Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
29	Nandakumar N. Tendolkar	Analysis of timing failures due to random AC defects in VLSI modules.	DAC	1985	DBLP DOI BibTeX RDF
28	Anne E. Gattiker, Wojciech Maly	Current signatures [VLSI circuit testing].	VTS	1996	DBLP DOI BibTeX RDF	VLSI circuit testing, current signature, passive defects, active defects, VLSI, integrated circuit testing, CMOS integrated circuits, I/sub DDQ/ testing
28	Mingshien Wang, Michal Cutler, Stephen Y. H. Su	Reconfiguration of VLSI/WSI Mesh Array Processors with Two-Level Redundancy.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	distributed defects, VLSI/WSI mesh array processors, two-level redundancy, parallel rectangular, operation reliability, clustered defects, complexity, parallel processing, VLSI, fault tolerant computing, reconfiguration, processing elements, optimization technique, combinatorial analysis, manufacturing yield
26	Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott A. Mahlke	Necromancer: enhancing system throughput by animating dead cores.	ISCA	2010	DBLP DOI BibTeX RDF	execution abstraction, heterogeneous core coupling, manufacturing defects
26	Michael Crocker, Michael T. Niemier, Xiaobo Sharon Hu, Marya Lieberman	Molecular QCA design with chemically reasonable constraints.	ACM J. Emerg. Technol. Comput. Syst.	2008	DBLP DOI BibTeX RDF	Nanotechnology, defects, physical simulation, quantum-dot cellular automata
26	Carolyn B. Seaman, Forrest Shull, Myrna Regardie, Denis Elbert, Raimund L. Feldmann, Yuepu Guo, Sally Godfrey	Defect categorization: making use of a decade of widely varying historical data.	ESEM	2008	DBLP DOI BibTeX RDF	defect categories, defects, historical data
26	Mihir R. Choudhury, Youngki Yoon, Jing Guo, Kartik Mohanram	Technology exploration for graphene nanoribbon FETs.	DAC	2008	DBLP DOI BibTeX RDF	graphene nanoribbons, variability, defects
26	Nathaniel Ayewah, William W. Pugh, J. David Morgenthaler, John Penix, YuQian Zhou	Using FindBugs on production software.	OOPSLA Companion	2007	DBLP DOI BibTeX RDF	Java, static analysis, software quality, Google, bugs, false positives, software defects, FindBugs, bug patterns
26	Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan	Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	SRAM core-cell, resistive open defects, memory testing, March test, dynamic faults
26	Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira 0001, Salvador Manich, Luz Balado, Joan Figueras	On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	low-power, BIST, RTL, test quality, defects-based test
26	R. Geoff Dromey	Software Quality-Prevention versus Cure?	Softw. Qual. J.	2003	DBLP DOI BibTeX RDF	product quality models, defect prevention, quality-carrying properties, component-based quality, software inspection, software defects, acceptance testing
26	Xuemei Zhao, Yizheng Yu, Chunxu Chen	Tests for Word-Oriented Content Addressable Memories.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	word-oriented CAM, March algorithm, content addressable memories, Functional fault models, Spot defects
26	Raymond A. Paul, Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen	A Memory-Based Reasoning Approach for Assessing Software Quality.	COMPSAC	2001	DBLP DOI BibTeX RDF	Software metrics repository, Metrics data analysis, Y2K defects, Software reliability, Mission Critical Systems
26	Raymond A. Paul, Farokh B. Bastani, I-Ling Yen, Venkata U. B. Challagulla	Defect-Based Reliability Analysis for Mission-Critical Software.	COMPSAC	2000	DBLP DOI BibTeX RDF	Measurement data, Y2K compliance assessment, Software reliability, Data analysis, Software defects
26	Howard D. Owens, Baxter F. Womack, Mario J. Gonzalez	Software Error Classification using Purify.	ICSM	1996	DBLP DOI BibTeX RDF	Purify, maintenance, detection, Defects
26	Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio	Quiescent current analysis and experimentation of defective CMOS circuits.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts
25	Marouane Kessentini, Wael Kessentini, Houari A. Sahraoui, Mounir Boukadoum, Ali Ouni 0001	Design Defects Detection and Correction by Example.	ICPC	2011	DBLP DOI BibTeX RDF	by example, software maintenance, search-based software engineering, design defects
25	Panduka Nagahawatte, Hyunsook Do	The Effectiveness of Regression Testing Techniques in Reducing the Occurrence of Residual Defects.	ICST	2010	DBLP DOI BibTeX RDF	residual defects, empirical study, Regression testing, test case prioritization
25	Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine	Impact of Resistive-Bridging Defects in SRAM Core-Cell.	DELTA	2010	DBLP DOI BibTeX RDF	core-cell, resistive-bridging defects, SRAM
25	Lian Yu, Jun Zhou, Yue Yi, Jianchu Fan, Qianxiang Wang	A Hybrid Approach to Detecting Security Defects in Programs.	QSIC	2009	DBLP DOI BibTeX RDF	security defects, model checking, feature extraction, static analysis, fuzzy inference, ontology model
25	Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001	A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.	ETS	2008	DBLP DOI BibTeX RDF	Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation
25	Matthias Klaus, Ad J. van de Goor	Tests for Resistive and Capacitive Defects in Address Decoders.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF	address decoders, test conditions, Defects, opens, dynamic faults, capacitive coupling
25	Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan	Low-cost diagnosis of defects in MCM substrate interconnections.	VTS	1996	DBLP DOI BibTeX RDF	low-cost diagnosis, MCM substrate interconnections, substrate interconnect defects, defect location, defect size, fault diagnosis, integrated circuit testing, fault location, multichip modules, integrated circuit interconnections, fault-dictionary, substrates
25	Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira 0001	Test preparation for high coverage of physical defects in CMOS digital ICs.	VTS	1995	DBLP DOI BibTeX RDF	high defect coverage, CMOS digital ICs, pseudo realistic faults generation, test quality assessment, tabloid, iceTgen, I/sub DDQ/ test generation, test preparation, logic testing, integrated circuit testing, automatic testing, CMOS logic circuits, CMOS digital integrated circuits, physical defects
25	Thomas E. Fuja, Chris Heegard	Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's.	IEEE Trans. Computers	1986	DBLP DOI BibTeX RDF	hard defects, RAM's, row/column replacement, reliability, redundancy, Error-control coding, yield improvement
23	Juha-Matti Koljonen, Matti Peltomäki, Mikko Alava, Olav Tirkkonen	Inertia-based distributed channel allocation.	IWCMC	2009	DBLP DOI BibTeX RDF	distributed algorithms, self-organization, channel allocation
23	Fan Wang, Xiaohu Yang 0001, Xiaochun Zhu, Lu Chen	Simulation of the defect removal process with queuing theory.	ESEM	2009	DBLP DOI BibTeX RDF
23	Norman E. Fenton, Martin Neil, William Marsh 0001, Peter Stewart Hearty, Lukasz Radlinski, Paul Krause	On the effectiveness of early life cycle defect prediction with Bayesian Nets.	Empir. Softw. Eng.	2008	DBLP DOI BibTeX RDF	Qualitative factors, Bayesian network, Decision support, Sensitivity analysis, Quantitative data, Software defect prediction
23	Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar	Defect Analysis and Defect Tolerant Design of Multi-port SRAMs.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Multi-port SRAMs, Defect/fault tolerant design, Defect analysis
23	Stefan Wagner 0001, Florian Deissenboeck, Michael Aichner, Johann Wimmer, Markus Schwalb	An Evaluation of Two Bug Pattern Tools for Java.	ICST	2008	DBLP DOI BibTeX RDF	Static analysis, economics, effectiveness, bug pattern
23	Ali Jannesari, Walter F. Tichy	On-the-fly race detection in multi-threaded programs.	PADTAD	2008	DBLP DOI BibTeX RDF	lockset, parallel programs, debugging, dynamic analysis, race conditions, race detection, multi-threaded programming, happens-before
23	D. X. Zhao, H. Wang, J. L. Zhu, J. L. Li	Research on a New Fabric Defect Identification Method.	CSSE (2)	2008	DBLP DOI BibTeX RDF
23	Jaekwang Lee, Intaik Park, Edward J. McCluskey	Error Sequence Analysis.	VTS	2008	DBLP DOI BibTeX RDF
23	Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee	Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS.	VLSI Design	2008	DBLP DOI BibTeX RDF
23	Pilsung Choe, Mark R. Lehto, Jan P. Allebach	Self-help Troubleshooting by Q-KE-CLD Based on a Fuzzy Bayes Model.	HCI (8)	2007	DBLP DOI BibTeX RDF	fuzzy Bayes model, Q-KE-CLD, cross language diagnosis, search, diagnosis, translation, parsing, cross language information retrieval, CLIR, troubleshooting, lexical analysis
23	Alicja Ciemniewska, Jakub Jurkiewicz, Lukasz Olek, Jerzy R. Nawrocki	Supporting Use-Case Reviews.	BIS	2007	DBLP DOI BibTeX RDF
23	Jingyue Li, Anita Gupta, Jon Arvid Børretzen, Reidar Conradi	The Empirical Studies on Quality Benefits of Reusing Software Components.	COMPSAC (2)	2007	DBLP DOI BibTeX RDF
23	Ravi Bonam, Yong-Bin Kim, Minsu Choi	Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture.	DFT	2007	DBLP DOI BibTeX RDF
23	Eun-Ser Lee, Je-Min Bae	Design Opportunity Tree for Requirement Management and Software Process Improvement.	MUE	2007	DBLP DOI BibTeX RDF
23	Kyungmee O. Kim	Relating integrated circuit yield and time-dependent reliability for various defect density distributions.	IEEE Trans. Reliab.	2006	DBLP DOI BibTeX RDF
23	Tao Jiang 0028, R. D. (Shawn) Blanton	Inductive fault analysis of surface-micromachined MEMS.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
23	Arivazhagan Selvaraj, L. Ganesan, S. Bama	Fault segmentation in fabric images using Gabor wavelet transform.	Mach. Vis. Appl.	2006	DBLP DOI BibTeX RDF	Fabric faults, Fault segmentation, Image analysis, Gabor wavelets
23	Robert W. Reeder, Roy A. Maxion	User Interface Defect Detection by Hesitation Analysis.	DSN	2006	DBLP DOI BibTeX RDF
23	Charles X. Ling, Victor S. Sheng, Tilmann F. W. Bruckhaus, Nazim H. Madhavji	Maximum profit mining and its application in software development.	KDD	2006	DBLP DOI BibTeX RDF	escalation prediction, data mining, cost-sensitive learning
23	Bin Chen 0018, George S. Avrunin, Lori A. Clarke, Leon J. Osterweil	Automatic Fault Tree Derivation from Little-JIL Process Definitions.	SPW/ProSim	2006	DBLP DOI BibTeX RDF
23	Hideki Imai	Trends and Challenges for Securer Cryptography in Practice.	Mycrypt	2005	DBLP DOI BibTeX RDF
23	Praveen Parvathala	High Level Test Generation / SW based Embedded Test.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
23	Haihua Yan, Adit D. Singh, Gefu Xu	Delay Defect Characterization Using Low Voltage Test.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
23	Robert E. Mullen, Swapna S. Gokhale	Software Defect Rediscoveries: A Discrete Lognormal Model.	ISSRE	2005	DBLP DOI BibTeX RDF	Discrete Lognormal, Poisson-Lognormal, Software Maintenance, Software Reliability
23	Anderson Belgamo, Sandra Camargo Pinto Ferraz Fabbri, José Carlos Maldonado	TUCCA: improving the effectiveness of use case construction and requirement analysis.	ISESE	2005	DBLP DOI BibTeX RDF
23	Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian	Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies.	DAC	2005	DBLP DOI BibTeX RDF	SRAM memories, VDSM technologies, core-cell, test, march test, dynamic faults, defect analysis
23	Clelia Mandriota, Massimiliano Nitti, Nicola Ancona, Ettore Stella, Arcangelo Distante	Filter-based feature selection for rail defect detection.	Mach. Vis. Appl.	2004	DBLP DOI BibTeX RDF	Rail detection, Texture feature, Filter bank, K-nearest neighbor classifier
23	Janusz Rajski, Kan Thapar	Nanometer Design: What are the Requirements for Manufacturing Test?	DATE	2004	DBLP DOI BibTeX RDF
23	Dietmar Winkler 0001, Michael Halling, Stefan Biffl	Investigating the Effect of Expert Ranking of Use Cases for Design Inspection.	EUROMICRO	2004	DBLP DOI BibTeX RDF	usage-based reading, external replication, empirical software engineering, inspection, software inspection, reading technique
23	Thomas Lee Rodgers, Douglas L. Dean, Jay F. Nunamaker Jr.	Increasing Inspection Efficiency through Group Support Systems.	HICSS	2004	DBLP DOI BibTeX RDF	collaborative attention, collaborative preparation, Software inspections, group support systems
23	Mohamed Azimane, Ananta K. Majhi	New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders.	VTS	2004	DBLP DOI BibTeX RDF
23	Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu	MRAM Defect Analysis and Fault Modeli.	ITC	2004	DBLP DOI BibTeX RDF
23	Thomas S. Barnett, Adit D. Singh, Victor P. Nelson	Extending integrated-circuit yield-models to estimate early-life reliability.	IEEE Trans. Reliab.	2003	DBLP DOI BibTeX RDF
23	Phillip Christie, José Pineda de Gyvez	Prelayout interconnect yield prediction.	IEEE Trans. Very Large Scale Integr. Syst.	2003	DBLP DOI BibTeX RDF
23	Yi Zhao, Sujit Dey	Fault-coverage analysis techniques of crosstalk in chip interconnects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
23	Olli Silvén, Matti Niskanen, Hannu Kauppinen	Wood inspection with non-supervised clustering.	Mach. Vis. Appl.	2003	DBLP DOI BibTeX RDF	user interface, Self-organizing map, texture, color
23	John G. Dorsey, Daniel P. Siewiorek	The Design of Wearable Systems: A Shift in Development Effort.	DSN	2003	DBLP DOI BibTeX RDF
23	Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco	A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip.	DSN	2003	DBLP DOI BibTeX RDF
23	Claes Wohlin, Aybüke Aurum	An Evaluation of Checklist-Based Reading for Entity-Relationship Diagrams.	IEEE METRICS	2003	DBLP DOI BibTeX RDF
23	Leena Lepistö, Iivari Kunttu, Jorma Autio, Ari Visa	Multiresolution Texture Analysis of Surface Reflection Images.	SCIA	2003	DBLP DOI BibTeX RDF
23	Dan Stefanoiu, Florin Ionescu	Faults Diagnosis through Genetic Matching Pursuit.	KES	2003	DBLP DOI BibTeX RDF
23	Filippo Lanubile, Teresa Mallardo	An Empirical Study of Web-Based Inspection Meetings.	ISESE	2003	DBLP DOI BibTeX RDF
23	Caroline D. Rombach, Oliver Kude, Aybüke Aurum, D. Ross Jeffery, Claes Wohlin	An Empirical Study of an ER-Model Inspection Meeting.	EUROMICRO	2003	DBLP DOI BibTeX RDF	Requirements Specification Inspection, Inspection Teams, Entity Relationship Model, Empirical Research, Reading Techniques
23	Paul Grünbacher, Michael Halling, Stefan Biffl	An Empirical Study on Groupware Support for Software Inspection Meetings.	ASE	2003	DBLP DOI BibTeX RDF
23	Houman Younessi, Panlop Zeephongsekul, Winai Bodhisuwan	A General Model of Unit Testing Efficacy.	Softw. Qual. J.	2002	DBLP DOI BibTeX RDF	process efficacy, unit testing efficacy model, usability, reliability, software quality, software process, functionality, maintainability, defect management
23	Jehad Al-Dallal, Paul G. Sorenson	System Testing for Object-Oriented Frameworks Using Hook Technology.	ASE	2002	DBLP DOI BibTeX RDF	hooks, object-oriented framework testing, test case generation, object-oriented framework
23	Mohammad Gh. Mohammad, Kewal K. Saluja, Alex S. Yap	Fault Models and Test Procedures for Flash Memory Disturbances.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	program disturbance, fault model, flash memory, test algorithms
23	Hideo Shimazu, Dai Kusui	Real-Time Creation of Frequently Asked Questions.	ICCBR	2001	DBLP DOI BibTeX RDF
23	Kunihito Yamamori, Toru Abe, Susumu Horiguchi	Performance Evaluation of a Partial Retraining Scheme for Defective Multi-Layer Neural Networks.	ACSAC	2001	DBLP DOI BibTeX RDF
23	Phillip Christie, José Pineda de Gyvez	Pre-layout prediction of interconnect manufacturability.	SLIP	2001	DBLP DOI BibTeX RDF	design, reliability, interconnect, theory, yield, Rent's rule, critical areas
23	José Pineda de Gyvez	Yield modeling and BEOL fundamentals.	SLIP	2001	DBLP DOI BibTeX RDF
23	Michael Halling, Stefan Biffl, Thomas Grechenig, Monika Köhle	Using Reading Techniques to Focus Inspection Performance.	EUROMICRO	2001	DBLP DOI BibTeX RDF	Software inspection process, replicated experiment, empirical software engineering, quality measurement, defect detection techniques
23	Forrest Shull, Ioana Rus, Victor R. Basili	How Perspective-Based Reading Can Improve Requirements Inspections.	Computer	2000	DBLP DOI BibTeX RDF
23	Lionel C. Briand, Khaled El Emam, Bernd G. Freimut, Oliver Laitenberger	A Comprehensive Evaluation of Capture-Recapture Models for Estimating Software Defect Content.	IEEE Trans. Software Eng.	2000	DBLP DOI BibTeX RDF	capture-recapture models, fault content estimation, robustness, Inspections
23	Yashwant K. Malaiya, Jason Denton	Module Size Distribution and Defect Density.	ISSRE	2000	DBLP DOI BibTeX RDF	Module size, module size Distribution, reliability, defect density
23	Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu	Cold Delay Defect Screening.	VTS	2000	DBLP DOI BibTeX RDF	Manufacturing quality, Reliability, Delay Testing
23	Oliver Laitenberger, Marek Leszak, Dieter Stoll, Khaled El Emam	Quantitative Modeling of Software Reviews in an Industrial Setting.	IEEE METRICS	1999	DBLP DOI BibTeX RDF	Technical reviews, success factors, path analysis
23	Michael Cuviello, Sujit Dey, Xiaoliang Bai, Yi Zhao	Fault modeling and simulation for crosstalk in system-on-chip interconnects.	ICCAD	1999	DBLP DOI BibTeX RDF
23	M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi	Three-dimensional defect sensitivity modeling for open circuits in ULSI structures.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
23	Phyllis G. Frankl, Richard G. Hamlet, Bev Littlewood, Lorenzo Strigini	Evaluating Testing Methods by Delivered Reliability.	IEEE Trans. Software Eng.	1998	DBLP DOI BibTeX RDF	statistical testing theory, Reliability, software testing, debugging
23	Claude Thibeault	Increasing Current Testing Resolution.	DFT	1998	DBLP DOI BibTeX RDF	current signatures, test, Integrated circuits, Iddq testing
23	Francesco Paolo Lovergine, Antonella Branca, Giovanni Attolico, Arcangelo Distante	Leather Inspection by Oriented Texture Analysis with a Morphological Approach.	ICIP (2)	1997	DBLP DOI BibTeX RDF	leather inspection, oriented texture analysis, morphological approach, scars, black and white camera, gradient orientations, local coherence, normalized B-spline basis, morphological segmentation, probable defective areas extraction, classification, industrial application, defect detection, folds, knots, automatic optical inspection
23	Tze-Jie Yu, Vincent Y. Shen, Hubert E. Dunsmore	An Analysis of Several Software Defect Models.	IEEE Trans. Software Eng.	1988	DBLP DOI BibTeX RDF	software defect models, software testing, software development, software reliability, software reliability, mathematical model, programming theory
23	Meihong Shi, Shoushan Jiang, Huiran Wang, Bugao Xu	A Simplified pulse-coupled neural network for adaptive segmentation of fabric defects.	Mach. Vis. Appl.	2009	DBLP DOI BibTeX RDF	Fabric defect, Image segmentation, Synchronization, Pulse-coupled neural network
23	Rafael Vilar, Juan Zapata-Pérez, Ramón Ruiz	Classification of Welding Defects in Radiographic Images Using an ANN with Modified Performance Function.	IWINAC (2)	2009	DBLP DOI BibTeX RDF
23	Klaus Wolfmaier, Rudolf Ramler, Gábor Guta, Heinz Dobler	Observable Runtime Behavior for Defects Indicated by Automated Static Analysis.	EUROCAST	2009	DBLP DOI BibTeX RDF	Automated Static Analysis, Defect Classification
23	Syed Waseem Haider, João W. Cangussu, Kendra M. L. Cooper, Ram Dantu, Syed Haider	Estimation of Defects Based on Defect Decay Model: ED^{3}M.	IEEE Trans. Software Eng.	2008	DBLP DOI BibTeX RDF	Statistical methods, estimation theory, system testing, Testing and Debugging, Defect prediction, Metrics/Measurement
23	Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz	Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC.	DSD	2008	DBLP DOI BibTeX RDF
23	Lang Gou, Qing Wang 0001, Jun Yuan, Ye Yang, Mingshu Li 0001, Nan Jiang 0001	Quantitatively Managing Defects for Iterative Projects: An Industrial Experience Report in China.	ICSP	2008	DBLP DOI BibTeX RDF	Quantitative process management, Measurement, Software process improvement, Defect Management
23	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman	Full Open Defects in Nanometric CMOS.	VTS	2008	DBLP DOI BibTeX RDF	interconnect open, gate leakage current, CMOS
23	Hongyu Zhang 0002	An initial study of the growth of eclipse defects.	MSR	2008	DBLP DOI BibTeX RDF	defect growth model, eclipse, defect prediction, polynomial regression
23	Athanasios Tsakonas, Georgios Dounias	Predicting Defects in Software Using Grammar-Guided Genetic Programming.	SETN	2008	DBLP DOI BibTeX RDF	Software engineering, genetic programming, defect prediction
23	Tadashi Kunieda, Teijiro Isokawa, Ferdinand Peper, Ayumu Saitoh, Naotake Kamiura, Nobuyuki Matsui	Reconfiguring Circuits Around Defects in Self-Timed Cellular Automata.	ACRI	2008	DBLP DOI BibTeX RDF
23	Hamidreza Hashempour, Fabrizio Lombardi	Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs.	DATE	2007	DBLP DOI BibTeX RDF	CNTFET, fault detection, nanotechnology, carbon nanotube, defect modeling, CNT
23	Kypros Constantinides, Onur Mutlu, Todd M. Austin, Valeria Bertacco	Software-Based Online Detection of Hardware Defects Mechanisms, Architectural Support, and Evaluation.	MICRO	2007	DBLP DOI BibTeX RDF