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Searching for phrase known-good-die (changed automatically) with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1994-2006 (15) 2007-2016 (4)
Publication types (Num. hits)
article(10) inproceedings(9)
Venues (Conferences, Journals, ...)
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Found 19 publication records. Showing 19 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
147Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF known good die, bare die test, multichip modules
86Larry Gilg Known Good Die. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF known good die, KGD, chip scale (size) package, multi-chip module (MCM), wafer probe, membrane probe card, buckling beam probe card, KGD carrier, CSP, burn-in
73Joel A. Jorgenson, Russell J. Wagner Design-For-Test in a Multiple Substrate Multichip Module. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF Multichip Module (MCM) Test, Known-Good Die (KGD), Ball Grid Array (BGA), Built-In-Self-Test (BIST), boundary-scan
58Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla A Novel RF Test Scheme Based on a DFT Method. Search on Bibsonomy J. Electron. Test. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF RF design-for-testability, known-good-die, defects, low noise amplifier, RF test
58Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee A Survey of Test Techniques for MCM Substrates. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF multi-chip module, MCM substrates, known-good-die, interconnect test
37James Quinn, Barbara Loferer Quality in 3D assembly - Is "Known Good Die" good enough? Search on Bibsonomy 3DIC The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
28Dave Armstrong, Gary Maier Known-good-die test methods for large, thin, high-power digital devices. Search on Bibsonomy ITC The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
28Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Tsutomu Yoshihara, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara A 65 nm Embedded SRAM With Wafer Level Burn-In Mode, Leak-Bit Redundancy and Cu E-Trim Fuse for Known Good Die. Search on Bibsonomy IEEE J. Solid State Circuits The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
28Shigeki Ohbayashi, Makoto Yabuuchi, Kazushi Kono, Yuji Oda, Susumu Imaoka, Keiichi Usui, Toshiaki Yonezu, Takeshi Iwamoto, Koji Nii, Yasumasa Tsukamoto, Masashi Arakawa, Takahiro Uchida, Masakazu Okada, Atsushi Ishii, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die. Search on Bibsonomy ISSCC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
28Harry K. Charles Jr. Tradeoffs in multichip module yield and cost with known good die probability and repair. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
28Adit D. Singh, Phil Nigh, C. Mani Krishna 0001 Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. Search on Bibsonomy ITC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
28Alan W. Righter Solving Known Good Die (and Substrate) Test Issues. Search on Bibsonomy ITC The full citation details ... 1995 DBLP  DOI  BibTeX  RDF
28A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. Search on Bibsonomy ITC The full citation details ... 1995 DBLP  DOI  BibTeX  RDF
28Barbara Vasquez, Don R. Van Overloop, Scott E. Lindsey Known-good-die technologies on the horizon. Search on Bibsonomy VTS The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
28Toshiaki Ueno, You Kondoh Membrane Prove Technology for MCM Known-Good-Die. Search on Bibsonomy ITC The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
28Lina Prokopchak Development of a Solution for Achieving Known-Good-Die. Search on Bibsonomy ITC The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
12Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda System-in-Package Testing: Problems and Solutions. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF IEEE1500 SECT, KGD, System-on-Chip, SoC, test access mechanism, SiP, System-in-Package, System-on-Package
9Anne E. Gattiker, Wojciech Maly Smart Substrate MCMs. Search on Bibsonomy J. Electron. Test. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF smart substrate, testing, cost model, MCM
9Wojciech Maly, Derek Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas Smart-Substrate Multichip-Module Systems. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
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