Search results for "faults"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
18	Miron Abramovici, Prem R. Menon, David T. Miller	Checkpoint Faults are not Sufficient Target Faults for Test Generation.	IEEE Trans. Computers	1986	DBLP DOI BibTeX RDF
18	Bev Littlewood	Stochastic reliability growth: A model with applications to computer software faults and hardware design faults.	Measurement and evaluation of software quality	1981	DBLP DOI BibTeX RDF
17	Irith Pomeranz, Sudhakar M. Reddy	State persistence: a property for guiding test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	broadside tests, test generation, transition faults, scan-based tests
17	Elaine J. Weyuker, Thomas J. Ostrand, Robert M. Bell	Do too many cooks spoil the broth? Using the number of developers to enhance defect prediction models.	Empir. Softw. Eng.	2008	DBLP DOI BibTeX RDF	Negative binomial model, Developer counts, Empirical study, Software faults
17	Irene Finocchi, Giuseppe F. Italiano	Sorting and Searching in Faulty Memories.	Algorithmica	2008	DBLP DOI BibTeX RDF	Memory faults, Computing with unreliable information, Searching, Sorting, Memory models, Combinatorial algorithms
17	Daniele Rossi 0001, Martin Omaña 0001, Cecilia Metra	Checkers' No-Harm Alarms and Design Approaches to Tolerate Them.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Error detecting codes, Transient faults, Self-checking circuits, Checker
17	Christian Gout, Carole Le Guyader, Lucia Romani, A.-G. Saint-Guirons	Approximation of surfaces with fault(s) and/or rapidly varying data, using a segmentation process, D m -splines and the finite element method.	Numer. Algorithms	2008	DBLP DOI BibTeX RDF	Surfaces with faults, Image segmentation, Finite element methods, Splines
17	Sriraman Tallam, Chen Tian 0002, Rajiv Gupta 0001, Xiangyu Zhang 0001	Avoiding Program Failures Through Safe Execution Perturbations.	COMPSAC	2008	DBLP DOI BibTeX RDF	avoiding failures, environmental faults, logging/replay tools, bad user requests, heap overflow, atomicity violation
17	Mohammad Gh. Mohammad, Laila Terkawi	Techniques for Disturb Fault Collapsing.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	algorithm, test, flash memory, faults, disturb
17	Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian	Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	Resistive-open defects, Pre-charge circuits, Memory testing, Dynamic faults
17	Fatih Kocan, Daniel G. Saab	Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	Dynamic fault diagnosis, FPGA, Emulation, Stuck-at faults, Circuits, Gate-level
17	Thomas J. Ostrand, Elaine J. Weyuker, Robert M. Bell	Automating algorithms for the identification of fault-prone files.	ISSTA	2007	DBLP DOI BibTeX RDF	software testing, prediction, empirical study, software faults, regression model, fault-prone
17	Zemo Yang, Samiha Mourad	Crosstalk Induced Fault Analysis and Test in DRAMs.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	crosstalk, DRAMs, pattern sensitive faults
17	Benjy J. Thomasson, Mark Ratcliffe 0001, Lynda Thomas	Identifying novice difficulties in object oriented design.	ITiCSE	2006	DBLP DOI BibTeX RDF	design faults, design, software design, introductory programming
17	Hakan Özdemir, Güngör Baser	Computer Simulation of Woven Fabric Defects Based on Faulty Yarn Photographs.	ISCIS	2006	DBLP DOI BibTeX RDF	Fabric simulation, fabric appearance, woven fabric faults, elastica curve, yarn flattening
17	Robert M. Bell, Thomas J. Ostrand, Elaine J. Weyuker	Looking for bugs in all the right places.	ISSTA	2006	DBLP DOI BibTeX RDF	software testing, prediction, empirical study, software faults, regression model, fault-prone
17	Alain Girault, Hamoudi Kalla, Yves Sorel	Transient Processor/Bus Fault Tolerance for Embedded Systems.	DIPES	2006	DBLP DOI BibTeX RDF	hybrid redundancy, safety-critical systems, transient faults, real-time embedded systems, scheduling heuristics, heterogeneous architectures, data fragmentation
17	James A. Muir	Seifert's RSA Fault Attack: Simplified Analysis and Generalizations.	ICICS	2006	DBLP DOI BibTeX RDF	signature verification, fault analysis, RSA signatures, hardware faults
17	Ian Broster, Alan Burns 0001, Guillermo Rodríguez-Navas	Timing Analysis of Real-Time Communication Under Electromagnetic Interference.	Real Time Syst.	2005	DBLP DOI BibTeX RDF	TTCAN, probabilistic timing analysis, electromagnetic interference, bus guardian, babbling idiot, dependability, faults, Controller Area Network, CAN
17	Richard W. Selby	Enabling Reuse-Based Software Development of Large-Scale Systems.	IEEE Trans. Software Eng.	2005	DBLP DOI BibTeX RDF	empirical study, software metrics, Software reuse, experimentation, software measurement, large-scale systems, mining software repositories, software faults, software changes
17	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi	Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	interconnect, multiple faults, adaptive diagnosis, Wiring network
17	Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel	Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Space compaction, testing, stuck-at faults, system-on-a-chip
17	Amy Streich, Alex Kondratyev, Lief Sorensen	Testing of Asynchronous Designs by "Inappropriate" Means: Synchronous Approach.	ASYNC	2002	DBLP DOI BibTeX RDF	ATPG, asynchronous circuits, stuck-at faults, partial scan
17	Ilia Polian, Piet Engelke, Bernd Becker 0001	Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics.	ISMVL	2002	DBLP DOI BibTeX RDF	Voting models, Fault simulation, Bridging faults
17	Erica Y. Yang, Jie Xu 0007, Keith H. Bennett	A Fault-Tolerant Approach to Secure Information Retrieval.	SRDS	2002	DBLP DOI BibTeX RDF	malicious faults, security, fault tolerance, secret sharing, private information retrieval, Distributed database systems
17	Kim Potter Kihlstrom, Louise E. Moser, P. M. Melliar-Smith	The SecureRing group communication system.	ACM Trans. Inf. Syst. Secur.	2001	DBLP DOI BibTeX RDF	group communication, survivability, intrusion, Byzantine faults, partial synchrony, state machine replication
17	Mandeep Singh, Israel Koren	Reliability Enhancement of Analog-to-Digital Converters (ADCs).	DFT	2001	DBLP DOI BibTeX RDF	Fault sensitivity, Alpha particle, Fault tolerance, Reliability, Transient faults, Analog-to-Digital Converters
17	Irith Pomeranz, Sudhakar M. Reddy	On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits.	IEEE Trans. Computers	2000	DBLP DOI BibTeX RDF	irredundant faults, built-in test generation, test generation, synchronous sequential circuits, Initial states
17	Claude Thibeault	Diagnosis Method Using DeltaIDDQ Probabilistic Signatures: Theory and Results.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	probabilistic signatures, diagnosis, bridging faults, Delta IDDQ
17	Marly Roncken, Ken S. Stevens, Rajesh Pendurkar, Shai Rotem, Parimal Pal Chaudhuri	CA-BIST for Asynchronous Circuits: A Case Study on the RAPPID Asynchronous Instruction Length Decoder.	ASYNC	2000	DBLP DOI BibTeX RDF	pulse logic, switch-level fault simulation, Cellular Automata, BIST, asynchronous circuits, testability, stuck-at faults, domino logic, self-timed circuits, dynamic circuits
17	Michael J. Liebelt, Cheng-Chew Lim	A method for determining whether asynchronous circuits are self-checking.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	low-power electronics, TSC, low noise properties, semi-modular asynchronous circuit, output stuck-at-faults, low power, fault diagnosis, logic testing, integrated circuit testing, design for testability, asynchronous circuits, testability, totally self-checking, integrated circuit noise
17	Yin-Chao Huang, Chung-Len Lee 0001, Jun-Weir Lin, Jwu E. Chen, Chauchin Su	A methodology for fault model development for hierarchical linear systems.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	closed loop systems, hierarchical linear systems, transfer function model, open-loop, element faults, benchmark state-variable filter, AC fault model, state variable filter, fault diagnosis, fault model, fault simulation, modules, Monte Carlo methods, Monte Carlo simulation, transfer functions, computation time, operational amplifiers, operational amplifiers, closed loop, analogue circuits
17	Wei-Je Huang, Edward J. McCluskey	Transient errors and rollback recovery in LZ compression.	PRDC	2000	DBLP DOI BibTeX RDF	LZ compression, Lempel-Ziv compression, compressed codewords, rollback error recovery schemes, data integrity, data integrity, fault tolerant computing, data compression, error detection, system recovery, transient faults, rollback recovery, compression ratio, lossless data compression, transient errors, data reconstruction, hardware redundancy
17	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi	Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects.	FTCS	1999	DBLP DOI BibTeX RDF	Interconnect, Multiple Faults, Adaptive Diagnosis, Wiring Network
17	Chanyutt Arjhan, Raghvendra G. Deshmukh	A Novel Fault-Detection Technique for The Parallel Multipliers and Dividers.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	parallel divider, parallel-array divider, pf-model, summand-generator, summand-counter, multiple faults functional testing, design for testability, boundary scan, array multiplier, Parallel multiplier
17	Daniel Gil, Juan Carlos Baraza, J. V. Busquets, Pedro J. Gil	Fault Injection into VHDL Models: Analysis of the Error Syndrome of a Microcomputer System.	EUROMICRO	1998	DBLP DOI BibTeX RDF	VHDL simulation, Error syndrome, Propagation latency, Fault injection, Transient faults, Experimental validation
17	Shalini Yajnik, Niraj K. Jha	Graceful Degradation in Algorithm-Based Fault Tolerant Multiprocessor Systems.	IEEE Trans. Parallel Distributed Syst.	1997	DBLP DOI BibTeX RDF	concurrent fault location, fault diagnosis, concurrent error detection, transient faults, graceful degradation, Algorithm-based fault tolerance
17	Michael Kishinevsky, Alex Kondratyev, Luciano Lavagno, Alexander Saldanha, Alexander Taubin	Partial scan delay fault testing of asynchronous circuits.	ICCAD	1997	DBLP DOI BibTeX RDF	robust path delay fault testing, asynchronous circuits, delay faults, sequential testing
17	Fausto Distante, Mariagiovanna Sami, Renato Stefanelli	Array partitioning to achieve defect tolerance.	EUROMICRO	1997	DBLP DOI BibTeX RDF	array partitioning, processing arrays, run time faults, reconfiguration techniques, architectural regularity, interconnection channel width, reconfiguration efficiency, partitioning approach, critical fault patterns, fault tolerance, redundancy, reconfigurable architectures, survival, defect tolerance, path length
17	Yiming Gong, Sreejit Chakravarty	Using fault sampling to compute IDDQ diagnostic test set.	VTS	1997	DBLP DOI BibTeX RDF	fault sampling, IDDQ diagnostic test set generation, combinational circuits, combinational circuit, bridging faults
17	Yinan N. Shen, Xiao-Tao Chen, Susumu Horiguchi, Fabrizio Lombardi	On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model.	ICPP	1997	DBLP DOI BibTeX RDF	CMOS fault model, multiple fault diagnosis, interconnection networks, fault diagnosis, lower bound, multistage interconnection networks, multistage interconnection networks, CMOS technology, stuck-open faults
17	Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta 0001	Fault macromodeling and a testing strategy for opamps.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	catastrophic fault model, operational amplifier design for testability, analog test, macromodeling, parametric faults
17	Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny	Optimization-based multifrequency test generation for analog circuits.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	multifrequency test generation, tolerance effects, fault observability maximization, parametric faults
17	Robert D. Blumofe, Matteo Frigo, Christopher F. Joerg, Charles E. Leiserson, Keith H. Randall	Dag-Consistent Distributed Shared Memory.	IPPS	1996	DBLP DOI BibTeX RDF	dag consistency, cactus stack, multithreading, distributed shared memory, dynamic scheduling, memory model, page faults
17	Katsuya Tanaka, Makoto Takizawa 0001	Distributed checkpointing based on influential messages.	ICPADS	1996	DBLP DOI BibTeX RDF	influential messages, massage passing, object faults, protocols, protocols, distributed processing, message passing, remote procedure calls, remote procedure call, consistent global state, distributed checkpointing
17	Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara	On the effects of test compaction on defect coverage.	VTS	1996	DBLP DOI BibTeX RDF	surrogate faults, fault diagnosis, test generation, integrated circuit testing, fault modeling, test sets, test compaction, defect coverage
17	Kent L. Einspahr, Sharad C. Seth	A switch-level test generation system for synchronous and asynchronous circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	reverse time processing, stuck-open and stuck-at faults, time-frame expansion, sequential circuits, Automatic test generation
17	Beyin Chen, Chung-Len Lee 0001	Universal test set generation for CMOS circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	functional testing, automatic test generation, CMOS circuits, stuck-open faults, universal test set
17	Michel Renovell, P. Huc, Yves Bertrand	The concept of resistance interval: a new parametric model for realistic resistive bridging fault.	VTS	1995	DBLP DOI BibTeX RDF	electric resistance, resistance interval, intrinsic resistance, logic behavior, 0 to 500 ohm, VLSI, VLSI, fault diagnosis, logic testing, integrated circuit testing, fault detection, automatic testing, fault coverage, bridging faults, parametric model, logic gates, logic gates, resistive bridging fault, faulty behavior
17	Anand Raghunathan, Pranav Ashar, Sharad Malik	Test generation for cyclic combinational circuits.	VLSI Design	1995	DBLP DOI BibTeX RDF	cyclic combinational circuits, bus structures, single-stuck-at fault test pattern, test generation problem, program RAM, fault diagnosis, logic testing, integrated circuit testing, network topology, combinational circuits, automatic testing, fault coverage, test pattern generators, formal analysis, data paths, testing algorithm, combinational logic circuits, untestable faults
17	Yung-Yuan Chen, Ching-Hwa Cheng, Jwu-E Chen	An efficient switching network fault diagnosis for reconfigurable VLSI/WSI array processors.	VLSI Design	1995	DBLP DOI BibTeX RDF	switching network fault diagnosis, reconfigurable VLSI/WSI array processors, switching network defects, killing error, testing circuit overhead, diagnosis time, mesh array, VLSI, parallel architectures, fault diagnosis, reconfigurable architectures, multiple faults, switching networks, wafer-scale integration, testing quality
17	Koji Tsuda, Shuji Senda, Michihiko Minoh, Katsuo Ikeda	Clustering OCR-ed texts for browsing document image database.	ICDAR	1995	DBLP DOI BibTeX RDF	OCR text clustering, document image database browsing, cluster extraction method, ordinal clustering methods, Complete Link, term loss, recognition faults, feature extraction, human factors, optical character recognition, interactive systems, document image processing, user interaction, document clustering, visual databases, word processing
17	Charles E. Stroud, Ahmed E. Barbour	Testability and test generation for majority voting fault-tolerant circuits.	J. Electron. Test.	1993	DBLP DOI BibTeX RDF	majority voting circuits, fault-tolerance, Design for testability, test pattern generation, multiple stuck-at faults
17	Jean-Claude Laprie, Karama Kanoun	X-Ware Reliability and Availability Modeling.	IEEE Trans. Software Eng.	1992	DBLP DOI BibTeX RDF	classical reliability theory, software viewpoints, X-Ware, performance evaluation, fault tolerant computing, software reliability, faults, software models, reliability theory, availability modeling
17	Tsong Yueh Chen, Man Fai Lau, Kwan Yong Sim, Chang-Ai Sun	On detecting faults for Boolean expressions.	Softw. Qual. J.	2009	DBLP DOI BibTeX RDF	MUMCUT strategy, Software testing, Fault detection, Specification based testing, Black-box testing, Fault based testing, Boolean specification
17	Yomara Pires, Jefferson Morais, Claudomir Cardoso, Aldebaro Klautau	Data Mining Applied to the Electric Power Industry: Classification of Short-Circuit Faults in Transmission Lines.	Innovative Applications in Data Mining	2009	DBLP DOI BibTeX RDF
17	Piotr Jantos, Damian Grzechca, Jerzy Rutkowski	Global parametric faults identification with the use of Differential Evolution.	DDECS	2009	DBLP DOI BibTeX RDF
17	Natasa Miskov-Zivanov, Diana Marculescu	A systematic approach to modeling and analysis of transient faults in logic circuits.	ISQED	2009	DBLP DOI BibTeX RDF
17	Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu	Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.	VLSI Design	2009	DBLP DOI BibTeX RDF
17	Ying-Yen Chen, Jing-Jia Liou	Diagnosis Framework for Locating Failed Segments of Path Delay Faults.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
17	Hsing-Chung Liang, Pao-Hsin Huang, Yan-Fei Tang	Testing Transition Delay Faults in Modified Booth Multipliers.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
17	Munkang Choi, Linda S. Milor	Diagnosis of Optical Lithography Faults With Product Test Sets.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
17	Hongyu Zhang 0002	On the Distribution of Software Faults.	IEEE Trans. Software Eng.	2008	DBLP DOI BibTeX RDF	Measurement applied to SQA and V&V, Product metrics
17	Bogdan F. Romanescu, Daniel J. Sorin	Core cannibalization architecture: improving lifetime chip performance for multicore processors in the presence of hard faults.	PACT	2008	DBLP DOI BibTeX RDF	lifetime performance, fault tolerance, reliability, multicore
17	José Fonseca 0002, Marco Vieira	Mapping software faults with web security vulnerabilities.	DSN	2008	DBLP DOI BibTeX RDF
17	Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu	On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.	DATE	2008	DBLP DOI BibTeX RDF
17	Irith Pomeranz, Sudhakar M. Reddy	A Bridging Fault Model Where Undetectable Faults Imply Logic Redundancy.	DATE	2008	DBLP DOI BibTeX RDF
17	Borzoo Bonakdarpour, Sandeep S. Kulkarni	Masking Faults While Providing Bounded-Time Phased Recovery.	FM	2008	DBLP DOI BibTeX RDF	Bounded-time recovery, Phased recovery, Fault-tolerance, Real-time, Formal methods, Synthesis, Transformation
17	Jane-Ferng Chiu, Wei-Hua Hao	Mutual-Aid: Diskless Checkpointing Scheme for Tolerating Double Faults.	HPCC	2008	DBLP DOI BibTeX RDF
17	Gabriella Carrozza, Domenico Cotroneo, Stefano Russo 0001	Software Faults Diagnosis in Complex OTS Based Safety Critical Systems.	EDCC	2008	DBLP DOI BibTeX RDF
17	Fan Yang 0060, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz	Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells.	DFT	2008	DBLP DOI BibTeX RDF
17	Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian	An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories.	VTS	2008	DBLP DOI BibTeX RDF	localization, diagnosis, detection, fault, march test
17	Colin Cooper, Ralf Klasing, Tomasz Radzik	Locating and Repairing Faults in a Network with Mobile Agents.	SIROCCO	2008	DBLP DOI BibTeX RDF	Distributed computing, Mobile agents, Graph exploration
17	Guillermo Rodríguez-Navas, Julián Proenza	Analytical Assessment of the Precision Degradation Caused by Faults in a Fault-Tolerant Master/Slave Clock Synchronization Service for CAN.	SRDS	2008	DBLP DOI BibTeX RDF
17	Emmanuel Touloupis, James A. Flint, Vassilios A. Chouliaras, David D. Ward	Study of the Effects of SEU-Induced Faults on a Pipeline Protected Microprocessor.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	fault modeling and simulation, fault tolerance, fault injection, soft error, SEU, microprocessor test
17	Philip M. Wells, Koushik Chakraborty, Gurindar S. Sohi	Adapting to Intermittent Faults in Future Multicore Systems.	PACT	2007	DBLP DOI BibTeX RDF
17	Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel	Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults.	MEMOCODE	2007	DBLP DOI BibTeX RDF
17	Jean-Jacques Quisquater	The Power of Cryptographic Attacks: Is Your Network Really Secure Against Side Channels Attacks and Malicious Faults?	SSS	2007	DBLP DOI BibTeX RDF
17	Felix C. Freiling, Arshad Jhumka	Global Predicate Detection in Distributed Systems with Small Faults.	SSS	2007	DBLP DOI BibTeX RDF
17	Emin Germen, Dogan Gökhan Ece, Ömer Nezih Gerek	Self Organizing Map (SOM) Approach for Classification of Mechanical Faults in Induction Motors.	IWANN	2007	DBLP DOI BibTeX RDF
17	Zsolt Kira	Modeling cross-sensory and sensorimotor correlations to detect and localize faults in mobile robots.	IROS	2007	DBLP DOI BibTeX RDF
17	Manuel Cheminod, Ivan Cibrario Bertolotti, Luca Durante, Riccardo Sisto, Adriano Valenzano	Evaluating the Combined Effect of Vulnerabilities and Faults on Large Distributed Systems.	DepCoS-RELCOMEX	2007	DBLP DOI BibTeX RDF
17	Hao Yang 0001, Bin Jiang 0001, Vincent Cocquempot	Fault Accommodation for Hybrid Systems with Continuous and Discrete Faults.	HSCC	2007	DBLP DOI BibTeX RDF
17	Young J. Won, Mi-Jung Choi, Jang Jin Lee, Jun Hyub Lee, Hwa Won Hwang, James Won-Ki Hong	Detecting Network Faults on Industrial Process Control IP Networks.	IPOM	2007	DBLP DOI BibTeX RDF	Industrial Process Control Networks, IP Network Operation and Management, Traffic Monitoring, Fault Detection and Diagnosis
17	Ben Vandiver, Hari Balakrishnan, Barbara Liskov, Samuel Madden 0001	Tolerating byzantine faults in transaction processing systems using commit barrier scheduling.	SOSP	2007	DBLP DOI BibTeX RDF	databases, byzantine fault tolerance, state machine replication
17	Veljko Krunic, Eric Trumpler, Richard Han 0001	NodeMD: diagnosing node-level faults in remote wireless sensor systems.	MobiSys	2007	DBLP DOI BibTeX RDF	wireless sensor networks, diagnosis, deployment, software fault
17	Talmai Brandão de Oliveira, Victor Franco Costa, Fabíola Greve	On the Behavior of Broadcasting Protocols for MANETs Under Omission Faults Scenarios.	LADC	2007	DBLP DOI BibTeX RDF	Fault-Tolerant Wireless Communication, Mobile Ad-Hoc Networks, Broadcasting, Reliable Broadcasting
17	Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel	Robustness of circuits under delay-induced faults : test of AES with the PAFI tool.	IOLTS	2007	DBLP DOI BibTeX RDF
17	Rajsekhar Adapa, Spyros Tragoudas, Maria K. Michael	Accelerating Diagnosis via Dominance Relations between Sets of Faults.	VTS	2007	DBLP DOI BibTeX RDF
17	Qiang Xu 0001, Yubin Zhang, Krishnendu Chakrabarty	SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects.	DAC	2007	DBLP DOI BibTeX RDF
17	Yigal Bejerano, Rajeev Rastogi	Robust monitoring of link delays and faults in IP networks.	IEEE/ACM Trans. Netw.	2006	DBLP DOI BibTeX RDF	latency and fault monitoring, approximation algorithms, set cover problem, network failures
17	Yannick Monnet, Marc Renaudin, Régis Leveugle	Designing Resistant Circuits against Malicious Faults Injection Using Asynchronous Logic.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	quasi-delay insensitive, hardening techniques, Asynchronous circuits, data encryption standard, fault attacks
17	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001	Simulating Resistive-Bridging and Stuck-At Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
17	Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park	Efficient Interconnect Test Patterns for Crosstalk and Static Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
17	Saravanan Padmanaban, Spyros Tragoudas	Implicit grading of multiple path delay faults.	ACM Trans. Design Autom. Electr. Syst.	2006	DBLP DOI BibTeX RDF	Fault simulation, decision diagrams, delay fault testing
17	Taghi M. Khoshgoftaar, Naeem Seliya, Nandini Sundaresh	An empirical study of predicting software faults with case-based reasoning.	Softw. Qual. J.	2006	DBLP DOI BibTeX RDF	Solution algorithm, Software quality, Software metrics, Case-based reasoning, Similarity functions, Software fault prediction
17	Dong Tang, Peter Carruthers, Zuheir Totari, Michael W. Shapiro	Assessment of the Effect of Memory Page Retirement on System RAS Against Hardware Faults.	DSN	2006	DBLP DOI BibTeX RDF
17	Vishal Suthar, Shantanu Dutt	Efficient on-line interconnect testing in FPGAs with provable detectability for multiple faults.	DATE	2006	DBLP DOI BibTeX RDF
17	Martin Omaña 0001, José Manuel Cazeaux, Daniele Rossi 0001, Cecilia Metra	Low-cost and highly reliable detector for transient and crosstalk faults affecting FPGA interconnects.	DATE	2006	DBLP DOI BibTeX RDF
17	Shiva Shankar, Ottalingam Satyanarayanan	An Automated System for Analyzing Impact of Faults in IP Telephony Networks.	NOMS	2006	DBLP DOI BibTeX RDF