Search results for "Testing"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
25	Nadia Alshahwan, Yue Jia 0001, Kiran Lakhotia, Gordon Fraser 0001, David Shuler, Paolo Tonella	AUTOMOCK: Automated Synthesis of a Mock Environment for Test Case Generation.	Practical Software Testing: Tool Automation and Human Factors	2010	DBLP BibTeX RDF
25	Amy J. Ko, Michal Young, Jamie Andrews, Brian P. Robinson, Mark Grechanik	Computing and Diagnosing Changes in Unit Test Energy Consumption.	Practical Software Testing: Tool Automation and Human Factors	2010	DBLP BibTeX RDF
25	Oded Goldreich 0001	Short Locally Testable Codes and Proofs: A Survey in Two Parts.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Krzysztof Onak, Ronitt Rubinfeld	Dynamic Approximate Vertex Cover and Maximum Matching.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Alexandr Andoni, Piotr Indyk, Krzysztof Onak, Ronitt Rubinfeld	Sublinear Algorithms in the External Memory Model.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Noga Alon	On Constant Time Approximation of Parameters of Bounded Degree Graphs.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Eli Ben-Sasson	Limitation on the Rate of Families of Locally Testable Codes.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Michael E. Saks, C. Seshadhri 0001	Local Property Reconstruction and Monotonicity.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Oded Goldreich 0001	The Program of the Mini-Workshop.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Artur Czumaj, Christian Sohler	Sublinear-time Algorithms.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Alexandr Andoni, Robert Krauthgamer, Krzysztof Onak	Polylogarithmic Approximation for Edit Distance and the Asymmetric Query Complexity.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Sofya Raskhodnikova	Transitive-Closure Spanners: A Survey.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Irit Dinur, Prahladh Harsha	Composition of Low-Error 2-Query PCPs Using Decodable PCPs.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Krzysztof Onak	Sublinear Graph Approximation Algorithms.	Property Testing	2010	DBLP DOI BibTeX RDF
25	Alexander Schliep, Amin Shokrollahi, Nicolas Thierry-Mieg (eds.)	Group Testing in the Life Sciences, 20.07. - 25.07.2008	Group Testing in the Life Sciences	2008	DBLP BibTeX RDF
25	Robert M. Hierons, Jonathan P. Bowen, Mark Harman (eds.)	Formal Methods and Testing, An Outcome of the FORTEST Network, Revised Selected Papers	Formal Methods and Testing	2008	DBLP DOI BibTeX RDF
25	Bev Littlewood, Peter T. Popov, Lorenzo Strigini, Nick Shryane	Modelling the Effects of Combining Diverse Software Fault Detection Techniques.	Formal Methods and Testing	2008	DBLP DOI BibTeX RDF
25	Johannes Mayer, Robert G. Merkel (eds.)	Proceedings of the 1st International Workshop on Random Testing, RT 2006, Portland, Maine, USA, July 20, 2006	Random Testing	2006	DBLP BibTeX RDF
25	Ed Brinksma, Wolfgang Grieskamp, Jan Tretmans (eds.)	Perspectives of Model-Based Testing, 5.-10. September 2004	Perspectives of Model-Based Testing	2005	DBLP BibTeX RDF
25	Manfred Broy, Bengt Jonsson 0001, Joost-Pieter Katoen, Martin Leucker, Alexander Pretschner (eds.)	Model-Based Testing of Reactive Systems, Advanced Lectures [The volume is the outcome of a research seminar that was held in Schloss Dagstuhl in January 2004]	Model-Based Testing of Reactive Systems	2005	DBLP DOI BibTeX RDF
25	Levi Lucio, Marko Samer	Technology of Test-Case Generation.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Axel Belinfante, Lars Frantzen, Christian Schallhart	Tools for Test Case Generation.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25		Part IV. Tools and Case Studies.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Bengt Jonsson 0001	Finite State Machines.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Stefan D. Bruda	Preorder Relations.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25		Part III. Model-Based Test Case Generation.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Sven Sandberg	Homing and Synchronizing Sequences.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Moez Krichen	State Identification.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Joost-Pieter Katoen	Labelled Transition Systems.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Séverine Colin, Leonardo Mariani	Run-Time Verification.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Therese Berg, Harald Raffelt	Model Checking.	Model-Based Testing of Reactive Systems	2004	DBLP DOI BibTeX RDF
25	Mary Jean Harrold	The Effects of Optimizing Transformations on Data-Flow Adequate Test Sets.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Joseph Robert Horgan, Saul London	Data Flow Coverage and the C Language.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF	C
25	Brian Marick	The Weak Mutation Hypothesis.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Thomas J. Ostrand, Elaine J. Weyuker	Data Flow-Based Test Adequacy Analysis for Languages with Pointers.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF	C
25	Douglas L. Long, Lori A. Clarke	Data Flow Analysis of Concurrent Systems that Use the Rendezvous Model of Synchronization.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Evelyn Duesterwald, Mary Lou Soffa	Concurrency Analysis in the Presence of Procedures Using a Data-Flow Framework.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF	DEBUG
25	Andy Podgurski	Reliability, Sampling, and Algorithmic Randomness.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Sriram Sankar	Run-Time Consistency Checking of Algebraic Specifications.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Hemant D. Pande, William Landi	Interprocedural Def-Use Associations in C Programs.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF	C
25	Hiralal Agrawal, Richard A. DeMillo, Eugene H. Spafford	Dynamic Slicing in the Presence of Unconstrained Pointers.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF	DEBUG
25	A. Jefferson Offutt, Stephen D. Lee	How Strong is Weak Mutation?	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Carlo Ghezzi, Richard A. Kennerer	Executing Formal Specifications: The ASTRAL to TRIO Translation Approach.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Phyllis G. Frankl, Stewart N. Weiss	An Experimental Comparison of the Effectiveness of the All-Uses and All-Edges Adequacy Criteria.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Rajiv Gupta 0001, Madalene Spezialetti	Loop Monotonic Computations: An Approach for the Efficient Run-Time Detection of Races.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF	DEBUG
25	George S. Avrunin, Ugo A. Buy, James C. Corbett, Laura K. Dillon, Jack C. Wileden	Experiments with an Improved Constrained Expression Toolset.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	Wei Jen Yeh, Michal Young	Compositional Reachability Analysis Using Process Algebra.	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	William D. Young	Formal Methods versus Software Engineering: Is There a Conflict?	Symposium on Testing, Analysis, and Verification	1991	DBLP DOI BibTeX RDF
25	John H. Rowland, Y. Zuyuan	Experimental Comparison of Three System Test Strategies Preliminary Report.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	George S. Avrunin, Jack C. Wileden, Laura K. Dillon	Experiments in Automated Analysis of Concurrent Software Systems.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	Michal Young, Richard N. Taylor, K. Forester, Debra Brodbeck	Integrated Concurrency Analysis in a Software Development Enviornment.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	Mark Moriconi	A Practical Approach to Semantic Configuration Management.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	Marc J. Balcer, William M. Hasling, Thomas J. Ostrand	Automatic Generation of Test Scripts from Formal Test Specifications.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	Kurt M. Olender, Leon J. Osterweil	Cesar: A Static Sequencing Constraint Analyzer.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	William E. Howden	Validating Programs without Specifications.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	D. Perry	The Logic of Propagation in the Inscape Environment.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	Susan L. Gerhart	Preliminary Summary: FM89 Assessment of Formal Methods for Trustworthy Computer Systems.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
25	William D. Young	Verified Compilation in micro-Gypsy.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF	GYPSY
23	Luay Ho Tahat, Atef Bader, Boris Vaysburg, Bogdan Korel	Requirement-Based Automated Black-Box Test Generation.	COMPSAC	2001	DBLP DOI BibTeX RDF	Selective Testing, Requirements, Regression Testing, System Model, SDL, Black-Box Testing, System Testing, Automated Test Generation, EFSM
23	Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen	Peak-power reduction for multiple-scan circuits during test application.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	peak-power reduction, multiple scan chain based circuits, peak periodicity, peak width, power waveforms, scan-based circuits, delay buffers, interleaving scan technique, data output, logic testing, logic testing, delays, integrated circuit testing, application specific integrated circuits, SOC, boundary scan testing
23	Andy Podgurski, Wassim Masri, Yolanda McCleese, Francis G. Wolff, Charles Yang 0001	Estimation of Software Reliability by Stratified Sampling.	ACM Trans. Softw. Eng. Methodol.	1999	DBLP DOI BibTeX RDF	beta testing, operational testing, software testing, software reliability, cluster analysis, statistical testing, stratified sampling
23	Monika Rauch Henzinger, Michael L. Fredman	Lower Bounds for Fully Dynamic Connectivity Problems in Graphs.	Algorithmica	1998	DBLP DOI BibTeX RDF	Dynamic planarity testing, Dynamic connectivity testing, Dynamic planarity testing, Dynamic connectivity testing, Lower bounds, Lower bounds, Key words, Cell probe model, Cell probe model
23	Antoni Ferré, Joan Figueras	On estimating bounds of the quiescent current for IDDQ testin.	VTS	1996	DBLP DOI BibTeX RDF	quiescent current bounds, sensing circuitry design, VLSI, logic testing, integrated circuit testing, ATPG, automatic testing, CMOS integrated circuits, leakage currents, I/sub DDQ/ testing, CMOS ICs, hierarchical approach
23	Marcello Dalpasso, Michele Favalli, Piero Olivo	Test pattern generation for IDDQ: increasing test quality.	VTS	1995	DBLP DOI BibTeX RDF	ATPG strategy, quiescent power supply current monitoring, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, CMOS logic circuits, I/sub DDQ/ testing
23	Imtiaz P. Shaik, Michael L. Bushnell	Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming .	VTS	1995	DBLP DOI BibTeX RDF	low overhead delay-fault BIST, constrained quadratic 0-1 programming, built-in self testing model, weighted signed graph balancing problem, VLSI, logic testing, delays, built-in self test, integrated circuit testing, logic design, automatic testing, integrated circuit design, quadratic programming, circuit design, digital integrated circuits, hazards and race conditions
23	Tong Liu 0007, Fabrizio Lombardi, José Salinas	Diagnosis of interconnects and FPICs using a structured walking-1 approach.	VTS	1995	DBLP DOI BibTeX RDF	field programmable interconnect chips, structured walking-1 approach, boundary scan architectures, one-step test generation, two-step test generation, fault diagnosis, integrated circuit testing, diagnosis, automatic testing, boundary scan testing, interconnects testing, integrated circuit interconnections
23	Anand Raghunathan, Pranav Ashar, Sharad Malik	Test generation for cyclic combinational circuits.	VLSI Design	1995	DBLP DOI BibTeX RDF	cyclic combinational circuits, bus structures, single-stuck-at fault test pattern, test generation problem, program RAM, fault diagnosis, logic testing, integrated circuit testing, network topology, combinational circuits, automatic testing, fault coverage, test pattern generators, formal analysis, data paths, testing algorithm, combinational logic circuits, untestable faults
23	Pedro de Alcântara dos Santos Neto, Rodolfo F. Resende, Clarindo Isaías Pereira da Silva e Pádua	An evaluation of a model-based testing method for information systems.	SAC	2008	DBLP DOI BibTeX RDF	software testing, model-based testing, testing automation, test requirements
23	Mikhail Auguston, James Bret Michael, Man-tak Shing	Environment behavior models for scenario generation and testing automation.	ACM SIGSOFT Softw. Eng. Notes	2005	DBLP DOI BibTeX RDF	reactive and real time system testing, model-based testing, testing automation
23	Sarfraz Khurshid, Darko Marinov	TestEra: Specification-Based Testing of Java Programs Using SAT.	Autom. Softw. Eng.	2004	DBLP DOI BibTeX RDF	Java testing, TestEra, SAT enumeration, software testing, specification-based testing, Alloy, automated test generation
23	Nashat Mansour, Miran Salame	Data Generation for Path Testing.	Softw. Qual. J.	2004	DBLP DOI BibTeX RDF	genetic algorithms, software testing, simulated annealing, software quality, structural testing, path testing
23	Spyros Tragoudas, N. Denny	Path delay fault testing using test points.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	path delay fault simulation (coverage), testing digital circuits, design for testability, Automatic test pattern generation, delay testing, path delay fault testing
23	Hans G. Kerkhoff, Mustafa Acar	Testable Design and Testing of Micro-Electro-Fluidic Arrays.	VTS	2003	DBLP DOI BibTeX RDF	Multi-domain testing, Microsystem testing, Multi-domain fault modeling & simulation, Design-for-Testability, MEMS testing
23	Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina	At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor.	VTS	2000	DBLP DOI BibTeX RDF	delay testing, at-speed testing, microprocessor testing
23	Aynur Abdurazik, Paul Ammann, Wei Ding 0003, A. Jefferson Offutt	Evaluation of Three Specification-Based Testing Criteria.	ICECCS	2000	DBLP DOI BibTeX RDF	PROBSUBSUMES measure, specification-mutation coverage, full predicate coverage, transition-pair coverage, program testing, specification-based testing, testing criteria, model checker
23	Abhijit Jas, Nur A. Touba	Using an Embedded Processor for Efficient Deterministic Testing of Systems-on-a-Chip.	ICCD	1999	DBLP DOI BibTeX RDF	Test Vector Compression, External Testing, Built-In Self-Test, Embedded Processor, System-on-a-Chip, Automatic Test Equipment, At-Speed Testing, Scan Chains, Deterministic Testing
23	S. Crepaux-Motte, Mireille Jacomino, Rene David	An algebraic method for delay fault testing.	VTS	1996	DBLP DOI BibTeX RDF	input values, output function, robustly testable fault, nonrobustly testable fault, weakly verifiable, fault diagnosis, logic testing, delays, timing, Markov processes, random testing, delay fault testing, state transition, input vectors, algebraic method
23	Fidel Muradali, Janusz Rajski	A self-driven test structure for pseudorandom testing of non-scan sequential circuits.	VTS	1996	DBLP DOI BibTeX RDF	self-driven test structure, primary inputs, nonscan sequential circuits, test point structure, parallel pseudorandom test patterns, test mode flag, stuck-at fault coverage, ISCAS-89 benchmarks, logic testing, built-in self test, integrated circuit testing, design for testability, sequential circuits, BIST, automatic testing, circuit under test
23	Anne E. Gattiker, Wojciech Maly	Current signatures [VLSI circuit testing].	VTS	1996	DBLP DOI BibTeX RDF	VLSI circuit testing, current signature, passive defects, active defects, VLSI, integrated circuit testing, CMOS integrated circuits, I/sub DDQ/ testing
23	Mohamed Soufi, Steve Rochon, Yvon Savaria, Bozena Kaminska	Design and performance of CMOS TSPC cells for high speed pseudo random testing.	VTS	1996	DBLP DOI BibTeX RDF	CMOS TSPC cells, high speed pseudo random testing, built-in self-test scheme, HSpice simulations, functionally equivalent logic block, true single phase clocking, logic testing, built-in self test, integrated circuit testing, logic CAD, layout, circuit analysis computing, clocks, circuit layout CAD, CMOS logic circuits, SPICE, cellular arrays, integrated circuit layout, test methodology, untestable faults, netlists
23	Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu	Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	electron beam testing, multiple fault diagnosis, sensitized paths, EB testing, TP-1, TP-2, TP-3, TP-4, electron-beam tester, internal lines, VLSI, fault diagnosis, logic testing, combinational circuits, combinational circuits, fault location, fault location, stuck-at faults, diagnostic resolution
23	Remata S. Reddy, Irith Pomeranz, Sudhakar M. Reddy, Seiji Kajihara	Compact test generation for bridging faults under IDDQ testing.	VTS	1995	DBLP DOI BibTeX RDF	compact test generation, bit-adders, logic testing, partitioning, integrated circuit testing, fault location, stuck-at faults, CMOS logic circuits, bridging faults, logic partitioning, I/sub DDQ/ testing
23	Wojciech Maly, Marek J. Patyra	Design of ICs applying built-in current testing.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	BIC-testing, Built-in testing, current testing
23	Pankaj Jalote	Testing the Completeness of Specifications.	IEEE Trans. Software Eng.	1989	DBLP DOI BibTeX RDF	completeness testing, VAX system, data structures, Unix, program testing, conformance testing, abstract data types, test cases, axiomatic specifications
23	Simeon C. Ntafos	A Comparison of Some Structural Testing Strategies.	IEEE Trans. Software Eng.	1988	DBLP DOI BibTeX RDF	program testing, program testing, programming theory, structural testing, structured programming
23	Kalpesh Kapoor	Formal Analysis of Coupling Hypothesis for Logical Faults.	Innov. Syst. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Logical fault, Software testing, Mutation testing, Fault-based testing, Boolean specification
23	Chintan Patel, Abhishek Singh 0001, Jim Plusquellic	Defect Detection Using Quiescent Signal Analysis.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing
23	Noëlly Grondin, J. M. Christian Bastien, Blandine Agopian	Les tests utilisateurs: avantages et inconvénients des passations individuelles et par paires.	IHM	2002	DBLP DOI BibTeX RDF	co-discovery, co-participation, constructive interaction, paired-user testing, usability evaluation, usability testing, user testing, interactive TV, usability methods
23	Zahra Sadat Ebadi, André Ivanov	Design of an Optimal Test Access Architecture Using a Genetic Algorithm.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF	Optimal testing time, test data width, Genetic Algorithm, Test Access Mechanism (TAM), SOC testing, Embedded core testing
23	Amit M. Paradkar	SALT - An Integrated Environment to Automate Generation of Function Tests for APIs.	ISSRE	2000	DBLP DOI BibTeX RDF	Test Design Automation, Model Based Testing, Specification-Based Testing, Fault-Based Testing
23	Nancy S. Eickelmann, Debra J. Richardson	An Evaluation of Software Test Environment Architectures.	ICSE	1996	DBLP BibTeX RDF	CITE, CONVEX Integrated Test Environment, PROLOG Test Environment, Version II, PROTest II, Software Architectural Analysis Method, TAOS, Testing with Analysis and Oracle Support, architecturally imposed constraints, environment functions allocation, implementation structures, processing algorithms, software test environment architectures, test development, test failure analysis, test measurement, test process automation, performance, software architecture, programming environments, program testing, software reusability, extensibility, reusability, software performance evaluation, portability, functionality, computer aided software engineering, software portability, testing tools, data representation, reference architecture, modifiability, test management, modifications, test planning, test execution, SAAM
23	Timothy J. Shimeall, Nancy G. Leveson	An Empirical Comparison of Software Fault Tolerance and Fault Elimination.	IEEE Trans. Software Eng.	1991	DBLP DOI BibTeX RDF	fault elimination, run-time assertions, multiversion voting, stepwise abstraction, static data-flow analysis, project resources, fault tolerant computing, software reliability, software reliability, program testing, software fault tolerance, functional testing, structural testing, code reading
23	Jose Pablo Escobedo, Christophe Gaston, Pascale Le Gall, Ana R. Cavalli	Observability and Controllability Issues in Conformance Testing of Web Service Compositions.	TestCom/FATES	2009	DBLP DOI BibTeX RDF	observability and controllability, verdict testing report, Web Service composition, Conformance testing
23	Ru-Gang Xu, Patrice Godefroid, Rupak Majumdar	Testing for buffer overflows with length abstraction.	ISSTA	2008	DBLP DOI BibTeX RDF	length abstractions, underapproximation, buffer overflows, testing c programs, directed testing
23	Abdelghani Benharref, Rachida Dssouli, Mohamed Adel Serhani, Abdeslam En-Nouaary, Roch H. Glitho	New Approach for EFSM-Based Passive Testing of Web Services.	TestCom/FATES	2007	DBLP DOI BibTeX RDF	EFSM-based passive testing, Web Services testing
23	Kevin J. Sullivan, Jinlin Yang, David Coppit, Sarfraz Khurshid, Daniel Jackson 0001	Software assurance by bounded exhaustive testing.	ISSTA	2004	DBLP DOI BibTeX RDF	TestEra, formal methods, reverse engineering, specification-based testing, automated test case generation, bounded exhaustive testing
23	Sebastian Wieczorek, Vitaly Kozyura, Andreas Roth 0001, Michael Leuschel, Jens Bendisposto, Daniel Plagge, Ina Schieferdecker	Applying Model Checking to Generate Model-Based Integration Tests from Choreography Models.	TestCom/FATES	2009	DBLP DOI BibTeX RDF	Service Choreography Models, Model Checking, Formal Methods, Model-based Testing, Integration Testing
23	Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury, Kaushik Roy 0001	Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Enhanced scan, Supply gating, Delay fault testing, Two-pattern testing
23	Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita	Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	At-speed scan testing, Capture switching activity, X-filling, Test cube, ATPG, Low power testing
23	Arilo Claudio Dias Neto, Guilherme Horta Travassos	Surveying model based testing approaches characterization attributes.	ESEM	2008	DBLP DOI BibTeX RDF	software testing, survey, model-based testing, experimental software engineering