|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 3212 occurrences of 1532 keywords
|
|
|
Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
29 | Nandakumar N. Tendolkar |
Analysis of timing failures due to random AC defects in VLSI modules. |
DAC |
1985 |
DBLP DOI BibTeX RDF |
|
28 | Anne E. Gattiker, Wojciech Maly |
Current signatures [VLSI circuit testing]. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
VLSI circuit testing, current signature, passive defects, active defects, VLSI, integrated circuit testing, CMOS integrated circuits, I/sub DDQ/ testing |
28 | Mingshien Wang, Michal Cutler, Stephen Y. H. Su |
Reconfiguration of VLSI/WSI Mesh Array Processors with Two-Level Redundancy. |
IEEE Trans. Computers |
1989 |
DBLP DOI BibTeX RDF |
distributed defects, VLSI/WSI mesh array processors, two-level redundancy, parallel rectangular, operation reliability, clustered defects, complexity, parallel processing, VLSI, fault tolerant computing, reconfiguration, processing elements, optimization technique, combinatorial analysis, manufacturing yield |
26 | Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott A. Mahlke |
Necromancer: enhancing system throughput by animating dead cores. |
ISCA |
2010 |
DBLP DOI BibTeX RDF |
execution abstraction, heterogeneous core coupling, manufacturing defects |
26 | Michael Crocker, Michael T. Niemier, Xiaobo Sharon Hu, Marya Lieberman |
Molecular QCA design with chemically reasonable constraints. |
ACM J. Emerg. Technol. Comput. Syst. |
2008 |
DBLP DOI BibTeX RDF |
Nanotechnology, defects, physical simulation, quantum-dot cellular automata |
26 | Carolyn B. Seaman, Forrest Shull, Myrna Regardie, Denis Elbert, Raimund L. Feldmann, Yuepu Guo, Sally Godfrey |
Defect categorization: making use of a decade of widely varying historical data. |
ESEM |
2008 |
DBLP DOI BibTeX RDF |
defect categories, defects, historical data |
26 | Mihir R. Choudhury, Youngki Yoon, Jing Guo, Kartik Mohanram |
Technology exploration for graphene nanoribbon FETs. |
DAC |
2008 |
DBLP DOI BibTeX RDF |
graphene nanoribbons, variability, defects |
26 | Nathaniel Ayewah, William W. Pugh, J. David Morgenthaler, John Penix, YuQian Zhou |
Using FindBugs on production software. |
OOPSLA Companion |
2007 |
DBLP DOI BibTeX RDF |
Java, static analysis, software quality, Google, bugs, false positives, software defects, FindBugs, bug patterns |
26 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan |
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. |
J. Electron. Test. |
2005 |
DBLP DOI BibTeX RDF |
SRAM core-cell, resistive open defects, memory testing, March test, dynamic faults |
26 | Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira 0001, Salvador Manich, Luz Balado, Joan Figueras |
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. |
J. Electron. Test. |
2004 |
DBLP DOI BibTeX RDF |
low-power, BIST, RTL, test quality, defects-based test |
26 | R. Geoff Dromey |
Software Quality-Prevention versus Cure? |
Softw. Qual. J. |
2003 |
DBLP DOI BibTeX RDF |
product quality models, defect prevention, quality-carrying properties, component-based quality, software inspection, software defects, acceptance testing |
26 | Xuemei Zhao, Yizheng Yu, Chunxu Chen |
Tests for Word-Oriented Content Addressable Memories. |
Asian Test Symposium |
2002 |
DBLP DOI BibTeX RDF |
word-oriented CAM, March algorithm, content addressable memories, Functional fault models, Spot defects |
26 | Raymond A. Paul, Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen |
A Memory-Based Reasoning Approach for Assessing Software Quality. |
COMPSAC |
2001 |
DBLP DOI BibTeX RDF |
Software metrics repository, Metrics data analysis, Y2K defects, Software reliability, Mission Critical Systems |
26 | Raymond A. Paul, Farokh B. Bastani, I-Ling Yen, Venkata U. B. Challagulla |
Defect-Based Reliability Analysis for Mission-Critical Software. |
COMPSAC |
2000 |
DBLP DOI BibTeX RDF |
Measurement data, Y2K compliance assessment, Software reliability, Data analysis, Software defects |
26 | Howard D. Owens, Baxter F. Womack, Mario J. Gonzalez |
Software Error Classification using Purify. |
ICSM |
1996 |
DBLP DOI BibTeX RDF |
Purify, maintenance, detection, Defects |
26 | Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio |
Quiescent current analysis and experimentation of defective CMOS circuits. |
J. Electron. Test. |
1992 |
DBLP DOI BibTeX RDF |
Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts |
25 | Marouane Kessentini, Wael Kessentini, Houari A. Sahraoui, Mounir Boukadoum, Ali Ouni 0001 |
Design Defects Detection and Correction by Example. |
ICPC |
2011 |
DBLP DOI BibTeX RDF |
by example, software maintenance, search-based software engineering, design defects |
25 | Panduka Nagahawatte, Hyunsook Do |
The Effectiveness of Regression Testing Techniques in Reducing the Occurrence of Residual Defects. |
ICST |
2010 |
DBLP DOI BibTeX RDF |
residual defects, empirical study, Regression testing, test case prioritization |
25 | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
Impact of Resistive-Bridging Defects in SRAM Core-Cell. |
DELTA |
2010 |
DBLP DOI BibTeX RDF |
core-cell, resistive-bridging defects, SRAM |
25 | Lian Yu, Jun Zhou, Yue Yi, Jianchu Fan, Qianxiang Wang |
A Hybrid Approach to Detecting Security Defects in Programs. |
QSIC |
2009 |
DBLP DOI BibTeX RDF |
security defects, model checking, feature extraction, static analysis, fuzzy inference, ontology model |
25 | Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001 |
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation |
25 | Matthias Klaus, Ad J. van de Goor |
Tests for Resistive and Capacitive Defects in Address Decoders. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
address decoders, test conditions, Defects, opens, dynamic faults, capacitive coupling |
25 | Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan |
Low-cost diagnosis of defects in MCM substrate interconnections. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
low-cost diagnosis, MCM substrate interconnections, substrate interconnect defects, defect location, defect size, fault diagnosis, integrated circuit testing, fault location, multichip modules, integrated circuit interconnections, fault-dictionary, substrates |
25 | Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Test preparation for high coverage of physical defects in CMOS digital ICs. |
VTS |
1995 |
DBLP DOI BibTeX RDF |
high defect coverage, CMOS digital ICs, pseudo realistic faults generation, test quality assessment, tabloid, iceTgen, I/sub DDQ/ test generation, test preparation, logic testing, integrated circuit testing, automatic testing, CMOS logic circuits, CMOS digital integrated circuits, physical defects |
25 | Thomas E. Fuja, Chris Heegard |
Row/Column Replacement for the Control of Hard Defects in Semiconductor RAM's. |
IEEE Trans. Computers |
1986 |
DBLP DOI BibTeX RDF |
hard defects, RAM's, row/column replacement, reliability, redundancy, Error-control coding, yield improvement |
23 | Juha-Matti Koljonen, Matti Peltomäki, Mikko Alava, Olav Tirkkonen |
Inertia-based distributed channel allocation. |
IWCMC |
2009 |
DBLP DOI BibTeX RDF |
distributed algorithms, self-organization, channel allocation |
23 | Fan Wang, Xiaohu Yang 0001, Xiaochun Zhu, Lu Chen |
Simulation of the defect removal process with queuing theory. |
ESEM |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Norman E. Fenton, Martin Neil, William Marsh 0001, Peter Stewart Hearty, Lukasz Radlinski, Paul Krause |
On the effectiveness of early life cycle defect prediction with Bayesian Nets. |
Empir. Softw. Eng. |
2008 |
DBLP DOI BibTeX RDF |
Qualitative factors, Bayesian network, Decision support, Sensitivity analysis, Quantitative data, Software defect prediction |
23 | Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar |
Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. |
J. Electron. Test. |
2008 |
DBLP DOI BibTeX RDF |
Multi-port SRAMs, Defect/fault tolerant design, Defect analysis |
23 | Stefan Wagner 0001, Florian Deissenboeck, Michael Aichner, Johann Wimmer, Markus Schwalb |
An Evaluation of Two Bug Pattern Tools for Java. |
ICST |
2008 |
DBLP DOI BibTeX RDF |
Static analysis, economics, effectiveness, bug pattern |
23 | Ali Jannesari, Walter F. Tichy |
On-the-fly race detection in multi-threaded programs. |
PADTAD |
2008 |
DBLP DOI BibTeX RDF |
lockset, parallel programs, debugging, dynamic analysis, race conditions, race detection, multi-threaded programming, happens-before |
23 | D. X. Zhao, H. Wang, J. L. Zhu, J. L. Li |
Research on a New Fabric Defect Identification Method. |
CSSE (2) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Jaekwang Lee, Intaik Park, Edward J. McCluskey |
Error Sequence Analysis. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee |
Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. |
VLSI Design |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Pilsung Choe, Mark R. Lehto, Jan P. Allebach |
Self-help Troubleshooting by Q-KE-CLD Based on a Fuzzy Bayes Model. |
HCI (8) |
2007 |
DBLP DOI BibTeX RDF |
fuzzy Bayes model, Q-KE-CLD, cross language diagnosis, search, diagnosis, translation, parsing, cross language information retrieval, CLIR, troubleshooting, lexical analysis |
23 | Alicja Ciemniewska, Jakub Jurkiewicz, Lukasz Olek, Jerzy R. Nawrocki |
Supporting Use-Case Reviews. |
BIS |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Jingyue Li, Anita Gupta, Jon Arvid Børretzen, Reidar Conradi |
The Empirical Studies on Quality Benefits of Reusing Software Components. |
COMPSAC (2) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Ravi Bonam, Yong-Bin Kim, Minsu Choi |
Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture. |
DFT |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Eun-Ser Lee, Je-Min Bae |
Design Opportunity Tree for Requirement Management and Software Process Improvement. |
MUE |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Kyungmee O. Kim |
Relating integrated circuit yield and time-dependent reliability for various defect density distributions. |
IEEE Trans. Reliab. |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Tao Jiang 0028, R. D. (Shawn) Blanton |
Inductive fault analysis of surface-micromachined MEMS. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Arivazhagan Selvaraj, L. Ganesan, S. Bama |
Fault segmentation in fabric images using Gabor wavelet transform. |
Mach. Vis. Appl. |
2006 |
DBLP DOI BibTeX RDF |
Fabric faults, Fault segmentation, Image analysis, Gabor wavelets |
23 | Robert W. Reeder, Roy A. Maxion |
User Interface Defect Detection by Hesitation Analysis. |
DSN |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Charles X. Ling, Victor S. Sheng, Tilmann F. W. Bruckhaus, Nazim H. Madhavji |
Maximum profit mining and its application in software development. |
KDD |
2006 |
DBLP DOI BibTeX RDF |
escalation prediction, data mining, cost-sensitive learning |
23 | Bin Chen 0018, George S. Avrunin, Lori A. Clarke, Leon J. Osterweil |
Automatic Fault Tree Derivation from Little-JIL Process Definitions. |
SPW/ProSim |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Hideki Imai |
Trends and Challenges for Securer Cryptography in Practice. |
Mycrypt |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Praveen Parvathala |
High Level Test Generation / SW based Embedded Test. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Haihua Yan, Adit D. Singh, Gefu Xu |
Delay Defect Characterization Using Low Voltage Test. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Robert E. Mullen, Swapna S. Gokhale |
Software Defect Rediscoveries: A Discrete Lognormal Model. |
ISSRE |
2005 |
DBLP DOI BibTeX RDF |
Discrete Lognormal, Poisson-Lognormal, Software Maintenance, Software Reliability |
23 | Anderson Belgamo, Sandra Camargo Pinto Ferraz Fabbri, José Carlos Maldonado |
TUCCA: improving the effectiveness of use case construction and requirement analysis. |
ISESE |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. |
DAC |
2005 |
DBLP DOI BibTeX RDF |
SRAM memories, VDSM technologies, core-cell, test, march test, dynamic faults, defect analysis |
23 | Clelia Mandriota, Massimiliano Nitti, Nicola Ancona, Ettore Stella, Arcangelo Distante |
Filter-based feature selection for rail defect detection. |
Mach. Vis. Appl. |
2004 |
DBLP DOI BibTeX RDF |
Rail detection, Texture feature, Filter bank, K-nearest neighbor classifier |
23 | Janusz Rajski, Kan Thapar |
Nanometer Design: What are the Requirements for Manufacturing Test? |
DATE |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Dietmar Winkler 0001, Michael Halling, Stefan Biffl |
Investigating the Effect of Expert Ranking of Use Cases for Design Inspection. |
EUROMICRO |
2004 |
DBLP DOI BibTeX RDF |
usage-based reading, external replication, empirical software engineering, inspection, software inspection, reading technique |
23 | Thomas Lee Rodgers, Douglas L. Dean, Jay F. Nunamaker Jr. |
Increasing Inspection Efficiency through Group Support Systems. |
HICSS |
2004 |
DBLP DOI BibTeX RDF |
collaborative attention, collaborative preparation, Software inspections, group support systems |
23 | Mohamed Azimane, Ananta K. Majhi |
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu |
MRAM Defect Analysis and Fault Modeli. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Extending integrated-circuit yield-models to estimate early-life reliability. |
IEEE Trans. Reliab. |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Phillip Christie, José Pineda de Gyvez |
Prelayout interconnect yield prediction. |
IEEE Trans. Very Large Scale Integr. Syst. |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Yi Zhao, Sujit Dey |
Fault-coverage analysis techniques of crosstalk in chip interconnects. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Olli Silvén, Matti Niskanen, Hannu Kauppinen |
Wood inspection with non-supervised clustering. |
Mach. Vis. Appl. |
2003 |
DBLP DOI BibTeX RDF |
user interface, Self-organizing map, texture, color |
23 | John G. Dorsey, Daniel P. Siewiorek |
The Design of Wearable Systems: A Shift in Development Effort. |
DSN |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco |
A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. |
DSN |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Claes Wohlin, Aybüke Aurum |
An Evaluation of Checklist-Based Reading for Entity-Relationship Diagrams. |
IEEE METRICS |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Leena Lepistö, Iivari Kunttu, Jorma Autio, Ari Visa |
Multiresolution Texture Analysis of Surface Reflection Images. |
SCIA |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Dan Stefanoiu, Florin Ionescu |
Faults Diagnosis through Genetic Matching Pursuit. |
KES |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Filippo Lanubile, Teresa Mallardo |
An Empirical Study of Web-Based Inspection Meetings. |
ISESE |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Caroline D. Rombach, Oliver Kude, Aybüke Aurum, D. Ross Jeffery, Claes Wohlin |
An Empirical Study of an ER-Model Inspection Meeting. |
EUROMICRO |
2003 |
DBLP DOI BibTeX RDF |
Requirements Specification Inspection, Inspection Teams, Entity Relationship Model, Empirical Research, Reading Techniques |
23 | Paul Grünbacher, Michael Halling, Stefan Biffl |
An Empirical Study on Groupware Support for Software Inspection Meetings. |
ASE |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Houman Younessi, Panlop Zeephongsekul, Winai Bodhisuwan |
A General Model of Unit Testing Efficacy. |
Softw. Qual. J. |
2002 |
DBLP DOI BibTeX RDF |
process efficacy, unit testing efficacy model, usability, reliability, software quality, software process, functionality, maintainability, defect management |
23 | Jehad Al-Dallal, Paul G. Sorenson |
System Testing for Object-Oriented Frameworks Using Hook Technology. |
ASE |
2002 |
DBLP DOI BibTeX RDF |
hooks, object-oriented framework testing, test case generation, object-oriented framework |
23 | Mohammad Gh. Mohammad, Kewal K. Saluja, Alex S. Yap |
Fault Models and Test Procedures for Flash Memory Disturbances. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
program disturbance, fault model, flash memory, test algorithms |
23 | Hideo Shimazu, Dai Kusui |
Real-Time Creation of Frequently Asked Questions. |
ICCBR |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Kunihito Yamamori, Toru Abe, Susumu Horiguchi |
Performance Evaluation of a Partial Retraining Scheme for Defective Multi-Layer Neural Networks. |
ACSAC |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Phillip Christie, José Pineda de Gyvez |
Pre-layout prediction of interconnect manufacturability. |
SLIP |
2001 |
DBLP DOI BibTeX RDF |
design, reliability, interconnect, theory, yield, Rent's rule, critical areas |
23 | José Pineda de Gyvez |
Yield modeling and BEOL fundamentals. |
SLIP |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Michael Halling, Stefan Biffl, Thomas Grechenig, Monika Köhle |
Using Reading Techniques to Focus Inspection Performance. |
EUROMICRO |
2001 |
DBLP DOI BibTeX RDF |
Software inspection process, replicated experiment, empirical software engineering, quality measurement, defect detection techniques |
23 | Forrest Shull, Ioana Rus, Victor R. Basili |
How Perspective-Based Reading Can Improve Requirements Inspections. |
Computer |
2000 |
DBLP DOI BibTeX RDF |
|
23 | Lionel C. Briand, Khaled El Emam, Bernd G. Freimut, Oliver Laitenberger |
A Comprehensive Evaluation of Capture-Recapture Models for Estimating Software Defect Content. |
IEEE Trans. Software Eng. |
2000 |
DBLP DOI BibTeX RDF |
capture-recapture models, fault content estimation, robustness, Inspections |
23 | Yashwant K. Malaiya, Jason Denton |
Module Size Distribution and Defect Density. |
ISSRE |
2000 |
DBLP DOI BibTeX RDF |
Module size, module size Distribution, reliability, defect density |
23 | Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu |
Cold Delay Defect Screening. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
Manufacturing quality, Reliability, Delay Testing |
23 | Oliver Laitenberger, Marek Leszak, Dieter Stoll, Khaled El Emam |
Quantitative Modeling of Software Reviews in an Industrial Setting. |
IEEE METRICS |
1999 |
DBLP DOI BibTeX RDF |
Technical reviews, success factors, path analysis |
23 | Michael Cuviello, Sujit Dey, Xiaoliang Bai, Yi Zhao |
Fault modeling and simulation for crosstalk in system-on-chip interconnects. |
ICCAD |
1999 |
DBLP DOI BibTeX RDF |
|
23 | M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi |
Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1998 |
DBLP DOI BibTeX RDF |
|
23 | Phyllis G. Frankl, Richard G. Hamlet, Bev Littlewood, Lorenzo Strigini |
Evaluating Testing Methods by Delivered Reliability. |
IEEE Trans. Software Eng. |
1998 |
DBLP DOI BibTeX RDF |
statistical testing theory, Reliability, software testing, debugging |
23 | Claude Thibeault |
Increasing Current Testing Resolution. |
DFT |
1998 |
DBLP DOI BibTeX RDF |
current signatures, test, Integrated circuits, Iddq testing |
23 | Francesco Paolo Lovergine, Antonella Branca, Giovanni Attolico, Arcangelo Distante |
Leather Inspection by Oriented Texture Analysis with a Morphological Approach. |
ICIP (2) |
1997 |
DBLP DOI BibTeX RDF |
leather inspection, oriented texture analysis, morphological approach, scars, black and white camera, gradient orientations, local coherence, normalized B-spline basis, morphological segmentation, probable defective areas extraction, classification, industrial application, defect detection, folds, knots, automatic optical inspection |
23 | Tze-Jie Yu, Vincent Y. Shen, Hubert E. Dunsmore |
An Analysis of Several Software Defect Models. |
IEEE Trans. Software Eng. |
1988 |
DBLP DOI BibTeX RDF |
software defect models, software testing, software development, software reliability, software reliability, mathematical model, programming theory |
23 | Meihong Shi, Shoushan Jiang, Huiran Wang, Bugao Xu |
A Simplified pulse-coupled neural network for adaptive segmentation of fabric defects. |
Mach. Vis. Appl. |
2009 |
DBLP DOI BibTeX RDF |
Fabric defect, Image segmentation, Synchronization, Pulse-coupled neural network |
23 | Rafael Vilar, Juan Zapata-Pérez, Ramón Ruiz |
Classification of Welding Defects in Radiographic Images Using an ANN with Modified Performance Function. |
IWINAC (2) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Klaus Wolfmaier, Rudolf Ramler, Gábor Guta, Heinz Dobler |
Observable Runtime Behavior for Defects Indicated by Automated Static Analysis. |
EUROCAST |
2009 |
DBLP DOI BibTeX RDF |
Automated Static Analysis, Defect Classification |
23 | Syed Waseem Haider, João W. Cangussu, Kendra M. L. Cooper, Ram Dantu, Syed Haider |
Estimation of Defects Based on Defect Decay Model: ED^{3}M. |
IEEE Trans. Software Eng. |
2008 |
DBLP DOI BibTeX RDF |
Statistical methods, estimation theory, system testing, Testing and Debugging, Defect prediction, Metrics/Measurement |
23 | Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz |
Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. |
DSD |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Lang Gou, Qing Wang 0001, Jun Yuan, Ye Yang, Mingshu Li 0001, Nan Jiang 0001 |
Quantitatively Managing Defects for Iterative Projects: An Industrial Experience Report in China. |
ICSP |
2008 |
DBLP DOI BibTeX RDF |
Quantitative process management, Measurement, Software process improvement, Defect Management |
23 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Full Open Defects in Nanometric CMOS. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
interconnect open, gate leakage current, CMOS |
23 | Hongyu Zhang 0002 |
An initial study of the growth of eclipse defects. |
MSR |
2008 |
DBLP DOI BibTeX RDF |
defect growth model, eclipse, defect prediction, polynomial regression |
23 | Athanasios Tsakonas, Georgios Dounias |
Predicting Defects in Software Using Grammar-Guided Genetic Programming. |
SETN |
2008 |
DBLP DOI BibTeX RDF |
Software engineering, genetic programming, defect prediction |
23 | Tadashi Kunieda, Teijiro Isokawa, Ferdinand Peper, Ayumu Saitoh, Naotake Kamiura, Nobuyuki Matsui |
Reconfiguring Circuits Around Defects in Self-Timed Cellular Automata. |
ACRI |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Hamidreza Hashempour, Fabrizio Lombardi |
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
CNTFET, fault detection, nanotechnology, carbon nanotube, defect modeling, CNT |
23 | Kypros Constantinides, Onur Mutlu, Todd M. Austin, Valeria Bertacco |
Software-Based Online Detection of Hardware Defects Mechanisms, Architectural Support, and Evaluation. |
MICRO |
2007 |
DBLP DOI BibTeX RDF |
|
Displaying result #201 - #300 of 5103 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4][ 5][ 6][ 7][ 8][ 9][ 10][ 11][ 12][ >>] |
|