Search results for "scan"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
24	Dilip K. Bhavsar	Scan Wheel - A Technique for Interfacing a High Speed Scan-Path with a Slow Speed Tester.	VTS	2001	DBLP DOI BibTeX RDF
21	Raghavendra Adiga, Gandhi Arpit, Virendra Singh, Kewal K. Saluja, Hideo Fujiwara, Adit D. Singh	On Minimization of Test Application Time for RAS.	VLSI Design	2010	DBLP DOI BibTeX RDF	Random Access Scan (RAS), DFT, Scan Design
21	Nick Montfort, Ian Bogost	Random and Raster: Display Technologies and the Development of Videogames.	IEEE Ann. Hist. Comput.	2009	DBLP DOI BibTeX RDF	arcade games, cathode-ray tube displays, random scan displays, raster scan displays, History of computing, videogames, porting, vector graphics
21	Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero	An evolutionary algorithm for reducing integrated-circuit test application time.	SAC	2002	DBLP DOI BibTeX RDF	interleaved-scan, test, evolutionary algorithm, computer aided design, full-scan
21	Jacob Savir, Robert F. Berry	AC strength of a pattern generator.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	AC test, level sensitive scan design, test pattern generator, scan path
21	Mauro Negri, Giuseppe Pelagatti	Distributive Join: A New Algorithm for Joining Relations.	ACM Trans. Database Syst.	1991	DBLP DOI BibTeX RDF	merging scan, nested scan, sort, hashing, buffer, join
21	P. Golan, Ondrej Novák, Jan Hlavicka	Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage.	IEEE Trans. Computers	1988	DBLP DOI BibTeX RDF	pseudoexhaustive test pattern generation, random access scan, scan addresses, logic testing, integrated circuit testing, feedback, linear feedback shift registers, shift registers
21	Sophie Stellmach, Lennart E. Nacke, Raimund Dachselt	Advanced gaze visualizations for three-dimensional virtual environments.	ETRA	2010	DBLP DOI BibTeX RDF	attentional maps, gaze visualizations, virtual environments, eye tracking, eye movements, three-dimensional, scan paths
21	Irith Pomeranz, Sudhakar M. Reddy	State persistence: a property for guiding test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	broadside tests, test generation, transition faults, scan-based tests
21	Minoru Nakayama, Yosiyuki Takahasi	Estimation of certainty for responses to multiple-choice questionnaires using eye movements.	ACM Trans. Multim. Comput. Commun. Appl.	2008	DBLP DOI BibTeX RDF	scan-path analysis, support vector machines, Eye-movements, certainty
21	Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury, Kaushik Roy 0001	Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Enhanced scan, Supply gating, Delay fault testing, Two-pattern testing
21	Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham, Manuel A. d'Abreu	Controllability of Static CMOS Circuits for Timing Characterization.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Design for test, Delay fault testing, Scan design
21	Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu	VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF	combinational broadcaster, combinational compactor, fault diagnosis, ATPG, test compression, low-power testing, scan testing
21	Yu Cao 0004, Gopal C. Das, Chee Yong Chan, Kian-Lee Tan	Optimizing complex queries with multiple relation instances.	SIGMOD Conference	2008	DBLP DOI BibTeX RDF	interleaved execution, shared scan, query processing, query optimization
21	Sushmita Mitra, Bishal Barman	Rough-Fuzzy Clustering: An Application to Medical Imagery.	RSKT	2008	DBLP DOI BibTeX RDF	Rough-fuzzy clustering, CT scan imaging, image segmentation, cluster validation
21	Hiroaki Kikuchi, Naoya Fukuno, Tomohiro Kobori, Masato Terada, Tangtisanon Pikulkaew	Automated Classification of Port-Scans from Distributed Sensors.	AINA	2008	DBLP DOI BibTeX RDF	classification, sensor, port-scan
21	Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai	X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	on-chip collection of test data, selective compaction of test responses, fault diagnosis, DFT, embedded test, scan-based designs
21	Juha Havukumpu, Jukka Häkkinen, Eija Grönroos, Pia Vähäkangas, Göte Nyman	Comparing Two Head-Mounted Displays in Ultrasound Scanning.	HCI (2)	2007	DBLP DOI BibTeX RDF	monocular display, see-through display, ultrasound scan, user experience, Head-mounted displays
21	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Test response compactor with programmable selector.	DAC	2006	DBLP DOI BibTeX RDF	scan chain selection, unknown states, compression, VLSI test
21	Scott Davidson 0001	BIST the hard way.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	N-detection, scan BIST, built-in self-test, logic, IC, mixed-signal BIST
21	Mário Zenha Rela, João Carlos Cunha, Carlos Bruno Silva, Luís Ferreira da Silva	On the Effects of Errors During Boot.	LADC	2005	DBLP DOI BibTeX RDF	fault-tolerance, embedded systems, fault-injection, boundary-scan, dependability evaluation
21	Kaustav Das, Andrew W. Moore 0001, Jeff G. Schneider	Belief state approaches to signaling alarms in surveillance systems.	KDD	2004	DBLP DOI BibTeX RDF	scan statistic, signaling alarms, probabilistic model, surveillance systems
21	Vijay S. Iyengar	On detecting space-time clusters.	KDD	2004	DBLP DOI BibTeX RDF	space-time region, clusters, search, Monte Carlo, spatial scan statistic
21	Frank te Beest, Kees van Berkel 0001, Ad M. G. Peeters	Adding Synchronous and LSSD Modes to Asynchronous Circuits.	ASYNC	2002	DBLP DOI BibTeX RDF	design for testability, asynchronous circuits, scan test, LSSD
21	Sergei Gorlatch	Toward Formally-Based Design of Message Passing Programs.	IEEE Trans. Software Eng.	2000	DBLP DOI BibTeX RDF	systematic program design, maximum segment sum, MPI, Message passing, program transformations, skeletons, reduction, scan, homomorphisms, collective operations
21	Wu-Tung Cheng	Current status and future trend on CAD tools for VLSI testing Wu-Tung Cheng.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	test logic, deep Sub-Micron technologies, scan-based ATPG, test application cost, test development, VLSI, CAD, logic testing, built-in self test, system on chip, SoC, automatic test pattern generation, automatic test pattern generation, ATPG, BIST, VLSI design, integrated circuit design, circuit CAD, VLSI testing, embedded memories, test quality, integrated circuit economics
21	Marie-Lise Flottes, Christian Landrault, A. Petitqueux	Design for sequential testability: an internal state reseeding approach for 100 % fault coverage.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	sequential testability, internal state reseeding, observation points, minimum DFT insertion, non-scan approach, fault efficiency, 100 percent, fault diagnosis, logic testing, controllability, controllability, design for testability, logic design, sequential circuits, automatic test pattern generation, ATPG, observability, fault coverage, flip-flops, at-speed testing, benchmark circuits, CPU time, partial reset
21	Ella Barkan, Dan Gordon 0001	The scanline principle: efficient conversion of display algorithms into scanline mode.	Vis. Comput.	1999	DBLP DOI BibTeX RDF	Critical-points, BSP trees, Z-buffer, Hidden surface removal, Scan conversion, Scanline
21	Feng Lu 0001, Evangelos E. Milios	Robot Pose Estimation in Unknown Environments by Matching 2D Range Scans.	J. Intell. Robotic Syst.	1997	DBLP DOI BibTeX RDF	robot pose estimation, aligning scans, rotation search, reference scan
21	D. B. Hillis	Using a Genetic Algorithm for Multi-Hypothesis Tracking.	ICTAI	1997	DBLP DOI BibTeX RDF	multi-hypothesis tracking, multi-scan assignment problem, continuous mode, genetic algorithm, target tracking, fitness landscape, scheduling problem, greedy heuristic, multitarget tracking, hypotheses
21	Claudio Costi, Micaela Serra, Donatella Sciuto	A new DFT methodology for sequential circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	design for testability, ATPG, fault coverage, scan design, test application time
21	Sujit Dey, Srimat T. Chakradhar	Design of testable sequential circuits by repositioning flip-flops.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	cycle-breaking, flip-flop minimization, sequential redundancy, design for testability, sequential circuits, retiming, partial scan, strongly connected components, redundant fault
21	Hakim Bederr, Michael Nicolaidis, Alain Guyot	Analytic approach for error masking elimination in on-line multipliers.	IEEE Symposium on Computer Arithmetic	1995	DBLP DOI BibTeX RDF	error masking elimination, online multipliers, high precision numbers, scan design approach, internal state observability, DFT approach, sequential circuits, digital arithmetic, fault coverage, multiplying circuits, area overhead
21	Nadime Zacharia, Janusz Rajski, Jerzy Tyszer	Decompression of test data using variable-length seed LFSRs.	VTS	1995	DBLP DOI BibTeX RDF	test data decompression, variable-length seed LFSRs, deterministic test vectors, scan circuits, multiple polynomial LFSR, encoding efficiency, logic testing, built-in self test, integrated circuit testing, encoding, automatic testing, polynomials, linear feedback shift register, shift registers, modular design, digital integrated circuits
21	Ling Tony Chen, Larry S. Davis, Clyde P. Kruskal	Efficient Parallel Processing of Image Contours.	IEEE Trans. Pattern Anal. Mach. Intell.	1993	DBLP DOI BibTeX RDF	EREW model, CREW PRAM model, segmented scan operations, computer vision, computer vision, parallel algorithms, parallel algorithms, computational complexity, image processing, parallel processing, parallel processing, hypercube, hypercube networks, image contours, Connection Machine
20	Jinliang Li, Jihua Bao, Yan Yu	Study on the Localization for a Rescue Robot Based on Laser Scan Matching.	MVHI	2010	DBLP DOI BibTeX RDF	Scan match-ing, Normal distribution transform, Robot localization, Rescue robots
20	Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya	A Unified Solution to Scan Test Volume, Time, and Power Minimization.	VLSI Design	2010	DBLP DOI BibTeX RDF	Test power minimization, Test time reduction, Test data reduction, Nonlinear scan
20	Siddhartha Datta, Ron Sass	Scalability Studies of the BLASTn Scan and Ungapped Extension Functions.	ReConFig	2009	DBLP DOI BibTeX RDF	Ungapped Extension, FPGA, Reconfiguration, mathematical model, Scan, BLAST
20	Yu Zhang 0036, Binxing Fang	A Novel Approach to Scan Detection on the Backbone.	ITNG	2009	DBLP DOI BibTeX RDF	Real time port scan detection, Flow size distribution entropy, Sequential hypothesis testing, IP backbone monitoring, Port scanning
20	Xiaoguang Tian, Yuke Ma, Xiaorong Hou	A New Scan-Line Algorithm Using Clustering Approach.	HIS (2)	2009	DBLP DOI BibTeX RDF	scan-line algorithm, recognition of the lines, recovery of the lines, clustering algorithm, particle swarm optimization (PSO)
20	Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja	A Capture-Safe Test Generation Scheme for At-Speed Scan Testing.	ETS	2008	DBLP DOI BibTeX RDF	At-Speed Scan Testing, Test Relaxation, X-Filling, Capture Mode, Yield Loss
20	Seongmoon Wang, Wenlong Wei	Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns.	ETS	2008	DBLP DOI BibTeX RDF	Transition delay fault, broadside, skewed-load, enhanced scan
20	Irith Pomeranz, Sudhakar M. Reddy	On Generating Tests that Avoid the Detection of Redundant Faults in Synchronous Sequential Circuits with Full Scan.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	overtesting, test generation, Design-for-testability, synchronous sequential circuits, redundant faults, full-scan, fault dominance
20	Octavian Petre, Hans G. Kerkhoff	Scan Test Strategy for Asynchronous-Synchronous Interfaces.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	globally asynchronous locally synchronous (GALS), asynchronous synchronous interface, synchronizers, scan test
20	Irith Pomeranz	On the generation of scan-based test sets with reachable states for testing under functional operation conditions.	DAC	2004	DBLP DOI BibTeX RDF	functional tests, scan design, reachable states
20	John Jing-Fu Jenq	Parallel Polygon Scan Conversion on Hypercube Multiprocessors.	SAC	1999	DBLP DOI BibTeX RDF	polygon scan conversion, parallel algorithms, computer graphics, hypercube algorithms
20	Sei-ichiro Kamata, Yukihiro Bandoh	An Address Generator of a Pseudo-Hilbert Scan in a Rectangle Region.	ICIP (1)	1997	DBLP DOI BibTeX RDF	pseudo-Hilbert scan, rectangle region, space filing curves, nonrecursive algorithm, image processing, image compression, experimental results, hardware implementation, lookup tables, Hilbert spaces, Hilbert curve, address generator
20	Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.	VTS	1997	DBLP DOI BibTeX RDF	semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing
20	Prashant J. Shenoy, Harrick M. Vin	Efficient Support for Scan Operations in Video Servers.	ACM Multimedia	1995	DBLP DOI BibTeX RDF	video servers, disk arrays, scan operations
20	Allan L. Fisher, Peter T. Highnam	Computing the Hough Transform on a Scan Line Array Processor (Image Processing).	IEEE Trans. Pattern Anal. Mach. Intell.	1989	DBLP DOI BibTeX RDF	scan line array processor, parallel algorithm, parallel algorithms, image processing, transforms, computerised picture processing, computerised picture processing, SIMD, Hough transform, digital signal processing chips, linear arrays, vector processing
20	Kewal K. Saluja, Ramaswami Dandapani	An Alternative to Scan Design Methods for Sequential Machines.	IEEE Trans. Computers	1986	DBLP DOI BibTeX RDF	Built-in self test, sequential machines, scan design, checking experiments, testable design
20	Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu	An Improved Soft-Error Rate Measurement Technique.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2009	DBLP DOI BibTeX RDF
20	Peder E. Z. Larson, Paul T. Gurney, Dwight G. Nishimura	Anisotropic Field-of-Views in Radial Imaging.	IEEE Trans. Medical Imaging	2008	DBLP DOI BibTeX RDF
20	Daniel Flores-Tapia, Gabriel Thomas, Stephen Pistorius	A Wavefront Reconstruction Method for 3-D Cylindrical Subsurface Radar Imaging.	IEEE Trans. Image Process.	2008	DBLP DOI BibTeX RDF
20	Tian Chen, Huaguo Liang, Minsheng Zhang, Wei Wang 0310	A Scheme of Test Pattern Generation Based on Reseeding of Segment-Fixing Counter.	ICYCS	2008	DBLP DOI BibTeX RDF
20	Sam S. Stone, Justin P. Haldar, Stephanie C. Tsao, Wen-mei W. Hwu, Zhi-Pei Liang, Bradley P. Sutton	Accelerating advanced mri reconstructions on gpus.	Conf. Computing Frontiers	2008	DBLP DOI BibTeX RDF	gpu computing, mri, reconstruction, gpgpu, cuda
20	Uvais Qidwai, Mohammed Maqbool	On hybrid-fuzzy classifier design: An empirical modeling scenario for corrosion detection in gas pipelines.	AICCSA	2008	DBLP DOI BibTeX RDF
20	Inas Khalifa, Rodney G. Vaughan	Optimal Configuration of Multi-Faceted Phased Arrays for Wide Angle Coverage.	VTC Spring	2007	DBLP DOI BibTeX RDF
20	Ran Gal, Ariel Shamir, Tal Hassner, Mark Pauly, Daniel Cohen-Or	Surface reconstruction using local shape priors.	Symposium on Geometry Processing	2007	DBLP DOI BibTeX RDF
20	Rubil Ahmadi	A Hold Friendly Flip-Flop For Area Recovery.	ISCAS	2007	DBLP DOI BibTeX RDF
20	Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Zainalabedin Navabi	Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Mode.	DFT	2007	DBLP DOI BibTeX RDF
20	Kedarnath J. Balakrishnan, Nur A. Touba	Improving Linear Test Data Compression.	IEEE Trans. Very Large Scale Integr. Syst.	2006	DBLP DOI BibTeX RDF
20	Renato Villán, Sviatoslav Voloshynovskiy, Oleksiy J. Koval, Thierry Pun	Multilevel 2-D Bar Codes: Toward High-Capacity Storage Modules for Multimedia Security and Management.	IEEE Trans. Inf. Forensics Secur.	2006	DBLP DOI BibTeX RDF
20	Ying Zhang 0001, Xuemin Lin 0001, Jian Xu, Flip Korn, Wei Wang 0011	Space-efficient Relative Error Order Sketch over Data Streams.	ICDE	2006	DBLP DOI BibTeX RDF
20	Jie Don, Yu Hu 0001, Yinhe Han 0001, Xiaowei Li 0001	An on-chip combinational decompressor for reducing test data volume.	ISCAS	2006	DBLP DOI BibTeX RDF
20	Yi-Min Wang, Doug Beck, Binh Vo, Roussi Roussev, Chad Verbowski	Detecting Stealth Software with Strider GhostBuster.	DSN	2005	DBLP DOI BibTeX RDF
20	Samuel S. Gross, Michael R. Brent	Using Multiple Alignments to Improve Gene Prediction.	RECOMB	2005	DBLP DOI BibTeX RDF
20	Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik Roy 0001	A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application.	DATE	2005	DBLP DOI BibTeX RDF
20	Frank te Beest, Ad M. G. Peeters	A Multiplexor Based Test Method for Self-Timed Circuits.	ASYNC	2005	DBLP DOI BibTeX RDF
20	Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz	Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
20	DongSup Song, Sungho Kang	Increasing Embedding Probabilities of RPRPs in RIN Based BIST.	Asia-Pacific Computer Systems Architecture Conference	2005	DBLP DOI BibTeX RDF
20	Irith Pomeranz	Constrained test generation for embedded synchronous sequential circuits with serial-input access.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
20	Kuen-Jong Lee, Shaing-Jer Hsu, Chia-Ming Ho	Test Power Reduction with Multiple Capture Orders.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
20	Yu Zhang 0075, Terence Sim, Chew Lim Tan	Adaptation-Based Individualized Face Modeling for Animation Using Displacement Map.	Computer Graphics International	2004	DBLP DOI BibTeX RDF	Individualized Face Modeling and Animation, Face Adaptation, Displacement Map
20	Dimitrios Katsoulas, Andreas Werber	Edge Detection in Range Images of Piled Box-like Objects.	ICPR (2)	2004	DBLP DOI BibTeX RDF
20	Jan Van den Bussche	Finite Cursor Machines in Database Query Processing.	Abstract State Machines	2004	DBLP DOI BibTeX RDF
20	Peter Wohl, John A. Waicukauski, Sanjay Patel	Scalable selector architecture for x-tolerant deterministic BIST.	DAC	2004	DBLP DOI BibTeX RDF	test-generation (ATPG), test-data compression
20	Jih-Jeen Chen, Chia-Kai Yang, Kuen-Jong Lee	Test pattern generation and clock disabling for simultaneous test time and power reduction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
20	Nisar Ahmed, Mohammad H. Tehranipour, Mehrdad Nourani	Extending JTAG for Testing Signal Integrity in SoCs.	DATE	2003	DBLP DOI BibTeX RDF
20	Xiaoding Chen, Michael S. Hsiao	Energy-Efficient Logic BIST Based on State Correlation Analysis.	VTS	2003	DBLP DOI BibTeX RDF
20	Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara	Design for Two-Pattern Testability of Controller-Data Path Circuits.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
20	Y. J. Song, R. Z. Liu, T. N. Tan	Digital Watermarking for Forgery Detection in Printed Materials.	IEEE Pacific Rim Conference on Multimedia	2001	DBLP DOI BibTeX RDF
20	Irith Pomeranz, Sudhakar M. Reddy	On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits.	IEEE Trans. Computers	2000	DBLP DOI BibTeX RDF	irredundant faults, built-in test generation, test generation, synchronous sequential circuits, Initial states
20	Hyunseung Choo, Seong-Moo Yoo, Hee Yong Youn	Processor Scheduling and Allocation for 3D Torus Multicomputer Systems.	IEEE Trans. Parallel Distributed Syst.	2000	DBLP DOI BibTeX RDF	Best-fit and first-fit approach, processor scheduling and allocation, 3D torus, multicomputer
20	Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng	A Test Synthesis Approach to Reducing BALLAST DFT Overhead.	DAC	1997	DBLP DOI BibTeX RDF
20	Hans-Joachim Wunderlich, Gundolf Kiefer	Bit-flipping BIST.	ICCAD	1996	DBLP DOI BibTeX RDF	mixed-model BIST
20	Arun Balakrishnan, Srimat T. Chakradhar	Sequential Circuits with combinational Test Generation Complexity.	VLSI Design	1996	DBLP DOI BibTeX RDF
20	Chung-Hsing Chen, Tanay Karnik, Daniel G. Saab	Structural and behavioral synthesis for testability techniques.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
20	Vivek Chickermane, Jaushin Lee, Janak H. Patel	Addressing design for testability at the architectural level.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
20	Arun N. Swami, K. Bernhard Schiefer	Estimating Page Fetches for Index Scans with Finite LRU Buffers.	SIGMOD Conference	1994	DBLP DOI BibTeX RDF
20	Mehrdad Soumekh	Array imaging with beam-steered data.	IEEE Trans. Image Process.	1992	DBLP DOI BibTeX RDF
20	Cynthia Dwork, Maurice Herlihy, Serge A. Plotkin, Orli Waarts	Time-Lapse Snapshots.	ISTCS	1992	DBLP DOI BibTeX RDF
20	Anthony C. Barkans	High speed high quality antialiased vector generation.	SIGGRAPH	1990	DBLP DOI BibTeX RDF
20	Chih-Wei Yi	A Unified Analytic Framework Based on Minimum Scan Statistics for Wireless Ad Hoc and Sensor Networks.	IEEE Trans. Parallel Distributed Syst.	2009	DBLP DOI BibTeX RDF
20	Edwin B. Olson	Real-time correlative scan matching.	ICRA	2009	DBLP DOI BibTeX RDF
20	Tomohito Takubo, Takuya Kaminade, Yasushi Mae, Kenichi Ohara, Tatsuo Arai	NDT scan matching method for high resolution grid map.	IROS	2009	DBLP DOI BibTeX RDF
20	Yucai Wang, Guangyong Li, Lianqing Liu	Local scan for compensation of drift contamination in AFM based nanomanipulation.	IROS	2009	DBLP DOI BibTeX RDF
20	M. Salah E.-N. Shafik, Bärbel Mertsching	Real-Time Scan-Line Segment Based Stereo Vision for the Estimation of Biologically Motivated Classifier Cells.	KI	2009	DBLP DOI BibTeX RDF
20	Jun Xu, Xiangku Li	Efficient Physical Design Methodology for Reducing Test Power Dissipation of Scan-Based Designs.	NAS	2009	DBLP DOI BibTeX RDF
20	Frank Dennerlein, Frédéric Noo, H. Schondube, Günter Lauritsch, Joachim Hornegger	A Factorization Approach for Cone-Beam Reconstruction on a Circular Short-Scan.	IEEE Trans. Medical Imaging	2008	DBLP DOI BibTeX RDF