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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 110 occurrences of 58 keywords
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Results
Found 444 publication records. Showing 444 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
144 | Andrea Calimera, Enrico Macii, Massimo Poncino |
NBTI-aware sleep transistor design for reliable power-gating. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 333-338, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
reliability, sizing, sleep-transistor, nbti |
138 | Wenping Wang, Shengqi Yang, Yu Cao 0001 |
Node Criticality Computation for Circuit Timing Analysis and Optimization under NBTI Effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA, pp. 763-768, 2008, IEEE Computer Society, 978-0-7695-3117-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
129 | Basab Datta, Wayne P. Burleson |
Analysis and mitigation of NBTI-impact on PVT variability in repeated global interconnect performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 341-346, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
tunable buffer, variability, NBTI, global-interconnect |
129 | Hamed Abrishami, Safar Hatami, Behnam Amelifard, Massoud Pedram |
NBTI-aware flip-flop characterization and design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008, pp. 29-34, 2008, ACM, 978-1-59593-999-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
device aging, setup and hold times, static timing analysis, NBTI, circuit reliability |
114 | Taniya Siddiqua, Sudhanva Gurumurthi |
A multi-level approach to reduce the impact of NBTI on processor functional units. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 67-72, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
reliability, NBTI |
114 | Rakesh Vattikonda, Wenping Wang, Yu Cao 0001 |
Modeling and minimization of PMOS NBTI effect for robust nanometer design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 1047-1052, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
reliability, variability, temperature, performance degradation, NBTI, threshold voltage |
108 | Yu Wang 0002, Xiaoming Chen 0003, Wenping Wang, Varsha Balakrishnan, Yu Cao 0001, Yuan Xie 0001, Huazhong Yang |
On the efficacy of input Vector Control to mitigate NBTI effects and leakage power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 19-26, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
108 | Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy 0001 |
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008, pp. 726-731, 2008, IEEE, 978-1-4244-1921-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
106 | Kunhyuk Kang, Haldun Kufluoglu, Kaushik Roy 0001, Muhammad Ashraful Alam |
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(10), pp. 1770-1781, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
99 | Ashutosh Chakraborty, David Z. Pan |
Skew management of NBTI impacted gated clock trees. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of the 2010 International Symposium on Physical Design, ISPD 2010, San Francisco, California, USA, March 14-17, 2010, pp. 127-133, 2010, ACM, 978-1-60558-920-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
clock skew, clock gating, NBTI |
99 | Andrea Calimera, Enrico Macii, Massimo Poncino |
NBTI-aware power gating for concurrent leakage and aging optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2009 International Symposium on Low Power Electronics and Design, 2009, San Fancisco, CA, USA, August 19-21, 2009, pp. 127-132, 2009, ACM, 978-1-60558-684-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
aging, leakage, power-gating, nbti |
99 | Zhenyu Qi, Mircea R. Stan |
NBTI resilient circuits using adaptive body biasing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008, pp. 285-290, 2008, ACM, 978-1-59593-999-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
reliability, body bias, nbti |
99 | John Keane 0001, Tony Tae-Hyoung Kim, Chris H. Kim |
An on-chip NBTI sensor for measuring PMOS threshold voltage degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007, pp. 189-194, 2007, ACM, 978-1-59593-709-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
locked loop, delay, aging, NBTI |
99 | Yiran Chen 0001, Hai Li 0001, Jing Li 0073, Cheng-Kok Koh |
Variable-latency adder (VL-adder): new arithmetic circuit design practice to overcome NBTI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007, pp. 195-200, 2007, ACM, 978-1-59593-709-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
variable-latency adder (VL-adder), negative bias temperature instability (NBTI) |
96 | Xiaoming Chen 0003, Yu Wang 0002, Yu Cao 0001, Yuchun Ma, Huazhong Yang |
Variation-aware supply voltage assignment for minimizing circuit degradation and leakage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2009 International Symposium on Low Power Electronics and Design, 2009, San Fancisco, CA, USA, August 19-21, 2009, pp. 39-44, 2009, ACM, 978-1-60558-684-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
dynamic vdd scaling, leakage power, negative bias temperature instability (NBTI), dual vdd |
93 | Shubhankar Basu, Ranga Vemuri |
Process Variation and NBTI Tolerant Standard Cells to Improve Parametric Yield and Lifetime of ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil, pp. 291-298, 2007, IEEE Computer Society, 0-7695-2896-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
93 | Xiangning Yang, Kewal K. Saluja |
Combating NBTI Degradation via Gate Sizing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 47-52, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
93 | Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Rakesh Vattikonda, Sarma B. K. Vrudhula, Frank Liu 0001, Yu Cao 0001 |
The Impact of NBTI on the Performance of Combinational and Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 364-369, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
91 | Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatnekar |
An analytical model for negative bias temperature instability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2006 International Conference on Computer-Aided Design, ICCAD 2006, San Jose, CA, USA, November 5-9, 2006, pp. 493-496, 2006, ACM, 1-59593-389-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
84 | Bin Zhang 0011, Michael Orshansky |
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA, pp. 774-779, 2008, IEEE Computer Society, 978-0-7695-3117-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
temperature variation, NBTI |
84 | Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatnekar |
Impact of NBTI on SRAM Read Stability and Design for Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA, pp. 210-218, 2006, IEEE Computer Society, 0-7695-2523-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Static Noise Margin (SNM), Reaction-Diffusion (R-D) Model, Cache, SRAM, Negative Bias Temperature Instability (NBTI) |
78 | Yu Wang 0002, Hong Luo, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001 |
Temperature-aware NBTI modeling and the impact of input vector control on performance degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 546-551, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Jaume Abella 0001, Xavier Vera, Antonio González 0001 |
Penelope: The NBTI-Aware Processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: 40th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-40 2007), 1-5 December 2007, Chicago, Illinois, USA, pp. 85-96, 2007, IEEE Computer Society, 0-7695-3047-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Kunhyuk Kang, Sang Phill Park, Kaushik Roy 0001, Muhammad Ashraful Alam |
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2007 International Conference on Computer-Aided Design, ICCAD 2007, San Jose, CA, USA, November 5-8, 2007, pp. 730-734, 2007, IEEE Computer Society, 1-4244-1382-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Rakesh Vattikonda, Yansheng Luo, Alex Gyure, Xiaoning Qi, Sam C. Lo, Mahmoud Shahram, Yu Cao 0001, Kishore Singhal, Dino Toffolon |
A New Simulation Method for NBTI Analysis in SPICE Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 41-46, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001 |
Modeling of PMOS NBTI Effect Considering Temperature Variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 139-144, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Xiangning Yang, Eric F. Weglarz, Kewal K. Saluja |
On NBTI Degradation Process in Digital Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 723-730, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy 0001 |
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 358-363, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
78 | Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy 0001 |
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 780-785, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
69 | Mehmet Basoglu, Michael Orshansky, Mattan Erez |
NBTI-aware DVFS: a new approach to saving energy and increasing processor lifetime. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010, pp. 253-258, 2010, ACM, 978-1-4503-0146-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
wearout, energy efficiency, process variation, DVFS, NBTI |
69 | Basab Datta, Wayne P. Burleson |
Circuit-level NBTI macro-models for collaborative reliability monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 453-458, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
macro-models, on-chip sensors, calibration, NBTI |
69 | Zhenyu Qi, Jiajing Wang, Adam C. Cabe, Stuart N. Wooters, Travis N. Blalock, Benton H. Calhoun, Mircea R. Stan |
SRAM-based NBTI/PBTI sensor system design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010, pp. 849-852, 2010, ACM, 978-1-4503-0002-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
PBTI, sensor system design, sensor, redundancy, process variation, aging, yield, SRAM, NBTI |
63 | Michael DeBole, Krishnan Ramakrishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang 0002, Yuan Xie 0001, Yu Cao 0001, Narayanan Vijaykrishnan |
A framework for estimating NBTI degradation of microarchitectural components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009, pp. 455-460, 2009, IEEE, 978-1-4244-2748-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
63 | Balaji Vaidyanathan, Anthony S. Oates, Yuan Xie 0001, Yu Wang 0002 |
NBTI-aware statistical circuit delay assessment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 13-18, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
63 | Jin Sun 0006, Avinash Karanth Kodi, Ahmed Louri, Janet Meiling Wang |
NBTI aware workload balancing in multi-core systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 833-838, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
63 | Alexander L. Stempkovsky, Alexey Glebov, Sergey Gavrilov |
Calculation of stress probability for NBTI-aware timing analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 714-718, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
63 | Xin Fu, Tao Li 0006, José A. B. Fortes |
NBTI tolerant microarchitecture design in the presence of process variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: 41st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-41 2008), November 8-12, 2008, Lake Como, Italy, pp. 399-410, 2008, IEEE Computer Society, 978-1-4244-2836-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
63 | Krishnan Ramakrishnan, Xiaoxia Wu, Narayanan Vijaykrishnan, Yuan Xie 0001 |
Comparative analysis of NBTI effects on low power and high performance flip-flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings, pp. 200-205, 2008, IEEE Computer Society, 978-1-4244-2657-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
63 | Kewal K. Saluja, Shriram Vijayakumar, Warin Sootkaneung, Xaingning Yang |
NBTI Degradation: A Problem or a Scare? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 137-142, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
63 | Krishnan Ramakrishnan, Sivaprakasam Suresh, Narayanan Vijaykrishnan, Mary Jane Irwin |
Impact of NBTI on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 717-722, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
60 | Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy 0001 |
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(4), pp. 743-751, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
60 | Wenping Wang, Zile Wei, Shengqi Yang, Yu Cao 0001 |
An efficient method to identify critical gates under circuit aging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2007 International Conference on Computer-Aided Design, ICCAD 2007, San Jose, CA, USA, November 5-8, 2007, pp. 735-740, 2007, IEEE Computer Society, 1-4244-1382-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
59 | Yu Wang 0002, Hong Luo, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001 |
Temperature-Aware NBTI Modeling and the Impact of Standby Leakage Reduction Techniques on Circuit Performance Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Dependable Secur. Comput. ![In: IEEE Trans. Dependable Secur. Comput. 8(5), pp. 756-769, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
temperature-aware NBTI modeling, circuit performance degradation, Negative bias temperature instability (NBTI), leakage reduction |
53 | Karthik Duraisami, Enrico Macii, Massimo Poncino |
Using soft-edge flip-flops to compensate NBTI-induced delay degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 169-172, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
device aging, seff, setup and hold time, flip-flop, circuit reliability, nbti |
48 | Anuj Pushkarna, Hamid Mahmoodi |
Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 373-376, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
reliability, aging, SRAM, power gating |
48 | Andrea Marongiu, Andrea Acquaviva, Luca Benini |
OpenMP Support for NBTI-Induced Aging Tolerance in MPSoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSS ![In: Stabilization, Safety, and Security of Distributed Systems, 11th International Symposium, SSS 2009, Lyon, France, November 3-6, 2009. Proceedings, pp. 547-562, 2009, Springer, 978-3-642-05117-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
48 | Lide Zhang, Robert P. Dick |
Scheduled voltage scaling for increasing lifetime in the presence of NBTI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009, pp. 492-497, 2009, IEEE, 978-1-4244-2748-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
48 | Adam C. Cabe, Zhenyu Qi, Stuart N. Wooters, Travis N. Blalock, Mircea R. Stan |
Small embeddable NBTI sensors (SENS) for tracking on-chip performance decay. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 1-6, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
48 | Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001 |
A Novel Gate-Level NBTI Delay Degradation Model with Stacking Effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PATMOS ![In: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 17th International Workshop, PATMOS 2007, Gothenburg, Sweden, September 3-5, 2007, Proceedings, pp. 160-170, 2007, Springer, 978-3-540-74441-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
48 | Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatnekar |
NBTI-Aware Synthesis of Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 370-375, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
45 | Andrea Calimera, Mirko Loghi, Enrico Macii, Massimo Poncino |
Aging effects of leakage optimizations for caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 95-98, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
memory hierarchy, aging, leakage reduction |
45 | Subhasish Mitra |
Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 123, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
45 | Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra |
Circuit Failure Prediction and Its Application to Transistor Aging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 277-286, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
36 | Andrea Calimera, Mirko Loghi, Enrico Macii, Massimo Poncino |
Dynamic indexing: concurrent leakage and aging optimization for caches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010, pp. 343-348, 2010, ACM, 978-1-4503-0146-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
leakage optimization, memory hierarchy, aging, NBTI |
36 | Martin Omaña 0001, Daniele Rossi 0001, Nicolò Bosio, Cecilia Metra |
Novel low-cost aging sensor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Conf. Computing Frontiers ![In: Proceedings of the 7th Conference on Computing Frontiers, 2010, Bertinoro, Italy, May 17-19, 2010, pp. 93-94, 2010, ACM, 978-1-4503-0044-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
aging sensor, performance degradation, nbti |
36 | Arjun Rajagopal |
Clock tree design challenges for robust and low power design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of the 2006 International Symposium on Physical Design, ISPD 2006, San Jose, California, USA, April 9-12, 2006, pp. 168, 2006, ACM, 1-59593-299-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
NBTI, IR drop |
36 | Zhihong Liu, Bruce McGaughy, James Z. Ma |
Design tools for reliability analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 182-187, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
design-in reliability, reliability simulation, HCI, EM, NBTI |
36 | Toshinari Takayanagi, Jinuk Luke Shin, Bruce Petrick, Jeffrey Y. Su, Ana Sonia Leon |
A dual-core 64b ultraSPARC microprocessor for dense server applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004, pp. 673-677, 2004, ACM, 1-58113-828-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
L2, UltraSPARC, coupling noise, deep submicron technology, dense server, dual-core, throughput computing, cache, multiprocessor, leakage, NBTI, negative bias temperature instability |
35 | Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim |
An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-5, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
35 | Katerina Katsarou, Yiorgos Tsiatouhas, Angela Arapoyanni |
NBTI aging tolerance in pipeline based designs NBTI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013, pp. 31-36, 2013, IEEE, 978-1-4799-0662-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
35 | Eisuke Saneyoshi, Koichi Nose, Masayuki Mizuno |
A precise-tracking NBTI-degradation monitor independent of NBTI recovery effect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010, pp. 192-193, 2010, IEEE, 978-1-4244-6033-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
33 | Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman |
An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA, pp. 1257-1260, 2007, IEEE, 1-4244-0920-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Krishnan Ramakrishnan, R. Rajaraman, Sivaprakasam Suresh, Narayanan Vijaykrishnan, Yuan Xie 0001, Mary Jane Irwin |
Variation Impact on SER of Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 911-916, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
21 | Guihai Yan, Yinhe Han 0001, Xiaowei Li 0001 |
ReviveNet: A Self-Adaptive Architecture for Improving Lifetime Reliability via Localized Timing Adaptation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 60(9), pp. 1219-1232, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
Lifetime reliability, aging sensor, self-adaptive, NBTI, timing adaptation |
21 | Edward A. Stott, Peter Y. K. Cheung |
Improving FPGA Reliability with Wear-Levelling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPL ![In: International Conference on Field Programmable Logic and Applications, FPL 2011, September 5-7, Chania, Crete, Greece, pp. 323-328, 2011, IEEE Computer Society, 978-1-4577-1484-9. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
FPGA, Reliability, NBTI, Degradation, Wear Levelling |
21 | Amlan Ghosh, Rob Franklin, Richard B. Brown |
Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010, pp. 369-374, 2010, IEEE Computer Society, 978-0-7695-3928-7. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
analog circuit design methodologies, input switching, NBTI, body biasing |
21 | Yinghai Lu, Li Shang, Hai Zhou 0001, Hengliang Zhu, Fan Yang 0001, Xuan Zeng 0001 |
Statistical reliability analysis under process variation and aging effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 46th Design Automation Conference, DAC 2009, San Francisco, CA, USA, July 26-31, 2009, pp. 514-519, 2009, ACM, 978-1-60558-497-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
process variations, yield, NBTI |
21 | Thomas Pompl, Christian Schlünder, Martina Hommel, Heiko Nielen, Jens Schneider |
Practical aspects of reliability analysis for IC designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 193-198, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
ESD, TDDB of intermetal dielectric, design-in reliability, gate oxide integrity, hot carrier stress, stress-induced voiding, NBTI, electromigration |
18 | Daniele Placido, Gianluca De Marzi, Luigi Muzzi, Laura Savoldi |
Techno-Economic Optimization of the NbTi DTT Feeders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 15144-15152, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Daniele Placido, Gianluca De Marzi, Luigi Muzzi, Laura Savoldi |
Corrections to "Techno-Economic Optimization of the NbTi DTT Feeders". ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 42795, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Hui Xu, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang, Zhengfeng Huang |
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 32(10), pp. 2350175:1-2350175:19, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Huimei Zhou, Miaomiao Wang 0006, Nicolas Loubet, Andrew Gaul, Yasir Sulehria |
Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-6, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Christian Bogner, Christian Schlünder, Michael Waltl, Hans Reisinger, Tibor Grasser |
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-7, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Wonju Sung, Hyun Seung Kim, Jung Hoon Han, Seguen Park, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee |
Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-5, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Daehyun Kwon, Heon Su Jeong, Jaemin Choi, Wijong Kim, Jae Woong Kim, Junsub Yoon, Jungmin Choi, Sanguk Lee, Hyunsub Norbert Rie, Jin-Il Lee, Jongbum Lee, Taeseong Jang, JunHyung Kim, Sanghee Kang, Jung-Bum Shin, Yanggyoon Loh, Chang-Yong Lee, Junmyung Woo, Hye-Seung Yu, Changhyun Bae, Reum Oh, Young-Soo Sohn, Changsik Yoo, Jooyoung Lee |
A 1.1V 6.4Gb/s/pin 24-Gb DDR5 SDRAM with a Highly-Accurate Duty Corrector and NBTI-Tolerant DLL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSCC ![In: IEEE International Solid- State Circuits Conference, ISSCC 2023, San Francisco, CA, USA, February 19-23, 2023, pp. 412-413, 2023, IEEE, 978-1-6654-9016-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Yi Jiang, Yanning Chen, Fang Liu, Bo Wu, Yongfeng Deng, Junkang Li, Dawei Gao, Rui Zhang |
Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023, pp. 120-123, 2023, IEEE, 979-8-3503-1931-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
18 | Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel |
Impact of various NBTI distributions on SRAM performance for FinFET technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Integr. ![In: Integr. 83, pp. 60-66, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Yarong Fu, Wang Wang, Xin Zhong, Manni Li, Zixu Li, Qing Dong, Yu Jiang, Yinyin Lin |
Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 69(12), pp. 5185-5194, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Ashish Sharma 0005, Manoj Singh Gaur, Lava Bhargava, Vijay Laxmi, Manoj Gupta |
Pre-Silicon NBTI Delay-Aware Modeling of Network-on-Chip Router Microarchitecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microprocess. Microsystems ![In: Microprocess. Microsystems 91, pp. 104526, June 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Abhishek Bhattacharjee, Abhishek Nag, Kaushik Das, Sambhu Nath Pradhan |
Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 38(1), pp. 91-105, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Nicolás Landeros Muñoz, Alejandro Valero, Ruben Gran Tejero, Davide Zoni |
Gated-CNN: Combating NBTI and HCI aging effects in on-chip activation memories of Convolutional Neural Network accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Syst. Archit. ![In: J. Syst. Archit. 128, pp. 102553, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder |
Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 1-8, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Yu-Hsing Cheng, Michael Cook 0004, Derryl D. J. Allman |
NBTI Characterization with in Situ Poly Heater. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 43-1, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Nilotpal Choudhury, Ayush Ranjan, Souvik Mahapatra |
Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 56-1, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | S. M. Shakil, Muhammad Sana Ullah |
Effects of NBTI On PMOS Device With Technology Scaling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
UEMCON ![In: 13th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2022, New York, NY, USA, October 26-29, 2022, pp. 402-406, 2022, IEEE, 978-1-6654-9299-7. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
18 | Yu-Guang Chen, Ing-Chao Lin, Kun-Wei Chiu, Cheng-Hsuan Liu |
An efficient NBTI-aware wake-up strategy: Concept, design, and manipulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Integr. ![In: Integr. 80, pp. 60-71, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Abhishek Bhattacharjee, Sambhu Nath Pradhan |
NBTI-Aware Power Gating Design with Dynamically Varying Stress Probability Control on Sleep Transistor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 30(11), pp. 2120004:1-2120004:21, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Kajal, Vijay Kumar Sharma |
Design and Simulation for NBTI Aware Logic Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Wirel. Pers. Commun. ![In: Wirel. Pers. Commun. 120(2), pp. 1525-1542, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Stephan Adolf, Wolfgang Nebel |
Abstraction NBTI model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
it Inf. Technol. ![In: it Inf. Technol. 63(5-6), pp. 299-310, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Matthew R. Strong, Kushagra Bhatheja, Ruohan Yang, Degang Chen 0001 |
A Simple Monitor for Tracking NBTI in Integrated Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MWSCAS ![In: 64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021, pp. 1112-1115, 2021, IEEE, 978-1-6654-2461-5. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Longda Zhou, Zhaohao Zhang, Hong Yang, Zhigang Ji, Qianqian Liu, Qingzhu Zhang, Eddy Simoen, Huaxiang Yin, Jun Luo, Anyan Du, Chao Zhao, Wenwu Wang 0006 |
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-7, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Gang-Jun Kim, Moonjee Yoon, SungHwan Kim, Myeongkyu Eo, Shinhyung Kim, Taehun You, Namhyun Lee, Kijin Kim, Sangwoo Pae |
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-4, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Nilotpal Choudhury, Tarun Samadder, Ravi Tiwari, Huimei Zhou, Richard G. Southwick, Miaomiao Wang 0006, Souvik Mahapatra |
Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-8, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Hao Chang, Longda Zhou, Hong Yang, Zhigang Ji, Qianqian Liu, Eddy Simoen, Huaxiang Yin, Wenwu Wang 0006 |
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, pp. 1-5, 2021, IEEE, 978-1-7281-6893-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Xiong Li, Huangxia Zhu, Xiaolin Guo, Kejun Mu, Peng Feng, Qi-An Xu, Blacksmith Wu, Kanyu Cao |
Impact of Hydrogen Anneal on Peripheral PMOS NBTI and Array Transistor GIDL in DRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASICON ![In: 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-3867-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Yu-Guang Chen, Ing-Chao Lin, Yong-Che Wei |
A Novel NBTI-Aware Chip Remaining Lifetime Prediction Framework Using Machine Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 22nd International Symposium on Quality Electronic Design, ISQED 2021, Santa Clara, CA, USA, April 7-9, 2021, pp. 476-481, 2021, IEEE, 978-1-7281-7641-3. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
18 | Takumi Hosaka, Shinichi Nishizawa, Ryo Kishida, Takashi Matsumoto, Kazutoshi Kobayashi |
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPSJ Trans. Syst. LSI Des. Methodol. ![In: IPSJ Trans. Syst. LSI Des. Methodol. 13, pp. 56-64, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
18 | Shilpa Pendyala, Sheikh Ariful Islam, Srinivas Katkoori |
Gate Level NBTI and Leakage Co-Optimization in Combinational Circuits with Input Vector Cycling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Emerg. Top. Comput. ![In: IEEE Trans. Emerg. Top. Comput. 8(3), pp. 738-749, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
18 | Amel Chenouf, Boualem Djezzar, Hamid Bentarzi, Abdelmadjid Benabdelmoumene |
Sizing of the CMOS 6T-SRAM cell for NBTI ageing mitigation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Circuits Devices Syst. ![In: IET Circuits Devices Syst. 14(4), pp. 555-561, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
18 | Liting Yu, Jianguo Ren, Xian Lu, Xiaoxiao Wang 0001 |
NBTI and HCI Aging Prediction and Reliability Screening During Production Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10), pp. 3000-3011, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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