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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 1714 occurrences of 747 keywords
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Results
Found 4157 publication records. Showing 4157 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
36 | T. H. Manjula Devi, Pooja P. Shenoy, Swathi Saigali, Harsha Mathew, K. B. Raja, K. R. Venugopal 0001, Lalit M. Patnaik |
Extracting hidden image using histogram, DFT and SVM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Bangalore Compute Conf. ![In: Proceedings of the 2nd Bangalore Annual Compute Conference, Compute 2009, Bangalore, India, January 9-10, 2009, pp. 26, 2009, ACM, 978-1-60558-476-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
SVM, DFT, histogram, steganalysis |
36 | M. Ramalingam, K. Ramasami, Ponnambalam Venuvanalingam, J. Swaminathan |
Ab Initio and DFT Investigations of the Mechanistic Pathway of Singlet Bromocarbenes Insertion into C-H Bonds of Methane and Ethane. ![Search on Bibsonomy](Pics/bibsonomy.png) |
International Conference on Computational Science (2) ![In: Computational Science - ICCS 2007, 7th International Conference, Beijing, China, May 27 - 30, 2007, Proceedings, Part II, pp. 288-295, 2007, Springer, 978-3-540-72585-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
bromocarbenes, ab initio, DFT, insertions, IRC |
36 | Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell |
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(3), pp. 234-243, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
DFT, ADC, mixed-signal testing, SiP, DAC, system-in-package |
36 | Marie-Lise Flottes, Christian Landrault, A. Petitqueux |
A Unified DFT Approach for BIST and External Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(1), pp. 49-60, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
BIST, DFT, test point insertion, partial reset |
35 | Yiorgos Makris, Jamison Collins, Alex Orailoglu |
Fast hierarchical test path construction for DFT-free controller-datapath circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 185-190, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
fast hierarchical test path construction, DFT-free controller-datapath circuits, transparency based scheme, locally generated vectors, global design test, influence tables, valid control state sequences, module testing, fault coverage levels, vector counts, logic testing, test generation, automatic test pattern generation, ATPG, computational cost reduction |
35 | Michel Renovell, Florence Azaïs, Yves Bertrand |
The multi-configuration: A DFT technique for analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 54-59, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
multi-configuration technique, diagnosis facilities, 8/sup th/ order band pass filter, integrated circuit testing, design for testability, integrated circuit design, analog circuits, analogue integrated circuits, band-pass filters, DFT technique |
35 | Imtiaz P. Shaik, Michael L. Bushnell |
A graph approach to DFT hardware placement for robust delay fault BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 177-182, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
graph heuristic, DFT hardware placement, robust delay fault BIST, ULSI circuit, built-in self-testing model, design for testability hardware, hazard free structure, graph theory, logic testing, delays, built-in self test, integrated circuit testing, design for testability, fault location, digital integrated circuits, ULSI |
35 | Nilanjan Mukherjee 0001 |
Targeting "Zero DPPM" - Can we ever get there? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 163-163, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
35 | Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas 0001, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy., pp. 303-311, 2007, IEEE Computer Society, 0-7695-2885-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
35 | Cecilia Metra, Martin Omaña 0001, Daniele Rossi 0001, José Manuel Cazeaux, T. M. Mak |
The Other Side of the Timing Equation: a Result of Clock Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA, pp. 169-177, 2005, IEEE Computer Society, 0-7695-2464-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
35 | Baosheng Wang, Yuejian Wu, André Ivanov |
Designs for Reducing Test Time of Distributed Small Embedded SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings, pp. 120-128, 2004, IEEE Computer Society, 0-7695-2241-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Distributed Small Embedded SRAMs, Data Retention Fault Test, Response Analysis, Test Time |
35 | Debjyoti Ghosh, Swarup Bhunia, Kaushik Roy 0001 |
Multiple Scan Chain Design Technique for Power Reduction during Test Application in BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 191-198, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
33 | Sanjiv Taneja |
DFT Aware Layout - Layout Aware DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Hichem Boudali, A. P. Nijmeijer, Mariëlle Stoelinga |
DFTSim: a simulation tool for extended dynamic fault trees. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SpringSim ![In: Proceedings of the 2009 Spring Simulation Multiconference, SpringSim 2009, San Diego, California, USA, March 22-27, 2009, 2009, SCS/ACM. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
reliability benchmark, dependability analysis, simulation tool, dynamic fault trees |
32 | Martin Rötteler, Thomas Beth |
Representation-theoretical properties of the approximate quantum Fourier transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Appl. Algebra Eng. Commun. Comput. ![In: Appl. Algebra Eng. Commun. Comput. 19(3), pp. 177-193, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Quantum Fourier transform, Basefield transforms, Quantum computing |
32 | Soo-Chang Pei, Jian-Jiun Ding, Wen-Liang Hsue, Kuo-Wei Chang |
Generalized Commuting Matrices and Their Eigenvectors for DFTs, Offset DFTs, and Other Periodic Operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Signal Process. ![In: IEEE Trans. Signal Process. 56(8-2), pp. 3891-3904, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
32 | Shaohua Li 0001, Defeng Huang, Khaled Ben Letaief, Zucheng Zhou |
Multi-Stage Beamforming for Coded OFDM with Multiple Transmit and Multiple Receive Antennas. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Wirel. Commun. ![In: IEEE Trans. Wirel. Commun. 6(3), pp. 959-969, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Loganathan Lingappan, Niraj K. Jha |
Efficient Design for Testability Solution Based on Unsatisfiability for Register-Transfer Level Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(7), pp. 1339-1345, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | I. Faik Baskaya, Brian Gestner, Christopher M. Twigg, Sung Kyu Lim, David V. Anderson, Paul E. Hasler |
Rapid Prototyping of Large-scale Analog Circuits With Field Programmable Analog Array. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FCCM ![In: IEEE Symposium on Field-Programmable Custom Computing Machines, FCCM 2007, 23-25 April 2007, Napa, California, USA, pp. 319-320, 2007, IEEE Computer Society, 0-7695-2940-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Andreas Bonelli, Franz Franchetti, Juergen Lorenz, Markus Püschel, Christoph W. Ueberhuber |
Automatic Performance Optimization of the Discrete Fourier Transform on Distributed Memory Computers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPA ![In: Parallel and Distributed Processing and Applications, 4th International Symposium, ISPA 2006, Sorrento, Italy, December 4-6, 2006, Proceedings, pp. 818-832, 2006, Springer, 3-540-68067-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
32 | Ping Tak Peter Tang |
DFTI---a new interface for fast fourier transform libraries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Math. Softw. ![In: ACM Trans. Math. Softw. 31(4), pp. 475-507, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
interface, software, FFT, API |
32 | Xiaoming Yu, Miron Abramovici |
Sequential circuit ATPG using combinational algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(8), pp. 1294-1310, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Janusz Rajski |
Embedded Test Technology - Brief History, Current Status, and Future Directions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
32 | Grace Nordin, Peter A. Milder, James C. Hoe, Markus Püschel |
Automatic generation of customized discrete fourier transform IPs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005, pp. 471-474, 2005, ACM, 1-59593-058-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
design generator, FPGA, IP, discrete fourier transform |
32 | Cecilia Metra, T. M. Mak, Martin Omaña 0001 |
Fault secureness need for next generation high performance microprocessor design for testability structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Conf. Computing Frontiers ![In: Proceedings of the First Conference on Computing Frontiers, 2004, Ischia, Italy, April 14-16, 2004, pp. 444-450, 2004, ACM, 1-58113-741-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
built in self test, design for testability, microprocessor, comparator, fault secureness |
32 | Jiun-In Guo, Chih-Da Chien, Chien-Chang Lin |
A parameterized low power design for the variable-length discrete Fourier transform using dynamic pipelining. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (5) ![In: Proceedings of the 2003 International Symposium on Circuits and Systems, ISCAS 2003, Bangkok, Thailand, May 25-28, 2003, pp. 293-296, 2003, IEEE, 0-7803-7761-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
32 | Teresa L. McLaurin, Frank Frederick, Rich Slobodnik |
The Testability Features of The ARM1026EJ Microprocessor Core. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 773-782, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
32 | Normand Beaudoin, Steven S. Beauchemin |
An Accurate Discrete Fourier Transform for Image Processing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (3) ![In: 16th International Conference on Pattern Recognition, ICPR 2002, Quebec, Canada, August 11-15, 2002., pp. 935-, 2002, IEEE Computer Society, 0-7695-1695-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Cheong Yiu Fung, S. C. Chan 0001 |
A multistage filterbank-based channelizer and its multiplier-less realization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (3) ![In: Proceedings of the 2002 International Symposium on Circuits and Systems, ISCAS 2002, Scottsdale, Arizona, USA, May 26-29, 2002, pp. 429-432, 2002, IEEE, 0-7803-7448-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Jiun-In Guo, Chien-Chang Lin |
A new hardware efficient design for the one dimensional discrete Fourier transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (5) ![In: Proceedings of the 2002 International Symposium on Circuits and Systems, ISCAS 2002, Scottsdale, Arizona, USA, May 26-29, 2002, pp. 549-552, 2002, IEEE, 0-7803-7448-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Normand Beaudoin, Steven S. Beauchemin |
Accurate Numerical Fourier Transform in d-Dimensions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SNSC ![In: Symbolic and Numerical Scientific Computation, Second International Conference, SNSC 2001, Hagenberg, Austria, September 10-11, 2001, Revised Papers, pp. 266-278, 2001, Springer, 3-540-40554-2. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
32 | Elizabeth M. Rudnick, Vivek Chickermane, Prithviraj Banerjee, Janak H. Patel |
Sequential circuit testability enhancement using a nonscan approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 3(2), pp. 333-338, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
32 | Srinivas Chellappa, Franz Franchetti, Markus Püschel |
Computer generation of fast fourier transforms for the cell broadband engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICS ![In: Proceedings of the 23rd international conference on Supercomputing, 2009, Yorktown Heights, NY, USA, June 8-12, 2009, pp. 26-35, 2009, ACM, 978-1-60558-498-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
dft, multibuffering, performance library, parallelization, streaming, fast fourier transform, multicore, program generation, cell be, automatic performance tuning |
32 | Anna Amat, Antonio Sgamellotti, Simona Fantacci |
Theoretical Study of the Structural and Electronic Properties of Luteolin and Apigenin Dyes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (1) ![In: Computational Science and Its Applications - ICCSA 2008, International Conference, Perugia, Italy, June 30 - July 3, 2008, Proceedings, Part I, pp. 1141-1155, 2008, Springer, 978-3-540-69838-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
MP2, flavones, flavonoids, apigenin, luteolin, electronic structure, DFT |
32 | Ahmed Mostayed, Mohammad Mynuddin Gani Mazumder, Sikyung Kim, Se Jin Park |
Abnormal Gait Detection Using Discrete Fourier Transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MUE ![In: 2008 International Conference on Multimedia and Ubiquitous Engineering (MUE 2008), 24-26 April 2008, Busan, Korea, pp. 36-40, 2008, IEEE Computer Society, 978-0-7695-3134-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
DFT, Detection, Gait, Abnormal |
32 | Salem Abdennadher, Saghir A. Shaikh |
Practices in Mixed-Signal and RF IC Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(4), pp. 332-339, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
I/O testing, SiP testing, wireless transceiver testing, DFT, built-in tests, ATE |
32 | Daniel J. Bernstein |
The Tangent FFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AAECC ![In: Applied Algebra, Algebraic Algorithms and Error-Correcting Codes, 17th International Symposium, AAECC-17, Bangalore, India, December 16-20, 2007, Proceedings, pp. 291-300, 2007, Springer, 978-3-540-77223-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Tangent FFT, split-radix FFT, modified split-radix FFT, scaled odd tail, DFT, communication complexity, convolution, polynomial multiplication, algebraic complexity |
32 | Toshinori Hosokawa, Kenichi Kawaguchi, Mitsuyasu Ohta, Michiaki Muraoka |
A Design for testability Method Using RTL Partitioning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 88-93, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
line-up structure, internally balanced structure, acyclic structure, partitioning, ATPG, DFT, RTL, isolation, balanced structure |
32 | Krishna B. Rajan, David E. Long, Miron Abramovici |
Increasing testability by clock transformation (getting rid of those darn states). ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 224-230, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
clock transformation, sequential test generation, darn states, easy-to-reach states, logic testing, partitioning, design for testability, sequential circuits, DFT, fault coverage, testability, flip-flops, flip-flops, clocks, logic partitioning |
32 | S. Lavabre, Yves Bertrand, Michel Renovell, Christian Landrault |
Test configurations to enhance the testability of sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 160-168, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
shift operation, scan register, test operation, modified flip-flops, ISCAS89 benchmarks, multiconfiguration, triconfiguration, dynamic generation, logic testing, controllability, design for testability, design for testability, sequential circuits, sequential circuits, observability, observability, DFT, fault coverage, flip-flops, minimisation, scan designs, test application time, test vector |
31 | Lampros Dermentzoglou, Y. Tsiatouhas, Angela Arapoyanni |
A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled Oscillators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(2), pp. 133-142, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Radio Frequency (RF) Testing, Design for Testability (DFT), Voltage Controlled Oscillator (VCOs) |
31 | Hakim Bederr, Michael Nicolaidis, Alain Guyot |
Analytic approach for error masking elimination in on-line multipliers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Symposium on Computer Arithmetic ![In: 12th Symposium on Computer Arithmetic (ARITH-12 '95), July 19-21, 1995, Bath, England, UK, pp. 30-37, 1995, IEEE Computer Society, 0-8186-7089-4. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
error masking elimination, online multipliers, high precision numbers, scan design approach, internal state observability, DFT approach, sequential circuits, digital arithmetic, fault coverage, multiplying circuits, area overhead |
28 | Yu Wang 0019, Hongyi Wu, Ha Dang |
Analytic study of Delay/Fault-Tolerant Mobile Sensor Networks (DFT-MSN's). ![Search on Bibsonomy](Pics/bibsonomy.png) |
WOWMOM ![In: 10th IEEE International Symposium on a World of Wireless, Mobile and Multimedia Networks, WOWMOM 2009, Kos Island, Greece, 15-19 June, 2009, pp. 1-9, 2009, IEEE Computer Society, 978-1-4244-4439-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
28 | Nadia El Mrabet, Christophe Nègre |
Finite Field Multiplication Combining AMNS and DFT Approach for Pairing Cryptography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACISP ![In: Information Security and Privacy, 14th Australasian Conference, ACISP 2009, Brisbane, Australia, July 1-3, 2009, Proceedings, pp. 422-436, 2009, Springer, 978-3-642-02619-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
AMNS, discrete Fourrier transform, finite fields, Pairing |
28 | Satyender Goel, Artëm E. Masunov |
Pairwise Spin-Contamination Correction Method and DFT Study of MnH and H2 Dissociation Curves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCS (2) ![In: Computational Science - ICCS 2009, 9th International Conference, Baton Rouge, LA, USA, May 25-27, 2009, Proceedings, Part II, pp. 141-150, 2009, Springer, 978-3-642-01972-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
28 | Meng-Lin Ku, Chia-Chi Huang |
A derivation on the equivalence between newton's method and DF DFT-based method for channel estimation in OFDM systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Wirel. Commun. ![In: IEEE Trans. Wirel. Commun. 7(10), pp. 3982-3987, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
28 | Hanguang Wu, Thomas Haustein |
Radio Resource Management for the Multi-User Uplink Using DFT-Precoded OFDM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICC ![In: Proceedings of IEEE International Conference on Communications, ICC 2008, Beijing, China, 19-23 May 2008, pp. 4724-4728, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
28 | Stephan Jaeckel, Volker Jungnickel |
On the Optimality of Frequency-Domain Equalization in DFT-Spread MIMO-OFDM Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WCNC ![In: WCNC 2008, IEEE Wireless Communications & Networking Conference, March 31 2008 - April 3 2008, Las Vegas, Nevada, USA, Conference Proceedings, pp. 1172-1177, 2008, IEEE, 978-1-4244-1997-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
28 | Chao Wang 0019, Chunyan Huang, Xiaoli Zhang, Huaxiang Wang |
Mixing Frequency Bio-impedance Measurement Technology based on DFT and Virtual Reference Vector. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BMEI (2) ![In: Proceedings of the 2008 International Conference on BioMedical Engineering and Informatics, BMEI 2008, May 28-30, 2008, Sanya, Hainan, China - Volume 2, pp. 455-459, 2008, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Bio-impedance Measurement, Mixing frequency Excitation, Discrete Fourier Transform Demodulation, Virtual Preference Vector, Dynamic Information Detection |
28 | Venkat Satagopan, Bonita Bhaskaran, Waleed K. Al-Assadi, Scott C. Smith, Sindhu Kakarla |
DFT Techniques and Automation for Asynchronous NULL Conventional Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 15(10), pp. 1155-1159, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
28 | Saad Bouguezel, M. Omair Ahmad, M. N. S. Swamy |
A General Class of Split-Radix FFT Algorithms for the Computation of the DFT of Length-2m. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Signal Process. ![In: IEEE Trans. Signal Process. 55(8), pp. 4127-4138, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
28 | Salvatore Distefano, Antonio Puliafito |
DFT and DRBD in Computing Systems Dependability Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAFECOMP ![In: Computer Safety, Reliability, and Security, 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007., pp. 423-429, 2007, Springer, 978-3-540-75100-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
28 | Ajmal H. Hamdani, S. Shahdin |
DFT studies of closely bound ground state of (N2-N2)+1 ionic dimmer. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICQNM ![In: First International Conference on Quantum, Nano, and Micro Technologies, ICQNM 2007, January 2-6, 2007, Guadeloupe, French Caribbean, pp. 5, 2007, IEEE Computer Society, 0-7695-2759-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
28 | Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla |
A Novel RF Test Scheme Based on a DFT Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(3), pp. 229-237, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
RF design-for-testability, known-good-die, defects, low noise amplifier, RF test |
28 | Soumendu Bhattacharya, Abhijit Chatterjee |
A DFT Approach for Testing Embedded Systems Using DC Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(6), pp. 464-475, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
computer-aided design, test generation, built-in tests, reliability and testing |
28 | Dong Li, Feng Guo, Guosong Li, Liyu Cai |
Enhanced DFT Interpolation-based Channel Estimation for OFDM Systems with Virtual Subcarriers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTC Spring ![In: Proceedings of the 63rd IEEE Vehicular Technology Conference, VTC Spring 2006, 7-10 May 2006, Melbourne, Australia, pp. 1580-1584, 2006, IEEE. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | Xuan-Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach |
A DFT Architecture for Asynchronous Networks-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 11th European Test Symposium, ETS 2006, Southhampton, UK, May 21-24, 2006, pp. 219-224, 2006, IEEE Computer Society, 0-7695-2566-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | Andrew Naftel, Shehzad Khalid |
Motion Trajectory Learning in the DFT-Coefficient Feature Space. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICVS ![In: 2006 IEEE International Conference on Computer Vision Systems, January 5-7, 2006, St. Johns University, Manhattan, New York City, New York, NY, USA, Proceedings, CDROM, pp. 47, 2006, IEEE Computer Society, 0-7695-2506-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | M. Ramalingam, K. Ramasami, Ponnambalam Venuvanalingam, V. Sethuraman |
C-H Functionalisation Through Singlet Chlorocarbenes Insertions - MP2 and DFT Investigations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
International Conference on Computational Science (3) ![In: Computational Science - ICCS 2006, 6th International Conference, Reading, UK, May 28-31, 2006, Proceedings, Part III, pp. 143-152, 2006, Springer, 3-540-34383-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
28 | See-May Phoong, Yubing Chang, Chun-Yang Chen |
DFT-modulated filterbank transceivers for multipath fading channels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Signal Process. ![In: IEEE Trans. Signal Process. 53(1), pp. 182-192, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
28 | Gagan Rath, Christine Guillemot |
Subspace algorithms for error localization with quantized DFT codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Commun. ![In: IEEE Trans. Commun. 52(12), pp. 2115-2124, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | Yuan-Pei Lin, See-May Phoong |
DFT based transceivers with-windowing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCC ![In: Proceedings of the 9th IEEE Symposium on Computers and Communications (ISCC 2006), June 28 - July 1, 2004, Alexandria, Egypt, pp. 574-579, 2004, IEEE Computer Society, 0-7803-8623-X. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher |
An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 38-47, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1108-1117, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | Jeff Remmers, Moe Villalba, Richard Fisette |
Hierarchical DFT Methodology - A Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 847-856, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | K. Nikila, Rubin A. Parekhji |
DFT for Test Optimisations in a Complex Mixed-Signal SOC - Case Study on TI's TNETD7300 ADSL Modem Device. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 773-782, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
28 | Muhammad Nummer, Manoj Sachdev |
A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(3), pp. 299-314, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
high-performance testing, controlled-delay flip-flop, built-in self test, delay-fault testing, design for delay testability |
28 | Saad Bouguezel, M. Omair Ahmad, M. N. S. Swamy |
A split-radix algorithm for 2-D DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (3) ![In: Proceedings of the 2003 International Symposium on Circuits and Systems, ISCAS 2003, Bangkok, Thailand, May 25-28, 2003, pp. 698-701, 2003, IEEE, 0-7803-7761-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
28 | Kenneth E. Posse, Geir Eide |
Key Impediments to DFT-Focused Test and How to Overcome Them. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 503-511, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
28 | Rubin A. Parekhji |
Testing Embedded Cores and SOCs-DFT, ATPG and BIST Solutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India, pp. 17, 2003, IEEE Computer Society, 0-7695-1868-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
28 | Yiorgos Makris, Jamison Collins, Alex Orailoglu |
Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(1), pp. 29-42, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
controller-datapath circuit, hierarchical test path, influence tables, transparency |
28 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1130-1139, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
28 | Dawit Belete, Ashutosh Razdan, William Schwarz, Rajesh Raina, Christopher Hawkins, Jeff Morehead |
Use of DFT Techniques In Speed Grading a 1GHz+ Microprocessor . ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1111-1119, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
28 | Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung |
Re-Using DFT Logic for Functional and Silicon Debugging Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 648-656, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
28 | Yaxiao Song, Minghao Cui, Hongxun Yao |
A High Capacity Data Hiding Scheme Based on DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Pacific Rim Conference on Multimedia ![In: Advances in Multimedia Information Processing - PCM 2002, Third IEEE Pacific Rim Conference on Multimedia, Hsinchu, Taiwan, December 16-18, 2002, Proceedings, pp. 82-88, 2002, Springer, 3-540-00262-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
28 | Janusz Rajski |
DFT for High-Quality Low Cost Manufacturing Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 3-, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
28 | N. Nakanishi, Yoshio Itoh, Yutaka Fukui, Kensaku Fujii |
Noise reduction system using modified DFT pair. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (2) ![In: Proceedings of the 2001 International Symposium on Circuits and Systems, ISCAS 2001, Sydney, Australia, May 6-9, 2001, pp. 9-12, 2001, IEEE, 0-7803-6685-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
28 | Antonio Zenteno, Víctor H. Champac |
Resistive Opens in a Class of CMOS Latches: Analysis and DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 138-144, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
28 | Debesh Kumar Das, Satoshi Ohtake, Hideo Fujiwara |
New DFT Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 263-268, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
28 | Jae-Hwa Kim, Tae-Gyu Chang |
Analytic derivation of the performance degradation in recursive implementation of sliding-DFT with the twiddle factors of finite-bit precision. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (3) ![In: Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30 - June 2, 1999, pp. 504-507, 1999, IEEE, 0-7803-5471-0. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
28 | Gadi Singer |
The Future of Test and DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 14(3), pp. 11-14, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
28 | Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu |
DfT Architecture for 3D-SICs with Multiple Towers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, pp. 51-56, 2011, IEEE Computer Society, 978-0-7695-4433-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
three-dimensional stacking, 3D-SIC, multi-tower, DfT, wrapper, design-for-test, TSV, through-silicon via |
28 | S. Saqib Khursheed, Sheng Yang 0003, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn |
Improved DFT for Testing Power Switches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, pp. 7-12, 2011, IEEE Computer Society, 978-0-7695-4433-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
power switch, leakage power management, test time overhead, DFT, design for test, Sleep transistor |
28 | Jiancheng Zou, Xin Yang, Shaozhang Niu |
A Novel Robust Watermarking Method for Certificates Based on DFT and Hough Transforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IIH-MSP ![In: Sixth International Conference on Intelligent Information Hiding and Multimedia Signal Processing (IIH-MSP 2010), Darmstadt, Germany, 15-17 October, 2010, Proceedings, pp. 438-441, 2010, IEEE Computer Society, 978-1-4244-8378-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
certificate security, digital watermark, DFT, Hough transformations |
28 | Sandhya Seshadri, Michael S. Hsiao |
Behavioral-Level DFT via Formal Operator Testability Measures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(6), pp. 595-611, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
behavioral level, operator testability, value range, SSA representation, DFT |
28 | Daniela De Venuto, Michael J. Ohletz, Bruno Riccò |
Digital Window Comparator DfT Scheme for Mixed-Signal ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(2), pp. 121-128, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
mixed-signal ASIC, window comparator, GO/NOGO test, signal level evaluation, DfT |
28 | Eduardo Fullea, José María Martínez Sanchez |
Robust digital image watermarking using DWT, DFT and quality based average. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Multimedia ![In: Proceedings of the 9th ACM International Conference on Multimedia 2001, Ottawa, Ontario, Canada, September 30 - October 5, 2001, pp. 489-491, 2001, ACM, 1-58113-394-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
estimated quality based average, watermark, DFT, DWT, stirmark |
28 | Hsin-Po Wang 0002, Jon Turino |
DFT and BIST techniques for the future. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 6-7, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
multimillion gate system-on-chip, multinational design, logic testing, built-in self test, design for testability, quality, BIST, economics, DFT, integrated circuit design, time to market, production testing, IC design, integrated circuit economics |
28 | Diego Vázquez, José L. Huertas, Adoración Rueda |
Reducing the impact of DFT on the performance of analog integrated circuits: improved sw-op amp design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 42-47, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
sw-op amp design, CMOS implementations, design efforts, cell design, integrated circuit testing, design for testability, DFT, integrated circuit design, power dissipation, operational amplifiers, area, analogue integrated circuits, IC testing, analog integrated circuits, CMOS analogue integrated circuits |
28 | Sandeep Pagey, Ajay Khoche, Erik Brunvand |
DFT for fast testing of self-timed control circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 382-386, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
fast testing, self-timed control circuits, execution paths, simultaneous testing, OCCAM based circuit compiler, OCCAM program, self-timed macro-modules, modified modules, macromodules, fault diagnosis, logic testing, delays, design for testability, DFT, logic CAD, asynchronous circuits, translation, program compilers, automatic test software |
27 | Richard M. Chou, Kewal K. Saluja |
Sequential Circuit Testing: From DFT to SFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India, pp. 274-278, 1997, IEEE Computer Society, 0-8186-7755-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
design-for-testability methods, SFT techniques, large sequential circuits, logic testing, automatic test pattern generation, ATPG, synthesis-for-testability, sequential circuit testing, DFT techniques |
27 | Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio (eds.) |
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE, 979-8-3503-1500-4 The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Momona Mizota, Toshinori Hosokawa, Masayoshi Yoshimura, Masayuki Arai |
A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Tobias Kilian, Abhishek Sengupta, Daniel Tille, Martin Huch, Ulf Schlichtmann |
An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Govind Rajhans Jadhav, Sonali Shukla, Virendra Singh |
On Attacking Scan-based Logic Locking Schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | S. Bouat, Stéphanie Anceau, Laurent Maingault, Jessy Clédière, Luc Salvo, Rémi Tucoulou |
X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Christos Georgakidis, Dimitris Valiantzas, Stavros Simoglou, Iordanis Lilitsis, Nikolaos Chatzivangelis, Ilias Golfos, Marko S. Andjelkovic, Christos P. Sotiriou, Milos Krstic |
Towards a Comprehensive SET Analysis Flow for VLSI Circuits using Static Timing Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Zahin Ibnat, Hadi Mardani Kamali, Farimah Farahmandi |
Iterative Mitigation of Insecure Resource Sharing Produced by High-level Synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Shruti Dutta, Sai Charan Rachamadugu Chinni, Abhishek Das, Nur A. Touba |
Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
27 | Yudai Toyooka, Haruki Watanabe, Toshinori Hosokawa, Masayoshi Yoshimura |
An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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