Search results for "TCAD"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
77	Martin D. Giles, Duane S. Boning, Goodwin R. Chin, Walter C. Dietrich Jr., Michael S. Karasick, Mark E. Law, Purnendu K. Mozumder, Lee R. Nackman, V. T. Rajan, Duncan M. Hank Walker, Robert H. Wang, Alexander S. Wong	Semiconductor wafer representation for TCAD.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
73	Georgios Ch. Sirakoulis	A Cellular Automata Simulation Tool for Modelling and Automatic VLSI Implementation of the Oxidation Process in Integrated Circuit Fabrication.	ACRI	2006	DBLP DOI BibTeX RDF
73	Alexander S. Wong, Andrew R. Neureuther	The intertool profile interchange format: a technology CAD environment approach [semiconductor technology].	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1991	DBLP DOI BibTeX RDF
73	Naoyuki Shigyo, Hirobumi Kawashima, Seiji Yasuda	Design of ESD Protection Device Using Statistical Methods.	ISQED	2002	DBLP DOI BibTeX RDF	ESD, TCAD, Statistical methods, Hypothesis test, DOE
55	Robert W. Dutton, Andrzej J. Strojwas	Perspectives on technology and technology-driven CAD.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
43	Sanghoon Myung, Wonik Jang, Seonghoon Jin, Jae Myung Choe, Changwook Jeong, Daesin Kim	Restructuring TCAD System: Teaching Traditional TCAD New Tricks.	CoRR	2022	DBLP DOI BibTeX RDF
37	Puneet Gupta 0001, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester	Investigation of diffusion rounding for post-lithography analysis.	ASP-DAC	2008	DBLP DOI BibTeX RDF
37	Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng	A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects.	ICCAD	2008	DBLP DOI BibTeX RDF
37	Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Frank Liu 0001, Sani R. Nassif, Yu Cao 0001	Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation.	DAC	2007	DBLP DOI BibTeX RDF
37	Sridhar Tirumala, Yuri Mahotin, Xiao Lin, Victor Moroz, Lee Smith, S. Krishnamurthy, L. Bomholt, Dipu Pramanik	Bringing Manufacturing into Design via Process-Dependent SPICE Models.	ISQED	2006	DBLP DOI BibTeX RDF
37	Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian	Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories.	VTS	2006	DBLP DOI BibTeX RDF
37	Franz Fasching, Walter Tuppa, Siegfried Selberherr	VISTA-the data level.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
22	Luigi Balestra, Franco Ercolano, Elena Gnani, Susanna Reggiani	TCAD Modeling of High-Field Electron Transport in Bulk Wurtzite GaN: The Full-Band SHE-BTE.	IEEE Access	2023	DBLP DOI BibTeX RDF
22	Jasurbek Gulomov, Oussama Accouche, Rayimjon Aliev, Raymond Ghandour, Irodakhon Gulomova	Investigation of n-ZnO/p-Si and n-TiO2/p-Si Heterojunction Solar Cells: TCAD + DFT.	IEEE Access	2023	DBLP DOI BibTeX RDF
22	Karine Coulié, Hassen Aziza, Wenceslas Rahajandraibe	Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations.	J. Electron. Test.	2023	DBLP DOI BibTeX RDF
22	Yibo Lei, Jian Fang, Yingdong Liang, Yisen Zhang, Ling Yan, Lingli Tang, Xihe Yang, Bo Zhang 0027	Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations.	Microelectron. J.	2023	DBLP DOI BibTeX RDF
22	Xiao Ma, Yongle Huang, Fei Xiao, Yifei Luo, Tongyao Han	Characterization on the thermal field inside IGBT cells during switching based on TCAD modeling and Thermoreflectance imaging.	Microelectron. J.	2023	DBLP DOI BibTeX RDF
22	Guangxi Fan, Kain Lu Low	Revolutionizing TCAD Simulations with Universal Device Encoding and Graph Attention Networks.	CoRR	2023	DBLP DOI BibTeX RDF
22	Jixing Ye, Abderrezak Boughedda, D. M. S. Sultan, Gian-Franco Dalla Betta	TCAD Analysis of Leakage Current and Breakdown Voltage in Small Pitch 3D Pixel Sensors.	Sensors	2023	DBLP DOI BibTeX RDF
22	Tom Klauner, Iman Sabri Alirezaei, Nicolas Roisin, Nicolas André, Denis Flandre	SPICE Model of SPAD Transient Intrinsic Response Validated using Mixed-Mode TCAD Simulations.	ESSDERC	2023	DBLP DOI BibTeX RDF
22	Nicolas Roisin, Jean-Pierre Raskin, Denis Flandre	Near-IR response of highly-strained Si photodetector linking first principles and TCAD.	ESSDERC	2023	DBLP DOI BibTeX RDF
22	M. Thesberg, Franz Schanovsky, Zlatan Stanojevic, Oskar Baumgartner, Markus Karner	A Study of the Variability and Design Considerations of Ferroelectric VNAND Memories With Polycrystalline Films Using An Experimentally Validated TCAD Model.	ESSDERC	2023	DBLP DOI BibTeX RDF
22	Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken	Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper.	IRPS	2023	DBLP DOI BibTeX RDF
22	Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli	TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection.	IRPS	2023	DBLP DOI BibTeX RDF
22	Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen	Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD.	ICTA	2023	DBLP DOI BibTeX RDF
22	Lida Kouhalvandi, Eva Catoggio, Simona Donati Guerrieri	Synergic Exploitation of TCAD and Deep Neural Networks for Nonlinear FinFET Modeling.	EUROCON	2023	DBLP DOI BibTeX RDF
22	Eva Catoggio, Simona Donati Guerrieri, Fabrizio Bonani, G. Ghione	Spatial distribution of microwave device harmonic electrical variables through T-dependent TCAD simulations.	EUROCON	2023	DBLP DOI BibTeX RDF
22	Francisco Pasadas, Anibal Pacheco-Sanchez, Nikolaos Mavredakis, David Jiménez	Graphene field-effect transistor TCAD tool for circuit design under freeware.	SMACD	2023	DBLP DOI BibTeX RDF
22	Rodion Novkin, Simon Thomann, Hussam Amrouch	ML-TCAD: Perspectives and Challenges on Accelerating Transistor Modeling using ML.	MLCAD	2023	DBLP DOI BibTeX RDF
22	Xuan Chi, Yubo Wang, Fan Li, Yixiao Huang, Chenruiyuan Yu, Shiqiang Wu, Huiqing Wen, Jiangmin Gu, Ping Zhang, Wen Liu	The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation.	ICICDT	2023	DBLP DOI BibTeX RDF
22	Ran Bi, Baotong Zhang, Jianhuan Wang, Jianjun Zhang, Haixia Li, Ming Li	TCAD Study on Strain Engineering in Vertical Channel Gate-all-around Transistor.	ASICON	2023	DBLP DOI BibTeX RDF
22	Cristian J. Herrera-Rodriguez, Atsushi Shimbori, Timothy A. Grotjohn	$\alpha$-Ga2O3/Diamond Heterojunction PN Diode: Device Fabrication and TCAD Modelling.	DRC	2023	DBLP DOI BibTeX RDF
22	S. Ahmed, A. E. Islam, Daniel Dryden, Kyle J. Liddy, Nolan S. Hendricks, Neil A. Moser, Kelson D. Chabak, Andrew J. Green	The $R_{\text{ON}}-V_{\text{BK}}$ Relationship in $\beta$-Ga2O3 Lateral MESFETs Determined Using Physics-Based TCAD Simulation.	DRC	2023	DBLP DOI BibTeX RDF
22	Tongshan Lu, Chenghua Wang	TCAD Simulation of Single Event Transient in Si Bulk MOSFET at Cryogenic Temperature.	IEEE Access	2022	DBLP DOI BibTeX RDF
22	Yaqiong Duan, Mian Xiang, Bingtao Zhou, Desu Fu, Hongxiao Liu	TCAD: Unsupervised Anomaly Detection Based on Global Local Representation Differences.	IEEE Access	2022	DBLP DOI BibTeX RDF
22	Juan E. Sanchez	DEVSIM: A TCAD Semiconductor Device Simulator.	J. Open Source Softw.	2022	DBLP DOI BibTeX RDF
22	Neha, Vandana Kumari, Mridula Gupta, Manoj Saxena	Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment.	Microelectron. J.	2022	DBLP DOI BibTeX RDF
22	Shalini Chaudhary, Basudha Dewan, Chitrakant Sahu, Menka Yadav	Steep-subthreshold slope dual gate negative capacitance junction less FET with dead channel: TCAD approach for digital/ RF applications.	Microelectron. J.	2022	DBLP DOI BibTeX RDF
22	Albert Lu, Jordan Marshall, Yifan Wang, Ming Xiao, Yuhao Zhang, Hiu Yung Wong	Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model.	CoRR	2022	DBLP DOI BibTeX RDF
22	Laura Zunarelli, Susanna Reggiani, Elena Gnani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli	TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells.	IRPS	2022	DBLP DOI BibTeX RDF
22	Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy	A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
22	Seungju Hwang, Ilgu Yun	Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation.	ICEIC	2022	DBLP DOI BibTeX RDF
22	Sungkyu Kwon, Doohyung Cho, Jongil Won, Dong Yun Jung, Hyun Gyu Jang, Kunsik Park	TCAD simulation of electrical characteristics dependence on metal work function for Schottky Contact-Super Barrier Rectifier (SC-SBR).	ICEIC	2022	DBLP DOI BibTeX RDF
22	Yubo Wang, Fan Li, Xuan Chi, Wen Liu, Guohao Yu, Zhongkai Du, Baoshun Zhang	TCAD-Based Investigation of the Electrical Characteristics of Normally off p-GaN Passivated GaN HEMTs.	ICICDT	2022	DBLP DOI BibTeX RDF
22	Srinivas Varma, Ch Pratyusha Chowdari, D. Jayanthi, Asisa Kumar Panigrahi, K. Jamal	TCAD Simulation of a 10nm n-Channel Vertical Double Gate Silicon On Insulator MOSFET for Digital Applications.	ICCCNT	2022	DBLP DOI BibTeX RDF
22	Mamidala Karthik Ram, Neha Tiwari, Dawit Burusie Abdi, Sneh Saurabh	Effect of Drain Induced Barrier Enhancement on Subthreshold Swing and OFF-State Current of Short Channel MOSFETs: A TCAD Study.	IEEE Access	2021	DBLP DOI BibTeX RDF
22	Lorenzo De Cilladi, Thomas Corradino, Gian-Franco Dalla Betta, Coralie Neubüser, Lucio Pancheri	Fully Depleted Monolithic Active Microstrip Sensors: TCAD Simulation Study of an Innovative Design Concept.	Sensors	2021	DBLP DOI BibTeX RDF
22	Hong Yu, Shentong Ji, Xiangyan Luo, Quan Xie	Technology CAD (TCAD) Simulations of Mg2Si/Si Heterojunction Photodetector Based on the Thickness Effect.	Sensors	2021	DBLP DOI BibTeX RDF
22	Marwa Sayed Salem, Mohammed Elbanna, Mohamed Abouelatta, Ahmed Saeed 0005, Ahmed Shaker	A Comparative Simulation Study of DG-MOSFETs: PCMS Approach in FETMOSS vs. CMS in Silvaco TCAD.	NILES	2021	DBLP DOI BibTeX RDF
22	Yun-Yeong Choi, Ji-Sun Park, Hyung-Soon Shin	Analysis of hump effect in tensile-stressed a-IGZO TFT using TCAD simulation.	ICEIC	2021	DBLP DOI BibTeX RDF
22	Dandan Jiang, Wenying Ma, Jian Tao, Song Ye, Zhongyun Li	Study on PBL and TCAD Tools in Microelectronics Process Education.	ICEIT	2021	DBLP DOI BibTeX RDF
22	Wolfgang Goes, D. Green, Philippe Blaise, Giuseppe Piccolboni, Alessandro Bricalli, Amir Regev, Gabriel Molas, Jean-Francois Nodin	A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification.	IMW	2021	DBLP DOI BibTeX RDF
22	Franz Schanovsky, Devin Verreck, Antonio Arreghini, Gerhard Rzepa, Zlatan Stanojevic, Christian Kernstock, Oskar Baumgartner, Maarten Rosmeulen, Markus Karner	A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics.	IMW	2021	DBLP DOI BibTeX RDF
22	Tapas Dutta, Cristina Medina-Bailon, Ali Rezaei, Daniel Nagy, Fikru Adamu-Lema, Nikolas Xeni, Yassine Abourrig, Naveen Kumar, Vihar P. Georgiev, Asen Asenov	TCAD Simulation of Novel Semiconductor Devices.	ASICON	2021	DBLP DOI BibTeX RDF
22	Masahiro Watanabe	TCAD simulation of trench-gate IGBTs for prediction of carrier lifetime requirements for future scaled devices.	ASICON	2021	DBLP DOI BibTeX RDF
22	Dragan Stamenkovic, Umamaheswara Vemulapati, Thomas Stiasny, Munaf Rahimo, Drazen Dujic	IGCT Low-Current Switching - TCAD and Experimental Characterization.	IEEE Trans. Ind. Electron.	2020	DBLP DOI BibTeX RDF
22	Kashyap Mehta, Sophia Susan Raju, Ming Xiao, Boyan Wang, Yuhao Zhang, Wong Hiu Yung	Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design.	IEEE Access	2020	DBLP DOI BibTeX RDF
22	A. Nisha Justeena, R. Srinivasan	Reconfigurable FET-Based SRAM and Its Single Event Upset Performance Analysis Using TCAD Simulations.	Microelectron. J.	2020	DBLP DOI BibTeX RDF
22	Linjie Fan, Jinshun Bi, Kai Xi, Gangping Yan	Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations.	Sensors	2020	DBLP DOI BibTeX RDF
22	Linjie Fan, Jinshun Bi, Kai Xi, Sandip Majumdar, Bo Li 0051	Performance Optimization of FD-SOI Hall Sensors Via 3D TCAD Simulations.	Sensors	2020	DBLP DOI BibTeX RDF
22	Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey Johnson, William Taylor, Myra Boenke, Byoung Min	Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications.	IRPS	2020	DBLP DOI BibTeX RDF
22	Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier 0002	Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation.	IRPS	2020	DBLP DOI BibTeX RDF
22	Hao Yu, Chengxu Wang, Xiangshui Miao, Xingsheng Wang	A TCAD-based Study of NDR Effect in NC-FinFET.	ICTA	2020	DBLP DOI BibTeX RDF
22	Aurelio Mannara	TCAD modeling of current transport and main reliability issues of polysilicon-channel 3-D NAND Flash strings.		2020	RDF
22	Philip Brisk, Suman Chakraborty, Claudionor Coelho, Abdoulaye Gamatié, Swaroop Ghosh, Xun Jiao	TCAD EIC Message: February 2019.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2019	DBLP DOI BibTeX RDF
22	Huizhang Luo	TCAD MLC-STTRAM.		2019	DOI RDF
22	Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov	Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem.	DDECS	2019	DBLP DOI BibTeX RDF
22	Patrick Scharf, Christoph Sohrmann, Steffen Holland, Volkhard Beyer	Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations.	ESSDERC	2019	DBLP DOI BibTeX RDF
22	Federico Giuliano, Riccardo Depetro, Giuseppe Croce, Andrea Natale Tallarico, Susanna Reggiani, Antonio Gnudi, Enrico Sangiorgi, Claudio Fiegna, Mattia Rossetti, Antonio Molfese, Stefano Manzini	TCAD predictions of hot-electron injection in p-type LDMOS transistors.	ESSDERC	2019	DBLP DOI BibTeX RDF
22	Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan	TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement.	IRPS	2019	DBLP DOI BibTeX RDF
22	Manoj Kumar Reddy, Jhansi Lakshmi, Atluri Hemanth, Bhajantri Hemanth Kumar, Lavanya Bandi, Gene Sheu, Yu-Lin Song, Po-An Chen, Luh-Maan Chang	Physics Based TCAD Simulation and Calibration of GaN/AlGaN/GaN HEMT Device.	ICSAI	2019	DBLP DOI BibTeX RDF
22	Tomohiro Otsuka, Yutaro Yamaguchi 0002, Shintaro Shinjo, Toshiyuki Oishi	Study of Self-heating Effect of GaN HEMTs with Buffer Traps by Low Frequency S-parameters Measurements and TCAD Simulation.	BCICTS	2019	DBLP DOI BibTeX RDF
22	Soumya Ranjan Panda, Sébastien Fregonese, Anjan Chakravorty, Thomas Zimmer	TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range.	BCICTS	2019	DBLP DOI BibTeX RDF
22	Xueqing Liu 0003, Michael S. Shur	An Efficient TCAD Model for TeraFET Detectors.	RWS	2019	DBLP DOI BibTeX RDF
22	Ning Li, Wen-Yang Jiang, Blacksmith Wu, Kanyu Cao	Improve DRAM Leakage Issue During RAS Operational Phase Through TCAD Simulation.	ASICON	2019	DBLP DOI BibTeX RDF
22	Chien Y. Huang, Sze Ming Fu, Parag Parashar, Chun Han Chen, Chandni Akbar, Albert S. Lin	Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks.	IEEE Access	2018	DBLP DOI BibTeX RDF
22	Alexandre Simionovski, Gilson I. Wirth, Ronald D. Schrimpf, Bharat L. Bhuva	A TCAD evaluation of a single Bulk-BICS with integrative memory cell.	Microelectron. J.	2018	DBLP DOI BibTeX RDF
22	Mohamed Abouelatta-Ebrahim, Ahmed Shaker, Christian Gontrand	Impact of TSV location in HVIC on CMOS operation: A mixed-mode TCAD simulation study.	Microelectron. J.	2018	DBLP DOI BibTeX RDF
22	Paul Pfäffli, Hiu Yung Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, Souvik Mahapatra, Steve Motzny, Victor Moroz, Terry Ma	TCAD modeling for reliability.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	Susanna Reggiani, Mattia Rossetti, Antonio Gnudi, Andrea Natale Tallarico, Antonio Molfese, Stefano Manzini, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna	TCAD investigation on hot-electron injection in new-generation technologies.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	Susanna Reggiani, Luigi Balestra, Antonio Gnudi, Elena Gnani, Giorgio Baccarani, J. Dobrzynska, J. Vobecký, C. Tosi	TCAD study of DLC coatings for large-area high-power diodes.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	Tommaso Cilento, Chan-Su Yun, Arsen Terterian, Chang Hwi Lee, Jung Eon Moon, Si Woo Lee, Hyoungcheol Kwon, Manho Seung, Seokkiu Lee	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	Hoang T. Nguyen, Axel Rodriguez, Frederic Wrobel, Alain Michez, Francoise Bezerra, Nathalie Chatry, Benjamin Vandevelde	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	ChengKuei Lee, Sen Yin, Jinyu Zhang, Yan Wang 0023, Zhiping Yu	Study on scalability of hybrid junctionless FinFET and multi-stacked nanowire FET by TCAD simulation.	IEICE Electron. Express	2018	DBLP DOI BibTeX RDF
22	Alfonso Herrera-Moreno, Jose Luis Garcia-Gervacio, Héctor Villacorta-Minaya, Héctor Vázquez-Leal	TCAD analysis and modeling for NBTI mechanism in FinFET transistors.	IEICE Electron. Express	2018	DBLP DOI BibTeX RDF
22	Zlatan Stanojevic, Georg Strof, Franz Schanovsky, Klaus Steiner, Oskar Baumgartner, Christian Kernstock, Markus Karner	Cell Designer - a Comprehensive TCAD-Based Framework for DTCO of Standard Logic Cells.	ESSDERC	2018	DBLP DOI BibTeX RDF
22	Stefania Carapezzi, Sebastian Eberle, Susanna Reggiani, Elena Gnani, Cosmin Roman, Christofer Hierold, Antonio Gnudi	3D TCAD modeling of NO2CNT FET sensors.	ESSDERC	2018	DBLP DOI BibTeX RDF
22	Juan Manuel Lopez-Martinez, Ion Vornicu, Ricardo Carmona-Galán, Ángel Rodríguez-Vázquez	An Experimentally-Validated Verilog-A SPAD Model Extracted from TCAD Simulation.	ICECS	2018	DBLP DOI BibTeX RDF
22	Filip Segmanovic, Frederic Roger, Gerald Meinhardt, Ingrid Jonak-Auer, Tomislav Suligoj	Impact of TCAD model parameters on optical and electrical characteristics of radiation-hard photodiode in 0.35bm CMOS technology.	MIPRO	2018	DBLP DOI BibTeX RDF
22	Xiaoliang Dai, Niraj K. Jha	Using a Device State Library to Boost the Performance of TCAD Mixed-Mode Simulation.	IEEE Trans. Very Large Scale Integr. Syst.	2017	DBLP DOI BibTeX RDF
22	Clément Fleury, Guido Notermans, Hans-Martin Ritter, Dionyz Pogany	TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
22	Kalparupa Mukherjee, Frédéric Darracq, Arnaud Curutchet, Nathalie Malbert, Nathalie Labat	TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
22	Michael Schröter, Tommy Rosenbaum, Pascal Chevalier 0002, Bernd Heinemann, Sorin P. Voinigescu, Ed Preisler, Josef Böck, Anindya Mukherjee	SiGe HBT Technology: Future Trends and TCAD-Based Roadmap.	Proc. IEEE	2017	DBLP DOI BibTeX RDF
22	Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma	TCAD based Design-Technology Co-Optimisations in advanced technology nodes.	VLSI-DAT	2017	DBLP DOI BibTeX RDF
22	Debajit Bhattacharya, Niraj K. Jha	TCAD-Assisted Capacitance Extraction of FinFET SRAM and Logic Arrays.	IEEE Trans. Very Large Scale Integr. Syst.	2016	DBLP DOI BibTeX RDF
22	Quan Chen, Wim Schoenmaker, Shih-Hung Weng, Chung-Kuan Cheng, Guan-Hua Chen, Lijun Jiang, Ngai Wong	A fast time-domain EM-TCAD coupled simulation framework via matrix exponential with stiffness reduction.	Int. J. Circuit Theory Appl.	2016	DBLP DOI BibTeX RDF
22	Ajay Kumar 0004, Neha Gupta 0003, Rishu Chaujar	TCAD RF performance investigation of Transparent Gate Recessed Channel MOSFET.	Microelectron. J.	2016	DBLP DOI BibTeX RDF
22	Maran Ponnambalam, N. Vinodhkumar, R. Srinivasan, Premanand Venkatesh Chandramani	Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
22	Rockey Bhardwaj, Gurinderpal Singh	TFET simulation using Matlab and sentaraus TCAD.	ICACCI	2016	DBLP DOI BibTeX RDF
22	Stefania Carapezzi, Enrico Caruso, Antonio Gnudi, Susanna Reggiani, Elena Gnani	TCAD low-field mobility model for InGaAs UTB MOSFETs including quasi-ballistic corrections.	ESSDERC	2016	DBLP DOI BibTeX RDF