Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
88 | Antonio Zenteno, Víctor H. Champac |
Resistive Opens in a Class of CMOS Latches: Analysis and DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 138-144, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
74 | Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac |
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(6), pp. 529-538, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Interconnection opens, Boolean testing, Favorable logic conditions, Test generation methodology, Coupling capacitances |
74 | Antonio Zenteno, Víctor H. Champac, Joan Figueras |
Detectability Conditions of Full Opens in the Interconnections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(2), pp. 85-95, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
logic testing, IDDQ testing, opens, defect modeling |
60 | Sreejit Chakravarty |
On the capability of delay tests to detect bridges and opens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 314-319, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
defective IC, faulty dynamic logic behavior, transition tests, simulation, integrated circuit testing, delay tests, bridges, opens, at-speed testing, path delay tests |
60 | Haluk Konuk |
Fault simulation of interconnect opens in digital CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1997, San Jose, CA, USA, November 9-13, 1997, pp. 548-554, 1997, IEEE Computer Society / ACM, 0-8186-8200-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
fault simulation, opens, breaks |
59 | Sudhakar M. Reddy, Irith Pomeranz, Chen Liu |
On tests to detect via opens in digital CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 840-845, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
constrained stuck-at tests, test generation, DFT, open defects |
46 | Arun Krishnamachary, Jacob A. Abraham |
Test generation for resistive opens in CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002, pp. 65-70, 2002, ACM, 1-58113-462-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
resistive opens, delay testing, defect detection |
46 | Víctor H. Champac, José Castillejos, Joan Figueras |
IDDQ Testing of Opens in CMOS SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 15(1-2), pp. 53-62, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
data retention faults, memory testing, opens, IDDQ |
46 | Haluk Konuk, F. Joel Ferguson |
An unexpected factor in testing for CMOS opens: the die surface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 422-429, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
surface phenomena, electric charge, CMOS opens, die surface, RC interconnect, HSPICE simulations, trapped charge, floating gates, VLSI, integrated circuit testing, CMOS integrated circuits, integrated circuit modelling, circuit model |
45 | Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
Testing for resistive opens and stuck opens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001, pp. 1049-1058, 2001, IEEE Computer Society, 0-7803-7169-0. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
43 | Víctor H. Champac, Antonio Zenteno |
Detectability Conditions for Interconnection Open Defect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 305-312, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
37 | Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng |
Automatic Test Pattern Generation for Interconnect Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 181-186, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Interconnect opens, Open-via defects, ATPG |
37 | Walter W. Weber, Adit D. Singh |
An experimental evaluation of the differential BICS for IDDQ testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 472-485, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
differential BICS, CMOS test chips, inter-layer shorts, intra-layer shorts, fault diagnosis, integrated circuit testing, fault coverage, CMOS integrated circuits, opens, built-in current sensor, IC testing, I/sub DDQ/ testing, electric current measurement, electric sensing devices |
37 | Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor |
Opens and Delay Faults in CMOS RAM Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 55(12), pp. 1630-1639, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
address decoder delay faults, addressing methods, BIST, DFT, Memory testing, open defects |
37 | Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac |
Test of Interconnection Opens Considering Coupling Signals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA, pp. 247-258, 2005, IEEE Computer Society, 0-7695-2464-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
37 | Chien-Mo James Li, Edward J. McCluskey |
Diagnosis of Tunneling Opens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 22-27, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
37 | Haluk Konuk, F. Joel Ferguson |
Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(11), pp. 1200-1210, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
36 | Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura |
Current Testable Design of Resistor String DACs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia, pp. 197-200, 2006, IEEE Computer Society, 0-7695-2500-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
30 | Matthias Klaus, Ad J. van de Goor |
Tests for Resistive and Capacitive Defects in Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 31-36, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
address decoders, test conditions, Defects, opens, dynamic faults, capacitive coupling |
30 | Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi |
Low-cost DC built-in self-test of linear analog circuits using checksums. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India, pp. 230-233, 1996, IEEE Computer Society, 0-8186-7228-5. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
DC built-in self-test, catastrophic failures, line opens, DC transfer function, on-chip fault detection, BIST circuitry, fault diagnosis, built-in self test, integrated circuit testing, transfer functions, analogue integrated circuits, checksums, linear analog circuits, matrix representations, fault classes |
30 | Philipp V. Panitz, Markus Olbrich, Erich Barke, Markus Bühler, Jürgen Koehl |
Considering possible opens in non-tree topology wire delay calculation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008, pp. 17-22, 2008, ACM, 978-1-59593-999-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
non-tree topologies, yield, static timing analysis, delay analysis |
30 | Antonio Zenteno Ramírez, Guillermo Espinosa, Víctor H. Champac |
Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 15(5), pp. 572-577, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
30 | Sreejit Chakravarty, Ankur Jain |
Fault Models for Speed Failures Caused by Bridges and Opens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 373-378, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
30 | Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly |
A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(2), pp. 151-162, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
29 | Dirk K. de Vries, Paul L. C. Simon |
Calibration of Open Interconnect Yield Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 26-33, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001 |
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, pp. 113-118, 2008, IEEE Computer Society, 978-0-7695-3150-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation |
23 | Ugur Çilingiroglu |
Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(1), pp. 25-34, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
in-circuit testing, opens testing, Hall sensors |
23 | Ali Chehab, Saurabh Patel, Rafic Z. Makki |
Scaling of iDDT Test Methods for Random Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(1), pp. 11-22, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
dynamic power supply current, design for current testability, resistive opens, resistive bridges, very deep sub-micron technologies, VDSM, fault simulation |
23 | Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov, Yervant Zorian |
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 66-71, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Data Retention Faults, Zero-time DRF Testing, Opens, Embedded SRAMs |
23 | Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle |
Transient power supply current monitoring - A new test method for CMOS VLSI circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 6(1), pp. 23-43, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
Design for current-testability, drain/source opens, floating gates, shorts, transient power supply current |
23 | Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio |
Quiescent current analysis and experimentation of defective CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 337-348, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts |
23 | Dong Xu |
ChatGPT opens a new door for bioinformatics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Quant. Biol. ![In: Quant. Biol. 11(2), pp. 204-206, June 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
23 | Yuepeng Wu, Hongxiang Guo, Bowen Zhang, Ran Tao, Yi Guo, Tian Zhang, Jifang Qiu, Jian Wu |
Calculating with Phase Opens up the High-Precision and High-Reconfigurability Integrated Photonic Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OFC ![In: Optical Fiber Communications Conference and Exhibition, OFC 2023, San Diego, CA, USA, March 5-9, 2023, pp. 1-3, 2023, IEEE, 978-1-957171-18-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
23 | José Antonio Barbero-Aparicio, Santiago Cuesta-López, César Ignacio García-Osorio, Javier Pérez-Rodríguez, Nicolás García-Pedrajas |
Nonlinear physics opens a new paradigm for accurate transcription start site prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BMC Bioinform. ![In: BMC Bioinform. 23(1), pp. 565, December 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
23 | Vinicius Gonçalves Maltarollo, Ekaterina Shevchenko, Igor Daniel de Miranda Lima, Elio A. Cino, Glaucio Monteiro Ferreira, Antti Poso, Thales Kronenberger |
Do Go Chasing Waterfalls: Enoyl Reductase (FabI) in Complex with Inhibitors Stabilizes the Tetrameric Structure and Opens Water Channels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Chem. Inf. Model. ![In: J. Chem. Inf. Model. 62(22), pp. 5746-5761, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
23 | Ildikó Vancsa |
The Four Opens: Open Source Beyond the Code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 55(6), pp. 81-84, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
23 | Arled Papa, Jörg von Mankowski, Hansini Vijayaraghavan, Babak Mafakheri, Leonardo Goratti, Wolfgang Kellerer |
6G opens up a New Era for Aeronautical Communication and Services. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2206.11694, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
23 | Fariha Tasmin Jaigirdar, Carsten Rudolph, Rayhan Rashed, Md. Nahiyan Uddin, Chris Bain, A. B. M. Alim Al Islam |
NOTE: Unavoidable Service to Unnoticeable Risks: A Study on How Healthcare Record Management Opens the Doors of Unnoticeable Vulnerabilities for Rohingya Refugees. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPASS ![In: COMPASS '22: ACM SIGCAS/SIGCHI Conference on Computing and Sustainable Societies, Seattle, WA, USA, 29 June 2022 - 1 July 2022, pp. 614-622, 2022, ACM, 978-1-4503-9347-8. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
23 | Leon Biscornet, Christophe Révillion, Sylvaine Jégo, Erwan Lagadec, Yann Gomard, Gildas Le Minter, Gérard Rocamora, Vanina Guernier-Cambert, Julien Mélade, Koussay Dellagi, Pablo Tortosa, Vincent Herbreteau |
Predicting the Presence of Leptospires in Rodents from Environmental Indicators Opens Up Opportunities for Environmental Monitoring of Human Leptospirosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 13(2), pp. 325, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
23 | Effrosyni Doutsi, Marc Antonini, Panagiotis Tsakalides |
Neuronal Communication Process Opens New Directions in Image and Video Compression Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ERCIM News ![In: ERCIM News 2021(125), 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
|
23 | Barry Hoberman, Jean-Pierre Nozieres |
SOT-MRAM - Third generation MRAM memory opens new opportunities : Hot Chips Conference August 2021. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HCS ![In: IEEE Hot Chips 33 Symposium, HCS 2021, Palo Alto, CA, USA, August 22-24, 2021, pp. 1-10, 2021, IEEE, 978-1-6654-1397-8. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
23 | Hanne Scheers, Tinne De Laet |
Interactive and Explainable Advising Dashboard Opens the Black Box of Student Success Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EC-TEL ![In: Technology-Enhanced Learning for a Free, Safe, and Sustainable World - 16th European Conference on Technology Enhanced Learning, EC-TEL 2021, Bolzano, Italy, September 20-24, 2021, Proceedings, pp. 52-66, 2021, Springer, 978-3-030-86435-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
23 | Niranjan Kumar Ray, Kamalakanta Mahapatra |
New IEEE Consumer Technology Society Chapter Opens in Odisha, India. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Consumer Electron. Mag. ![In: IEEE Consumer Electron. Mag. 9(6), pp. 6-7, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
23 | Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee |
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020, pp. 1-10, 2020, IEEE, 978-1-7281-9113-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
23 | Mark Fosberry, Ben McMahon |
Matlab JTAG AXI Master opens new dimensions for development and testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NATW ![In: 28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019, pp. 1-2, 2019, IEEE, 978-1-7281-3382-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
23 | Jeffrey Stuecheli, William J. Starke, John D. Irish, L. Baba Arimilli, Daniel M. Dreps, Bart Blaner, Curt Wollbrink, Brian Allison |
IBM POWER9 opens up a new era of acceleration enablement: OpenCAPI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IBM J. Res. Dev. ![In: IBM J. Res. Dev. 62(4/5), pp. 8:1-8:8, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | Sibendu Som, Yuanjiang Pei |
HPC Opens a New Frontier in Fuel-Engine Research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Sci. Eng. ![In: Comput. Sci. Eng. 20(5), pp. 77-80, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | Ahmed Shihab Albahri, A. A. Zaidan 0001, Osamah Shihab Albahri, B. B. Zaidan, M. A. Alsalem 0001 |
Real-Time Fault-Tolerant mHealth System: Comprehensive Review of Healthcare Services, Opens Issues, Challenges and Methodological Aspects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Medical Syst. ![In: J. Medical Syst. 42(8), pp. 137:1-137:56, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | John Edwards 0001 |
Signal Processing Opens the Internet of Things to a New World of Possibilities: Research Leads to New Internet of Things Technologies and Applications [Special Reports]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Signal Process. Mag. ![In: IEEE Signal Process. Mag. 35(5), pp. 9-12, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | Tan Li, Hosung Lee, GeunYong Bak, Sanghyeon Baeg |
Failure signature analysis of power-opens in DDR3 SDRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 88-90, pp. 277-281, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | Niyati Chhaya, Kokil Jaidka, Rahul Wadbude |
Predicting Email Opens with Domain-Sensitive Affect Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICLing (2) ![In: Computational Linguistics and Intelligent Text Processing - 19th International Conference, CICLing 2018, Hanoi, Vietnam, March 18-24, 2018, Revised Selected Papers, Part II, pp. 71-79, 2018, Springer, 978-3-031-23803-1. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | Konstantin Thierbach, Pierre-Louis Bazin, Walter de Back, Filippos Gavriilidis, Evgeniya Kirilina, Carsten Jäger, Markus Morawski, Stefan Geyer, Nikolaus Weiskopf, Nico Scherf |
Combining Deep Learning and Active Contours Opens The Way to Robust, Automated Analysis of Brain Cytoarchitectonics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MLMI@MICCAI ![In: Machine Learning in Medical Imaging - 9th International Workshop, MLMI 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, September 16, 2018, Proceedings, pp. 179-187, 2018, Springer, 978-3-030-00918-2. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
23 | Harvey Glickenstein |
Rio Opens Tram Line for Olympics [Transportation Systems]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Veh. Technol. Mag. ![In: IEEE Veh. Technol. Mag. 11(4), pp. 8-11, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
23 | Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee |
Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016, pp. 96-101, 2016, IEEE Computer Society, 978-1-5090-3809-1. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
23 | Andrea Cavallo, Ovidiu V. Lungu, Cristina Becchio, Caterina Ansuini, Aldo Rustichini, Luciano Fadiga |
When gaze opens the channel for communication: Integrative role of IFG and MPFC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NeuroImage ![In: NeuroImage 119, pp. 63-69, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
23 | Arif Raza, Luiz Fernando Capretz |
Addressing User Requirements in Opens Source Software: The Role of Online Forums. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1507.07908, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
|
23 | Sampsa Hyysalo, Mikael Johnson |
The user as relational entity: Options that deeper insight into user representations opens for human-centered design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Technol. People ![In: Inf. Technol. People 28(1), pp. 72-89, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
23 | John Edwards 0001 |
Signal Processing Opens New Views on Imaging [Special Reports]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Signal Process. Mag. ![In: IEEE Signal Process. Mag. 32(5), pp. 8-11, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
23 | Adit D. Singh |
Scan based two-pattern tests: should they target opens instead of TDFs? ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATS ![In: 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015, pp. 1-2, 2015, IEEE Computer Society, 978-1-4673-6710-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
23 | Chao Han, Adit D. Singh |
Testing cross wire opens within complex gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015, pp. 1-6, 2015, IEEE Computer Society, 978-1-4799-7597-6. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
23 | Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus |
A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microprocess. Microsystems ![In: Microprocess. Microsystems 38(5), pp. 359-367, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
23 | Richard Van Noorden |
Elsevier opens its papers to text-mining. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Nat. ![In: Nat. 506(7486), pp. 17, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
23 | Raju Balakrishnan, Rajesh Parekh |
Learning to predict subject-line opens for large-scale email marketing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE BigData ![In: 2014 IEEE International Conference on Big Data (IEEE BigData 2014), Washington, DC, USA, October 27-30, 2014, pp. 579-584, 2014, IEEE Computer Society, 978-1-4799-5665-4. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
23 | Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac |
Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATW ![In: 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014, pp. 1-6, 2014, IEEE. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
23 | Francesco Ciraulo |
Regular opens in constructive topology and a representation theorem for overlap algebras. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Ann. Pure Appl. Log. ![In: Ann. Pure Appl. Log. 164(4), pp. 421-436, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
23 | Jan Gaudestad, Vladimir Talanov, M. Marchetti |
Opens localization on silicon level in a Chip Scale Package using space domain reflectometry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 53(9-11), pp. 1418-1421, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
23 | David A. Cartes, Joe H. Chow, Dan McCaugherty, Steven E. Widergren, Ganesh Kumar Venayagamoorthy |
The IEEE Computer Society Smart Grid Vision Project opens opportunites for computational intelligence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EAIS ![In: Proceedings of the 2013 IEEE Conference on Evolving and Adaptive Intelligent Systems, EAIS 2013, IEEE Symposium Series on Computational Intelligence (SSCI), 16-19 April 2013, Singapore, pp. 144-150, 2013, IEEE, 978-1-4673-5855-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
23 | Jan Gaudestad, Vladimir Talanov, Po Chih Huang |
Space Domain Reflectometry for opens detection location in microbumps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 52(9-10), pp. 2123-2126, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
23 | Kim Sneppen, Ian B. Dodd |
A Simple Histone Code Opens Many Paths to Epigenetics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PLoS Comput. Biol. ![In: PLoS Comput. Biol. 8(8), 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
23 | Jesús Moreno, Víctor H. Champac, Michel Renovell |
Low voltage testing for interconnect opens under process variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATW ![In: 13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012, pp. 1-6, 2012, IEEE Computer Society, 978-1-4673-2355-0. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
23 | Robert Bogue |
Imaging technology opens up new robotic applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Ind. Robot ![In: Ind. Robot 38(4), pp. 343-348, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Evanthia Papadopoulou |
Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(5), pp. 704-717, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková |
Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011, pp. 395-396, 2011, IEEE Computer Society, 978-1-4244-9755-3. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Athanasios Fevgas, Panagiota E. Tsompanopoulou, Panayiotis Bozanis |
iMuse Mobile Tour: A personalized multimedia museum guide opens to groups. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCC ![In: Proceedings of the 16th IEEE Symposium on Computers and Communications, ISCC 2011, Kerkyra, Corfu, Greece, June 28 - July 1, 2011, pp. 971-975, 2011, IEEE Computer Society, 978-1-4577-0680-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Seongmoon Wang |
An efficient method to screen resistive opens under presence of process variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA, pp. 122-127, 2011, IEEE Computer Society, 978-1-61284-657-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Rajeev D. S. Raizada, Nikolaus Kriegeskorte |
Pattern-information fMRI: New questions which it opens up and challenges which face it. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Imaging Syst. Technol. ![In: Int. J. Imaging Syst. Technol. 20(1), pp. 31-41, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
23 | Jose Luis Garcia-Gervacio, Víctor H. Champac |
Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 15th European Test Symposium, ETS 2010, Prague, Czech Republic, May 24-28, 2010, pp. 126-131, 2010, IEEE Computer Society, 978-1-4244-5833-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
23 | Josep Rius 0001 |
A method for detecting resistive opens in buses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece, pp. 187-189, 2010, IEEE Computer Society, 978-1-4244-7724-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
23 | Gary G. Yen |
When one door closes, another door opens... [Editor's Remarks]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Comput. Intell. Mag. ![In: IEEE Comput. Intell. Mag. 4(4), pp. 2, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Johannes Karlsson, Adi Anani, Haibo Li 0001 |
Enabling Real-Time Video Services over Ad-Hoc Networks Opens the Gates for E-learning in Areas Lacking Infrastructure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Interact. Mob. Technol. ![In: Int. J. Interact. Mob. Technol. 3(4), pp. 17-23, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Delay caused by resistive opens in interconnecting lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Integr. ![In: Integr. 42(3), pp. 286-293, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Stéphane Grumbach |
Sino-French IT Lab in Beijing Opens to European Institutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ERCIM News ![In: ERCIM News 2009(76), 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
|
23 | Michele Favalli, Cecilia Metra |
Testing Resistive Opens and Bridging Faults Through Pulse Propagation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(6), pp. 915-925, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Michael J. Marcus |
Wireless innovation and spectrum policy: FCC opens a new inquiry [Spectrum Policy and Regulatory Issues]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Wirel. Commun. ![In: IEEE Wirel. Commun. 16(6), pp. 4, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Michael J. Marcus |
Wireless innovation and spectrum policy: the fcc opens a new inquiry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Wirel. Commun. ![In: IEEE Wirel. Commun. 16(5), pp. 4-5, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Jose Luis Garcia-Gervacio, Víctor H. Champac |
Detectability analysis of small delays due to resistive opens considering process variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 195-197, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Pablo Maqueda, Josep Rius 0001 |
Analysis of the extra delay on interconnects caused by resistive opens and shorts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal, pp. 208-209, 2009, IEEE Computer Society, 978-1-4244-4596-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Chwee Liong Tee, Tzyy Haw Tan, Chin Chuan Ng |
Augmenting board test coverage with new intel powered opens boundary scan instruction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009, pp. 1-10, 2009, IEEE Computer Society, 978-1-4244-4868-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | G. Anyfandi, Vasileios Laopodis, Vasilis Koulaidis, Nicolas Apostolopoulos, V. De Semir, D. Markovitsi, X. Tsilibaris |
Laboratory Door Opens to Non-formal Learning Communities. Science Centres as Mediators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Knowledge Construction in E-learning Context ![In: Proceedings of the Conference Knowledge Construction in E-learning Context: CSCL, ODL, ICT and SNA in education (2008), Cesena, Italy, September 1-2, 2008, 2008, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
23 | Xijiang Lin, Janusz Rajski |
Test Generation for Interconnect Opens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-7, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Jose M. M. Ferreira, Ana C. Leão |
Remote Access to Expensive SDRAM Test Equipment: Qimonda Opens the Shop-floor to Test Course Students. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Online Eng. ![In: Int. J. Online Eng. 3(3), 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP BibTeX RDF |
|
23 | Harvey Glickenstein |
First portion of the Chicago's Circle Line opens [Transportation Systems]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Veh. Technol. Mag. ![In: IEEE Veh. Technol. Mag. 1(3), pp. 47-48, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker 0001 |
A unified fault model and test generation procedure for interconnect opens and bridges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 10th European Test Symposium, ETS 2005, Tallinn, Estonia, May 22-25, 2005, pp. 22-27, 2005, IEEE Computer Society, 0-7695-2341-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Víctor H. Champac, Antonio Zenteno, José L. Garcia |
Testing of resistive opens in CMOS latches and flip-flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 10th European Test Symposium, ETS 2005, Tallinn, Estonia, May 22-25, 2005, pp. 34-40, 2005, IEEE Computer Society, 0-7695-2341-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Defective behaviours of resistive opens in interconnect lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 10th European Test Symposium, ETS 2005, Tallinn, Estonia, May 22-25, 2005, pp. 28-33, 2005, IEEE Computer Society, 0-7695-2341-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars |
Tests for address decoder delay faults in RAMs due to inter-gate opens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 9th European Test Symposium, ETS 2004, Ajaccio, France, May 23-26, 2004, pp. 146-151, 2004, IEEE Computer Society, 0-7695-2119-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Shalini Ghosh, F. Joel Ferguson |
Estimating detection probability of interconnect opens using stuck-at tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004, pp. 254-259, 2004, ACM, 1-58113-853-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
break fault, interconnect open, stuck-at test |
23 | Zhuo Li 0001, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker |
A Circuit Level Fault Model for Resistive Opens and Bridges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, pp. 379-384, 2003, IEEE Computer Society, 0-7695-1924-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Bob Forbes |
The 5th Factor: Behavior Profiling Opens New Possibilities for Web Access Control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Secur. J. A Glob. Perspect. ![In: Inf. Secur. J. A Glob. Perspect. 11(1), pp. 16-22, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
23 | Sue A. Olson |
Emboss opens up sequence analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Briefings Bioinform. ![In: Briefings Bioinform. 3(1), pp. 87-91, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|