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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
12 | Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada |
CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Stefan Biffl, Michael Halling |
Investigating Reinspection Decision Accuracy Regarding Product-Quality and Cost-Benefit Estimates. |
COMPSAC |
2001 |
DBLP DOI BibTeX RDF |
Defect Detection Capability Estimation, Measurement, Empirical Software Engineering, Controlled Experiment, Software Inspection, Quality Management, Reliability Growth Models |
12 | Wei Yi |
Automatic Aircraft Recognition Using Maximum Likelihood Ratio Test. |
Active Media Technology |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Paul Lee, Alfred Chen, Dilip Mathew |
A Speed-Dependent Approach for Delta IDDQ Implementation. |
DFT |
2001 |
DBLP DOI BibTeX RDF |
Self-scaling IDDQ, Speed Performance Index, characterization, Delta IDDQ |
12 | Neil Harrison |
A Simple via Duplication Tool for Yield Enhancement. |
DFT |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Sergio Coronado, José Alberto Jaén |
Incremental Quality Network. |
APAQS |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Irith Pomeranz, Sudhakar M. Reddy |
On n-detection test sets and variable n-detection test sets fortransition faults. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2000 |
DBLP DOI BibTeX RDF |
|
12 | Adriana Bodnarova, Mohammed Bennamoun, Kurt Kubik |
Suitability Analysis of Techniques for Flaw Detection in Textiles using Texture Analysis. |
Pattern Anal. Appl. |
2000 |
DBLP DOI BibTeX RDF |
Flaw detection techniques, Textile quality control, Weaving flaws, Texture analysis, Case study, Visual inspection |
12 | Pin Xie, Sheng Uei Guan |
A golden-template self-generating method for patterned wafer inspection. |
Mach. Vis. Appl. |
2000 |
DBLP DOI BibTeX RDF |
Wafer inspection, Golden template, Spectral estimation, PDI, Image-to-image reference method |
12 | Charles Howell, Gary Vecellio |
Experiences with Error Handling in Critical Systems. |
Advances in Exception Handling Techniques |
2000 |
DBLP DOI BibTeX RDF |
|
12 | Stefan Biffl |
Analysis of the impact of reading technique and inspector capability on individual inspection performance. |
APSEC |
2000 |
DBLP DOI BibTeX RDF |
performance index, inspector capability, individual inspection performance, software document inspection, quality assurance measure, software defect detection, software product quality feedback, requirements specification document, inspectors' attention, inspection targets, severity levels, inspection planners, detection effectiveness, document coverage, inspection effort, inspection performance, software development, human factors, software quality, empirical software engineering, system documentation, reading technique |
12 | Chin-Te Kao, Sam Wu, Jwu E. Chen |
A case study of failure analysis and guardband determination for a 64M-bit DRAM. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
guardband determination, prevention strategy, test derivation, test cost, 64 Mbit, integrated circuit testing, yield, DRAM, failure analysis, failure analysis, test selection, DRAM chips, product quality, integrated circuit yield, integrated circuit economics |
12 | John T. Carr III, Osman Balci |
Verification and validation of object-oriented artifacts throughout the simulation model development life cycle. |
WSC |
2000 |
DBLP DOI BibTeX RDF |
|
12 | Lee J. White, Husain Almezen |
Generating Test Cases for GUI Responsibilities Using Complete Interaction Sequences. |
ISSRE |
2000 |
DBLP DOI BibTeX RDF |
GUI Object Collaboration, Complete Interaction Sequences, Graphical User Interfaces, GUI Testing |
12 | Stefan Biffl, Michael Halling |
Software Product Improvement with Inspection. |
EUROMICRO |
2000 |
DBLP DOI BibTeX RDF |
Software inspection process, empirical software engineering, controlled experiment, quality measurement, defect detection techniques |
12 | Sukalyan Mukherjee |
Design for Testability to Achieve High Test Coverage - A Case Study. |
DFT |
2000 |
DBLP DOI BibTeX RDF |
|
12 | Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng |
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
Microprocessor self-testing, Path delay fault classification, Functionally testable paths, Functional tests, Delay fault testing |
12 | Paul Clay, Alan Crispin, Sam Crossley |
A Comparative Analysis of Search Methods as Applied to Shearographic Fringe Modeling. |
IEA/AIE |
2000 |
DBLP DOI BibTeX RDF |
|
12 | Víctor H. Champac, José Castillejos, Joan Figueras |
IDDQ Testing of Opens in CMOS SRAMs. |
J. Electron. Test. |
1999 |
DBLP DOI BibTeX RDF |
data retention faults, memory testing, opens, IDDQ |
12 | Diego Del Gobbo, Bojan Cukic, Marcello R. Napolitano, Steve M. Easterbrook |
Fault Detectability Analysis for Requirements Validation of Fault Tolerant Systems. |
HASE |
1999 |
DBLP DOI BibTeX RDF |
|
12 | Maha Boughdadi, Robert Busser |
An Industrial Application of an Integrated UML and SDL Modeling Technique. |
COMPSAC |
1999 |
DBLP DOI BibTeX RDF |
|
12 | Anna Anzalone, G. Gugliotta, Alberto Machì, G. Sardisco |
Automatic Quality Control of Industrial Products for Irrigation. |
ICIAP |
1999 |
DBLP DOI BibTeX RDF |
|
12 | Sheng Uei Guan, Pin Xie |
A Golden Block Self-Generating Scheme for Continuous Patterned Wafer Inspections. |
ICIAP |
1999 |
DBLP DOI BibTeX RDF |
|
12 | Jean-Sébastien Coron |
On the Security of Random Sources. |
Public Key Cryptography |
1999 |
DBLP DOI BibTeX RDF |
|
12 | Abderrahim Doumar, Satoshi Kaneko, Hideo Ito |
Defect and Fault Tolerance FPGAs by Shifting the Configuration Data. |
DFT |
1999 |
DBLP DOI BibTeX RDF |
|
12 | Irith Pomeranz, Sudhakar M. Reddy |
On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults. |
VTS |
1999 |
DBLP DOI BibTeX RDF |
|
12 | F. Calzolari, Paolo Tonella, Giuliano Antoniol |
Modeling Maintenance Effort by Means of Dynamic Systems. |
CSMR |
1998 |
DBLP DOI BibTeX RDF |
|
12 | Pascal Nussbaum, Bernard Girau, Arnaud Tisserand |
Field Programmable Processor Arrays. |
ICES |
1998 |
DBLP DOI BibTeX RDF |
|
12 | Dhamin Al-Khalili, Saman Adham, Côme Rozon, Moazzem Hossain, Douglas Racz |
Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. |
DFT |
1998 |
DBLP DOI BibTeX RDF |
CMOS Defect Modeling, Defect Analysis |
12 | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
12 | F. Calzolari, Paolo Tonella, Giuliano Antoniol |
Dynamic Model for Maintenance and Testing Effort. |
ICSM |
1998 |
DBLP DOI BibTeX RDF |
|
12 | Steven Haehn, T. S. Kalkur |
Failure Analysis of VLSI by IDDQ Testing. |
J. Electron. Test. |
1997 |
DBLP DOI BibTeX RDF |
quiescent current measurement, scanning electron microscope, fault diagnosis, failure analysis |
12 | Mick Tegethoff, Tom Chen 0001 |
Simulation Techniques for the Manufacturing Test of MCMs. |
J. Electron. Test. |
1997 |
DBLP DOI BibTeX RDF |
simulation, test, DFT, yield, DFM, SMT, MCM, board |
12 | José M. Miranda |
A BIST and Boundary-Scan Economics Framework. |
IEEE Des. Test Comput. |
1997 |
DBLP DOI BibTeX RDF |
|
12 | Lesley Pek Wee Land, D. Ross Jeffery, Chris Sauer |
Validating the Defect Detection Performance Advantage of Group Designs for Software Reviews: Report of a Replicated Experiment. |
Australian Software Engineering Conference |
1997 |
DBLP DOI BibTeX RDF |
Software Development Technical Review, interacting group, nominal group, defect detection, false positives |
12 | Bernard Faure, Maguelonne Teisseire, Rosine Cicchetti |
Activity Threads: A Unified Framework for Aiding Behavioural Modelling. |
DEXA |
1997 |
DBLP DOI BibTeX RDF |
|
12 | Björn Schieffer, Günter Hotz |
Diagnosis of Tank Ballast Systems. |
IDA |
1997 |
DBLP DOI BibTeX RDF |
|
12 | Tien-fu Chang, Alejandro Danylyzsn, So Norimatsu, Jose Rivera, David Shepard, Anthony J. Lattanze, James E. Tomayko |
"Continuous Verification" in Mission Critical Software Development. |
HICSS (5) |
1997 |
DBLP DOI BibTeX RDF |
|
12 | Michiel van Genuchten, Wieger Cornelissen, Cor van Dijk |
Supporting Inspections With an Electronic Meeting System. |
HICSS (2) |
1997 |
DBLP DOI BibTeX RDF |
|
12 | Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. |
DFT |
1997 |
DBLP DOI BibTeX RDF |
|
12 | Pascal Bichebois, Pierre Mathery |
Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits. |
DFT |
1997 |
DBLP DOI BibTeX RDF |
algorithm, tool, correlation, method, errors, inspection, yield, failure, defect, limits |
12 | Pascal Caunegre, Claude Abraham |
Fault simulation for mixed-signal systems. |
J. Electron. Test. |
1996 |
DBLP DOI BibTeX RDF |
mixed-signal systems, fault simulation, bridging faults |
12 | Jan Rooijmans, Hans Aerts, Michiel van Genuchten |
Software Quality in Consumer Electronics Products. |
IEEE Softw. |
1996 |
DBLP DOI BibTeX RDF |
|
12 | Watts S. Humphrey |
Using A Defined and Measured Personal Software Process. |
IEEE Softw. |
1996 |
DBLP DOI BibTeX RDF |
|
12 | Khoi Hoang, Anantharai Nachimuthu |
Image processing techniques for leather hide ranking in the footwear industry. |
Mach. Vis. Appl. |
1996 |
DBLP DOI BibTeX RDF |
Leather hide ranking, Scanning process, Scanning algorithm, Footwear, Machine vision |
12 | Teruhiko Yamada, Tsuyoshi Sasaki |
On Current Testing of Josephson Logic Circuits Using the 4JL Gate Family. |
Asian Test Symposium |
1996 |
DBLP DOI BibTeX RDF |
4JL gate, Josephson logic circuit, current testing, defect coverage |
12 | Li-C. Wang, M. Ray Mercer, Thomas W. Williams |
A Better ATPG Algorithm and Its Design Principles. |
ICCD |
1996 |
DBLP DOI BibTeX RDF |
|
12 | Tomas Vagoun |
Input Domain Partitioning in Software Testing. |
HICSS (2) |
1996 |
DBLP DOI BibTeX RDF |
|
12 | Joan Figueras, Michel Renovell |
Current testing in dynamic CMOS circuits. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
dynamic CMOS, test technique, integrated circuit, Current testing |
12 | R. Geoff Dromey |
A Model for Software Product Quality. |
IEEE Trans. Software Eng. |
1995 |
DBLP DOI BibTeX RDF |
product evaluation, code auditing, quality defect classification, software characteristics, quality-carrying properties, Software quality, maintainability, quality attributes, quality model, ISO-9126 |
12 | Mauro Barni, A. W. Mussa, Alessandro Mecocci, Vito Cappellini, Tariq S. Durrani |
An intelligent perception system for food quality inspection using color analysis. |
ICIP |
1995 |
DBLP DOI BibTeX RDF |
food processing industry, intelligent perception system, food quality inspection, vision based intelligent perception system, chicken meat, RGB images, burns, hematomas, blisters, vision module, anatomic subparts, defect description, reference database, computer vision, image segmentation, image reconstruction, image analysis, mathematical morphology, multilayer perceptrons, image colour analysis, manufacturing systems, automatic optical inspection, morphological reconstruction, color analysis, automated inspection |
12 | Kimberly Williams |
Using object oriented analysis and design in a non-object oriented environment experience report. |
ICSM |
1995 |
DBLP DOI BibTeX RDF |
control system analysis computing, nonobject oriented environment, subsystem development, independent test, Allen-Bradley's 6200 Series Programming Software for Programmable Controllers, structured analysis/structured design subsystems, function point number, code line number, subsystem function number, defect number, defect fixing time, complexity, metrics, software maintenance, software metrics, programming environments, program testing, object oriented design, object-oriented methods, object oriented analysis, structured programming, programmable controllers, control system CAD, development time, Object Modeling Technique |
12 | Israel Koren, Zahava Koren, Charles H. Stapper |
A statistical study of defect maps of large area VLSI IC's. |
IEEE Trans. Very Large Scale Integr. Syst. |
1994 |
DBLP DOI BibTeX RDF |
|
12 | Daniel Brand, Vijay S. Iyengar |
Identification of redundant delay faults. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1994 |
DBLP DOI BibTeX RDF |
|
12 | Kanad Chakraborty, Pinaki Mazumder |
Technology and layout-related testing of static random-access memories. |
J. Electron. Test. |
1994 |
DBLP DOI BibTeX RDF |
Array layout, cell technology, Gallium Arsenide (GaAs), high electron mobility transistor (HEMT) RAMs, I DD testing, I DDQ testing |
12 | D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan |
Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. |
IEEE Trans. Very Large Scale Integr. Syst. |
1993 |
DBLP DOI BibTeX RDF |
|
12 | Marcel Jacomet, Walter Guggenbühl |
Layout-dependent fault analysis and test synthesis for CMOS circuits. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1993 |
DBLP DOI BibTeX RDF |
|
12 | Sundarar Mohan, Pinaki Mazumder |
Analytical and simulation studies of failure modes in SRAMs using high electron mobility transistors. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1993 |
DBLP DOI BibTeX RDF |
|
12 | Jeffery A. Solheim, John H. Rowland |
An Empirical Study of Testing and Integration Strategies Using Artificial Software Systems. |
IEEE Trans. Software Eng. |
1993 |
DBLP DOI BibTeX RDF |
artificial software systems, top-down strategies, sandwich integration strategies, spot unit testing, bottom-up integration, defect correction, big-bang strategies, code generator, software reliability, program testing, system reliability, reliable systems, verification processes |
12 | Seth D. Silverstein, Lewis J. Thomas |
Analytical comparison of sensor signal processing enhancements for NDT synthetic aperture ultrasonic imaging. |
IEEE Trans. Image Process. |
1993 |
DBLP DOI BibTeX RDF |
|
12 | Richard G. Hamlet, Jeffrey M. Voas |
Faults on Its Sleeve: Amplifying Software Reliability Testing. |
ISSTA |
1993 |
DBLP DOI BibTeX RDF |
software reliability, testability, failure, fault |
12 | Joe Wigglesworth |
Surveys as a method for improving the development process. |
CASCON |
1993 |
DBLP BibTeX RDF |
|
12 | Weiwei Mao, Ravi K. Gulati |
Quietest: A methodology for selecting IDDQ test vectors. |
J. Electron. Test. |
1992 |
DBLP DOI BibTeX RDF |
weak faults, I DDQ testing, Leakage faults |
12 | Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong |
Orthogonal Defect Classification - A Concept for In-Process Measurements. |
IEEE Trans. Software Eng. |
1992 |
DBLP DOI BibTeX RDF |
in-process measurements, cause-effect relationships, measurement and analysis methods, defect trigger distribution, testing, software development, software quality, software reliability, feedback, completeness, inspection, semantic information, necessary and sufficient conditions, verification processes, orthogonal defect classification |
12 | A. Ravishankar Rao, Ramesh C. Jain |
Computerized Flow Field Analysis: Oriented Texture Fields. |
IEEE Trans. Pattern Anal. Mach. Intell. |
1992 |
DBLP DOI BibTeX RDF |
flow field analysis, oriented texture fields, signal-to-symbol transformation, velocity vector fields, geometric theory, symbol set, phase portraits, symbolic descriptors, flow visualization pictures, semiconductor wafer inspection, optical flow fields, computer vision, computerised picture processing, computerised pattern recognition, computerised pattern recognition, differential equations, differential equations, optical information processing, symbolic representation |
12 | Anna Antola, Roberto M. Negrini, Mariagiovanna Sami, Nello Scarabottolo |
Fault tolerance in FFT arrays: Time redundancy approaches. |
J. VLSI Signal Process. |
1992 |
DBLP DOI BibTeX RDF |
|
12 | Bruno Ciciani, Giuseppe Iazeolla |
A Markov chain-based yield formula for VLSI fault-tolerant chips. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1991 |
DBLP DOI BibTeX RDF |
|
12 | Michael Demjanenko, Shambhu J. Upadhyaya |
Yield enhancement of field programmable logic arrays by inherent component redundancy. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1990 |
DBLP DOI BibTeX RDF |
|
12 | Ytzhak H. Levendel |
Reliability Analysis of Large Software Systems: Defect Data Modeling. |
IEEE Trans. Software Eng. |
1990 |
DBLP DOI BibTeX RDF |
defect data modeling, large distributed systems, defect removal, birth-death mathematical model, field failure report data, software development, distributed processing, software reliability, quality, program testing, large-scale systems, reliability analysis, bottleneck |
12 | Phil Nigh, Wojciech Maly |
Test Generation for Current Testing (CMOS ICs). |
IEEE Des. Test Comput. |
1990 |
DBLP DOI BibTeX RDF |
|
12 | Martin D. Giles |
Defect-coupled diffusion at high concentrations. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1989 |
DBLP DOI BibTeX RDF |
|
12 | John H. Rowland, Y. Zuyuan |
Experimental Comparison of Three System Test Strategies Preliminary Report. |
Symposium on Testing, Analysis, and Verification |
1989 |
DBLP DOI BibTeX RDF |
|
12 | Kit Po Wong, Chi Ping Tsang, Wan Yee Chan |
Sherlock - a System for Diagnosing Power Distribution Ring Network Faults. |
IEA/AIE (Vol. 1) |
1988 |
DBLP DOI BibTeX RDF |
Prolog, Smalltalk |
12 | Elizabeth S. Adams, Mary W. Gray |
Liability for malfunction of medical expert systems - why an expert system is like a power saw (abstract only). |
ACM Conference on Computer Science |
1987 |
DBLP DOI BibTeX RDF |
|
12 | Ned Chapin |
Symbolic analysis methods for information systems. |
Commun. ACM |
1961 |
DBLP DOI BibTeX RDF |
application mechanization, formalized analysis techniques, symbolic analysis methods, systems automation, information systems, system design, system analysis, data processing |
11 | Weitao Li, Qianqian Tong, Jiaqin Gu, Junchen Li, Wei Sun 0011, Qiyue Li |
A self-adjusting transformer network for detecting transmission line defects. |
Neural Comput. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Aya Zahra, Mohamed Amin, Fathi E. Abd El-Samie, Mahmoud Emam |
Efficient utilization of deep learning for the detection of fabric defects. |
Neural Comput. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Nhat-To Huynh |
An approach for classifying ceramic tile defects based on a two-dimensional Genetic CNN algorithm. |
Neural Comput. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Mario Dib, Pedro A. Prates, Bernardete Ribeiro |
SecFL - Secure Federated Learning Framework for predicting defects in sheet metal forming under variability. |
Expert Syst. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Qiang Wu, Zeqi Hu, Xunpeng Qin, Bo Huang, Kang Dong, Aixian Shi |
Surface defects 3D localization for fluorescent magnetic particle inspection via regional reconstruction and partial-in-complete point clouds registration. |
Expert Syst. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Waseem Akram, Taimur Hassan, Hamed Toubar, Muhayyuddin Ahmed, Nikola Miskovic, Lakmal D. Seneviratne, Irfan Hussain |
Aquaculture defects recognition via multi-scale semantic segmentation. |
Expert Syst. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Siyamalan Manivannan |
Semi-supervised imbalanced classification of wafer bin map defects using a Dual-Head CNN. |
Expert Syst. Appl. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Wensong Wang, Quqin Sun, Zhenyu Zhao, Zhongyuan Fang, Jian Sheng Tay, Kye Yak See, Yuanjin Zheng |
Novel Coil Transducer Induced Thermoacoustic Detection of Rail Internal Defects Towards Intelligent Processing. |
IEEE Trans. Ind. Electron. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Qi Xiao, Jian Feng 0001, Huaguang Zhang, Qiangxin Li |
Composite Sensor of EMAT and ECT Using a Shareable Receiver Coil for Detecting Surface and Bottom Defects on the Steel Plate. |
IEEE Trans. Ind. Electron. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Anthony Ashwin Peter Chazhoor, Edmond S. L. Ho, Bin Gao 0003, Wai Lok Woo |
A Review and Benchmark on State-of-the-Art Steel Defects Detection. |
SN Comput. Sci. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | |
Retraction Note: Analyzing gene polymorphism and metal folic acid interactions in neural tube defects using optimized deep recurrent neural networks. |
Pers. Ubiquitous Comput. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Beraud |
Modal approach based on global stereocorrelation for defects measurement in wire-laser additive manufacturing. |
J. Electronic Imaging |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Tianyuan Hu, Bixin Li, Zhenyu Pan, Chen Qian |
Detect Defects of Solidity Smart Contract Based on the Knowledge Graph. |
IEEE Trans. Reliab. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Wenqian Chen, Yuanlin Zheng, Kaiyang Liao, Haiwen Liu, Yalin Miao, Bangyong Sun |
Small target detection algorithm for printing defects detection based on context structure perception and multi-scale feature fusion. |
Signal Image Video Process. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Ziang Zhou, Wensong Zhao, Jun Li, Kechen Song |
SPCNet: a strip pyramid ConvNeXt network for detection of road surface defects. |
Signal Image Video Process. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Hao Wang, Lanxue Fu, Liwen Wang |
Detection algorithm of aircraft skin defects based on improved YOLOv8n. |
Signal Image Video Process. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Siyamalan Manivannan |
Pseudo-labeling and clustering-based active learning for imbalanced classification of wafer bin map defects. |
Signal Image Video Process. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Pengyu Wang, Peng Jing |
Deep learning-based methods for detecting defects in cast iron parts and surfaces. |
IET Image Process. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Jiacheng Fan, Min Wang, Baolei Li, Mingxue Liu, Dingcai Shen |
ACD-YOLO: Improved YOLOv5-based method for steel surface defects detection. |
IET Image Process. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Xin Xie 0002, Songlin Ge, Mingye Xie, Fengping Hu, Nan Jiang 0013, Tijian Cai, Bo Li |
Image matching algorithm of defects on navel orange surface based on compressed sensing. |
J. Ambient Intell. Humaniz. Comput. |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Niannian Wang, Zexi Zhang, Haobang Hu, Bin Li, Jianwei Lei |
Underground Defects Detection Based on GPR by Fusing Simple Linear Iterative Clustering Phash (SLIC-Phash) and Convolutional Block Attention Module (CBAM)-YOLOv8. |
IEEE Access |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Qiang Zhang, Jianing Zhang, Ying Li, Changfei Zhu, Guifang Wang |
IL-YOLO: An Efficient Detection Algorithm for Insulator Defects in Complex Backgrounds of Transmission Lines. |
IEEE Access |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Sajid Anwer, Lian Wen, Mahmood Ul Hassan, Zhe Wang 0001, Amin A. Al-Awady, Yahya Ali Abdelrahman Ali |
BERDD: A Behaviour Engineering-Based Approach for Requirements Defects Detection. |
IEEE Access |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Niannian Wang, Zexi Zhang, Haobang Hu, Bin Li, Jianwei Lei |
Corrections to "Underground Defects Detection Based on GPR by Fusing Simple Linear Iterative Clustering Phash (SLIC-Phash) and Convolutional Block Attention Module (CBAM)-YOLOv8". |
IEEE Access |
2024 |
DBLP DOI BibTeX RDF |
|
11 | Abderrahman El Idrissi, Aziz Derouich, Said Mahfoud, Najib El Ouanjli, Abdelilah Byou, Fahd Ahmed Banakhr, Mohamed I. Mosaad |
Stator Imbalance Defects Diagnosis of Induction Machine Using Thermography and Machine Learning Algorithms. |
IEEE Access |
2024 |
DBLP DOI BibTeX RDF |
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