Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
18	Yiwen Shi, Kellie DiPalma, Jennifer Dworak	Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization.	DFT	2008	DBLP DOI BibTeX RDF
18	Bin Chen 0018, George S. Avrunin, Elizabeth A. Henneman, Lori A. Clarke, Leon J. Osterweil, Philip L. Henneman	Analyzing medical processes.	ICSE	2008	DBLP DOI BibTeX RDF	medical processes, model checking, finite-state verification, property specifications
18	Na Meng 0001, Qianxiang Wang, Qian Wu, Hong Mei 0001	An Approach to Merge Results of Multiple Static Analysis Tools (Short Paper).	QSIC	2008	DBLP DOI BibTeX RDF	general specification, prioritizing policyquality, quality, result merge, static analysis tool
18	Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Melouki	Transistor-level based defect tolerance for reliable nanoelectronics.	AICCSA	2008	DBLP DOI BibTeX RDF
18	Teijiro Isokawa, Shin'ya Kowada, Yousuke Takada, Ferdinand Peper, Naotake Kamiura, Nobuyuki Matsui	Defect-Tolerance in Cellular Nanocomputers.	New Gener. Comput.	2007	DBLP DOI BibTeX RDF	Cellular Automata, Configurability, Asynchronous, Nanotechnology, Defect Tolerance
18	Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli	QCA Circuits for Robust Coplanar Crossing.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	coplanar crossing, temperature characterization, defect characterization, Bayesian network, QCA, TMR
18	Katrin Meisinger, Til Aach, André Kaup	Spatio-Temporal Defect Pixel Interpolation using 3-D Frequency Selective Extrapolation.	ICIP (4)	2007	DBLP DOI BibTeX RDF
18	Joaquín Santoyo, Jesús Carlos Pedraza Ortega, L. Felipe Mejía, Alejandro Santoyo	PCB Inspection Using Image Processing and Wavelet Transform.	MICAI	2007	DBLP DOI BibTeX RDF
18	Hong-Dar Lin, Chung-Yu Chung	A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips.	ISNN (2)	2007	DBLP DOI BibTeX RDF	LED chip, surface defect detection, Multi-layer perceptron neural network with backpropagation algorithm, Wavelet decomposition, Computer vision system
18	F. Onur Kutlubay, Burak Turhan, Ayse Basar Bener	A Two-Step Model for Defect Density Estimation.	EUROMICRO-SEAA	2007	DBLP DOI BibTeX RDF
18	Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia	Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield.	IOLTS	2007	DBLP DOI BibTeX RDF
18	Jari Vanhanen, Harri Korpi	Experiences of Using Pair Programming in an Agile Project.	HICSS	2007	DBLP DOI BibTeX RDF
18	Ilya Levin, Benjamin Abramov, Vladimir Ostrovsky	Reduction of Fault Latency in Sequential Circuits by using Decomposition.	DFT	2007	DBLP DOI BibTeX RDF
18	Jyun-Wei Chen, Ying-Yen Chen, Jing-Jia Liou	Handling Pattern-Dependent Delay Faults in Diagnosis.	VTS	2007	DBLP DOI BibTeX RDF
18	Vadim A. Slavin, Robert Pelcovits, George Loriot, Andrew Callan-Jones, David H. Laidlaw	Techniques for the Visualization of Topological Defect Behavior in Nematic Liquid Crystals.	IEEE Trans. Vis. Comput. Graph.	2006	DBLP DOI BibTeX RDF	Tensor Visualization, Liquid Crystals, Case Studies, Molecular Modeling
18	Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh	Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	fault tolerance, reliability, testing
18	Rahul Jain 0004, Anindita Mukherjee, Kolin Paul	Defect-Aware Design Paradigm for Reconfigurable Architectures.	ISVLSI	2006	DBLP DOI BibTeX RDF
18	Francisca Emanuelle Vieira, Francisco Martins, Rafael Silva, Ronaldo Menezes, Márcio Braga	On the Idea of Using Nature-Inspired Metaphors to Improve Software Testing.	AIAI	2006	DBLP DOI BibTeX RDF
18	Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang	Defect detection in low-contrast glass substrates using anisotropic diffusion.	ICPR (1)	2006	DBLP DOI BibTeX RDF
18	Thilo Streichert, Christian Strengert, Christian Haubelt, Jürgen Teich	Dynamic task binding for hardware/software reconfigurable networks.	SBCCI	2006	DBLP DOI BibTeX RDF	online hardware/software partitioning, fault-tolerance, reconfigurable system
18	Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram	A novel framework for faster-than-at-speed delay test considering IR-drop effects.	ICCAD	2006	DBLP DOI BibTeX RDF
18	Manuvir Das	Unleashing the Power of Static Analysis.	SAS	2006	DBLP DOI BibTeX RDF
18	Dietmar Winkler 0001, Stefan Biffl	An Empirical Study on Design Quality Improvement from Best-Practice Inspection and Pair Programming.	PROFES	2006	DBLP DOI BibTeX RDF
18	Ian Holden, Dave Dalton	Improving Testing Efficiency using Cumulative Test Analysis.	TAIC PART	2006	DBLP DOI BibTeX RDF
18	Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang	On Methods to Improve Location Based Logic Diagnosis.	VLSI Design	2006	DBLP DOI BibTeX RDF
18	Jaime Spacco, David Hovemeyer, William W. Pugh	Tracking defect warnings across versions.	MSR	2006	DBLP DOI BibTeX RDF	bug histories, bug tracking, Java, static analysis, FindBugs
18	Domingo Mery, Miguel Carrasco	Advances on Automated Multiple View Inspection.	PSIVT	2006	DBLP DOI BibTeX RDF	industrial applications, multiple view geometry, automated visual inspection
18	Smitha Shyam, Kypros Constantinides, Sujay Phadke, Valeria Bertacco, Todd M. Austin	Ultra low-cost defect protection for microprocessor pipelines.	ASPLOS	2006	DBLP DOI BibTeX RDF	defect-protection, reliability, pipelines, low-cost
18	Chintan Patel, Abhishek Singh 0001, Jim Plusquellic	Defect Detection Using Quiescent Signal Analysis.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing
18	Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan	A nondestructive automated defect detection system for silicon carbide wafers.	Mach. Vis. Appl.	2005	DBLP DOI BibTeX RDF
18	David Hovemeyer, Jaime Spacco, William W. Pugh	Evaluating and tuning a static analysis to find null pointer bugs.	PASTE	2005	DBLP DOI BibTeX RDF	testing, static analysis
18	Bernd G. Freimut, Christian Denger, Markus Ketterer	An Industrial Case Study of Implementing and Validating Defect Classification for Process Improvement and Quality Management.	IEEE METRICS	2005	DBLP DOI BibTeX RDF
18	Charles X. Ling, Shengli Sheng, Tilmann F. W. Bruckhaus, Nazim H. Madhavji	Predicting Software Escalations with Maximum ROI.	ICDM	2005	DBLP DOI BibTeX RDF
18	Matthew J. Rummel, Gregory M. Kapfhammer, Andrew Thall	Towards the prioritization of regression test suites with data flow information.	SAC	2005	DBLP DOI BibTeX RDF
18	Huaxing Tang, Gang Chen 0011, Sudhakar M. Reddy, Chen Wang 0014, Janusz Rajski, Irith Pomeranz	Defect Aware Test Patterns.	DATE	2005	DBLP DOI BibTeX RDF
18	Ruben Alexandersson, D. Krishna Chaitanya, Peter Öhman, Yasir Siraj	A Technique for Fault Tolerance Assessment of COTS Based Systems.	SAFECOMP	2005	DBLP DOI BibTeX RDF
18	Rong-Chi Chang, Louis H. Lin, Chia-Ton Tian, Timothy K. Shih	Video inpainting and restoration techniques.	ACM Multimedia	2005	DBLP DOI BibTeX RDF	motion estimation, software tool, defect detection, inpainting, image completion, video inpainting, object removal
18	Kenichi Horie, Yukio Ohsawa	Extracting High Quality Scenario for Consensus on Specifications of New Products.	KES (1)	2005	DBLP DOI BibTeX RDF
18	Jari Vanhanen, Casper Lassenius	Effects of pair programming at the development team level: an experiment.	ISESE	2005	DBLP DOI BibTeX RDF
18	Jay Jahangiri, David Abercrombie	Meeting Nanometer DPM Requirements Through DFT.	ISQED	2005	DBLP DOI BibTeX RDF
18	Srinivas Raghvendra, Philippe Hurat	DFM: Linking Design and Manufacturing.	VLSI Design	2005	DBLP DOI BibTeX RDF
18	Ethan Schuchman, T. N. Vijaykumar	Rescue: A Microarchitecture for Testability and Defect Tolerance.	ISCA	2005	DBLP DOI BibTeX RDF
18	Laurie A. Williams	On the need for a process for making reliable quality comparisons with industrial data.	ACM SIGSOFT Softw. Eng. Notes	2004	DBLP DOI BibTeX RDF
18	Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng	Critical path selection for delay fault testing based upon a statistical timing model.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
18	Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras	Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	Analog Switch, DC defective behaviour, DC test, open defect, bridging defect
18	Xin Wang, Brian Stephen Wong, W. M. Bai, Chen Guan Tui	X-ray image segmentation using wavelet method.	ICARCV	2004	DBLP DOI BibTeX RDF
18	Mahim Mishra	Scalable Defect Tolerance Beyond the SIA Roadmap.	FPL	2004	DBLP DOI BibTeX RDF
18	João W. Cangussu, Richard M. Karcich, Aditya P. Mathur, Raymond A. DeCarlo	Software Release Control using Defect Based Quality Estimation.	ISSRE	2004	DBLP DOI BibTeX RDF
18	Youngshin Han, Chilgee Lee	RRAM Spare Allocation in Semiconductor Manufacturing for Yield Improvement.	KES	2004	DBLP DOI BibTeX RDF
18	Jing Huang 0001, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi	Defect Characterization for Scaling of QCA Devices.	DFT	2004	DBLP DOI BibTeX RDF
18	Yen-Lin Peng, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu	An Application-Independent Delay Testing Methodology for Island-Style FPGA.	DFT	2004	DBLP DOI BibTeX RDF	segment delay fault, FPGA, delay testing, path delay fault
18	Jerzy J. Dabrowski, Javier Gonzalez Bayon	Mixed Loopback BiST for RF Digital Transceivers.	DFT	2004	DBLP DOI BibTeX RDF
18	Abhishek Singh 0001, Chintan Patel, Jim Plusquellic	Fault Simulation Model for i{DDT} Testing: An Investigation.	VTS	2004	DBLP DOI BibTeX RDF
18	Amit Verma, Charles Robinson, Steve Butkovich	Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies.	ITC	2004	DBLP DOI BibTeX RDF
18	Chintan Patel, Abhishek Singh 0001, Jim Plusquellic	Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement.	ITC	2004	DBLP DOI BibTeX RDF
18	Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary	Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.	ITC	2004	DBLP DOI BibTeX RDF
18	Yukio Okuda	Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed?	ITC	2004	DBLP DOI BibTeX RDF
18	Alan P. Wood	Software Reliability from the Customer View.	Computer	2003	DBLP DOI BibTeX RDF
18	Fred J. Meyer, Nohpill Park	Predicting Defect-Tolerant Yield in the Embedded Core Context.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Yield, integrated circuit, defect tolerance, embedded core
18	Sadahiro Isoda	A Critique of UML's Definition of the Use-Case Class.	UML	2003	DBLP DOI BibTeX RDF
18	Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira 0001	RTL Test Pattern Generation for High Quality Loosely Deterministic BIST.	DATE	2003	DBLP DOI BibTeX RDF
18	Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri	Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
18	Rei-Fu Huang, Yung-Fa Chou, Cheng-Wen Wu	Defect Oriented Fault Analysis for SRAM.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
18	Mohammad Gh. Mohammad, Kewal K. Saluja	Electrical Model For Program Disturb Faults in Non-Volatile Memories.	VLSI Design	2003	DBLP DOI BibTeX RDF
18	Daniel Micusík, Viera Stopjaková, Lubica Benusková	Application of Feed-forward Artificial Neural Networks to the Identification of Defective Analog Integrated Circuits.	Neural Comput. Appl.	2002	DBLP DOI BibTeX RDF	Circuits response investigation, Fault modelling and simulation, Resilient-backpropagation neural networks, Signal filtering, Supply current analysis
18	Bente Anda, Dag I. K. Sjøberg	Towards an inspection technique for use case models.	SEKE	2002	DBLP DOI BibTeX RDF	use cases, inspections
18	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo	CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
18	Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh	Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model.	ITC	2002	DBLP DOI BibTeX RDF
18	Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill	Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation.	ITC	2002	DBLP DOI BibTeX RDF
18	Jacob A. Abraham, Arun Krishnamachary, Raghuram S. Tupuri	A Comprehensive Fault Model for Deep Submicron Digital Circuits.	DELTA	2002	DBLP DOI BibTeX RDF
18	Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans	Testable Design and Testing of High-Speed Superconductor Microelectronics.	DELTA	2002	DBLP DOI BibTeX RDF
18	Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu	IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits.	DELTA	2002	DBLP DOI BibTeX RDF
18	Kin'ya Takahashi, Kunihito Yamamori, Ikuo Yoshihara, Susumu Horiguchi	Comparison with Defect Compensation Methods for Feed-forward Neural Networks.	PRDC	2002	DBLP DOI BibTeX RDF
18	Anna Maria Brosa, Joan Figueras	Digital Signature Proposal for Mixed-Signal Circuits.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	BIST, analog test, mixed-signal test
18	Oliver Laitenberger, Khaled El Emam, Thomas G. Harbich	An Internally Replicated Quasi-Experimental Comparison of Checklist and Perspective-Based Reading of Code Documents.	IEEE Trans. Software Eng.	2001	DBLP DOI BibTeX RDF	replication, Software inspection, meta-analysis, perspective-based reading, quasi experiment
18	Stéphane Mérillou, Jean-Michel Dischler, Djamchid Ghazanfarpour	Surface scratches: measuring, modeling and rendering.	Vis. Comput.	2001	DBLP DOI BibTeX RDF	Surface scratches, Physical measurements, Texture mapping, BRDFs, Realistic rendering
18	Clelia Mandriota, Ettore Stella, Massimiliano Nitti, Nicola Ancona, Arcangelo Distante	Rail corrugation detection by Gabor filtering.	ICIP (2)	2001	DBLP DOI BibTeX RDF
18	Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams	Defect Analysis and a New Fault Model for Multi-port SRAMs.	DFT	2001	DBLP DOI BibTeX RDF	dual-port, SDDRF, electrical fault model, SRAM, defect analysis, multi-port
18	S. K. Tewksbury	Challenges Facing Practical DFT for MEMS.	DFT	2001	DBLP DOI BibTeX RDF	Microelectromechanical systems, microsystems technologies, fault tolerance, defect tolerance
18	Mykola Blyzniuk, Irena Kazymyra	Development of the Special Software Tools for the Defect/Fault Analysis in the Complex Gates from Standard Cell Library.	DFT	2001	DBLP DOI BibTeX RDF	Test Vector Components, Software Tool, VLSI Circuit, Spot Defect, Fault Identification, Complex Gate
18	Sanjay Mohapatra, B. Mohanty	Defect Prevention through Defect Prediction: A Case Study at Infosys.	ICSM	2001	DBLP DOI BibTeX RDF
18	Slawomir Skoneczny, Marcin Iwanowski	On Restoration of Degraded Cinematic Sequences by Means of Digital Image Processing.	CAIP	2001	DBLP DOI BibTeX RDF	degraded image sequence, image restoration
18	Diane Kelly 0002, Terry Shepard	A case study in the use of defect classification in inspections.	CASCON	2001	DBLP BibTeX RDF	software engineering, software testing, software maintenance, software metrics, software validation, orthogonal defect classification
18	Stéphane Mérillou, Jean-Michel Dischler, Djamchid Ghazanfarpour	A BRDF Postprocess to Integrate Porosity on Rendered Surfaces.	IEEE Trans. Vis. Comput. Graph.	2000	DBLP DOI BibTeX RDF	physical state of surfaces, porosity measurements, BRDF, Realistic rendering
18	Stan Rifkin, Lionel E. Deimel	Program Comprehension Techniques Improve Software Inspections: A Case Study.	IWPC	2000	DBLP DOI BibTeX RDF
18	Xiaohong Jiang 0001, Susumu Horiguchi, Yue Hao	Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core.	DFT	2000	DBLP DOI BibTeX RDF
18	Theo J. Powell, James R. Pair, Melissa St. John, Doug Counce	Delta Iddq for Testing Reliability.	VTS	2000	DBLP DOI BibTeX RDF	reliability, Iddq
18	Marek Leszak, Dewayne E. Perry, Dieter Stoll	A case study in root cause defect analysis.	ICSE	2000	DBLP DOI BibTeX RDF	defect prevention, modification management, root cause analyis, process improvement, quality assurance
18	Xiaoliang Bai, Sujit Dey, Janusz Rajski	Self-test methodology for at-speed test of crosstalk in chip interconnects.	DAC	2000	DBLP DOI BibTeX RDF
18	Ravi Prakash Nandivada, Arunava Chandra, Saswata Dutta, Gargi Keeni	The 9 Quadrant Model for Code Reviews.	APAQS	2000	DBLP DOI BibTeX RDF
18	Stefan Biffl, Michael Halling, Monika Köhle	Investigating the Effect of a Second Software Inspection Cycle: Cost-Benefit Data from a Large-Scale Experiment on Reinspection of a Software Requirements Document.	APAQS	2000	DBLP DOI BibTeX RDF
18	Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar	Primitive delay faults: identification, testing, and design for testability.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
18	Søren Lauesen, Houman Younessi	Is Software Quality Visible in the Code?	IEEE Softw.	1998	DBLP DOI BibTeX RDF
18	Arno Vermunt, Martin Smits, Gert van der Pijl, Rini van Solingen	Using GSSs to Support Error Detection in Software Specifications.	HICSS (1)	1998	DBLP DOI BibTeX RDF
18	Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat	A fault diagnosis methodology for the UltraSPARCTM-I microprocessor.	ED&TC	1997	DBLP DOI BibTeX RDF
18	W. Bruce Culbertson, Rick Amerson, Richard J. Carter, Philip Kuekes, Greg Snider	Defect tolerance on the Teramac custom computer.	FCCM	1997	DBLP DOI BibTeX RDF
18	Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey	Testing Analogue Circuits by A C Power Supply Voltage.	VLSI Design	1996	DBLP DOI BibTeX RDF	analogue test, Fault model, low voltage test
18	Leendert M. Huisman	Yield fluctuations and defect models.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	chip testing, defect distribution, field failures, clustering, yield, defect coverage
18	Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle	Transient power supply current monitoring - A new test method for CMOS VLSI circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	Design for current-testability, drain/source opens, floating gates, shorts, transient power supply current
18	Robert Azencott, Bernard Chalmond, François Coldefy	Markov fusion of a pair of noisy images to detect intensity valleys.	Int. J. Comput. Vis.	1995	DBLP DOI BibTeX RDF