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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 97 occurrences of 83 keywords
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Results
Found 1675 publication records. Showing 1675 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
141 | K. J. Stanley, Timothy D. Stanley, José Maia |
Wafer fabrication: realizing 300mm fab productivity improvements through integrated metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WSC ![In: Proceedings of the 34th Winter Simulation Conference: Exploring New Frontiers, San Diego, California, USA, December 8-11, 2002, pp. 1369-1376, 2002, WSC, 0-7803-7615-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
94 | Yaw-Jen Chang, Yuan Kang, Chin-Liang Hsu, Chi-Tim Chang, Tat Yan Chan |
Virtual Metrology Technique for Semiconductor Manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCNN ![In: Proceedings of the International Joint Conference on Neural Networks, IJCNN 2006, part of the IEEE World Congress on Computational Intelligence, WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006, pp. 5289-5293, 2006, IEEE, 0-7803-9490-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
76 | Fabricio Fishkel, Anath Fischer, Sigal Ar |
Verification of Engineering Models Based on Bipartite Graph Matching for Inspection Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GMP ![In: Geometric Modeling and Processing - GMP 2006, 4th International Conference, Pittsburgh, PA, USA, July 26-28, 2006, Proceedings, pp. 485-499, 2006, Springer, 3-540-36711-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Computational metrology, Reverse engineering, Metrology, Mesh processing, Bipartite graph matching |
69 | José Otero, Luciano Sánchez, Jesús Alcalá-Fdez |
Fuzzy-genetic optimization of the parameters of a low cost system for the optical measurement of several dimensions of vehicles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Soft Comput. ![In: Soft Comput. 12(8), pp. 751-764, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Fuzzy uncertainty, Genetic algorithms, Stereoscopic vision, Metrology, Random sets |
63 | Xiaoming Deng 0001, Fuchao Wu, Yihong Wu 0002, Fuqing Duan |
Visual metrology with uncalibrated radial distorted images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR ![In: 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA, pp. 1-4, 2008, IEEE Computer Society, 978-1-4244-2175-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
63 | Seong-ho Kang, Mitchell W. Pryor, Delbert Tesar |
Kinematic Model and Metrology System for Modular Robot Calibration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICRA ![In: Proceedings of the 2004 IEEE International Conference on Robotics and Automation, ICRA 2004, April 26 - May 1, 2004, New Orleans, LA, USA, pp. 2894-2899, 2004, IEEE. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
63 | Yue-Tsang Chen, Chauchin Su |
Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, pp. 378-382, 1998, IEEE Computer Society, 0-8186-8277-9. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
54 | Christoph Heinzl, Johann Kastner, M. Eduard Gröller |
Surface Extraction from Multi-Material Components for Metrology using Dual Energy CT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Vis. Comput. Graph. ![In: IEEE Trans. Vis. Comput. Graph. 13(6), pp. 1520-1527, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
DECT image fusion, local surface extraction, Dual Energy CT, dimensional measurement, variance comparison, metrology |
47 | Dongtai Liang, Xuanyin Wang |
Planar Visual Metrology using Partition-based Camera Calibration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RAM ![In: 2008 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2008, 21-24 September 2008, Chengdu, China, pp. 205-209, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
47 | Fan-Tien Cheng, Yeh-Tung Chen, Yu-Chuan Su, Deng-Lin Zeng |
Method for Evaluating Reliance Level of a Virtual Metrology System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICRA ![In: 2007 IEEE International Conference on Robotics and Automation, ICRA 2007, 10-14 April 2007, Roma, Italy, pp. 1590-1596, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
47 | Scott C.-H. Huang, Shamila Makki, Niki Pissinou |
Accusation Resolution Using Security Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WASA ![In: Wireless Algorithms, Systems, and Applications, First International Conference, WASA 2006, Xi'an, China, August 15-17, 2006, Proceedings, pp. 435-444, 2006, Springer, 3-540-37189-3. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
47 | Enrico S. Canuto, Fabio Musso |
Embedded Model Control: Application to Interferometric Metrology Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETFA ![In: Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2006, September 20-22, 2006, Diplomat Hotel Prague, Czech Republic, pp. 493-500, 2006, IEEE, 0-7803-9758-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
47 | Alain Abran, Asma Sellami, Witold Suryn |
Metrology, Measurement and Metrics in Software Engineering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE METRICS ![In: 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia, pp. 2-, 2003, IEEE Computer Society, 0-7695-1987-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
47 | B. Muralikrishnan, Kayvan Najarian, J. Raja |
Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (1) ![In: 16th International Conference on Pattern Recognition, ICPR 2002, Quebec, Canada, August 11-15, 2002., pp. 29-32, 2002, IEEE Computer Society, 0-7695-1695-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
47 | Robert Wright II, Marlin Shopbell, Kristin Rust, Silpa Sigireddy |
Wafer fabrication: effects of metrology load port buffering in automated 300mm factories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WSC ![In: Proceedings of the 34th Winter Simulation Conference: Exploring New Frontiers, San Diego, California, USA, December 8-11, 2002, pp. 1359-1364, 2002, WSC, 0-7803-7615-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
39 | Feng Guo 0006, Rama Chellappa |
Video Metrology Using a Single Camera. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 32(7), pp. 1329-1335, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Video metrology, mensuration, rectification |
39 | Yisong Chen, Horace Ho-Shing Ip |
Single view metrology of wide-angle lens images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Vis. Comput. ![In: Vis. Comput. 22(7), pp. 445-455, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Lens distortion correction, Euclidean measurement, Single view metrology, Error analysis |
39 | Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen |
Analog signal metrology for mixed signal ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 194-, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Analog signal metrology, multiple period low-rate sampled waveform, high-rate sampled waveform, DSP based testing, on-chip ADC, 20 MHz, mixed analogue-digital integrated circuits, Signal reconstruction, mixed signal IC |
39 | Heikki Ailisto |
CAD and Vision in Rangefinder-based Dimensional Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
3DIM ![In: International Conference on Recent Advances in 3-D Digital Imaging and Modeling (3DIM '97), May 12-15, 1997, Ottawa, Ontario, Canada, pp. 251-261, 1997, IEEE Computer Society, 0-8186-7943-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
rangefinder-based dimensional metrology, automated 3D measurement, measurement planning, measurement execution, graphical measurement planning tool, automatic optical measurement systems, sensory feedback, performance criteria, CAD, CAD, vision |
33 | Alessandro Schiavi, Fabrizio Mazzoleni, Alessio Facello, Andrea Prato |
Metrology for next generation "Phygital Sensors". ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![In: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2023, Brescia, Italy, June 6-8, 2023, pp. 90-95, 2023, IEEE, 979-8-3503-9657-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
33 | Tamador Salih Saeed |
Metrology for All: Women in Metrology (WIM): 2022 First Forum. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 25(4), pp. 36-37, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
33 | Giada Luppino, Lisa Bosisio, Chiara Conese, Davide Maria Fabris, Marco Tarabini |
Metrology of a Monocular Vision System for Markers Localization and Tracking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0& IoT ![In: IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2022, Trento, Italy, June 7-9, 2022, pp. 6-10, 2022, IEEE, 978-1-6654-1093-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
33 | Wiebke Heeren, Bernd Müller, Gianfranco Miele, Tuukka Mustapää, Daniel Hutzschenreuter, Clifford Brown, Oksana Baer |
SmartCom - Key Findings for Digitalisation in Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![In: IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2021, Rome, Italy, June 7-9, 2021, pp. 364-369, 2021, IEEE, 978-1-6654-1980-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
33 | Maximilian Gruber, Sascha Eichstädt, Julia Neumann, Adrian Paschke |
Semantic Information in Sensor Networks: How to Combine Existing Ontologies, Vocabularies and Data Schemes to Fit a Metrology Use Case. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT, Roma, Italy, June 3-5, 2020, pp. 469-473, 2020, IEEE, 978-1-7281-4892-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
33 | Mark Kuster |
A Measurement Information Infrastructure's Benefits for Industrial Metrology and IoT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT, Roma, Italy, June 3-5, 2020, pp. 479-484, 2020, IEEE, 978-1-7281-4892-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
33 | Roberto Benitez, Roberto Benitez Jr., Cesar Ramirez, Jose A. Vazquez |
Sensors calibration for Metrology 4.0. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![In: 2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, Naples, Italy, June 4-6, 2019, pp. 296-299, 2019, IEEE, 978-1-7281-0429-4. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
33 | Richard Davis 0001 |
Why the Mohs scale remains relevant for metrology [Basic Metrology]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 21(6), pp. 49-51, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
33 | Richard Davis 0001 |
The center of a souffle-metrology in the kitchen [Basic metrology]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 21(4), pp. 39-40, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
33 | Henry Swofford, Ted Vosk |
Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 20(1), pp. 15-19, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
33 | Annarita Lazzari, Jean-Michel Pou, Christopher DuBois, Laurent Leblond |
Smart metrology: the importance of metrology of decisions in the big data era. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 20(6), pp. 22-29, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
33 | Bryan P. Kibble |
Everyday instruments from basic metrology [Basic Metrology]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 18(3), pp. 9-10, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
33 | Alessandro Ferrero, Veronica Scotti |
The story of the right measurement that caused injustice and the wrong measurement that did justice; How to explain the importance of metrology to lawyers and judges [Legal Metrology]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 18(6), pp. 18-19, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
33 | Dongil Kim, Pilsung Kang 0001, Seung-kyung Lee, Seokho Kang 0001, Seungyong Doh, Sungzoon Cho |
Improvement of virtual metrology performance by removing metrology noises in a training dataset. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pattern Anal. Appl. ![In: Pattern Anal. Appl. 18(1), pp. 173-189, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
33 | Thiago de Castro Martins, Marcos de Sales Guerra Tsuzuki, Rogerio Y. Takimoto, Ahmad Barari, Giulliano B. Gallo, Marcos A. A. Garcia, Hamilton Tiba |
Algorithmic iterative sampling in coordinate metrology plan for coordinate metrology using dynamic uncertainty analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
INDIN ![In: 12th IEEE International Conference on Industrial Informatics, INDIN 2014, Porto Alegre, RS, Brazil, July 27-30, 2014, pp. 316-319, 2014, IEEE, 978-1-4799-4905-2. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
33 | Chun Hung Cheng, Dehong Huo, Xi Zhang, Wei Dai 0005, Paul G. Maropoulos |
Large Volume Metrology Process Model: Measurability Analysis with Integration of Metrology Classification Model and Feature-Based Selection Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DET ![In: Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology, DET 2009, Hong Kong, China, December 14.16, 2009, pp. 1013-1026, 2009, Springer, 978-3-642-10429-9. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
33 | Anath Fischer, Raffaello Levi |
Special Issue on Reverse Engineering and Computational Metrology: Part 2 - Computational Metrology Strategies and Methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Inf. Sci. Eng. ![In: J. Comput. Inf. Sci. Eng. 7(1), pp. 1-2, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Tung-Ho Lin, Fan-Tien Cheng, Aeo-Juo Ye, Wei-Ming Wu, Min-Hsiung Hung |
A novel key-variable sifting algorithm for virtual metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICRA ![In: 2008 IEEE International Conference on Robotics and Automation, ICRA 2008, May 19-23, 2008, Pasadena, California, USA, pp. 3636-3641, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
32 | Yu-Chuan Su, Wen-Huang Tsai, Fan-Tien Cheng, Wei-Ming Wu |
Development of a dual-stage virtual metrology architecture for TFT-LCD manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICRA ![In: 2008 IEEE International Conference on Robotics and Automation, ICRA 2008, May 19-23, 2008, Pasadena, California, USA, pp. 3630-3635, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
32 | P. Ravindran, Nicola J. Ferrier, S. M. Park, P. F. Nealey |
Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP (4) ![In: Proceedings of the International Conference on Image Processing, ICIP 2007, September 16-19, 2007, San Antonio, Texas, USA, pp. 329-332, 2007, IEEE, 978-1-4244-1436-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
32 | Bojian Liang, Zezhi Chen, Nick E. Pears |
Uncalibrated Two-View Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (1) ![In: 17th International Conference on Pattern Recognition, ICPR 2004, Cambridge, UK, August 23-26, 2004., pp. 96-99, 2004, IEEE Computer Society, 0-7695-2128-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
32 | Mohammad Saadatseresht, Farhad Samadzadegan, Ali Azizi |
ANN-Based Visibility Prediction for Camera Placement in Vision Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CRV ![In: 1st Canadian Conference on Computer and Robot Vision (CRV 2004) 17-19 May 2004, London, Ontario, Canada, pp. 188-194, 2004, IEEE Computer Society, 0-7695-2127-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
32 | Guanghui Wang 0001, Yihong Wu 0002, Zhanyi Hu |
A Novel Approach for Single View Based Plane Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (2) ![In: 16th International Conference on Pattern Recognition, ICPR 2002, Quebec, Canada, August 11-15, 2002., pp. 556-559, 2002, IEEE Computer Society, 0-7695-1695-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Antonio Criminisi |
Single-View Metrology: Algorithms and Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAGM-Symposium ![In: Pattern Recognition, 24th DAGM Symposium, Zurich, Switzerland, September 16-18, 2002, Proceedings, pp. 224-239, 2002, Springer, 3-540-44209-X. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
32 | Chauchin Su, Yue-Tsang Chen, Chung-Len Lee 0001 |
Analog Metrology and Stimulus Selection in a Noisy Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 233-238, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Mixed Signal and Analog Test |
32 | Ian D. Reid 0001, Andrew Zisserman |
Goal-directed Video Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECCV (2) ![In: Computer Vision - ECCV'96, 4th European Conference on Computer Vision, Cambridge, UK, April 15-18, 1996, Proceedings, Volume II, pp. 647-658, 1996, Springer, 3-540-61123-1. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
31 | Alan M. Lytle, Kamel S. Saidi |
NIST research in autonomous construction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Auton. Robots ![In: Auton. Robots 22(3), pp. 211-221, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Construction visualization, Robotic crane, Indoor positioning and tracking, Parallel kinematic machine, 3D imaging, Construction automation |
31 | Andrea Bondavalli, Andrea Ceccarelli, Lorenzo Falai, Michele Vadursi |
Foundations of Measurement Theory Applied to the Evaluation of Dependability Attributes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: The 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2007, 25-28 June 2007, Edinburgh, UK, Proceedings, pp. 522-533, 2007, IEEE Computer Society, 0-7695-2855-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Duane S. Boning, Karthik Balakrishnan, Hong Cai, Nigel Drego, Ali Farahanchi, Karen Gettings, Daihyun Lim, Ajay Somani, Hayden Taylor, Daniel Truque, Xiaolin Xie |
Variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 15-20, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
31 | Erik Novak, Der-Shen Wan, Paul Unruh, Joanna Schmit |
Dynamic MEMS Measurement Using a Strobed Interferometric System with Combined Coherence Sensing and Phase Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICMENS ![In: 2003 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2003), 20-23 July 2003, Banff, Alberta, Canada, pp. 285-, 2003, IEEE Computer Society, 0-7695-1947-4. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
22 | José R. Villar 0001, Adolfo Otero, José Otero, Luciano Sánchez |
Taximeter verification with GPS and soft computing techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Soft Comput. ![In: Soft Comput. 14(4), pp. 405-418, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Vague data, Fuzzy fitness function, Genetic algorithms, GPS, Fuzzy systems, Metrology |
22 | Jeff Klingner |
The pupillometric precision of a remote video eye tracker. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETRA ![In: Proceedings of the 2010 Symposium on Eye-Tracking Research & Applications, ETRA 2010, Austin, Texas, USA, March 22-24, 2010, pp. 259-262, 2010, ACM, 978-1-60558-994-7. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
pupillometry, eye tracking, metrology, pupil |
22 | Tong Tu, Wooi-Boon Goh |
Using CCD Moiré Pattern Analysis to Implement Pressure-Sensitive Touch Surfaces. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CAIP ![In: Computer Analysis of Images and Patterns, 13th International Conference, CAIP 2009, Münster, Germany, September 2-4, 2009. Proceedings, pp. 1228-1235, 2009, Springer, 978-3-642-03766-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Moiré patterns, Image-based metrology, Surface deformation analysis, Human computer interface, Vision-based interface |
22 | Prosenjit Bose, Pat Morin |
Testing the Quality of Manufactured Disks and Balls. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Algorithmica ![In: Algorithmica 38(1), pp. 161-177, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Tolerancing metrology, Guaranteed quality, Testing, Sampling, Quality assurance, Roundness, Disks, Spheres, Cylinders |
22 | Sotiris Malassiotis, Michael G. Strintzis |
Stereo vision system for precision dimensional inspection of 3D holes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 15(2), pp. 101-113, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Knowledge-based vision, Stereoscopic matching, Metallic surfaces, Inspection, Metrology |
22 | John Horst, Thomas R. Kramer, Keith Stouffer, Joseph Falco, Hui-Min Huang, Frederick M. Proctor, Albert Wavering |
Distributed Testing of an Equipment-Level Interface Specification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Object-Oriented Real-Time Distributed Computing ![In: 5th International Symposiun on Object Oriented Real-Time Distributed Computing, ISORC 2002, Washington, DC, USA, April 29 - May 1, 2002, pp. 330-340, 2002, IEEE Computer Society, 0-7695-1558-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
coordinate measuring machine, real-time systems, object-oriented, conformance test, test suite, distributed testing, interface specifications, metrology, validation test |
22 | Derek C. Stanford, Adrian E. Raftery |
Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 22(6), pp. 601-609, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
CEM algorithm, spatial point process, visual defect metrology, EM algorithm, smoothing, Hough transform, model-based clustering, earthquake, BIC, Bayes factor |
22 | Olivier Devillers, Franco P. Preparata |
Evaluating the cylindricity of a nominally cylindrical point set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SODA ![In: Proceedings of the Eleventh Annual ACM-SIAM Symposium on Discrete Algorithms, January 9-11, 2000, San Francisco, CA, USA., pp. 518-527, 2000, ACM/SIAM, 0-89871-453-2. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP BibTeX RDF |
cylindricity, minimum cyclinder, zone cylinder, roundness, metrology |
22 | Wen-Jean Hsueh, Erik K. Antonsson |
Automatic high-resolution optoelectronic photogrammetric 3D surface geometry acquisition system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 10(3), pp. 98-113, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Range-finding, Triangulation, Active vision, Photogrammetry, Metrology |
22 | Lawrence O'Gorman |
Subpixel Precision of Straight-Edged Shapes for Registration and Measurement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 18(7), pp. 746-751, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
fiducial marks, subpixel precision, image processing, Registration, machine vision, precision, metrology |
22 | Aldo Cumani, Antonio Guiducci |
Geometric camery calibration: the virtual camera approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 8(6), pp. 375-384, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
Computer vision, Camera calibration, Metrology, Lens distortion |
22 | M. Y. Amirat, Jean Pontnau, Francis Artigue |
A three-dimensional measurement system for robot applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Intell. Robotic Syst. ![In: J. Intell. Robotic Syst. 9(3), pp. 291-299, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
Robot calibration, vision sensor, 3D dynamic metrology, noncontacting sensor, Euler angles, external position sensor |
16 | Yifan Xie, Tianhui Wang, Young-Seon Jeong 0001, Ali Tosyali, Myong K. Jeong |
True sparse PCA for reducing the number of essential sensors in virtual metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Prod. Res. ![In: Int. J. Prod. Res. 62(6), pp. 2142-2157, March 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Philipp Euringer, Gerald Hechenblaikner, Francis Soualle, Walter Fichter |
Performance Analysis of Sequential Carrier- and Code-Tracking Receivers in the Context of High-Precision Spaceborne Metrology Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 73, pp. 1-10, 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Wenwen Tian, Jiong Zhang, Fei Zhao, Gedong Jiang, Xuesong Mei, Guangde Chen, Hao Wang 0048 |
A Novel Fuzzy Echo State Broad Learning System for Surface Roughness Virtual Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Ind. Informatics ![In: IEEE Trans. Ind. Informatics 20(3), pp. 3756-3766, March 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
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16 | Mark O. Neisser, Ndubuisi G. Orji, Harry J. Levinson, Umberto Celano, James R. Moyne, Supika Mashiro, Dan Wilcox, Slava Libman |
How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 57(1), pp. 51-58, January 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Pavol Kajánek, Alojz Kopácik, Peter Kyrinovic, Ján Erdélyi, Marián Marcis, Marek Frastia |
Metrology of Short-Length Measurers - Development of a Comparator for the Calibration of Measurers Based on Image Processing and Interferometric Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 24(5), pp. 1573, March 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
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16 | Clayton Forssén, Isak Silander, Johan Zakrisson, Eynas Amer, Dávid Szabó, Thomas Bock, André Kussike, Tom Rubin, Domenico Mari, Stefano Pasqualin, Zaccaria Silvestri, Djilali Bentouati, Ove Axner, Martin Zelan |
Demonstration of a Transportable Fabry-Pérot Refractometer by a Ring-Type Comparison of Dead-Weight Pressure Balances at Four European National Metrology Institutes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 24(1), pp. 7, 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Andrey Tsapalov, Konstantin Kovler |
Metrology for Indoor Radon Measurements and Requirements for Different Types of Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 24(2), pp. 504, January 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Kartikay Tehlan, Michele Bissolo, Riccardo Silvioli, Johannes Oberreuter, Andreas Stier, Nassir Navab, Thomas Wendler 0001 |
Magnetisation Reconstruction for Quantum Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Bildverarbeitung für die Medizin ![In: Bildverarbeitung für die Medizin 2024 - Proceedings, German Conference on Medical Image Computing, Erlangen, March 10-12, 2024, pp. 166-171, 2024, Springer, 978-3-658-44036-7. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Kunal Sinha, Rajas Dalvi, M. Girish Chandra, Sourav Chatterjee |
MetQuan - A Comprehensive Toolkit for Variational Quantum Sensing and Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMSNETS ![In: 16th International Conference on COMmunication Systems & NETworkS, COMSNETS 2024, Bengaluru, India, January 3-7, 2024, pp. 1082-1087, 2024, IEEE, 979-8-3503-8311-9. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
16 | Yongjiang Huang, Xixiang Liu, Qiantong Shao, Zixuan Wang |
Virtual Metrology Filter-Based Algorithms for Estimating Constant Ocean Current Velocity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 15(16), pp. 4097, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Janusz Kaczmarek, Massimo Ortolano, Oliver Power, Jan Kucera 0001, Luca Callegaro, Vincenzo D'Elia, Martina Marzano, Robert Walsh, Miroslaw Koziol, Ryszard Rybski |
Virtual Training Laboratory for Primary Impedance Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 72, pp. 1-12, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Simone Donadello, Elio K. Bertacco, Davide Calonico, Cecilia Clivati |
Embedded Digital Phase Noise Analyzer for Optical Frequency Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 72, pp. 1-12, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Atasi Chatterjee, Mattias Kruskopf, Martin Götz, Yefei Yin, Eckart Pesel, Pierre Gournay, Benjamin Rolland, Jan Kucera 0001, Stephan Bauer, Klaus Pierz, Bernhard Schumacher, Hansjörg Scherer |
Performance and Stability Assessment of Graphene-Based Quantum Hall Devices for Resistance Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 72, pp. 1-6, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Muhammad Azwan Ibrahim, Faizan Qamar, Zarina Shukur, Nasharuddin Zainal, Nazri Marzuki, Maria Ulfah Siregar |
Formalizing Attack Tree on Security Object for MySANi in Legal Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Syst. ![In: Syst. 11(1), pp. 49, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Daniel Gauder, Johannes Gölz, Niels Jung, Gisela Lanza |
Development of an adaptive quality control loop in micro-production using machine learning, analytical gear simulation, and inline focus variation metrology for zero defect manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Ind. ![In: Comput. Ind. 144, pp. 103799, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Dong-Joon Lim, Sangjin Kim, Uijong Hwang, Sanghun Jeong, Dongwook Kim, Yeolib Kim |
Development of a virtual metrology system for smart manufacturing: A case study of spandex fiber production. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Ind. ![In: Comput. Ind. 145, pp. 103825, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | David Macii |
Basics of Industrial Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 26(6), pp. 5-12, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Akshay Agarwal, Minxu Peng, Vivek K. Goyal |
Continuous-Time Modeling and Analysis of Particle Beam Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Sel. Areas Inf. Theory ![In: IEEE J. Sel. Areas Inf. Theory 4, pp. 61-74, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Jia-Xuan Liu, Jing Yang, Hai-Long Shi, Sixia Yu |
Optimal Local Measurements in Many-body Quantum Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2310.00285, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Jing Yang |
Theory of Compression Channels for Post-selected Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2311.06679, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray 0002, Sandip Halder |
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2312.09462, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Angzhi Fan, Yu Huang 0017, Fei Xu, Sthitie Bom |
Soft Sensing Regression Model: from Sensor to Wafer Metrology Forecasting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2301.08974, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Donatien Koulla Moulla, Ernest Mnkandla, Alain Abran |
Evaluation of IoT Measurement Solutions from a Metrology Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Syst. Sci. Eng. ![In: Comput. Syst. Sci. Eng. 47(2), pp. 2455-2479, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Mankei Tsang |
Operational meanings of a generalized conditional expectation in quantum metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Quantum ![In: Quantum 7, pp. 1162, November 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Masahito Hayashi, Yingkai Ouyang |
Tight Cramér-Rao type bounds for multiparameter quantum metrology through conic programming. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Quantum ![In: Quantum 7, pp. 1094, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Anna A. Dedkova, Igor V. Florinsky |
Geomorphometry and microelectronic metrology: Converged realms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Trans. GIS ![In: Trans. GIS 27(6), pp. 1642-1661, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Naoki Takegawa, Noriyuki Furuichi |
Traceability Management System Using Blockchain Technology and Cost Estimation in the Metrology Field. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(3), pp. 1673, February 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
16 | Angzhi Fan, Yu Huang 0017, Fei Xu, Sthitie Bom |
Soft-Sensing Regression Model: From Sensor to Wafer Metrology Forecasting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(20), pp. 8363, October 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Michael Fahrbach, Min Xu, Wilson Ombati Nyang'au, Oleg Domanov, Christian H. Schwalb, Zhi Li, Christian Kuhlmann 0003, Uwe Brand, Erwin Peiner |
Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(4), pp. 2003, February 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Patrick Frank |
LiG Metrology, Correlated Error, and the Integrity of the Global Surface Air-Temperature Record. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(13), pp. 5976, July 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Jie Wang 0042, Richard Chang 0002, Ziyuan Zhao, Ramanpreet Singh Pahwa |
Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(12), pp. 5470, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Carl Johan G. Nielsen, André Preumont |
Adaptive Petal Reflector: In-Lab Software Configurable Optical Testing System Metrology and Modal Wavefront Reconstruction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(17), pp. 7316, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Yonggang Yan, Zhengxing Wu, Jianjun Cui, Kai Chen, Yanhong Tang, Ning Yang |
Calibration Model Optimization for Strain Metrology of Equal Strength Beams Using Deflection Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(6), pp. 3059, March 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Damir Malnar, Miroslav Vrankic |
Optimising Time-Frequency Distributions: A Surface Metrology Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(13), pp. 5804, July 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Chen-Fu Chien 0001, Tran Hong Van Nguyen, Yi-Chiu Li, Ying-Jen Chen |
Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Ind. Eng. ![In: Comput. Ind. Eng. 182, pp. 109421, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Chia-Yu Hsu, Yi-Wei Lu |
Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Ind. Eng. ![In: Comput. Ind. Eng. 186, pp. 109701, December 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Richard Chang 0002, Wang Jie, Namrata Thakur, Ramanpreet Singh Pahwa |
AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans. ![Search on Bibsonomy](Pics/bibsonomy.png) |
World Sci. Annu. Rev. Artif. Intell. ![In: World Sci. Annu. Rev. Artif. Intell. 1, pp. 2440002:1-2440002:31, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | |
2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2023, Brescia, Italy, June 6-8, 2023 ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![IEEE, 979-8-3503-9657-7 The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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16 | Marko Esche, Levin Ho, Martin Nischwitz, Reinhard Meyer |
Risk-Based Continuous Quality Control for Software in Legal Metrology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FedCSIS ![In: Proceedings of the 18th Conference on Computer Science and Intelligence Systems, FedCSIS 2023, Warsaw, Poland, September 17-20, 2023., pp. 451-461, 2023, 978-83-967447-8-4. The full citation details ...](Pics/full.jpeg) |
2023 |
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