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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
29 | Nandakumar N. Tendolkar |
Analysis of timing failures due to random AC defects in VLSI modules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA, 1985., pp. 709-714, 1985, ACM, 0-8186-0635-5. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP DOI BibTeX RDF |
|
28 | Anne E. Gattiker, Wojciech Maly |
Current signatures [VLSI circuit testing]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 112-117, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
VLSI circuit testing, current signature, passive defects, active defects, VLSI, integrated circuit testing, CMOS integrated circuits, I/sub DDQ/ testing |
28 | Mingshien Wang, Michal Cutler, Stephen Y. H. Su |
Reconfiguration of VLSI/WSI Mesh Array Processors with Two-Level Redundancy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 38(4), pp. 547-554, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
distributed defects, VLSI/WSI mesh array processors, two-level redundancy, parallel rectangular, operation reliability, clustered defects, complexity, parallel processing, VLSI, fault tolerant computing, reconfiguration, processing elements, optimization technique, combinatorial analysis, manufacturing yield |
26 | Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott A. Mahlke |
Necromancer: enhancing system throughput by animating dead cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCA ![In: 37th International Symposium on Computer Architecture (ISCA 2010), June 19-23, 2010, Saint-Malo, France, pp. 473-484, 2010, ACM, 978-1-4503-0053-7. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
execution abstraction, heterogeneous core coupling, manufacturing defects |
26 | Michael Crocker, Michael T. Niemier, Xiaobo Sharon Hu, Marya Lieberman |
Molecular QCA design with chemically reasonable constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM J. Emerg. Technol. Comput. Syst. ![In: ACM J. Emerg. Technol. Comput. Syst. 4(2), pp. 9:1-9:21, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Nanotechnology, defects, physical simulation, quantum-dot cellular automata |
26 | Carolyn B. Seaman, Forrest Shull, Myrna Regardie, Denis Elbert, Raimund L. Feldmann, Yuepu Guo, Sally Godfrey |
Defect categorization: making use of a decade of widely varying historical data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Second International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, October 9-10, 2008, Kaiserslautern, Germany, pp. 149-157, 2008, ACM, 978-1-59593-971-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect categories, defects, historical data |
26 | Mihir R. Choudhury, Youngki Yoon, Jing Guo, Kartik Mohanram |
Technology exploration for graphene nanoribbon FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 272-277, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
graphene nanoribbons, variability, defects |
26 | Nathaniel Ayewah, William W. Pugh, J. David Morgenthaler, John Penix, YuQian Zhou |
Using FindBugs on production software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOPSLA Companion ![In: Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada, pp. 805-806, 2007, ACM, 978-1-59593-865-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Java, static analysis, software quality, Google, bugs, false positives, software defects, FindBugs, bug patterns |
26 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan |
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 21(5), pp. 551-561, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
SRAM core-cell, resistive open defects, memory testing, March test, dynamic faults |
26 | Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira 0001, Salvador Manich, Luz Balado, Joan Figueras |
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(4), pp. 345-355, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
low-power, BIST, RTL, test quality, defects-based test |
26 | R. Geoff Dromey |
Software Quality-Prevention versus Cure? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 11(3), pp. 197-210, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
product quality models, defect prevention, quality-carrying properties, component-based quality, software inspection, software defects, acceptance testing |
26 | Xuemei Zhao, Yizheng Yu, Chunxu Chen |
Tests for Word-Oriented Content Addressable Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, pp. 151-156, 2002, IEEE Computer Society, 0-7695-1825-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
word-oriented CAM, March algorithm, content addressable memories, Functional fault models, Spot defects |
26 | Raymond A. Paul, Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen |
A Memory-Based Reasoning Approach for Assessing Software Quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: 25th International Computer Software and Applications Conference (COMPSAC 2001), Invigorating Software Development, 8-12 October 2001, Chicago, IL, USA, pp. 97-103, 2001, IEEE Computer Society, 0-7695-1372-7. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Software metrics repository, Metrics data analysis, Y2K defects, Software reliability, Mission Critical Systems |
26 | Raymond A. Paul, Farokh B. Bastani, I-Ling Yen, Venkata U. B. Challagulla |
Defect-Based Reliability Analysis for Mission-Critical Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: 24th International Computer Software and Applications Conference (COMPSAC 2000), 25-28 October 2000, Taipei, Taiwan, pp. 439-444, 2000, IEEE Computer Society, 0-7695-0792-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Measurement data, Y2K compliance assessment, Software reliability, Data analysis, Software defects |
26 | Howard D. Owens, Baxter F. Womack, Mario J. Gonzalez |
Software Error Classification using Purify. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 1996 International Conference on Software Maintenance (ICSM '96), 4-8 November 1996, Monterey, CA, USA, Proceedings, pp. 104-113, 1996, IEEE Computer Society, 0-8186-7677-9. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
Purify, maintenance, detection, Defects |
26 | Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio |
Quiescent current analysis and experimentation of defective CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 337-348, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts |
25 | Marouane Kessentini, Wael Kessentini, Houari A. Sahraoui, Mounir Boukadoum, Ali Ouni 0001 |
Design Defects Detection and Correction by Example. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPC ![In: The 19th IEEE International Conference on Program Comprehension, ICPC 2011, Kingston, ON, Canada, June 22-24, 2011, pp. 81-90, 2011, IEEE Computer Society, 978-1-61284-308-7. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
by example, software maintenance, search-based software engineering, design defects |
25 | Panduka Nagahawatte, Hyunsook Do |
The Effectiveness of Regression Testing Techniques in Reducing the Occurrence of Residual Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: Third International Conference on Software Testing, Verification and Validation, ICST 2010, Paris, France, April 7-9, 2010, pp. 79-88, 2010, IEEE Computer Society, 978-0-7695-3990-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
residual defects, empirical study, Regression testing, test case prioritization |
25 | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
Impact of Resistive-Bridging Defects in SRAM Core-Cell. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010, pp. 265-269, 2010, IEEE Computer Society, 978-0-7695-3978-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
core-cell, resistive-bridging defects, SRAM |
25 | Lian Yu, Jun Zhou, Yue Yi, Jianchu Fan, Qianxiang Wang |
A Hybrid Approach to Detecting Security Defects in Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
QSIC ![In: Proceedings of the Ninth International Conference on Quality Software, QSIC 2009, Jeju, Korea, August 24-25, 2009, pp. 1-10, 2009, IEEE Computer Society, 978-0-7695-3828-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
security defects, model checking, feature extraction, static analysis, fuzzy inference, ontology model |
25 | Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001 |
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, pp. 113-118, 2008, IEEE Computer Society, 978-0-7695-3150-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation |
25 | Matthias Klaus, Ad J. van de Goor |
Tests for Resistive and Capacitive Defects in Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 31-36, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
address decoders, test conditions, Defects, opens, dynamic faults, capacitive coupling |
25 | Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan |
Low-cost diagnosis of defects in MCM substrate interconnections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 260-265, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
low-cost diagnosis, MCM substrate interconnections, substrate interconnect defects, defect location, defect size, fault diagnosis, integrated circuit testing, fault location, multichip modules, integrated circuit interconnections, fault-dictionary, substrates |
25 | Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Test preparation for high coverage of physical defects in CMOS digital ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 330-337, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
high defect coverage, CMOS digital ICs, pseudo realistic faults generation, test quality assessment, tabloid, iceTgen, I/sub DDQ/ test generation, test preparation, logic testing, integrated circuit testing, automatic testing, CMOS logic circuits, CMOS digital integrated circuits, physical defects |
25 | Thomas E. Fuja, Chris Heegard |
Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 35(11), pp. 996-1000, 1986. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP DOI BibTeX RDF |
hard defects, RAM's, row/column replacement, reliability, redundancy, Error-control coding, yield improvement |
23 | Juha-Matti Koljonen, Matti Peltomäki, Mikko Alava, Olav Tirkkonen |
Inertia-based distributed channel allocation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWCMC ![In: Proceedings of the International Conference on Wireless Communications and Mobile Computing: Connecting the World Wirelessly, IWCMC 2009, Leipzig, Germany, June 21-24, 2009, pp. 126-131, 2009, ACM, 978-1-60558-569-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
distributed algorithms, self-organization, channel allocation |
23 | Fan Wang, Xiaohu Yang 0001, Xiaochun Zhu, Lu Chen |
Simulation of the defect removal process with queuing theory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Third International Symposium on Empirical Software Engineering and Measurement, ESEM 2009, October 15-16, 2009, Lake Buena Vista, Florida, USA, pp. 473-476, 2009, IEEE Computer Society, 978-1-4244-4842-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Norman E. Fenton, Martin Neil, William Marsh 0001, Peter Stewart Hearty, Lukasz Radlinski, Paul Krause |
On the effectiveness of early life cycle defect prediction with Bayesian Nets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 13(5), pp. 499-537, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Qualitative factors, Bayesian network, Decision support, Sensitivity analysis, Quantitative data, Software defect prediction |
23 | Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar |
Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(1-3), pp. 165-179, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Multi-port SRAMs, Defect/fault tolerant design, Defect analysis |
23 | Stefan Wagner 0001, Florian Deissenboeck, Michael Aichner, Johann Wimmer, Markus Schwalb |
An Evaluation of Two Bug Pattern Tools for Java. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: First International Conference on Software Testing, Verification, and Validation, ICST 2008, Lillehammer, Norway, April 9-11, 2008, pp. 248-257, 2008, IEEE Computer Society, 978-0-7695-3127-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Static analysis, economics, effectiveness, bug pattern |
23 | Ali Jannesari, Walter F. Tichy |
On-the-fly race detection in multi-threaded programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PADTAD ![In: Proceedings of the 6th Workshop on Parallel and Distributed Systems: Testing, Analysis, and Debugging, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), PADTAD 2008, Seattle, Washington, USA, July 20-21, 2008, pp. 6, 2008, ACM, 978-1-60558-052-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
lockset, parallel programs, debugging, dynamic analysis, race conditions, race detection, multi-threaded programming, happens-before |
23 | D. X. Zhao, H. Wang, J. L. Zhu, J. L. Li |
Research on a New Fabric Defect Identification Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSSE (2) ![In: International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 2: Software Engineering, December 12-14, 2008, Wuhan, China, pp. 814-817, 2008, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Jaekwang Lee, Intaik Park, Edward J. McCluskey |
Error Sequence Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 255-260, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee |
Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 27-32, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Pilsung Choe, Mark R. Lehto, Jan P. Allebach |
Self-help Troubleshooting by Q-KE-CLD Based on a Fuzzy Bayes Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HCI (8) ![In: Human Interface and the Management of Information. Methods, Techniques and Tools in Information Design, Symposium on Human Interface 2007, Held as Part of HCI International 2007, Beijing, China, July 22-27, 2007, Proceedings Part I, pp. 391-400, 2007, Springer, 978-3-540-73344-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
fuzzy Bayes model, Q-KE-CLD, cross language diagnosis, search, diagnosis, translation, parsing, cross language information retrieval, CLIR, troubleshooting, lexical analysis |
23 | Alicja Ciemniewska, Jakub Jurkiewicz, Lukasz Olek, Jerzy R. Nawrocki |
Supporting Use-Case Reviews. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BIS ![In: Business Information Systems, 10th International Conference, BIS 2007, Poznan, Poland, April 25-27, 2007, Proceedings, pp. 424-437, 2007, Springer, 978-3-540-72034-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Jingyue Li, Anita Gupta, Jon Arvid Børretzen, Reidar Conradi |
The Empirical Studies on Quality Benefits of Reusing Software Components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC (2) ![In: 31st Annual International Computer Software and Applications Conference, COMPSAC 2007, Beijing, China, July 24-27, 2007. Volume 2, pp. 399-402, 2007, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Ravi Bonam, Yong-Bin Kim, Minsu Choi |
Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy., pp. 161-169, 2007, IEEE Computer Society, 0-7695-2885-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Eun-Ser Lee, Je-Min Bae |
Design Opportunity Tree for Requirement Management and Software Process Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MUE ![In: 2007 International Conference on Multimedia and Ubiquitous Engineering (MUE 2007), 26-28 April 2007, Seoul, Korea, pp. 395-400, 2007, IEEE Computer Society, 978-0-7695-2777-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Kyungmee O. Kim |
Relating integrated circuit yield and time-dependent reliability for various defect density distributions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 55(2), pp. 307-313, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Tao Jiang 0028, R. D. (Shawn) Blanton |
Inductive fault analysis of surface-micromachined MEMS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(6), pp. 1104-1116, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Arivazhagan Selvaraj, L. Ganesan, S. Bama |
Fault segmentation in fabric images using Gabor wavelet transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 16(6), pp. 356-363, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Fabric faults, Fault segmentation, Image analysis, Gabor wavelets |
23 | Robert W. Reeder, Roy A. Maxion |
User Interface Defect Detection by Hesitation Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2006 International Conference on Dependable Systems and Networks (DSN 2006), 25-28 June 2006, Philadelphia, Pennsylvania, USA, Proceedings, pp. 61-72, 2006, IEEE Computer Society, 0-7695-2607-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Charles X. Ling, Victor S. Sheng, Tilmann F. W. Bruckhaus, Nazim H. Madhavji |
Maximum profit mining and its application in software development. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KDD ![In: Proceedings of the Twelfth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Philadelphia, PA, USA, August 20-23, 2006, pp. 929-934, 2006, ACM, 1-59593-339-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
escalation prediction, data mining, cost-sensitive learning |
23 | Bin Chen 0018, George S. Avrunin, Lori A. Clarke, Leon J. Osterweil |
Automatic Fault Tree Derivation from Little-JIL Process Definitions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SPW/ProSim ![In: Software Process Change, International Software Process Workshop and International Workshop on Software Process Simulation and Modeling, SPW/ProSim 2006, Shanghai, China, May 20-21, 2006, Proceedings, pp. 150-158, 2006, Springer, 3-540-34199-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Hideki Imai |
Trends and Challenges for Securer Cryptography in Practice. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mycrypt ![In: Progress in Cryptology - Mycrypt 2005, First International Conference on Cryptology in Malaysia, Kuala Lumpur, Malaysia, September 28-30, 2005, Proceedings, pp. 1, 2005, Springer, 3-540-28938-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Praveen Parvathala |
High Level Test Generation / SW based Embedded Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 459, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Haihua Yan, Adit D. Singh, Gefu Xu |
Delay Defect Characterization Using Low Voltage Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 8-13, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Robert E. Mullen, Swapna S. Gokhale |
Software Defect Rediscoveries: A Discrete Lognormal Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 16th International Symposium on Software Reliability Engineering (ISSRE 2005), 8-11 November 2005, Chicago, IL, USA, pp. 203-212, 2005, IEEE Computer Society, 0-7695-2482-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Discrete Lognormal, Poisson-Lognormal, Software Maintenance, Software Reliability |
23 | Anderson Belgamo, Sandra Camargo Pinto Ferraz Fabbri, José Carlos Maldonado |
TUCCA: improving the effectiveness of use case construction and requirement analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2005 International Symposium on Empirical Software Engineering (ISESE 2005), 17-18 November 2005, Noosa Heads, Australia, pp. 266-275, 2005, IEEE Computer Society, 0-7803-9507-7. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005, pp. 857-862, 2005, ACM, 1-59593-058-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
SRAM memories, VDSM technologies, core-cell, test, march test, dynamic faults, defect analysis |
23 | Clelia Mandriota, Massimiliano Nitti, Nicola Ancona, Ettore Stella, Arcangelo Distante |
Filter-based feature selection for rail defect detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 15(4), pp. 179-185, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Rail detection, Texture feature, Filter bank, K-nearest neighbor classifier |
23 | Janusz Rajski, Kan Thapar |
Nanometer Design: What are the Requirements for Manufacturing Test? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France, pp. 930-937, 2004, IEEE Computer Society, 0-7695-2085-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Dietmar Winkler 0001, Michael Halling, Stefan Biffl |
Investigating the Effect of Expert Ranking of Use Cases for Design Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 30th EUROMICRO Conference 2004, 31 August - 3 September 2004, Rennes, France, pp. 362-371, 2004, IEEE Computer Society, 0-7695-2199-1. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
usage-based reading, external replication, empirical software engineering, inspection, software inspection, reading technique |
23 | Thomas Lee Rodgers, Douglas L. Dean, Jay F. Nunamaker Jr. |
Increasing Inspection Efficiency through Group Support Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HICSS ![In: 37th Hawaii International Conference on System Sciences (HICSS-37 2004), CD-ROM / Abstracts Proceedings, 5-8 January 2004, Big Island, HI, USA, 2004, IEEE Computer Society, 0-7695-2056-1. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
collaborative attention, collaborative preparation, Software inspections, group support systems |
23 | Mohamed Azimane, Ananta K. Majhi |
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 123-128, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu |
MRAM Defect Analysis and Fault Modeli. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 124-133, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Extending integrated-circuit yield-models to estimate early-life reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 52(3), pp. 296-300, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Phillip Christie, José Pineda de Gyvez |
Prelayout interconnect yield prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 11(1), pp. 55-59, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Yi Zhao, Sujit Dey |
Fault-coverage analysis techniques of crosstalk in chip interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(6), pp. 770-782, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Olli Silvén, Matti Niskanen, Hannu Kauppinen |
Wood inspection with non-supervised clustering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 13(5), pp. 275-285, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
user interface, Self-organizing map, texture, color |
23 | John G. Dorsey, Daniel P. Siewiorek |
The Design of Wearable Systems: A Shift in Development Effort. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2003 International Conference on Dependable Systems and Networks (DSN 2003), 22-25 June 2003, San Francisco, CA, USA, Proceedings, pp. 273-280, 2003, IEEE Computer Society, 0-7695-1952-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco |
A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2003 International Conference on Dependable Systems and Networks (DSN 2003), 22-25 June 2003, San Francisco, CA, USA, Proceedings, pp. 563-572, 2003, IEEE Computer Society, 0-7695-1952-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Claes Wohlin, Aybüke Aurum |
An Evaluation of Checklist-Based Reading for Entity-Relationship Diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE METRICS ![In: 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia, pp. 286-, 2003, IEEE Computer Society, 0-7695-1987-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Leena Lepistö, Iivari Kunttu, Jorma Autio, Ari Visa |
Multiresolution Texture Analysis of Surface Reflection Images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCIA ![In: Image Analysis, 13th Scandinavian Conference, SCIA 2003, Halmstad, Sweden, June 29 - July 2, 2003, Proceedings, pp. 4-10, 2003, Springer, 3-540-40601-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Dan Stefanoiu, Florin Ionescu |
Faults Diagnosis through Genetic Matching Pursuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES ![In: Knowledge-Based Intelligent Information and Engineering Systems, 7th International Conference, KES 2003, Oxford, UK, September 3-5, 2003, Proceedings, Part I, pp. 733-740, 2003, Springer, 3-540-40803-7. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Filippo Lanubile, Teresa Mallardo |
An Empirical Study of Web-Based Inspection Meetings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2003 International Symposium on Empirical Software Engineering (ISESE 2003), 30 September - 1 October 2003. Rome, Italy, pp. 244-251, 2003, IEEE Computer Society, 0-7695-2002-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Caroline D. Rombach, Oliver Kude, Aybüke Aurum, D. Ross Jeffery, Claes Wohlin |
An Empirical Study of an ER-Model Inspection Meeting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 29th EUROMICRO Conference 2003, New Waves in System Architecture, 3-5 September 2003, Belek-Antalya, Turkey, pp. 308-315, 2003, IEEE Computer Society, 0-7695-1996-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Requirements Specification Inspection, Inspection Teams, Entity Relationship Model, Empirical Research, Reading Techniques |
23 | Paul Grünbacher, Michael Halling, Stefan Biffl |
An Empirical Study on Groupware Support for Software Inspection Meetings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: 18th IEEE International Conference on Automated Software Engineering (ASE 2003), 6-10 October 2003, Montreal, Canada, pp. 4-11, 2003, IEEE Computer Society, 0-7695-2035-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Houman Younessi, Panlop Zeephongsekul, Winai Bodhisuwan |
A General Model of Unit Testing Efficacy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 10(1), pp. 69-92, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
process efficacy, unit testing efficacy model, usability, reliability, software quality, software process, functionality, maintainability, defect management |
23 | Jehad Al-Dallal, Paul G. Sorenson |
System Testing for Object-Oriented Frameworks Using Hook Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: 17th IEEE International Conference on Automated Software Engineering (ASE 2002), 23-27 September 2002, Edinburgh, Scotland, UK, pp. 231-236, 2002, IEEE Computer Society, 0-7695-1736-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
hooks, object-oriented framework testing, test case generation, object-oriented framework |
23 | Mohammad Gh. Mohammad, Kewal K. Saluja, Alex S. Yap |
Fault Models and Test Procedures for Flash Memory Disturbances. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(6), pp. 495-508, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
program disturbance, fault model, flash memory, test algorithms |
23 | Hideo Shimazu, Dai Kusui |
Real-Time Creation of Frequently Asked Questions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCBR ![In: Case-Based Reasoning Research and Development, 4th International Conference on Case-Based Reasoning, ICCBR 2001, Vancouver, BC, Canada, July 30 - August 2, 2001, Proceedings, pp. 611-621, 2001, Springer, 3-540-42358-3. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Kunihito Yamamori, Toru Abe, Susumu Horiguchi |
Performance Evaluation of a Partial Retraining Scheme for Defective Multi-Layer Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACSAC ![In: 6th Australasian Computer Systems Architecture Conference (ACSAC 2001), 29-30 January 2001, Gold Coast, Queensland, Australia, pp. 138-146, 2001, IEEE Computer Society, 0-7695-0954-1. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Phillip Christie, José Pineda de Gyvez |
Pre-layout prediction of interconnect manufacturability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SLIP ![In: The Third IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2001), March 31 - April 1, 2001, DoubleTree Hotel, Rohnert Park, CA, USA, Proceedings, pp. 167-173, 2001, ACM. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
design, reliability, interconnect, theory, yield, Rent's rule, critical areas |
23 | José Pineda de Gyvez |
Yield modeling and BEOL fundamentals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SLIP ![In: The Third IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2001), March 31 - April 1, 2001, DoubleTree Hotel, Rohnert Park, CA, USA, Proceedings, pp. 135-163, 2001, ACM. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Michael Halling, Stefan Biffl, Thomas Grechenig, Monika Köhle |
Using Reading Techniques to Focus Inspection Performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 27th EUROMICRO Conference 2001: A Net Odyssey, 4-6 September 2001, Warsaw, Poland, pp. 248-257, 2001, IEEE Computer Society, 0-7695-1236-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Software inspection process, replicated experiment, empirical software engineering, quality measurement, defect detection techniques |
23 | Forrest Shull, Ioana Rus, Victor R. Basili |
How Perspective-Based Reading Can Improve Requirements Inspections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 33(7), pp. 73-79, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
23 | Lionel C. Briand, Khaled El Emam, Bernd G. Freimut, Oliver Laitenberger |
A Comprehensive Evaluation of Capture-Recapture Models for Estimating Software Defect Content. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 26(6), pp. 518-540, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
capture-recapture models, fault content estimation, robustness, Inspections |
23 | Yashwant K. Malaiya, Jason Denton |
Module Size Distribution and Defect Density. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 11th International Symposium on Software Reliability Engineering (ISSRE 2000), 8-11 October 2000, San Jose, CA, USA, pp. 62-71, 2000, IEEE Computer Society, 0-7695-0807-3. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Module size, module size Distribution, reliability, defect density |
23 | Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu |
Cold Delay Defect Screening. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 183-188, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Manufacturing quality, Reliability, Delay Testing |
23 | Oliver Laitenberger, Marek Leszak, Dieter Stoll, Khaled El Emam |
Quantitative Modeling of Software Reviews in an Industrial Setting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE METRICS ![In: 6th IEEE International Software Metrics Symposium (METRICS 1999), 4-6 November 1999, Boca Raton, FL, USA, pp. 312-, 1999, IEEE Computer Society, 0-7695-0403-5. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Technical reviews, success factors, path analysis |
23 | Michael Cuviello, Sujit Dey, Xiaoliang Bai, Yi Zhao |
Fault modeling and simulation for crosstalk in system-on-chip interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999, San Jose, California, USA, November 7-11, 1999, pp. 297-303, 1999, IEEE Computer Society, 0-7803-5832-5. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
23 | M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi |
Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(4), pp. 366-371, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
23 | Phyllis G. Frankl, Richard G. Hamlet, Bev Littlewood, Lorenzo Strigini |
Evaluating Testing Methods by Delivered Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 24(8), pp. 586-601, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
statistical testing theory, Reliability, software testing, debugging |
23 | Claude Thibeault |
Increasing Current Testing Resolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings, pp. 126-134, 1998, IEEE Computer Society, 0-8186-8832-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
current signatures, test, Integrated circuits, Iddq testing |
23 | Francesco Paolo Lovergine, Antonella Branca, Giovanni Attolico, Arcangelo Distante |
Leather Inspection by Oriented Texture Analysis with a Morphological Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP (2) ![In: Proceedings 1997 International Conference on Image Processing, ICIP '97, Santa Barbara, California, USA, October 26-29, 1997, pp. 669-671, 1997, IEEE Computer Society, 0-8186-8183-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
leather inspection, oriented texture analysis, morphological approach, scars, black and white camera, gradient orientations, local coherence, normalized B-spline basis, morphological segmentation, probable defective areas extraction, classification, industrial application, defect detection, folds, knots, automatic optical inspection |
23 | Tze-Jie Yu, Vincent Y. Shen, Hubert E. Dunsmore |
An Analysis of Several Software Defect Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 14(9), pp. 1261-1270, 1988. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
software defect models, software testing, software development, software reliability, software reliability, mathematical model, programming theory |
23 | Meihong Shi, Shoushan Jiang, Huiran Wang, Bugao Xu |
A Simplified pulse-coupled neural network for adaptive segmentation of fabric defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 20(2), pp. 131-138, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Fabric defect, Image segmentation, Synchronization, Pulse-coupled neural network |
23 | Rafael Vilar, Juan Zapata-Pérez, Ramón Ruiz |
Classification of Welding Defects in Radiographic Images Using an ANN with Modified Performance Function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWINAC (2) ![In: Bioinspired Applications in Artificial and Natural Computation, Third International Work-Conference on the Interplay Between Natural and Artificial Computation, IWINAC 2009, Santiago de Compostela, Spain, June 22-26, 2009, Proceedings, Part II, pp. 284-293, 2009, Springer, 978-3-642-02266-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Klaus Wolfmaier, Rudolf Ramler, Gábor Guta, Heinz Dobler |
Observable Runtime Behavior for Defects Indicated by Automated Static Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROCAST ![In: Computer Aided Systems Theory - EUROCAST 2009, 12th International Conference, Las Palmas de Gran Canaria, Spain, February 15-20, 2009, Revised Selected Papers, pp. 312-319, 2009, Springer, 978-3-642-04771-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Automated Static Analysis, Defect Classification |
23 | Syed Waseem Haider, João W. Cangussu, Kendra M. L. Cooper, Ram Dantu, Syed Haider |
Estimation of Defects Based on Defect Decay Model: ED^{3}M. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 34(3), pp. 336-356, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Statistical methods, estimation theory, system testing, Testing and Debugging, Defect prediction, Metrics/Measurement |
23 | Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz |
Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: 11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2008, Parma, Italy, September 3-5, 2008, pp. 729-734, 2008, IEEE Computer Society, 978-0-7695-3277-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Lang Gou, Qing Wang 0001, Jun Yuan, Ye Yang, Mingshu Li 0001, Nan Jiang 0001 |
Quantitatively Managing Defects for Iterative Projects: An Industrial Experience Report in China. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSP ![In: Making Globally Distributed Software Development a Success Story, International Conference on Software Process, ICSP 2008, Leipzig, Germany, May 10-11, 2008, Proceedings, pp. 369-380, 2008, Springer, 978-3-540-79587-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Quantitative process management, Measurement, Software process improvement, Defect Management |
23 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Full Open Defects in Nanometric CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 119-124, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
interconnect open, gate leakage current, CMOS |
23 | Hongyu Zhang 0002 |
An initial study of the growth of eclipse defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MSR ![In: Proceedings of the 2008 International Working Conference on Mining Software Repositories, MSR 2008 (Co-located with ICSE), Leipzig, Germany, May 10-11, 2008, Proceedings, pp. 141-144, 2008, ACM, 978-1-60558-024-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect growth model, eclipse, defect prediction, polynomial regression |
23 | Athanasios Tsakonas, Georgios Dounias |
Predicting Defects in Software Using Grammar-Guided Genetic Programming. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SETN ![In: Artificial Intelligence: Theories, Models and Applications, 5th Hellenic Conference on AI, SETN 2008, Syros, Greece, October 2-4, 2008. Proceedings, pp. 413-418, 2008, Springer, 978-3-540-87880-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Software engineering, genetic programming, defect prediction |
23 | Tadashi Kunieda, Teijiro Isokawa, Ferdinand Peper, Ayumu Saitoh, Naotake Kamiura, Nobuyuki Matsui |
Reconfiguring Circuits Around Defects in Self-Timed Cellular Automata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACRI ![In: Cellular Automata, 8th International Conference on Cellular Aotomata for Reseach and Industry, ACRI 2008, Yokohama, Japan, September 23-26, 2008. Proceedings, pp. 200-209, 2008, Springer, 978-3-540-79991-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Hamidreza Hashempour, Fabrizio Lombardi |
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 841-846, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
CNTFET, fault detection, nanotechnology, carbon nanotube, defect modeling, CNT |
23 | Kypros Constantinides, Onur Mutlu, Todd M. Austin, Valeria Bertacco |
Software-Based Online Detection of Hardware Defects Mechanisms, Architectural Support, and Evaluation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: 40th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-40 2007), 1-5 December 2007, Chicago, Illinois, USA, pp. 97-108, 2007, IEEE Computer Society, 0-7695-3047-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
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