Search results for "compaction"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
134	Yoav Ossia, Ori Ben-Yitzhak, Marc Segal	Mostly concurrent compaction for mark-sweep GC.	ISMM	2004	DBLP DOI BibTeX RDF	concurrent compaction, incremental compaction, Java, garbage collection, JVM, compaction
115	Ahmed A. El Farag, Hatem M. El-Boghdadi, Samir I. Shaheen	Improving utilization of reconfigurable resources using two-dimensional compaction.	J. Supercomput.	2007	DBLP DOI BibTeX RDF	Pre-emptive tasks, Online placement, Compaction, Partial reconfiguration, Resources utilization
101	Ahmed A. El Farag, Hatem M. El-Boghdadi, Samir I. Shaheen	Improving utilization of reconfigurable resources using two dimensional compaction.	DATE	2007	DBLP DOI BibTeX RDF
101	Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy	Static test sequence compaction based on segment reordering and accelerated vector restoration.	ITC	1998	DBLP DOI BibTeX RDF
94	Diab Abuaiadh, Yoav Ossia, Erez Petrank, Uri Silbershtein	An efficient parallel heap compaction algorithm.	OOPSLA	2004	DBLP DOI BibTeX RDF	parallel compaction, java, garbage collection, JVM, compaction, parallel garbage collection
93	Krishnendu Chakrabarty	Zero-aliasing space compaction using linear compactors with bounded overhead.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
89	Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara	Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	Time expansion model, acyclic sequential circuit, reverse transformation fault simulation, template, Test sequence compaction
85	Slawomir Pilarski, Kevin James Wiebe	Counter-based compaction: An analysis for BIST.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	compaction by counter, edge counting, one's counting, transition counting, built-in self-test, linear feedback shift register, signature analysis, Aliasing probability, test response compaction
80	Michael S. Hsiao, Srimat T. Chakradhar	Test Set Compaction Using Relaxed Subsequence Removal.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	static test set compaction, support sets, recurrence subsequence, ATPG
80	Michael S. Hsiao, Srimat T. Chakradhar	Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	static test set compaction, vector-reordering, fault coverage curve, partitioning, ATPG
77	Rainer Leupers, Peter Marwedel	Time-constrained code compaction for DSPs.	ISSS	1995	DBLP DOI BibTeX RDF	code generation techniques, digital signal processing algorithms, encoding restrictions, exact timing behavior, hard real-time constraints, integer programming model, local code compaction, programmable DSP, rigid heuristics, time-constrained code compaction, real-time systems, timing, integer programming, instruction-level parallelism, source coding, automatic programming, digital signal processing chips, side-effects
75	Narayan Vikas	Computational Complexity Classification of Partition under Compaction and Retraction.	COCOON	2004	DBLP DOI BibTeX RDF
75	Irith Pomeranz, Sudhakar M. Reddy	Improving the Efficiency of Static Compaction Based on Chronological Order Enumeration of Test Sequences.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
75	Zhenyu Li, Victor Milenkovic	A Compaction Algorithm for Non-Convex Polygons and Its Application.	SCG	1993	DBLP DOI BibTeX RDF
72	Nian-Feng Tzeng, Hsing-Lung Chen	Fast Compaction in Hypercubes.	IEEE Trans. Parallel Distributed Syst.	1998	DBLP DOI BibTeX RDF	hypercubes, fragmentation, Compaction, disjoint paths, task migration, subcubes
72	Michael S. Hsiao, Srimat T. Chakradhar	State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential Circuits.	DATE	1998	DBLP DOI BibTeX RDF	test set compaction, state relaxation, recurrence subsequence removal, sequential circuit
68	Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal	Compaction-based test generation using state and fault information.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	compaction-based test generation, newly-traversed state information, newly-detected fault information, vector compaction iterations, vector sequence bias, biased vectors, compacted test set extension, intelligent vector selection, state analysis, fault diagnosis, fault detection, sequential circuits, sequential circuits, automatic test pattern generation, iterative methods, vectors, fault coverage, circuit analysis computing, fault analysis, benchmark circuits, computing resources, vector generation
68	Markus Seuring, Krishnendu Chakrabarty	Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions.	VTS	2000	DBLP DOI BibTeX RDF	non-modeled faults, one-step compaction, two-step compaction, error detection, transparency, Aliasing
67	Sverre Wichlund, Frank Berntsen, Einar J. Aas	Scan Test Response Compaction Combined with Diagnosis Capabilities.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Scan compression, Diagnosis, ATPG, Yield, Design for test, ATE
67	Bjorn De Sutter, Bruno De Bus, Koenraad De Bosschere, Saumya K. Debray	Combining Global Code and Data Compaction.	LCTES/OM	2001	DBLP DOI BibTeX RDF
67	Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy	On Improving Static Test Compaction for Sequential Circuits.	VLSI Design	2001	DBLP DOI BibTeX RDF
67	Gunnar W. Klau, Petra Mutzel	Optimal Compaction of Orthogonal Grid Drawings.	IPCO	1999	DBLP DOI BibTeX RDF
67	Irith Pomeranz, Sudhakar M. Reddy	VERSE: A Vector Replacement Procedure for Improving Test Compaction in Synchronous Sequential Circuits.	VLSI Design	1999	DBLP DOI BibTeX RDF
67	Krishnendu Chakrabarty, John P. Hayes	Test response compaction using multiplexed parity trees.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
67	David G. Boyer	Symbolic Layout Compaction Review.	DAC	1988	DBLP BibTeX RDF
63	Aiman H. El-Maleh, Yahya E. Osais	Test vector decomposition-based static compaction algorithms for combinational circuits.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	Static compaction, class-based clustering, independent fault clustering, test vector decomposition, taxonomy, combinational circuits
63	Wen-Ke Chen, Bengu Li, Rajiv Gupta 0001	Code Compaction of Matching Single-Entry Multiple-Exit Regions.	SAS	2003	DBLP DOI BibTeX RDF	single-entry-multiple-exit regions, control flow signature, Code compaction, predicated execution
63	Paulo F. Flores, Horácio C. Neto, João P. Marques Silva	On Applying Set Covering Models to Test Set Compaction.	Great Lakes Symposium on VLSI	1999	DBLP DOI BibTeX RDF	Test Set Compaction, Unate Covering Problem, Test Pattern Generation, Set Covering
63	Anand Raghunathan, Srimat T. Chakradhar	Acceleration techniques for dynamic vector compaction.	ICCAD	1995	DBLP DOI BibTeX RDF	Dynamic equivalent and untestable fault analysis, Target fault switching, Support sets, Test compaction, Acceleration Techniques
59	Ranganathan Sankaralingam, Rama Rao Oruganti, Nur A. Touba	Static Compaction Techniques to Control Scan Vector Power Dissipation.	VTS	2000	DBLP DOI BibTeX RDF	Static Compaction, Test Vector Compaction, Heat Minimization, Low Power, Built-In Self-Test, Design-for-Testability, Integrated Circuits, switching activity, Scan Chains, Peak power, Embedded Cores, Digital Testing
58	Irith Pomeranz, Sudhakar M. Reddy	Vector-restoration-based static compaction using random initial omission.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
58	Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz	Reverse-order-restoration-based static test compaction for synchronous sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
58	Ori Ben-Yitzhak, Irit Goft, Elliot K. Kolodner, Kean Kuiper, Victor Leikehman	An algorithm for parallel incremental compaction.	MSP/ISMM	2002	DBLP DOI BibTeX RDF
58	Kwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata	A Method of Static Compaction of Test Stimuli.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
58	Dimitris Bakalis, Dimitris Nikolos, Haridimos T. Vergos, Xrysovalantis Kavousianos	On Accumulator-Based Bit-Serial Test Response Compaction Schemes.	ISQED	2001	DBLP DOI BibTeX RDF
58	Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy	Resource-Constrained Compaction of Sequential Circuit Test Sets.	VLSI Design	2000	DBLP DOI BibTeX RDF
58	Michael S. Hsiao, Srimat T. Chakradhar	Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
58	Rainer Leupers, Peter Marwedel	Time-constrained code compaction for DSPs.	IEEE Trans. Very Large Scale Integr. Syst.	1997	DBLP DOI BibTeX RDF
58	Srimat T. Chakradhar, Anand Raghunathan	Bottleneck removal algorithm for dynamic compaction in sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1997	DBLP DOI BibTeX RDF
58	Kurt Mehlhorn, Wolfgang Rülling	Compaction on the torus [VLSI layout].	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
58	Mark Harris	Extending microcode compaction for real architectures.	MICRO	1987	DBLP DOI BibTeX RDF
58	Y. Eric Cho	A subjective review of compaction (tutorial session).	DAC	1985	DBLP DOI BibTeX RDF
55	Huaxing Tang, Chen Wang 0014, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz	On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.	VLSI Design	2005	DBLP DOI BibTeX RDF
54	Reshma C. Jumani, Niraj Bharatkumar Jain, Virendra Singh, Kewal K. Saluja	DX-compactor: distributed X-compaction for SoCs.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	dx-compactor, hierarchical compactor, x-compactor, SoC, compaction
54	Michal Wegiel, Chandra Krintz	The mapping collector: virtual memory support for generational, parallel, and concurrent compaction.	ASPLOS	2008	DBLP DOI BibTeX RDF	parallel, concurrent, virtual memory, compaction
54	Haim Kermany, Erez Petrank	The Compressor: concurrent, incremental, and parallel compaction.	PLDI	2006	DBLP DOI BibTeX RDF	garbage collection, memory management, compaction, runtime systems, concurrent garbage collection
54	Yinhe Han 0001, Xiaowei Li 0001, Huawei Li 0001, Anshuman Chandra	Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF	test resource partitioning (TRP), error cancellation, System-on-a-Chip (SoC), diagnose, response compaction
54	Irith Pomeranz, Sudhakar M. Reddy	Static Test Compaction for Full-Scan Circuits Based on Combinational Test Sets and Nonscan Input Sequences and a Lower Bound on the Number of Tests.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF	Scan circuits, test application time, static test compaction
54	Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal	State and Fault Information for Compaction-Based Test Generation.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	sequential circuits, ATPG, test compaction
54	Sandeep Bhatia, Prab Varma	Test Compaction in a Parallel Access Scan Environment.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	Test Vector Compaction, Design for Testability, Scan
54	Wen-Ben Jone, Anita Gleason	Analysis of Hamming count compaction scheme.	J. Electron. Test.	1991	DBLP DOI BibTeX RDF	index vector, spectral coefficients, Built-in self test, compaction, syndrome
52	Jin Ding, David Moloney, Xiaojun Wang 0001	Aliasing-Free Space and Time Compactions with Limited Overhead.	ISQED	2000	DBLP DOI BibTeX RDF
51	Yoshinobu Higami, Yuzo Takamatsu, Kozo Kinoshita	Test sequence compaction for sequential circuits with reset states.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	reset states, test compaction method, single stuck-at fault assumption, unremovable vectors, fault-dropping fault simulation, nonfault-dropping fault simulation, reset signal, test subsequences, logic testing, fault detection, sequential circuits, sequential circuits, automatic test pattern generation, fault simulation, vectors, logic simulation, logic simulation, benchmark circuits, test vectors, signal detection, test sequence compaction
51	Irith Pomeranz, Sudhakar M. Reddy	Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling.	Great Lakes Symposium on VLSI	1998	DBLP DOI BibTeX RDF	dynamic test compaction, synchronous sequential circuits, static test compaction
51	Sunil R. Das, H. T. Ho, Wen-Ben Jone, Amiya R. Nayak	An improved output compaction technique for built-in self-test in VLSI circuits.	VLSI Design	1995	DBLP DOI BibTeX RDF	output compaction technique, space compression technique, compaction tree generation, detectable error probability, Boolean difference method, syndrome counter, VLSI, logic testing, probability, built-in self test, built-in self-test, Boolean functions, integrated circuit testing, design for testability, BIST, combinational circuits, combinational circuits, automatic testing, DFT, fault coverage, integrated logic circuits, digital circuits, VLSI circuits, digital integrated circuits
49	Bo Cui 0002, DengHua Zhong, Ping Zhang 0006, Lei Liu	The Application of Computer Graphic Technology on Monitoring Roller Compaction Quality of Rock-fill Dam.	CGIV	2009	DBLP DOI BibTeX RDF
49	Chinnakrishnan S. Ballapuram, Hsien-Hsin S. Lee, Milos Prvulovic	Synonymous address compaction for energy reduction in data TLB.	ISLPED	2005	DBLP DOI BibTeX RDF	low-power TLB, spatial and temporal locality, multi-porting
49	Puqing Chen, Kejing He, Zhaoyao Zhou, Yuanyuan Li	The Research on MPC-WS, a Web Service for the Simulation of Metal Powder Compaction Process.	GCC	2005	DBLP DOI BibTeX RDF
49	Irith Pomeranz, Sudhakar M. Reddy	Vector replacement to improve static-test compaction forsynchronous sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2001	DBLP DOI BibTeX RDF
49	Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo	Static test compaction for synchronous sequential circuits based on vector restoration.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
49	Ioan Tabus, Corneliu Popeea, Jaakko Astola	Optimizing the compaction gain in a class of IIR filters.	ISCAS (3)	1999	DBLP DOI BibTeX RDF
49	Youssef Saab	An improved linear placement algorithm using node compaction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
49	Roberto Bevacqua, Luca Guerrazzi, Fabrizio Ferrandi, Franco Fummi	Implicit Test Sequences Compaction for Decreasing Test Application Cos.	ICCD	1996	DBLP DOI BibTeX RDF
49	Jau-Shien Chang, Chen-Shang Lin	Test set compaction for combinational circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
49	Prabhakar Radge	The Parallel Simplicity of Compaction and Chaining.	ICALP	1990	DBLP DOI BibTeX RDF
49	Shao-Jun Wei, Jacques Leroy, Raymond Crappe	An efficient two-dimensional compaction algorithm for VLSI symbolic layout.	EURO-DAC	1990	DBLP DOI BibTeX RDF
49	Bogong Su, Jian Wang 0046, Jinshi Xia	Global microcode compaction under timing constraints.	MICRO	1988	DBLP BibTeX RDF
49	M. Al-Suwaiyel, Ellis Horowitz	Algorithms for Trie Compaction.	ACM Trans. Database Syst.	1984	DBLP DOI BibTeX RDF
49	Zinaida V. Apanovich, Alexander G. Marchuk	Top-Down Approach to Technology Migration for Full-Custom Mask Layouts.	VLSI Design	1998	DBLP DOI BibTeX RDF	Technology migration, decomposition, compaction, rerouting
46	Markus Billeter, Ola Olsson, Ulf Assarsson	Efficient stream compaction on wide SIMD many-core architectures.	High Performance Graphics	2009	DBLP DOI BibTeX RDF	stream compaction, GPGPU, CUDA, parallel sorting, prefix sum
46	Yinhe Han 0001, Huawei Li 0001, Xiaowei Li 0001, Anshuman Chandra	Response compaction for system-on-a-chip based on advanced convolutional codes.	Sci. China Ser. F Inf. Sci.	2006	DBLP DOI BibTeX RDF	X bits masking, aliasing, convolutional code, SOC test, response compaction
46	Shahin Nazarian, Massoud Pedram, Sandeep K. Gupta 0001, Melvin A. Breuer	STAX: statistical crosstalk target set compaction.	DATE Designers' Forum	2006	DBLP DOI BibTeX RDF	compaction degree, fault-producing target, pruning power, safe target, statistical static timing analyzer, ATPG
46	Dominique Chanet, Bjorn De Sutter, Bruno De Bus, Ludo Van Put, Koen De Bosschere	System-wide compaction and specialization of the linux kernel.	LCTES	2005	DBLP DOI BibTeX RDF	operating system, compaction, specialization, system calls, linux kernel
46	Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato	Path delay test compaction with process variation tolerance.	DAC	2005	DBLP DOI BibTeX RDF	process variation, delay testing, path delay fault, test compaction
46	Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel	Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Space compaction, testing, stuck-at faults, system-on-a-chip
46	Irith Pomeranz, Sudhakar M. Reddy	Enumeration of Test Sequences in Increasing Chronological Order to Improve the Levels of Compaction Achieved by Vector Omission.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	synchronous sequential circuits, Static test compaction
46	Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy	A Method of Static Test Compaction Based on Don't Care Identification.	DELTA	2002	DBLP DOI BibTeX RDF	Coloring Problem, Don't Care Identification, ATPG, Static Test Compaction
46	Saumya K. Debray, William S. Evans, Robert Muth, Bjorn De Sutter	Compiler techniques for code compaction.	ACM Trans. Program. Lang. Syst.	2000	DBLP DOI BibTeX RDF	code compression, code size reduction, code compaction
46	Irith Pomeranz, Sudhakar M. Reddy	Test-Point Insertion to Enhance Test Compaction for Scan Designs.	DSN	2000	DBLP DOI BibTeX RDF	Scan design, test-point insertion, static test compaction
46	Toshiyuki Maeda, Kozo Kinoshita	Memory reduction of IDDQ test compaction for internal and external bridging faults.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	I/sub DDQ/ test compaction, internal bridging faults, external bridging faults, IDDQ test sequence, reassignment method, weighted random sequences, logic testing, integrated circuit testing, sequential circuits, sequential circuits, automatic testing, fault simulation, CMOS logic circuits, CMOS circuits, test application time reduction, memory reduction
46	Irith Pomeranz, Sudhakar M. Reddy	On Test Compaction Objectives for Combinational and Sequential Circuits.	VLSI Design	1998	DBLP DOI BibTeX RDF	combinational circuits synchronous sequential circuits test compaction tester storage schemes tester memory requirements
46	Irith Pomeranz, Sudhakar M. Reddy	On the Compaction of Test Sets Produced by Genetic Optimization.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	test generation, test compaction, genetic optimization, n-detection test sets
46	Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara	On the effects of test compaction on defect coverage.	VTS	1996	DBLP DOI BibTeX RDF	surrogate faults, fault diagnosis, test generation, integrated circuit testing, fault modeling, test sets, test compaction, defect coverage
46	Irith Pomeranz, Sudhakar M. Reddy	Static compaction for two-pattern test sets.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	two-pattern test sets, static compaction procedure, test set size reduction, redundant tests removal, redundant patterns removal, CMOS stuck open faults, reordering of tests, digital logic circuits, fault diagnosis, logic testing, delays, built-in self test, integrated circuit testing, ATPG, combinational circuits, combinational circuits, automatic testing, fault coverage, CMOS logic circuits, delay faults
46	Paolo Ienne	Horizontal Microcode Compaction for Programmable Systolic Accelerators.	ASAP	1995	DBLP DOI BibTeX RDF	Horizontal Microcode, Microcode Compaction, Programmable Systolic Arrays, Neural Networks
46	Toshio Nakatani, Kemal Ebcioglu	Making Compaction-Based Parallelization Affordable.	IEEE Trans. Parallel Distributed Syst.	1993	DBLP DOI BibTeX RDF	compaction-based parallelization, code explosion problem, software lookahead heuristic, VLIW parallelizing compiler, branch-intensive code, AIX utilities, fgrep, sed, parallel programming, parallel architectures, compress, program, sort, instruction-level parallelism, software pipelining, pipeline processing, instruction sets, loop parallelization, yacc
45	Irith Pomeranz, Sudhakar M. Reddy	Reducing test application time for full scan circuits by the addition of transfer sequences.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	transfer sequences, primary input vectors, scan-in operation, scan-out operation, static compaction procedure, compaction levels, fault diagnosis, logic testing, design for testability, fault detection, automatic testing, boundary scan testing, test set, test application time, full scan circuits
43	Qianying Tang, Jianwen Zhu	Two-Dimensional Layout Migration by Soft Constraint Satisfaction.	ISQED	2005	DBLP DOI BibTeX RDF
43	Faith E. Fich, Miroslaw Kowaluk, Krzysztof Lorys, Miroslaw Kutylowski, Prabhakar Ragde	Retrieval of scattered information by EREW, CREW and CRCW PRAMs.	SWAT	1992	DBLP DOI BibTeX RDF
43	David Marple	A Hierarchy Preserving Hierarchical Compactor.	DAC	1990	DBLP DOI BibTeX RDF
43	Jingsheng Cong, D. F. Wong 0001	How to Obtain More Compactable Channel Routing Solutions.	DAC	1988	DBLP BibTeX RDF
41	Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau	An efficient test-data compaction for low power VLSI testing.	EIT	2008	DBLP DOI BibTeX RDF
41	Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada	OPC-Friendly De-Compaction with Timing Constraints for Standard Cell Layouts.	ISQED	2007	DBLP DOI BibTeX RDF
41	Chunsheng Liu, Yu Huang 0005	Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance.	VTS	2007	DBLP DOI BibTeX RDF
41	Andre Tkacenko, P. P. Vaidyanathan	On the spectral factor ambiguity of FIR energy compaction filter Banks.	IEEE Trans. Signal Process.	2006	DBLP DOI BibTeX RDF
41	Irith Pomeranz, Sudhakar M. Reddy	Test compaction for transition faults under transparent-scan.	DATE	2006	DBLP DOI BibTeX RDF
41	Jing Wang 0006, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker	Static Compaction of Delay Tests Considering Power Supply Noise.	VTS	2005	DBLP DOI BibTeX RDF
41	Ozgur Sinanoglu, Alex Orailoglu	Compaction Schemes with Minimum Test Application Time.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
41	Youcef Bourai, C.-J. Richard Shi	Layout Compaction for Yield Optimization via Critical Area Minimization.	DATE	2000	DBLP DOI BibTeX RDF
41	Rei Oguro, Kazuhiko Ozeki, Kazuyuki Takagi, Yujie Zhang	An Efficient Algorithm for Japanese Sentence Compaction Based on Phrase Importance and Inter-Phrase Dependency.	TSD	2000	DBLP DOI BibTeX RDF