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Found 1201 publication records. Showing 1201 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Tsung-En Lee, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi |
Characterization of Slow Traps in SiGe MOS Interfaces by TiN/Y2O3 Gate Stacks.  |
IRPS  |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Heung-Kook Ko, Sena Park, Jihyun Ryu, Sung Ryul Kim, Giwon Lee, Dongjoon Lee, Sangwoo Pae, Euncheol Lee, Yongsun Ji, Hai Jiang 0005, Taeyoung Jeong, Taiki Uemura, Dongkyun Kwon, Hyungrok Do, Hyungu Kahng, Yoon-Sang Cho, Jiyoon Lee, Seoung Bum Kim |
Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Xavier Federspiel, Cheikh Diouf, Florian Cacho, Emmanuel Vincent 0004 |
Comparison of variability of HCI induced drift for SiON and HKMG devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva |
High-Current State triggered by Operating-Frequency Change. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey Johnson, William Taylor, Myra Boenke, Byoung Min |
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Xin Ju, Diing Shenp Ang |
Gate-Oxide Trapping Enabled Synaptic Logic Transistor. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Elias Reese |
The Role of RF Operational Life Testing in Evaluating III-V Devices Addressing RF Through Millimeter-wave Applications. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Yingzhe Wang, Xuefeng Zheng, Jiaduo Zhu, Shengrui Xu, Xiaohua Ma, Jincheng Zhang, Yue Hao, Linlin Xu, Jiangnan Dai, Peixian Li |
Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang 0006, Souvik Mahapatra |
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Chieh Roger Lo, Teng-Hao Yeh, Wei-Chen Chen, Hang-Ting Lue, Keh-Chung Wang, Chih-Yuan Lu, Yao-Wen Chang, Yung-Hsiang Chen, Chu-Yung Liu |
Study of the Walk-Out Effect of Junction Breakdown Instability of the High-Voltage Depletion-Mode N-Channel MOSFET for NAND Flash Peripheral Device and an Efficient Layout Solution. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan |
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Yang Wang, Chen Wang, Tao Chen 0003, Hao Liu, Chinte Kuo, Ke Zhou, Binfeng Yin, Lin Chen, Qing-Qing Sun |
Front-plane and Back-plane Bias Temperature Instability of 22 nm Gate-last FDSOI MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Huimei Zhou, Miaomiao Wang 0006, Jingyun Zhang, Koji Watanabe, Curtis Durfee, Shogo Mochizuki, Ruqiang Bao, Richard G. Southwick, Maruf Bhuiyan, Basker Veeraraghavan |
NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Shanmuganathan Palanisamy, Josef Lutz, R. Boldyrjew-Mast, Thomas Basler |
Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier 0002 |
Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Wang Liao, Kojiro Ito, Yukio Mitsuyama, Masanori Hashimoto |
Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz |
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Subrat Mishra, Pieter Weckx, Ji-Yung Lin, Ben Kaczer, Dimitri Linten, Alessio Spessot, Francky Catthoor |
Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS). |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey |
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Dmitry Veksler, Gennadi Bersuker, Adam W. Bushmaker, Maribeth Mason, P. R. Shrestha, Kin P. Cheung, Jason P. Campbell, Thomas Rueckes, Lee Cleveland, Harry Luan, David C. Gilmer |
Memory update characteristics of carbon nanotube memristors (NRAM®) under circuitry-relevant operation conditions. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Oren Zonensain, Roman Rechter, Robert Kwasnick, Keun-Woo Park, Anisur Rahman, Almog Reshef, Tal Raz, Maxim Levit |
Advanced methods for CPU product reliability modeling and enhancement. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Martina Gerlach, Peter Seidel, Josef Lutz |
Specific aspects regarding evaluation of power cycling tests with SiC devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Kuo-Hsuan Meng |
A Method to Analyze Aging Effect on ESD Protection Design. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Kuilong Yu, Xiaojuan Zhu, Rui Fang, Tingting Ma, Kun Han, Zhongyi Xia |
Hybrid HCI Degradation in Sub-micron NMOSFET due to Mixed Back-end Process Damages. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang 0001, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang |
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Shin-ichiro Abe, Tatsuhiko Sato, Junya Kuroda, Seiya Manabe, Yukinobu Watanabe, Wang Liao, Kojiro Ito, Masanori Hashimoto, Masahide Harada, Kenichi Oikawa, Yasuhiro Miyake |
Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Dongyoung Kim, Adam J. Morgan, Nick Yun, Woongje Sung, Anant Agarwal, Robert Kaplar |
Non-Isothermal Simulations to Optimize SiC MOSFETs for Enhanced Short-Circuit Ruggedness. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Yao-Feng Chang, James A. O'Donnell, Tony Acosta, Roza Kotlyar, Albert B. Chen, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jeff Hicks |
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Thomas Aichinger, Matthias Schmidt |
Gate-oxide reliability and failure-rate reduction of industrial SiC MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Wen Yang, Jiann-Shiun Yuan, Balakrishnan Krishnan, An-Jye Tzou, Wen-Kuan Yeh |
Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Maaß, Hans Reisinger, Thomas Aichinger, Gerald Rescher |
Influence of high-voltage gate-oxide pulses on the BTI behavior of SiC MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Weishen Chu, Laura Spinella, Dwayne R. Shirley, Paul S. Ho |
Effects of Wiring Density and Pillar Structure on Chip Package Interaction for Advanced Cu Low-k Chips. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra |
Hot Carrier Degradation in Cryo-CMOS. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Tae Young Lee, Kazutaka Yamane, Lee Yong Hau, Robin Chao, Nyuk Leong Chung, Vinayak Bharat Naik, K. Sivabalan, Jae Hyun Kwon, Jia Hao Lim, Wah-Peng Neo, Kevin Khua, Naganivetha Thiyagarajah, Suk Hee Jang, Behtash Behin-Aein, Eng-Huat Toh, Yuichi Otani, Dinggui Zeng, Nivetha Balasankaran, Lian Choo Goh, Timothy Ling, Jay Hwang, Lei Zhang, Rachel Low, Soon Leng Tan, Chim Seng Seet, Jia Wen Ting, Stanley Ong, Young Seon You, Swee Tuck Woo, Elgin Quek, Soh Yun Siah |
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Minsu Kim, Jeehwan Song, Chris H. Kim |
Reliability Characterization of Logic-Compatible NAND Flash Memory based Synapses with 3-bit per Cell Weights and 1μA Current Steps. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Chao-Yang Ke, Ming-Dou Ker |
Over-Voltage Protection on the CC Pin of USB Type-C Interface against Electrical Overstress Events. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Adrian Vaisman Chasin, Jacopo Franco, Erik Bury, Romain Ritzenthaler, Eugenio Dentoni Litta, Alessio Spessot, Naoto Horiguchi, Dimitri Linten, Ben Kaczer |
Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Artsiom Balakir, Alan Yang, Elyse Rosenbaum |
An Interpretable Predictive Model for Early Detection of Hardware Failure. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | M. H. Hsieh, W. S. Chiang, Harry H. Chen, M. Z. Lin, M. J. Lin |
Comprehensive Quality and Reliability Management for Automotive Product. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Wen Yang, Nicholas Stoll, Jiann-Shiun Yuan |
ESD Robustness of GaN-on-Si Power Devices under Substrate Biases by means of TLP/VFTLP Tests. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Siddarth Sundaresan, Vamsi Mulpuri, Jaehoon Park, Ranbir Singh |
Reliability and Robustness Performance of 1200 V SiC DMOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Fabrizio Masin, Matteo Meneghini, Eleonora Canato, Alessandro Barbato, Carlo De Santi, Arno Stockman, Abhishek Banerjee 0003, Peter Moens, Enrico Zanoni, Gaudenzio Meneghesso |
Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and Hard- Switching Conditions. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost 0002, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva |
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Marina Yamaguchi, Shosuke Fujii, Kensuke Ota, Masumi Saitoh |
Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Clyde Dunn, John MacPeak, Sean Bo, Brian Kirkpatrick, Brian Horning, Tad Grider, Corey O'Brien, Steve Heinrich-Barna, Armando Vigil, Jon Nafziger, Lyndon Preiss, Kelly DeShields, Viktor Markov, JinHo Kim, Nhan Do, Alexander Kotov |
Program Disturb Mechanism in Embedded SuperFlash® Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Thong Tran, Sudheer Reddy Gundala, Komal Soni, Aaron Baker, Adam Fogle, Sandhya Chandrashekhar |
No Trouble Found (NTF) Customer Return Analysis. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | P. Srinivasan 0002, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min |
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas |
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Kyong Jin Hwang, Sagar Premnath Karalkar, Vishal Ganesan, Sevashanmugam Marimuthu, Alban Zaka, Tom Herrmann, Bhoopendra Singh, Robert Gauthier 0002 |
Design Optimization of MV-NMOS for ESD Self-protection in 28nm CMOS technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Dong Ji, Burcu Ercan, Garret Benson, A. K. M. Newaz, Srabanti Chowdhury |
Robust avalanche in GaN leading to record performance in avalanche photodiode. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Juan Bautista Roldán, David Maldonado, Francisco Jiménez-Molinos, Christian Acal, Juan Eloy Ruiz-Castro, Ana M. Aguilera, Fei Hui, J. Kong, Y. Shi, Xu Jing, Chao Wen, Marco Antonio Villena, Mario Lanza |
Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jordan Locati, Vincenzo Della Marca, Christian Rivero, Arnaud Régnier, Stephan Niel, Karine Coulié |
AC stress reliability study of a new high voltage transistor for logic memory circuits. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae-Gyung Ahn, Ping-Chin Yeh, Jonathan Chang |
Estimation of Product Reliability using TDDB Simulation and Statistical EM Method. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula |
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Trang Le Dinh Dang, Trinh Dinh Linh, Ngyuen Thanh Dat, Changhong Min, Jinsang Kim, Ik-Joon Chang, Jin-Woo Han |
Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava |
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Alexander Grill, Erik Bury, Jakob Michl, Stanislav Tyaginov, Dimitri Linten, Tibor Grasser, Bertrand Parvais, Ben Kaczer, Michael Waltl, Iuliana P. Radu |
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Andrea Natale Tallarico, Susanna Reggiani, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna |
Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Simon Van Beek, Barry J. O'Sullivan, Sebastien Couet, Davide Crotti, Dimitri Linten, Gouri Sankar Kar |
Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | W. Rhett Davis, Colin Shaw, Ahmed Ramadan Hassan |
How to write a compact reliability model with the Open Model Interface (OMI). |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Premachandran CS, Salvatore Cimino, Manjunatha Prabhu |
Efficient Bidirectional protection structure for Plasma induced damage (PID) and Electrostatic discharge (ESD) for 3D IC Integration. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Nilotpal Choudhury, Narendra Parihar, Souvik Mahapatra |
Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young |
Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Bahar Ajdari, Samwel Sekwao, Ricardo Ascázubi, Adam Neale, Norbert Seifert |
On the Correlation of Laser-induced and High-Energy Proton Beam-induced Single Event Latchup. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Maurits J. de Jong, Cora Salm, Jurriaan Schmitz |
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Mauro Ciappa, Marco Pocaterra |
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | David Maldonado, Juan Bautista Roldán, Andrés M. Roldán, Francisco Jiménez-Molinos, Fei Hui, Y. Shi, Xu Jing, Chao Wen, Mario Lanza |
Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | James P. Ashton, Patrick M. Lenahan, Daniel J. Lichtenwalner, Aivars J. Lelis |
Leakage Currents and E' Centers in 4H-SiC MOSFETs with Barium Passivation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele, Tibor Grasser, Geert Hellings, Alexander Makarov, Markus Jech, Dimitri Linten, Ben Kaczer |
A Compact Physics Analytical Model for Hot-Carrier Degradation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Hang-Ting Lue, Po-Kai Hsu, Keh-Chung Wang, Chih-Yuan Lu |
Introduction of Non-Volatile Computing In Memory (nvCIM) by 3D NAND Flash for Inference Accelerator of Deep Neural Network (DNN) and the Read Disturb Reliability Evaluation : (Invited Paper). |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jun-Kyo Jeong, Jae-Young Sung, Hee-Hun Yang, Hi-Deok Lee, Ga-Won Lee 0001 |
Reliability Analysis by Charge Migration of 3D SONOS Flash Memory. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Peter Friedrichs |
Ruggedness of SiC devices under extreme conditions. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Paul Colestock, P. Srinivasan 0002, Fernando Guarin |
Silicon Based RF Reliability Challenges for 5G Communications. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Naohito Suzumura, Kazuyuki Omori, Hideaki Tsuchiya, Hideki Aono, Tomohiro Yamashita |
Impact of Anode-side Defect Generation on Inter-Level TDDB Degradation in Cu/Low-k Damascene Structures. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch |
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Rui Zhang 0048, Zhaocheng Liu, Kexin Yang 0001, Taizhi Liu, Wenshan Cai, Linda Milor |
Inverse Design of FinFET SRAM Cells. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Md. Mehedi Hasan, Md Raquibuzzaman, Indranil Chatterjee, Biswajit Ray |
Radiation Tolerance of 3-D NAND Flash Based Neuromorphic Computing System. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tobias Kemmer, Michael Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Oliver Ambacher |
Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jyotika Athavale, Andrea Baldovin, Michael Paulitsch |
Trends and Functional Safety Certification Strategies for Advanced Railway Automation Systems. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Kuan-Ting Chen, C. Lo, Y.-Y. Lin, C.-Y. Chueh, C. Chang, G.-Y. Siang, Y.-J. Tseng, Y.-J. Yang, F.-C. Hsieh, S.-H. Chang, H. Liang, S.-H. Chiang, J.-H. Liu, Y.-D. Lin, P.-C. Yeh, C.-Y. Wang, H.-Y. Yang, P.-J. Tzeng, M.-H. Liao, Shu-Tong Chang, Y.-Y. Tseng, Min-Hung Lee |
Double Layers Omega FETs with Ferroelectric HfZrO2 for One-Transistor Memory. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Betting Wehring, Raik Hoffmann, Lukas Gerlich, Malte Czernohorsky, Benjamin Uhlig, Robert Seidel, Tobias Barchewitz, Frank Schlaphof, Lutz Meinshausen, Christoph Leyens |
BEoL Reliability, XPS and REELS Study on low-k Dielectrics to understand Breakdown Mechanisms. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Olalla Varela Pedreira, Michele Stucchi, Anshul Gupta, Victor Vega-Gonzalez, Marleen van der Veen, Stephane Lariviere, Christopher J. Wilson, Zsolt Tökei, Kristof Croes |
Metal reliability mechanisms in Ruthenium interconnects. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Harumi Seki, Yasushi Nakasaki, Yuichiro Mitani |
Further Investigation on Mechanism of Trap Level Modulation in Silicon Nitride Films by Fluorine Incorporation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Ruizhe Zhang 0003, Joseph P. Kozak, Jingcun Liu, Ming Xiao, Yuhao Zhang |
Surge Energy Robustness of GaN Gate Injection Transistors. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava |
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Clement Huang, Alex Juan, K. C. Su |
Stress Induced Voiding Behavior of Electroplated Copper Thin Films in Highly Scaled Cu/low-k interconnects. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Don A. Gajewski |
Challenges and Peculiarities in Developing New Standards for SiC. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Rakesh Ranjan, Charles B. LaRow, Ki-Don Lee, Minhyo Kang, Pavitra R. Perepa, Md. Shahriar Rahman, Bong Ki Lee, David Moreau, Carolyn Cariss-Daniels, Timothy Basford, Colby Callahan, Maihan Nguyen, Gil Heyun Choi, Hyunchul Sagong, HwaSung Rhee |
Trap Density Modulation for IO FinFET NBTI Improvement. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Robin Wuytens, Sybren Santermans, Mihir Gupta, Bert Du Bois, Simone Severi, Liesbet Lagae, Wim Van Roy, Koen M. Martens |
Two-Regime Drift in Electrolytically Gated FETs and BioFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Kai Ni 0004, Aniket Gupta, Om Prakash 0007, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch |
Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Krishnaswamy Ramkumar, Venkatraman Prabhakar, Vineet Agrawal, Long Hinh, Swatilekha Saha, Santanu Kumar Samanta, Ravindra M. Kapre |
Reliability Aspects of SONOS Based Analog Memory for Neuromorphic Computing. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tibor Grasser, Ben Kaczer, Barry J. O'Sullivan, Gerhard Rzepa, Bernhard Stampfer, Michael Waltl |
The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam |
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | |
2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020 |
IRPS |
2020 |
DBLP BibTeX RDF |
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| 1 | Wonbo Shim, Yandong Luo, Jae-sun Seo, Shimeng Yu |
Impact of Read Disturb on Multilevel RRAM based Inference Engine: Experiments and Model Prediction. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Andreas Martin 0002, Angelika Kamp |
A New Implementation Approach for Reliability Design Rules against Plasma Induced Charging Damage from Well Configurations of Complex ICs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Alok Ranjan 0001, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey |
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Hyeong-Sub Song, Sunil Babu Eadi, Hyun-Dong Song, Hyun-Woong Choi, Ga-Won Lee 0001, Hi-Deok Lee |
Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Joseph P. Kozak, Ruizhe Zhang 0003, Jingcun Liu, Khai D. T. Ngo, Yuhao Zhang |
Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Koichiro Okamoto, Ryusuke Nebashi, Naoki Banno, Xu Bai, Hideaki Numata, Noriyuki Iguchi, Makoto Miyamura, Hiromitsu Hada, Kazunori Funahashi, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada |
ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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