Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
12	Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada	CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
12	Stefan Biffl, Michael Halling	Investigating Reinspection Decision Accuracy Regarding Product-Quality and Cost-Benefit Estimates.	COMPSAC	2001	DBLP DOI BibTeX RDF	Defect Detection Capability Estimation, Measurement, Empirical Software Engineering, Controlled Experiment, Software Inspection, Quality Management, Reliability Growth Models
12	Wei Yi	Automatic Aircraft Recognition Using Maximum Likelihood Ratio Test.	Active Media Technology	2001	DBLP DOI BibTeX RDF
12	Paul Lee, Alfred Chen, Dilip Mathew	A Speed-Dependent Approach for Delta IDDQ Implementation.	DFT	2001	DBLP DOI BibTeX RDF	Self-scaling IDDQ, Speed Performance Index, characterization, Delta IDDQ
12	Neil Harrison	A Simple via Duplication Tool for Yield Enhancement.	DFT	2001	DBLP DOI BibTeX RDF
12	Sergio Coronado, José Alberto Jaén	Incremental Quality Network.	APAQS	2001	DBLP DOI BibTeX RDF
12	Irith Pomeranz, Sudhakar M. Reddy	On n-detection test sets and variable n-detection test sets fortransition faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
12	Adriana Bodnarova, Mohammed Bennamoun, Kurt Kubik	Suitability Analysis of Techniques for Flaw Detection in Textiles using Texture Analysis.	Pattern Anal. Appl.	2000	DBLP DOI BibTeX RDF	Flaw detection techniques, Textile quality control, Weaving flaws, Texture analysis, Case study, Visual inspection
12	Pin Xie, Sheng Uei Guan	A golden-template self-generating method for patterned wafer inspection.	Mach. Vis. Appl.	2000	DBLP DOI BibTeX RDF	Wafer inspection, Golden template, Spectral estimation, PDI, Image-to-image reference method
12	Charles Howell, Gary Vecellio	Experiences with Error Handling in Critical Systems.	Advances in Exception Handling Techniques	2000	DBLP DOI BibTeX RDF
12	Stefan Biffl	Analysis of the impact of reading technique and inspector capability on individual inspection performance.	APSEC	2000	DBLP DOI BibTeX RDF	performance index, inspector capability, individual inspection performance, software document inspection, quality assurance measure, software defect detection, software product quality feedback, requirements specification document, inspectors' attention, inspection targets, severity levels, inspection planners, detection effectiveness, document coverage, inspection effort, inspection performance, software development, human factors, software quality, empirical software engineering, system documentation, reading technique
12	Chin-Te Kao, Sam Wu, Jwu E. Chen	A case study of failure analysis and guardband determination for a 64M-bit DRAM.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	guardband determination, prevention strategy, test derivation, test cost, 64 Mbit, integrated circuit testing, yield, DRAM, failure analysis, failure analysis, test selection, DRAM chips, product quality, integrated circuit yield, integrated circuit economics
12	John T. Carr III, Osman Balci	Verification and validation of object-oriented artifacts throughout the simulation model development life cycle.	WSC	2000	DBLP DOI BibTeX RDF
12	Lee J. White, Husain Almezen	Generating Test Cases for GUI Responsibilities Using Complete Interaction Sequences.	ISSRE	2000	DBLP DOI BibTeX RDF	GUI Object Collaboration, Complete Interaction Sequences, Graphical User Interfaces, GUI Testing
12	Stefan Biffl, Michael Halling	Software Product Improvement with Inspection.	EUROMICRO	2000	DBLP DOI BibTeX RDF	Software inspection process, empirical software engineering, controlled experiment, quality measurement, defect detection techniques
12	Sukalyan Mukherjee	Design for Testability to Achieve High Test Coverage - A Case Study.	DFT	2000	DBLP DOI BibTeX RDF
12	Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng	On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set.	VTS	2000	DBLP DOI BibTeX RDF	Microprocessor self-testing, Path delay fault classification, Functionally testable paths, Functional tests, Delay fault testing
12	Paul Clay, Alan Crispin, Sam Crossley	A Comparative Analysis of Search Methods as Applied to Shearographic Fringe Modeling.	IEA/AIE	2000	DBLP DOI BibTeX RDF
12	Víctor H. Champac, José Castillejos, Joan Figueras	IDDQ Testing of Opens in CMOS SRAMs.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	data retention faults, memory testing, opens, IDDQ
12	Diego Del Gobbo, Bojan Cukic, Marcello R. Napolitano, Steve M. Easterbrook	Fault Detectability Analysis for Requirements Validation of Fault Tolerant Systems.	HASE	1999	DBLP DOI BibTeX RDF
12	Maha Boughdadi, Robert Busser	An Industrial Application of an Integrated UML and SDL Modeling Technique.	COMPSAC	1999	DBLP DOI BibTeX RDF
12	Anna Anzalone, G. Gugliotta, Alberto Machì, G. Sardisco	Automatic Quality Control of Industrial Products for Irrigation.	ICIAP	1999	DBLP DOI BibTeX RDF
12	Sheng Uei Guan, Pin Xie	A Golden Block Self-Generating Scheme for Continuous Patterned Wafer Inspections.	ICIAP	1999	DBLP DOI BibTeX RDF
12	Jean-Sébastien Coron	On the Security of Random Sources.	Public Key Cryptography	1999	DBLP DOI BibTeX RDF
12	Abderrahim Doumar, Satoshi Kaneko, Hideo Ito	Defect and Fault Tolerance FPGAs by Shifting the Configuration Data.	DFT	1999	DBLP DOI BibTeX RDF
12	Irith Pomeranz, Sudhakar M. Reddy	On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults.	VTS	1999	DBLP DOI BibTeX RDF
12	F. Calzolari, Paolo Tonella, Giuliano Antoniol	Modeling Maintenance Effort by Means of Dynamic Systems.	CSMR	1998	DBLP DOI BibTeX RDF
12	Pascal Nussbaum, Bernard Girau, Arnaud Tisserand	Field Programmable Processor Arrays.	ICES	1998	DBLP DOI BibTeX RDF
12	Dhamin Al-Khalili, Saman Adham, Côme Rozon, Moazzem Hossain, Douglas Racz	Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits.	DFT	1998	DBLP DOI BibTeX RDF	CMOS Defect Modeling, Defect Analysis
12	Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey	Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.	ITC	1998	DBLP DOI BibTeX RDF
12	F. Calzolari, Paolo Tonella, Giuliano Antoniol	Dynamic Model for Maintenance and Testing Effort.	ICSM	1998	DBLP DOI BibTeX RDF
12	Steven Haehn, T. S. Kalkur	Failure Analysis of VLSI by IDDQ Testing.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	quiescent current measurement, scanning electron microscope, fault diagnosis, failure analysis
12	Mick Tegethoff, Tom Chen 0001	Simulation Techniques for the Manufacturing Test of MCMs.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	simulation, test, DFT, yield, DFM, SMT, MCM, board
12	José M. Miranda	A BIST and Boundary-Scan Economics Framework.	IEEE Des. Test Comput.	1997	DBLP DOI BibTeX RDF
12	Lesley Pek Wee Land, D. Ross Jeffery, Chris Sauer	Validating the Defect Detection Performance Advantage of Group Designs for Software Reviews: Report of a Replicated Experiment.	Australian Software Engineering Conference	1997	DBLP DOI BibTeX RDF	Software Development Technical Review, interacting group, nominal group, defect detection, false positives
12	Bernard Faure, Maguelonne Teisseire, Rosine Cicchetti	Activity Threads: A Unified Framework for Aiding Behavioural Modelling.	DEXA	1997	DBLP DOI BibTeX RDF
12	Björn Schieffer, Günter Hotz	Diagnosis of Tank Ballast Systems.	IDA	1997	DBLP DOI BibTeX RDF
12	Tien-fu Chang, Alejandro Danylyzsn, So Norimatsu, Jose Rivera, David Shepard, Anthony J. Lattanze, James E. Tomayko	"Continuous Verification" in Mission Critical Software Development.	HICSS (5)	1997	DBLP DOI BibTeX RDF
12	Michiel van Genuchten, Wieger Cornelissen, Cor van Dijk	Supporting Inspections With an Electronic Meeting System.	HICSS (2)	1997	DBLP DOI BibTeX RDF
12	Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001	Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems.	DFT	1997	DBLP DOI BibTeX RDF
12	Pascal Bichebois, Pierre Mathery	Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits.	DFT	1997	DBLP DOI BibTeX RDF	algorithm, tool, correlation, method, errors, inspection, yield, failure, defect, limits
12	Pascal Caunegre, Claude Abraham	Fault simulation for mixed-signal systems.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	mixed-signal systems, fault simulation, bridging faults
12	Jan Rooijmans, Hans Aerts, Michiel van Genuchten	Software Quality in Consumer Electronics Products.	IEEE Softw.	1996	DBLP DOI BibTeX RDF
12	Watts S. Humphrey	Using A Defined and Measured Personal Software Process.	IEEE Softw.	1996	DBLP DOI BibTeX RDF
12	Khoi Hoang, Anantharai Nachimuthu	Image processing techniques for leather hide ranking in the footwear industry.	Mach. Vis. Appl.	1996	DBLP DOI BibTeX RDF	Leather hide ranking, Scanning process, Scanning algorithm, Footwear, Machine vision
12	Teruhiko Yamada, Tsuyoshi Sasaki	On Current Testing of Josephson Logic Circuits Using the 4JL Gate Family.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	4JL gate, Josephson logic circuit, current testing, defect coverage
12	Li-C. Wang, M. Ray Mercer, Thomas W. Williams	A Better ATPG Algorithm and Its Design Principles.	ICCD	1996	DBLP DOI BibTeX RDF
12	Tomas Vagoun	Input Domain Partitioning in Software Testing.	HICSS (2)	1996	DBLP DOI BibTeX RDF
12	Joan Figueras, Michel Renovell	Current testing in dynamic CMOS circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	dynamic CMOS, test technique, integrated circuit, Current testing
12	R. Geoff Dromey	A Model for Software Product Quality.	IEEE Trans. Software Eng.	1995	DBLP DOI BibTeX RDF	product evaluation, code auditing, quality defect classification, software characteristics, quality-carrying properties, Software quality, maintainability, quality attributes, quality model, ISO-9126
12	Mauro Barni, A. W. Mussa, Alessandro Mecocci, Vito Cappellini, Tariq S. Durrani	An intelligent perception system for food quality inspection using color analysis.	ICIP	1995	DBLP DOI BibTeX RDF	food processing industry, intelligent perception system, food quality inspection, vision based intelligent perception system, chicken meat, RGB images, burns, hematomas, blisters, vision module, anatomic subparts, defect description, reference database, computer vision, image segmentation, image reconstruction, image analysis, mathematical morphology, multilayer perceptrons, image colour analysis, manufacturing systems, automatic optical inspection, morphological reconstruction, color analysis, automated inspection
12	Kimberly Williams	Using object oriented analysis and design in a non-object oriented environment experience report.	ICSM	1995	DBLP DOI BibTeX RDF	control system analysis computing, nonobject oriented environment, subsystem development, independent test, Allen-Bradley's 6200 Series Programming Software for Programmable Controllers, structured analysis/structured design subsystems, function point number, code line number, subsystem function number, defect number, defect fixing time, complexity, metrics, software maintenance, software metrics, programming environments, program testing, object oriented design, object-oriented methods, object oriented analysis, structured programming, programmable controllers, control system CAD, development time, Object Modeling Technique
12	Israel Koren, Zahava Koren, Charles H. Stapper	A statistical study of defect maps of large area VLSI IC's.	IEEE Trans. Very Large Scale Integr. Syst.	1994	DBLP DOI BibTeX RDF
12	Daniel Brand, Vijay S. Iyengar	Identification of redundant delay faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
12	Kanad Chakraborty, Pinaki Mazumder	Technology and layout-related testing of static random-access memories.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	Array layout, cell technology, Gallium Arsenide (GaAs), high electron mobility transistor (HEMT) RAMs, I DD testing, I DDQ testing
12	D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan	Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model.	IEEE Trans. Very Large Scale Integr. Syst.	1993	DBLP DOI BibTeX RDF
12	Marcel Jacomet, Walter Guggenbühl	Layout-dependent fault analysis and test synthesis for CMOS circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
12	Sundarar Mohan, Pinaki Mazumder	Analytical and simulation studies of failure modes in SRAMs using high electron mobility transistors.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
12	Jeffery A. Solheim, John H. Rowland	An Empirical Study of Testing and Integration Strategies Using Artificial Software Systems.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	artificial software systems, top-down strategies, sandwich integration strategies, spot unit testing, bottom-up integration, defect correction, big-bang strategies, code generator, software reliability, program testing, system reliability, reliable systems, verification processes
12	Seth D. Silverstein, Lewis J. Thomas	Analytical comparison of sensor signal processing enhancements for NDT synthetic aperture ultrasonic imaging.	IEEE Trans. Image Process.	1993	DBLP DOI BibTeX RDF
12	Richard G. Hamlet, Jeffrey M. Voas	Faults on Its Sleeve: Amplifying Software Reliability Testing.	ISSTA	1993	DBLP DOI BibTeX RDF	software reliability, testability, failure, fault
12	Joe Wigglesworth	Surveys as a method for improving the development process.	CASCON	1993	DBLP BibTeX RDF
12	Weiwei Mao, Ravi K. Gulati	Quietest: A methodology for selecting IDDQ test vectors.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	weak faults, I DDQ testing, Leakage faults
12	Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong	Orthogonal Defect Classification - A Concept for In-Process Measurements.	IEEE Trans. Software Eng.	1992	DBLP DOI BibTeX RDF	in-process measurements, cause-effect relationships, measurement and analysis methods, defect trigger distribution, testing, software development, software quality, software reliability, feedback, completeness, inspection, semantic information, necessary and sufficient conditions, verification processes, orthogonal defect classification
12	A. Ravishankar Rao, Ramesh C. Jain	Computerized Flow Field Analysis: Oriented Texture Fields.	IEEE Trans. Pattern Anal. Mach. Intell.	1992	DBLP DOI BibTeX RDF	flow field analysis, oriented texture fields, signal-to-symbol transformation, velocity vector fields, geometric theory, symbol set, phase portraits, symbolic descriptors, flow visualization pictures, semiconductor wafer inspection, optical flow fields, computer vision, computerised picture processing, computerised pattern recognition, computerised pattern recognition, differential equations, differential equations, optical information processing, symbolic representation
12	Anna Antola, Roberto M. Negrini, Mariagiovanna Sami, Nello Scarabottolo	Fault tolerance in FFT arrays: Time redundancy approaches.	J. VLSI Signal Process.	1992	DBLP DOI BibTeX RDF
12	Bruno Ciciani, Giuseppe Iazeolla	A Markov chain-based yield formula for VLSI fault-tolerant chips.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1991	DBLP DOI BibTeX RDF
12	Michael Demjanenko, Shambhu J. Upadhyaya	Yield enhancement of field programmable logic arrays by inherent component redundancy.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
12	Ytzhak H. Levendel	Reliability Analysis of Large Software Systems: Defect Data Modeling.	IEEE Trans. Software Eng.	1990	DBLP DOI BibTeX RDF	defect data modeling, large distributed systems, defect removal, birth-death mathematical model, field failure report data, software development, distributed processing, software reliability, quality, program testing, large-scale systems, reliability analysis, bottleneck
12	Phil Nigh, Wojciech Maly	Test Generation for Current Testing (CMOS ICs).	IEEE Des. Test Comput.	1990	DBLP DOI BibTeX RDF
12	Martin D. Giles	Defect-coupled diffusion at high concentrations.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1989	DBLP DOI BibTeX RDF
12	John H. Rowland, Y. Zuyuan	Experimental Comparison of Three System Test Strategies Preliminary Report.	Symposium on Testing, Analysis, and Verification	1989	DBLP DOI BibTeX RDF
12	Kit Po Wong, Chi Ping Tsang, Wan Yee Chan	Sherlock - a System for Diagnosing Power Distribution Ring Network Faults.	IEA/AIE (Vol. 1)	1988	DBLP DOI BibTeX RDF	Prolog, Smalltalk
12	Elizabeth S. Adams, Mary W. Gray	Liability for malfunction of medical expert systems - why an expert system is like a power saw (abstract only).	ACM Conference on Computer Science	1987	DBLP DOI BibTeX RDF
12	Ned Chapin	Symbolic analysis methods for information systems.	Commun. ACM	1961	DBLP DOI BibTeX RDF	application mechanization, formalized analysis techniques, symbolic analysis methods, systems automation, information systems, system design, system analysis, data processing
11	Weitao Li, Qianqian Tong, Jiaqin Gu, Junchen Li, Wei Sun 0011, Qiyue Li	A self-adjusting transformer network for detecting transmission line defects.	Neural Comput. Appl.	2024	DBLP DOI BibTeX RDF
11	Aya Zahra, Mohamed Amin, Fathi E. Abd El-Samie, Mahmoud Emam	Efficient utilization of deep learning for the detection of fabric defects.	Neural Comput. Appl.	2024	DBLP DOI BibTeX RDF
11	Nhat-To Huynh	An approach for classifying ceramic tile defects based on a two-dimensional Genetic CNN algorithm.	Neural Comput. Appl.	2024	DBLP DOI BibTeX RDF
11	Mario Dib, Pedro A. Prates, Bernardete Ribeiro	SecFL - Secure Federated Learning Framework for predicting defects in sheet metal forming under variability.	Expert Syst. Appl.	2024	DBLP DOI BibTeX RDF
11	Qiang Wu, Zeqi Hu, Xunpeng Qin, Bo Huang, Kang Dong, Aixian Shi	Surface defects 3D localization for fluorescent magnetic particle inspection via regional reconstruction and partial-in-complete point clouds registration.	Expert Syst. Appl.	2024	DBLP DOI BibTeX RDF
11	Waseem Akram, Taimur Hassan, Hamed Toubar, Muhayyuddin Ahmed, Nikola Miskovic, Lakmal D. Seneviratne, Irfan Hussain	Aquaculture defects recognition via multi-scale semantic segmentation.	Expert Syst. Appl.	2024	DBLP DOI BibTeX RDF
11	Siyamalan Manivannan	Semi-supervised imbalanced classification of wafer bin map defects using a Dual-Head CNN.	Expert Syst. Appl.	2024	DBLP DOI BibTeX RDF
11	Wensong Wang, Quqin Sun, Zhenyu Zhao, Zhongyuan Fang, Jian Sheng Tay, Kye Yak See, Yuanjin Zheng	Novel Coil Transducer Induced Thermoacoustic Detection of Rail Internal Defects Towards Intelligent Processing.	IEEE Trans. Ind. Electron.	2024	DBLP DOI BibTeX RDF
11	Qi Xiao, Jian Feng 0001, Huaguang Zhang, Qiangxin Li	Composite Sensor of EMAT and ECT Using a Shareable Receiver Coil for Detecting Surface and Bottom Defects on the Steel Plate.	IEEE Trans. Ind. Electron.	2024	DBLP DOI BibTeX RDF
11	Anthony Ashwin Peter Chazhoor, Edmond S. L. Ho, Bin Gao 0003, Wai Lok Woo	A Review and Benchmark on State-of-the-Art Steel Defects Detection.	SN Comput. Sci.	2024	DBLP DOI BibTeX RDF
11		Retraction Note: Analyzing gene polymorphism and metal folic acid interactions in neural tube defects using optimized deep recurrent neural networks.	Pers. Ubiquitous Comput.	2024	DBLP DOI BibTeX RDF
11	Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Beraud	Modal approach based on global stereocorrelation for defects measurement in wire-laser additive manufacturing.	J. Electronic Imaging	2024	DBLP DOI BibTeX RDF
11	Tianyuan Hu, Bixin Li, Zhenyu Pan, Chen Qian	Detect Defects of Solidity Smart Contract Based on the Knowledge Graph.	IEEE Trans. Reliab.	2024	DBLP DOI BibTeX RDF
11	Wenqian Chen, Yuanlin Zheng, Kaiyang Liao, Haiwen Liu, Yalin Miao, Bangyong Sun	Small target detection algorithm for printing defects detection based on context structure perception and multi-scale feature fusion.	Signal Image Video Process.	2024	DBLP DOI BibTeX RDF
11	Ziang Zhou, Wensong Zhao, Jun Li, Kechen Song	SPCNet: a strip pyramid ConvNeXt network for detection of road surface defects.	Signal Image Video Process.	2024	DBLP DOI BibTeX RDF
11	Hao Wang, Lanxue Fu, Liwen Wang	Detection algorithm of aircraft skin defects based on improved YOLOv8n.	Signal Image Video Process.	2024	DBLP DOI BibTeX RDF
11	Siyamalan Manivannan	Pseudo-labeling and clustering-based active learning for imbalanced classification of wafer bin map defects.	Signal Image Video Process.	2024	DBLP DOI BibTeX RDF
11	Pengyu Wang, Peng Jing	Deep learning-based methods for detecting defects in cast iron parts and surfaces.	IET Image Process.	2024	DBLP DOI BibTeX RDF
11	Jiacheng Fan, Min Wang, Baolei Li, Mingxue Liu, Dingcai Shen	ACD-YOLO: Improved YOLOv5-based method for steel surface defects detection.	IET Image Process.	2024	DBLP DOI BibTeX RDF
11	Xin Xie 0002, Songlin Ge, Mingye Xie, Fengping Hu, Nan Jiang 0013, Tijian Cai, Bo Li	Image matching algorithm of defects on navel orange surface based on compressed sensing.	J. Ambient Intell. Humaniz. Comput.	2024	DBLP DOI BibTeX RDF
11	Niannian Wang, Zexi Zhang, Haobang Hu, Bin Li, Jianwei Lei	Underground Defects Detection Based on GPR by Fusing Simple Linear Iterative Clustering Phash (SLIC-Phash) and Convolutional Block Attention Module (CBAM)-YOLOv8.	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Qiang Zhang, Jianing Zhang, Ying Li, Changfei Zhu, Guifang Wang	IL-YOLO: An Efficient Detection Algorithm for Insulator Defects in Complex Backgrounds of Transmission Lines.	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Sajid Anwer, Lian Wen, Mahmood Ul Hassan, Zhe Wang 0001, Amin A. Al-Awady, Yahya Ali Abdelrahman Ali	BERDD: A Behaviour Engineering-Based Approach for Requirements Defects Detection.	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Niannian Wang, Zexi Zhang, Haobang Hu, Bin Li, Jianwei Lei	Corrections to "Underground Defects Detection Based on GPR by Fusing Simple Linear Iterative Clustering Phash (SLIC-Phash) and Convolutional Block Attention Module (CBAM)-YOLOv8".	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Abderrahman El Idrissi, Aziz Derouich, Said Mahfoud, Najib El Ouanjli, Abdelilah Byou, Fahd Ahmed Banakhr, Mohamed I. Mosaad	Stator Imbalance Defects Diagnosis of Induction Machine Using Thermography and Machine Learning Algorithms.	IEEE Access	2024	DBLP DOI BibTeX RDF