|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 10002 occurrences of 3019 keywords
|
|
|
Results
Found 11893 publication records. Showing 11893 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
18 | Miron Abramovici, Prem R. Menon, David T. Miller |
Checkpoint Faults are not Sufficient Target Faults for Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 35(8), pp. 769-771, 1986. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP DOI BibTeX RDF |
|
18 | Bev Littlewood |
Stochastic reliability growth: A model with applications to computer software faults and hardware design faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Measurement and evaluation of software quality ![In: Proceedings of the 1981 ACM workshop/symposium on Measurement and evaluation of software quality, USA, 1981, pp. 139-152, 1981, ACM, 978-0-89791-038-5. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz, Sudhakar M. Reddy |
State persistence: a property for guiding test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 523-528, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
broadside tests, test generation, transition faults, scan-based tests |
17 | Elaine J. Weyuker, Thomas J. Ostrand, Robert M. Bell |
Do too many cooks spoil the broth? Using the number of developers to enhance defect prediction models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 13(5), pp. 539-559, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Negative binomial model, Developer counts, Empirical study, Software faults |
17 | Irene Finocchi, Giuseppe F. Italiano |
Sorting and Searching in Faulty Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Algorithmica ![In: Algorithmica 52(3), pp. 309-332, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Memory faults, Computing with unreliable information, Searching, Sorting, Memory models, Combinatorial algorithms |
17 | Daniele Rossi 0001, Martin Omaña 0001, Cecilia Metra |
Checkers' No-Harm Alarms and Design Approaches to Tolerate Them. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(1-3), pp. 93-103, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Error detecting codes, Transient faults, Self-checking circuits, Checker |
17 | Christian Gout, Carole Le Guyader, Lucia Romani, A.-G. Saint-Guirons |
Approximation of surfaces with fault(s) and/or rapidly varying data, using a segmentation process, D m -splines and the finite element method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Numer. Algorithms ![In: Numer. Algorithms 48(1-3), pp. 67-92, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Surfaces with faults, Image segmentation, Finite element methods, Splines |
17 | Sriraman Tallam, Chen Tian 0002, Rajiv Gupta 0001, Xiangyu Zhang 0001 |
Avoiding Program Failures Through Safe Execution Perturbations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: Proceedings of the 32nd Annual IEEE International Computer Software and Applications Conference, COMPSAC 2008, 28 July - 1 August 2008, Turku, Finland, pp. 152-159, 2008, IEEE Computer Society, 978-0-7695-3262-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
avoiding failures, environmental faults, logging/replay tools, bad user requests, heap overflow, atomicity violation |
17 | Mohammad Gh. Mohammad, Laila Terkawi |
Techniques for Disturb Fault Collapsing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(4), pp. 363-368, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
algorithm, test, flash memory, faults, disturb |
17 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(5), pp. 435-444, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Resistive-open defects, Pre-charge circuits, Memory testing, Dynamic faults |
17 | Fatih Kocan, Daniel G. Saab |
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(5), pp. 405-420, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Dynamic fault diagnosis, FPGA, Emulation, Stuck-at faults, Circuits, Gate-level |
17 | Thomas J. Ostrand, Elaine J. Weyuker, Robert M. Bell |
Automating algorithms for the identification of fault-prone files. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2007, London, UK, July 9-12, 2007, pp. 219-227, 2007, ACM, 978-1-59593-734-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
software testing, prediction, empirical study, software faults, regression model, fault-prone |
17 | Zemo Yang, Samiha Mourad |
Crosstalk Induced Fault Analysis and Test in DRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(2), pp. 173-187, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
crosstalk, DRAMs, pattern sensitive faults |
17 | Benjy J. Thomasson, Mark Ratcliffe 0001, Lynda Thomas |
Identifying novice difficulties in object oriented design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITiCSE ![In: Proceedings of the 11th Annual SIGCSE Conference on Innovation and Technology in Computer Science Education, ITiCSE 2006, Bologna, Italy, June 26-28, 2006, pp. 28-32, 2006, ACM, 1-59593-055-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
design faults, design, software design, introductory programming |
17 | Hakan Özdemir, Güngör Baser |
Computer Simulation of Woven Fabric Defects Based on Faulty Yarn Photographs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCIS ![In: Computer and Information Sciences - ISCIS 2006, 21th International Symposium, Istanbul, Turkey, November 1-3, 2006, Proceedings, pp. 325-333, 2006, Springer, 3-540-47242-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Fabric simulation, fabric appearance, woven fabric faults, elastica curve, yarn flattening |
17 | Robert M. Bell, Thomas J. Ostrand, Elaine J. Weyuker |
Looking for bugs in all the right places. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2006, Portland, Maine, USA, July 17-20, 2006, pp. 61-72, 2006, ACM, 1-59593-263-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
software testing, prediction, empirical study, software faults, regression model, fault-prone |
17 | Alain Girault, Hamoudi Kalla, Yves Sorel |
Transient Processor/Bus Fault Tolerance for Embedded Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DIPES ![In: From Model-Driven Design to Resource Management for Distributed Embedded Systems, IFIP TC 10 Working Conference on Distributed and Parallel Embedded Systems (DIPES 2006), October 11-13, 2006, Braga, Portugal, pp. 135-144, 2006, Springer, 978-0-387-39361-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
hybrid redundancy, safety-critical systems, transient faults, real-time embedded systems, scheduling heuristics, heterogeneous architectures, data fragmentation |
17 | James A. Muir |
Seifert's RSA Fault Attack: Simplified Analysis and Generalizations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICS ![In: Information and Communications Security, 8th International Conference, ICICS 2006, Raleigh, NC, USA, December 4-7, 2006, Proceedings, pp. 420-434, 2006, Springer, 3-540-49496-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
signature verification, fault analysis, RSA signatures, hardware faults |
17 | Ian Broster, Alan Burns 0001, Guillermo Rodríguez-Navas |
Timing Analysis of Real-Time Communication Under Electromagnetic Interference. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Real Time Syst. ![In: Real Time Syst. 30(1-2), pp. 55-81, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
TTCAN, probabilistic timing analysis, electromagnetic interference, bus guardian, babbling idiot, dependability, faults, Controller Area Network, CAN |
17 | Richard W. Selby |
Enabling Reuse-Based Software Development of Large-Scale Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 31(6), pp. 495-510, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
empirical study, software metrics, Software reuse, experimentation, software measurement, large-scale systems, mining software repositories, software faults, software changes |
17 | Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi |
Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 52(10), pp. 1259-1270, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
interconnect, multiple faults, adaptive diagnosis, Wiring network |
17 | Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel |
Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 52(12), pp. 1646-1651, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Space compaction, testing, stuck-at faults, system-on-a-chip |
17 | Amy Streich, Alex Kondratyev, Lief Sorensen |
Testing of Asynchronous Designs by "Inappropriate" Means: Synchronous Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASYNC ![In: 8th International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2002), 9-11 April 2002, Manchester, UK, pp. 171-180, 2002, IEEE Computer Society, 0-7695-1540-1. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
ATPG, asynchronous circuits, stuck-at faults, partial scan |
17 | Ilia Polian, Piet Engelke, Bernd Becker 0001 |
Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISMVL ![In: 32nd IEEE International Symposium on Multiple-Valued Logic (ISMVL 2002), May 15-18, 2002, Boston, Massachusetts, USA, pp. 216-223, 2002, IEEE Computer Society, 0-7695-1462-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Voting models, Fault simulation, Bridging faults |
17 | Erica Y. Yang, Jie Xu 0007, Keith H. Bennett |
A Fault-Tolerant Approach to Secure Information Retrieval. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SRDS ![In: 21st Symposium on Reliable Distributed Systems (SRDS 2002), 13-16 October 2002, Osaka, Japan, pp. 12-21, 2002, IEEE Computer Society, 0-7695-1659-9. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
malicious faults, security, fault tolerance, secret sharing, private information retrieval, Distributed database systems |
17 | Kim Potter Kihlstrom, Louise E. Moser, P. M. Melliar-Smith |
The SecureRing group communication system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Inf. Syst. Secur. ![In: ACM Trans. Inf. Syst. Secur. 4(4), pp. 371-406, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
group communication, survivability, intrusion, Byzantine faults, partial synchrony, state machine replication |
17 | Mandeep Singh, Israel Koren |
Reliability Enhancement of Analog-to-Digital Converters (ADCs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 347-, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters |
17 | Irith Pomeranz, Sudhakar M. Reddy |
On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(2), pp. 175-181, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
irredundant faults, built-in test generation, test generation, synchronous sequential circuits, Initial states |
17 | Claude Thibeault |
Diagnosis Method Using DeltaIDDQ Probabilistic Signatures: Theory and Results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 16(4), pp. 339-353, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
probabilistic signatures, diagnosis, bridging faults, Delta IDDQ |
17 | Marly Roncken, Ken S. Stevens, Rajesh Pendurkar, Shai Rotem, Parimal Pal Chaudhuri |
CA-BIST for Asynchronous Circuits: A Case Study on the RAPPID Asynchronous Instruction Length Decoder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASYNC ![In: 6th International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2000), 2-6 April 2000, Eilat, Israel, pp. 62-72, 2000, IEEE Computer Society, 0-7695-0586-4. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
pulse logic, switch-level fault simulation, Cellular Automata, BIST, asynchronous circuits, testability, stuck-at faults, domino logic, self-timed circuits, dynamic circuits |
17 | Michael J. Liebelt, Cheng-Chew Lim |
A method for determining whether asynchronous circuits are self-checking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 472-477, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
low-power electronics, TSC, low noise properties, semi-modular asynchronous circuit, output stuck-at-faults, low power, fault diagnosis, logic testing, integrated circuit testing, design for testability, asynchronous circuits, testability, totally self-checking, integrated circuit noise |
17 | Yin-Chao Huang, Chung-Len Lee 0001, Jun-Weir Lin, Jwu E. Chen, Chauchin Su |
A methodology for fault model development for hierarchical linear systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 90-95, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
closed loop systems, hierarchical linear systems, transfer function model, open-loop, element faults, benchmark state-variable filter, AC fault model, state variable filter, fault diagnosis, fault model, fault simulation, modules, Monte Carlo methods, Monte Carlo simulation, transfer functions, computation time, operational amplifiers, operational amplifiers, closed loop, analogue circuits |
17 | Wei-Je Huang, Edward J. McCluskey |
Transient errors and rollback recovery in LZ compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 2000 Pacific Rim International Symposium on Dependable Computing (PRDC 2000), 18-20 December 2000, Los Angeles, CA, USA, pp. 128-138, 2000, IEEE Computer Society, 0-7695-0975-4. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
LZ compression, Lempel-Ziv compression, compressed codewords, rollback error recovery schemes, data integrity, data integrity, fault tolerant computing, data compression, error detection, system recovery, transient faults, rollback recovery, compression ratio, lossless data compression, transient errors, data reconstruction, hardware redundancy |
17 | Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi |
Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTCS ![In: Digest of Papers: FTCS-29, The Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing, Madison, Wisconsin, USA, June 15-18, 1999, pp. 130-137, 1999, IEEE Computer Society, 0-7695-0213-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Interconnect, Multiple Faults, Adaptive Diagnosis, Wiring Network |
17 | Chanyutt Arjhan, Raghvendra G. Deshmukh |
A Novel Fault-Detection Technique for The Parallel Multipliers and Dividers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 127-132, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
parallel divider, parallel-array divider, pf-model, summand-generator, summand-counter, multiple faults functional testing, design for testability, boundary scan, array multiplier, Parallel multiplier |
17 | Daniel Gil, Juan Carlos Baraza, J. V. Busquets, Pedro J. Gil |
Fault Injection into VHDL Models: Analysis of the Error Syndrome of a Microcomputer System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 24th EUROMICRO '98 Conference, Engineering Systems and Software for the Next Decade, 25-27 August 1998, Vesteras, Sweden, pp. 10418-10425, 1998, IEEE Computer Society, 0-8186-8646-4. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
VHDL simulation, Error syndrome, Propagation latency, Fault injection, Transient faults, Experimental validation |
17 | Shalini Yajnik, Niraj K. Jha |
Graceful Degradation in Algorithm-Based Fault Tolerant Multiprocessor Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 8(2), pp. 137-153, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
concurrent fault location, fault diagnosis, concurrent error detection, transient faults, graceful degradation, Algorithm-based fault tolerance |
17 | Michael Kishinevsky, Alex Kondratyev, Luciano Lavagno, Alexander Saldanha, Alexander Taubin |
Partial scan delay fault testing of asynchronous circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1997, San Jose, CA, USA, November 9-13, 1997, pp. 728-735, 1997, IEEE Computer Society / ACM, 0-8186-8200-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
robust path delay fault testing, asynchronous circuits, delay faults, sequential testing |
17 | Fausto Distante, Mariagiovanna Sami, Renato Stefanelli |
Array partitioning to achieve defect tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 23rd EUROMICRO Conference '97, New Frontiers of Information Technology, 1-4 September 1997, Budapest, Hungary, pp. 487-491, 1997, IEEE Computer Society, 0-8186-8129-2. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
array partitioning, processing arrays, run time faults, reconfiguration techniques, architectural regularity, interconnection channel width, reconfiguration efficiency, partitioning approach, critical fault patterns, fault tolerance, redundancy, reconfigurable architectures, survival, defect tolerance, path length |
17 | Yiming Gong, Sreejit Chakravarty |
Using fault sampling to compute IDDQ diagnostic test set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 74-79, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
fault sampling, IDDQ diagnostic test set generation, combinational circuits, combinational circuit, bridging faults |
17 | Yinan N. Shen, Xiao-Tao Chen, Susumu Horiguchi, Fabrizio Lombardi |
On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPP ![In: 1997 International Conference on Parallel Processing (ICPP '97), August 11-15, 1997, Bloomington, IL, USA, Proceedings, pp. 350-359, 1997, IEEE Computer Society, 0-8186-8108-X. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
CMOS fault model, multiple fault diagnosis, interconnection networks, fault diagnosis, lower bound, multistage interconnection networks, multistage interconnection networks, CMOS technology, stuck-open faults |
17 | Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta 0001 |
Fault macromodeling and a testing strategy for opamps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 9(3), pp. 225-235, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
catastrophic fault model, operational amplifier design for testability, analog test, macromodeling, parametric faults |
17 | Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny |
Optimization-based multifrequency test generation for analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 9(1-2), pp. 59-73, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
multifrequency test generation, tolerance effects, fault observability maximization, parametric faults |
17 | Robert D. Blumofe, Matteo Frigo, Christopher F. Joerg, Charles E. Leiserson, Keith H. Randall |
Dag-Consistent Distributed Shared Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPPS ![In: Proceedings of IPPS '96, The 10th International Parallel Processing Symposium, April 15-19, 1996, Honolulu, Hawaii, USA, pp. 132-141, 1996, IEEE Computer Society, 0-8186-7255-2. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
dag consistency, cactus stack, multithreading, distributed shared memory, dynamic scheduling, memory model, page faults |
17 | Katsuya Tanaka, Makoto Takizawa 0001 |
Distributed checkpointing based on influential messages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPADS ![In: 1996 International Conference on Parallel and Distributed Systems (ICPADS '96), June 3-6, 1996, Tokyo, Japan, Proceedings, pp. 440-447, 1996, IEEE Computer Society, 0-8186-7267-6. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
influential messages, massage passing, object faults, protocols, protocols, distributed processing, message passing, remote procedure calls, remote procedure call, consistent global state, distributed checkpointing |
17 | Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara |
On the effects of test compaction on defect coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 430-437, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
surrogate faults, fault diagnosis, test generation, integrated circuit testing, fault modeling, test sets, test compaction, defect coverage |
17 | Kent L. Einspahr, Sharad C. Seth |
A switch-level test generation system for synchronous and asynchronous circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 6(1), pp. 59-73, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
reverse time processing, stuck-open and stuck-at faults, time-frame expansion, sequential circuits, Automatic test generation |
17 | Beyin Chen, Chung-Len Lee 0001 |
Universal test set generation for CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 6(3), pp. 313-323, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
functional testing, automatic test generation, CMOS circuits, stuck-open faults, universal test set |
17 | Michel Renovell, P. Huc, Yves Bertrand |
The concept of resistance interval: a new parametric model for realistic resistive bridging fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 184-189, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electric resistance, resistance interval, intrinsic resistance, logic behavior, 0 to 500 ohm, VLSI, VLSI, fault diagnosis, logic testing, integrated circuit testing, fault detection, automatic testing, fault coverage, bridging faults, parametric model, logic gates, logic gates, resistive bridging fault, faulty behavior |
17 | Anand Raghunathan, Pranav Ashar, Sharad Malik |
Test generation for cyclic combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 104-109, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
cyclic combinational circuits, bus structures, single-stuck-at fault test pattern, test generation problem, program RAM, fault diagnosis, logic testing, integrated circuit testing, network topology, combinational circuits, automatic testing, fault coverage, test pattern generators, formal analysis, data paths, testing algorithm, combinational logic circuits, untestable faults |
17 | Yung-Yuan Chen, Ching-Hwa Cheng, Jwu-E Chen |
An efficient switching network fault diagnosis for reconfigurable VLSI/WSI array processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 349-354, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
switching network fault diagnosis, reconfigurable VLSI/WSI array processors, switching network defects, killing error, testing circuit overhead, diagnosis time, mesh array, VLSI, parallel architectures, fault diagnosis, reconfigurable architectures, multiple faults, switching networks, wafer-scale integration, testing quality |
17 | Koji Tsuda, Shuji Senda, Michihiko Minoh, Katsuo Ikeda |
Clustering OCR-ed texts for browsing document image database. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDAR ![In: Third International Conference on Document Analysis and Recognition, ICDAR 1995, August 14 - 15, 1995, Montreal, Canada. Volume I, pp. 171-174, 1995, IEEE Computer Society, 0-8186-7128-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
OCR text clustering, document image database browsing, cluster extraction method, ordinal clustering methods, Complete Link, term loss, recognition faults, feature extraction, human factors, optical character recognition, interactive systems, document image processing, user interaction, document clustering, visual databases, word processing |
17 | Charles E. Stroud, Ahmed E. Barbour |
Testability and test generation for majority voting fault-tolerant circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 4(3), pp. 201-214, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
majority voting circuits, fault-tolerance, Design for testability, test pattern generation, multiple stuck-at faults |
17 | Jean-Claude Laprie, Karama Kanoun |
X-Ware Reliability and Availability Modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 18(2), pp. 130-147, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
classical reliability theory, software viewpoints, X-Ware, performance evaluation, fault tolerant computing, software reliability, faults, software models, reliability theory, availability modeling |
17 | Tsong Yueh Chen, Man Fai Lau, Kwan Yong Sim, Chang-Ai Sun |
On detecting faults for Boolean expressions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 17(3), pp. 245-261, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
MUMCUT strategy, Software testing, Fault detection, Specification based testing, Black-box testing, Fault based testing, Boolean specification |
17 | Yomara Pires, Jefferson Morais, Claudomir Cardoso, Aldebaro Klautau |
Data Mining Applied to the Electric Power Industry: Classification of Short-Circuit Faults in Transmission Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Innovative Applications in Data Mining ![In: Innovative Applications in Data Mining, pp. 107-122, 2009, Springer, 978-3-540-88044-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
17 | Piotr Jantos, Damian Grzechca, Jerzy Rutkowski |
Global parametric faults identification with the use of Differential Evolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic, pp. 222-225, 2009, IEEE Computer Society, 978-1-4244-3341-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
17 | Natasa Miskov-Zivanov, Diana Marculescu |
A systematic approach to modeling and analysis of transient faults in logic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 408-413, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
17 | Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu |
Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, pp. 91-96, 2009, IEEE Computer Society, 978-0-7695-3506-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
17 | Ying-Yen Chen, Jing-Jia Liou |
Diagnosis Framework for Locating Failed Segments of Path Delay Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 16(6), pp. 755-765, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Hsing-Chung Liang, Pao-Hsin Huang, Yan-Fei Tang |
Testing Transition Delay Faults in Modified Booth Multipliers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(9), pp. 1693-1697, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Munkang Choi, Linda S. Milor |
Diagnosis of Optical Lithography Faults With Product Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(9), pp. 1657-1669, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Hongyu Zhang 0002 |
On the Distribution of Software Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 34(2), pp. 301-302, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Measurement applied to SQA and V&V, Product metrics |
17 | Bogdan F. Romanescu, Daniel J. Sorin |
Core cannibalization architecture: improving lifetime chip performance for multicore processors in the presence of hard faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PACT ![In: 17th International Conference on Parallel Architectures and Compilation Techniques, PACT 2008, Toronto, Ontario, Canada, October 25-29, 2008, pp. 43-51, 2008, ACM, 978-1-60558-282-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
lifetime performance, fault tolerance, reliability, multicore |
17 | José Fonseca 0002, Marco Vieira |
Mapping software faults with web security vulnerabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings, pp. 257-266, 2008, IEEE Computer Society, 978-1-4244-2397-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu |
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 616-621, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz, Sudhakar M. Reddy |
A Bridging Fault Model Where Undetectable Faults Imply Logic Redundancy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 1166-1171, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Borzoo Bonakdarpour, Sandeep S. Kulkarni |
Masking Faults While Providing Bounded-Time Phased Recovery. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FM ![In: FM 2008: Formal Methods, 15th International Symposium on Formal Methods, Turku, Finland, May 26-30, 2008, Proceedings, pp. 374-389, 2008, Springer, 978-3-540-68235-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Bounded-time recovery, Phased recovery, Fault-tolerance, Real-time, Formal methods, Synthesis, Transformation |
17 | Jane-Ferng Chiu, Wei-Hua Hao |
Mutual-Aid: Diskless Checkpointing Scheme for Tolerating Double Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCC ![In: 10th IEEE International Conference on High Performance Computing and Communications, HPCC 2008, 25-27 Sept. 2008, Dalian, China, pp. 540-547, 2008, IEEE Computer Society, 978-0-7695-3352-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Gabriella Carrozza, Domenico Cotroneo, Stefano Russo 0001 |
Software Faults Diagnosis in Complex OTS Based Safety Critical Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EDCC ![In: Seventh European Dependable Computing Conference, EDCC-7 2008, Kaunas, Lithuania, 7-9 May 2008, pp. 25-34, 2008, IEEE Computer Society, 978-0-7695-3138-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Fan Yang 0060, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 394-402, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian |
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 95-100, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
localization, diagnosis, detection, fault, march test |
17 | Colin Cooper, Ralf Klasing, Tomasz Radzik |
Locating and Repairing Faults in a Network with Mobile Agents. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIROCCO ![In: Structural Information and Communication Complexity, 15th International Colloquium, SIROCCO 2008, Villars-sur-Ollon, Switzerland, June 17-20, 2008, Proceedings, pp. 20-32, 2008, Springer, 978-3-540-69326-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Distributed computing, Mobile agents, Graph exploration |
17 | Guillermo Rodríguez-Navas, Julián Proenza |
Analytical Assessment of the Precision Degradation Caused by Faults in a Fault-Tolerant Master/Slave Clock Synchronization Service for CAN. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SRDS ![In: 27th IEEE Symposium on Reliable Distributed Systems (SRDS 2008), Napoli, Italy, October 6-8, 2008, pp. 33-42, 2008, IEEE Computer Society, 978-0-7695-3410-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
17 | Emmanuel Touloupis, James A. Flint, Vassilios A. Chouliaras, David D. Ward |
Study of the Effects of SEU-Induced Faults on a Pipeline Protected Microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 56(12), pp. 1585-1596, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
fault modeling and simulation, fault tolerance, fault injection, soft error, SEU, microprocessor test |
17 | Philip M. Wells, Koushik Chakraborty, Gurindar S. Sohi |
Adapting to Intermittent Faults in Future Multicore Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PACT ![In: 16th International Conference on Parallel Architectures and Compilation Techniques (PACT 2007), Brasov, Romania, September 15-19, 2007, pp. 431, 2007, IEEE Computer Society, 0-7695-2944-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel |
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 5th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2007), May 30 - June 1st, Nice, France, pp. 181-187, 2007, IEEE Computer Society, 1-4244-1050-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Jean-Jacques Quisquater |
The Power of Cryptographic Attacks: Is Your Network Really Secure Against Side Channels Attacks and Malicious Faults? ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSS ![In: Stabilization, Safety, and Security of Distributed Systems, 9th International Symposium, SSS 2007, Paris, France, November 14-16, 2007, Proceedings, pp. 1, 2007, Springer, 978-3-540-76626-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Felix C. Freiling, Arshad Jhumka |
Global Predicate Detection in Distributed Systems with Small Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSS ![In: Stabilization, Safety, and Security of Distributed Systems, 9th International Symposium, SSS 2007, Paris, France, November 14-16, 2007, Proceedings, pp. 296-310, 2007, Springer, 978-3-540-76626-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Emin Germen, Dogan Gökhan Ece, Ömer Nezih Gerek |
Self Organizing Map (SOM) Approach for Classification of Mechanical Faults in Induction Motors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWANN ![In: Computational and Ambient Intelligence, 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, San Sebastián, Spain, June 20-22, 2007, Proceedings, pp. 855-861, 2007, Springer, 978-3-540-73006-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Zsolt Kira |
Modeling cross-sensory and sensorimotor correlations to detect and localize faults in mobile robots. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IROS ![In: 2007 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 29 - November 2, 2007, Sheraton Hotel and Marina, San Diego, California, USA, pp. 1520-1526, 2007, IEEE, 978-1-4244-0912-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Manuel Cheminod, Ivan Cibrario Bertolotti, Luca Durante, Riccardo Sisto, Adriano Valenzano |
Evaluating the Combined Effect of Vulnerabilities and Faults on Large Distributed Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DepCoS-RELCOMEX ![In: 2007 International Conference on Dependability of Computer Systems (DepCoS-RELCOMEX 2007), June 14-16, 2007, Szklarska Poreba, Poland, pp. 11-18, 2007, IEEE Computer Society, 0-7695-2850-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Hao Yang 0001, Bin Jiang 0001, Vincent Cocquempot |
Fault Accommodation for Hybrid Systems with Continuous and Discrete Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HSCC ![In: Hybrid Systems: Computation and Control, 10th International Workshop, HSCC 2007, Pisa, Italy, April 3-5, 2007, Proceedings, pp. 779-782, 2007, Springer, 978-3-540-71492-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Young J. Won, Mi-Jung Choi, Jang Jin Lee, Jun Hyub Lee, Hwa Won Hwang, James Won-Ki Hong |
Detecting Network Faults on Industrial Process Control IP Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPOM ![In: IP Operations and Management, 7th IEEE International Workshop, IPOM 2007, San José, USA, October 31 - November 2, 2007, Proceedings, pp. 184-187, 2007, Springer, 978-3-540-75852-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Industrial Process Control Networks, IP Network Operation and Management, Traffic Monitoring, Fault Detection and Diagnosis |
17 | Ben Vandiver, Hari Balakrishnan, Barbara Liskov, Samuel Madden 0001 |
Tolerating byzantine faults in transaction processing systems using commit barrier scheduling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SOSP ![In: Proceedings of the 21st ACM Symposium on Operating Systems Principles 2007, SOSP 2007, Stevenson, Washington, USA, October 14-17, 2007, pp. 59-72, 2007, ACM, 978-1-59593-591-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
databases, byzantine fault tolerance, state machine replication |
17 | Veljko Krunic, Eric Trumpler, Richard Han 0001 |
NodeMD: diagnosing node-level faults in remote wireless sensor systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MobiSys ![In: Proceedings of the 5th International Conference on Mobile Systems, Applications, and Services (MobiSys 2007), San Juan, Puerto Rico, June 11-13, 2007, pp. 43-56, 2007, ACM, 978-1-59593-614-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
wireless sensor networks, diagnosis, deployment, software fault |
17 | Talmai Brandão de Oliveira, Victor Franco Costa, Fabíola Greve |
On the Behavior of Broadcasting Protocols for MANETs Under Omission Faults Scenarios. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LADC ![In: Dependable Computing, Third Latin-American Symposium, LADC 2007, Morella, Mexico, September 26-28, 2007, Proceedings, pp. 142-159, 2007, Springer, 978-3-540-75293-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Fault-Tolerant Wireless Communication, Mobile Ad-Hoc Networks, Broadcasting, Reliable Broadcasting |
17 | Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel |
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 185-186, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Rajsekhar Adapa, Spyros Tragoudas, Maria K. Michael |
Accelerating Diagnosis via Dominance Relations between Sets of Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 219-224, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Qiang Xu 0001, Yubin Zhang, Krishnendu Chakrabarty |
SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 676-681, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
17 | Yigal Bejerano, Rajeev Rastogi |
Robust monitoring of link delays and faults in IP networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE/ACM Trans. Netw. ![In: IEEE/ACM Trans. Netw. 14(5), pp. 1092-1103, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
latency and fault monitoring, approximation algorithms, set cover problem, network failures |
17 | Yannick Monnet, Marc Renaudin, Régis Leveugle |
Designing Resistant Circuits against Malicious Faults Injection Using Asynchronous Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 55(9), pp. 1104-1115, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
quasi-delay insensitive, hardening techniques, Asynchronous circuits, data encryption standard, fault attacks |
17 | Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 |
Simulating Resistive-Bridging and Stuck-At Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10), pp. 2181-2192, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park |
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11), pp. 2605-2608, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Saravanan Padmanaban, Spyros Tragoudas |
Implicit grading of multiple path delay faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 11(2), pp. 346-361, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Fault simulation, decision diagrams, delay fault testing |
17 | Taghi M. Khoshgoftaar, Naeem Seliya, Nandini Sundaresh |
An empirical study of predicting software faults with case-based reasoning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Qual. J. ![In: Softw. Qual. J. 14(2), pp. 85-111, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Solution algorithm, Software quality, Software metrics, Case-based reasoning, Similarity functions, Software fault prediction |
17 | Dong Tang, Peter Carruthers, Zuheir Totari, Michael W. Shapiro |
Assessment of the Effect of Memory Page Retirement on System RAS Against Hardware Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2006 International Conference on Dependable Systems and Networks (DSN 2006), 25-28 June 2006, Philadelphia, Pennsylvania, USA, Proceedings, pp. 365-370, 2006, IEEE Computer Society, 0-7695-2607-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Vishal Suthar, Shantanu Dutt |
Efficient on-line interconnect testing in FPGAs with provable detectability for multiple faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 1165-1170, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Martin Omaña 0001, José Manuel Cazeaux, Daniele Rossi 0001, Cecilia Metra |
Low-cost and highly reliable detector for transient and crosstalk faults affecting FPGA interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 170-175, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
17 | Shiva Shankar, Ottalingam Satyanarayanan |
An Automated System for Analyzing Impact of Faults in IP Telephony Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NOMS ![In: Management of Integrated End-to-End Communications and Services, 10th IEEE/IFIP Network Operations and Management Symposium, NOMS 2006, Vancouver, Canada, April 3-7, 2006. Proceedings, 2006, IEEE, 1-4244-0143-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
|
|