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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 53 occurrences of 38 keywords
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Results
Found 227 publication records. Showing 226 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
152 | Ji Hwan Cha |
On optimal burn-in procedures - a generalized model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 54(2), pp. 198-206, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
111 | Shey-Huei Sheu, Yu-Hung Chien |
Minimizing cost-functions related to both burn-in and field-operation under a generalized model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 53(3), pp. 435-439, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
101 | Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko |
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 472, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
98 | Kyungmee O. Kim, W. Kuo |
Some considerations on system burn-in. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 54(2), pp. 207-214, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
98 | Thomas S. Barnett, Adit D. Singh |
Relating Yield Models to Burn-In Fall-Out in Time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 77-84, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
87 | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |
Cyclic stress tests for full scan circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 89-94, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits |
84 | Chin-Long Wey, Meng-Yao Liu |
Burn-In Stress Test of Analog CMOS ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, pp. 360-365, 2004, IEEE Computer Society, 0-7695-2235-1. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
84 | Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins |
Burn-in Temperature Projections for Deep Sub-micron Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 95-104, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
81 | Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 193-198, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
wafer-level, pattern ordering, burn-in |
81 | Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev |
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA, pp. 427-432, 2005, IEEE Computer Society, 0-7695-2301-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Electrostatic discharge (ESD), electrical overstress (EOS), LVTSCR, latch-up, burn-in |
74 | Mesut Meterelliyoz, Kaushik Roy 0001 |
Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009, pp. 787-792, 2009, IEEE, 978-1-4244-2748-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
67 | Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko |
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 88-98, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
burn-in reduction, voltage stress, Weibull analysis, integral circuit testing |
57 | Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz |
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 1103-1106, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
57 | Ji Hwan Cha |
An extended model for optimal burn-in procedures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 55(2), pp. 189-198, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
57 | Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi |
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings, pp. 12-19, 2002, IEEE Computer Society, 0-7695-1831-1. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
57 | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
CMOS IC reliability indicators and burn-in economics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 194-203, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
54 | Vivek De |
Leakage-tolerant design techniques for high performance processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of 2002 International Symposium on Physical Design, ISPD 2002, Del Mar, CA, USA, April 7-10, 2002, pp. 28-28, 2002, ACM, 1-58113-460-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
50 | Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko |
Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008, pp. 216-221, 2008, IEEE Computer Society, 978-0-7695-3110-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
wafer testing, reliability, integrated circuits, burn-in, yield modelling |
50 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 29-38, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
infant mortality, negative binomial distribution, clustering, reliability, redundancy, yield, defects, defect tolerance, burn-in |
44 | Sagar S. Sabade, D. M. H. Walker |
Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 81-86, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
44 | Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch |
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 69-74, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
44 | Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy |
Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 75-80, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
44 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 326-332, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
37 | Larry Gilg |
Known Good Die. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 15-25, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in |
30 | Shaomin Wu, Min Xie 0001 |
Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 56(3), pp. 552-561, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Xiaotie Deng, Haodi Feng, Guojun Li, Benyun Shi |
A PTAS for Semiconductor Burn-in Scheduling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comb. Optim. ![In: J. Comb. Optim. 9(1), pp. 5-17, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
geometric rounding, time stretching, approximation algorithm, batch processing, release date |
30 | Pei-Chann Chang, Yun-Shiow Chen, Hui-Mei Wang |
Dynamic Scheduling Problem of Batch Processing Machine in Semiconductor Burn-in Operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (4) ![In: Computational Science and Its Applications - ICCSA 2005, International Conference, Singapore, May 9-12, 2005, Proceedings, Part IV, pp. 172-181, 2005, Springer, 3-540-25863-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
30 | Atsumu Iseno, Yukihiro Iguchi |
A Method for Storing Fail Bit Maps in Burn-in Memory Testers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 142-148, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
30 | Kuo-Chan Huang, Chung-Len Lee 0001, Jwu E. Chen |
Maximization of power dissipation under random excitation for burn-in testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 567-576, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
27 | Diana El Rabih, Nihal Pekergin |
Statistical Model Checking Using Perfect Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATVA ![In: Automated Technology for Verification and Analysis, 7th International Symposium, ATVA 2009, Macao, China, October 14-16, 2009. Proceedings, pp. 120-134, 2009, Springer, 978-3-642-04760-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
27 | Jaydeep P. Kulkarni, Kaushik Roy 0001 |
A High Performance, Scalable Multiplexed Keeper Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 545-549, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
27 | Eric F. Weglarz, Kewal K. Saluja, T. M. Mak |
Testing of Hard Faults in Simultaneous Multithreaded Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal, pp. 95-100, 2004, IEEE Computer Society, 0-7695-2180-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
27 | Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba |
Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004, pp. 322-327, 2004, ACM, 1-58113-853-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
IC reliability |
27 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Extending integrated-circuit yield-models to estimate early-life reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 52(3), pp. 296-300, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
27 | Mary Kathryn Cowles |
MCMC Sampler Convergence Rates for Hierarchical Normal Linear Models: A Simulation Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Stat. Comput. ![In: Stat. Comput. 12(4), pp. 377-389, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
agricultural field trials, total variation distance, Bayesian models, Gibbs sampler |
27 | Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu, Cheng-Wen Wu, Tsin-Yuan Chang |
A Programmable BIST Core for Embedded DRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 16(1), pp. 59-70, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
23 | Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner |
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009, pp. 67-72, 2009, IEEE Computer Society, 978-0-7695-3703-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Gate Stress Test, Gate Oxide Reliability, Low Side Switch, Burn-In |
23 | Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang |
A Prevenient Voltage Stress Test Method for High Density Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008, pp. 516-520, 2008, IEEE Computer Society, 978-0-7695-3110-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
voltage stress test, acceleration factor, burn-in test, junction temperature, constant voltage stress, voltage ramp stress, reliability |
23 | Kwang-Ting (Tim) Cheng |
Dealing with early life failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 85, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
latent defects, embedded systems, technology scaling, IDDQ, burn-in |
23 | Phil Nigh |
Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 86-87, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
latent defects, reliability defects, latent-defect screening, defect acceleration, DPPM, burn-in |
23 | John M. Carulli Jr., Thomas J. Anderson |
The Impact of Multiple Failure Modes on Estimating Product Field Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 118-126, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
early failure rate, DPPM, reliability, burn-in |
23 | Vinay Dabholkar, Sreejit Chakravarty |
Computing Stress Tests for Gate Oxide Shorts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India, pp. 378-391, 1998, IEEE Computer Society, 0-8186-8224-8. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
burn-in, stress tests, gate oxide shorts |
17 | Yuanbo Li, Chu Kin Chan, Chun Yip Yau, Wai Leong Ng, Henry Lam |
Burn-in selection in simulating stationary time series. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Stat. Data Anal. ![In: Comput. Stat. Data Anal. 192, pp. 107886, April 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
17 | Qinqin Xu, Yuanguo Zhu |
Reliability Optimization of Uncertain Random Systems Combined With Burn-In and Preventive Maintenance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 72(3), pp. 1134-1146, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli |
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 105655-105676, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli |
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 72(5), pp. 1447-1459, May 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Xiang Ji, Gen Li |
Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2305.15546, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker 0001, Matteo Sonza Reorda |
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023, pp. 1-5, 2023, IEEE, 979-8-3503-3634-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Xiang Ji, Gen Li |
Regret-Optimal Model-Free Reinforcement Learning for Discounted MDPs with Short Burn-In Time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NeurIPS ![In: Advances in Neural Information Processing Systems 36: Annual Conference on Neural Information Processing Systems 2023, NeurIPS 2023, New Orleans, LA, USA, December 10 - 16, 2023., 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP BibTeX RDF |
|
17 | Tsuneo Kagawa, Masaya Ikemoto, Satoshi Ohtake |
A robust method of IC seating inspection in burn-in sockets using Hough transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCE-TW ![In: IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022, pp. 1-2, 2022, IEEE, 978-1-6654-7050-6. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
17 | Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-6706-3. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
17 | Hong-Kyu Shin, Hea-Bin Yang, Seung-Jin Baek, Sung-Jea Ko |
A luminance control method for OLED burn-in prevention using user information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCE ![In: IEEE International Conference on Consumer Electronics, ICCE 2022, Las Vegas, NV, USA, January 7-9, 2022, pp. 1-2, 2022, IEEE, 978-1-6654-4154-4. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
17 | Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara |
A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 56(7), pp. 2193-2204, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Jeon-Young Kang, Jared Aldstadt |
Using Multiple Scale Space-Time Patterns to Determine the Number of Replicates and Burn-In Periods in Spatially Explicit Agent-Based Modeling of Vector-Borne Disease Transmission. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPRS Int. J. Geo Inf. ![In: ISPRS Int. J. Geo Inf. 10(9), pp. 604, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Daniel Kurz, Horst Lewitschnig, Jürgen Pilz |
Flexible time reduction method for burn-in of high-quality products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 37(6), pp. 2900-2915, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Yue Shi 0004, Yisha Xiang, Ying Liao, Zhicheng Zhu, Yili Hong 0001 |
Optimal burn-in policies for multiple dependent degradation processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IISE Trans. ![In: IISE Trans. 53(11), pp. 1281-1293, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Seong-Chel Park, Kwan-Ho Park, Joon-Hyuk Chang |
Luminance-Degradation Compensation Based on Multistream Self-Attention to Address Thin-Film Transistor-Organic Light Emitting Diode Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 21(9), pp. 3182, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Yuan Chen 0005, Tao Yuan, Suk Joo Bae, Yue Kuo |
Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Ind. Eng. ![In: Comput. Ind. Eng. 162, pp. 107768, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara |
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021, pp. 502-504, 2021, IEEE, 978-1-7281-9549-0. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli |
Innovative methods for Burn-In related Stress Metrics Computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DTIS ![In: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2021, Montpellier, France, June 28-30, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-3654-0. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Zhen Chen, Ershun Pan, Tangbin Xia, Yanting Li |
Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 195, pp. 106748, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Jeffrey Zhang 0008, Antai Xu, Daniel Gitlin, Desmond Yeo |
Dynamic vs Static Burn-in for 16nm Production. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-3, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Kunyang Liu, Hongliang Pu, Hirofumi Shinohara |
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: 2020 IEEE Custom Integrated Circuits Conference, CICC 2020, Boston, MA, USA, March 22-25, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-6031-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Chen He, Yanyao Yu |
Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers without Package Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Xiaopeng Li, Zixian Liu, Yukun Wang, Mei Li |
Optimal burn-in strategy for two-dimensional warranted products considering preventive maintenance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Prod. Res. ![In: Int. J. Prod. Res. 57(17), pp. 5414-5431, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Yi Lyu, Yun Zhang 0001, Kairui Chen, Ci Chen, Xianxian Zeng |
Optimal Multi-Objective Burn-In Policy Based on Time-Transformed Wiener Degradation Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 7, pp. 73529-73539, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Yi Lyu, Junyan Gao, Ci Chen, Yijie Jiang, Huachuan Li, Kairui Chen, Yun Zhang 0001 |
Optimal Burn-in Strategy for High Reliable Products Using Convolutional Neural Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 7, pp. 178511-178521, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi |
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2019, Cluj-Napoca, Romania, April 24-26, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-0073-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Chen He |
Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive Microcontrollers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-4823-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Nasim Imtiaz Khan, Anirudh Iyengar, Swaroop Ghosh |
Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 26(8), pp. 1508-1517, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Goutam Paul 0001, Souvik Ray |
Analysis of burn-in period for RC4 state transition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Cryptogr. Commun. ![In: Cryptogr. Commun. 10(5), pp. 881-908, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini |
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 34(1), pp. 43-52, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez 0001, Federico Venini |
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Low Power Electron. ![In: J. Low Power Electron. 14(1), pp. 86-98, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Elizabeth Hunter, Brian Mac Namee, John D. Kelleher |
Using a Socioeconomic Segregation Burn-in Model to Initialise an Agent-Based Model for Infectious Diseases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Artif. Soc. Soc. Simul. ![In: J. Artif. Soc. Soc. Simul. 21(4), 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez 0001, Federico Venini |
An Optimized Test During Burn-In for Automotive SoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 35(3), pp. 46-53, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | M.-H. Kim, S.-H. Chae, J.-S. Kim |
A Burn-in Potential Region Detection Method for the OLED panel displays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISM ![In: 2018 IEEE International Symposium on Multimedia, ISM 2018, Taichung, Taiwan, December 10-12, 2018, pp. 182-183, 2018, IEEE Computer Society, 978-1-5386-6857-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
17 | Alex Kuefler, Mykel J. Kochenderfer |
Burn-In Demonstrations for Multi-Modal Imitation Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AAMAS ![In: Proceedings of the 17th International Conference on Autonomous Agents and MultiAgent Systems, AAMAS 2018, Stockholm, Sweden, July 10-15, 2018, pp. 1071-1078, 2018, International Foundation for Autonomous Agents and Multiagent Systems Richland, SC, USA / ACM. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
17 | Yihai He, Linbo Wang, Yi Wei, Zhenzhen He |
Optimisation of burn-in time considering the hidden loss of quality deviations in the manufacturing process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Prod. Res. ![In: Int. J. Prod. Res. 55(10), pp. 2961-2977, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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17 | Danilo M. S. Ribeiro, Paulo R. Aguiar, Luiz F. G. Fabiano, Doriana D'Addona, Fabricio Guimaraes Baptista, Eduardo C. Bianchi |
Spectra Measurements Using Piezoelectric Diaphragms to Detect Burn in Grinding Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 66(11), pp. 3052-3063, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Alex Kuefler, Mykel J. Kochenderfer |
Burn-In Demonstrations for Multi-Modal Imitation Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1710.05090, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP BibTeX RDF |
|
17 | Goutam Paul 0001, Souvik Ray |
Analysis of Burn-in period for RC4 State Transition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2017, pp. 175, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP BibTeX RDF |
|
17 | Sakchai Muangsrinoon, Poonpong Boonbrahm |
Burn in Zone: Real time Heart Rate monitoring for physical activity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
JCSSE ![In: 14th International Joint Conference on Computer Science and Software Engineering, JCSSE 2017, NakhonSiThammarat, Thailand, July 12-14, 2017, pp. 1-6, 2017, IEEE, 978-1-5090-4834-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Mohammad Nasim Imtiaz Khan, Anirudh Srikant Iyengar, Swaroop Ghosh |
Novel magnetic burn-in for retention testing of STTRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, pp. 666-669, 2017, IEEE, 978-3-9815370-8-6. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez 0001, C. M. Villa, Federico Venini |
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017, pp. 646-649, 2017, IEEE, 978-3-9815370-8-6. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola |
Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
I2MTC ![In: IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017, pp. 1-6, 2017, IEEE, 978-1-5090-3596-0. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Md. Nazmul Islam, Vinay C. Patil, Sandip Kundu |
A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017, pp. 1-4, 2017, IEEE, 978-1-4673-6853-7. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez 0001, Federico Venini, Davide Appello |
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATS ![In: 18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017, pp. 1-6, 2017, IEEE, 978-1-5386-0415-1. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Yong-Goo Shin, Dae-Hong Lee, Mun-Cheon Kang, Jeisung Lee, Sung-Jea Ko |
A novel burn-in potential region detection method using image processing technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCE ![In: IEEE International Conference on Consumer Electronics, ICCE 2017, Las Vegas, NV, USA, January 8-10, 2017, pp. 215-216, 2017, IEEE, 978-1-5090-5544-9. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
17 | Yisha Xiang, David W. Coit, Zhicheng Zhu |
A Multi-objective Joint Burn-in and Imperfect Condition-based Maintenance Model for Degradation-based Heterogeneous Populations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 32(8), pp. 2739-2750, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Qingqing Zhai, Zhi-Sheng Ye 0001, Jun Yang 0018, Yu Zhao 0003 |
Measurement errors in degradation-based burn-in. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 150, pp. 126-135, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Tao Yuan, Suk Joo Bae, Xiaoyan Zhu 0002 |
A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 155, pp. 55-63, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Ji Hwan Cha, Gianpaolo Pulcini |
Optimal burn-in procedure for mixed populations based on the device degradation process history. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Eur. J. Oper. Res. ![In: Eur. J. Oper. Res. 251(3), pp. 988-998, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
17 | Nima Aghaee, Zebo Peng, Petru Eles |
Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 23(12), pp. 2992-3005, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Zuolin Cheng, Xiaole Cui, Xiaoxin Cui, Chung Len Lee 0001 |
Self-heating burn-in pattern generation based on the genetic algorithm incorporated with a BACK-like procedure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 9(6), pp. 300-310, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski |
Implications of Burn-In Stress on NBTI Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1510.01370, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
17 | Daniel Kurz, Horst Lewitschnig, Jürgen Pilz |
An advanced area scaling approach for semiconductor burn-in. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 55(1), pp. 129-137, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
17 | Zhisheng Ye 0001, Loon-Ching Tang, Min Xie 0001 |
Bi-objective burn-in modeling and optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Ann. Oper. Res. ![In: Ann. Oper. Res. 212(1), pp. 201-214, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
17 | Nima Aghaee, Zebo Peng, Petru Eles |
An efficient temperature-gradient based burn-in technique for 3D stacked ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014, pp. 1-4, 2014, European Design and Automation Association, 978-3-9815370-2-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
17 | Kenneth M. Zick, Sen Li, Matthew French |
High-precision self-characterization for the LUT burn-in information leakage threat. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPL ![In: 24th International Conference on Field Programmable Logic and Applications, FPL 2014, Munich, Germany, 2-4 September, 2014, pp. 1-6, 2014, IEEE. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
17 | Ji Hwan Cha, Maxim Finkelstein |
Results for Burn-in of Systems Under External Shocks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 62(4), pp. 764-771, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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