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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 103 occurrences of 77 keywords
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Results
Found 72 publication records. Showing 72 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
145 | Koppolu Sasidhar, Abhijit Chatterjee |
Hierarchical Probablistic Diagnosis of MCMs on Large-Area Substrates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India, pp. 65-68, 1996, IEEE Computer Society, 0-8186-7228-5. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
95 | Hameed A. Naseem, Ajay P. Malshe, Rajan A. Beera, M. Shahid Haque, William D. Brown, Len W. Schaper |
CVD-diamond substrates for multi-chip modules (MCMs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 194-, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
diamond, laser beam machining, metallisation, CVD coatings, elemental semiconductors, chemical vapour deposition, CVD-diamond substrates, 3D MCM, chemical vapor deposition, diamond thin films, laser drilling, via holes, metallization, dielectric coatings, multilayer interconnects, C, planarization, multichip modules, multichip modules, fabrication, polishing, polishing, substrates |
61 | Mick Tegethoff, Tom Chen 0001 |
Simulation Techniques for the Manufacturing Test of MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 137-149, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
simulation, test, DFT, yield, DFM, SMT, MCM, board |
61 | Marc Perbost, Ludovic Le Lan, Christian Landrault |
Automatic Testability Analysis of Boards and MCMs at Chip Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 36-41, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
DFT, testability analysis, MCM |
50 | Nohpill Park, Fred J. Meyer, Fabrizio Lombardi |
Quality-Effective Repair of Multichip Module Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings, pp. 47-55, 2000, IEEE Computer Society, 0-7695-0719-0. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
49 | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |
Cyclic stress tests for full scan circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 89-94, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits |
45 | Anne E. Gattiker, Wojciech Maly |
Smart Substrate MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 39-53, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
smart substrate, testing, cost model, MCM |
45 | Thomas M. Storey, Bruce McWilliam |
A Test Methodology for High Performance MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 109-118, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
LOCST, AC BIST, delay testing, boundary scan, LSSD, MCM testing |
45 | Chua Hong Chuck, Chin Teck Chai, Tan Gim Chua |
A structured approach for routing of MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES (1) ![In: Knowledge-Based Intelligent Electronic Systems, 1st International Conference, KES 1997, Adelaide, South Australia, 21-23 May, 1997, Proceedings, Part I, pp. 255-259, 1997, IEEE, 0-7803-3755-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
45 | S. Y. Kulkarni, K. D. Patil, K. V. V. Murthy |
Transmission line model parameters for very high speed VLSI interconnects in MCMs using FEM with special elements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 260-263, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
very high speed integrated circuits, transmission line theory, integrated circuit packaging, transmission line model parameters, very high speed VLSI interconnects, higher order isoparametric elements, 2D interconnect/dielectric packaging structures, quadrilateral infinite elements, signal conductor boundaries, sharp corners, finite element method, finite element analysis, computation time, multichip modules, multichip modules, FEM, MCM, integrated circuit interconnections, VLSI interconnects |
34 | Andrew Flint |
MCM Test Strategy Synthesis from Chip Test and Board Test Approaches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 65-76, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
board test, chip test, case studies, automatic test equipment |
33 | Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian |
Distributed Diagnosis of Interconnections in SoC and MCM Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(3), pp. 291-307, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
interconnect test and diagnosis, performance fault diagnosis, design for testability for SOCs and MCMs, MISR reconfiguration |
28 | Yajie Ji, Lijie Ji, Yanlai Chen, Zhenli Xu |
MCMS-RBM: Multi-Component Multi-State Reduced Basis Method toward Efficient Transition Pathway Identification for Crystals and Quasicrystals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2308.15195, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
28 | Tong Gao, Hao Chen 0014, Wen Chen |
MCMS-STM: An Extension of Support Tensor Machine for Multiclass Multiscale Object Recognition in Remote Sensing Images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 14(1), pp. 196, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
28 | Shun Shen Peter Wang, Yin-Tien Wang, Choung-Lii Chao, Wei-Bin Yang |
Instrumentation of Twin-MCMs based mutual-test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 114, pp. 105108, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
28 | Santosh Kumar Tripathy, Rajeev Srivastava |
A real-time two-input stream multi-column multi-stage convolution neural network (TIS-MCMS-CNN) for efficient crowd congestion-level analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Multim. Syst. ![In: Multim. Syst. 26(5), pp. 585-605, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
28 | Eduardo A. C. da Costa, Paulo F. Flores, José Monteiro 0001 |
Exploiting general coefficient representation for the optimal sharing of partial products in MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2006, Ouro Preto, MG, Brazil, August 28 - September 1, 2006, pp. 161-166, 2006, ACM. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
common subexpression elimination (CSE), digital filter design, minimal signed digit (MSD), multiple constant multiplication (MCM) |
28 | Young-Jun Cha, Chong S. Rim, Kazuo Nakajima |
A simple and effective greedy multilayer router for MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of the 1997 International Symposium on Physical Design, ISPD 1997, Napa Valley, California, USA, April 14-16, 1997, pp. 67-72, 1997, ACM, 0-89791-927-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
28 | Andrew Flint |
A Simulation-Based JTAG ATPG Optimized for MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, pp. 101-105, 1997, IEEE Computer Society, 0-7803-4209-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
28 | Sharad Kapur, Jinsong Zhao |
A Fast Method of Moments Solver for Efficient Parameter Extraction of MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 34st Conference on Design Automation, Anaheim, California, USA, Anaheim Convention Center, June 9-13, 1997., pp. 141-146, 1997, ACM Press, 0-89791-920-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
28 | Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian |
Relay Propagation Scheme for Testing of MCMs on Large Area Substrates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ED&TC ![In: 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996, pp. 131-137, 1996, IEEE Computer Society, 0-8186-7423-7. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
28 | Wang-Dauh Tseng, Kuochen Wang |
Testable Design and Testing of MCMs Based on Multifrequency Scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 75-, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
boundary scan architecture, multifrequency test, smart substrate, technology mixed, design for testability, VHDL, multichip module |
28 | Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian |
Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996, pp. 818-827, 1996, IEEE Computer Society, 0-7803-3541-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
28 | Andrew Flint |
Three Different MCMs, Three Different Test Strategies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996, pp. 828-833, 1996, IEEE Computer Society, 0-7803-3541-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
28 | Shoab Ahmed Khan, Vijay K. Madisetti |
System Partitioning of MCMs for Low Power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 12(1), pp. 41-52, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | Ananta K. Majhi, Lalit M. Patnaik, Srilata Raman |
A genetic algorithm-based circuit partitioner for MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microprocess. Microprogramming ![In: Microprocess. Microprogramming 41(1), pp. 83-96, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | P. Brahic, Régis Leveugle, Gabriele Saucier |
Design of defect-tolerant scan chains for MCMs with an active substrate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995, pp. 252-260, 1995, IEEE Computer Society, 0-8186-7107-6. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | Fabian Vargas 0001, Michael Nicolaidis, Yervant Zorian |
An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 345-354, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | Andrew Flint |
Using the Right Tools and Techniques leads to Successful Testing of MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 673, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | Kevin T. Kornegay, Kaushik Roy 0001 |
Integrated Test Solutions and Test Economics for MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 193-201, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes |
Distributed Probabilistic Diagnosis of MCMs on Large Area. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995, pp. 208-216, 1995, IEEE Computer Society, 0-7803-2992-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | D. V. Das |
EM simulation [ICs and MCMs]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 264-267, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electromagnetic field theory, transmission line matrix methods, integrated circuit packaging, EM simulation, emitted radiation, transmission line matrix method, electromagnetic simulation, TLM method, signal integrity, multichip modules, IC, MCM, electromagnetic field |
28 | Sharad Mehrotra, Paul D. Franzon, Michael B. Steer |
Performance Driven Global Routing and Wiring Rule Generation for High Speed PCBs and MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 32st Conference on Design Automation, San Francisco, California, USA, Moscone Center, June 12-16, 1995., pp. 381-387, 1995, ACM Press, 0-89791-725-1. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
28 | James Loy, Atul Garg, Mukkai S. Krishnamoorthy, John F. McDonald 0001 |
Differential Routing of MCMs - CIF: The Ideal Bifurcation Medium. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD '94, Cambridge, MA, USA, October 10-12, 1994, pp. 599-603, 1994, IEEE Computer Society, 0-8186-6565-3. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
28 | Mick Tegethoff, Tom Chen 0001 |
Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994, pp. 903-910, 1994, IEEE Computer Society, 0-7803-2103-0. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
28 | Andrew Flint |
Test Strategies for a Family of Complex MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994, pp. 436-445, 1994, IEEE Computer Society, 0-7803-2103-0. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
28 | Ranga Vemuri, Nand Kumar, Raghu Vutukuru, Prasad Subba Rao, Praveen Sinha, Ning Ren, Paddy Mamtora, Ram Mandayam, Ram Vemuri, Jayanta Roy |
An Integrated Multicomponent Synthesis for MCMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 26(4), pp. 62-74, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
28 | David C. Keezer |
Known Godd Die for MCMs: Enabling Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993, pp. 266, 1993, IEEE Computer Society, 0-7803-1430-1. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
17 | Sebastian Wieczorek, Vitaly Kozyura, Andreas Roth 0001, Michael Leuschel, Jens Bendisposto, Daniel Plagge, Ina Schieferdecker |
Applying Model Checking to Generate Model-Based Integration Tests from Choreography Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communication Systems, 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings, pp. 179-194, 2009, Springer, 978-3-642-05030-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Service Choreography Models, Model Checking, Formal Methods, Model-based Testing, Integration Testing |
17 | Julien Arnaud, Daniel Négru, Mamadou Sidibé, Julien Pauty, Harilaos Koumaras |
Adapted IPTV service within novel IMS architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MobiMedia ![In: Proceedings of the 5th International Conference on Mobile Multimedia Communications, MobiMedia 2009, London, UK, September 7-9, 2009, 2009, ICST, 978-963-9799-62-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
PQoS, adaptation, IMS, IPTV |
17 | Alin Stefanescu, Sebastian Wieczorek, Andrei Kirshin |
MBT4Chor: A Model-Based Testing Approach for Service Choreographies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECMDA-FA ![In: Model Driven Architecture - Foundations and Applications, 5th European Conference, ECMDA-FA 2009, Enschede, The Netherlands, June 23-26, 2009. Proceedings, pp. 313-324, 2009, Springer, 978-3-642-02673-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Choreography Modeling, SOA, Model Transformation, Domain Specific Language, Model-Based Testing, Service Integration |
17 | Levent Aksoy, Eduardo A. C. da Costa, Paulo F. Flores, José Monteiro 0001 |
Exact and Approximate Algorithms for the Optimization of Area and Delay in Multiple Constant Multiplications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(6), pp. 1013-1026, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Zdenek Vasícek, Martin Zádník, Lukás Sekanina, Jirí Tobola |
On Evolutionary Synthesis of Linear Transforms in FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICES ![In: Evolvable Systems: From Biology to Hardware, 8th International Conference, ICES 2008, Prague, Czech Republic, September 21-24, 2008. Proceedings, pp. 141-152, 2008, Springer, 978-3-540-85856-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Paolo Bolettieri, Fabrizio Falchi, Claudio Gennaro, Fausto Rabitti |
A Digital Library Framework for Reusing e-Learning Video Documents. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EC-TEL ![In: Creating New Learning Experiences on a Global Scale, Second European Conference on Technology Enhanced Learning, EC-TEL 2007, Crete, Greece, September 17-20, 2007, Proceedings, pp. 444-449, 2007, Springer, 978-3-540-75194-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Multimedia Content Management System, User Interface, Metadata, Similarity Search, MPEG-7, LOM, Automatic Extraction |
17 | Jing Ai, Alhussein A. Abouzeid |
Coverage by directional sensors in randomly deployed wireless sensor networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comb. Optim. ![In: J. Comb. Optim. 11(1), pp. 21-41, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Directional sensors, Scheduling, Distributed algorithm, Network lifetime, Mathematical programming/optimization |
17 | Sandip Das 0001, Susmita Sur-Kolay, Bhargab B. Bhattacharya |
Manhattan-diagonal routing in channels and switchboxes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 9(1), pp. 75-104, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Manhattan routing, channel density, diagonal wires |
17 | Fang-Xiang Wu, Wen-Jun Zhang 0001, Anthony J. Kusalik |
Model-Based Clustering with Genes Expression Dynamics for Time-Course Gene Expression Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BIBE ![In: 4th IEEE International Symposium on BioInformatics and BioEngineering (BIBE 2004), 19-21 March 2004, Taichung, Taiwan, pp. 267-274, 2004, IEEE Computer Society, 0-7695-2173-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Markov Chain models (MCM), gene expression dynamics, average adjusted Rand index (AARI), model-based clustering |
17 | Jun Ni 0001, Lili Huang, Tao He 0003, Yongxiang Zhang, Shaowen Wang, Boyd M. Knosp, Chinglong Lin |
Distributed Computation for Diffusion Problem in a P2P-Enhanced Computing System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GCC (1) ![In: Grid and Cooperative Computing, Second International Workshop, GCC 2003, Shanghai, China, December 7-10, 2003, Revised Papers, Part I, pp. 428-435, 2003, Springer, 3-540-21988-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
17 | Alfredo Benso, Silvia Chiusano, Paolo Prinetto |
DFT and BIST of a Multichip Module for High-Energy Physics Experiments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 19(3), pp. 94-105, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
17 | Robby Schönfeld, Paul Molitor |
What are the samples for learning efficient routing heuristics? [MCM routing]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS (1) ![In: IEEE Asia Pacific Conference on Circuits and Systems 2002, APCCAS 2002, Singapore, 16-18 December 2002, pp. 267-272, 2002, IEEE, 0-7803-7690-0. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
17 | Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian |
Boundary Scan-Based Relay Wave Propagation Test of Arrays of Identical Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 50(10), pp. 1007-1019, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
relay propagation test, multiprocessor systems, Boundary scan |
17 | Koppolu Sasidhar, Abhijit Chatterjee |
Hierarchical Diagnosis of Identical Units in a System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 50(2), pp. 186-191, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
hierarchical diagnosis, System level diagnosis |
17 | Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi |
Connectivity-Based Multichip Module Repair. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 8th Pacific Rim International Symposium on Dependable Computing (PRDC 2001), 17-19 December 2001, Seoul, Korea, pp. 19-26, 2001, IEEE Computer Society, 0-7695-1414-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
17 | Jun Dong Cho |
Wiring space and length estimation in two-dimensional arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(5), pp. 612-615, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
17 | Vikram Pasham, Wilfrido Alejandro Moreno, Fernando J. Falquez |
Field Programmable Multi Chip Modules Using Programmable Laser Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE International Workshop on Rapid System Prototyping ![In: Proceedings of the Tenth IEEE International Workshop on Rapid System Prototyping (RSP 1999), Clearwater, Florida, USA, June 16-18, 1999, pp. 210-, 1999, IEEE Computer Society, 0-7695-0246-6. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Multi-FPGAs, Laser Vertical Links, LPIC, MCM, Programmable interconnects |
17 | Nohpill Park, Fabrizio Lombardi |
Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings, pp. 192-200, 1999, IEEE Computer Society, 0-7695-0325-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
17 | Fabien Clermidy, Thierry Collette, Michael Nicolaidis |
A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 1999 Pacific Rim International Symposium on Dependable Computing (PRDC 1999), 16-17 December 1999, Hong Kong, pp. 242-, 1999, IEEE Computer Society, 0-7695-0371-3. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
17 | Debaditya Mukherjee, Melvin A. Breuer |
An IEEE 1149.1 Compliant Test Control Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 13(3), pp. 273-297, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
test control, local test control, distributed test control, dynamic test control, built-in self-test, design-for-test, boundary scan, test bus |
17 | Jin Xu, Pei-Ning Guo, Chung-Kuan Cheng |
Rectilinear block placement using sequence-pair. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of the 1998 International Symposium on Physical Design, ISPD 1998, Monterey, CA, USA, April 6-8, 1998, pp. 173-178, 1998, ACM, 1-58113-021-X. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
17 | Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian |
A distributed BIST technique for diagnosis of MCM interconnections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 214-221, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
17 | Yervant Zorian, Hakim Bederr |
An Effective Multi-Chip BIST Scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 87-95, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
built-in self-test, DFT, MCM testing |
17 | Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn |
Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 151-166, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
known good die, bare die test, multichip modules |
17 | Ralf Schmid, Reinhold Schmitt, Matthias Brunner, Oliver Gessner, Matthias Sturm |
Electron Beam Probing - A Solution for MCM Test and Failure Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 55-63, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
electron-beam testing, short, open, MCM, printed circuit board |
17 | Najmi T. Jarwala |
Designing "Dual Personality" IEEE 1149.1 Compliant Multi-Chip Modules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 77-86, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
module test, design-for-testability, boundary-scan |
17 | Yervant Zorian |
Fundamentals of MCM Testing and Design-for-Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 7-14, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
known good dies, design-for-testability, MCM testing |
17 | Ken Posse |
A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 119-125, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
fault diagnosis, Boundary-Scan, Multichip Module, MCM, interconnect testing, manufacturing defects |
17 | Henrik Esbensen, Ernest S. Kuh |
A performance-driven IC/MCM placement algorithm featuring explicit design space exploration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 2(1), pp. 62-80, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
timing-driven building-block placement, design space exploration |
17 | Michel Kafrouni, Claude Thibeault, Yvon Savaria |
A Cost Model for VLSI / MCM Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France, pp. 148-156, 1997, IEEE Computer Society, 0-8186-8168-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
17 | James Loy, Atul Garg, Mukkai S. Krishnamoorthy, John F. McDonald 0001 |
Chip Pad Migration is a Key Component to High Performance MCM Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Great Lakes Symposium on VLSI ![In: 6th Great Lakes Symposium on VLSI (GLS-VLSI '96), March 22-23, 1996, Ames, IA, USA, pp. 96-99, 1996, IEEE Computer Society, 0-8186-7502-0. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
17 | Rick Amerson, Richard J. Carter, W. Bruce Culbertson, Philip Kuekes, Greg Snider |
Teramac-configurable custom computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FCCM ![In: 3rd IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM '95), 19-21 April 1995, Napa Valley, CA, USA, pp. 32-38, 1995, IEEE Computer Society, 0-8186-7086-X. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
17 | Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh |
Multichip systems trade-off analysis tool. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 5(2-3), pp. 207-218, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
flip chip bonding, multichip module (MCM), packaging and interconnect, Conceptual design, trade-off analysis |
17 | Jun Dong Cho, Majid Sarrafzadeh, Mysore Sriram, Sung-Mo Kang |
High-Performance MCM Routing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 10(4), pp. 27-37, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
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