Search results for "scan"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
34	Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda	Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2007	DBLP DOI BibTeX RDF
34	Li-Chung Hsu, Hung-Ming Chen	On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design.	ISQED	2006	DBLP DOI BibTeX RDF
34	Shalini Ghosh, Sugato Basu, Nur A. Touba	Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering.	ISVLSI	2003	DBLP DOI BibTeX RDF
34	Kenneth P. Parker	Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?	ITC	2003	DBLP DOI BibTeX RDF
34	Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy	Full Scan Fault Coverage With Partial Scan.	DATE	1999	DBLP DOI BibTeX RDF
32	Lei Shi, Vandana Pursnani Janeja	Anomalous Window Discovery for Linear Intersecting Paths.	IEEE Trans. Knowl. Data Eng.	2011	DBLP DOI BibTeX RDF	spatial scan window, linear scan statistic, anomaly detection, Spatial scan statistics
31	Young-Ho Choi, Se-Young Oh	Grid-Based Visual SLAM in Complex Environments.	J. Intell. Robotic Syst.	2007	DBLP DOI BibTeX RDF	Visual sonar, Pseudo dense scan, Trajectory correction, Scan matching
31	Chen-Huan Chiang, Sandeep K. Gupta 0001	BIST TPG for SRAM cluster interconnect testing at board level.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	SRAM cluster interconnect testing, BIST TPG, static random access memory, board-level interconnects, test pattern generation architecture, IEEE 1149.1 boundary scan architecture, prohibited conditions, testable SRAM cluster interconnect fault detection, logic testing, built-in self test, automatic test pattern generation, test pattern generation, boundary scan testing, integrated circuit interconnections, SRAM chips, printed circuit testing
31	Masayuki Tsukisaka, Takashi Nanya	A testable design for asynchronous fine-grain pipeline circuits.	PRDC	2000	DBLP DOI BibTeX RDF	asynchronous fine-grain pipeline circuits, dynamic gates, high-performance datapath design, pipeline latches, scan latch libraries, logic testing, logic CAD, SPICE, CMOS technology, scan path, SPICE simulation, testable design
31	Kaushik De	Test methodology for embedded cores which protects intellectual property.	VTS	1997	DBLP DOI BibTeX RDF	core I/Os, ASIC I/O inaccessibility, partial netlist generation, ASIC level test generation, gate testing, core scan chain, selective boundary scan, coreware design paradigm, logic testing, heuristic algorithm, structural analysis, intellectual property protection, embedded cores, test methodology
31	Chunduri Rama Mohan, Srobona Mitra, Partha Pal Chaudhuri	On Incorporation of BIST for the Synthesis of Easily and Fully Testable Controllers.	VLSI Design	1997	DBLP DOI BibTeX RDF	fully testable controllers, testing scheme, Cadence, target library, built-in self test, cellular automata, VHDL, ATPGs, BIST, testability, FSMs, partial scan, VERILOG, area overhead, RTL designs, SYNERGY, full scan, stuck-at fault model
31	S. Lavabre, Yves Bertrand, Michel Renovell, Christian Landrault	Test configurations to enhance the testability of sequential circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	shift operation, scan register, test operation, modified flip-flops, ISCAS89 benchmarks, multiconfiguration, triconfiguration, dynamic generation, logic testing, controllability, design for testability, design for testability, sequential circuits, sequential circuits, observability, observability, DFT, fault coverage, flip-flops, minimisation, scan designs, test application time, test vector
31	Jacob Savir	Generator choices for delay test.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	BIST based delay test, generator choices, delay test vector generator, nonscan designs, transition test, skewed-load delay test, shift dependency, digital logic circuits, performance, VLSI, fault diagnosis, logic testing, delays, built-in self test, integrated circuit testing, ATPG, automatic testing, flexibility, linear feedback shift register, cost, shift registers, scan designs, boundary scan testing, test vectors, timing requirement, pseudo-random test
31	Douglas W. Cornell, Philip S. Yu	An Effective Approach to Vertical Partitioning for Physical Design of Relational Databases.	IEEE Trans. Software Eng.	1990	DBLP DOI BibTeX RDF	two-step methodology, binary partitioning, sort-merge, segment scan, cluster index scan, software engineering, relational databases, relational databases, linear programming, physical design, integer linear programming, join, vertical partitioning, query analysis, disk accesses
31	Janusz Rajski, Jerzy Tyszer	Diagnosis of Scan Cells in BIST Environment.	IEEE Trans. Computers	1999	DBLP DOI BibTeX RDF	multiple scan chains, fault diagnosis, Built-in self-test, design for testability, test-response compaction, scan-based design
31	Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang	Using a single input to support multiple scan chains.	ICCAD	1998	DBLP DOI BibTeX RDF	boundary scan (IEEE 1149.1) and test compaction, test generation, design for testability, scan based design
31	Rajesh Gupta 0003, Rajiv Gupta 0002, Melvin A. Breuer	The BALLAST Methodology for Structured Partial Scan Design.	IEEE Trans. Computers	1990	DBLP DOI BibTeX RDF	scan path storage elements, Ballast methodology, structured partial scan design, balanced structure scant test, testability properties, combinatorial automatic test pattern generation, logic testing, sequential circuits, automatic testing, combinatorial circuits
31	Zhijing G. Mou, Hai Liu 0012, Paul Hudak	Compress-and-conquer for optimal multicore computing.	DAMP	2010	DBLP DOI BibTeX RDF	compress and conquer, parallel computing, functional programming, scan, divide and conquer, programming paradigm, multicore programming
31	Matthew G. Stout, Kenneth P. Tumin	Innovative Test Solutions for Pin-Limited Microcontrollers.	ISQED	2008	DBLP DOI BibTeX RDF	Freescale, Stout, Tumin, test, testing, DFT, scan, microcontroller, design-for-test, pins
31	Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase	On Test Data Compression Using Selective Don't-Care Identification.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF	multiple scan structure, dont-care identification, test data compression, test cost reduction
31	Daniel B. Neill, Andrew W. Moore 0001, Maheshkumar Sabhnani, Kenny Daniel	Detection of emerging space-time clusters.	KDD	2005	DBLP DOI BibTeX RDF	cluster detection, space-time scan statistics, biosurveillance
31	Andrea Frosini, Maurice Nivat	Binary Matrices Under the Microscope: A Tomographical Problem.	IWCIA	2004	DBLP DOI BibTeX RDF	Reconstruction algorithm, Rectangular scan, Computational complexity, Projection, Discrete Tomography
31	Egor S. Sogomonyan, Adit D. Singh, Michael Gössel	A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	design-for-testability, BIST, scan design
31	Debaditya Mukherjee, Melvin A. Breuer	An IEEE 1149.1 Compliant Test Control Architecture.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	test control, local test control, distributed test control, dynamic test control, built-in self-test, design-for-test, boundary scan, test bus
31	Phillip Krueger, Ten-Hwang Lai, Vibha A. Dixit-Radiya	ob Scheduling is More Important than Processor Allocation for Hypercube Computers.	IEEE Trans. Parallel Distributed Syst.	1994	DBLP DOI BibTeX RDF	hypercubecomputers, scheduling, scheduling, resource allocation, hypercube, hypercube networks, job scheduling, Scan, processor allocation, performance problems
30	Christian Wimmer, Michael Franz	Linear scan register allocation on SSA form.	CGO	2010	DBLP DOI BibTeX RDF	SSA form deconstruction, lifetime analysis, linear scan, Java, register allocation, just-in-time compilation, SSA form
30	Maciej Nikodem	Boundary Scan Security Enhancements for a Cryptographic Hardware.	EUROCAST	2009	DBLP DOI BibTeX RDF	IEEE 1149, side-channel attacks, countermeasures, boundary scan
30	Matthew K. Feusner, Brian Lukoff	Testing for statistically significant differences between groups of scan patterns.	ETRA	2008	DBLP DOI BibTeX RDF	scan pattern, similarity test, eye tracking, analysis, statistics, comparison, sequence comparison, scanpath
30	Shuhui Yang, Minglu Li 0001, Jie Wu 0001	Scan-Based Movement-Assisted Sensor Deployment Methods in Wireless Sensor Networks.	IEEE Trans. Parallel Distributed Syst.	2007	DBLP DOI BibTeX RDF	Dimension exchange., Hungarian method, movement-assisted, wireless sensor networks, load balance, scan, sensor deployment
30	Grzegorz Mrugalski, Janusz Rajski, Chen Wang 0014, Artur Pogiel, Jerzy Tyszer	Isolation of Failing Scan Cells through Convolutional Test Response Compaction.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	convolutional compactors, fault diagnosis, test response compaction, scan-based designs
30	Ilia Polian, Hideo Fujiwara	Functional Constraints vs. Test Compression in Scan-Based Delay Testing.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	Overtesting prevention, Scan-based delay test, Test compression, Functional constraints
30	Qiming Wang, Sandy Ressler	Generation and manipulation of H-Anim CAESAR scan bodies.	Web3D	2007	DBLP DOI BibTeX RDF	CAESAR, VRML, 3D scan, 3D animation, H-Anim
30	Young Lim Choi, Yunja Nam, Kueng Mi Choi, Ming Hai Cui	A Method for Garment Pattern Generation by Flattening 3D Body Scan Data.	HCI (12)	2007	DBLP DOI BibTeX RDF	3D scan data, apparel pattern, grid method, silhouette, flattening
30	Qian Li	Practice of Video Encryption Algorithms Based on Chaotic Sequence and Scan Pattern.	KES (2)	2007	DBLP DOI BibTeX RDF	scan methodology, difference matrix, difference-compressed matrix, Video encryption, chaotic sequence
30	Ilia Polian, Hideo Fujiwara	Functional constraints vs. test compression in scan-based delay testing.	DATE	2006	DBLP DOI BibTeX RDF	overtesting prevention, scan-based delay test, test compression, functional constraints
30	Juha Havukumpu, Pia Vähäkangas, Eija Grönroos, Jukka Häkkinen	Midwives experiences of using HMD in ultrasound scan.	NordiCHI	2006	DBLP DOI BibTeX RDF	patient-midwife communication, ultrasound scan, user experience, head-mounted displays
30	Irith Pomeranz, Sudhakar M. Reddy	Static Test Compaction for Full-Scan Circuits Based on Combinational Test Sets and Nonscan Input Sequences and a Lower Bound on the Number of Tests.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF	Scan circuits, test application time, static test compaction
30	Irith Pomeranz	Scan-BIST based on transition probabilities.	DAC	2004	DBLP DOI BibTeX RDF	built-in self-test, scan design
30	Qianren Xu, Mohamed Kamel, Magdy M. A. Salama	A Spatially Adaptive Filter Reducing Arc Stripe Noise for Sector Scan Medical Ultrasound Imaging.	ICIAR (2)	2004	DBLP DOI BibTeX RDF	Arc stripe noise, radial noise reduction, sector scan, ultrasonic image
30	Ismet Bayraktaroglu, Alex Orailoglu	Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Test pattern compression, test pattern compaction, on-chip decompression, deterministic decompression, scan chains
30	Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos	A highly regular multi-phase reseeding technique for scan-based BIST.	ACM Great Lakes Symposium on VLSI	2003	DBLP DOI BibTeX RDF	scan-based schemes, built-in self-test, linear feedback shift registers, reseeding
30	Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani	Testing SoC Interconnects for Signal Integrity Using Boundary Scan.	VTS	2003	DBLP DOI BibTeX RDF	Integrity Loss Sensor, System-on-Chip Interconnects, Data Compression, Boundary Scan, Signal Integrity
30	Hak-soo Yu, Jacob A. Abraham	An Efficient 3-Bit -Scan Multiplier without Overlapping Bits, and Its 64x64 Bit Implementation.	ASP-DAC/VLSI Design	2002	DBLP DOI BibTeX RDF	3-bit-scan, power-delay-area tradeoffs, synchronous sequential, multiplier, partial product
30	Laurence Tianruo Yang, Zebo Peng	Incremental Testability Analysis for Partial Scan Selection and Design Transformations.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	incremental testability analysis, partial scan selection, design transformation, register transfer level, high-level test synthesis
30	Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff	Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	bus-transfer, core reuse, test protocol, TIC, TTM, vector transfer, design-for-testability, ATPG, scan-test, AMBA
30	Zulan Huang, Yizheng Ye, Zhigang Mao	A New Algorithm for Retiming-Based Partial Scan.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	retiming, Partial scan, minimum feedback vertex set
30	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi	Novel Control Pattern Generators for Interconnect Testing with Boundary Scan.	DFT	1999	DBLP DOI BibTeX RDF	BIST, boundary scan, Interconnect testing
30	Toshinori Hosokawa, Toshihiro Hiraoka, Mitsuyasu Ohta, Michiaki Muraoka, Shigeo Kuninobu	A Partial Scan Design Method Based on n-Fold Line-up Structures.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	n-fold line-up structure, dynamic test sequence compaction, flip-flop of load/hold type, fault efficiency, state justification, partial scan
30	Srimat T. Chakradhar, Arun Balakrishnan, Vishwani D. Agrawal	An exact algorithm for selecting partial scan flip-flops.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	multiway search and integer linear program, partial scan, minimum feedback vertex set
30	Prashant S. Parikh, Miron Abramovici	Testability-based partial scan analysis.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	testability cost, sensitivity analysis, partial scan
30	Slawomir Pilarski, André Ivanov, Tiko Kameda	On minimizing aliasing in scan-based compaction.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	built-in self-test, linear feedback shift register, signature analysis, Aliasing probability, scan path, test response compaction
30	Bernhard Eschermann	An implicitly testable boundary scan TAP controller.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	test controller, BIST, self-test, boundary scan, synthesis for testability, controller design
30	Kenneth P. Parker, Stig Oresjo	A language for describing boundary scan devices.	J. Electron. Test.	1991	DBLP DOI BibTeX RDF	boundary scan testability, VHDL
30	Dongdong Zhang, Xiaoping Qian	Scanning in atomic force microscopy.	ICRA	2009	DBLP DOI BibTeX RDF
30	Cheng-Han Tsai, Tai-Yi Huang, Edward T.-H. Chu, Chun-Hang Wei, Yu-Che Tsai	An Efficient Real-Time Disk-Scheduling Framework with Adaptive Quality Guarantee.	IEEE Trans. Computers	2008	DBLP DOI BibTeX RDF	real-time disk-scheduling algorithms, Scheduling, Performance evaluation, Performance, Real-time systems, Imprecise computation, weighted round-robin
30	Seongmoon Wang, Wenlong Wei	An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
30	Joon-Sung Yang, Nur A. Touba	Enhancing Silicon Debug via Periodic Monitoring.	DFT	2008	DBLP DOI BibTeX RDF
30	Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar	Unknown blocking scheme for low control data volume and high observability.	DATE	2007	DBLP DOI BibTeX RDF
30	Chia-Yi Lin, Hung-Ming Chen	A selective pattern-compression scheme for power and test-data reduction.	ICCAD	2007	DBLP DOI BibTeX RDF
30	Richard Putman, Nur A. Touba	Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression.	VTS	2007	DBLP DOI BibTeX RDF
30	Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey	Optimized reseeding by seed ordering and encoding.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
30	Man-Soon Kim, Sang-Wook Kim, Miyoung Shin	Optimization of subsequence matching under time warping in time-series databases.	SAC	2005	DBLP DOI BibTeX RDF	time warping, time-series databases, subsequence matching
30	Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar	Partial Gating Optimization for Power Reduction During Test Application.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
30	Lei Li 0036, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan	Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores.	VLSI Design	2005	DBLP DOI BibTeX RDF
30	Pedram Azad, Tilo Gockel, Rüdiger Dillmann	3D Shape Acquisition using a combined SSD and Least Squares Correlation Approach.	ITCC (2)	2004	DBLP DOI BibTeX RDF	Least Squares Correlation, Pattern Projector, Single Shot, 3D Shape Acquisition, 3D Scanning, SSD, Structured Light
30	Ramesh C. Tekumalla	On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures.	ITC	2003	DBLP DOI BibTeX RDF
30	Xiao Liu 0010, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran	Techniques to Reduce Data Volume and Application Time for Transition Test.	ITC	2002	DBLP DOI BibTeX RDF
30	Srimat T. Chakradhar, Anand Raghunathan	Bottleneck removal algorithm for dynamic compaction in sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1997	DBLP DOI BibTeX RDF
30	Robert B. Norwood, Edward J. McCluskey	High-Level Synthesis for Orthogonal Sca.	VTS	1997	DBLP DOI BibTeX RDF
30	Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara	F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG.	ETS	2011	DBLP DOI BibTeX RDF	automatic test pattern generation, scan-based test, high-level testing
30	Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre	Scan Attacks and Countermeasures in Presence of Scan Response Compactors.	ETS	2011	DBLP DOI BibTeX RDF	scan-based attack, security, testability, response compaction
30	Peichen Pan, C. L. Liu 0001	Partial Scan with Preselected Scan Signals.	IEEE Trans. Computers	1999	DBLP DOI BibTeX RDF	design for testability, retiming, partial scan, Digital testing
30	Daniel P. Lopresti, George Nagy, Elisa H. Barney Smith	Document analysis issues in reading optical scan ballots.	Document Analysis Systems	2010	DBLP DOI BibTeX RDF
30	Emili Hernández, Pere Ridao, David Ribas, Angelos Mallios	Probabilistic sonar scan matching for an AUV.	IROS	2009	DBLP DOI BibTeX RDF
30	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
30	Antoni Burguera, Yolanda González Cid, Gabriel Oliver	The likelihood field approach to sonar scan matching.	IROS	2008	DBLP DOI BibTeX RDF
30	Yu Hu 0001, Xiang Fu 0007, Xiaoxin Fan, Hideo Fujiwara	Localized random access scan: Towards low area and routing overhead.	ASP-DAC	2008	DBLP DOI BibTeX RDF
30	Xiaojun Jiang, Nan Liu, Renyi Liu, Tianhe Yin	Study and Implementation of the Methods of the Side-scan Sonar Image Processing.	CSSE (6)	2008	DBLP DOI BibTeX RDF
30	Mukesh Agrawal, Sandip Karmakar, Dhiman Saha, Debdeep Mukhopadhyay	Scan Based Side Channel Attacks on Stream Ciphers and Their Counter-Measures.	INDOCRYPT	2008	DBLP DOI BibTeX RDF
30	Lifeng He, Yuyan Chao, Kenji Suzuki 0001	A Linear-Time Two-Scan Labeling Algorithm.	ICIP (5)	2007	DBLP DOI BibTeX RDF
30	Antoni Burguera, Yolanda González Cid, Gabriel Oliver	Probabilistic sonar filtering in scan matching localization.	IROS	2007	DBLP DOI BibTeX RDF
30	Vivek Sarkar, Rajkishore Barik	Extended Linear Scan: An Alternate Foundation for Global Register Allocation.	CC	2007	DBLP DOI BibTeX RDF
30	Baojun Zhang, Jiebing Wang, Xuezeng Pan	Virus Scan System Based on Hardware-Acceleration.	IMSCCS	2007	DBLP DOI BibTeX RDF	YUQUAN, HPM, Frox, Hpmd, Concurrency
30	Gefu Xu, Adit D. Singh	Delay Test Scan Flip-Flop: DFT for High Coverage Delay Testing.	VLSI Design	2007	DBLP DOI BibTeX RDF
30	Xinming Liu, C. C. Shaw, M. C. Altunbas, Tianpeng Wang	An alternate line erasure and readout (ALER) method for implementing slot-scan imaging technique with a flat-panel detector-initial experiences.	IEEE Trans. Medical Imaging	2006	DBLP DOI BibTeX RDF
30	David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre	A secure scan design methodology.	DATE	2006	DBLP DOI BibTeX RDF
30	Irith Pomeranz, Sudhakar M. Reddy	Test compaction for transition faults under transparent-scan.	DATE	2006	DBLP DOI BibTeX RDF
30	Marcin Gomulkiewicz, Maciej Nikodem, Tadeusz Tomczak	Low-cost and Universal Secure Scan: a Design- Architecture for Crypto Chips.	DepCoS-RELCOMEX	2006	DBLP DOI BibTeX RDF
30	Gefu Xu, Adit D. Singh	Low Cost Launch-on-Shift Delay Test with Slow Scan Enable.	ETS	2006	DBLP DOI BibTeX RDF
30	Jian Zhang 0076, Sei-ichiro Kamata, Yoshifumi Ueshige	A Pseudo-hilbert Scan Algorithm for Arbitrarily-Sized Rectangle Region.	IWICPAS	2006	DBLP DOI BibTeX RDF
30	Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya	An Efficient Scan Tree Design for Compact Test Pattern Set.	VLSI Design	2006	DBLP DOI BibTeX RDF
30	Chao-Shen Chen, Rong-Jian Chen	Image Encryption and Decryption Using SCAN Methodology.	PDCAT	2006	DBLP DOI BibTeX RDF
30	Nabil Badereddine, Patrick Girard 0001, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault	Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives.	PATMOS	2005	DBLP DOI BibTeX RDF
30	Varun Arora, Indranil Sengupta 0001	A Unified Approach to Partial Scan Design using Genetic Algorithm.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
30	Dong Hyun Baik, Kewal K. Saluja	State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
30	Irith Pomeranz, Sudhakar M. Reddy	Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.	IEEE Trans. Very Large Scale Integr. Syst.	2004	DBLP DOI BibTeX RDF
30	Il-soo Lee, Yong Min Hur, Tony Ambler	The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
30	Nan-Cheng Lai, Sying-Jyan Wang, Yu-Hsuan Fu	Low Power BIST with Smoother and Scan-Chain Reorder .	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
30	Jiann-Chyi Rau, Ching-Hsiu Lin, Jun-Yi Chang	An Efficient Low-Overhead Policy for Constructing Multiple Scan-Chains.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
30	Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars	The Effectiveness of the Scan Test and Its New Variants.	MTDT	2004	DBLP DOI BibTeX RDF