Search results for "MCMs"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
145	Koppolu Sasidhar, Abhijit Chatterjee	Hierarchical Probablistic Diagnosis of MCMs on Large-Area Substrates.	VLSI Design	1996	DBLP DOI BibTeX RDF
95	Hameed A. Naseem, Ajay P. Malshe, Rajan A. Beera, M. Shahid Haque, William D. Brown, Len W. Schaper	CVD-diamond substrates for multi-chip modules (MCMs).	VLSI Design	1995	DBLP DOI BibTeX RDF	diamond, laser beam machining, metallisation, CVD coatings, elemental semiconductors, chemical vapour deposition, CVD-diamond substrates, 3D MCM, chemical vapor deposition, diamond thin films, laser drilling, via holes, metallization, dielectric coatings, multilayer interconnects, C, planarization, multichip modules, multichip modules, fabrication, polishing, polishing, substrates
61	Mick Tegethoff, Tom Chen 0001	Simulation Techniques for the Manufacturing Test of MCMs.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	simulation, test, DFT, yield, DFM, SMT, MCM, board
61	Marc Perbost, Ludovic Le Lan, Christian Landrault	Automatic Testability Analysis of Boards and MCMs at Chip Level.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	DFT, testability analysis, MCM
50	Nohpill Park, Fred J. Meyer, Fabrizio Lombardi	Quality-Effective Repair of Multichip Module Systems.	DFT	2000	DBLP DOI BibTeX RDF
49	Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel	Cyclic stress tests for full scan circuits.	VTS	1995	DBLP DOI BibTeX RDF	cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits
45	Anne E. Gattiker, Wojciech Maly	Smart Substrate MCMs.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	smart substrate, testing, cost model, MCM
45	Thomas M. Storey, Bruce McWilliam	A Test Methodology for High Performance MCMs.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	LOCST, AC BIST, delay testing, boundary scan, LSSD, MCM testing
45	Chua Hong Chuck, Chin Teck Chai, Tan Gim Chua	A structured approach for routing of MCMs.	KES (1)	1997	DBLP DOI BibTeX RDF
45	S. Y. Kulkarni, K. D. Patil, K. V. V. Murthy	Transmission line model parameters for very high speed VLSI interconnects in MCMs using FEM with special elements.	VLSI Design	1995	DBLP DOI BibTeX RDF	very high speed integrated circuits, transmission line theory, integrated circuit packaging, transmission line model parameters, very high speed VLSI interconnects, higher order isoparametric elements, 2D interconnect/dielectric packaging structures, quadrilateral infinite elements, signal conductor boundaries, sharp corners, finite element method, finite element analysis, computation time, multichip modules, multichip modules, FEM, MCM, integrated circuit interconnections, VLSI interconnects
34	Andrew Flint	MCM Test Strategy Synthesis from Chip Test and Board Test Approaches.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	board test, chip test, case studies, automatic test equipment
33	Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian	Distributed Diagnosis of Interconnections in SoC and MCM Designs.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	interconnect test and diagnosis, performance fault diagnosis, design for testability for SOCs and MCMs, MISR reconfiguration
28	Yajie Ji, Lijie Ji, Yanlai Chen, Zhenli Xu	MCMS-RBM: Multi-Component Multi-State Reduced Basis Method toward Efficient Transition Pathway Identification for Crystals and Quasicrystals.	CoRR	2023	DBLP DOI BibTeX RDF
28	Tong Gao, Hao Chen 0014, Wen Chen	MCMS-STM: An Extension of Support Tensor Machine for Multiclass Multiscale Object Recognition in Remote Sensing Images.	Remote. Sens.	2022	DBLP DOI BibTeX RDF
28	Shun Shen Peter Wang, Yin-Tien Wang, Choung-Lii Chao, Wei-Bin Yang	Instrumentation of Twin-MCMs based mutual-test.	Microelectron. J.	2021	DBLP DOI BibTeX RDF
28	Santosh Kumar Tripathy, Rajeev Srivastava	A real-time two-input stream multi-column multi-stage convolution neural network (TIS-MCMS-CNN) for efficient crowd congestion-level analysis.	Multim. Syst.	2020	DBLP DOI BibTeX RDF
28	Eduardo A. C. da Costa, Paulo F. Flores, José Monteiro 0001	Exploiting general coefficient representation for the optimal sharing of partial products in MCMs.	SBCCI	2006	DBLP DOI BibTeX RDF	common subexpression elimination (CSE), digital filter design, minimal signed digit (MSD), multiple constant multiplication (MCM)
28	Young-Jun Cha, Chong S. Rim, Kazuo Nakajima	A simple and effective greedy multilayer router for MCMs.	ISPD	1997	DBLP DOI BibTeX RDF
28	Andrew Flint	A Simulation-Based JTAG ATPG Optimized for MCMs.	ITC	1997	DBLP DOI BibTeX RDF
28	Sharad Kapur, Jinsong Zhao	A Fast Method of Moments Solver for Efficient Parameter Extraction of MCMs.	DAC	1997	DBLP DOI BibTeX RDF
28	Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian	Relay Propagation Scheme for Testing of MCMs on Large Area Substrates.	ED&TC	1996	DBLP DOI BibTeX RDF
28	Wang-Dauh Tseng, Kuochen Wang	Testable Design and Testing of MCMs Based on Multifrequency Scan.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	boundary scan architecture, multifrequency test, smart substrate, technology mixed, design for testability, VHDL, multichip module
28	Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian	Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates.	ITC	1996	DBLP DOI BibTeX RDF
28	Andrew Flint	Three Different MCMs, Three Different Test Strategies.	ITC	1996	DBLP DOI BibTeX RDF
28	Shoab Ahmed Khan, Vijay K. Madisetti	System Partitioning of MCMs for Low Power.	IEEE Des. Test Comput.	1995	DBLP DOI BibTeX RDF
28	Ananta K. Majhi, Lalit M. Patnaik, Srilata Raman	A genetic algorithm-based circuit partitioner for MCMs.	Microprocess. Microprogramming	1995	DBLP DOI BibTeX RDF
28	P. Brahic, Régis Leveugle, Gabriele Saucier	Design of defect-tolerant scan chains for MCMs with an active substrate.	DFT	1995	DBLP DOI BibTeX RDF
28	Fabian Vargas 0001, Michael Nicolaidis, Yervant Zorian	An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring.	ITC	1995	DBLP DOI BibTeX RDF
28	Andrew Flint	Using the Right Tools and Techniques leads to Successful Testing of MCMs.	ITC	1995	DBLP DOI BibTeX RDF
28	Kevin T. Kornegay, Kaushik Roy 0001	Integrated Test Solutions and Test Economics for MCMs.	ITC	1995	DBLP DOI BibTeX RDF
28	Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes	Distributed Probabilistic Diagnosis of MCMs on Large Area.	ITC	1995	DBLP DOI BibTeX RDF
28	D. V. Das	EM simulation [ICs and MCMs].	VLSI Design	1995	DBLP DOI BibTeX RDF	electromagnetic field theory, transmission line matrix methods, integrated circuit packaging, EM simulation, emitted radiation, transmission line matrix method, electromagnetic simulation, TLM method, signal integrity, multichip modules, IC, MCM, electromagnetic field
28	Sharad Mehrotra, Paul D. Franzon, Michael B. Steer	Performance Driven Global Routing and Wiring Rule Generation for High Speed PCBs and MCMs.	DAC	1995	DBLP DOI BibTeX RDF
28	James Loy, Atul Garg, Mukkai S. Krishnamoorthy, John F. McDonald 0001	Differential Routing of MCMs - CIF: The Ideal Bifurcation Medium.	ICCD	1994	DBLP DOI BibTeX RDF
28	Mick Tegethoff, Tom Chen 0001	Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs.	ITC	1994	DBLP DOI BibTeX RDF
28	Andrew Flint	Test Strategies for a Family of Complex MCMs.	ITC	1994	DBLP DOI BibTeX RDF
28	Ranga Vemuri, Nand Kumar, Raghu Vutukuru, Prasad Subba Rao, Praveen Sinha, Ning Ren, Paddy Mamtora, Ram Mandayam, Ram Vemuri, Jayanta Roy	An Integrated Multicomponent Synthesis for MCMs.	Computer	1993	DBLP DOI BibTeX RDF
28	David C. Keezer	Known Godd Die for MCMs: Enabling Technologies.	ITC	1993	DBLP DOI BibTeX RDF
17	Sebastian Wieczorek, Vitaly Kozyura, Andreas Roth 0001, Michael Leuschel, Jens Bendisposto, Daniel Plagge, Ina Schieferdecker	Applying Model Checking to Generate Model-Based Integration Tests from Choreography Models.	TestCom/FATES	2009	DBLP DOI BibTeX RDF	Service Choreography Models, Model Checking, Formal Methods, Model-based Testing, Integration Testing
17	Julien Arnaud, Daniel Négru, Mamadou Sidibé, Julien Pauty, Harilaos Koumaras	Adapted IPTV service within novel IMS architecture.	MobiMedia	2009	DBLP DOI BibTeX RDF	PQoS, adaptation, IMS, IPTV
17	Alin Stefanescu, Sebastian Wieczorek, Andrei Kirshin	MBT4Chor: A Model-Based Testing Approach for Service Choreographies.	ECMDA-FA	2009	DBLP DOI BibTeX RDF	Choreography Modeling, SOA, Model Transformation, Domain Specific Language, Model-Based Testing, Service Integration
17	Levent Aksoy, Eduardo A. C. da Costa, Paulo F. Flores, José Monteiro 0001	Exact and Approximate Algorithms for the Optimization of Area and Delay in Multiple Constant Multiplications.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
17	Zdenek Vasícek, Martin Zádník, Lukás Sekanina, Jirí Tobola	On Evolutionary Synthesis of Linear Transforms in FPGA.	ICES	2008	DBLP DOI BibTeX RDF
17	Paolo Bolettieri, Fabrizio Falchi, Claudio Gennaro, Fausto Rabitti	A Digital Library Framework for Reusing e-Learning Video Documents.	EC-TEL	2007	DBLP DOI BibTeX RDF	Multimedia Content Management System, User Interface, Metadata, Similarity Search, MPEG-7, LOM, Automatic Extraction
17	Jing Ai, Alhussein A. Abouzeid	Coverage by directional sensors in randomly deployed wireless sensor networks.	J. Comb. Optim.	2006	DBLP DOI BibTeX RDF	Directional sensors, Scheduling, Distributed algorithm, Network lifetime, Mathematical programming/optimization
17	Sandip Das 0001, Susmita Sur-Kolay, Bhargab B. Bhattacharya	Manhattan-diagonal routing in channels and switchboxes.	ACM Trans. Design Autom. Electr. Syst.	2004	DBLP DOI BibTeX RDF	Manhattan routing, channel density, diagonal wires
17	Fang-Xiang Wu, Wen-Jun Zhang 0001, Anthony J. Kusalik	Model-Based Clustering with Genes Expression Dynamics for Time-Course Gene Expression Data.	BIBE	2004	DBLP DOI BibTeX RDF	Markov Chain models (MCM), gene expression dynamics, average adjusted Rand index (AARI), model-based clustering
17	Jun Ni 0001, Lili Huang, Tao He 0003, Yongxiang Zhang, Shaowen Wang, Boyd M. Knosp, Chinglong Lin	Distributed Computation for Diffusion Problem in a P2P-Enhanced Computing System.	GCC (1)	2003	DBLP DOI BibTeX RDF
17	Alfredo Benso, Silvia Chiusano, Paolo Prinetto	DFT and BIST of a Multichip Module for High-Energy Physics Experiments.	IEEE Des. Test Comput.	2002	DBLP DOI BibTeX RDF
17	Robby Schönfeld, Paul Molitor	What are the samples for learning efficient routing heuristics? [MCM routing].	APCCAS (1)	2002	DBLP DOI BibTeX RDF
17	Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian	Boundary Scan-Based Relay Wave Propagation Test of Arrays of Identical Structures.	IEEE Trans. Computers	2001	DBLP DOI BibTeX RDF	relay propagation test, multiprocessor systems, Boundary scan
17	Koppolu Sasidhar, Abhijit Chatterjee	Hierarchical Diagnosis of Identical Units in a System.	IEEE Trans. Computers	2001	DBLP DOI BibTeX RDF	hierarchical diagnosis, System level diagnosis
17	Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi	Connectivity-Based Multichip Module Repair.	PRDC	2001	DBLP DOI BibTeX RDF
17	Jun Dong Cho	Wiring space and length estimation in two-dimensional arrays.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
17	Vikram Pasham, Wilfrido Alejandro Moreno, Fernando J. Falquez	Field Programmable Multi Chip Modules Using Programmable Laser Interconnects.	IEEE International Workshop on Rapid System Prototyping	1999	DBLP DOI BibTeX RDF	Multi-FPGAs, Laser Vertical Links, LPIC, MCM, Programmable interconnects
17	Nohpill Park, Fabrizio Lombardi	Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield.	DFT	1999	DBLP DOI BibTeX RDF
17	Fabien Clermidy, Thierry Collette, Michael Nicolaidis	A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application.	PRDC	1999	DBLP DOI BibTeX RDF
17	Debaditya Mukherjee, Melvin A. Breuer	An IEEE 1149.1 Compliant Test Control Architecture.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	test control, local test control, distributed test control, dynamic test control, built-in self-test, design-for-test, boundary scan, test bus
17	Jin Xu, Pei-Ning Guo, Chung-Kuan Cheng	Rectilinear block placement using sequence-pair.	ISPD	1998	DBLP DOI BibTeX RDF
17	Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian	A distributed BIST technique for diagnosis of MCM interconnections.	ITC	1998	DBLP DOI BibTeX RDF
17	Yervant Zorian, Hakim Bederr	An Effective Multi-Chip BIST Scheme.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	built-in self-test, DFT, MCM testing
17	Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn	Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	known good die, bare die test, multichip modules
17	Ralf Schmid, Reinhold Schmitt, Matthias Brunner, Oliver Gessner, Matthias Sturm	Electron Beam Probing - A Solution for MCM Test and Failure Analysis.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	electron-beam testing, short, open, MCM, printed circuit board
17	Najmi T. Jarwala	Designing "Dual Personality" IEEE 1149.1 Compliant Multi-Chip Modules.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	module test, design-for-testability, boundary-scan
17	Yervant Zorian	Fundamentals of MCM Testing and Design-for-Testability.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	known good dies, design-for-testability, MCM testing
17	Ken Posse	A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	fault diagnosis, Boundary-Scan, Multichip Module, MCM, interconnect testing, manufacturing defects
17	Henrik Esbensen, Ernest S. Kuh	A performance-driven IC/MCM placement algorithm featuring explicit design space exploration.	ACM Trans. Design Autom. Electr. Syst.	1997	DBLP DOI BibTeX RDF	timing-driven building-block placement, design space exploration
17	Michel Kafrouni, Claude Thibeault, Yvon Savaria	A Cost Model for VLSI / MCM Systems.	DFT	1997	DBLP DOI BibTeX RDF
17	James Loy, Atul Garg, Mukkai S. Krishnamoorthy, John F. McDonald 0001	Chip Pad Migration is a Key Component to High Performance MCM Design.	Great Lakes Symposium on VLSI	1996	DBLP DOI BibTeX RDF
17	Rick Amerson, Richard J. Carter, W. Bruce Culbertson, Philip Kuekes, Greg Snider	Teramac-configurable custom computing.	FCCM	1995	DBLP DOI BibTeX RDF
17	Peter Sandborn, Rajarshi Ghosh, Ken Drake, Magdy S. Abadir, Linda Bal, Ashish Parikh	Multichip systems trade-off analysis tool.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	flip chip bonding, multichip module (MCM), packaging and interconnect, Conceptual design, trade-off analysis
17	Jun Dong Cho, Majid Sarrafzadeh, Mysore Sriram, Sung-Mo Kang	High-Performance MCM Routing.	IEEE Des. Test Comput.	1993	DBLP DOI BibTeX RDF