Search results for "Mixed-Signal"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
110	Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar	AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.	ASP-DAC	2007	DBLP DOI BibTeX RDF	mixed-signal cores, wafer-level defect screening, packaging cost reduction, big-D/small-A mixed-signal system-on-chip designs, mixed-signal SoC, consumer electronics market, wafer-level testing, correlation-based signature analysis, low-cost digital testers, generic cost model, mixed-signal test, digital logic, test cost reduction
72	Johan Verfaillie, Didier Haspeslagh	A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	mixed-signal DFT, mixed-signal boundary scan, modular mixed-signal test
57	Gloria Huertas, Diego Vázquez, Eduardo J. Peralías, Adoración Rueda, José L. Huertas	Testing mixed-signal cores: practical oscillation-based test in an analog macrocell.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	analog macrocell, mixed signal integrated circuit, OBT, mixed-signal macrocell, integrated circuit testing, mixed analogue-digital integrated circuits, oscillation-based test
55	Rajesh Ramadoss, Michael L. Bushnell	Test Generation for Mixed-Signal Devices Using Signal Flow Graphs.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	analog test generation, mixed-signal test generation, back tracing, parametric faults, catastrophic faults
54	Robert L. Ewing	Technology Road Map to Methodologies for Mixed-Signal System Design and Simulation.	J. VLSI Signal Process.	1999	DBLP DOI BibTeX RDF
53	Sudip Chakrabarti, Abhijit Chatterjee	Compact Fault Dictionary Construction for Efficient Isolation of Faults in Analog and Mixed-Signal Circuits.	ARVLSI	1999	DBLP DOI BibTeX RDF	fault diagnosis, analog, Design automation, mixed-signal, fault isolation
51	Rajesh Ramadoss, Michael L. Bushnell	Test generation for mixed-signal devices using signal flow graphs.	VLSI Design	1996	DBLP DOI BibTeX RDF	mixed-signal devices, reverse simulation approach, component tolerances, analog input sinusoids, test generation results, analog backtrace method, high-order analog circuits, fault diagnosis, test generation, integrated circuit testing, automatic testing, circuit analysis computing, mixed analogue-digital integrated circuits, signal flow graphs, signal flow graphs, nonlinear circuits
51	Ananta K. Majhi, Vishwani D. Agrawal	Mixed-Signal Test.	VLSI Design	1998	DBLP DOI BibTeX RDF	a survey of mixed-signal testing, tools and methods for mixed-signal test, Analog test
51	Javier Argüelles, Salvador Bracho	Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply current.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	mixed-signal IC testing, design for test in mixed-signal IC, built-in current sensors
48	Jaeha Kim	Mixed-Signal System Verification: A High-Speed Link Example.	CAV	2009	DBLP DOI BibTeX RDF	analog and mixed-signal verification, analog design intent, linear system models
48	Jie Liu 0001, Edward A. Lee	A component-based approach to modeling and simulating mixed-signal and hybrid systems.	ACM Trans. Model. Comput. Simul.	2002	DBLP DOI BibTeX RDF	actors-oriented design, hierarchical heterogeneity, mixed-signal systems, simulation, hybrid systems, Component-based modeling, Ptolemy II
48	Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek	Integrated Design and Test of Mixed-Signal Circuits.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	design and test integration, test plan generation, specification-based testing, mixed-signal test
48	Pierluigi Daglio	A complete and fully qualified design flow for verification of mixed-signal SoC with embedded flash memories.	DATE Designers' Forum	2006	DBLP DOI BibTeX RDF
46	Joonsung Park, Hongjoong Shin, Jacob A. Abraham	Parallel Loopback Test of Mixed-Signal Circuits.	VTS	2008	DBLP DOI BibTeX RDF	Test Quality and Reliability, Loopback Test, Characterization, Mixed-signal Test, Parallel Test
46	Sasikumar Cherubal, Abhijit Chatterjee	A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms.	DFT	1999	DBLP DOI BibTeX RDF	fault simulation, Mixed-signal test, fault isolation
46	Pascal Caunegre, Claude Abraham	Fault simulation for mixed-signal systems.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	mixed-signal systems, fault simulation, bridging faults
46	Gordon W. Roberts	Metrics, techniques and recent developments in mixed-signal testing.	ICCAD	1996	DBLP DOI BibTeX RDF	manufacturing environment, measurement setups, quality, mixed-signal testing, mixed analogue-digital integrated circuits, manufacturing defects, product cost
44	Stephen K. Sunter, Aubin Roy	A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution.	ETS	2011	DBLP DOI BibTeX RDF	mixed-signal DFT, analog bus, mixed-signal BIST
43	José Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor	Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	mixed current/voltage testing, design for testability, mixed-signal testing, cross-correlation
42	Daniela De Venuto, Michael J. Ohletz	On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	mixed-signal ASIC, hardware conversion, GO/NOGO test, bias programming, DfT, power consumption, overhead
42	Li-Rong Zheng 0001, Hannu Tenhunen	Noise Margin Constraints for Interconnectivity in Deep Submicron Low Power and Mixed-Signal VLSI Circuits.	ARVLSI	1999	DBLP DOI BibTeX RDF	Mixed-Signal VLSI, Interconnection, Crosstalk, Noise Margin
42	Ashok Balivada, Hong Zheng, Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham	A unified approach for fault simulation of linear mixed-signal circuits.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	arithmetic distance, testing, fault simulation, mixed-signal
42	José Luis Huertas	Test and design-for-test of mixed-signal integrated circuits.	SBCCI	2004	DBLP DOI BibTeX RDF
42	Junwei Hou, William H. Kao, Abhijit Chatterjee	A novel concurrent fault simulation method for mixed-signal circuits.	ISCAS (2)	1999	DBLP DOI BibTeX RDF
41	Mehdi M. Mechaik	Electrical Characterization of Signal Routability and Performance.	ISQED	2000	DBLP DOI BibTeX RDF
40	Nathaniel J. August	A Robust and Efficient Pre-Silicon Validation Environment for Mixed-Signal Circuits on Intel's Test Chips.	ISQED	2008	DBLP DOI BibTeX RDF	pre-silicon, validation, mixed-signal
40	Peng Zhang, Wai-Shing Luk, Yu Song, Jiarong Tong, Pushan Tang, Xuan Zeng 0001	WCOMP: Waveform Comparison Tool for Mixed-signal Validation Regression in Memory Design.	ASP-DAC	2007	DBLP DOI BibTeX RDF	Flash memory design, WCOMP, waveform comparison tool, full-chip validation, design cost, automated mixed-signal validation regression, functional match, time-to-market
40	Trent McConaghy, Georges G. E. Gielen	Automation in mixed-signal design: challenges and solutions in the wake of the nano era.	ICCAD	2006	DBLP DOI BibTeX RDF	computer-aided design, analog, integrated circuits, mixed-signal
40	Gladys Omayra Ducoudray, Jaime Ramírez-Angulo	Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	iDD analysis, built-in self-test, mixed-signal test
40	Mike W. T. Wong, K. Y. Ko, Yim-Shu Lee	Analog and Mixed-Signal IP Cores Testing.	DELTA	2002	DBLP DOI BibTeX RDF	mixed-signal design, analog circuit testing, SOCs
40	Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, Mani Soma	Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	Efficient, ATPG, Digital, Analog, Mixed-Signal
38	Daniele Bonomi, Giorgio Boselli, Gabriella Trucco, Valentino Liberali	Effects of digital switching noise on analog voltage references in mixed-signal CMOS ICs.	SBCCI	2006	DBLP DOI BibTeX RDF	crosstalk, mixed-signal ICs
38	Erik A. McShane, Krishna Shenai, Leon Alkalai, E. Kolawa, Victor Boyadzhyan, Brent R. Blaes, Wai-Chi Fang	Novel Design for Testability of a Mixed-Signal VLSI IC.	Great Lakes Symposium on VLSI	1999	DBLP DOI BibTeX RDF	Mixed-signal VLSI, verification, microprocessor, testability, RF
38	João Paulo Costa, Mike Chou, L. Miguel Silveira	Efficient Techniques for Accurate Modeling and Simulation of Substrate Coupling in Mixed-Signal IC's.	DATE	1998	DBLP DOI BibTeX RDF	Eigenfunction, Eigenpair, Fast Fourier Transform, Discrete Cosine Transform, Eigenvalue, Mixed-Signal, Substrate Coupling
38	Sree Ganesan, Ranga Vemuri	Analog-Digital Partitioning for Field-Programmable Mixed Signal Systems.	ARVLSI	2001	DBLP DOI BibTeX RDF
36	V. Loukusa	Embedded System Level Self-Test for Mixed-Signal IO Verification.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	IO connectivity, DFT, histogram, testability, self-test, mixed-signal, system level
35	Sri Chandra	Driving Analog Mixed Signal Verification through Verilog-AMS.	VLSI Design	2008	DBLP DOI BibTeX RDF
35	Liyi Xiao, Bin Li, Yizheng Ye, Guoyong Huang, JinJun Guo, Peng Zhang	A mixed-signal simulator for VHDL-AMS.	ASP-DAC	2001	DBLP DOI BibTeX RDF
35	Huimin Xia, Khaldoun Bataineh, Marwan Hassoun, Joe Kryzak	A mixed-signal behavioral level implementation of 1000BASE-X physical layer for gigabit Ethernet.	ISCAS (1)	1999	DBLP DOI BibTeX RDF
34	Erik A. McShane, Krishna Shenai, Leon Alkalai, E. Kolawa, Victor Boyadzhyan, Brent R. Blaes, Wai-Chi Fang	Monolithic Microprocessor and RF Transceiver in 0.25-micron FDSOI CMOS.	Great Lakes Symposium on VLSI	1999	DBLP DOI BibTeX RDF	Mixed-signal VLSI, VLSI circuits process for mixed-signal VLSI in a die size measuring 2.2 mm x 2.2 mm, low-power, microprocessor, RF
34	ByongChan Lim, Jaeha Kim, Mark A. Horowitz	An efficient test vector generation for checking analog/mixed-signal functional models.	DAC	2010	DBLP DOI BibTeX RDF	linear abstraction, validation, equivalence checking, verilog, functional model, test vector, mixed-signal circuits
34	Anirudh Devgan, Bulent Basaran, David Colleran, Mar Hershenson	Accelerated design of analog, mixed-signal circuits in Titan.	ISPD	2009	DBLP DOI BibTeX RDF	analog circuit layout, analog/digital, custom design, layout, physical design, analog circuits, mixed-signal circuits
34	Geoffrey Ying, Andreas Kuehlmann, Kenneth S. Kundert, Georges G. E. Gielen, Eric Grimme, Martin O'Leary, Sandeep Tare, Warren Wong	Guess, solder, measure, repeat: how do I get my mixed-signal chip right?	DAC	2009	DBLP DOI BibTeX RDF	Verilog-AMS, analog behavioral modeling, low power verification, mixed-signal verification, VHDL, SPICE, functional verification, Verilog, performance verification
34	Sounil Biswas, R. D. (Shawn) Blanton	Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data.	VTS	2008	DBLP DOI BibTeX RDF	pass-fail test data, boolean minimization, minimum constrained subset cover, Mixed-signal test, test compaction
34	Brian P. Ginsburg, Anantha P. Chandrakasan	The mixed signal optimum energy point: voltage and parallelism.	DAC	2008	DBLP DOI BibTeX RDF	optimization, low-power, analog-to-digital converters, mixed-signal circuits
34	Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani	RF Testing on a Mixed Signal Tester.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	DFT, ATE, RF, mixed signal, IC testing
34	David Walter, Scott Little, Nicholas Seegmiller, Chris J. Myers, Tomohiro Yoneda	Symbolic Model Checking of Analog/Mixed-Signal Circuits.	ASP-DAC	2007	DBLP DOI BibTeX RDF	analog/mixed-signal circuits, Boolean based symbolic model checking algorithm, VHDL-AMS description, labeled hybrid Petri nets, Boolean signals, temporal logic formulas, timed CTL, Boolean variables, Boolean function, binary decision diagram, hardware description language
34	Cristoforo Marzocca, Francesco Corsi	Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	circuit signature, mixed-signal test, pseudo-random test
34	Adil Koukab, Catherine Dehollain, Michel J. Declercq	HSpeedEx: a high-speed extractor for substrate noise analysis in complex mixed signal SOC.	DAC	2002	DBLP DOI BibTeX RDF	mixed-signal noise, supply noise, noise, numerical analysis, boundary-element-method, substrate noise, switching circuits, substrate coupling
34	Jan Arild Tofte, Chee-Kian Ong, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng	Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test.	VTS	2000	DBLP DOI BibTeX RDF	cross-correlation signature register, CCSR, implicit functional testing, harmonic distortion, THD, classification, synthesis, noise, BIST, convex hull, polygon, discrimination, analog test, cross-correlation, mixed-signal, pseudo-random, pseudo-random, labview, impulse response, performance parameter, analog BIST
34	Sasikumar Cherubal, Abhijit Chatterjee	An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards.	VLSI Design	2000	DBLP DOI BibTeX RDF	mixed-signal boards, fault verification, Fault isolation
34	Jeongjin Roh, Jacob A. Abraham	A Mixed-Signal BIST Scheme with Time-Division Multiplexing (TDM) Comparator and Counters.	VLSI Design	2000	DBLP DOI BibTeX RDF	BIST, Time-division multiplexing, Comparator, Mixed-signal, Signature analyzer
34	Serge N. Demidenko, Vincenzo Piuri, Vyacheslav N. Yarmolik, A. Shmidman	BIST Module for Mixed-Signal Circuits.	DFT	1998	DBLP DOI BibTeX RDF	Built-in Selft-Test, Test Data Generator, Mixed-Signal Circuits, Signature Analyzer
34	Eric Felt, Stefano Zanella, Carlo Guardiani, Alberto L. Sangiovanni-Vincentelli	Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling.	ICCAD	1996	DBLP DOI BibTeX RDF	statistical characterization, behavioral modeling, mixed-signal circuits
33	Akira Matsuzawa	High Quality Analog CMOS and Mixed Signal LSI Design.	ISQED	2001	DBLP DOI BibTeX RDF
32	Diego Vázquez, Gloria Huertas, África Luque, Manuel J. Barragan Asian, Gildas Léger, Adoración Rueda, José Luis Huertas	Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	BIST, analog testing, mixed-signal testing, sigma-delta modulation
32	Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen	Analog signal metrology for mixed signal ICs.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	Analog signal metrology, multiple period low-rate sampled waveform, high-rate sampled waveform, DSP based testing, on-chip ADC, 20 MHz, mixed analogue-digital integrated circuits, Signal reconstruction, mixed signal IC
32	Kevin J. Kerns, Ivan L. Wemple, Andrew T. Yang	Stable and efficient reduction of substrate model networks using congruence transforms.	ICCAD	1995	DBLP DOI BibTeX RDF	mixed-signal integrated circuits, rc network reduction, congruence transform, pade approximation, lanczos process, stability, voronoi tesselation, substrate noise
31	Robert J. Bowman	An Educational Program for Engineering Careers in Analog and Mixed-Signal Electronic Design.	MSE	2005	DBLP DOI BibTeX RDF
31	John Marty Emmert, Jason A. Cheatham, Badhri Jagannathan, Sandeep Umarani	A Monolithic Spectral BIST Technique for Control or Test of Analog or Mixed-Signal Circuits.	DFT	2003	DBLP DOI BibTeX RDF
30	Rajdeep Mukhopadhyay, Subrat Kumar Panda, Pallab Dasgupta, John Gough	Instrumenting AMS assertion verification on commercial platforms.	ACM Trans. Design Autom. Electr. Syst.	2009	DBLP DOI BibTeX RDF	OVL, SVA, integrated mixed signal design, verification library, simulation, Assertion
30	Pradip A. Thaker	Holistic verification: myth or magic bullet?	DAC	2009	DBLP DOI BibTeX RDF	SoC verification, mixed-signal verification, power management verification, emulation
30	Christopher Labrecque	Near-term industrial perspective of analog CAD.	ICCAD	2006	DBLP DOI BibTeX RDF	computer-aided design, analog, integrated circuits, mixed-signal
30	Yu Liu, Thanyapat Sakunkonchak, Satoshi Komatsu, Masahiro Fujita	System level design language extensions for timed/untimed digital-analog combined system design.	ACM Great Lakes Symposium on VLSI	2005	DBLP DOI BibTeX RDF	AMS extension, timed/untimed, synchronization, system level design, mixed-signal
30	L. Cassol, O. Betat, Luigi Carro, Marcelo Lubaszewski	The SigmaDelta-BIST Method Applied to Analog Filters.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	BIST, analog test, mixed signal testing, sigma-delta modulator
30	Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil	Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	supply current test, I DD, I DDX monitor, analog test, structural test, mixed-signal test, current monitor
30	Fernando da Rocha Paixão Cortes, Sergio Bampi	A fully integrated CMOS RF front-end for a multi-band analog mixed-signal interface.	SBCCI	2007	DBLP DOI BibTeX RDF	RF front-end, VGA, analog/RF design, frequency translation, mixer
29	Hari Vijay Venkatanarayanan, Michael L. Bushnell	An Area Efficient Mixed-Signal Test Architecture for Systems-on-a-Chip.	VLSI Design	2006	DBLP DOI BibTeX RDF
29	Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty	A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.	ICCD	2005	DBLP DOI BibTeX RDF
29	Shibaji Banerjee, Debdeep Mukhopadhyay, Dipanwita Roy Chowdhury	Computer Aided Test (CAT) Tool for Mixed Signal SOCs.	VLSI Design	2005	DBLP DOI BibTeX RDF
29	Geert Seuren, Tom Waayers	Extending the Digital Core-based Test Methodology to Support Mixed-Signal.	ITC	2004	DBLP DOI BibTeX RDF
29	John A. Nestor, David A. Rich	Integrating Digital, Analog, and Mixed-Signal Design in an Undergraduate ECE Curriculum.	MSE	2003	DBLP DOI BibTeX RDF
29	Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty	TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.	ICCAD	2003	DBLP DOI BibTeX RDF
29	Meigen Shen, Li-Rong Zheng 0001, Hannu Tenhunen	Case study of cost and performance trade-off analysis for mixed-signal integration in system-on-chip.	ISCAS (5)	2003	DBLP DOI BibTeX RDF
29	Antonio J. Ginés, Eduardo J. Peralías, Adoración Rueda, Ralf Seepold, Natividad Martínez Madrid	A Mixed-Signal Design Reuse Methodology Based on Parametric Behavioural Models with Non-Ideal Effects.	DATE	2002	DBLP DOI BibTeX RDF
29	Stephan Ohr, Rob A. Rutenbar, Henry Chang, Georges G. E. Gielen, Rudolf Koch, Roy McGuffin, K. C. Murphy	Survival strategies for mixed-signal systems-on-chip (panel session).	DAC	2000	DBLP DOI BibTeX RDF
29	Sudip Chakrabarti, Abhijit Chatterjee	Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits.	ISCAS (2)	1999	DBLP DOI BibTeX RDF
29	Chen-Yang Pan, Kwang-Ting Cheng	Pseudorandom testing for mixed-signal circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1997	DBLP DOI BibTeX RDF
29	Edward K. F. Lee	Reconfigurable data converter as a building block for mixed-signal test.	ED&TC	1997	DBLP DOI BibTeX RDF
28	Gordon W. Roberts	Test Methods For Sigma-Delta Data Converters and Related Devices.	SBCCI	2008	DBLP DOI BibTeX RDF	sigma-delta converter, mixed-signal testing
28	Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen 0001, Randall L. Geiger	BIST and production testing of ADCs using imprecise stimulus.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	ADC linearity, imprecision measurement, imprecision stimulus, built-in self-test, Analog and mixed-signal testing, production test
28	Wei-Yu Chen, Sandeep K. Gupta 0001, Melvin A. Breuer	Test Generation for Crosstalk-Induced Faults: Framework and Computational Results.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	time-based test generation, fault modeling, crosstalk, mixed-signal test
28	Wei-Yu Chen, Sandeep K. Gupta 0001, Melvin A. Breuer	Test generation for crosstalk-induced faults: framework and computational result.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	2-vector test generation, crosstalk-induced faults, noise effects, design effort, debugging effort, pulses, signal speedup, signal slowdown, digital combinational circuits, mixed-signal test generator, XGEN, static values, dynamic signals, signal arrival times, rise times, fall times, integrated circuit testing, automatic test pattern generation, combinational circuits, accuracy, vectors, circuit analysis computing, crosstalk, transitions, integrated logic circuits, technology scaling, SPICE simulations, gate delay, circuit performance, timing information, clock frequency
28	W. P. M. Allen, Donald G. Bailey, Serge N. Demidenko, Vincenzo Piuri	Analysis and application of digital spectral warping in analog and mixed-signal testing.	IEEE Trans. Reliab.	2003	DBLP DOI BibTeX RDF
28	Aarthi M. Reddy, Bhiksha Raj	Soft Mask Methods for Single-Channel Speaker Separation.	IEEE Trans. Speech Audio Process.	2007	DBLP DOI BibTeX RDF
27	Byoungho Kim, Nash Khouzam, Jacob A. Abraham	Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.	VTS	2008	DBLP DOI BibTeX RDF	Loopback Test, Aperture Jitter, Digital-to-Analog Converter, Analog-to-Digital Converter, ADC, Mixed-Signal Testing, DAC
27	Thomas Brandtner	Chip-Package Codesign Flow for Mixed-Signal SiP Designs.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	Mixed-Signal System-in-Package design, SiP
27	Antonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski	Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST.	SBCCI	2004	DBLP DOI BibTeX RDF	system-on-chip, BIST, power aware, mixed-signal test
27	Gabriella Trucco, Giorgio Boselli, Valentino Liberali	An approach to computer simulation of bonding and package crosstalk in mixed-signal CMOS ICs.	SBCCI	2004	DBLP DOI BibTeX RDF	crosstalk, mixed-signal ICs
27	Robert M. Senger, Eric D. Marsman, Michael S. McCorquodale, Fadi H. Gebara, Keith L. Kraver, Matthew R. Guthaus, Richard B. Brown	A 16-bit mixed-signal microsystem with integrated CMOS-MEMS clock reference.	DAC	2003	DBLP DOI BibTeX RDF	low voltage analog, varactor, low power, SoC, system-on-chip, design methodology, MEMS, microcontroller, ADC, mixed-signal, PGA, microsystem, SD, inductor, clock generation
27	Daniela De Venuto, Michael J. Ohletz, Bruno Riccò	Digital Window Comparator DfT Scheme for Mixed-Signal ICs.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	mixed-signal ASIC, window comparator, GO/NOGO test, signal level evaluation, DfT
27	José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski	Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.	VTS	2002	DBLP DOI BibTeX RDF	BIST, design for test, analog test, mixed-signal test
27	Anna Maria Brosa, Joan Figueras	Digital Signature Proposal for Mixed-Signal Circuits.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	BIST, analog test, mixed-signal test
27	Carsten Wegener, Michael Peter Kennedy	Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs.	DATE	2000	DBLP DOI BibTeX RDF	Defect and Tolerance-Oriented Test, ATPG and Fault Modeling, Analog and Mixed-Signal Test
27	Naim Ben-Hamida, Khaled Saab 0001, David Marche, Bozena Kaminska	A perturbation based fault modeling and simulation for mixed-signal circuits.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	analog circuit fault simulation, perturbation fault model, fault abstraction, structural fault modeling, perturbation estimation, fault observation, hierarchical analog fault simulator, complexity, test generation, CMOS, mixed-signal circuits, mixed analogue-digital integrated circuits, functional fault modeling, physical defects
27	Naim Ben-Hamida, Bechir Ayari, Bozena Kaminska	Testing of embedded A/D converters in mixed-signal circuit.	ICCD	1996	DBLP DOI BibTeX RDF	embedded A/D converters testing, integral nonlinearity error, differential nonlinearity error, offset error, gain error, boolean function manipulation, FFT, histogram, functional testing, transfer function, digital circuit, signal-to-noise ratio, mixed-signal circuit, analogue-digital conversion
27	Karim Arabi, Bozena Kaminska	Oscillation-test strategy for analog and mixed-signal integrated circuits.	VTS	1996	DBLP DOI BibTeX RDF	circuit oscillations, oscillation test strategy, analog ICs, low-cost test method, oscillation frequency deviation, wafer-probe testing, final production testing, ASIC testing, integrated circuit testing, operational amplifiers, analogue integrated circuits, mixed analogue-digital integrated circuits, production testing, analogue-digital conversion, mixed-signal ICs
27	Mitra Mirhassani	Mixed-signal CVNS adder for two-operand binary addition.	EIT	2009	DBLP DOI BibTeX RDF
27	Le Jin, Chengming He, Degang Chen 0001, Randall L. Geiger	An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli.	ISCAS (1)	2004	DBLP DOI BibTeX RDF
26	Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham	Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation.	ITC	2004	DBLP DOI BibTeX RDF