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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
18 | Albert V. Ferris-Prabhu |
On the assumptions contained in semiconductor yield models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(8), pp. 966-975, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
18 | Michael R. Kump, Robert W. Dutton |
The efficient simulation of coupled point defect and impurity diffusion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(2), pp. 191-204, 1988. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
17 | Manuela Kunz, Steven Devlin, Ren Hui Gong, Jiro Inoue, Stephen D. Waldman, Mark B. Hurtig, Purang Abolmaesumi, A. James Stewart |
Prediction of the Repair Surface over Cartilage Defects: A Comparison of Three Methods in a Sheep Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICCAI (1) ![In: Medical Image Computing and Computer-Assisted Intervention - MICCAI 2009, 12th International Conference, London, UK, September 20-24, 2009, Proceedings, Part I, pp. 75-82, 2009, Springer, 978-3-642-04267-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
17 | Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker 0001, Stefan Spinner, Xiaoqing Wen |
Diagnosis of Realistic Defects Based on the X-Fault Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008, pp. 263-266, 2008, IEEE Computer Society, 978-1-4244-2276-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Suraj C. Kothari |
Scalable Program Comprehension for Analyzing Complex Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPC ![In: The 16th IEEE International Conference on Program Comprehension, ICPC 2008, Amsterdam, The Netherlands, June 10-13, 2008, pp. 3-4, 2008, IEEE Computer Society, 978-0-7695-3176-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Kyoungwoo Lee, Aviral Shrivastava, Minyoung Kim, Nikil D. Dutt, Nalini Venkatasubramanian |
Mitigating the impact of hardware defects on multimedia applications: a cross-layer approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Multimedia ![In: Proceedings of the 16th International Conference on Multimedia 2008, Vancouver, British Columbia, Canada, October 26-31, 2008, pp. 319-328, 2008, ACM, 978-1-60558-303-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
error-awareness, cross-layer, soft error, video encoding |
17 | Ewaryst Rafajlowicz |
Improving the Efficiency of Counting Defects by Learning RBF Nets with MAD Loss. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICAISC ![In: Artificial Intelligence and Soft Computing - ICAISC 2008, 9th International Conference, Zakopane, Poland, June 22-26, 2008, Proceedings, pp. 146-153, 2008, Springer, 978-3-540-69572-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Suriyaprakash Natarajan |
On efficient generation of instruction sequences to test for delay defects in a processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008, pp. 279-284, 2008, ACM, 978-1-59593-999-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
native-mode self-test, delay test, software based self-test |
17 | Thomas Zimmermann 0001, Nachiappan Nagappan |
Predicting defects using network analysis on dependency graphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 30th International Conference on Software Engineering (ICSE 2008), Leipzig, Germany, May 10-18, 2008, pp. 531-540, 2008, ACM, 978-1-60558-079-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
windows server 2003, network analysis, dependency graph, defect prediction |
17 | Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas |
High-Quality Transition Fault ATPG for Small Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5), pp. 983-989, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | J. B. Rainsberger |
Avoiding Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Softw. ![In: IEEE Softw. 24(2), pp. 14-15, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
software quality, testing strategies, testing and debugging |
17 | Makoto Matsumoto, Isaku Wada, Ai Kuramoto, Hyo Ashihara |
Common defects in initialization of pseudorandom number generators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Model. Comput. Simul. ![In: ACM Trans. Model. Comput. Simul. 17(4), pp. 15, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Difference collision, interstream correlation, nearly affine dependence, Monte-Carlo simulation, pseudorandom number generator |
17 | Teijiro Isokawa, Shin'ya Kowada, Ferdinand Peper, Naotake Kamiura, Nobuyuki Matsui |
Online isolation of defects in cellular nanocomputers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Frontiers Comput. Sci. China ![In: Frontiers Comput. Sci. China 1(4), pp. 397-406, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
radom fly, cellular automata, asynchronous, nanotechnology, defect tolerance |
17 | Ahmed H. Eid, Brian E. Cooper, Mohamed N. Ahmed |
Characterization of Ghosting Defects in Electrophotographic Printers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP (3) ![In: Proceedings of the International Conference on Image Processing, ICIP 2007, September 16-19, 2007, San Antonio, Texas, USA, pp. 453-456, 2007, IEEE, 978-1-4244-1436-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab |
Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 12th European Test Symposium, ETS 2007, Freiburg, Germany, May 20, 2007, pp. 173-178, 2007, IEEE Computer Society, 978-0-7695-2827-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Alexandre Ney, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 12th European Test Symposium, ETS 2007, Freiburg, Germany, May 20, 2007, pp. 97-104, 2007, IEEE Computer Society, 978-0-7695-2827-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Giuseppe Acciani, Gioacchino Brunetti, Girolamo Fornarelli |
Automatic Detection of Solder Joint Defects on Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA, pp. 1021-1024, 2007, IEEE, 1-4244-0920-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Jeanette Heidenberg, Andreas Nåls, Ivan Porres |
Statechart Features and Pre-Release Defects in Software Maintenance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VL/HCC ![In: 2007 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC 2007), 23-27 September 2007, Coeur d'Alene, Idaho, USA, pp. 223-230, 2007, IEEE Computer Society, 978-0-7695-2987-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Full Open Defects in Interconnecting Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 158-166, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS |
17 | Alexandre Ney, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 361-368, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Claudio M. Privitera, Lawrence W. Stark |
A Binocular Pupil Model for Simulation of Relative Afferent Pupil Defects and the Swinging Flashlight Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Biol. Cybern. ![In: Biol. Cybern. 94(3), pp. 215-224, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Ibrahim Cem Baykal, Graham A. Jullien |
On the Use of Hash Functions as Preprocessing Algorithms to Detect Defects on Repeating Definite Textures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 17(3), pp. 185-195, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
In-camera, FPGA, Real-time, Segmentation, Defect detection, Camera network |
17 | Rudolf Ahlswede, Mark S. Pinsker |
Report on Models of Write-Efficient Memories with Localized Errors and Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GTIT-C ![In: General Theory of Information Transfer and Combinatorics, pp. 628-632, 2006, Springer, 3-540-46244-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Fernando Gayubo, José Luis González 0005, Eusebio de la Fuente López, Félix Miguel Trespaderne, José R. Perán |
On-line machine vision system for detect split defects in sheet-metal forming processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (1) ![In: 18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China, pp. 723-726, 2006, IEEE Computer Society, 0-7695-2521-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Mario I. Chacon, Graciela Ramírez Alonso |
Wood Defects Classification Using a SOM/FFP Approach with Minimum Dimension Feature Vector. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (2) ![In: Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28 - June 1, 2006, Proceedings, Part III, pp. 1105-1110, 2006, Springer, 3-540-34482-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Hakan Özdemir, Güngör Baser |
Computer Simulation of Woven Fabric Defects Based on Faulty Yarn Photographs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCIS ![In: Computer and Information Sciences - ISCIS 2006, 21th International Symposium, Istanbul, Turkey, November 1-3, 2006, Proceedings, pp. 325-333, 2006, Springer, 3-540-47242-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Fabric simulation, fabric appearance, woven fabric faults, elastica curve, yarn flattening |
17 | Sandeep Dechu, Manoj Kumar Goparaju, Spyros Tragoudas |
A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 318-326, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand |
Delay Testing Viability of Gate Oxide Short Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Sci. Technol. ![In: J. Comput. Sci. Technol. 20(2), pp. 195-200, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
gate oxide short (GOS), VLSI, delay testing, defect |
17 | Xianghua Xie, Majid Mirmehdi |
Localising surface defects in random colour textures using multiscale texem analysis in image eigenchannels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP (3) ![In: Proceedings of the 2005 International Conference on Image Processing, ICIP 2005, Genoa, Italy, September 11-14, 2005, pp. 1124-1127, 2005, IEEE, 0-7803-9134-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
17 | Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas |
Quality Transition Fault Tests Suitable for Small Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA, pp. 468-470, 2005, IEEE Computer Society, 0-7695-2451-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
17 | Marek Z. Reformat, Efe Igbide |
Isolation of software defects: extracting knowledge with confidence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRI ![In: Proceedings of the 2005 IEEE International Conference on Information Reuse and Integration, IRI - 2005, August 15-17, 2005, Las Vegas Hilton, Las Vegas, NV, USA, pp. 114-119, 2005, IEEE Systems, Man, and Cybernetics Society, 0-7803-9093-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
17 | Mariam Momenzadeh, Marco Ottavi, Fabrizio Lombardi |
Modeling QCA Defects at Molecular-level in Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA, pp. 208-216, 2005, IEEE Computer Society, 0-7695-2464-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
fault model, emerging technology, defect tolerance, QCA |
17 | Leendert M. Huisman |
Diagnosing arbitrary defects in logic designs using single location at a time (SLAT). ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(1), pp. 91-101, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Franz Pernkopf |
Detection of surface defects on raw steel blocks using Bayesian network classifiers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pattern Anal. Appl. ![In: Pattern Anal. Appl. 7(3), pp. 333-342, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Light sectioning, Feature selection, Range imaging, Surface inspection, Bayesian network classifier |
17 | S. Sarala, S. Valli |
A Tool to Automatically Detect Defects in C++ Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIT ![In: Intelligent Information Technology, 7th International Conference on Information Technology, CIT 2004, Hyderabad, India, December 20-23, 2004, Proceedings, pp. 302-314, 2004, Springer, 3-540-24126-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Function overloading, Hybrid Inheritance, Friend Function, Template Function, Dangling Reference, Test case, Automatic Generation, Virtual Function |
17 | Vittorio Murino, Manuele Bicego, Ivan A. Rossi |
Statistical Classification of Raw Textile Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (4) ![In: 17th International Conference on Pattern Recognition, ICPR 2004, Cambridge, UK, August 23-26, 2004., pp. 311-314, 2004, IEEE Computer Society, 0-7695-2128-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Mariam Momenzadeh, Mehdi Baradaran Tahoori, Jing Huang 0001, Fabrizio Lombardi |
Quantum Cellular Automata: New Defects and Faults for New Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPDPS ![In: 18th International Parallel and Distributed Processing Symposium (IPDPS 2004), CD-ROM / Abstracts Proceedings, 26-30 April 2004, Santa Fe, New Mexico, USA, 2004, IEEE Computer Society, 0-7695-2132-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Robert C. Aitken |
Redundancy & It's Not Just for Defects Anymore. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA, pp. 117-120, 2004, IEEE Computer Society, 0-7695-2193-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | André Baresel, Harmen Sthamer, Joachim Wegener |
Applying Evolutionary Testing to Search for Critical Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GECCO (2) ![In: Genetic and Evolutionary Computation - GECCO 2004, Genetic and Evolutionary Computation Conference, Seattle, WA, USA, June 26-30, 2004, Proceedings, Part II, pp. 1427-1428, 2004, Springer, 3-540-22343-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | David L. DeMaris, Dan Maynard, Bette Bergman Reuter, Shi Zhong |
An Information Retrieval System for the Analysis of Systematic Defects in VLSI. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICTAI ![In: 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2004), 15-17 November 2004, Boca Raton, FL, USA, pp. 216-223, 2004, IEEE Computer Society, 0-7695-2236-X. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Diagnosis of Hold Time Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings, pp. 192-199, 2004, IEEE Computer Society, 0-7695-2231-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Ibrahim Cem Baykal, Graham A. Jullien |
In-camera detection of fabric defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (3) ![In: Proceedings of the 2004 International Symposium on Circuits and Systems, ISCAS 2004, Vancouver, BC, Canada, May 23-26, 2004, pp. 933-936, 2004, IEEE, 0-7803-8251-X. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang 0001, Fabrizio Lombardi |
Defects and Faults in Quantum Cellular Automata at Nano Scale. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 291-296, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Haihua Yan, Adit D. Singh |
Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 242-251, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
17 | Jing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng |
Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(6), pp. 756-769, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
17 | Zaid Al-Ars, Ad J. van de Goor |
Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA, pp. 27-32, 2003, IEEE Computer Society, 0-7695-2004-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
two floating nodes, memory testing, DRAMs, dynamic faults, defect simulation |
17 | Alberto Machì, Fabio Collura |
Accurate spatio-temporal restoration of compact single frame defects in aged motion pictures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIAP ![In: 12th International Conference on Image Analysis and Processing (ICIAP 2003), 17-19 September 2003, Mantova, Italy, pp. 454-459, 2003, IEEE Computer Society, 0-7695-1948-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
17 | José A. Calderón-Martínez, Pascual Campoy Cervera |
A convolutional neural architecture: an application for defects detection in continuous manufacturing systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (5) ![In: Proceedings of the 2003 International Symposium on Circuits and Systems, ISCAS 2003, Bangkok, Thailand, May 25-28, 2003, pp. 749-752, 2003, IEEE, 0-7803-7761-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
17 | Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch |
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, pp. 39-46, 2003, IEEE Computer Society, 0-7695-1924-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
17 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak |
Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pp. 668-673, 2003, ACM, 1-58113-688-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
delay ATPG, delay fault diagnosis, statistical timing models |
17 | Li Chen, Xiaoliang Bai, Sujit Dey |
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(4-5), pp. 529-538, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
interconnect, crosstalk, processor, self-test |
17 | Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001 |
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(2), pp. 179-187, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
fault modeling, DFT, TPG, RTL |
17 | Peter G. Bishop, Robin E. Bloomfield |
Worst Case Reliability Prediction Based on a Prior Estimate of Residual Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 13th International Symposium on Software Reliability Engineering (ISSRE 2002), 12-15 November 2002, Annapolis, MD, USA, pp. 295-303, 2002, IEEE Computer Society, 0-7695-1763-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
worst case reliability bound, residual fault prediction, reliability prediction, reliability testing |
17 | Takamichi Saito, Toshiyuki Kito, Kentaro Umesawa, Fumio Mizoguchi |
Architectural Defects of the Secure Shell. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEXA Workshops ![In: 13th International Workshop on Database and Expert Systems Applications (DEXA 2002), 2-6 September 2002, Aix-en-Provence, France, pp. 22-28, 2002, IEEE Computer Society, 0-7695-1668-8. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
17 | Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita |
On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 83-89, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
17 | Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001 |
RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(3-4), pp. 311-319, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Defect-Oriented Test (DOT), low-energy test, test generation, RTL |
17 | Luigi G. Occhipinti, Giuseppe E. Spoto, Marco Branciforte, Francesco Doddo |
Defects detection and characterization by using cellular neural networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (3) ![In: Proceedings of the 2001 International Symposium on Circuits and Systems, ISCAS 2001, Sydney, Australia, May 6-9, 2001, pp. 481-484, 2001, IEEE, 0-7803-6685-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
17 | Claes Wohlin, Martin Höst, Magnus C. Ohlsson |
Understanding the Sources of Software Defects: A Filtering Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWPC ![In: 8th International Workshop on Program Comprehension (IWPC 2000), 10-11 June 2000, Limerick, Ireland, pp. 9-17, 2000, IEEE Computer Society, 0-7695-0656-9. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Defect understanding, software metrics, root cause analysis, prediction system, product measurements |
17 | Mark Oskin, Diana Keen, Justin Hensley, Lucian Vlad Lita, Frederic T. Chong |
Reducing Cost and Tolerating Defects in Page-based Intelligent Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings of the IEEE International Conference On Computer Design: VLSI In Computers & Processors, ICCD '00, Austin, Texas, USA, September 17-20, 2000, pp. 276-284, 2000, IEEE Computer Society, 0-7695-0801-4. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
17 | Li Di, Song Yonglun, Ye Feng |
On Line Monitoring of Weld Defects for Short-Circuit Gas Metal Arc Welding Based on the Self-Organize Feature Map Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCNN (5) ![In: Proceedings of the IEEE-INNS-ENNS International Joint Conference on Neural Networks, IJCNN 2000, Neural Computing: New Challenges and Perspectives for the New Millennium, Como, Italy, July 24-27, 2000, Volume 5, pp. 239-246, 2000, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
weld, GMAW, neural networks, SOM, quality, defect |
17 | Amy Germida, James F. Plusquellic |
Detection of CMOS Defects under Variable Processing Conditions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 195-204, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Built-In Differential Temperature Sensors, Fault Location, Mixed-Signal Circuits, Thermal Testing, Temperature Measurements |
17 | Anna Maria Brosa, Joan Figueras |
Characterization of Floating Gate Defects in Analog Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 14(1-2), pp. 23-31, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
floating gate defect, low-power/low-voltage analog circuits, analog testing |
17 | Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell |
Testing for Floating Gates Defects in CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, pp. 228-236, 1998, IEEE Computer Society, 0-8186-8277-9. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
17 | Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey |
Exposing floating gate defects in analogue CMOS circuits by power supply voltage control testing technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 239-242, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
analogue CMOS circuits, power supply voltage control testing technique, floating gate defect exposure, power supply voltage sweep, fault diagnosis, integrated circuit testing, fault detection, fault coverage, integrated circuit modelling, CMOS analogue integrated circuits |
14 | Javier Carretero, Xavier Vera, Pedro Chaparro, Jaume Abella 0001 |
Microarchitectural Online Testing for Failure Detection in Memory Order Buffers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 59(5), pp. 623-637, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
memory order buffer, error detection, soft errors, microarchitecture, defects, Online testing, control logic |
14 | Nathaniel Ayewah, William W. Pugh |
The Google FindBugs fixit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the Nineteenth International Symposium on Software Testing and Analysis, ISSTA 2010, Trento, Italy, July 12-16, 2010, pp. 241-252, 2010, ACM, 978-1-60558-823-0. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
java, static analysis, software quality, bugs, false positives, software defects, findbugs, bug patterns |
14 | Daniel Le Métayer, Manuel Maarek, Valérie Viet Triem Tong, Eduardo Mazza, Marie-Laure Potet, Nicolas Craipeau, Stéphane Frénot, Ronan Hardouin |
Liability in software engineering: overview of the LISE approach and illustration on a case study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE (1) ![In: Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 1, ICSE 2010, Cape Town, South Africa, 1-8 May 2010, pp. 135-144, 2010, ACM, 978-1-60558-719-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
formal methods, specification, contract, defects, evidence, legal aspects, liability |
14 | Jian Wei Cheng, Melanie Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge N. Demidenko |
Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010, pp. 360-366, 2010, IEEE Computer Society, 978-0-7695-3978-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
data mining, clusters, classification, recognition, feature, classifier, defects |
14 | Melanie Po-Leen Ooi, Chris Chan, Wey Jean Tee, Ye Chow Kuang, Lindsay Kleeman, Serge N. Demidenko |
Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010, pp. 276-280, 2010, IEEE Computer Society, 978-0-7695-3978-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
data mining, clusters, segmentation, detection, defects |
14 | Salman Mirghasemi |
Query-point debugging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOPSLA Companion ![In: Companion to the 24th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2009, October 25-29, 2009, Orlando, Florida, USA, pp. 763-764, 2009, ACM, 978-1-60558-768-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
dynamic breakpoint assignment, locating defects, query, program traces, execution monitoring |
14 | Douglas Buettner |
A System Dynamics Model That Simulates a Significant Late Life Cycle Manpower Increase Phenomenon. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSP ![In: Trustworthy Software Development Processes, International Conference on Software Process, ICSP 2009 Vancouver, Canada, May 16-17, 2009 Proceedings, pp. 402-410, 2009, Springer, 978-3-642-01679-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
satellite software, inspections, unit testing, system dynamics, peer reviews, software defects, feedback loops |
14 | Nachiappan Nagappan, E. Michael Maximilien, Thirumalesh Bhat, Laurie A. Williams |
Realizing quality improvement through test driven development: results and experiences of four industrial teams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 13(3), pp. 289-302, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Defects/faults, Empirical study, Test driven development, Development time |
14 | Mauricio Jose Ordoñez, Hisham M. Haddad |
The State of Metrics in Software Industry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITNG ![In: Fifth International Conference on Information Technology: New Generations (ITNG 2008), 7-8 April 2008, Las Vegas, Nevada, USA, pp. 453-458, 2008, IEEE Computer Society, 978-0-7695-3099-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Cost of defects, State of metrics, Metrics in software industry, Software metrics |
14 | Ramakrishna Rao D |
An Analysis of Missed Structure Field Handling Bugs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SERA ![In: Proceedings of the 6th ACIS International Conference on Software Engineering Research, Management and Applications, SERA 2008, 20-22 August 2008, Prague, Czech Republic, pp. 41-48, 2008, IEEE Computer Society, 978-0-7695-3302-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
errors of omission, structure, defects |
14 | Smruti R. Sarangi, Satish Narayanasamy, Bruce Carneal, Abhishek Tiwari 0002, Brad Calder, Josep Torrellas |
Patching Processor Design Errors with Programmable Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Micro ![In: IEEE Micro 27(1), pp. 12-25, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
hardware errors, microarchitecture for fault-tolerance, design defects in real processors, processor errata analysis |
14 | Ganesh J. Pai, Joanne Bechta Dugan |
Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 33(10), pp. 675-686, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
object-oriented, metrics, Bayesian networks, software quality, regression, defects, Bayesian analysis, fault proneness |
14 | J. B. Rainsberger |
Ship Effortlessly. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Softw. ![In: IEEE Softw. 24(3), pp. 16-17, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
software delivery, postproduction, comeback defects, automation, version control |
14 | Angela Lozano, Michel Wermelinger, Bashar Nuseibeh |
Assessing the impact of bad smells using historical information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWPSE ![In: 9th International Workshop on Principles of Software Evolution (IWPSE 2007), in conjunction with the 6th ESEC/FSE joint meeting, Dubrovnik, Croatia, September 3-4, 2007, pp. 31-34, 2007, ACM, 978-1-59593-722-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
bad smells, source cede, empirical study, software maintenance, software quality, software evolution, design defects, design flaws |
14 | William W. Pugh |
Finding bugs in eclipse. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOPSLA Companion ![In: Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada, pp. 856-857, 2007, ACM, 978-1-59593-865-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Java, static analysis, software quality, eclipse, bugs, false positives, software defects, FindBugs, bug patterns |
14 | Sheela Ramanna, Rajen Bhatt, Piotr Biernot |
A Rough-Hybrid Approach to Software Defect Classification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RSFDGrC ![In: Rough Sets, Fuzzy Sets, Data Mining and Granular Computing, 11th International Conference, RSFDGrC 2007, Toronto, Canada, May 14-16, 2007, Proceedings, pp. 79-86, 2007, Springer, 978-3-540-72529-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Neuro-Fuzzy-Decision Trees, Classification, Rough Sets, Software Defects |
14 | Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor |
Opens and Delay Faults in CMOS RAM Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 55(12), pp. 1630-1639, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
address decoder delay faults, addressing methods, BIST, DFT, Memory testing, open defects |
14 | Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 |
Automatic Test Pattern Generation for Resistive Bridging Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(1), pp. 61-69, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
resistive short defects, ATPG, SAT, bridging faults |
14 | Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet |
Electro-thermal Stimuli for MEMS Testing in FSBM Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(2), pp. 189-198, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
bulk micromachining, electro-thermal stimuli, testing, defects, MEMS |
14 | Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla |
A Novel RF Test Scheme Based on a DFT Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(3), pp. 229-237, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
RF design-for-testability, known-good-die, defects, low noise amplifier, RF test |
14 | Scott Davidson 0001 |
Searching for clues: Diagnosing IC failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(1), pp. 67-68, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
IC failures, IC manufacturing, data mining, defects, yield enhancement, failure diagnosis |
14 | Ghi Paul Im, Richard L. Baskerville |
A longitudinal study of information system threat categories: the enduring problem of human error. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Data Base ![In: Data Base 36(4), pp. 68-79, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
information infrastructure protection, information system threat, information system threat taxonomy, software quality and reliability, information security, computer security, human error, software defects |
14 | Ahmed E. Hassan, Richard C. Holt, Stephan Diehl 0001 |
MSR 2005 international workshop on mining software repositories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA, pp. 690, 2005, ACM. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
change patterns, exchange formats, source control, reliability, reuse, software evolution, defects, mining, software repositories, CVS |
14 | Pankaj Bhawnani, Behrouz Homayoun Far, Günther Ruhe |
Explorative Study to Provide Decision Support for Software Release Decisions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 21st IEEE International Conference on Software Maintenance (ICSM 2005), 25-30 September 2005, Budapest, Hungary, pp. 617-620, 2005, IEEE Computer Society, 0-7695-2368-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Reliability Demonstration Chart, Decision Support, Defects, Software Reliability Growth Models, Incremental software development |
14 | Salvador Mir, Libor Rufer, Bernard Courtois |
On-chip testing of embedded transducers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 463-, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
failure mechanisms, A-HDL, fault modeling, fault simulation, defects, MEMS, self-test |
14 | Ronald D. Blanton, John P. Hayes |
On the properties of the input pattern fault model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 8(1), pp. 108-124, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
fault testing, testing digital circuits, ATPG, fault models, faults, defects |
14 | Michael A. Cusumano, Alan MacCormack, Chris F. Kemerer, Bill Crandall |
Software Development Worldwide: The State of the Practice. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Softw. ![In: IEEE Softw. 20(6), pp. 28-34, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Indian software industry, Japanese software industry, daily builds, waterfall model, international software surveys, software quality, software development process, software process models, software productivity, software defects, iterative development |
14 | Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey |
Deformations of IC Structure in Test and Yield Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 856-865, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
yield learning, defect characterization, diagnosis, fault modeling, defects |
14 | Bogdan M. Maziarz, Vijay K. Jain |
Automatic Reconfiguration and Yield of the TESH Multicomputer Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 51(8), pp. 963-972, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
TESH, fault-tolerance, routing, VLSI, Interconnection networks, reconfiguration, redundancy, yield, hierarchical networks, manufacturing defects, parallel computing systems, ULSI |
14 | Peter Middleton |
Lean Software Development: Two Case Studies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 9(4), pp. 241-252, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
lean software development, zero-defects, mistake-proofing, management, quality, productivity, organizational change, just-in-time |
14 | Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz |
CMOS Standard Cells Characterization for Defect Based Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 384-, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
standard cells characterization, VLSI circuits, critical area, spot defects, defect based testing |
14 | Silvio Jamil Ferzoli Guimarães, Arnaldo de Albuquerque Araújo, Gustavo C. Cerqueira |
Old Movie Restoration using Opening by Surface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIBGRAPI ![In: 13th Brazilian Symposium on Computer Graphics and Image Processing (SIBGRAPI 2000), 17-20 October 2000, Gramado (RS), Brazil, pp. 334, 2000, IEEE Computer Society, 0-7695-0878-2. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
old movie restoration, opening by surface, area attribute, image information elimination, image restoration, defects |
14 | Witold A. Pleskacz |
Yield Estimation of VLSI Circuits with Downscaled Layouts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings, pp. 55-60, 1999, IEEE Computer Society, 0-7695-0325-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
IC layout scaling, VLSI circuits, critical area, spot defects, manufacturing yield |
14 | William D. Armitage, Jien-Chung Lo |
Erasure Error Correction with Hardware Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings, pp. 293-301, 1999, IEEE Computer Society, 0-7695-0325-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
erasures, fault-tolerance, communications, VLSI, correction, defects, error-control codes |
14 | Carolyn B. Seaman, Victor R. Basili |
Communication and Organization: An Empirical Study of Discussion in Inspection Meetings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 24(7), pp. 559-572, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
Communication, empirical study, process, productivity, inspections, defects, organizational structure |
14 | Anne M. Disney, Philip M. Johnson |
Investigation Data Quality Problems in the PSP. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGSOFT FSE ![In: Proceedings of the ACM SIGSOFT International Symposium on Foundations of Software Engineering, SIGSOFT 1998, Lake Buena Vista, Florida, USA, November 3-5, 1998, pp. 143-152, 1998, ACM, 978-1-58113-108-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
automated process support, measurement dysfunction, empirical software engineering, defects, personal software process |
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