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Publication years (Num. hits)
1959-1988 (16) 1989-1992 (18) 1993-1995 (33) 1996 (26) 1997 (18) 1998 (21) 1999 (28) 2000 (41) 2001 (51) 2002 (72) 2003 (49) 2004 (111) 2005 (120) 2006 (142) 2007 (150) 2008 (174) 2009 (119) 2010 (25) 2011-2014 (15) 2015-2018 (15) 2019-2023 (14)
Publication types (Num. hits)
article(234) incollection(15) inproceedings(1009)
Venues (Conferences, Journals, ...)
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The graphs summarize 1480 occurrences of 1153 keywords

Results
Found 1258 publication records. Showing 1258 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
88Antonio Zenteno, Víctor H. Champac Resistive Opens in a Class of CMOS Latches: Analysis and DFT. Search on Bibsonomy VTS The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
74Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. Search on Bibsonomy J. Electron. Test. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Interconnection opens, Boolean testing, Favorable logic conditions, Test generation methodology, Coupling capacitances
74Antonio Zenteno, Víctor H. Champac, Joan Figueras Detectability Conditions of Full Opens in the Interconnections. Search on Bibsonomy J. Electron. Test. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF logic testing, IDDQ testing, opens, defect modeling
60Sreejit Chakravarty On the capability of delay tests to detect bridges and opens. Search on Bibsonomy Asian Test Symposium The full citation details ... 1997 DBLP  DOI  BibTeX  RDF defective IC, faulty dynamic logic behavior, transition tests, simulation, integrated circuit testing, delay tests, bridges, opens, at-speed testing, path delay tests
60Haluk Konuk Fault simulation of interconnect opens in digital CMOS circuits. Search on Bibsonomy ICCAD The full citation details ... 1997 DBLP  DOI  BibTeX  RDF fault simulation, opens, breaks
59Sudhakar M. Reddy, Irith Pomeranz, Chen Liu On tests to detect via opens in digital CMOS circuits. Search on Bibsonomy DAC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF constrained stuck-at tests, test generation, DFT, open defects
46Arun Krishnamachary, Jacob A. Abraham Test generation for resistive opens in CMOS. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2002 DBLP  DOI  BibTeX  RDF resistive opens, delay testing, defect detection
46Víctor H. Champac, José Castillejos, Joan Figueras IDDQ Testing of Opens in CMOS SRAMs. Search on Bibsonomy J. Electron. Test. The full citation details ... 1999 DBLP  DOI  BibTeX  RDF data retention faults, memory testing, opens, IDDQ
46Haluk Konuk, F. Joel Ferguson An unexpected factor in testing for CMOS opens: the die surface. Search on Bibsonomy VTS The full citation details ... 1996 DBLP  DOI  BibTeX  RDF surface phenomena, electric charge, CMOS opens, die surface, RC interconnect, HSPICE simulations, trapped charge, floating gates, VLSI, integrated circuit testing, CMOS integrated circuits, integrated circuit modelling, circuit model
45Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey Testing for resistive opens and stuck opens. Search on Bibsonomy ITC The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
43Víctor H. Champac, Antonio Zenteno Detectability Conditions for Interconnection Open Defect. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
37Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng Automatic Test Pattern Generation for Interconnect Open Defects. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Interconnect opens, Open-via defects, ATPG
37Walter W. Weber, Adit D. Singh An experimental evaluation of the differential BICS for IDDQ testing. Search on Bibsonomy VTS The full citation details ... 1995 DBLP  DOI  BibTeX  RDF differential BICS, CMOS test chips, inter-layer shorts, intra-layer shorts, fault diagnosis, integrated circuit testing, fault coverage, CMOS integrated circuits, opens, built-in current sensor, IC testing, I/sub DDQ/ testing, electric current measurement, electric sensing devices
37Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor Opens and Delay Faults in CMOS RAM Address Decoders. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2006 DBLP  DOI  BibTeX  RDF address decoder delay faults, addressing methods, BIST, DFT, Memory testing, open defects
37Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac Test of Interconnection Opens Considering Coupling Signals. Search on Bibsonomy DFT The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
37Chien-Mo James Li, Edward J. McCluskey Diagnosis of Tunneling Opens. Search on Bibsonomy VTS The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
37Haluk Konuk, F. Joel Ferguson Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
36Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura Current Testable Design of Resistor String DACs. Search on Bibsonomy DELTA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
30Matthias Klaus, Ad J. van de Goor Tests for Resistive and Capacitive Defects in Address Decoders. Search on Bibsonomy Asian Test Symposium The full citation details ... 2001 DBLP  DOI  BibTeX  RDF address decoders, test conditions, Defects, opens, dynamic faults, capacitive coupling
30Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi Low-cost DC built-in self-test of linear analog circuits using checksums. Search on Bibsonomy VLSI Design The full citation details ... 1996 DBLP  DOI  BibTeX  RDF DC built-in self-test, catastrophic failures, line opens, DC transfer function, on-chip fault detection, BIST circuitry, fault diagnosis, built-in self test, integrated circuit testing, transfer functions, analogue integrated circuits, checksums, linear analog circuits, matrix representations, fault classes
30Philipp V. Panitz, Markus Olbrich, Erich Barke, Markus Bühler, Jürgen Koehl Considering possible opens in non-tree topology wire delay calculation. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2008 DBLP  DOI  BibTeX  RDF non-tree topologies, yield, static timing analysis, delay analysis
30Antonio Zenteno Ramírez, Guillermo Espinosa, Víctor H. Champac Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
30Sreejit Chakravarty, Ankur Jain Fault Models for Speed Failures Caused by Bridges and Opens. Search on Bibsonomy VTS The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
30Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
29Dirk K. de Vries, Paul L. C. Simon Calibration of Open Interconnect Yield Models. Search on Bibsonomy DFT The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
23Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001 A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. Search on Bibsonomy ETS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation
23Ugur Çilingiroglu Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults. Search on Bibsonomy J. Electron. Test. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF in-circuit testing, opens testing, Hall sensors
23Ali Chehab, Saurabh Patel, Rafic Z. Makki Scaling of iDDT Test Methods for Random Logic Circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF dynamic power supply current, design for current testability, resistive opens, resistive bridges, very deep sub-micron technologies, VDSM, fault simulation
23Baosheng Wang, Yuejian Wu, Josh Yang, André Ivanov, Yervant Zorian SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF Data Retention Faults, Zero-time DRF Testing, Opens, Embedded SRAMs
23Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle Transient power supply current monitoring - A new test method for CMOS VLSI circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 1995 DBLP  DOI  BibTeX  RDF Design for current-testability, drain/source opens, floating gates, shorts, transient power supply current
23Jaume A. Segura 0001, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio Quiescent current analysis and experimentation of defective CMOS circuits. Search on Bibsonomy J. Electron. Test. The full citation details ... 1992 DBLP  DOI  BibTeX  RDF Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts
23Dong Xu ChatGPT opens a new door for bioinformatics. Search on Bibsonomy Quant. Biol. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
23Yuepeng Wu, Hongxiang Guo, Bowen Zhang, Ran Tao, Yi Guo, Tian Zhang, Jifang Qiu, Jian Wu Calculating with Phase Opens up the High-Precision and High-Reconfigurability Integrated Photonic Computing. Search on Bibsonomy OFC The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
23José Antonio Barbero-Aparicio, Santiago Cuesta-López, César Ignacio García-Osorio, Javier Pérez-Rodríguez, Nicolás García-Pedrajas Nonlinear physics opens a new paradigm for accurate transcription start site prediction. Search on Bibsonomy BMC Bioinform. The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
23Vinicius Gonçalves Maltarollo, Ekaterina Shevchenko, Igor Daniel de Miranda Lima, Elio A. Cino, Glaucio Monteiro Ferreira, Antti Poso, Thales Kronenberger Do Go Chasing Waterfalls: Enoyl Reductase (FabI) in Complex with Inhibitors Stabilizes the Tetrameric Structure and Opens Water Channels. Search on Bibsonomy J. Chem. Inf. Model. The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
23Ildikó Vancsa The Four Opens: Open Source Beyond the Code. Search on Bibsonomy Computer The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
23Arled Papa, Jörg von Mankowski, Hansini Vijayaraghavan, Babak Mafakheri, Leonardo Goratti, Wolfgang Kellerer 6G opens up a New Era for Aeronautical Communication and Services. Search on Bibsonomy CoRR The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
23Fariha Tasmin Jaigirdar, Carsten Rudolph, Rayhan Rashed, Md. Nahiyan Uddin, Chris Bain, A. B. M. Alim Al Islam NOTE: Unavoidable Service to Unnoticeable Risks: A Study on How Healthcare Record Management Opens the Doors of Unnoticeable Vulnerabilities for Rohingya Refugees. Search on Bibsonomy COMPASS The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
23Leon Biscornet, Christophe Révillion, Sylvaine Jégo, Erwan Lagadec, Yann Gomard, Gildas Le Minter, Gérard Rocamora, Vanina Guernier-Cambert, Julien Mélade, Koussay Dellagi, Pablo Tortosa, Vincent Herbreteau Predicting the Presence of Leptospires in Rodents from Environmental Indicators Opens Up Opportunities for Environmental Monitoring of Human Leptospirosis. Search on Bibsonomy Remote. Sens. The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
23Effrosyni Doutsi, Marc Antonini, Panagiotis Tsakalides Neuronal Communication Process Opens New Directions in Image and Video Compression Systems. Search on Bibsonomy ERCIM News The full citation details ... 2021 DBLP  BibTeX  RDF
23Barry Hoberman, Jean-Pierre Nozieres SOT-MRAM - Third generation MRAM memory opens new opportunities : Hot Chips Conference August 2021. Search on Bibsonomy HCS The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
23Hanne Scheers, Tinne De Laet Interactive and Explainable Advising Dashboard Opens the Black Box of Student Success Prediction. Search on Bibsonomy EC-TEL The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
23Niranjan Kumar Ray, Kamalakanta Mahapatra New IEEE Consumer Technology Society Chapter Opens in Odisha, India. Search on Bibsonomy IEEE Consumer Electron. Mag. The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
23Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. Search on Bibsonomy ITC The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
23Mark Fosberry, Ben McMahon Matlab JTAG AXI Master opens new dimensions for development and testability. Search on Bibsonomy NATW The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
23Jeffrey Stuecheli, William J. Starke, John D. Irish, L. Baba Arimilli, Daniel M. Dreps, Bart Blaner, Curt Wollbrink, Brian Allison IBM POWER9 opens up a new era of acceleration enablement: OpenCAPI. Search on Bibsonomy IBM J. Res. Dev. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23Sibendu Som, Yuanjiang Pei HPC Opens a New Frontier in Fuel-Engine Research. Search on Bibsonomy Comput. Sci. Eng. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23Ahmed Shihab Albahri, A. A. Zaidan 0001, Osamah Shihab Albahri, B. B. Zaidan, M. A. Alsalem 0001 Real-Time Fault-Tolerant mHealth System: Comprehensive Review of Healthcare Services, Opens Issues, Challenges and Methodological Aspects. Search on Bibsonomy J. Medical Syst. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23John Edwards 0001 Signal Processing Opens the Internet of Things to a New World of Possibilities: Research Leads to New Internet of Things Technologies and Applications [Special Reports]. Search on Bibsonomy IEEE Signal Process. Mag. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23Tan Li, Hosung Lee, GeunYong Bak, Sanghyeon Baeg Failure signature analysis of power-opens in DDR3 SDRAMs. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23Niyati Chhaya, Kokil Jaidka, Rahul Wadbude Predicting Email Opens with Domain-Sensitive Affect Detection. Search on Bibsonomy CICLing (2) The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23Konstantin Thierbach, Pierre-Louis Bazin, Walter de Back, Filippos Gavriilidis, Evgeniya Kirilina, Carsten Jäger, Markus Morawski, Stefan Geyer, Nikolaus Weiskopf, Nico Scherf Combining Deep Learning and Active Contours Opens The Way to Robust, Automated Analysis of Brain Cytoarchitectonics. Search on Bibsonomy MLMI@MICCAI The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
23Harvey Glickenstein Rio Opens Tram Line for Olympics [Transportation Systems]. Search on Bibsonomy IEEE Veh. Technol. Mag. The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
23Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. Search on Bibsonomy ATS The full citation details ... 2016 DBLP  DOI  BibTeX  RDF
23Andrea Cavallo, Ovidiu V. Lungu, Cristina Becchio, Caterina Ansuini, Aldo Rustichini, Luciano Fadiga When gaze opens the channel for communication: Integrative role of IFG and MPFC. Search on Bibsonomy NeuroImage The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
23Arif Raza, Luiz Fernando Capretz Addressing User Requirements in Opens Source Software: The Role of Online Forums. Search on Bibsonomy CoRR The full citation details ... 2015 DBLP  BibTeX  RDF
23Sampsa Hyysalo, Mikael Johnson The user as relational entity: Options that deeper insight into user representations opens for human-centered design. Search on Bibsonomy Inf. Technol. People The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
23John Edwards 0001 Signal Processing Opens New Views on Imaging [Special Reports]. Search on Bibsonomy IEEE Signal Process. Mag. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
23Adit D. Singh Scan based two-pattern tests: should they target opens instead of TDFs? Search on Bibsonomy LATS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
23Chao Han, Adit D. Singh Testing cross wire opens within complex gates. Search on Bibsonomy VTS The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
23Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays. Search on Bibsonomy Microprocess. Microsystems The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
23Richard Van Noorden Elsevier opens its papers to text-mining. Search on Bibsonomy Nat. The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
23Raju Balakrishnan, Rajesh Parekh Learning to predict subject-line opens for large-scale email marketing. Search on Bibsonomy IEEE BigData The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
23Jose Luis Garcia-Gervacio, Jaime Martínez-Castillo, Víctor H. Champac Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies. Search on Bibsonomy LATW The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
23Francesco Ciraulo Regular opens in constructive topology and a representation theorem for overlap algebras. Search on Bibsonomy Ann. Pure Appl. Log. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
23Jan Gaudestad, Vladimir Talanov, M. Marchetti Opens localization on silicon level in a Chip Scale Package using space domain reflectometry. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
23David A. Cartes, Joe H. Chow, Dan McCaugherty, Steven E. Widergren, Ganesh Kumar Venayagamoorthy The IEEE Computer Society Smart Grid Vision Project opens opportunites for computational intelligence. Search on Bibsonomy EAIS The full citation details ... 2013 DBLP  DOI  BibTeX  RDF
23Jan Gaudestad, Vladimir Talanov, Po Chih Huang Space Domain Reflectometry for opens detection location in microbumps. Search on Bibsonomy Microelectron. Reliab. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
23Kim Sneppen, Ian B. Dodd A Simple Histone Code Opens Many Paths to Epigenetics. Search on Bibsonomy PLoS Comput. Biol. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
23Jesús Moreno, Víctor H. Champac, Michel Renovell Low voltage testing for interconnect opens under process variations. Search on Bibsonomy LATW The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
23Robert Bogue Imaging technology opens up new robotic applications. Search on Bibsonomy Ind. Robot The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
23Evanthia Papadopoulou Net-Aware Critical Area Extraction for Opens in VLSI Circuits Via Higher-Order Voronoi Diagrams. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
23Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. Search on Bibsonomy DDECS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
23Athanasios Fevgas, Panagiota E. Tsompanopoulou, Panayiotis Bozanis iMuse Mobile Tour: A personalized multimedia museum guide opens to groups. Search on Bibsonomy ISCC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
23Seongmoon Wang An efficient method to screen resistive opens under presence of process variation. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
23Rajeev D. S. Raizada, Nikolaus Kriegeskorte Pattern-information fMRI: New questions which it opens up and challenges which face it. Search on Bibsonomy Int. J. Imaging Syst. Technol. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
23Jose Luis Garcia-Gervacio, Víctor H. Champac Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. Search on Bibsonomy ETS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
23Josep Rius 0001 A method for detecting resistive opens in buses. Search on Bibsonomy IOLTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
23Gary G. Yen When one door closes, another door opens... [Editor's Remarks]. Search on Bibsonomy IEEE Comput. Intell. Mag. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Johannes Karlsson, Adi Anani, Haibo Li 0001 Enabling Real-Time Video Services over Ad-Hoc Networks Opens the Gates for E-learning in Areas Lacking Infrastructure. Search on Bibsonomy Int. J. Interact. Mob. Technol. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras Delay caused by resistive opens in interconnecting lines. Search on Bibsonomy Integr. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Stéphane Grumbach Sino-French IT Lab in Beijing Opens to European Institutions. Search on Bibsonomy ERCIM News The full citation details ... 2009 DBLP  BibTeX  RDF
23Michele Favalli, Cecilia Metra Testing Resistive Opens and Bridging Faults Through Pulse Propagation. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Michael J. Marcus Wireless innovation and spectrum policy: FCC opens a new inquiry [Spectrum Policy and Regulatory Issues]. Search on Bibsonomy IEEE Wirel. Commun. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Michael J. Marcus Wireless innovation and spectrum policy: the fcc opens a new inquiry. Search on Bibsonomy IEEE Wirel. Commun. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Jose Luis Garcia-Gervacio, Víctor H. Champac Detectability analysis of small delays due to resistive opens considering process variations. Search on Bibsonomy IOLTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Pablo Maqueda, Josep Rius 0001 Analysis of the extra delay on interconnects caused by resistive opens and shorts. Search on Bibsonomy IOLTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23Chwee Liong Tee, Tzyy Haw Tan, Chin Chuan Ng Augmenting board test coverage with new intel powered opens boundary scan instruction. Search on Bibsonomy ITC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
23G. Anyfandi, Vasileios Laopodis, Vasilis Koulaidis, Nicolas Apostolopoulos, V. De Semir, D. Markovitsi, X. Tsilibaris Laboratory Door Opens to Non-formal Learning Communities. Science Centres as Mediators. Search on Bibsonomy Knowledge Construction in E-learning Context The full citation details ... 2008 DBLP  BibTeX  RDF
23Xijiang Lin, Janusz Rajski Test Generation for Interconnect Opens. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
23Jose M. M. Ferreira, Ana C. Leão Remote Access to Expensive SDRAM Test Equipment: Qimonda Opens the Shop-floor to Test Course Students. Search on Bibsonomy Int. J. Online Eng. The full citation details ... 2007 DBLP  BibTeX  RDF
23Harvey Glickenstein First portion of the Chicago's Circle Line opens [Transportation Systems]. Search on Bibsonomy IEEE Veh. Technol. Mag. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
23Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker 0001 A unified fault model and test generation procedure for interconnect opens and bridges. Search on Bibsonomy ETS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
23Víctor H. Champac, Antonio Zenteno, José L. Garcia Testing of resistive opens in CMOS latches and flip-flops. Search on Bibsonomy ETS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
23Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras Defective behaviours of resistive opens in interconnect lines. Search on Bibsonomy ETS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
23Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars Tests for address decoder delay faults in RAMs due to inter-gate opens. Search on Bibsonomy ETS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
23Shalini Ghosh, F. Joel Ferguson Estimating detection probability of interconnect opens using stuck-at tests. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2004 DBLP  DOI  BibTeX  RDF break fault, interconnect open, stuck-at test
23Zhuo Li 0001, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker A Circuit Level Fault Model for Resistive Opens and Bridges. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
23Bob Forbes The 5th Factor: Behavior Profiling Opens New Possibilities for Web Access Control. Search on Bibsonomy Inf. Secur. J. A Glob. Perspect. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
23Sue A. Olson Emboss opens up sequence analysis. Search on Bibsonomy Briefings Bioinform. The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
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