Search results for "faults"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
19	Irith Pomeranz, Sudhakar M. Reddy	On test generation by input cube avoidance.	DATE	2007	DBLP DOI BibTeX RDF
19	Bernhard Fechner, Andre Osterloh	Transient Fault Detection in State-Automata.	DepCoS-RELCOMEX	2007	DBLP DOI BibTeX RDF
19	Patrick Ndai, Shih-Lien Lu, Dinesh Somasekhar, Kaushik Roy 0001	Fine-Grained Redundancy in Adders.	ISQED	2007	DBLP DOI BibTeX RDF
19	Ranjani Sridharan, Rabi N. Mahapatra	Analysis of RealTime Embedded Applications in the Presence of a Stochastic Fault Model.	VLSI Design	2007	DBLP DOI BibTeX RDF
19	Danhua Shao, Sarfraz Khurshid, Dewayne E. Perry	Evaluation of Semantic Interference Detection in Parallel Changes: an Exploratory Experiment.	ICSM	2007	DBLP DOI BibTeX RDF
19	María Engracia Gómez, Nils Agne Nordbotten, José Flich, Pedro López 0001, Antonio Robles, José Duato, Tor Skeie, Olav Lysne	A Routing Methodology for Achieving Fault Tolerance in Direct Networks.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	bubble flow control, Fault tolerance, adaptive routing, virtual channels, direct networks
19	Robert Schaefer	A critical programmer searches for professionalism.	ACM SIGSOFT Softw. Eng. Notes	2006	DBLP DOI BibTeX RDF
19	Soyoung Hwang, Yunju Baek	Fault Tolerant Time Synchronization for Wireless Sensor Networks.	ARCS	2006	DBLP DOI BibTeX RDF
19	Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato	A dynamic test compaction procedure for high-quality path delay testing.	ASP-DAC	2006	DBLP DOI BibTeX RDF
19	Damien Masson, Serge Midonnet	Fault tolerance with real-time Java.	IPDPS	2006	DBLP DOI BibTeX RDF
19	Juan Li, Gong-You Tang, Hong-Wei Gao	Fault Detection and Self-Restore Control for Linear Systems.	ISDA (1)	2006	DBLP DOI BibTeX RDF
19	Pan Zhongliang, Chen Ling, Liu Shouqiang, Guangzhao Zhang	Neural Network Approach for Multiple Fault Test of Digital Circuit.	ISDA (3)	2006	DBLP DOI BibTeX RDF
19	Wenjun Li, Yuanchun Li	A Method of Abrupt Sensor Fault Diagnosis.	ISDA (1)	2006	DBLP DOI BibTeX RDF
19	Frank Olaf Sem-Jacobsen, Tor Skeie, Olav Lysne, José Duato	Dynamic Fault Tolerance with Misrouting in Fat Trees.	ICPP	2006	DBLP DOI BibTeX RDF
19	Toshinori Sato, Akihiro Chiyonobu	Evaluating the Impact of Fault Recovery on Superscalar Processor Performance.	PRDC	2006	DBLP DOI BibTeX RDF
19	Shiyi Xu	A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing.	PRDC	2006	DBLP DOI BibTeX RDF	Software Testing, Mutation Testing, Testing Effectiveness, Fault Equivalence, Fault Dominance
19	N. Venkateswaran 0002, S. Balaji, V. Sridhar	Fault tolerant bus architecture for deep submicron based processors.	SIGARCH Comput. Archit. News	2005	DBLP DOI BibTeX RDF	deep submicron technology, fault tolerance, interconnect, electromigration
19	Lee-Juan Fan, Chang-Biau Yang, Shyue-Horng Shiau	Routing Algorithms on the Bus-Based Hypercube Network.	IEEE Trans. Parallel Distributed Syst.	2005	DBLP DOI BibTeX RDF	Multiple-bus network, fault tolerance, hypercube, routing algorithm, diameter
19	Jerker Hammarberg, Simin Nadjm-Tehrani	Formal verification of fault tolerance in safety-critical reconfigurable modules.	Int. J. Softw. Tools Technol. Transf.	2005	DBLP DOI BibTeX RDF	Fault tolerance, FPGA, Formal verification, Safety analysis, Esterel
19	Fred A. Bower, Sule Ozev, Daniel J. Sorin	Autonomic Microprocessor Execution via Self-Repairing Arrays.	IEEE Trans. Dependable Secur. Comput.	2005	DBLP DOI BibTeX RDF	Logic design reliability and testing, microprocessors and microcomputers
19	Elizabeth Latronico, Philip Koopman	Design Time Reliability Analysis of Distributed Fault Tolerance Algorithms.	DSN	2005	DBLP DOI BibTeX RDF
19	Mohammad Tanvir Huda, Heinz W. Schmidt, Ian D. Peake	An Agent Oriented Proactive Fault-Tolerant Framework for Grid Computing.	e-Science	2005	DBLP DOI BibTeX RDF
19	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy	Fault Diagnosis and Fault Model Aliasing.	ISVLSI	2005	DBLP DOI BibTeX RDF
19	Santosh Biswas, P. Srikanth, R. Jha, Siddhartha Mukhopadhyay, Amit Patra, Dipankar Sarkar 0001	On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
19	Sandip Bapat, Vinodkrishnan Kulathumani, Anish Arora	Analyzing the Yield of ExScal, a Large-Scale Wireless Sensor Network Experiment.	ICNP	2005	DBLP DOI BibTeX RDF
19	Paulo Sousa 0001, Nuno Ferreira Neves, Paulo Veríssimo	Resilient State Machine Replication.	PRDC	2005	DBLP DOI BibTeX RDF
19	Reza Asgary, Karim Mohammadi	Analog Fault Detection Using a Neuro Fuzzy Pattern Recognition Method.	ICANN (2)	2005	DBLP DOI BibTeX RDF
19	Ching-Tien Ho, Larry J. Stockmeyer	A New Approach to Fault-Tolerant Wormhole Routing for Mesh-Connected Parallel Computers.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF	performance evaluation, parallel computing, wormhole routing, mesh networks, Fault-tolerant routing
19	Jan Lunze, Jochen Schröder	Sensor and actuator fault diagnosis of systems with discrete inputs and outputs.	IEEE Trans. Syst. Man Cybern. Part B	2004	DBLP DOI BibTeX RDF
19	Lars-Ola Damm, Lars Lundberg, Claes Wohlin	Determining the Improvement Potential of a Software Development Organization Through Fault Analysis: A Method and a Case Study.	EuroSPI	2004	DBLP DOI BibTeX RDF
19	Nikhil Joshi, Kaijie Wu 0001, Ramesh Karri	Concurrent Error Detection Schemes for Involution Ciphers.	CHES	2004	DBLP DOI BibTeX RDF	Involutional ciphers, KHAZAD, Fault Tolerance, Concurrent Error Detection (CED)
19	Jun Zhao 0005, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park	Maximal diagnosis of interconnects of random access memories.	IEEE Trans. Reliab.	2003	DBLP DOI BibTeX RDF
19	Guido Bertoni, Luca Breveglieri, Israel Koren, Paolo Maistri, Vincenzo Piuri	Error Analysis and Detection Procedures for a Hardware Implementation of the Advanced Encryption Standard.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	parity codes, fault tolerance, fault detection, Advanced Encryption Standard, AES
19	João Durães, Henrique Madeira	Definition of Software Fault Emulation Operators: A Field Data Study.	DSN	2003	DBLP DOI BibTeX RDF
19	Saravanan Padmanaban, Spyros Tragoudas	Non-Enumerative Path Delay Fault Diagnosis .	DATE	2003	DBLP DOI BibTeX RDF
19	Yunzhan Gong, Wanli Xu, Xiaowei Li 0001	An Expression's Single Fault Model and the Testing Methods.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
19	Michael R. Lyu, Zubin Huang, Sam K. S. Sze, Xia Cai	An Empirical Study on Testing and Fault Tolerance for Software Reliability Engineering.	ISSRE	2003	DBLP DOI BibTeX RDF	data flow coverage testing, empirical study, software fault tolerance, mutation testing
19	Vinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis	SIFU! - A Didactic Stuck-at Fault Simulator.	MSE	2003	DBLP DOI BibTeX RDF
19	Pedro Yuste, Juan-Carlos Ruiz-Garcia, Lenin Lemus, Pedro J. Gil	Non-intrusive Software-Implemented Fault Injection in Embedded Systems.	LADC	2003	DBLP DOI BibTeX RDF
19	Rajesh Venkatasubramanian, John P. Hayes, Brian T. Murray	Low-Cost On-Line Fault Detection Using Control Flow Assertions.	IOLTS	2003	DBLP DOI BibTeX RDF
19	Allen P. Nikora, John C. Munson	Understanding the Nature of Software Evolution.	ICSM	2003	DBLP DOI BibTeX RDF
19	Der-Cheng Huang, Wen-Ben Jone	A parallel transparent BIST method for embedded memory arrays bytolerating redundant operations.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2002	DBLP DOI BibTeX RDF
19	Michiko Inoue, Emil Gizdarski, Hideo Fujiwara	Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	internally balanced structure, test generation, sequential circuit, combinational circuit, balanced structure
19	Scott F. Kaplan, Lyle A. McGeoch, Megan F. Cole	Adaptive caching for demand prepaging.	MSP/ISMM	2002	DBLP DOI BibTeX RDF	block paging, prepaging, clustering, adaptive caching
19	Giuliano Antoniol, Lionel C. Briand, Massimiliano Di Penta, Yvan Labiche	A Case Study Using the Round-Trip Strategy for State-Based Class Testing.	ISSRE	2002	DBLP DOI BibTeX RDF
19	Yu-Seung Ma, Yong Rae Kwon, Jeff Offutt	Inter-Class Mutation Operators for Java.	ISSRE	2002	DBLP DOI BibTeX RDF
19	Volkmar Sieh, Kerstin Buchacker	UMLinux - A Versatile SWIFI Tool.	EDCC	2002	DBLP DOI BibTeX RDF
19	Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita	On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout.	ITC	2002	DBLP DOI BibTeX RDF
19	Kamran Zarrineh, Shambhu J. Upadhyaya, Sreejit Chakravarty	Automatic generation and compaction of March tests for memory arrays.	IEEE Trans. Very Large Scale Integr. Syst.	2001	DBLP DOI BibTeX RDF
19	Pankaj Pant, Yuan-Chieh Hsu, Sandeep K. Gupta 0001, Abhijit Chatterjee	Path delay fault diagnosis in combinational circuits with implicitfault enumeration.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2001	DBLP DOI BibTeX RDF
19	Jun-Weir Lin, Chung-Len Lee 0001, Chauchin Su, Jwu E. Chen	Fault Diagnosis for Linear Analog Circuits.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	diagnosing evaluators, un-powered network, fault diagnosis, signal flow graph
19	Seo-Lim Park, Seung-Won Lee, In-Hwan Kim, Ki-Dong Chung	Server Switching and Flow Control: Supporting Fault Tolerant Playout of Videos in a VoD System.	ICME	2001	DBLP DOI BibTeX RDF
19	Irith Pomeranz, Sudhakar M. Reddy	On synchronizable circuits and their synchronizing sequences.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
19	Jue Wu, Elizabeth M. Rudnick	Bridge fault diagnosis using stuck-at fault simulation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
19	Jian Liu, Rafic Z. Makki, Ayman I. Kayssi	Dynamic Power Supply Current Testing of CMOS SRAMs.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	transient power supply current (i DDT), transient current sensor, disturb fault, CMOS SRAM
19	Ravishankar K. Iyer, Zbigniew Kalbarczyk, Mahesh Kalyanakrishnan	Measurement-based Analysis of Networked System Availability.	Performance Evaluation	2000	DBLP DOI BibTeX RDF
19	Laurence Goodby, Alex Orailoglu	Test Quality and Fault Risk in Digital Filter Datapath BIST.	DATE	2000	DBLP DOI BibTeX RDF
19	Rostislav Caha, Petr Gregor	Embedding Fibonacci Cubes into Hypercubes with Omega(2cn) Faulty Nodes.	MFCS	2000	DBLP DOI BibTeX RDF
19	Parag K. Lala, Alvernon Walker	An On-Line Reconfigurable FPGA Architecture.	DFT	2000	DBLP DOI BibTeX RDF
19	Hans Hansson, Christer Norström, Sasikumar Punnekkat	Reliability Modelling of Time-Critical Distributed Systems.	FTRTFT	2000	DBLP DOI BibTeX RDF
19	László Kovács, Gábor Terstyánszky	Boundary Region Sensitive Classification for the Counterpropagation Neural Network.	IJCNN (1)	2000	DBLP DOI BibTeX RDF	neural networks, classification, fault diagnosis, uncertainty, learning algorithms
19	Timothy K. Tsai, Mei-Chen Hsueh, Hong Zhao, Zbigniew Kalbarczyk, Ravishankar K. Iyer	Stress-Based and Path-Based Fault Injection.	IEEE Trans. Computers	1999	DBLP DOI BibTeX RDF	stress-based, path-based, program flow, fault tolerance, dependability, Fault injection, workload
19	Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich	Analog testing by characteristic observation inference.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
19	Zbigniew Kalbarczyk, Ravishankar K. Iyer, Gregory L. Ries, Jaqdish U. Patel, Myeong S. Lee, Yuxiao Xiao	Hierarchical Simulation Approach to Accurate Fault Modeling for System Dependability Evaluation.	IEEE Trans. Software Eng.	1999	DBLP DOI BibTeX RDF	Hierarchical simulation, accurate fault modeling, dependability evaluation, fault dictionaries
19	Ronald J. Hayne, Barry W. Johnson	Behavioral Fault Modeling in a VHDL Synthesis Environment.	VTS	1999	DBLP DOI BibTeX RDF
19	Michel Cukier, Ramesh Chandra, David Henke, Jessica Pistole, William H. Sanders	Fault Injection based on a Partial View of the Global State of a Distributed System.	SRDS	1999	DBLP DOI BibTeX RDF
19	Adam A. Porter, Lawrence G. Votta	Comparing Detection Methods For Software Requirements Inspections: A Replication Using Professional Subjects.	Empir. Softw. Eng.	1998	DBLP DOI BibTeX RDF	replication, inspection, controlled experiment
19	João Carreira, Henrique Madeira, João Gabriel Silva	Xception: A Technique for the Experimental Evaluation of Dependability in Modern Computers.	IEEE Trans. Software Eng.	1998	DBLP DOI BibTeX RDF	real time, Fault injection, dependability evaluation, RISC processors
19	Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-Sadowska, Mike Tien-Chien Lee	Functional Scan Chain Testing.	DATE	1998	DBLP DOI BibTeX RDF	functional scan chain, alternating sequence, scan chain testing, design for testability, test point insertion
19	Michael S. Hsiao, Srimat T. Chakradhar	Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
19	Jian Liu, Rafic Z. Makki, Ayman I. Kayssi	Dynamic Power Supply Current Testing of SRAMs.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
19	Kamran Zarrineh, Shambhu J. Upadhyaya, Sreejit Chakravarty	A new framework for generating optimal March tests for memory arrays.	ITC	1998	DBLP DOI BibTeX RDF
19	Hyung Ki Lee, Dong Sam Ha	HOPE: an efficient parallel fault simulator for synchronous sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
19	Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal	Functional test generation for synchronous sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
19	Naotake Kamiura, Yutaka Hata, Kazuharu Yamato	On Design of Fail-Safe Cellular Arrays.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	fail-safe logic system, Binary Decision Diagram and switch cell, cellular array
19	Ghassan Al Hayek, Chantal Robach	On the Adequacy of Deriving Hardware Test Data from the Behavioral Specification.	EUROMICRO	1996	DBLP DOI BibTeX RDF	hardware test data, behavioral fault modeling, gate-level strategies, high-level fault detection, gate-level fault detection, design automation tools, generated test set, gate-level fault coverage, hardware description languages, hardware description languages, behavioral specification
19	S. Crepaux-Motte, Mireille Jacomino, Rene David	An algebraic method for delay fault testing.	VTS	1996	DBLP DOI BibTeX RDF	input values, output function, robustly testable fault, nonrobustly testable fault, weakly verifiable, fault diagnosis, logic testing, delays, timing, Markov processes, random testing, delay fault testing, state transition, input vectors, algebraic method
19	Bethany Man-Yee Chan, Francis Y. L. Chin, Chung Keung Poon	Optimal Simulation of Full Binary Trees on Faulty Hypercubes.	IEEE Trans. Parallel Distributed Syst.	1995	DBLP DOI BibTeX RDF
19	Cinzia Bernardeschi, Alessandro Fantechi, Luca Simoncini	Formal Reasoning on Fault Coverage of Fault Tolerant Techniques: A Case Study.	EDCC	1994	DBLP DOI BibTeX RDF
19	W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana	Faulty behavior of storage elements and its effects on sequential circuits.	IEEE Trans. Very Large Scale Integr. Syst.	1993	DBLP DOI BibTeX RDF
19	Paris C. Kanellakis, Dimitrios Michailidis, Alexander A. Shvartsman	Controlling Memory Access Concurrency in Efficient Fault-Tolerant Parallel Algorithms (Extended Abstract).	WDAG	1993	DBLP DOI BibTeX RDF
19	Antonio Lioy	Advanced Fault Collapsing (Logic Circuits Testing).	IEEE Des. Test Comput.	1992	DBLP DOI BibTeX RDF
19	Michael Demjanenko, Shambhu J. Upadhyaya	Yield enhancement of field programmable logic arrays by inherent component redundancy.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
19	Danny Dolev, Rüdiger Reischuk, H. Raymond Strong	Early Stopping in Byzantine Agreement	J. ACM	1990	DBLP DOI BibTeX RDF
19	Charles H. Stapper	Simulation of spatial fault distributions for integrated circuit yield estimations.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1989	DBLP DOI BibTeX RDF
19	A. Jefferson Offutt	The Coupling Effect: Fact or Fiction.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
19	Irith Pomeranz, Sudhakar M. Reddy	Identifying Tests for Logic Fault Models Involving Subsets of Lines without Fault Enumeration.	VLSI Design	2010	DBLP DOI BibTeX RDF	interconnect open faults, test generation, bridging faults, static test compaction
19	Nicola Campregher, Peter Y. K. Cheung, George A. Constantinides, Milan Vasilko	Analysis of yield loss due to random photolithographic defects in the interconnect structure of FPGAs.	FPGA	2005	DBLP DOI BibTeX RDF	FPGA redundancy, interconnect faults, fault tolerance, yield enhancement, interconnect model, yield prediction, catastrophic faults, FPGA interconnect
19	M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor	Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume.	ITC	2002	DBLP DOI BibTeX RDF	compact test sets, ATPG, fault coverage, stuck-at faults, test length, Test point insertion, gate-delay faults
19	Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas	Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	statistical fault analysis, fault simulation, delay test, path-delay faults, transition faults
19	Michael Nicolaidis	Theory of Transparent BIST for RAMs.	IEEE Trans. Computers	1996	DBLP DOI BibTeX RDF	RAM test algorithms, transparent BIST, BIST, signature analysis, pattern sensitive faults, coupling faults
19	Irith Pomeranz, Sudhakar M. Reddy	On Removing Redundancies from Synchronous Sequential Circuits with Synchronizing Sequences.	IEEE Trans. Computers	1996	DBLP DOI BibTeX RDF	partially detectable faults, synchronous sequential circuits, redundant faults, redundancy removal, synchronizing sequences, Fault removal
19	Daniel J. Kleitman, Frank Thomson Leighton, Yuan Ma	On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates	FOCS	1994	DBLP DOI BibTeX RDF	reliable Boolean circuits design, partially unreliable gates, gate failure, short-circuit model, von Neumann model, worst-case faults, post-test alterations, tight bound, random faults, fault-tolerant circuits
19	Rohit Kapur, M. Ray Mercer	Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes.	IEEE Trans. Computers	1992	DBLP DOI BibTeX RDF	bounding algorithm, circuit faults, conditional syndromes, auxiliary gate, pseudorandom pattern resistant faults, circuit structure, computational complexity, lower bounds, built-in self test, integrated circuit testing, circuit analysis computing, signal probabilities, testability measurement, random pattern testability
19	Thyagaraju R. Damarla	Generalized Transforms for Multiple Valued Circuits and Their Fault Detection.	IEEE Trans. Computers	1992	DBLP DOI BibTeX RDF	generalised transforms, simple transforms, multiple value network, multiple valued circuits, spectral coefficients, VLSI, transforms, fault detection, upper bound, fault location, stuck at faults, many-valued logics, bridging faults, logic circuits, multiple valued functions, test patterns, test set generation, canonical representation, radix
19	Xiaoqing Wen, Kozo Kinoshita	A Testable Design of Logic Circuits under Highly Observable Condition.	IEEE Trans. Computers	1992	DBLP DOI BibTeX RDF	highly observable condition, fault tolerant computing, logic testing, integrated circuit testing, combinational circuit, stuck-at faults, logic circuits, integrated logic circuits, combinatorial circuits, stuck-open faults, testable design
19	T. Raju Damarla, Mark G. Karpovsky	Fault Detection in Combinational Networks by Reed-Muller Transforms.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	single bridging faults, computational complexity, logic testing, test generation, fault detection, time complexity, upper bound, combinatorial circuits, combinational networks, test patterns, Reed-Muller transforms, multiple stuck-at-faults
19	Kang G. Shin, Parameswaran Ramanathan	Transmission Delays in Hardware Clock Synchronization.	IEEE Trans. Computers	1988	DBLP DOI BibTeX RDF	hardware clock synchronization, malicious faults, delays, synchronisation, clocks, Byzantine faults, transmission delays, time overhead, clock signals
19	Israel Koren, Zahava Koren, Stephen Y. H. Su	Analysis of a Class of Recovery Procedures.	IEEE Trans. Computers	1986	DBLP DOI BibTeX RDF	program rollback, error recovery procedures, Checkpoint, intermittent faults, permanent faults, instruction retry, error latency
19	Dimitris Nikolos, Nikolaos Gaitanis, George Philokyprou	Systematic t-Error Correcting/All Unidirectional Error Detecting Codes.	IEEE Trans. Computers	1986	DBLP DOI BibTeX RDF	parity check codes, t-EC/AUED codes, error detection, error correction, transient faults, unidirectional errors, permanent faults, Concatenated codes, symmetric errors