Search results for "tests"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
66	Sreejit Chakravarty	On the capability of delay tests to detect bridges and opens.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	defective IC, faulty dynamic logic behavior, transition tests, simulation, integrated circuit testing, delay tests, bridges, opens, at-speed testing, path delay tests
53	Jin Ryong Kim, Il-Kyu Park, Kwang-Hyun Shim	The Effects of Network Loads and Latency in Multiplayer Online Games.	ICEC	2007	DBLP DOI BibTeX RDF	MMOG tests, P2P-based tests, network game tests, multiplayer games, mean opinion score, Load tests
53	Asim Jalis	Probe Tests: A Strategy for Growing Automated Tests around Legacy Code.	XP/Agile Universe	2002	DBLP DOI BibTeX RDF	NUnit, xUnit, refactoring, Unit testing, functional testing, automated testing, logging, C#, .NET, legacy code, mock objects, embedded tests
52	Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu	On Common-Mode Skewed-Load and Broadside Tests.	VLSI Design	2008	DBLP DOI BibTeX RDF
52	Tao Xie 0001, David Notkin	Automatically Identifying Special and Common Unit Tests for Object-Oriented Programs.	ISSRE	2005	DBLP DOI BibTeX RDF
51	Sudhakar M. Reddy, Irith Pomeranz, Chen Liu	On tests to detect via opens in digital CMOS circuits.	DAC	2008	DBLP DOI BibTeX RDF	constrained stuck-at tests, test generation, DFT, open defects
50	Xiehua Li, ShuTang Yang, Jian-Hua Li, HongWen Zhu	Security Protocol Analysis with Improved Authentication Tests.	ISPEC	2006	DBLP DOI BibTeX RDF	Authentication tests, Message type, Neuman-Stubblebine protocol, Improved authentication tests
50	Ad J. van de Goor, Issam B. S. Tlili	March Tests for Word-Oriented Memories.	DATE	1998	DBLP DOI BibTeX RDF	Bit-oriented memories, word-oriented memories, fault models, memory tests, march tests, data backgrounds
50	Chun-Hung Chen, Jacob A. Abraham	Generation and evaluation of current and logic tests for switch-level sequential circuits.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	logic tests, test generation, Current tests, I DDQ
49	Hana Sevcikova, Alan Borning, David Socha, Wolf-Gideon Bleek	Automated testing of stochastic systems: a statistically grounded approach.	ISSTA	2006	DBLP DOI BibTeX RDF	software engineering, software testing, unit tests, hypothesis testing, stochastic algorithms
46	Mark G. Karpovsky	Universal Tests for Detection of Input/Output Stuck-At and Bridging Faults.	IEEE Trans. Computers	1983	DBLP DOI BibTeX RDF	upper and lower bounds for number of tests, Asymptotically optimal tests, stuck-at and bridging faults, universal tests, fault detection
45	Wanli Jiang, Eric Peterson	Performance Comparison of VLV, ULV, and ECR Tests.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	very low voltage test, dynamic current test, test threshold, test effectiveness, test efficiency
44	Axel Kalenborn, Thomas Will, Rouven Thimm, Jana Raab, Ronny Fregin	Java-basiertes automatisiertes Test-Framework.	Wirtschaftsinf.	2006	DBLP DOI BibTeX RDF	Types of Software Tests, Automated Test-Case Creation, Bytecode-Injection, Plugin-Based Framework, Source Code Interdependence, Third-Party-Components Tests, Automated Software Tests
44	Robert C. Martin, Grigori Melnik	Tests and Requirements, Requirements and Tests: A Möbius Strip.	IEEE Softw.	2008	DBLP DOI BibTeX RDF
43	Ad J. van de Goor, Issam B. S. Tlili	A Systematic Method for Modifying March Tests for Bit-Oriented Memories into Tests for Word-Oriented Memories.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Bit-oriented memories, word-oriented memories, fault models, march tests, data backgrounds
41	Ali Amer Alwan, Hamidah Ibrahim, Nur Izura Udzir	Ranking and selecting integrity tests in a distributed database.	iiWAS	2009	DBLP DOI BibTeX RDF	integrity constraints checking, distributed database, integrity constraints, integrity tests
41	Said Hamdioui, Ad J. van de Goor	Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	multi-port memories, single-port memories, address decoder faults, read-only ports, write-only ports, fault models, fault coverage, march tests
41	T. Haulin	Built-in parametric test for controlled impedance I/Os.	VTS	1997	DBLP DOI BibTeX RDF	controlled impedance I/Os, built-in parametric test, full DC parametrics, full speed AC tests, lower cost ATE, differential signal I/Os, single-ended signal I/Os, short circuit proof drivers, B9 test method, bidirectional I/O, differential receivers, differential transmitters, diagnostic tests, narrow pulse test, contact test, high speed test logic, built-in self test, functional test, boundary scan, static tests
41	Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal	Segment delay faults: a new fault model.	VTS	1996	DBLP DOI BibTeX RDF	segment delay faults, delay defect, distributed defect, rising transitions, falling transitions, transition tests, nonrobust tests, VLSI, fault diagnosis, logic testing, delays, integrated circuit testing, fault model, automatic testing, circuit analysis computing, robust tests, integrated circuit modelling, production testing, spot defect, manufacturing defects
40	Sergey V. Zelenov, Sophia A. Zelenova	Automated Generation of Positive and Negative Tests for Parsers.	FATES	2005	DBLP DOI BibTeX RDF	specification-based test generation, coverage criterion, compiler testing, positive tests, negative tests, BNF grammar, formal language, mutation testing, parser
38	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Fault Tests for Diagnosis of Transition Faults.	DFT	2006	DBLP DOI BibTeX RDF
38	Tao Xie 0001	Automatic identification of common and special object-oriented unit tests.	OOPSLA Companion	2004	DBLP DOI BibTeX RDF	dynamic inference, test selection
38	Tei-Wei Kuo, Li-Pin Chang, Yu-Hua Liu, Kwei-Jay Lin	Efficient Online Schedulability Tests for Real-Time Systems.	IEEE Trans. Software Eng.	2003	DBLP DOI BibTeX RDF	division graph, reduced set, multiframe process, open system environment, MPEG streams, time reservation, Real-time systems, schedulability test
38	Jan Peleska 0001, Michael Siegel	From Testing Theory to Test Driver Implementation.	FME	1996	DBLP DOI BibTeX RDF	may tests, must tests, refinement, test generation, CSP, reactive systems, FDR, test evaluation
38	Irith Pomeranz, Sudhakar M. Reddy	Static compaction for two-pattern test sets.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	two-pattern test sets, static compaction procedure, test set size reduction, redundant tests removal, redundant patterns removal, CMOS stuck open faults, reordering of tests, digital logic circuits, fault diagnosis, logic testing, delays, built-in self test, integrated circuit testing, ATPG, combinational circuits, combinational circuits, automatic testing, fault coverage, CMOS logic circuits, delay faults
38	Said Hamdioui, Ad J. van de Goor	Efficient Tests for Realistic Faults in Dual-Port SRAMs.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	Multiport/single-port memories, weak faults, fault models, fault coverage, march tests
38	Sandip Kundu, Sudhakar M. Reddy	Robust tests for parity trees.	J. Electron. Test.	1990	DBLP DOI BibTeX RDF	linear gates, parity trees, URTS, robust tests, test length
37	Mira Kajko-Mattsson, Marcus Jonson, Saam Koroorian, Fredrik Westin	Lesson Learned from Attempts to Implement Daily Build.	CSMR	2004	DBLP DOI BibTeX RDF	Daily build engineer, feature teams, smoke tests, regression tests, automated tests, concurrent engineering, incremental software development
36	Chih Wei Hu, Chung-Len Lee 0001, Wen Ching Wu, Jwu E. Chen	Fault diagnosis of odd-even sorting networks.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	odd-even sorting networks, location tests, sorting element faults, binary search procedures, fault diagnosis, fault diagnosis, Banyan networks, switching system, ISDN
36	Ad J. van de Goor, Georgi Gaydadjiev, V. G. Mikitjuk, Vyacheslav N. Yarmolik	March LR: a test for realistic linked faults.	VTS	1996	DBLP DOI BibTeX RDF	disturb faults, March LR, March LRD, March LRDD, fault diagnosis, integrated circuit testing, fault models, fault coverage, march tests, integrated memory circuits, semiconductor memories, linked faults
35	Stark C. Draper, Prakash Ishwar, David Molnar, Vinod M. Prabhakaran, Kannan Ramchandran, Daniel Schonberg, David A. Wagner 0001	An Analysis of Empirical PMF Based Tests for Least Significant Bit Image Steganography.	Information Hiding	2005	DBLP DOI BibTeX RDF
35	Hitoshi Furusawa	A Free Construction of Kleene Algebras with Tests.	MPC	2004	DBLP DOI BibTeX RDF
35	Sultan M. Al-Harbi, Sandeep K. Gupta 0001	An Efficient Methodology for Generating Optimal and Uniform March Tests.	VTS	2001	DBLP DOI BibTeX RDF
35	Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick	March Tests for Realistic Faults in Two-Port Memories.	MTDT	2000	DBLP DOI BibTeX RDF
35	Salvador García 0001, Alberto Fernández 0001, Julián Luengo, Francisco Herrera	A study of statistical techniques and performance measures for genetics-based machine learning: accuracy and interpretability.	Soft Comput.	2009	DBLP DOI BibTeX RDF	Non-parametric tests, Cohen’s kappa, Genetic algorithms, Classification, Interpretability, Statistical tests, Genetics-based machine learning
35	Irith Pomeranz, Sudhakar M. Reddy	Functional test generation for delay faults in combinational circuits.	ACM Trans. Design Autom. Electr. Syst.	1998	DBLP DOI BibTeX RDF	function-robust tests, functional delay fault model, delay faults, path delay faults, robust tests
34	Stéphane Ducasse, Damien Pollet, Alexandre Bergel, Damien Cassou	Reusing and Composing Tests with Traits.	TOOLS (47)	2009	DBLP DOI BibTeX RDF	Tests, Reuse, Unit-Testing, Multiple Inheritance, Traits
34	Colin Atkinson 0001	Component-Oriented Verification of Software Architectures through Built-in Tests.	ECSA	2008	DBLP DOI BibTeX RDF	Verification, built-in tests, system services
34	Marcos Kalinowski, Hugo Vidal Teixeira, Paul Johan Heinrich van Oppen	ABAT: An Approach for Building Maintainable Automated Functional Software Tests.	SCCC	2007	DBLP DOI BibTeX RDF	Automated Functional Testing, Maintenance of Automated Tests, Component Based Software Development
34	Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers	Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	static faults, fault models, fault coverage, memory tests, dynamic faults, fault primitives
34	Nur A. Touba, Edward J. McCluskey	Applying two-pattern tests using scan-mapping.	VTS	1996	DBLP DOI BibTeX RDF	scan-mapping, combinational mapping logic, logic testing, built-in self test, built-in self-testing, fault coverage, delay faults, pseudo-random testing, deterministic testing, two-pattern tests
34	Cristóbal Romero 0001, Sebastián Ventura, César Hervás-Martínez, Paul De Bra	An Authoring Tool for Building Both Mobile Adaptable Tests and Web-Based Adaptive or Classic Tests.	AH	2006	DBLP DOI BibTeX RDF
34	Irith Pomeranz	On Transition Fault Diagnosis Using Multicycle At-Speed Broadside Tests.	ETS	2011	DBLP DOI BibTeX RDF	Broadside tests, multicycle tests, fault diagnosis, transition faults
34	Manuel Blum 0001, Oded Goldreich 0001	Towards a Computational Theory of Statistical Tests (Extended Abstract)	FOCS	1992	DBLP DOI BibTeX RDF	counter machines, universal statistical tests, algorithm, complexity, statistical tests, computational theory
34	Henryk Krawczyk, Wojciech E. Kozlowski	On the Diagnosability of Multicomputer Systems with Homogeneous and Incomplete Tests.	IEEE Trans. Computers	1988	DBLP DOI BibTeX RDF	homogeneous tests, system level fault diagnosis models, incomplete tests, generalized PMC model, visible faults, t/sub v/-diagnosable systems, O(mod T mod) diagnosis algorithm, computational complexity, multiprocessing systems, automatic testing, fault location, diagnosability, sufficient condition, multicomputer systems, computer testing, necessary conditions, connection assignment, fault identification
32	Pierre L'Ecuyer, Richard J. Simard	TestU01: A C library for empirical testing of random number generators.	ACM Trans. Math. Softw.	2007	DBLP DOI BibTeX RDF	Statistical software, random number generators, statistical test, random number tests
32	Claude Nadeau, Yoshua Bengio	Inference for the Generalization Error.	Mach. Learn.	2003	DBLP DOI BibTeX RDF	power, hypothesis tests, cross-validation, size, generalization error, variance estimation
32	Doron Blatt, Alfred O. Hero III	On Tests for Global Maximum of the Log-Likelihood Function.	IEEE Trans. Inf. Theory	2007	DBLP DOI BibTeX RDF
32	Dominik Jungo, David Buchmann, Ulrich Ultes-Nitsche	Assessment of Code Quality through Classification of Unit Tests in VeriNeC.	AINA Workshops (1)	2007	DBLP DOI BibTeX RDF
32	Nikolai Tillmann, Wolfram Schulte	Parameterized unit tests.	ESEC/SIGSOFT FSE	2005	DBLP DOI BibTeX RDF	automatic test input generation, unit testing, symbolic execution, constraint solving, algebraic data types
32	Irith Pomeranz, Sudhakar M. Reddy	Static Test Compaction for Full-Scan Circuits Based on Combinational Test Sets and Nonscan Input Sequences and a Lower Bound on the Number of Tests.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF	Scan circuits, test application time, static test compaction
32	Wanli Jiang, Eric Peterson	Performance Comparison of VLV, ULV, and ECR Tests.	VTS	2002	DBLP DOI BibTeX RDF
32	Richard M. Chou, Kewal K. Saluja, Vishwani D. Agrawal	Scheduling tests for VLSI systems under power constraints.	IEEE Trans. Very Large Scale Integr. Syst.	1997	DBLP DOI BibTeX RDF
31	Sounil Biswas, Ronald D. Blanton	Statistical Test Compaction Using Binary Decision Trees.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	statistical test compaction, redundant tests, kept tests, go/no-go testing, heterogeneous devices, binary decision trees
31	Carla Fredrick	Extreme Programming: Growing a Team Horizontally.	XP/Agile Universe	2003	DBLP DOI BibTeX RDF	hard fast rules, horizontal, Junit tests, shunted tests, persistence requirements, customer team, requirements, refactoring, extreme programming, XP, developers, vertical, stories, velocity, lurk
31	Merlin Hughes, Christopher DiMattia, Ming C. Lin, Dinesh Manocha	Efficient And Accurate Interference Detection For Polynomial Deformation.	CA	1996	DBLP DOI BibTeX RDF	polynomial deformation, soft object animation, Bezier patches, axis aligned bounding boxes, surface intersection tests, loop intersection tests, animation, computational geometry, linear programming, linear programming, geometric models, computer animation, deformable models, solid modelling, solid models, B-splines, convex hulls, subdivision, parametric surfaces, dynamic simulation, splines (mathematics), polygonal meshes, variational models, interference detection, frame-to-frame coherence
31	Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita	Transistor leakage fault location with ZDDQ measurement.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	field effect transistor circuits, transistor leakage fault location, I/sub DDQ/ measurement, equivalence fault collapsing, diagnosed faults, gate-array circuit, fault diagnosis, logic testing, random tests, fault location, CMOS logic circuits, leakage currents, logic arrays, CMOS circuit, deterministic tests, electric current measurement, diagnostic resolution
31	Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal	An efficient automatic test generation system for path delay faults in combinational circuits.	VLSI Design	1995	DBLP DOI BibTeX RDF	automatic test generation system, test pattern generation system, nonrobust tests, nine-value logic system, multiple backtrace procedure, path selection method, logic testing, delays, integrated circuit testing, fault detection, ATPG, combinational circuits, combinational circuits, automatic testing, fault location, multivalued logic, logic circuits, integrated logic circuits, path delay faults, robust tests
31	Brian J. Ross, Janine H. Imada	Evolving stochastic processes using feature tests and genetic programming.	GECCO	2009	DBLP DOI BibTeX RDF	feature tests, genetic programming, time series, process algebra, stochastic process
31	Alex Samorodnitsky	Low-degree tests at large distances.	STOC	2007	DBLP DOI BibTeX RDF	low-degree tests
31	Ina Schieferdecker, George Din, Dimitrios Apostolidis	Distributed functional and load tests for Web services.	Int. J. Softw. Tools Technol. Transf.	2005	DBLP DOI BibTeX RDF	Web services, TTCN-3, Distributed tests, Test frameworks, Test specification
31	Petr Sojka	Rapid evaluation using multiple choice tests and TeX.	ITiCSE	2003	DBLP DOI BibTeX RDF	multiple-choice tests, evaluation, information system, TeX
31	Ad J. van de Goor, Ivo Schanstra	Address and Data Scrambling: Causes and Impact on Memory Tests.	DELTA	2002	DBLP DOI BibTeX RDF	Address-scrambling, data-scrambling, fault models, memory tests, data backgrounds
31	Ankan K. Pramanick, Sudhakar M. Reddy	Efficient multiple path propagating tests for delay faults.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	delay testing, path delay faults, robust tests, test efficiency
31	Hiroshi Takahashi, Takashi Watanabe, Yuzo Takamatsu	Generation of tenacious tests for small gate delay faults in combinational circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	tenacious tests, small gate delay faults, single gate delay fault, ISCAS'85 benchmark circuits, fault diagnosis, logic testing, delays, test generation, combinational circuits, combinational circuits, fault coverage
30	Richard Carlsson, Mickaël Rémond	EUnit: a lightweight unit testing framework for Erlang.	Erlang Workshop	2006	DBLP DOI BibTeX RDF	frameworks, unit testing, Erlang, agile methods
30	David Saff, Michael D. Ernst	Mock object creation for test factoring.	PASTE	2004	DBLP DOI BibTeX RDF	test factoring, unit testing, mock objects
30	Niall McCarroll 0002, Jon M. Kerridge	A Strategy for Semantic Integrity Enforcement in a Parallel Database Machine.	BNCOD	1994	DBLP DOI BibTeX RDF
29	Mark Sanderson, Justin Zobel	Information retrieval system evaluation: effort, sensitivity, and reliability.	SIGIR	2005	DBLP DOI BibTeX RDF	mean average precision, precision at 10, significance tests
29	Ahmed A. El Farag, Hatem M. El-Boghdadi, Samir I. Shaheen	On the acceptance tests of aperiodic real-time tasks for FPGAs.	IPDPS	2009	DBLP DOI BibTeX RDF
29	Irith Pomeranz, Sudhakar M. Reddy	Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point Insertion.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
29	Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy	On Complete Functional Broadside Tests for Transition Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
29	Mark D. Smucker, James Allan, Ben Carterette	A comparison of statistical significance tests for information retrieval evaluation.	CIKM	2007	DBLP DOI BibTeX RDF	student's t-test, wilcoxon, randomization, permutation, bootstrap, hypothesis test, statistical significance, sign
29	Zhuo Zhang 0008, Sudhakar M. Reddy, Irith Pomeranz	Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes.	ASP-DAC	2007	DBLP DOI BibTeX RDF
29	Tao Xie 0001, Jianjun Zhao 0001, Darko Marinov, David Notkin	Detecting Redundant Unit Tests for AspectJ Programs.	ISSRE	2006	DBLP DOI BibTeX RDF
29	Hasmik Gharibyan	Assessing students' knowledge: oral exams vs. written tests.	ITiCSE	2005	DBLP DOI BibTeX RDF	oral exam, written exam, student assessment
29	Tao Xie 0001, Darko Marinov, David Notkin	Rostra: A Framework for Detecting Redundant Object-Oriented Unit Tests.	ASE	2004	DBLP DOI BibTeX RDF
28	Irith Pomeranz, Sudhakar M. Reddy	State persistence: a property for guiding test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	broadside tests, test generation, transition faults, scan-based tests
28	Alexey V. Khoroshilov, Vladimir V. Rubanov, Eugene A. Shatokhin	Automated Formal Testing of C API Using T2C Framework.	ISoLA	2008	DBLP DOI BibTeX RDF	compliance testing, parameterized tests, medium-quality tests, Formal testing
28	Dexter Kozen	Nonlocal Flow of Control and Kleene Algebra with Tests.	LICS	2008	DBLP DOI BibTeX RDF	control flow, Kleene algebra, program restructuring, Kleene algebra with tests
28	Florian Haftmann, Donald Kossmann, Eric Lo 0001	A framework for efficient regression tests on database applications.	VLDB J.	2007	DBLP DOI BibTeX RDF	Regression tests, Database applications
28	Krzysztof A. Cyran	Rough Sets in the Interpretation of Statistical Tests Outcomes for Genes Under Hypothetical Balancing Selection.	RSEISP	2007	DBLP DOI BibTeX RDF	BLM, RECQL, WRN, neutrality tests, rough sets, ATM, natural selection
28	Uwe Brinkschulte	Scalable Online Feasibility Tests for Admission Control in a Java Real-Time System.	Real Time Syst.	2006	DBLP DOI BibTeX RDF	guaranteed percentage scheduling, processor demand analysis, real-time scheduling, feasibility tests
28	Pedro Salcedo Lagos, M. Angélica Pinninghoff, A. Ricardo Contreras	Computerized Adaptive Tests and Item Response Theory on a Distance Education Platform.	IWINAC (2)	2005	DBLP DOI BibTeX RDF	Distance Education Platform, Computerized Adaptive Tests, Adaptive Systems, Item Response Theory
28	Ad J. van de Goor, Said Hamdioui, Rob Wadsworth	Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests.	ITC	2004	DBLP DOI BibTeX RDF	address directions, peripheral circuit faults, fault coverage, March tests, data-backgrounds
28	Christopher J. Whitaker, Ludmila I. Kuncheva, Peter D. Cockcroft	A Logodds Criterion for Selection of Diagnostic Tests.	SSPR/SPR	2004	DBLP DOI BibTeX RDF	combining diagnostic tests, independent binary features, logodds criterion, veterinary medicine, diagnosis ofscrapie in sheep, feature selection
28	Vinay Dabholkar, Sreejit Chakravarty	Computing stress tests for interconnect defects.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	interconnect defects, reliability screens, infant mortality, gate-oxide defects, integrated circuit testing, stress tests
28	Angela Krstic, Kwang-Ting Cheng	Generation of high quality tests for functional sensitizable paths.	VTS	1995	DBLP DOI BibTeX RDF	high quality tests, functional sensitizable paths, long paths, untestable paths, faulty conditions, test derivation, logic testing, delays, timing, integrated circuit testing, combinational circuits, combinational circuits, automatic testing, delay testing, test vectors, timing information
28	Bruce F. Cockburn	Deterministic tests for detecting singleV-coupling faults in RAMs.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	V-coupling faults, lower bounds, Functional tests, pattern-sensitive faults, RAM testing
28	Bruce F. Cockburn, Janusz A. Brzozowski	Near-optimal tests for classes of write-triggered coupling faults in RAMs.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	toggling faults, lower bounds, coupling faults, RAM testing, optimal tests
27	Juan Carlos Figueroa García, Dusko Kalenatic, Cesar Amilcar Lopez Bello	On the Robustness of Type-1 and Type-2 Fuzzy Tests vs. ANOVA Tests on Means.	ICIC (2)	2009	DBLP DOI BibTeX RDF
26	Moez Krichen, Stavros Tripakis	Conformance testing for real-time systems.	Formal Methods Syst. Des.	2009	DBLP DOI BibTeX RDF	On-the-fly algorithms, Real-time systems, Test generation, Coverage, Timed automata, Conformance testing, Specification and verification, Partial observability
26	Xiaoqing Cheng	Performance, Benchmarking and Sizing in Developing Highly Scalable Enterprise Software.	SIPEW	2008	DBLP DOI BibTeX RDF
26	Fan Yang 0060, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz	On the Detectability of Scan Chain Internal Faults - An Industrial Case Study.	VTS	2008	DBLP DOI BibTeX RDF	Faults in scan cells, stuck-at and stuck-on faults
26	Benny Pasternak, Shmuel S. Tyszberowicz, Amiram Yehudai	GenUTest: A Unit Test and Mock Aspect Generation Tool.	Haifa Verification Conference	2007	DBLP DOI BibTeX RDF
26	Tao Xie 0001, David Notkin	Mutually Enhancing Test Generation and Specification Inference.	FATES	2003	DBLP DOI BibTeX RDF
26	Rick Mugridge, Ewan D. Tempero	Retrofitting an Acceptance Test Framework for Clarit.	Agile Development Conference	2003	DBLP DOI BibTeX RDF
26	Said Hamdioui, Ad J. van de Goor	Consequences of Port Restriction on Testing Address Decoders in Two-Port Memories.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
26	Wolfgang Kössler	Max-type rank tests, U-tests, and adaptive tests for the two-sample location problem - An asymptotic power study.	Comput. Stat. Data Anal.	2010	DBLP DOI BibTeX RDF
26	Eugene Goldberg, Panagiotis Manolios	Generating High-Quality Tests for Boolean Circuits by Treating Tests as Proof Encoding.	TAP@TOOLS	2010	DBLP DOI BibTeX RDF