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Results
Found 1201 publication records. Showing 1201 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Chris Kendrick, Michael Cook 0004, Jeff P. Gambino, T. Myers, J. Slezak, T. Hirano, T. Sano, Y. Watanabe, K. Ozeki |
Polysilicon resistor stability under voltage stress for safe-operating area characterization. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Pengpeng Ren, Changze Liu, Sanping Wan, Jiayang Zhang, Zhuoqing Yu, Nie Liu, Yongsheng Sun, Runsheng Wang, Canhui Zhan, Zhenghao Gan, Waisum Wong, Yu Xia, Ru Huang |
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Sol-Kyu Lee, Kyung-Tae Jang, Seol-Min Yi, Young-Chang Joo |
Successive breakdown mode of time-dependent dielectric breakdown for Cu interconnects and lifetime enhancement under dynamic bias stress. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Lucile Arnaud, Stéphane Moreau, Amadine Jouve, Imed Jani, Didier Lattard, F. Fournel, C. Euvrard, Y. Exbrayat, Viorel Balan, Nicolas Bresson, S. Lhostis, J. Jourdon, E. Deloffre, S. Guillaumet, Alexis Farcy, Simon Gousseau, M. Arnoux |
Fine pitch 3D interconnections with hybrid bonding technology: From process robustness to reliability. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kirby K. H. Smithe, Zhongwei Zhu, Connor S. Bailey, Eric Pop, Alex Yoon |
Investigation of monolayer MX2 as sub-nanometer copper diffusion barriers. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kai-Hsin Chuang, Erik Bury, Robin Degraeve, Ben Kaczer, T. Kallstenius, Guido Groeseneken, Dimitri Linten, Ingrid Verbauwhede |
A multi-bit/cell PUF using analog breakdown positions in CMOS. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Younggeun Ji, Jeonghoon Kim, Jungin Kim, Miji Lee, Jaeheon Noh, Taeyoung Jeong, Juhyeon Shin, Junho Kim, Young Heo, Ung Cho, Hyun-Chul Sagong, Junekyun Park, Yeonsik Choo, Gilhwan Do, Hoyoung Kang, Eunkyeong Choi, Dongyoon Sun, Changki Kang, Sangchul Shin, Sangwoo Pae |
Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | P. C. Su, C. M. Jiang, C. W. Wang, Tahui Wang |
Correlation between SET-state current level and read-disturb failure time in a resistive switching memory. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Amit A. Kale, Amit Marathe, Ajay Kamath |
Machine learning based dynamic cause maps for condition monitoring and life estimation. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Tian Shen, Kong Boon Yeap, Sean P. Ogden, Cathryn Christiansen, Patrick Justison |
New insight on TDDB area scaling methodology of non-Poisson systems. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Pai-Yu Chen, Shimeng Yu |
Reliability perspective of resistive synaptic devices on the neuromorphic system performance. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | David Z. Gao, Jack Strand, Al-Moatasem El-Sayed, Alexander L. Shluger, Andrea Padovani, Luca Larcher |
Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Chia-Chi Fan, Chun-Yuan Tu, Ming-Huei Lin, Chun-Yen Chang, Chun-Hu Cheng, Yen-Liang Chen, Guan-Lin Liou, Chien Liu, Wu-Ching Chou, Hsiao-Hsuan Hsu |
Interface engineering of ferroelectric negative capacitance FET for hysteresis-free switch and reliability improvement. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Omar Chihani, Loic Théolier, Jean-Yves Delétage, Eric Woirgard, Alain Bensoussan 0002, André Durier |
Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Ayanori Ikoshi, Masahiro Toki, Hiroto Yamagiwa, Daijiro Arisawa, Masahiro Hikita, Kazuki Suzuki, Manabu Yanagihara, Yasuhiro Uemoto, Kenichiro Tanaka, Tetsuzo Ueda |
Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor (HD-GIT) under practical switching operations. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Balaji Narasimham, Saket Gupta, Daniel S. Reed, J. K. Wang, Nick Hendrickson, Hasan Taufique |
Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | R. E. Stahbush, Nadeemullah A. Mahadik |
Defects affecting SiC power device reliability. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Ferdinando Iucolano, Antonino Maurizio Parisi, Santo Reina, Alessandro Chini |
A novel GaN HEMT degradation mechanism observed during HTST test. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Shaofeng Guo, Zhenghan Lin, Runsheng Wang, Zexuan Zhang, Zhe Zhang, Yangyuan Wang, Ru Huang |
Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Baozhen Li, Andrew Kim, Paul McLaughlin, Barry P. Linder, Cathryn Christiansen |
Electromigration characteristics of power grid like structures. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | C. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis |
Effect of HCI degradation on the variability of MOSFETS. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Mariappan Murugesan, Takafumi Fukushima, Ji Chel Bea, Hiroyuki Hashimoto, Mitsu Koyanagi |
Intra- and inter-chip electrical interconnection formed by directed self assembly of nanocomposite containing diblock copolymer and nanometal. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Antoine Laurent, Xavier Garros, Sylvain Barraud, J. Pelloux-Prayer, Mikaël Cassé, Fred Gaillard, X. Federspiel, David Roy 0001, E. Vincent, Gérard Ghibaudo |
Performance & reliability of 3D architectures (πfet, Finfet, Ωfet). |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Roberta Bottini, Andrea Ghetti, Sara Vigano, Maria Grazia Valentini, Pratap Murali, Chandra Mouli |
Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Andy Fenner, Mark Porter, Randy Crutchfield |
Making the connection between physics of failure and system-level reliability for medical devices. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Miky Lee, K. Kim, D. Lim, D. Cho, Ck. Han |
Weibull cumulative distribution function (CDF) analysis with life expectancy endurance test result of power window switch. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Deniz Kocaay, Philippe Roussel, Kristof Croes, Ivan Ciofi, Alicja Lesniewska, Ingrid De Wolf |
Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yuichiro Mitani, Yusuke Higashi, Yasushi Nakasaki |
Study on mechanism of thermal curing in ultra-thin gate dielectrics. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Miaomiao Wang 0006, Richard G. Southwick, Kangguo Cheng, James H. Stathis |
Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with Id-Vd characteristics. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Ernest Y. Wu, Andrew Kim, Baozhen Li, James H. Stathis |
Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Rania Lajmi, Florian Cacho, O. David, Jean-Pierre Blanc, Emmanuel Rouat, Sébastien Haendler, Ph. Benech, Estelle Lauga-Larroze, Sylvain Bourdel |
Reliability assessment of 4GSP/s interleaved SAR ADC. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Guido Quax, Theo Smedes |
An integral injector-victim current transfer model for latchup design rule optimization. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kristof Croes, Vladimir Cherman, Melina Lofrano, Houman Zahedmanesh, Luka Kljucar, Mario Gonzalez, Ingrid De Wolf, Zsolt Tökei, Eric Beyne |
Stress mitigation of 3D-stacking/packaging induced stresses. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Jifa Hao, Amartya Ghosh, Mark Rinehimer, Joe Yedinak, Muhammad Ashraful Alam |
BVDSS (drain to source breakdown voltage) instability in shielded gate trench power MOSFETs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Chih-Yi Yang, Tian-Li Wu, Tin-En Hsieh, Edward Yi Chang |
Investigation of degradation phenomena in GaN-on-Si power MIS-HEMTs under source current and drain bias stresses. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kaustubh Joshi, Shu-Wen Chang, D. S. Huang, P. J. Liao, Yung-Huei Lee |
Study of dynamic TDDB in scaled FinFET technologies. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kin P. Cheung |
SiC power MOSFET gate oxide breakdown reliability - Current status. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Sami Alghamdi, Mengwei Si, Lingming Yang, Peide D. Ye |
Low frequency noise in MOS2 negative capacitance field-effect transistor. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Guido T. Sasse |
Hot carrier induced TDDB in HV MOS: Lifetime model and extrapolation to use conditions. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Y. H. Liu, H. Y. Lin, C. M. Jiang, Tahui Wang, W. J. Tsai, T. C. Lu, K. C. Chen, Chih-Yuan Lu |
Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | H. Jiang, H. Zhang, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva |
Designing soft-error-aware circuits with power and speed optimization. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Srikanth Jagannathan, Kumar Abhishek, Nihaar N. Mahatme, Ender Yilmaz |
Design of aging aware 5 Gbps LVDS transmitter for automotive applications. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Andrea Padovani, Luca Larcher |
Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics: Insights from a multi-scale modeling approach. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Giovanni Landi, Carlo Barone, C. Mauro, S. Pagano, Heinz-Christoph Neitzert |
Evaluation of silicon, organic, and perovskite solar cell reliability with low-frequency noise spectroscopy. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Pradeep Lall, Hao Zhang, Rahul Lall |
PHM of state-of-charge for flexible power sources in wearable electronics with EKF. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Heejin Kim, Hayeon Shin, Jiyoung Park, Youngtae Choi, Jongwoo Park 0001 |
Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Christine S. Hau-Riege, Huilin Xu, You-Wen Yau, Manasi S. Kakade, Jianfeng Li, Xiaonan Zhang, Hosain Farr |
Electromigration of multi-solder ball test structures. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Lesly Endrinal, Rakesh Kinger, Lavakumar Ranganathan, Amit Sheth 0001 |
Solving critical issues in 10nm technology using innovative laser-based fault isolation and DFT diagnosis techniques. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Pin-Shiang Chen, Shou-Chung Lee, A. S. Oates, Chee Wee Liu |
BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Hyun-Chul Sagong, Hyunjin Kim, Seungjin Choo, Sungyoung Yoon, Hyewon Shim, Sangsu Ha, Tae-Young Jeong, Minhyeok Choe, Junekyun Park, Sangchul Shin, Sangwoo Pae |
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Riddhi Jitendrakumar Shah, Florian Cacho, Vincent Huard, Souhir Mhira, D. Arora, Pankaj Agarwal, Shubham Kumar, S. Balaraman, Bijoy Kumar Singh, Lorena Anghel |
Investigation of speed sensors accuracy for process and aging compensation. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg |
Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Wen Liu, Andreas Kerber, Fernando Guarin, Claude Ortolland |
Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018 |
IRPS |
2018 |
DBLP BibTeX RDF |
|
1 | M. Kraatz, Christoph Sander, André Clausner, M. Hauschildt, Yvonne Standke, Martin Gall, Ehrenfried Zschech |
Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | D. Singh, Oscar D. Restrepo, P. P. Manik, N. Rao Mavilla, H. Zhang, Peter C. Paliwoda, S. Pinkett, Y. Deng, Eduardo Cruz Silva, J. B. Johnson, M. Bajaj, S. Furkay, Z. Chbili, A. Kerber, C. Christiansen, S. Narasimha, E. Maciejewski, S. Samavedam, C.-H. Lin |
Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Katja Puschkarsky, Tibor Grasser, Thomas Aichinger, Wolfgang Gustin, Hans Reisinger |
Understanding and modeling transient threshold voltage instabilities in SiC MOSFETs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | T. W. Lin, S. H. Ku, C. H. Cheng, C. W. Lee, Ijen Huang, Wen-Jer Tsai, T. C. Lu, W. P. Lu, K. C. Chen, Tahui Wang, Chih-Yuan Lu |
Chip-level characterization and RTN-induced error mitigation beyond 20nm floating gate flash memory. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Pin Fang, Anthony S. Oates |
Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii |
Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Thibault Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, Francesco La Rosa, Stephan Niel, Arnaud Régnier, Jean-Michel Portal, Pascal Masson |
Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | F. Griggio, James Palmer, F. Pan, N. Toledo, Anthony Schmitz, Ilan Tsameret, R. Kasim, Gerald S. Leatherman, Jeffery Hicks, A. Madhavan, J. Shin, J. Steigerwald, A. Yeoh, C. Auth |
Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Brian Kosinski, Ken Dodson |
Key attributes to achieving > 99.99 satellite availability. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Anthonin Verdy, Gabriele Navarro, Mathieu Bernard, Sophie Chevalliez, Niccolo Castellani, Emmanuel Nolot, Julien Garrione, Pierre Noe, Guillaume Bourgeois, Veronique Sousa, Marie Claire Cyrille, Etienne Nowak |
Carbon electrode for Ge-Se-Sb based OTS selector for ultra low leakage current and outstanding endurance. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Devyani Patra, Ahmed Kamal Reza, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy 0001, Yu Cao 0001 |
Accelerated BTI degradation under stochastic TDDB effect. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava |
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | C. Monachon, Marcin Stefan Zielinski, J. Berney, D. Poppitz, Andreas Graff, Steffen Breuer, Lutz Kirste |
Cathodoluminescence spectroscopy for failure analysis and process development of GaN-based microelectronic devices. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Souhir Mhira, Vincent Huard, D. Arora, Philippe Flatresse, Alain Bravaix |
Resilient automotive products through process, temperature and aging compensation schemes. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kangwook Lee 0005 |
High-density fan-out technology for advanced SiP and 3D heterogeneous integration. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Sofie Beyne, Shibesh Dutta, Olalla Varela Pedreira, Niels Bosman, Christoph Adelmann, Ingrid De Wolf, Zsolt Tökei, Kristof Croes |
The first observation of p-type electromigration failure in full ruthenium interconnects. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | C. Chung, D. Kobayashi, K. Hirose |
Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: Difference between sensitivities to terrestrial and space radiation. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Mingoo Seok, Peter R. Kinget, Teng Yang, Jiangyi Li, Doyun Kim |
Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Subramanian S. Iyer, Adeel Ahmad Bajwa |
Reliability challenges in advance packaging. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | P. Srinivasan, Rakesh Ranjan, S. Cimino, A. Zainuddin, B. Kannan, L. Pantisano, I. Mahmud, G. Dilliway, Tanya Nigam |
Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao |
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Peter C. Paliwoda, Zakariae Chbili, A. Kerber, D. Singh, Durga Misra |
Ambient temperature and layout impact on self-heating characterization in FinFET devices. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Eduard Cartier, Martin M. Frank, Takashi Ando, John Rozen, Vijay Narayanan |
PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Marta Pedro, Javier Martín-Martínez, E. Miranda, Rosana Rodríguez, Montserrat Nafría, M. B. González, Francesca Campabadal |
Device variability tolerance of a RRAM-based self-organizing neuromorphic system. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva |
Single-event effects on optical transceiver. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Timothy J. Silverman, Steve Johnston |
Permanent shunts from passing shadows: Reverse-bias damage in thin-film photovoltaic modules. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Nirmal R. Saxena, Sanu Mathew, Krishna Saraswat |
Keynote 1: The road to resilient computing in autonomous driving is paved with redundancy. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Jay Sarkar, Cory Peterson, Amir Sanayei |
Machine-learned assessment and prediction of robust solid state storage system reliability physics. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | M. Rafik, A. P. Nguyen, Xavier Garros, M. Arabi, X. Federspiel, Cheikh Diouf |
AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Philippe J. Roussel, Adrian Vaisman Chasin, Steven Demuynck, Naoto Horiguchi, Dimitri Linten, Anda Mocuta |
New methodology for modelling MOL TDDB coping with variability. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Toru Sugiyama, Kohei Oasa, Yasunobu Saito, Akira Yoshioka, Takuo Kikuchi, Aya Shindome, Tatsuya Ohguro, Takeshi Hamamoto |
Evaluation methodology for current collapse phenomenon of GaN HEMTs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Arno Stockman, Eleonora Canato, Alaleh Tajalli, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Peter Moens, Benoit Bakeroot |
On the origin of the leakage current in p-gate AlGaN/GaN HEMTs. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Shouhei Fukuyama, Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara |
Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey |
Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Pradeep Lall, Kazi Mirza, David Locker |
Prognostics health management of electronic systems - A reliability physics approach. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam |
High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Tibor Grasser, Bernhard Stampfer, Michael Waltl, Gerhard Rzepa, Karl Rupp, Franz Schanovsky, Gregor Pobegen, Katja Puschkarsky, Hans Reisinger, Barry J. O'Sullivan, Ben Kaczer |
Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yasunori Tateno, Yasuyo Kurachi, Hiroshi Yamamoto, Takashi Nakabayashi |
Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under high temperature storage tests. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Vamsi Putcha, Jacopo Franco, Abhitosh Vais, Ben Kaczer, S. Sioncke, Dimitri Linten, Guido Groeseneken |
Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kuo-Hsuan Meng, Mohamed Moosa, Cynthia A. Torres, James W. Miller |
A case study of ESD trigger circuit: Time-out and stability. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat |
Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Hyunjin Kim, Minjung Jin, Hyun-Chul Sagong, Jinju Kim, Ukjin Jung, Minhyuck Choi, Junekyun Park, Sangchul Shin, Sangwoo Pae |
A systematic study of gate dielectric TDDB in FinFET technology. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Krzysztof Domanski |
Latch-up in FinFET technologies. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Cameron McNairy |
Exascale fault tolerance challenge and approaches. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Alok Ranjan 0001, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey |
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yun Li, K. L. Wang, Shaoyan Di, Peng Huang 0004, Gang Du, Xiao-Yan Liu |
PBTI evaluation of In0.65Ga0.35As/In0.53Ga0.47As nanowire FETs with Al2O3 and LaAlO3 gate dielectrics. |
IRPS |
2018 |
DBLP DOI BibTeX RDF |
|
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