Search results for "testing"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
22	Dennis Brylow, Jens Palsberg	Deadline Analysis of Interrupt-Driven Software.	IEEE Trans. Software Eng.	2004	DBLP DOI BibTeX RDF	multiresolution static analysis, Real time, testing oracles
22	Dennis Brylow, Jens Palsberg	Deadline analysis of interrupt-driven software.	ESEC / SIGSOFT FSE	2003	DBLP DOI BibTeX RDF	multi-resolution static analysis, real time, testing oracles
22	Mary Jean Harrold, David S. Rosenblum, Gregg Rothermel, Elaine J. Weyuker	Empirical Studies of a Prediction Model for Regression Test Selection.	IEEE Trans. Software Eng.	2001	DBLP DOI BibTeX RDF	Software maintenance, regression testing, regression test selection, selective retest
22	Mohamed Zaït, Allison W. Lee, Khaled Yagoub, Ravi Sahani, Holly Casaletto, Lokesh Kumar	Testing on a budget: integrating e-business certification into the Oracle DBMS testing.	DBTest	2009	DBLP DOI BibTeX RDF	test, SQL, query optimizer, DBMS, workload, Oracle
22	Jun Chen 0018, Steve MacDonald	Towards a better collaboration of static and dynamic analyses for testing concurrent programs.	PADTAD	2008	DBLP DOI BibTeX RDF
22	Eitan Farchi	Pitfalls in teaching development and testing of concurrent programs and how to overcome them.	PADTAD	2008	DBLP DOI BibTeX RDF
22	Antonio Bucchiarone, Henry Muccini, Patrizio Pelliccione, Pierluigi Pierini	Model-Checking Plus Testing: From Software Architecture Analysis to Code Testing.	FORTE Workshops	2004	DBLP DOI BibTeX RDF
22	José Antonio Arnedo, Ana R. Cavalli, Manuel Núñez 0001	Fast Testing of Critical Properties through Passive Testing.	TestCom	2003	DBLP DOI BibTeX RDF
22	Sita Ramakrishnan	VISWAS and on Diagnosability with IEEE Std P1522 and UML2.0 Testing Profile.	FATES	2003	DBLP DOI BibTeX RDF
22	Reiner Hähnle, Angela Wallenburg	Using a Software Testing Technique to Improve Theorem Proving.	FATES	2003	DBLP DOI BibTeX RDF
22	Guoqing Xu, Zongyuang Yang	JMLAutoTest: A Novel Automated Testing Framework Based on JML and JUnit.	FATES	2003	DBLP DOI BibTeX RDF
22	Harm M. A. van Beek, Sjouke Mauw	Automatic Conformance Testing of Internet Applications.	FATES	2003	DBLP DOI BibTeX RDF
22	Tsong Yueh Chen, Fei-Ching Kuo, Huai Liu, Shengqiong Wang	Conformance Testing of Network Simulators Based on Metamorphic Testing Technique.	FMOODS/FORTE	2009	DBLP DOI BibTeX RDF
22	Gabor Szeder	Unit testing for multi-threaded Java programs.	PADTAD	2009	DBLP DOI BibTeX RDF	Java
22	Ido Ben-Eliezer, Tali Kaufman, Michael Krivelevich, Dana Ron	Comparing the strength of query types in property testing: the case of testing k-colorability.	SODA	2008	DBLP BibTeX RDF
22	Pu Yunming, Wang Wei	A Balancing Model between Structural Testing and Functional Testing.	CSSE (2)	2008	DBLP DOI BibTeX RDF
22	Jaymie Strecker, Atif M. Memon	Relationships between Test Suites, Faults, and Fault Detection in GUI Testing.	ICST	2008	DBLP DOI BibTeX RDF
22	Bo Yu, Liang Kong, Yufeng Zhang 0001, Hong Zhu 0002	Testing Java Components based on Algebraic Specifications.	ICST	2008	DBLP DOI BibTeX RDF
22	Tim Trew	Chasing rainbows: improving software testing in the real world.	ISSTA	2007	DBLP DOI BibTeX RDF
22	Holger Giese, Stefan Henkler, Martin Hirsch 0001	Combining Formal Verification and Testing for Correct Legacy Component Integration in Mechatronic UML.	WADS	2007	DBLP DOI BibTeX RDF
22	Shmuel Ur, Elad Yom-Tov, Paul Wernick	An Open Source Simulation Model of Software Development and Testing.	Haifa Verification Conference	2006	DBLP DOI BibTeX RDF	Simulation, Performance, Design, Algorithms, Reliability, Verification, Measurement, Software Development, Management, Theory, Experimentation, Economics, Iterative design
22	Mats Grindal, Jeff Offutt, Jonas Mellin	On the Testing Maturity of Software Producing Organizations.	TAIC PART	2006	DBLP DOI BibTeX RDF
22	Sami Beydeda	Research in testing COTS components - built-in testing approaches.	AICCSA	2005	DBLP DOI BibTeX RDF
22	Ismail Berrada, Richard Castanet, Patrick Félix	Testing Communicating Systems: a Model, a Methodology, and a Tool.	TestCom	2005	DBLP DOI BibTeX RDF
22	Antti Kervinen, Mika Maunumaa, Tuula Pääkkönen, Mika Katara	Model-Based Testing Through a GUI.	FATES	2005	DBLP DOI BibTeX RDF
22	Hoijin Yoon, Eunhee Kim, Jooyoung Seo, Byoungju Choi	Testing COM Components Using Software Fault Injection and Mutation Analysis, and Its Empirical Study.	FATES	2004	DBLP DOI BibTeX RDF
22	Ying Li 0013, Minglu Li 0001, Jiadi Yu	Web Services Testing, the Methodology, and the Implementation of the Automation-Testing Tool.	GCC (1)	2003	DBLP DOI BibTeX RDF
22	Bram Kruseman, Stefan van den Oetelaar, Josep Rius 0001	Comparison of IDDQ Testing and Very-Low Voltage Testing.	ITC	2002	DBLP DOI BibTeX RDF
22	Yasuharu Nishi	Quality-Adaptive Testing: A Strategy for Testing with Focusing on Where Bugs Have Been Detected.	ECSQ	2002	DBLP DOI BibTeX RDF
22	Phil Stocks, David A. Carrington	Test Template Framework: A Specification-Based Testing Case Study.	ISSTA	1993	DBLP DOI BibTeX RDF
22	Lixiao Zheng, Haiming Chen	A Systematic Framework for Grammar Testing.	ACIS-ICIS	2009	DBLP DOI BibTeX RDF
22	Hossain Shahriar, Mohammad Zulkernine	Automatic Testing of Program Security Vulnerabilities.	COMPSAC (2)	2009	DBLP DOI BibTeX RDF
22	Anne Miller, Balaji Kumar, Anukul Singhal	Photon: A Domain-Specific Language for Testing Converged Applications.	COMPSAC (2)	2009	DBLP DOI BibTeX RDF
22	Ajitha Rajan, Michael W. Whalen, Matt Staats, Mats Per Erik Heimdahl	Requirements Coverage as an Adequacy Measure for Conformance Testing.	ICFEM	2008	DBLP DOI BibTeX RDF
22	Yufeng Zhang 0001, Hong Zhu 0002	Ontology for Service Oriented Testing of Web Services.	SOSE	2008	DBLP DOI BibTeX RDF
22	Lijun Lun, Hui Xu	Analysis of the Subsume Relation between Software Architecture Testing Criteria.	CSSE (2)	2008	DBLP DOI BibTeX RDF
22	Chuanming Jing, Zhiliang Wang, Xingang Shi, Xia Yin, Jianping Wu	Mutation Testing of Protocol Messages Based on Extended TTCN-3.	AINA	2008	DBLP DOI BibTeX RDF
22	Chengying Mao, Yansheng Lu	CppTest: A Prototype Tool for Testing C/C++ Programs.	ARES	2007	DBLP DOI BibTeX RDF
22	Shaohua Zhang, Zhigang Ding, Yuwei Zong, Ning Gu	Remote Software Testing System Based on Grid Workflow.	CSCWD	2007	DBLP DOI BibTeX RDF
22	Zhiquan Zhou, Bernhard Scholz, Giovanni Denaro	Automated Software Testing and Analysis: Techniques, Practices and Tools.	HICSS	2007	DBLP DOI BibTeX RDF
22	Ossi Taipale, Katja Karhu, Kari Smolander	Observing Software Testing Practice from the Viewpoint of Organizations and Knowledge Management.	ESEM	2007	DBLP DOI BibTeX RDF
22	Kobi Inkumsah, Tao Xie 0001	Evacon: a framework for integrating evolutionary and concolic testing for object-oriented programs.	ASE	2007	DBLP DOI BibTeX RDF	structural coverage, test generation
22	Duy Cu Nguyen, Anna Perini, Paolo Tonella	A Goal-Oriented Software Testing Methodology.	AOSE	2007	DBLP DOI BibTeX RDF
22	Kai-Yuan Cai, Lei Zhao, Feng Wang	A Dynamic Partitioning Approach for GUI Testing.	COMPSAC (2)	2006	DBLP DOI BibTeX RDF
22	Liangliang Kong, Zhaolin Yin	The Extension of the Unit Testing Tool Junit for Special Testings.	IMSCCS (2)	2006	DBLP DOI BibTeX RDF
22	Hirohisa Furuta, Akira Ishihara, Takayuki Yamaoka	Reusing a System Testing Process Using with a Model.	ETFA	2006	DBLP DOI BibTeX RDF
22	Ossi Taipale, Kari Smolander, Heikki Kälviäinen	Finding and Ranking Research Directions for Software Testing.	EuroSPI	2005	DBLP DOI BibTeX RDF
22	Shiyi Xu	Pseudo-Parity Testing with Testable Design.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
22	Peng Wu 0002	Iterative Metamorphic Testing.	COMPSAC (1)	2005	DBLP DOI BibTeX RDF
22	Yu Qi, David Chenho Kung, W. Eric Wong	An Agent-Based Testing Approach for Web Applications.	COMPSAC (2)	2005	DBLP DOI BibTeX RDF
22	Qianxiang Wang, Lining Quan, Fuchen Ying	Online Testing of Web-Based Applications.	COMPSAC Workshops	2004	DBLP DOI BibTeX RDF
22	Tsong Yueh Chen, Hing Leung, I. K. Mak	Adaptive Random Testing.	ASIAN	2004	DBLP DOI BibTeX RDF
22	Shuang Quan Li, Huo Yan Chen, Yu Xia Sun	A framework of reachability testing for Java multithread programs.	SMC (3)	2004	DBLP DOI BibTeX RDF
22	Annalisa De Bonis, Leszek Gasieniec, Ugo Vaccaro	Generalized Framework for Selectors with Applications in Optimal Group Testing.	ICALP	2003	DBLP DOI BibTeX RDF
22	Carina Andersson, Thomas Thelin, Per Runeson, Nina Dzamashvili	An Experimental Evaluation of Inspection and Testing for Detection of Design Faults.	ISESE	2003	DBLP DOI BibTeX RDF
22	Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi	Regressive Testing for System-on-Chip with Unknown-Good-Yield.	DFT	2003	DBLP DOI BibTeX RDF
22	Shiyi Xu, Jianwen Chen	Maximum Distance Testing.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
22	C. P. Ravikumar, Rahul Kumar	Divide-and-Conquer IDDQ Testing for Core-Based System Chips.	ASP-DAC/VLSI Design	2002	DBLP DOI BibTeX RDF
22	Alessandro Brawerman, Elias Procópio Duarte Jr.	An Isochronous Testing Strategy for Hierarchical Adaptive Distributed System-Level Diagnosis.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	hierarchical diagnosis, network fault management, fault-tolerance, distributed systems, distributed diagnosis
22	Raymond A. Paul, Lian Yu, Wei-Tek Tsai, Xiaoying Bai	Scenario-Based Functional Regression Testing.	COMPSAC	2001	DBLP DOI BibTeX RDF
22	R. Wen	URL-Driven Automated Testing.	APAQS	2001	DBLP DOI BibTeX RDF
22	Nancy J. Wahl	Student-Run Usability Testing.	CSEE&T	2000	DBLP DOI BibTeX RDF
22	Michael Kishinevsky, Alex Kondratyev, Luciano Lavagno, Alexander Saldanha, Alexander Taubin	Partial-scan delay fault testing of asynchronous circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
22	A. Jefferson Offutt, Jane Huffman Hayes	A Semantic Model of Program Faults.	ISSTA	1996	DBLP DOI BibTeX RDF
22	Phil Nigh, Wojciech Maly	Test Generation for Current Testing (CMOS ICs).	IEEE Des. Test Comput.	1990	DBLP DOI BibTeX RDF
22	Takeshi Chusho, Atsushi Tanaka, Eri Okamoto, Akinori Honda, Toru Kurosaki	HITS: a symbolic testing and debugging system for multilingual microcomputer software.	AFIPS National Computer Conference	1983	DBLP DOI BibTeX RDF
22	Jeffrey M. Voas, Keith W. Miller 0001	Software Testability: The New Verification.	IEEE Softw.	1995	DBLP DOI BibTeX RDF
20	Nelson H. F. Beebe, James S. Ball	Algorithm 867: QUADLOG - a package of routines for generating Gauss-related quadrature for two classes of logarithmic weight functions.	ACM Trans. Math. Softw.	2007	DBLP DOI BibTeX RDF	EISPACK pythag() function, Gauss-Chebyshev quadrature, Gauss-Jacobi quadrature, Gauss-Laguerre quadrature, Gauss-Legendre quadrature, Gauss-type quadrature, Maple symbolic algebra system, Mehler quadrature, gamma-function testing, logarithmic integrals, machine-epsilon testing, psi-function testing, software testing, software portability, orthogonal polynomials
20	Ysong Yueh Yu, Sebastian P. Ng, Eric Y. K. Chan	Generating, Selecting and Prioritizing Test Cases from Specifications with Tool Support.	QSIC	2003	DBLP DOI BibTeX RDF	software testing, specification-based testing, Black box testing, partition testing, test case selection, classification-tree method
20	Maria K. Michael, Spyros Tragoudas	ATPG tools for delay faults at the functional level.	ACM Trans. Design Autom. Electr. Syst.	2002	DBLP DOI BibTeX RDF	functional-level testing, path delay fault simulation (coverage), testing digital circuits, Automatic test pattern generation, Binary Decision Diagrams, delay testing, Boolean Satisfiability, path delay fault testing
20	Sandip Kundu, Sujit T. Zachariah, Sanjay Sengupta, Rajesh Galivanche	Test Challenges in Nanometer Technologies.	J. Electron. Test.	2001	DBLP DOI BibTeX RDF	circuit marginality testing, process marginality testing, defect based testing, path delay testing
20	Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal	Segment delay faults: a new fault model.	VTS	1996	DBLP DOI BibTeX RDF	segment delay faults, delay defect, distributed defect, rising transitions, falling transitions, transition tests, nonrobust tests, VLSI, fault diagnosis, logic testing, delays, integrated circuit testing, fault model, automatic testing, circuit analysis computing, robust tests, integrated circuit modelling, production testing, spot defect, manufacturing defects
20	Nur A. Touba, Edward J. McCluskey	Test point insertion based on path tracing.	VTS	1996	DBLP DOI BibTeX RDF	probabilistic techniques, primary inputs, insertion methods, VLSI, VLSI, fault diagnosis, logic testing, logic testing, probability, built-in self test, timing, integrated circuit testing, BIST, automatic testing, fault coverage, test point insertion, path tracing, circuit-under-test
20	Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda	Scan insertion criteria for low design impact.	VTS	1996	DBLP DOI BibTeX RDF	scan insertion criteria, design impact, flip-flop ordering, capacitance constraints, layout information, Italtel Design Environment, logic testing, integrated circuit testing, sequential circuits, automatic testing, application specific integrated circuits, logic CAD, flip-flops, integrated circuit design, power dissipation, partial scan, design flow, boundary scan testing, scan chain, capacitance, full scan
20	Jacob Savir	Module level weighted random patterns.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	module level self-test architecture, pseudorandom pattern generator, universal weighting generator, scan latch, near-optimal weight, signal pins, weight control function, self-test time, logic testing, probability, integrated circuit testing, automatic testing, multivalued logic circuits, boundary scan testing, scan test, weighted random patterns, multiple input signature register
20	Sudhir K. Jhajharia, Hua Swee Wang	Training diploma students on ATE-related module.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	electronic equipment testing, tertiary institution, ATE-related module, diploma students, final year students, Microelectronics option, Electronics and Communication Engineering Department, Singapore Polytechnic, Singapore Polytechnic Education Model, automated test equipment, Advanced Diploma, practical training, laboratory session, training, integrated circuit testing, assessment, teaching, teaching, automatic testing, automatic test equipment, test patterns, printed circuit boards, educational courses, printed circuit testing, industry-standard, electronic engineering education
20	Winfried Hahn, Andreas Hagerer, R. Kandlbinder	Hardware-accelerated concurrent fault simulation: eventflow computing versus dataflow computing.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	hardware-accelerated concurrent fault simulation, eventflow computing, highly-parallel Munich Simulation Computer, compiler-driven simulation, selective trace simulation, VLSI, VLSI, fault diagnosis, logic testing, integrated circuit testing, discrete event simulation, MuSiC, automatic testing, automatic testing, circuit analysis computing, logic simulation, concurrent engineering, test vectors, data flow computing, dataflow computing
20	Jacob Savir	Generator choices for delay test.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	BIST based delay test, generator choices, delay test vector generator, nonscan designs, transition test, skewed-load delay test, shift dependency, digital logic circuits, performance, VLSI, fault diagnosis, logic testing, delays, built-in self test, integrated circuit testing, ATPG, automatic testing, flexibility, linear feedback shift register, cost, shift registers, scan designs, boundary scan testing, test vectors, timing requirement, pseudo-random test
20	Yu Fang, Alexander Albicki	Efficient testability enhancement for combinational circuit.	ICCD	1995	DBLP DOI BibTeX RDF	testability enhancement, combinational circuit testing, XOR Chain Structure, insertion points, random pattern resistant node source tracking, ISCAS85, performance evaluation, VLSI, VLSI, logic testing, controllability, built-in self test, combinational circuits, automatic testing, automatic testing, observability, testability analysis, benchmark circuits, hardware overhead, performance penalty
20	Gang Luo, Gregor von Bochmann, Alexandre Petrenko	Test Selection Based on Communicating Nondeterministic Finite-State Machines Using a Generalized WP-Method.	IEEE Trans. Software Eng.	1994	DBLP DOI BibTeX RDF	communicating nondeterministic finite-state machines, generalized Wp-method, conformance relation, trace-equivalence, deterministic finite-state machines, software engineering, software engineering, protocols, software testing, finite state machines, specification languages, program testing, concurrent programs, communication protocols, fault coverage, conformance testing, programming theory, SDL, reachability analysis, test suites, multiprocessing programs, test selection, protocol engineering, test sequence generation, protocol conformance testing
20	Andrzej Pelc	Optimal Fault Diagnosis in Comparison Models.	IEEE Trans. Computers	1992	DBLP DOI BibTeX RDF	nonadaptive testing, comparison models, optimal testing algorithms, fault diagnosis, fault tolerant computing, logic testing, fault detection, multiprocessing systems, fault location, adaptive testing
20	A. Boneh, Jacob Savir	Statistical Resistance to Detection.	IEEE Trans. Computers	1992	DBLP DOI BibTeX RDF	digital circuits testing, random pattern test, simulation cost, logic testing, integrated circuit testing, automatic testing, fault coverage, fault location, statistical method, digital circuit, digital circuits, detection probabilities
20	Mark G. Karpovsky, Prawat Nagvajara	Optimal Robust Compression of Test Responses.	IEEE Trans. Computers	1990	DBLP DOI BibTeX RDF	optimal robust compression, fault-free responses, VLSI, logic testing, data compression, built-in self-test, integrated circuit testing, error detectability, statistics, automatic testing, VLSI design, pseudorandom testing, test responses
20	Yoon-Hwa Choi, Miroslaw Malek	A Fault-Tolerant Systolic Sorter.	IEEE Trans. Computers	1988	DBLP DOI BibTeX RDF	VLSI sorter, fault-tolerant systolic sorter, permanent computation errors, error-checking code, redundant cells, single faulty cell, offline fault-testing, permanent stuck-at faults, testing, fault tolerant computing, reconfiguration, redundancy, integrated circuit testing, sorting, automatic testing, invariants, error detection codes, cellular arrays, algorithm-based fault tolerance, digital integrated circuits, hardware overhead, time overhead
20	Macario Polo Usaola, Pedro Reales Mateo	Mutation Testing Cost Reduction Techniques: A Survey.	IEEE Softw.	2010	DBLP DOI BibTeX RDF	software engineering, testing tools, testing strategies, testing and debugging
20	Ellen Souza 0001, Cristine Gusmão, Julio Venancio	Risk-Based Testing: A Case Study.	ITNG	2010	DBLP DOI BibTeX RDF	Risk-Based Testing, Software Testing, Risk Management, Case Study, Testing Process
20	Etiene Lamas, Erica Ferreira 0001, Marcos Ribeiro do Nascimento, Luiz Alberto Vieira Dias, Fábio Fagundes Silveira	Organizational Testing Management Maturity Model for a Software Product Line.	ITNG	2010	DBLP DOI BibTeX RDF	Maturity Models for Software Testing, Process Management with Testing, Software Testing, Software Product Line, Experimental Software Engineering
20	Shay Artzi, Julian Dolby, Frank Tip, Marco Pistoia	Directed test generation for effective fault localization.	ISSTA	2010	DBLP DOI BibTeX RDF	testing web applications, automated testing, concolic testing
20	Gordon Fraser 0001, Andreas Zeller	Mutation-driven generation of unit tests and oracles.	ISSTA	2010	DBLP DOI BibTeX RDF	unit testing, assertions, test case generation, mutation testing, test oracles, mutation analysis, search based testing
20	Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Ishwar Parulkar	Exploiting Thread-Level Parallelism in Functional Self-Testing of CMT Processors.	ETS	2009	DBLP DOI BibTeX RDF	Chip multithreading, micro-processor testing, functional self-testing, test time optimization, multiprocessors, software-based self-testing
20	Fevzi Belli, Axel Hollmann, Sascha Padberg	Communication Sequence Graphs for Mutation-Oriented Integration Testing.	SSIRI	2009	DBLP DOI BibTeX RDF	communication sequence graphs, Software testing, mutation testing, integration testing
20	Kaarthik Sivashanmugam, Senthil Palanisamy	Testing SQL Server Integration Services Runtime Engine Using Model and Mock Objects.	ITNG	2009	DBLP DOI BibTeX RDF	software testing, software quality, Automatic testing, model based testing, mock objects
20	Ben W. Y. Kam, Thomas R. Dean	Lessons Learned from a Survey of Web Applications Testing.	ITNG	2009	DBLP DOI BibTeX RDF	traditional testing, performance, effectiveness, Web application testing, testing model
20	Zhi Quan Zhou, Arnaldo Sinaga, Lei Zhao, Willy Susilo, Kai-Yuan Cai	Improving Software Testing Cost-Effectiveness through Dynamic Partitioning.	QSIC	2009	DBLP DOI BibTeX RDF	software testing, random testing, partition testing, dynamic partitioning
20	Fei-Ching Kuo	An Indepth Study of Mirror Adaptive Random Testing.	QSIC	2009	DBLP DOI BibTeX RDF	failure detection effectiveness, Software testing, random testing, adaptive random testing, mirroring
20	Lijun Mei, W. K. Chan 0001, T. H. Tse, Robert G. Merkel	Tag-Based Techniques for Black-Box Test Case Prioritization for Service Testing.	QSIC	2009	DBLP DOI BibTeX RDF	black-box regression testing, service testing, encapsulation testing, WS-BPEL, test case prioritization
20	Javier Tuya, José Javier Dolado, María José Suárez Cabal, Claudio de la Riva	A controlled experiment on white-box database testing.	ACM SIGSOFT Softw. Eng. Notes	2008	DBLP DOI BibTeX RDF	SQL testing, software testing, controlled experiment, empirical validation, database testing
20	Sagi Schliesser	An Approach to ERP Testing Using Services.	SwSTE	2007	DBLP DOI BibTeX RDF	ERP testing, Software Testing, Software quality, Automated Testing
20	David C. Keezer, Dany Minier, Patrice Ducharme	Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	control structure reliability, multi-gigahertz testing, picosecond timing accuracy, jitter-tolerance testing, jitter injection, fault tolerance, testing
20	Michael R. Wick, Daniel E. Stevenson, Paul J. Wagner	Using testing and JUnit across the curriculum.	SIGCSE	2005	DBLP DOI BibTeX RDF	unit testing frameworks, testing, unit testing, JUnit