Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
18	Albert V. Ferris-Prabhu	On the assumptions contained in semiconductor yield models.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
18	Michael R. Kump, Robert W. Dutton	The efficient simulation of coupled point defect and impurity diffusion.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1988	DBLP DOI BibTeX RDF
17	Manuela Kunz, Steven Devlin, Ren Hui Gong, Jiro Inoue, Stephen D. Waldman, Mark B. Hurtig, Purang Abolmaesumi, A. James Stewart	Prediction of the Repair Surface over Cartilage Defects: A Comparison of Three Methods in a Sheep Model.	MICCAI (1)	2009	DBLP DOI BibTeX RDF
17	Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker 0001, Stefan Spinner, Xiaoqing Wen	Diagnosis of Realistic Defects Based on the X-Fault Model.	DDECS	2008	DBLP DOI BibTeX RDF
17	Suraj C. Kothari	Scalable Program Comprehension for Analyzing Complex Defects.	ICPC	2008	DBLP DOI BibTeX RDF
17	Kyoungwoo Lee, Aviral Shrivastava, Minyoung Kim, Nikil D. Dutt, Nalini Venkatasubramanian	Mitigating the impact of hardware defects on multimedia applications: a cross-layer approach.	ACM Multimedia	2008	DBLP DOI BibTeX RDF	error-awareness, cross-layer, soft error, video encoding
17	Ewaryst Rafajlowicz	Improving the Efficiency of Counting Defects by Learning RBF Nets with MAD Loss.	ICAISC	2008	DBLP DOI BibTeX RDF
17	Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Suriyaprakash Natarajan	On efficient generation of instruction sequences to test for delay defects in a processor.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	native-mode self-test, delay test, software based self-test
17	Thomas Zimmermann 0001, Nachiappan Nagappan	Predicting defects using network analysis on dependency graphs.	ICSE	2008	DBLP DOI BibTeX RDF	windows server 2003, network analysis, dependency graph, defect prediction
17	Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas	High-Quality Transition Fault ATPG for Small Delay Defects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2007	DBLP DOI BibTeX RDF
17	J. B. Rainsberger	Avoiding Defects.	IEEE Softw.	2007	DBLP DOI BibTeX RDF	software quality, testing strategies, testing and debugging
17	Makoto Matsumoto, Isaku Wada, Ai Kuramoto, Hyo Ashihara	Common defects in initialization of pseudorandom number generators.	ACM Trans. Model. Comput. Simul.	2007	DBLP DOI BibTeX RDF	Difference collision, interstream correlation, nearly affine dependence, Monte-Carlo simulation, pseudorandom number generator
17	Teijiro Isokawa, Shin'ya Kowada, Ferdinand Peper, Naotake Kamiura, Nobuyuki Matsui	Online isolation of defects in cellular nanocomputers.	Frontiers Comput. Sci. China	2007	DBLP DOI BibTeX RDF	radom fly, cellular automata, asynchronous, nanotechnology, defect tolerance
17	Ahmed H. Eid, Brian E. Cooper, Mohamed N. Ahmed	Characterization of Ghosting Defects in Electrophotographic Printers.	ICIP (3)	2007	DBLP DOI BibTeX RDF
17	Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab	Automatic Generation of Instructions to Robustly Test Delay Defects in Processors.	ETS	2007	DBLP DOI BibTeX RDF
17	Alexandre Ney, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian	Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.	ETS	2007	DBLP DOI BibTeX RDF
17	Giuseppe Acciani, Gioacchino Brunetti, Girolamo Fornarelli	Automatic Detection of Solder Joint Defects on Integrated Circuits.	ISCAS	2007	DBLP DOI BibTeX RDF
17	Jeanette Heidenberg, Andreas Nåls, Ivan Porres	Statechart Features and Pre-Release Defects in Software Maintenance.	VL/HCC	2007	DBLP DOI BibTeX RDF
17	Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi	Diagnosis of Full Open Defects in Interconnecting Lines.	VTS	2007	DBLP DOI BibTeX RDF	Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS
17	Alexandre Ney, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian	Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs.	VTS	2007	DBLP DOI BibTeX RDF
17	Claudio M. Privitera, Lawrence W. Stark	A Binocular Pupil Model for Simulation of Relative Afferent Pupil Defects and the Swinging Flashlight Test.	Biol. Cybern.	2006	DBLP DOI BibTeX RDF
17	Ibrahim Cem Baykal, Graham A. Jullien	On the Use of Hash Functions as Preprocessing Algorithms to Detect Defects on Repeating Definite Textures.	Mach. Vis. Appl.	2006	DBLP DOI BibTeX RDF	In-camera, FPGA, Real-time, Segmentation, Defect detection, Camera network
17	Rudolf Ahlswede, Mark S. Pinsker	Report on Models of Write-Efficient Memories with Localized Errors and Defects.	GTIT-C	2006	DBLP DOI BibTeX RDF
17	Fernando Gayubo, José Luis González 0005, Eusebio de la Fuente López, Félix Miguel Trespaderne, José R. Perán	On-line machine vision system for detect split defects in sheet-metal forming processes.	ICPR (1)	2006	DBLP DOI BibTeX RDF
17	Mario I. Chacon, Graciela Ramírez Alonso	Wood Defects Classification Using a SOM/FFP Approach with Minimum Dimension Feature Vector.	ISNN (2)	2006	DBLP DOI BibTeX RDF
17	Hakan Özdemir, Güngör Baser	Computer Simulation of Woven Fabric Defects Based on Faulty Yarn Photographs.	ISCIS	2006	DBLP DOI BibTeX RDF	Fabric simulation, fabric appearance, woven fabric faults, elastica curve, yarn flattening
17	Sandeep Dechu, Manoj Kumar Goparaju, Spyros Tragoudas	A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates.	DFT	2006	DBLP DOI BibTeX RDF
17	Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand	Delay Testing Viability of Gate Oxide Short Defects.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF	gate oxide short (GOS), VLSI, delay testing, defect
17	Xianghua Xie, Majid Mirmehdi	Localising surface defects in random colour textures using multiscale texem analysis in image eigenchannels.	ICIP (3)	2005	DBLP DOI BibTeX RDF
17	Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas	Quality Transition Fault Tests Suitable for Small Delay Defects.	ICCD	2005	DBLP DOI BibTeX RDF
17	Marek Z. Reformat, Efe Igbide	Isolation of software defects: extracting knowledge with confidence.	IRI	2005	DBLP DOI BibTeX RDF
17	Mariam Momenzadeh, Marco Ottavi, Fabrizio Lombardi	Modeling QCA Defects at Molecular-level in Combinational Circuits.	DFT	2005	DBLP DOI BibTeX RDF	fault model, emerging technology, defect tolerance, QCA
17	Leendert M. Huisman	Diagnosing arbitrary defects in logic designs using single location at a time (SLAT).	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
17	Franz Pernkopf	Detection of surface defects on raw steel blocks using Bayesian network classifiers.	Pattern Anal. Appl.	2004	DBLP DOI BibTeX RDF	Light sectioning, Feature selection, Range imaging, Surface inspection, Bayesian network classifier
17	S. Sarala, S. Valli	A Tool to Automatically Detect Defects in C++ Programs.	CIT	2004	DBLP DOI BibTeX RDF	Function overloading, Hybrid Inheritance, Friend Function, Template Function, Dangling Reference, Test case, Automatic Generation, Virtual Function
17	Vittorio Murino, Manuele Bicego, Ivan A. Rossi	Statistical Classification of Raw Textile Defects.	ICPR (4)	2004	DBLP DOI BibTeX RDF
17	Mariam Momenzadeh, Mehdi Baradaran Tahoori, Jing Huang 0001, Fabrizio Lombardi	Quantum Cellular Automata: New Defects and Faults for New Devices.	IPDPS	2004	DBLP DOI BibTeX RDF
17	Robert C. Aitken	Redundancy & It's Not Just for Defects Anymore.	MTDT	2004	DBLP DOI BibTeX RDF
17	André Baresel, Harmen Sthamer, Joachim Wegener	Applying Evolutionary Testing to Search for Critical Defects.	GECCO (2)	2004	DBLP DOI BibTeX RDF
17	David L. DeMaris, Dan Maynard, Bette Bergman Reuter, Shi Zhong	An Information Retrieval System for the Analysis of Systematic Defects in VLSI.	ICTAI	2004	DBLP DOI BibTeX RDF
17	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Diagnosis of Hold Time Defects.	ICCD	2004	DBLP DOI BibTeX RDF
17	Ibrahim Cem Baykal, Graham A. Jullien	In-camera detection of fabric defects.	ISCAS (3)	2004	DBLP DOI BibTeX RDF
17	Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang 0001, Fabrizio Lombardi	Defects and Faults in Quantum Cellular Automata at Nano Scale.	VTS	2004	DBLP DOI BibTeX RDF
17	Haihua Yan, Adit D. Singh	Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study.	ITC	2004	DBLP DOI BibTeX RDF
17	Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng	Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
17	Zaid Al-Ars, Ad J. van de Goor	Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes.	MTDT	2003	DBLP DOI BibTeX RDF	two floating nodes, memory testing, DRAMs, dynamic faults, defect simulation
17	Alberto Machì, Fabio Collura	Accurate spatio-temporal restoration of compact single frame defects in aged motion pictures.	ICIAP	2003	DBLP DOI BibTeX RDF
17	José A. Calderón-Martínez, Pascual Campoy Cervera	A convolutional neural architecture: an application for defects detection in continuous manufacturing systems.	ISCAS (5)	2003	DBLP DOI BibTeX RDF
17	Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch	Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.	VTS	2003	DBLP DOI BibTeX RDF
17	Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak	Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models.	DAC	2003	DBLP DOI BibTeX RDF	delay ATPG, delay fault diagnosis, statistical timing models
17	Li Chen, Xiaoliang Bai, Sujit Dey	Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	interconnect, crosstalk, processor, self-test
17	Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001	RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	fault modeling, DFT, TPG, RTL
17	Peter G. Bishop, Robin E. Bloomfield	Worst Case Reliability Prediction Based on a Prior Estimate of Residual Defects.	ISSRE	2002	DBLP DOI BibTeX RDF	worst case reliability bound, residual fault prediction, reliability prediction, reliability testing
17	Takamichi Saito, Toshiyuki Kito, Kentaro Umesawa, Fumio Mizoguchi	Architectural Defects of the Secure Shell.	DEXA Workshops	2002	DBLP DOI BibTeX RDF
17	Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita	On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout.	ITC	2002	DBLP DOI BibTeX RDF
17	Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001	RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	Defect-Oriented Test (DOT), low-energy test, test generation, RTL
17	Luigi G. Occhipinti, Giuseppe E. Spoto, Marco Branciforte, Francesco Doddo	Defects detection and characterization by using cellular neural networks.	ISCAS (3)	2001	DBLP DOI BibTeX RDF
17	Claes Wohlin, Martin Höst, Magnus C. Ohlsson	Understanding the Sources of Software Defects: A Filtering Approach.	IWPC	2000	DBLP DOI BibTeX RDF	Defect understanding, software metrics, root cause analysis, prediction system, product measurements
17	Mark Oskin, Diana Keen, Justin Hensley, Lucian Vlad Lita, Frederic T. Chong	Reducing Cost and Tolerating Defects in Page-based Intelligent Memory.	ICCD	2000	DBLP DOI BibTeX RDF
17	Li Di, Song Yonglun, Ye Feng	On Line Monitoring of Weld Defects for Short-Circuit Gas Metal Arc Welding Based on the Self-Organize Feature Map Neural Networks.	IJCNN (5)	2000	DBLP DOI BibTeX RDF	weld, GMAW, neural networks, SOM, quality, defect
17	Amy Germida, James F. Plusquellic	Detection of CMOS Defects under Variable Processing Conditions.	VTS	2000	DBLP DOI BibTeX RDF	Built-In Differential Temperature Sensors, Fault Location, Mixed-Signal Circuits, Thermal Testing, Temperature Measurements
17	Anna Maria Brosa, Joan Figueras	Characterization of Floating Gate Defects in Analog Cells.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	floating gate defect, low-power/low-voltage analog circuits, analog testing
17	Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell	Testing for Floating Gates Defects in CMOS Circuits.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
17	Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey	Exposing floating gate defects in analogue CMOS circuits by power supply voltage control testing technique.	VLSI Design	1995	DBLP DOI BibTeX RDF	analogue CMOS circuits, power supply voltage control testing technique, floating gate defect exposure, power supply voltage sweep, fault diagnosis, integrated circuit testing, fault detection, fault coverage, integrated circuit modelling, CMOS analogue integrated circuits
14	Javier Carretero, Xavier Vera, Pedro Chaparro, Jaume Abella 0001	Microarchitectural Online Testing for Failure Detection in Memory Order Buffers.	IEEE Trans. Computers	2010	DBLP DOI BibTeX RDF	memory order buffer, error detection, soft errors, microarchitecture, defects, Online testing, control logic
14	Nathaniel Ayewah, William W. Pugh	The Google FindBugs fixit.	ISSTA	2010	DBLP DOI BibTeX RDF	java, static analysis, software quality, bugs, false positives, software defects, findbugs, bug patterns
14	Daniel Le Métayer, Manuel Maarek, Valérie Viet Triem Tong, Eduardo Mazza, Marie-Laure Potet, Nicolas Craipeau, Stéphane Frénot, Ronan Hardouin	Liability in software engineering: overview of the LISE approach and illustration on a case study.	ICSE (1)	2010	DBLP DOI BibTeX RDF	formal methods, specification, contract, defects, evidence, legal aspects, liability
14	Jian Wei Cheng, Melanie Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge N. Demidenko	Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.	DELTA	2010	DBLP DOI BibTeX RDF	data mining, clusters, classification, recognition, feature, classifier, defects
14	Melanie Po-Leen Ooi, Chris Chan, Wey Jean Tee, Ye Chow Kuang, Lindsay Kleeman, Serge N. Demidenko	Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.	DELTA	2010	DBLP DOI BibTeX RDF	data mining, clusters, segmentation, detection, defects
14	Salman Mirghasemi	Query-point debugging.	OOPSLA Companion	2009	DBLP DOI BibTeX RDF	dynamic breakpoint assignment, locating defects, query, program traces, execution monitoring
14	Douglas Buettner	A System Dynamics Model That Simulates a Significant Late Life Cycle Manpower Increase Phenomenon.	ICSP	2009	DBLP DOI BibTeX RDF	satellite software, inspections, unit testing, system dynamics, peer reviews, software defects, feedback loops
14	Nachiappan Nagappan, E. Michael Maximilien, Thirumalesh Bhat, Laurie A. Williams	Realizing quality improvement through test driven development: results and experiences of four industrial teams.	Empir. Softw. Eng.	2008	DBLP DOI BibTeX RDF	Defects/faults, Empirical study, Test driven development, Development time
14	Mauricio Jose Ordoñez, Hisham M. Haddad	The State of Metrics in Software Industry.	ITNG	2008	DBLP DOI BibTeX RDF	Cost of defects, State of metrics, Metrics in software industry, Software metrics
14	Ramakrishna Rao D	An Analysis of Missed Structure Field Handling Bugs.	SERA	2008	DBLP DOI BibTeX RDF	errors of omission, structure, defects
14	Smruti R. Sarangi, Satish Narayanasamy, Bruce Carneal, Abhishek Tiwari 0002, Brad Calder, Josep Torrellas	Patching Processor Design Errors with Programmable Hardware.	IEEE Micro	2007	DBLP DOI BibTeX RDF	hardware errors, microarchitecture for fault-tolerance, design defects in real processors, processor errata analysis
14	Ganesh J. Pai, Joanne Bechta Dugan	Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods.	IEEE Trans. Software Eng.	2007	DBLP DOI BibTeX RDF	object-oriented, metrics, Bayesian networks, software quality, regression, defects, Bayesian analysis, fault proneness
14	J. B. Rainsberger	Ship Effortlessly.	IEEE Softw.	2007	DBLP DOI BibTeX RDF	software delivery, postproduction, comeback defects, automation, version control
14	Angela Lozano, Michel Wermelinger, Bashar Nuseibeh	Assessing the impact of bad smells using historical information.	IWPSE	2007	DBLP DOI BibTeX RDF	bad smells, source cede, empirical study, software maintenance, software quality, software evolution, design defects, design flaws
14	William W. Pugh	Finding bugs in eclipse.	OOPSLA Companion	2007	DBLP DOI BibTeX RDF	Java, static analysis, software quality, eclipse, bugs, false positives, software defects, FindBugs, bug patterns
14	Sheela Ramanna, Rajen Bhatt, Piotr Biernot	A Rough-Hybrid Approach to Software Defect Classification.	RSFDGrC	2007	DBLP DOI BibTeX RDF	Neuro-Fuzzy-Decision Trees, Classification, Rough Sets, Software Defects
14	Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor	Opens and Delay Faults in CMOS RAM Address Decoders.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	address decoder delay faults, addressing methods, BIST, DFT, Memory testing, open defects
14	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001	Automatic Test Pattern Generation for Resistive Bridging Faults.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	resistive short defects, ATPG, SAT, bridging faults
14	Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet	Electro-thermal Stimuli for MEMS Testing in FSBM Technology.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	bulk micromachining, electro-thermal stimuli, testing, defects, MEMS
14	Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla	A Novel RF Test Scheme Based on a DFT Method.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	RF design-for-testability, known-good-die, defects, low noise amplifier, RF test
14	Scott Davidson 0001	Searching for clues: Diagnosing IC failures.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	IC failures, IC manufacturing, data mining, defects, yield enhancement, failure diagnosis
14	Ghi Paul Im, Richard L. Baskerville	A longitudinal study of information system threat categories: the enduring problem of human error.	Data Base	2005	DBLP DOI BibTeX RDF	information infrastructure protection, information system threat, information system threat taxonomy, software quality and reliability, information security, computer security, human error, software defects
14	Ahmed E. Hassan, Richard C. Holt, Stephan Diehl 0001	MSR 2005 international workshop on mining software repositories.	ICSE	2005	DBLP DOI BibTeX RDF	change patterns, exchange formats, source control, reliability, reuse, software evolution, defects, mining, software repositories, CVS
14	Pankaj Bhawnani, Behrouz Homayoun Far, Günther Ruhe	Explorative Study to Provide Decision Support for Software Release Decisions.	ICSM	2005	DBLP DOI BibTeX RDF	Reliability Demonstration Chart, Decision Support, Defects, Software Reliability Growth Models, Incremental software development
14	Salvador Mir, Libor Rufer, Bernard Courtois	On-chip testing of embedded transducers.	VLSI Design	2004	DBLP DOI BibTeX RDF	failure mechanisms, A-HDL, fault modeling, fault simulation, defects, MEMS, self-test
14	Ronald D. Blanton, John P. Hayes	On the properties of the input pattern fault model.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	fault testing, testing digital circuits, ATPG, fault models, faults, defects
14	Michael A. Cusumano, Alan MacCormack, Chris F. Kemerer, Bill Crandall	Software Development Worldwide: The State of the Practice.	IEEE Softw.	2003	DBLP DOI BibTeX RDF	Indian software industry, Japanese software industry, daily builds, waterfall model, international software surveys, software quality, software development process, software process models, software productivity, software defects, iterative development
14	Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey	Deformations of IC Structure in Test and Yield Learning.	ITC	2003	DBLP DOI BibTeX RDF	yield learning, defect characterization, diagnosis, fault modeling, defects
14	Bogdan M. Maziarz, Vijay K. Jain	Automatic Reconfiguration and Yield of the TESH Multicomputer Network.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	TESH, fault-tolerance, routing, VLSI, Interconnection networks, reconfiguration, redundancy, yield, hierarchical networks, manufacturing defects, parallel computing systems, ULSI
14	Peter Middleton	Lean Software Development: Two Case Studies.	Softw. Qual. J.	2001	DBLP DOI BibTeX RDF	lean software development, zero-defects, mistake-proofing, management, quality, productivity, organizational change, just-in-time
14	Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz	CMOS Standard Cells Characterization for Defect Based Testing.	DFT	2001	DBLP DOI BibTeX RDF	standard cells characterization, VLSI circuits, critical area, spot defects, defect based testing
14	Silvio Jamil Ferzoli Guimarães, Arnaldo de Albuquerque Araújo, Gustavo C. Cerqueira	Old Movie Restoration using Opening by Surface.	SIBGRAPI	2000	DBLP DOI BibTeX RDF	old movie restoration, opening by surface, area attribute, image information elimination, image restoration, defects
14	Witold A. Pleskacz	Yield Estimation of VLSI Circuits with Downscaled Layouts.	DFT	1999	DBLP DOI BibTeX RDF	IC layout scaling, VLSI circuits, critical area, spot defects, manufacturing yield
14	William D. Armitage, Jien-Chung Lo	Erasure Error Correction with Hardware Detection.	DFT	1999	DBLP DOI BibTeX RDF	erasures, fault-tolerance, communications, VLSI, correction, defects, error-control codes
14	Carolyn B. Seaman, Victor R. Basili	Communication and Organization: An Empirical Study of Discussion in Inspection Meetings.	IEEE Trans. Software Eng.	1998	DBLP DOI BibTeX RDF	Communication, empirical study, process, productivity, inspections, defects, organizational structure
14	Anne M. Disney, Philip M. Johnson	Investigation Data Quality Problems in the PSP.	SIGSOFT FSE	1998	DBLP DOI BibTeX RDF	automated process support, measurement dysfunction, empirical software engineering, defects, personal software process