|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 29817 occurrences of 7713 keywords
|
|
|
Results
Found 56580 publication records. Showing 56580 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
25 | Nadia Alshahwan, Yue Jia 0001, Kiran Lakhotia, Gordon Fraser 0001, David Shuler, Paolo Tonella |
AUTOMOCK: Automated Synthesis of a Mock Environment for Test Case Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Practical Software Testing: Tool Automation and Human Factors ![In: Practical Software Testing: Tool Automation and Human Factors, 14.03. - 19.03.2010, 2010, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, Germany. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
25 | Amy J. Ko, Michal Young, Jamie Andrews, Brian P. Robinson, Mark Grechanik |
Computing and Diagnosing Changes in Unit Test Energy Consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Practical Software Testing: Tool Automation and Human Factors ![In: Practical Software Testing: Tool Automation and Human Factors, 14.03. - 19.03.2010, 2010, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, Germany. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
25 | Oded Goldreich 0001 |
Short Locally Testable Codes and Proofs: A Survey in Two Parts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 65-104, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Krzysztof Onak, Ronitt Rubinfeld |
Dynamic Approximate Vertex Cover and Maximum Matching. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 341-345, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Alexandr Andoni, Piotr Indyk, Krzysztof Onak, Ronitt Rubinfeld |
Sublinear Algorithms in the External Memory Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 240-243, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Noga Alon |
On Constant Time Approximation of Parameters of Bounded Degree Graphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 234-239, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Eli Ben-Sasson |
Limitation on the Rate of Families of Locally Testable Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 13-31, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Michael E. Saks, C. Seshadhri 0001 |
Local Property Reconstruction and Monotonicity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 346-354, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Oded Goldreich 0001 |
The Program of the Mini-Workshop. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 6-12, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Artur Czumaj, Christian Sohler |
Sublinear-time Algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 41-64, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Alexandr Andoni, Robert Krauthgamer, Krzysztof Onak |
Polylogarithmic Approximation for Edit Distance and the Asymmetric Query Complexity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 244-252, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Sofya Raskhodnikova |
Transitive-Closure Spanners: A Survey. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 167-196, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Irit Dinur, Prahladh Harsha |
Composition of Low-Error 2-Query PCPs Using Decodable PCPs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 280-288, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Krzysztof Onak |
Sublinear Graph Approximation Algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Property Testing ![In: Property Testing - Current Research and Surveys, pp. 158-166, 2010, Springer, 978-3-642-16366-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
25 | Alexander Schliep, Amin Shokrollahi, Nicolas Thierry-Mieg (eds.) |
Group Testing in the Life Sciences, 20.07. - 25.07.2008 ![Search on Bibsonomy](Pics/bibsonomy.png) |
Group Testing in the Life Sciences ![Schloss Dagstuhl - Leibniz-Zentrum für Informatik, Germany The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
25 | Robert M. Hierons, Jonathan P. Bowen, Mark Harman (eds.) |
Formal Methods and Testing, An Outcome of the FORTEST Network, Revised Selected Papers ![Search on Bibsonomy](Pics/bibsonomy.png) |
Formal Methods and Testing ![Springer, 978-3-540-78916-1 The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Bev Littlewood, Peter T. Popov, Lorenzo Strigini, Nick Shryane |
Modelling the Effects of Combining Diverse Software Fault Detection Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Formal Methods and Testing ![In: Formal Methods and Testing, An Outcome of the FORTEST Network, Revised Selected Papers, pp. 345-366, 2008, Springer, 978-3-540-78916-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Johannes Mayer, Robert G. Merkel (eds.) |
Proceedings of the 1st International Workshop on Random Testing, RT 2006, Portland, Maine, USA, July 20, 2006 ![Search on Bibsonomy](Pics/bibsonomy.png) |
Random Testing ![ACM, 1-59593-457-X The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP BibTeX RDF |
|
25 | Ed Brinksma, Wolfgang Grieskamp, Jan Tretmans (eds.) |
Perspectives of Model-Based Testing, 5.-10. September 2004 ![Search on Bibsonomy](Pics/bibsonomy.png) |
Perspectives of Model-Based Testing ![IBFI, Schloss Dagstuhl, Germany The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP BibTeX RDF |
|
25 | Manfred Broy, Bengt Jonsson 0001, Joost-Pieter Katoen, Martin Leucker, Alexander Pretschner (eds.) |
Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004] ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![Springer, 3-540-26278-4 The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Levi Lucio, Marko Samer |
Technology of Test-Case Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 323-354, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Axel Belinfante, Lars Frantzen, Christian Schallhart |
Tools for Test Case Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 391-438, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | |
Part IV. Tools and Case Studies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 389-390, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Bengt Jonsson 0001 |
Finite State Machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 611-614, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Stefan D. Bruda |
Preorder Relations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 117-149, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | |
Part III. Model-Based Test Case Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 277-279, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Sven Sandberg |
Homing and Synchronizing Sequences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 5-33, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Moez Krichen |
State Identification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 35-67, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Joost-Pieter Katoen |
Labelled Transition Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 615-616, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Séverine Colin, Leonardo Mariani |
Run-Time Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 525-555, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Therese Berg, Harald Raffelt |
Model Checking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Model-Based Testing of Reactive Systems ![In: Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004], pp. 557-603, 2004, Springer, 3-540-26278-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Mary Jean Harrold |
The Effects of Optimizing Transformations on Data-Flow Adequate Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 130-138, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Joseph Robert Horgan, Saul London |
Data Flow Coverage and the C Language. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 87-97, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
C |
25 | Brian Marick |
The Weak Mutation Hypothesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 190-199, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Thomas J. Ostrand, Elaine J. Weyuker |
Data Flow-Based Test Adequacy Analysis for Languages with Pointers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 74-86, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
C |
25 | Douglas L. Long, Lori A. Clarke |
Data Flow Analysis of Concurrent Systems that Use the Rendezvous Model of Synchronization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 21-35, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Evelyn Duesterwald, Mary Lou Soffa |
Concurrency Analysis in the Presence of Procedures Using a Data-Flow Framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 36-48, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
DEBUG |
25 | Andy Podgurski |
Reliability, Sampling, and Algorithmic Randomness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 11-20, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Sriram Sankar |
Run-Time Consistency Checking of Algebraic Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 123-129, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Hemant D. Pande, William Landi |
Interprocedural Def-Use Associations in C Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 139-153, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
C |
25 | Hiralal Agrawal, Richard A. DeMillo, Eugene H. Spafford |
Dynamic Slicing in the Presence of Unconstrained Pointers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 60-73, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
DEBUG |
25 | A. Jefferson Offutt, Stephen D. Lee |
How Strong is Weak Mutation? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 200-213, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Carlo Ghezzi, Richard A. Kennerer |
Executing Formal Specifications: The ASTRAL to TRIO Translation Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 112-122, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Phyllis G. Frankl, Stewart N. Weiss |
An Experimental Comparison of the Effectiveness of the All-Uses and All-Edges Adequacy Criteria. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 154-164, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Rajiv Gupta 0001, Madalene Spezialetti |
Loop Monotonic Computations: An Approach for the Efficient Run-Time Detection of Races. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 98-111, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
DEBUG |
25 | George S. Avrunin, Ugo A. Buy, James C. Corbett, Laura K. Dillon, Jack C. Wileden |
Experiments with an Improved Constrained Expression Toolset. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 178-187, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | Wei Jen Yeh, Michal Young |
Compositional Reachability Analysis Using Process Algebra. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 49-59, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | William D. Young |
Formal Methods versus Software Engineering: Is There a Conflict? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the Symposium on Testing, Analysis, and Verification, TAV 1991, Victoria, British Columbia, Canada, October 8-10, 1991, pp. 188-189, 1991, ACM, 0-89791-449-X. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
25 | John H. Rowland, Y. Zuyuan |
Experimental Comparison of Three System Test Strategies Preliminary Report. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 141-149, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | George S. Avrunin, Jack C. Wileden, Laura K. Dillon |
Experiments in Automated Analysis of Concurrent Software Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 124-130, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | Michal Young, Richard N. Taylor, K. Forester, Debra Brodbeck |
Integrated Concurrency Analysis in a Software Development Enviornment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 200-209, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | Mark Moriconi |
A Practical Approach to Semantic Configuration Management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 103-113, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | Marc J. Balcer, William M. Hasling, Thomas J. Ostrand |
Automatic Generation of Test Scripts from Formal Test Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 210-218, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | Kurt M. Olender, Leon J. Osterweil |
Cesar: A Static Sequencing Constraint Analyzer. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 66-74, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | William E. Howden |
Validating Programs without Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 2-9, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | D. Perry |
The Logic of Propagation in the Inscape Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 114-121, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | Susan L. Gerhart |
Preliminary Summary: FM89 Assessment of Formal Methods for Trustworthy Computer Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 152-155, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
25 | William D. Young |
Verified Compilation in micro-Gypsy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Testing, Analysis, and Verification ![In: Proceedings of the ACM SIGSOFT '89 Third Symposium on Testing, Analysis, and Verification, TAV 1989, Key West, Florida, USA, December 13-15, 1989, pp. 20-26, 1989, ACM, 0-89791-342-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
GYPSY |
23 | Luay Ho Tahat, Atef Bader, Boris Vaysburg, Bogdan Korel |
Requirement-Based Automated Black-Box Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: 25th International Computer Software and Applications Conference (COMPSAC 2001), Invigorating Software Development, 8-12 October 2001, Chicago, IL, USA, pp. 489-495, 2001, IEEE Computer Society, 0-7695-1372-7. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Selective Testing, Requirements, Regression Testing, System Model, SDL, Black-Box Testing, System Testing, Automated Test Generation, EFSM |
23 | Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen |
Peak-power reduction for multiple-scan circuits during test application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 453-458, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
peak-power reduction, multiple scan chain based circuits, peak periodicity, peak width, power waveforms, scan-based circuits, delay buffers, interleaving scan technique, data output, logic testing, logic testing, delays, integrated circuit testing, application specific integrated circuits, SOC, boundary scan testing |
23 | Andy Podgurski, Wassim Masri, Yolanda McCleese, Francis G. Wolff, Charles Yang 0001 |
Estimation of Software Reliability by Stratified Sampling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Softw. Eng. Methodol. ![In: ACM Trans. Softw. Eng. Methodol. 8(3), pp. 263-283, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
beta testing, operational testing, software testing, software reliability, cluster analysis, statistical testing, stratified sampling |
23 | Monika Rauch Henzinger, Michael L. Fredman |
Lower Bounds for Fully Dynamic Connectivity Problems in Graphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Algorithmica ![In: Algorithmica 22(3), pp. 351-362, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
Dynamic planarity testing, Dynamic connectivity testing, Dynamic planarity testing, Dynamic connectivity testing, Lower bounds, Lower bounds, Key words, Cell probe model, Cell probe model |
23 | Antoni Ferré, Joan Figueras |
On estimating bounds of the quiescent current for IDDQ testin. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 106-111, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
quiescent current bounds, sensing circuitry design, VLSI, logic testing, integrated circuit testing, ATPG, automatic testing, CMOS integrated circuits, leakage currents, I/sub DDQ/ testing, CMOS ICs, hierarchical approach |
23 | Marcello Dalpasso, Michele Favalli, Piero Olivo |
Test pattern generation for IDDQ: increasing test quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 304-309, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
ATPG strategy, quiescent power supply current monitoring, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, CMOS logic circuits, I/sub DDQ/ testing |
23 | Imtiaz P. Shaik, Michael L. Bushnell |
Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming . ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 393-399, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
low overhead delay-fault BIST, constrained quadratic 0-1 programming, built-in self testing model, weighted signed graph balancing problem, VLSI, logic testing, delays, built-in self test, integrated circuit testing, logic design, automatic testing, integrated circuit design, quadratic programming, circuit design, digital integrated circuits, hazards and race conditions |
23 | Tong Liu 0007, Fabrizio Lombardi, José Salinas |
Diagnosis of interconnects and FPICs using a structured walking-1 approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 256-261, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
field programmable interconnect chips, structured walking-1 approach, boundary scan architectures, one-step test generation, two-step test generation, fault diagnosis, integrated circuit testing, diagnosis, automatic testing, boundary scan testing, interconnects testing, integrated circuit interconnections |
23 | Anand Raghunathan, Pranav Ashar, Sharad Malik |
Test generation for cyclic combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 104-109, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
cyclic combinational circuits, bus structures, single-stuck-at fault test pattern, test generation problem, program RAM, fault diagnosis, logic testing, integrated circuit testing, network topology, combinational circuits, automatic testing, fault coverage, test pattern generators, formal analysis, data paths, testing algorithm, combinational logic circuits, untestable faults |
23 | Pedro de Alcântara dos Santos Neto, Rodolfo F. Resende, Clarindo Isaías Pereira da Silva e Pádua |
An evaluation of a model-based testing method for information systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008, pp. 770-776, 2008, ACM, 978-1-59593-753-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
software testing, model-based testing, testing automation, test requirements |
23 | Mikhail Auguston, James Bret Michael, Man-tak Shing |
Environment behavior models for scenario generation and testing automation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 30(4), pp. 1-6, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
reactive and real time system testing, model-based testing, testing automation |
23 | Sarfraz Khurshid, Darko Marinov |
TestEra: Specification-Based Testing of Java Programs Using SAT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Autom. Softw. Eng. ![In: Autom. Softw. Eng. 11(4), pp. 403-434, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Java testing, TestEra, SAT enumeration, software testing, specification-based testing, Alloy, automated test generation |
23 | Nashat Mansour, Miran Salame |
Data Generation for Path Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 12(2), pp. 121-136, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
genetic algorithms, software testing, simulated annealing, software quality, structural testing, path testing |
23 | Spyros Tragoudas, N. Denny |
Path delay fault testing using test points. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 8(1), pp. 1-10, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
path delay fault simulation (coverage), testing digital circuits, design for testability, Automatic test pattern generation, delay testing, path delay fault testing |
23 | Hans G. Kerkhoff, Mustafa Acar |
Testable Design and Testing of Micro-Electro-Fluidic Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, pp. 403-409, 2003, IEEE Computer Society, 0-7695-1924-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Multi-domain testing, Microsystem testing, Multi-domain fault modeling & simulation, Design-for-Testability, MEMS testing |
23 | Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina |
At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 3-8, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
delay testing, at-speed testing, microprocessor testing |
23 | Aynur Abdurazik, Paul Ammann, Wei Ding 0003, A. Jefferson Offutt |
Evaluation of Three Specification-Based Testing Criteria. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECCS ![In: 6th International Conference on Engineering of Complex Computer Systems (ICECCS 2000), 11-15 September 2000, Tokyo, Japan, pp. 179-187, 2000, IEEE Computer Society, 0-7695-0583-X. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
PROBSUBSUMES measure, specification-mutation coverage, full predicate coverage, transition-pair coverage, program testing, specification-based testing, testing criteria, model checker |
23 | Abhijit Jas, Nur A. Touba |
Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings of the IEEE International Conference On Computer Design, VLSI in Computers and Processors, ICCD '99, Austin, Texas, USA, October 10-13, 1999, pp. 418-, 1999, IEEE Computer Society, 0-7695-0406-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Test Vector Compression, External Testing, Built-In Self-Test, Embedded Processor, System-on-a-Chip, Automatic Test Equipment, At-Speed Testing, Scan Chains, Deterministic Testing |
23 | S. Crepaux-Motte, Mireille Jacomino, Rene David |
An algebraic method for delay fault testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 308-315, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
input values, output function, robustly testable fault, nonrobustly testable fault, weakly verifiable, fault diagnosis, logic testing, delays, timing, Markov processes, random testing, delay fault testing, state transition, input vectors, algebraic method |
23 | Fidel Muradali, Janusz Rajski |
A self-driven test structure for pseudorandom testing of non-scan sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 17-25, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
self-driven test structure, primary inputs, nonscan sequential circuits, test point structure, parallel pseudorandom test patterns, test mode flag, stuck-at fault coverage, ISCAS-89 benchmarks, logic testing, built-in self test, integrated circuit testing, design for testability, sequential circuits, BIST, automatic testing, circuit under test |
23 | Anne E. Gattiker, Wojciech Maly |
Current signatures [VLSI circuit testing]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 112-117, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
VLSI circuit testing, current signature, passive defects, active defects, VLSI, integrated circuit testing, CMOS integrated circuits, I/sub DDQ/ testing |
23 | Mohamed Soufi, Steve Rochon, Yvon Savaria, Bozena Kaminska |
Design and performance of CMOS TSPC cells for high speed pseudo random testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 368-373, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
CMOS TSPC cells, high speed pseudo random testing, built-in self-test scheme, HSpice simulations, functionally equivalent logic block, true single phase clocking, logic testing, built-in self test, integrated circuit testing, logic CAD, layout, circuit analysis computing, clocks, circuit layout CAD, CMOS logic circuits, SPICE, cellular arrays, integrated circuit layout, test methodology, untestable faults, netlists |
23 | Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu |
Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 58-64, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electron beam testing, multiple fault diagnosis, sensitized paths, EB testing, TP-1, TP-2, TP-3, TP-4, electron-beam tester, internal lines, VLSI, fault diagnosis, logic testing, combinational circuits, combinational circuits, fault location, fault location, stuck-at faults, diagnostic resolution |
23 | Remata S. Reddy, Irith Pomeranz, Sudhakar M. Reddy, Seiji Kajihara |
Compact test generation for bridging faults under IDDQ testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 310-316, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
compact test generation, bit-adders, logic testing, partitioning, integrated circuit testing, fault location, stuck-at faults, CMOS logic circuits, bridging faults, logic partitioning, I/sub DDQ/ testing |
23 | Wojciech Maly, Marek J. Patyra |
Design of ICs applying built-in current testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 397-406, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
BIC-testing, Built-in testing, current testing |
23 | Pankaj Jalote |
Testing the Completeness of Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 15(5), pp. 526-531, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
completeness testing, VAX system, data structures, Unix, program testing, conformance testing, abstract data types, test cases, axiomatic specifications |
23 | Simeon C. Ntafos |
A Comparison of Some Structural Testing Strategies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 14(6), pp. 868-874, 1988. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
program testing, program testing, programming theory, structural testing, structured programming |
23 | Kalpesh Kapoor |
Formal Analysis of Coupling Hypothesis for Logical Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Innov. Syst. Softw. Eng. ![In: Innov. Syst. Softw. Eng. 2(2), pp. 80-87, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Logical fault, Software testing, Mutation testing, Fault-based testing, Boolean specification |
23 | Chintan Patel, Abhishek Singh 0001, Jim Plusquellic |
Defect Detection Using Quiescent Signal Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 21(5), pp. 463-483, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing |
23 | Noëlly Grondin, J. M. Christian Bastien, Blandine Agopian |
Les tests utilisateurs: avantages et inconvénients des passations individuelles et par paires. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IHM ![In: Proceedings of the 14th French-speaking conference on Human-computer interaction, Conference Francophone sur l'Interaction Homme-Machine, IHM 2002, Poitiers, France, November 26-29, 2002, pp. 121-128, 2002, ACM, 1-58113-615-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
co-discovery, co-participation, constructive interaction, paired-user testing, usability evaluation, usability testing, user testing, interactive TV, usability methods |
23 | Zahra Sadat Ebadi, André Ivanov |
Design of an Optimal Test Access Architecture Using a Genetic Algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 205-, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Optimal testing time, test data width, Genetic Algorithm, Test Access Mechanism (TAM), SOC testing, Embedded core testing |
23 | Amit M. Paradkar |
SALT - An Integrated Environment to Automate Generation of Function Tests for APIs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 11th International Symposium on Software Reliability Engineering (ISSRE 2000), 8-11 October 2000, San Jose, CA, USA, pp. 304-316, 2000, IEEE Computer Society, 0-7695-0807-3. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Test Design Automation, Model Based Testing, Specification-Based Testing, Fault-Based Testing |
23 | Nancy S. Eickelmann, Debra J. Richardson |
An Evaluation of Software Test Environment Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 18th International Conference on Software Engineering, Berlin, Germany, March 25-29, 1996, Proceedings., pp. 353-364, 1996, IEEE Computer Society, 0-8186-7246-3. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP BibTeX RDF |
CITE, CONVEX Integrated Test Environment, PROLOG Test Environment, Version II, PROTest II, Software Architectural Analysis Method, TAOS, Testing with Analysis and Oracle Support, architecturally imposed constraints, environment functions allocation, implementation structures, processing algorithms, software test environment architectures, test development, test failure analysis, test measurement, test process automation, performance, software architecture, programming environments, program testing, software reusability, extensibility, reusability, software performance evaluation, portability, functionality, computer aided software engineering, software portability, testing tools, data representation, reference architecture, modifiability, test management, modifications, test planning, test execution, SAAM |
23 | Timothy J. Shimeall, Nancy G. Leveson |
An Empirical Comparison of Software Fault Tolerance and Fault Elimination. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 17(2), pp. 173-182, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
fault elimination, run-time assertions, multiversion voting, stepwise abstraction, static data-flow analysis, project resources, fault tolerant computing, software reliability, software reliability, program testing, software fault tolerance, functional testing, structural testing, code reading |
23 | Jose Pablo Escobedo, Christophe Gaston, Pascale Le Gall, Ana R. Cavalli |
Observability and Controllability Issues in Conformance Testing of Web Service Compositions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communication Systems, 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings, pp. 217-222, 2009, Springer, 978-3-642-05030-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
observability and controllability, verdict testing report, Web Service composition, Conformance testing |
23 | Ru-Gang Xu, Patrice Godefroid, Rupak Majumdar |
Testing for buffer overflows with length abstraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2008, Seattle, WA, USA, July 20-24, 2008, pp. 27-38, 2008, ACM, 978-1-60558-050-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
length abstractions, underapproximation, buffer overflows, testing c programs, directed testing |
23 | Abdelghani Benharref, Rachida Dssouli, Mohamed Adel Serhani, Abdeslam En-Nouaary, Roch H. Glitho |
New Approach for EFSM-Based Passive Testing of Web Services. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communicating Systems, 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007, Proceedings, pp. 13-27, 2007, Springer, 978-3-540-73065-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
EFSM-based passive testing, Web Services testing |
23 | Kevin J. Sullivan, Jinlin Yang, David Coppit, Sarfraz Khurshid, Daniel Jackson 0001 |
Software assurance by bounded exhaustive testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2004, Boston, Massachusetts, USA, July 11-14, 2004, pp. 133-142, 2004, ACM, 1-58113-820-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
TestEra, formal methods, reverse engineering, specification-based testing, automated test case generation, bounded exhaustive testing |
23 | Sebastian Wieczorek, Vitaly Kozyura, Andreas Roth 0001, Michael Leuschel, Jens Bendisposto, Daniel Plagge, Ina Schieferdecker |
Applying Model Checking to Generate Model-Based Integration Tests from Choreography Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communication Systems, 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings, pp. 179-194, 2009, Springer, 978-3-642-05030-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Service Choreography Models, Model Checking, Formal Methods, Model-based Testing, Integration Testing |
23 | Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury, Kaushik Roy 0001 |
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(6), pp. 577-590, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Enhanced scan, Supply gating, Delay fault testing, Two-pattern testing |
23 | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(4), pp. 379-391, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing |
23 | Arilo Claudio Dias Neto, Guilherme Horta Travassos |
Surveying model based testing approaches characterization attributes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Second International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, October 9-10, 2008, Kaiserslautern, Germany, pp. 324-326, 2008, ACM, 978-1-59593-971-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
software testing, survey, model-based testing, experimental software engineering |
|
|