDF	large area binary tree architectures, reliability enhancement, partially global redundancy, programmable switches, VLSI, fault tolerant computing, computer architecture, trees (mathematics), yield enhancement, reconfiguration scheme
24	Israel Koren, Dhiraj K. Pradhan	Modeling the Effect of Redundancy on Yield and Performance of VLSI Systems.	IEEE Trans. Computers	1987	DBLP DOI BibTeX RDF	Computational availability, fault tolerance, reliability, redundancy, VLSI designs, yield, wafer-scale integration
24	Tülin Erdim Mangir, Algirdas Avizienis	Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs.	IEEE Trans. Computers	1982	DBLP DOI BibTeX RDF	VLSI fault tolerance, Interconnect area estimates, redundancy partitioning, redundancy placement, regular designs, VLSI yield improvement
23	Daniel K. Beece, Jinjun Xiong, Chandu Visweswariah, Vladimir Zolotov, Yifang Liu	Transistor sizing of custom high-performance digital circuits with parametric yield considerations.	DAC	2010	DBLP DOI BibTeX RDF	custom circuits, optimization
23	Giuseppe Nicosia, Giovanni Stracquadanio	A Design-for-Yield Algorithm to Assess and Improve the Structural and Energetic Robustness of Proteins and Drugs.	SEA	2009	DBLP DOI BibTeX RDF
23	Gregory Lucas, Scott Cromar, Deming Chen	FastYield: variation-aware, layout-driven simultaneous binding and module selection for performance yield optimization.	ASP-DAC	2009	DBLP DOI BibTeX RDF
23	Nancy Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li 0001, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi	The impact of BEOL lithography effects on the SRAM cell performance and yield.	ISQED	2009	DBLP DOI BibTeX RDF
23	Javid Jaffari, Mohab Anis	Timing yield estimation of digital circuits using a control variate technique.	ISQED	2009	DBLP DOI BibTeX RDF
23	Jwu-E Chen, Pei-Wen Luo, Chin-Long Wey	Yield evaluation of analog placement with arbitrary capacitor ratio.	ISQED	2009	DBLP DOI BibTeX RDF
23	Costas Argyrides, Ahmad A. Al-Yamani, Carlos Arthur Lang Lisbôa, Luigi Carro, Dhiraj K. Pradhan	Increasing memory yield in future technologies through innovative design.	ISQED	2009	DBLP DOI BibTeX RDF
23	Jin Sun 0006, Jun Li 0066, Dongsheng Ma, Janet Meiling Wang	Chebyshev Affine-Arithmetic-Based Parametric Yield Prediction Under Limited Descriptions of Uncertainty.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
23	Xin Li 0001, Yaping Zhan, Lawrence T. Pileggi	Quadratic Statistical MAX Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
23	Jin Sun 0006, Yue Huang, Jun Li 0066, Janet Meiling Wang	Chebyshev Affine Arithmetic based parametric yield prediction under limited descriptions of uncertainty.	ASP-DAC	2008	DBLP DOI BibTeX RDF
23	Amit Goel, Sarvesh Bhardwaj, Praveen Ghanta, Sarma B. K. Vrudhula	Computation of Joint Timing Yield of Sequential Networks Considering Process Variations.	PATMOS	2007	DBLP DOI BibTeX RDF
23	Paolo Azzoni, Massimo Bertoletti, Nicola Dragone, Franco Fummi, Carlo Guardiani, W. Vendraminetto	Yield-aware placement optimization.	DATE	2007	DBLP DOI BibTeX RDF
23	Bao Liu 0001, Andrew B. Kahng, Xu Xu 0001, Jiang Hu, Ganesh Venkataraman	A Global Minimum Clock Distribution Network Augmentation Algorithm for Guaranteed Clock Skew Yield.	ASP-DAC	2007	DBLP DOI BibTeX RDF
23	Vivek Joshi, David T. Blaauw, Dennis Sylvester	Soft-edge flip-flops for improved timing yield: design and optimization.	ICCAD	2007	DBLP DOI BibTeX RDF
23	Hyunjin Lee, Sangyeun Cho, Bruce R. Childers	Exploring the interplay of yield, area, and performance in processor caches.	ICCD	2007	DBLP DOI BibTeX RDF
23	Subarna Sinha, Qing Su, Linni Wen, Frank Lee, Charles C. Chiang, Yi-Kan Cheng, Jin-Lien Lin, Yu-Chyi Harn	A New Flexible Algorithm for Random Yield Improvement.	ISQED	2007	DBLP DOI BibTeX RDF
23	Uthman Alsaiari, Resve A. Saleh	Power, Delay and Yield Analysis of BIST/BISR PLAs Using Column Redundancy.	ISQED	2007	DBLP DOI BibTeX RDF
23	Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas	Processing High Volume Scan Test Results for Yield Learning.	ISQED	2007	DBLP DOI BibTeX RDF
23	Jin-Tai Yan, Bo-Yi Chiang	Timing-Constrained Yield-Driven Wiring Reconstruction for Critical Area Minimization.	VLSI Design	2007	DBLP DOI BibTeX RDF
23	Rajeev R. Rao, Anirudh Devgan, David T. Blaauw, Dennis Sylvester	Analytical yield prediction considering leakage/performance correlation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
23	Lei-Ting Chen, David Lin, Dan Muuniz, Chia-Jiu Wang	Wafer Yield Estimation Using Support Vector Machines.	ISNN (2)	2006	DBLP DOI BibTeX RDF
23	Kenneth L. Shepard, Daniel N. Maynard	Variability and yield improvement: rules, models, and characterization.	ICCAD	2006	DBLP DOI BibTeX RDF
23	Abhishek Somani, P. P. Chakrabarti 0001, Amit Patra	A model-based hybrid evolutionary algorithm for fast yield-inclusive design space exploration of analog circuits.	ISCAS	2006	DBLP DOI BibTeX RDF
23	Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park, Rouwaida Kanj, Sani R. Nassif	System-Level SRAM Yield Enhancement.	ISQED	2006	DBLP DOI BibTeX RDF
23	Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer	An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance.	VTS	2006	DBLP DOI BibTeX RDF
23	A. Majid Awan, Mohd. Noor Md. Sap	An Intelligent System Based on Kernel Methods for Crop Yield Prediction.	PAKDD	2006	DBLP DOI BibTeX RDF
23	Amit Agarwal 0001, Bipul Chandra Paul, Hamid Mahmoodi-Meimand, Animesh Datta, Kaushik Roy 0001	A process-tolerant cache architecture for improved yield in nanoscale technologies.	IEEE Trans. Very Large Scale Integr. Syst.	2005	DBLP DOI BibTeX RDF
23	Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy 0001	Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
23	Animesh Datta, Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy 0001	Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology.	IOLTS	2005	DBLP DOI BibTeX RDF
23	Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian	SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure.	IEEE Des. Test Comput.	2004	DBLP DOI BibTeX RDF
23	Mauro Olivieri, Mirko Scarana, Giuseppe Scotti, Alessandro Trifiletti	Yield Optimization by Means of Process Parameters Estimation: Comparison Between ABB and ASV Techniques.	PATMOS	2004	DBLP DOI BibTeX RDF
23	Nicola Dragone, Michele Quarantelli, Massimo Bertoletti, Carlo Guardiani	High Yield Standard Cell Libraries: Optimization and Modeling.	PATMOS	2004	DBLP DOI BibTeX RDF
23	Shanrui Zhang, Minsu Choi, Nohpill Park	Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme.	DFT	2004	DBLP DOI BibTeX RDF
23	Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi	On The Yield of Compiler-Based eSRAMs.	DFT	2004	DBLP DOI BibTeX RDF
23	Phillip Christie, José Pineda de Gyvez	Prelayout interconnect yield prediction.	IEEE Trans. Very Large Scale Integr. Syst.	2003	DBLP DOI BibTeX RDF
23	Bart De Smedt, Georges G. E. Gielen	HOLMES: Capturing the Yield-Optimized Design Space Boundaries of Analog and RF Integrated Circuits.	DATE	2003	DBLP DOI BibTeX RDF
23	Marko Kosunen, Jouko Vankka, Ilari Teikari, Kari Halonen	DNL and INL yield models for a current-steering D/A converter.	ISCAS (1)	2003	DBLP DOI BibTeX RDF
23	Tao Feng, Nohpill Park, Yong-Bin Kim, Vincenzo Piuri	Yield Modeling and Analysis of a Clockless Asynchronous Wave Pipeline with Pulse Faults.	DFT	2003	DBLP DOI BibTeX RDF
23	Xiaopeng Wang, Marco Ottavi, Fabrizio Lombardi	Yield Analysis of Compiler-Based Arrays of Embedded SRAMs.	DFT	2003	DBLP DOI BibTeX RDF
23	Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi	Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.	DFT	2002	DBLP DOI BibTeX RDF
23	Bogdan M. Maziarz, Vijay K. Jain	Yield Estimates for the TESH Multicomputer Network.	DFT	2002	DBLP DOI BibTeX RDF
23	Gerard A. Allan	Yield prediction by sampling IC layout.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
23	Tianxu Zhao, Yue Hao, Yong-Chang Jiao	VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy.	DFT	2000	DBLP DOI BibTeX RDF
23	Tuna B. Tarim, Mohammed Ismail 0001	Functional yield enhancement and statistical design of a low power transconductor.	ISCAS (2)	1999	DBLP DOI BibTeX RDF
23	Ting Wu, Say Wei Foo	An efficient method for parametric yield gradient estimation.	ISCAS (1)	1999	DBLP DOI BibTeX RDF
23	Brian Murphy	Modelling the Yield of Number Field Sieve Polynominals.	ANTS	1998	DBLP DOI BibTeX RDF
23	Israel Koren, Zahava Koren	Yield and Routing Objectives in Floorplanning.	DFT	1998	DBLP DOI BibTeX RDF
23	Zahava Koren, Israel Koren	On the effect of floorplanning on the yield of large area integrated circuits.	IEEE Trans. Very Large Scale Integr. Syst.	1997	DBLP DOI BibTeX RDF
23	Witold A. Pleskacz, Wojciech Maly	Improved Yield Model for Submicron Domain.	DFT	1997	DBLP DOI BibTeX RDF
23	Neil J. Howard, Andrew M. Tyrrell, Nigel M. Allinson	The yield enhancement of field-programmable gate arrays.	IEEE Trans. Very Large Scale Integr. Syst.	1994	DBLP DOI BibTeX RDF
23	Chin-Long Wey, Jyhyeung Ding, Tsin-Yuan Chang	Design of Repairable and Fully Diagnosable Folded PLAs for Yield Enhancement.	DAC	1990	DBLP DOI BibTeX RDF
23	Max Dauchet, Erick Timmerman	Decidability of yield's equality for infinite regular trees.	Automata on Infinite Words	1984	DBLP DOI BibTeX RDF
22	Dessislava Ganeva, Eugenia Roumenina, Petar Dimitrov, Alexander Gikov, Violeta Bozhanova, Rangel Dragov, Georgi Jelev, Krasimira Taneva	Preharvest Durum Wheat Yield, Protein Content, and Protein Yield Estimation Using Unmanned Aerial Vehicle Imagery and Pléiades Satellite Data in Field Breeding Experiments.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
22	Varvara Voinarovska, Mikhail Kabeshov, Dmytro Dudenko, Samuel Genheden, Igor V. Tetko	When Yield Prediction Does Not Yield Prediction: An Overview of the Current Challenges.	J. Chem. Inf. Model.	2024	DBLP DOI BibTeX RDF
22	Greg Lyle, Kenneth D. Clarke, Adam D. Kilpatrick, David McCulloch Summers, Bertram Ostendorf	A Spatial and Temporal Evaluation of Broad-Scale Yield Predictions Created from Yield Mapping Technology and Landsat Satellite Imagery in the Australian Mediterranean Dryland Cropping Region.	ISPRS Int. J. Geo Inf.	2023	DBLP DOI BibTeX RDF
22	Nicoleta Darra, Borja Espejo-García, Aikaterini Kasimati, Olga Kriezi, Emmanouil Psomiadis, Spyros Fountas	Can Satellites Predict Yield? Ensemble Machine Learning and Statistical Analysis of Sentinel-2 Imagery for Processing Tomato Yield Prediction.	Sensors	2023	DBLP DOI BibTeX RDF
22	Patrick Helber, Benjamin Bischke, Peter Habelitz, Cristhian Sanchez, Deepak Pathak, Miro Miranda, Hiba Najjar, Francisco Alejandro Mena, Jayanth Siddamsetty, Diego Arenas, Michaela Vollmer, Marcela Charfuelan, Marlon Nuske, Andreas Dengel 0001	Crop Yield Prediction: An Operational Approach to Crop Yield Modeling on Field and Subfield Level with Machine Learning Models.	IGARSS	2023	DBLP DOI BibTeX RDF
22	Qi Zhang, Kaiyi Wang, Yanyun Han, Zhongqiang Liu, Feng Yang, Shufeng Wang, Xiangyu Zhao 0004, Chunjiang Zhao 0001	A crop variety yield prediction system based on variety yield data compensation.	Comput. Electron. Agric.	2022	DBLP DOI BibTeX RDF
22	Tanuj Misra, Alka Arora, Sudeep Marwaha, Ranjeet Ranjan Jha, Mrinmoy Ray, Shailendra Kumar, Sudhir Kumar 0003, Viswanathan Chinnusamy	Yield-SpikeSegNet: An Extension of SpikeSegNet Deep-Learning Approach for the Yield Estimation in the Wheat Using Visual Images.	Appl. Artif. Intell.	2022	DBLP DOI BibTeX RDF
22	Renata Duffková, Lucie Poláková, Vojtech Lukas, Petr Fucík	The Effect of Controlled Tile Drainage on Growth and Grain Yield of Spring Barley as Detected by UAV Images, Yield Map and Soil Moisture Content.	Remote. Sens.	2022	DBLP DOI BibTeX RDF
22	Shuo Chen, Weihang Liu, Puyu Feng, Tao Ye, Yuchi Ma, Zhou Zhang 0001	Improving Spatial Disaggregation of Crop Yield by Incorporating Machine Learning with Multisource Data: A Case Study of Chinese Maize Yield.	Remote. Sens.	2022	DBLP DOI BibTeX RDF
22	Sumathi M., M. Rajkamal, S. P. Raja 0001, M. Venkatachalapathy, N. Vijayaraj	A crop yield prediction model based on an improved artificial neural network and yield monitoring using a blockchain technique.	Int. J. Wavelets Multiresolution Inf. Process.	2022	DBLP DOI BibTeX RDF
22	Mamunur Rashid, Bifta Sama Bari, Yusri Yusup, Mohamad Anuar Kamaruddin, Nuzhat Khan	A Comprehensive Review of Crop Yield Prediction Using Machine Learning Approaches With Special Emphasis on Palm Oil Yield Prediction.	IEEE Access	2021	DBLP DOI BibTeX RDF
22	Dong Han, Pengxin Wang, Kevin Tansey, Shuyu Zhang 0001, Huiren Tian, Yue Zhang, Hongmei Li	Improving Wheat Yield Estimates by Integrating a Remotely Sensed Drought Monitoring Index Into the Simple Algorithm for Yield Estimate Model.	IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.	2021	DBLP DOI BibTeX RDF
22	Luis G. Riera, Matthew E. Carroll, Zhisheng Zhang, Johnathon M. Shook, Sambuddha Ghosal, Tianshuang Gao, Arti Singh, Sourabh Bhattacharya, Baskar Ganapathysubramanian, Asheesh K. Singh, Soumik Sarkar	Deep Multi-view Image Fusion for Soybean Yield Estimation in Breeding Applications Deep Multi-view Image Fusion for Soybean Yield Estimation in Breeding Applications.	CoRR	2020	DBLP BibTeX RDF
22	José A. Iglesias, Gwenael Mercier, Emad Chaparian, Ian A. Frigaard	Computing the Yield Limit in Three-dimensional Flows of a Yield Stress Fluid About a Settling Particle.	CoRR	2020	DBLP BibTeX RDF
22	Jenelle White, Aaron A. Berg, Catherine Champagne, Yinsuo Zhang, Aston Chipanshi, Bahram Daneshfar	Improving crop yield forecasts with satellite-based soil moisture estimates: An example for township level canola yield forecasts over the Canadian Prairies.	Int. J. Appl. Earth Obs. Geoinformation	2020	DBLP DOI BibTeX RDF
22	Sergii Skakun, Eric F. Vermote, Belen Franch, Jean-Claude Roger, Nataliia Kussul, Junchang Ju, Jeffrey G. Masek	Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield Models.	Remote. Sens.	2019	DBLP DOI BibTeX RDF
22	Li Yu, Jun Pei, Xinbao Liu, Wenjuan Fan, Panos M. Pardalos	The effect of yield rate in a general price-setting newsvendor model with a yield-dependent secondary market.	Int. Trans. Oper. Res.	2019	DBLP DOI BibTeX RDF
22	Anil Suat Terliksiz, D. Turgay Altýlar	Use Of Deep Neural Networks For Crop Yield Prediction: A Case Study Of Soybean Yield in Lauderdale County, Alabama, USA.	Agro-Geoinformatics	2019	DBLP DOI BibTeX RDF
22	Mengshuo Wang, Wenlong Lv, Fan Yang 0001, Changhao Yan, Wei Cai 0003, Dian Zhou, Xuan Zeng 0001	Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2018	DBLP DOI BibTeX RDF
22	Paolo Cosmo Silvestro, Stefano Pignatti, Simone Pascucci, Hao Yang 0009, Zhenhai Li, Guijun Yang, Wenjiang Huang, Raffaele Casa	Estimating Wheat Yield in China at the Field and District Scale from the Assimilation of Satellite Data into the Aquacrop and Simple Algorithm for Yield (SAFY) Models.	Remote. Sens.	2017	DBLP DOI BibTeX RDF
22	Lakesh K. Sharma, Sukhwinder K. Bali, James D. Dwyer, Andrew B. Plant, Arnab Bhowmik	A Case Study of Improving Yield Prediction and Sulfur Deficiency Detection Using Optical Sensors and Relationship of Historical Potato Yield with Weather Data in Maine.	Sensors	2017	DBLP DOI BibTeX RDF
22	Amin Aslani, Ata Allah Taleizadeh, Simone Zanoni	An EOQ model with partial backordering with regard to random yield: two strategies to improve mean and variance of the yield.	Comput. Ind. Eng.	2017	DBLP DOI BibTeX RDF
22	Renzhong Song, Tao Cheng 0003, Xia Yao, Yongchao Tian, Yan Zhu 0005, Weixing Cao	Evaluation of Landsat 8 time series image stacks for predicitng yield and yield components of winter wheat.	IGARSS	2016	DBLP DOI BibTeX RDF
22	Yu Huang 0005, Wu Yang, Wu-Tung Cheng	Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies.	ETS	2015	DBLP DOI BibTeX RDF
22	Junichi Hirase	Introduction of Yield Quadrant and Yield Capability Index for VLSI Manufacturing.	IEICE Trans. Electron.	2014	DBLP DOI BibTeX RDF
22	Yang Xu 0019, Bo Wang 0010, Jürgen Teich	Parametric yield optimization using leakage-yield-driven floorplanning.	PATMOS	2014	DBLP DOI BibTeX RDF
22	Juanjuan Dai, Yaojian Wu, Yurong Ouyang	Calculations of the National Average Yield, Equivalence Factor and Yield Factor in Ten Years Based on National Hectares' Ecological Footprint Model - A Case Study of Xiamen City.	GRMSE	2014	DBLP DOI BibTeX RDF
22	Eshan Singh	Modeling location based wafer die yield variation in estimating 3D stacked IC yield from wafer to wafer stacking.	VTS	2014	DBLP DOI BibTeX RDF
22	Felix Rembold, Clement Atzberger, Igor V. Savin, Oscar Rojas	Using Low Resolution Satellite Imagery for Yield Prediction and Yield Anomaly Detection.	Remote. Sens.	2013	DBLP DOI BibTeX RDF
22	Felix Rembold, Clement Atzberger, Igor V. Savin, Oscar Rojas	Correction: Rembold, F.; Atzberger, C.; Savin, I.; Rojas, O. Using Low Resolution Satellite Imagery for Yield Prediction and Yield Anomaly Detection. RemoteSens 2013, 5, 1704-1733.	Remote. Sens.	2013	DBLP DOI BibTeX RDF
22	Eun Ju Hwang, Wook Kim, Young Hwan Kim	Timing Yield Slack for Timing Yield-Constrained Optimization and Its Application to Statistical Leakage Minimization.	IEEE Trans. Very Large Scale Integr. Syst.	2013	DBLP DOI BibTeX RDF
22	Seyyed Hassan Khalilinezhad, Akram Reza, Midia Reshadi	Yield modeling and yield-aware mapping for application specific networks-on-chip.	NORCHIP	2011	DBLP DOI BibTeX RDF
22	Wei Tian, Zhensheng Guo, Yanxia Liu, Shenju Zhang	Research on the Yield Formation Characteristics of Zheng-Wheat 7698 under the Super-High Yield Condition.	ICDMA	2011	DBLP DOI BibTeX RDF
22	Yuanjie He, Jiang Zhang	Random yield supply chain with a yield dependent secondary market.	Eur. J. Oper. Res.	2010	DBLP DOI BibTeX RDF
22	Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta 0001	Algorithms to maximize yield and enhance yield/area of pipeline circuitry by insertion of switches and redundant modules.	DATE	2010	DBLP DOI BibTeX RDF
22	Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta 0001	SIRUP: Switch Insertion in RedUndant Pipeline Structures for Yield and Yield/Area Improvement.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF