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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
18 | Yiwen Shi, Kellie DiPalma, Jennifer Dworak |
Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. |
DFT |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Bin Chen 0018, George S. Avrunin, Elizabeth A. Henneman, Lori A. Clarke, Leon J. Osterweil, Philip L. Henneman |
Analyzing medical processes. |
ICSE |
2008 |
DBLP DOI BibTeX RDF |
medical processes, model checking, finite-state verification, property specifications |
18 | Na Meng 0001, Qianxiang Wang, Qian Wu, Hong Mei 0001 |
An Approach to Merge Results of Multiple Static Analysis Tools (Short Paper). |
QSIC |
2008 |
DBLP DOI BibTeX RDF |
general specification, prioritizing policyquality, quality, result merge, static analysis tool |
18 | Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Melouki |
Transistor-level based defect tolerance for reliable nanoelectronics. |
AICCSA |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Teijiro Isokawa, Shin'ya Kowada, Yousuke Takada, Ferdinand Peper, Naotake Kamiura, Nobuyuki Matsui |
Defect-Tolerance in Cellular Nanocomputers. |
New Gener. Comput. |
2007 |
DBLP DOI BibTeX RDF |
Cellular Automata, Configurability, Asynchronous, Nanotechnology, Defect Tolerance |
18 | Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli |
QCA Circuits for Robust Coplanar Crossing. |
J. Electron. Test. |
2007 |
DBLP DOI BibTeX RDF |
coplanar crossing, temperature characterization, defect characterization, Bayesian network, QCA, TMR |
18 | Katrin Meisinger, Til Aach, André Kaup |
Spatio-Temporal Defect Pixel Interpolation using 3-D Frequency Selective Extrapolation. |
ICIP (4) |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Joaquín Santoyo, Jesús Carlos Pedraza Ortega, L. Felipe Mejía, Alejandro Santoyo |
PCB Inspection Using Image Processing and Wavelet Transform. |
MICAI |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Hong-Dar Lin, Chung-Yu Chung |
A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips. |
ISNN (2) |
2007 |
DBLP DOI BibTeX RDF |
LED chip, surface defect detection, Multi-layer perceptron neural network with backpropagation algorithm, Wavelet decomposition, Computer vision system |
18 | F. Onur Kutlubay, Burak Turhan, Ayse Basar Bener |
A Two-Step Model for Defect Density Estimation. |
EUROMICRO-SEAA |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia |
Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield. |
IOLTS |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Jari Vanhanen, Harri Korpi |
Experiences of Using Pair Programming in an Agile Project. |
HICSS |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Ilya Levin, Benjamin Abramov, Vladimir Ostrovsky |
Reduction of Fault Latency in Sequential Circuits by using Decomposition. |
DFT |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Jyun-Wei Chen, Ying-Yen Chen, Jing-Jia Liou |
Handling Pattern-Dependent Delay Faults in Diagnosis. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
|
18 | Vadim A. Slavin, Robert Pelcovits, George Loriot, Andrew Callan-Jones, David H. Laidlaw |
Techniques for the Visualization of Topological Defect Behavior in Nematic Liquid Crystals. |
IEEE Trans. Vis. Comput. Graph. |
2006 |
DBLP DOI BibTeX RDF |
Tensor Visualization, Liquid Crystals, Case Studies, Molecular Modeling |
18 | Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh |
Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. |
IEEE Des. Test Comput. |
2006 |
DBLP DOI BibTeX RDF |
fault tolerance, reliability, testing |
18 | Rahul Jain 0004, Anindita Mukherjee, Kolin Paul |
Defect-Aware Design Paradigm for Reconfigurable Architectures. |
ISVLSI |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Francisca Emanuelle Vieira, Francisco Martins, Rafael Silva, Ronaldo Menezes, Márcio Braga |
On the Idea of Using Nature-Inspired Metaphors to Improve Software Testing. |
AIAI |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang |
Defect detection in low-contrast glass substrates using anisotropic diffusion. |
ICPR (1) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Thilo Streichert, Christian Strengert, Christian Haubelt, Jürgen Teich |
Dynamic task binding for hardware/software reconfigurable networks. |
SBCCI |
2006 |
DBLP DOI BibTeX RDF |
online hardware/software partitioning, fault-tolerance, reconfigurable system |
18 | Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram |
A novel framework for faster-than-at-speed delay test considering IR-drop effects. |
ICCAD |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Manuvir Das |
Unleashing the Power of Static Analysis. |
SAS |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Dietmar Winkler 0001, Stefan Biffl |
An Empirical Study on Design Quality Improvement from Best-Practice Inspection and Pair Programming. |
PROFES |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Ian Holden, Dave Dalton |
Improving Testing Efficiency using Cumulative Test Analysis. |
TAIC PART |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang |
On Methods to Improve Location Based Logic Diagnosis. |
VLSI Design |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Jaime Spacco, David Hovemeyer, William W. Pugh |
Tracking defect warnings across versions. |
MSR |
2006 |
DBLP DOI BibTeX RDF |
bug histories, bug tracking, Java, static analysis, FindBugs |
18 | Domingo Mery, Miguel Carrasco |
Advances on Automated Multiple View Inspection. |
PSIVT |
2006 |
DBLP DOI BibTeX RDF |
industrial applications, multiple view geometry, automated visual inspection |
18 | Smitha Shyam, Kypros Constantinides, Sujay Phadke, Valeria Bertacco, Todd M. Austin |
Ultra low-cost defect protection for microprocessor pipelines. |
ASPLOS |
2006 |
DBLP DOI BibTeX RDF |
defect-protection, reliability, pipelines, low-cost |
18 | Chintan Patel, Abhishek Singh 0001, Jim Plusquellic |
Defect Detection Using Quiescent Signal Analysis. |
J. Electron. Test. |
2005 |
DBLP DOI BibTeX RDF |
multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing |
18 | Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan |
A nondestructive automated defect detection system for silicon carbide wafers. |
Mach. Vis. Appl. |
2005 |
DBLP DOI BibTeX RDF |
|
18 | David Hovemeyer, Jaime Spacco, William W. Pugh |
Evaluating and tuning a static analysis to find null pointer bugs. |
PASTE |
2005 |
DBLP DOI BibTeX RDF |
testing, static analysis |
18 | Bernd G. Freimut, Christian Denger, Markus Ketterer |
An Industrial Case Study of Implementing and Validating Defect Classification for Process Improvement and Quality Management. |
IEEE METRICS |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Charles X. Ling, Shengli Sheng, Tilmann F. W. Bruckhaus, Nazim H. Madhavji |
Predicting Software Escalations with Maximum ROI. |
ICDM |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Matthew J. Rummel, Gregory M. Kapfhammer, Andrew Thall |
Towards the prioritization of regression test suites with data flow information. |
SAC |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Huaxing Tang, Gang Chen 0011, Sudhakar M. Reddy, Chen Wang 0014, Janusz Rajski, Irith Pomeranz |
Defect Aware Test Patterns. |
DATE |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Ruben Alexandersson, D. Krishna Chaitanya, Peter Öhman, Yasir Siraj |
A Technique for Fault Tolerance Assessment of COTS Based Systems. |
SAFECOMP |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Rong-Chi Chang, Louis H. Lin, Chia-Ton Tian, Timothy K. Shih |
Video inpainting and restoration techniques. |
ACM Multimedia |
2005 |
DBLP DOI BibTeX RDF |
motion estimation, software tool, defect detection, inpainting, image completion, video inpainting, object removal |
18 | Kenichi Horie, Yukio Ohsawa |
Extracting High Quality Scenario for Consensus on Specifications of New Products. |
KES (1) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Jari Vanhanen, Casper Lassenius |
Effects of pair programming at the development team level: an experiment. |
ISESE |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Jay Jahangiri, David Abercrombie |
Meeting Nanometer DPM Requirements Through DFT. |
ISQED |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Srinivas Raghvendra, Philippe Hurat |
DFM: Linking Design and Manufacturing. |
VLSI Design |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Ethan Schuchman, T. N. Vijaykumar |
Rescue: A Microarchitecture for Testability and Defect Tolerance. |
ISCA |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Laurie A. Williams |
On the need for a process for making reliable quality comparisons with industrial data. |
ACM SIGSOFT Softw. Eng. Notes |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng |
Critical path selection for delay fault testing based upon a statistical timing model. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras |
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. |
J. Electron. Test. |
2004 |
DBLP DOI BibTeX RDF |
Analog Switch, DC defective behaviour, DC test, open defect, bridging defect |
18 | Xin Wang, Brian Stephen Wong, W. M. Bai, Chen Guan Tui |
X-ray image segmentation using wavelet method. |
ICARCV |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Mahim Mishra |
Scalable Defect Tolerance Beyond the SIA Roadmap. |
FPL |
2004 |
DBLP DOI BibTeX RDF |
|
18 | João W. Cangussu, Richard M. Karcich, Aditya P. Mathur, Raymond A. DeCarlo |
Software Release Control using Defect Based Quality Estimation. |
ISSRE |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Youngshin Han, Chilgee Lee |
RRAM Spare Allocation in Semiconductor Manufacturing for Yield Improvement. |
KES |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Jing Huang 0001, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi |
Defect Characterization for Scaling of QCA Devices. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Yen-Lin Peng, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu |
An Application-Independent Delay Testing Methodology for Island-Style FPGA. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
segment delay fault, FPGA, delay testing, path delay fault |
18 | Jerzy J. Dabrowski, Javier Gonzalez Bayon |
Mixed Loopback BiST for RF Digital Transceivers. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Abhishek Singh 0001, Chintan Patel, Jim Plusquellic |
Fault Simulation Model for i{DDT} Testing: An Investigation. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Amit Verma, Charles Robinson, Steve Butkovich |
Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Chintan Patel, Abhishek Singh 0001, Jim Plusquellic |
Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary |
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Yukio Okuda |
Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed? |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
18 | Alan P. Wood |
Software Reliability from the Customer View. |
Computer |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Fred J. Meyer, Nohpill Park |
Predicting Defect-Tolerant Yield in the Embedded Core Context. |
IEEE Trans. Computers |
2003 |
DBLP DOI BibTeX RDF |
Yield, integrated circuit, defect tolerance, embedded core |
18 | Sadahiro Isoda |
A Critique of UML's Definition of the Use-Case Class. |
UML |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira 0001 |
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. |
DATE |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri |
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. |
Asian Test Symposium |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Rei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu |
Defect Oriented Fault Analysis for SRAM. |
Asian Test Symposium |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Mohammad Gh. Mohammad, Kewal K. Saluja |
Electrical Model For Program Disturb Faults in Non-Volatile Memories. |
VLSI Design |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Daniel Micusík, Viera Stopjaková, Lubica Benusková |
Application of Feed-forward Artificial Neural Networks to the Identification of Defective Analog Integrated Circuits. |
Neural Comput. Appl. |
2002 |
DBLP DOI BibTeX RDF |
Circuits response investigation, Fault modelling and simulation, Resilient-backpropagation neural networks, Signal filtering, Supply current analysis |
18 | Bente Anda, Dag I. K. Sjøberg |
Towards an inspection technique for use case models. |
SEKE |
2002 |
DBLP DOI BibTeX RDF |
use cases, inspections |
18 | Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo |
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh |
Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill |
Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri |
A Comprehensive Fault Model for Deep Submicron Digital Circuits. |
DELTA |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans |
Testable Design and Testing of High-Speed Superconductor Microelectronics. |
DELTA |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu |
IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. |
DELTA |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Kin'ya Takahashi, Kunihito Yamamori, Ikuo Yoshihara, Susumu Horiguchi |
Comparison with Defect Compensation Methods for Feed-forward Neural Networks. |
PRDC |
2002 |
DBLP DOI BibTeX RDF |
|
18 | Anna Maria Brosa, Joan Figueras |
Digital Signature Proposal for Mixed-Signal Circuits. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
BIST, analog test, mixed-signal test |
18 | Oliver Laitenberger, Khaled El Emam, Thomas G. Harbich |
An Internally Replicated Quasi-Experimental Comparison of Checklist and Perspective-Based Reading of Code Documents. |
IEEE Trans. Software Eng. |
2001 |
DBLP DOI BibTeX RDF |
replication, Software inspection, meta-analysis, perspective-based reading, quasi experiment |
18 | Stéphane Mérillou, Jean-Michel Dischler, Djamchid Ghazanfarpour |
Surface scratches: measuring, modeling and rendering. |
Vis. Comput. |
2001 |
DBLP DOI BibTeX RDF |
Surface scratches, Physical measurements, Texture mapping, BRDFs, Realistic rendering |
18 | Clelia Mandriota, Ettore Stella, Massimiliano Nitti, Nicola Ancona, Arcangelo Distante |
Rail corrugation detection by Gabor filtering. |
ICIP (2) |
2001 |
DBLP DOI BibTeX RDF |
|
18 | Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams |
Defect Analysis and a New Fault Model for Multi-port SRAMs. |
DFT |
2001 |
DBLP DOI BibTeX RDF |
dual-port, SDDRF, electrical fault model, SRAM, defect analysis, multi-port |
18 | S. K. Tewksbury |
Challenges Facing Practical DFT for MEMS. |
DFT |
2001 |
DBLP DOI BibTeX RDF |
Microelectromechanical systems, microsystems technologies, fault tolerance, defect tolerance |
18 | Mykola Blyzniuk, Irena Kazymyra |
Development of the Special Software Tools for the Defect/Fault Analysis in the Complex Gates from Standard Cell Library. |
DFT |
2001 |
DBLP DOI BibTeX RDF |
Test Vector Components, Software Tool, VLSI Circuit, Spot Defect, Fault Identification, Complex Gate |
18 | Sanjay Mohapatra, B. Mohanty |
Defect Prevention through Defect Prediction: A Case Study at Infosys. |
ICSM |
2001 |
DBLP DOI BibTeX RDF |
|
18 | Slawomir Skoneczny, Marcin Iwanowski |
On Restoration of Degraded Cinematic Sequences by Means of Digital Image Processing. |
CAIP |
2001 |
DBLP DOI BibTeX RDF |
degraded image sequence, image restoration |
18 | Diane Kelly 0002, Terry Shepard |
A case study in the use of defect classification in inspections. |
CASCON |
2001 |
DBLP BibTeX RDF |
software engineering, software testing, software maintenance, software metrics, software validation, orthogonal defect classification |
18 | Stéphane Mérillou, Jean-Michel Dischler, Djamchid Ghazanfarpour |
A BRDF Postprocess to Integrate Porosity on Rendered Surfaces. |
IEEE Trans. Vis. Comput. Graph. |
2000 |
DBLP DOI BibTeX RDF |
physical state of surfaces, porosity measurements, BRDF, Realistic rendering |
18 | Stan Rifkin, Lionel E. Deimel |
Program Comprehension Techniques Improve Software Inspections: A Case Study. |
IWPC |
2000 |
DBLP DOI BibTeX RDF |
|
18 | Xiaohong Jiang 0001, Susumu Horiguchi, Yue Hao |
Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. |
DFT |
2000 |
DBLP DOI BibTeX RDF |
|
18 | Theo J. Powell, James R. Pair, Melissa St. John, Doug Counce |
Delta Iddq for Testing Reliability. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
reliability, Iddq |
18 | Marek Leszak, Dewayne E. Perry, Dieter Stoll |
A case study in root cause defect analysis. |
ICSE |
2000 |
DBLP DOI BibTeX RDF |
defect prevention, modification management, root cause analyis, process improvement, quality assurance |
18 | Xiaoliang Bai, Sujit Dey, Janusz Rajski |
Self-test methodology for at-speed test of crosstalk in chip interconnects. |
DAC |
2000 |
DBLP DOI BibTeX RDF |
|
18 | Ravi Prakash Nandivada, Arunava Chandra, Saswata Dutta, Gargi Keeni |
The 9 Quadrant Model for Code Reviews. |
APAQS |
2000 |
DBLP DOI BibTeX RDF |
|
18 | Stefan Biffl, Michael Halling, Monika Köhle |
Investigating the Effect of a Second Software Inspection Cycle: Cost-Benefit Data from a Large-Scale Experiment on Reinspection of a Software Requirements Document. |
APAQS |
2000 |
DBLP DOI BibTeX RDF |
|
18 | Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar |
Primitive delay faults: identification, testing, and design for testability. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1999 |
DBLP DOI BibTeX RDF |
|
18 | Søren Lauesen, Houman Younessi |
Is Software Quality Visible in the Code? |
IEEE Softw. |
1998 |
DBLP DOI BibTeX RDF |
|
18 | Arno Vermunt, Martin Smits, Gert van der Pijl, Rini van Solingen |
Using GSSs to Support Error Detection in Software Specifications. |
HICSS (1) |
1998 |
DBLP DOI BibTeX RDF |
|
18 | Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat |
A fault diagnosis methodology for the UltraSPARCTM-I microprocessor. |
ED&TC |
1997 |
DBLP DOI BibTeX RDF |
|
18 | W. Bruce Culbertson, Rick Amerson, Richard J. Carter, Philip Kuekes, Greg Snider |
Defect tolerance on the Teramac custom computer. |
FCCM |
1997 |
DBLP DOI BibTeX RDF |
|
18 | Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey |
Testing Analogue Circuits by A C Power Supply Voltage. |
VLSI Design |
1996 |
DBLP DOI BibTeX RDF |
analogue test, Fault model, low voltage test |
18 | Leendert M. Huisman |
Yield fluctuations and defect models. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
chip testing, defect distribution, field failures, clustering, yield, defect coverage |
18 | Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle |
Transient power supply current monitoring - A new test method for CMOS VLSI circuits. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
Design for current-testability, drain/source opens, floating gates, shorts, transient power supply current |
18 | Robert Azencott, Bernard Chalmond, François Coldefy |
Markov fusion of a pair of noisy images to detect intensity valleys. |
Int. J. Comput. Vis. |
1995 |
DBLP DOI BibTeX RDF |
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