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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
75 | Rudolf Ramler |
The impact of product development on the lifecycle of defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 21-25, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect lifecycle, product development |
70 | Norihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue |
Retrieving similar code fragments based on identifier similarity for defect detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 41-42, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
69 | Mika Mäntylä, Casper Lassenius |
What Types of Defects Are Really Discovered in Code Reviews? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 35(3), pp. 430-448, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
68 | Talha Javed, Manzil e Maqsood, Qaiser S. Durrani |
A study to investigate the impact of requirements instability on software defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 29(3), pp. 1-7, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
change request (CR's)1, high/medium/low change requests, pre/post release changes, severity-1/severity-2 defects, defects, requirements change |
68 | Gerard A. Allan, Anthony J. Walton |
Efficient critical area estimation for arbitrary defect shapes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France, pp. 20-28, 1997, IEEE Computer Society, 0-8186-8168-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
critical area estimation, arbitrary defect shapes, circular defects, elliptical defects, rod shaped defects, arbitrary shaped defects, Edinburgh Yield Estimator, Cadence layout editor, EYE-sampling tool, EYE, EYES, integrated circuit yield, IC layout |
67 | Ian Pyle |
Quality in Software Based Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECBS ![In: IEEE Symposium and Workshop on Engineering of Computer Based Systems (ECBS'96), March 11-15, 1996, Friedrichshafen, Germany., pp. 214-, 1996, IEEE Computer Society, 0-8186-7355-9. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
software, Quality, process, production, risk, defects, checking |
66 | Stefan Wagner 0001 |
Defect classification and defect types revisited. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 39-40, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect taxonomy, defect types, faults, defects, bugs, defect classification |
66 | Nathaniel Ayewah, William W. Pugh |
A report on a survey and study of static analysis users. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 1-5, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Java, static analysis, software quality, bugs, false positives, software defects, FindBugs, bug patterns |
64 | Timea Illes-Seifert, Barbara Paech |
Exploring the relationship of history characteristics and defect count: an empirical study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 11-15, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect database, versioning systems, empirical study |
64 | Haihua Yan, Adit D. Singh |
A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India, pp. 47-52, 2005, IEEE Computer Society, 0-7695-2264-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
62 | Vinay Dabholkar, Sreejit Chakravarty |
Computing stress tests for interconnect defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 143-148, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
interconnect defects, reliability screens, infant mortality, gate-oxide defects, integrated circuit testing, stress tests |
60 | Gertrude Neuman Levine |
Defining defects, errors, and service degradations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 34(2), pp. 1-14, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
service degradation, errors, failure, defects |
60 | Md. Atiqul Islam, Shamim Akhter, Tamnun E. Mursalin, M. Ashraful Amin |
A Suitable Neural Network to Detect Textile Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICONIP (2) ![In: Neural Information Processing, 13th International Conference, ICONIP 2006, Hong Kong, China, October 3-6, 2006, Proceedings, Part II, pp. 430-438, 2006, Springer, 3-540-46481-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Textile defects, threshold decision tree, multi-layer neural networks, resilient back propagation, cross validation |
58 | Per Runeson, Måns Holmstedt Jönsson, Fredrik Scheja |
Are Found Defects an Indicator of Software Correctness? An Investigation in a Controlled Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 15th International Symposium on Software Reliability Engineering (ISSRE 2004), 2-5 November 2004, Saint-Malo, Bretagne, France, pp. 91-100, 2004, IEEE Computer Society, 0-7695-2215-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
57 | Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita |
On the Evaluation of Arbitrary Defect Coverage of Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 17th IEEE VLSI Test Symposium (VTS '99), 25-30 April 1999, San Diego, CA, USA, pp. 426-432, 1999, IEEE Computer Society, 0-7695-0146-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Fault Modeling & Simulation, Arbitrary Defects, Vector-Independent and Vector-Dependent Defects |
57 | Jaume A. Segura 0001, Miquel Roca 0001, Diego Mateo, Antonio Rubio 0001 |
An approach to dynamic power consumption current testing of CMOS ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 95-100, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
dynamic power consumption current testing, logic behavior, parametric defect, quiescent power supply current testing, consumption current testing time, on-chip sensor, static power consumption, fault diagnosis, logic testing, integrated circuit testing, automatic testing, adders, CMOS logic circuits, I/sub DDQ/ testing, CMOS ICs, full adders, open defects, electric current measurement, bridging defects, transient current |
57 | Jian Liu, Rafic Z. Makki |
Power supply current detectability of SRAM defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 367-, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
short-circuit currents, fault currents, power supply circuits, power supply current detectability, SRAM defects, SRAM cell, power supply current, I/sub DDQ/, quiescent power supply current, i/sub DDT/, transient power supply current, shorts, disturb-type pattern sensitivity, total current leakage, SRAM size, current detectability, large circuit effects, simulation, fault diagnosis, leakage currents, transients, SRAM chips, open defects, electric current measurement, physical defect |
54 | Roberto N. de Mesquita, Daniel K. S. Ting, Eduardo L. L. Cabral, Belle R. Upadhyaya |
Classification of Steam Generator Tube Defects for Real-Time Applications Using Eddy Current Test Data and Self-Organizing Maps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Real Time Syst. ![In: Real Time Syst. 27(1), pp. 49-70, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
eddy current, tube defects, nuclear plant, self-organizing map |
53 | Sylvie Trudel, Alain Abran |
Improving Quality of Functional Requirements by Measuring Their Functional Size. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWSM/Metrikon/Mensura ![In: Software Process and Product Measurement, International Conferences: IWSM 2008, Metrikon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008. Proceedings, pp. 287-301, 2008, Springer, 978-3-540-89402-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
inspection, review, FSM, Functional requirements, Functional size measurement, COSMIC |
52 | Sandeep Kumar Goel, Krishnendu Chakrabarty |
Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 161-184, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
52 | Sandeep Kumar Goel, Narendra Devta-Prasanna |
Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 147-160, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
52 | Nisar Ahmed, Mohammad Tehranipoor |
Faster-than-at-Speed Test for Screening Small-Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 73-94, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
52 | Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann 0001 (eds.) |
Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![ACM, 978-1-60558-051-7 The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
52 | Elaine J. Weyuker, Thomas J. Ostrand |
Comparing methods to identify defect reports in a change management database. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 27-31, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
52 | Yasuhiro Hayase, Yii Yong Lee, Katsuro Inoue |
A criterion for filtering code clone related bugs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 37-38, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect mining, code clone |
52 | Chadd C. Williams, Jaime Spacco |
SZZ revisited: verifying when changes induce fixes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 32-36, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
52 | Yue Jiang 0001, Bojan Cukic, Tim Menzies |
Can data transformation help in the detection of fault-prone modules? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 16-20, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
52 | Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue |
Predicting fault-prone modules based on metrics transitions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 6-10, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
52 | Min Zhang 0008, Tracy Hall, Nathan Baddoo, Paul Wernick |
Do bad smells indicate "trouble" in code? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 43-44, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
bad smells, open source, faults |
52 | Burak Turhan, Ayse Basar Bener, Tim Menzies |
Nearest neighbor sampling for cross company defect predictors: abstract only. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DEFECTS ![In: Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008, pp. 26, 2008, ACM, 978-1-60558-051-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
52 | Zude Li, Mechelle Gittens, Syed Shariyar Murtaza, Nazim H. Madhavji, Andriy V. Miranskyy, David Godwin, Enzo Cialini |
Analysis of pervasive multiple-component defects in a large software system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 25th IEEE International Conference on Software Maintenance (ICSM 2009), September 20-26, 2009, Edmonton, Alberta, Canada, pp. 265-273, 2009, IEEE Computer Society, 978-1-4244-4897-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
52 | Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede |
Systematic Defects in Deep Sub-Micron Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 290-299, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
51 | Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki |
Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCV ![In: Procedings of the Fifth International Conference on Computer Vision (ICCV 95), Massachusetts Institute of Technology, Cambridge, Massachusetts, USA, June 20-23, 1995, pp. 575-582, 1995, IEEE Computer Society, 0-8186-7042-8. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
printed circuit layout, X-ray applications, real time X-ray inspection, real-time X-ray inspection, 3D defect, 3-D defects, circuit board patterns, three dimensional defects, fine PCB patterns, sphere surface, X-ray detector, defect detection algorithm, heavy shading, real-time systems, feature extraction, feature extraction, signal processing, inspection, circuit analysis computing, X-ray images, printed circuit board, printed circuit testing, perspective transform, intensity variation, defect detection techniques |
48 | Naouel Moha |
Detection and correction of design defects in object-oriented designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOPSLA Companion ![In: Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada, pp. 949-950, 2007, ACM, 978-1-59593-865-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
specification, refactorings, detection, correction, meta-modelling, code smells, antipatterns, design defects |
48 | Josh Yang, Baosheng Wang, André Ivanov |
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 493-498, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
6T SRAM, Area Penalty, Write Recovery, Memory testing, Test Time, Open Defects |
47 | Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren |
Automatic Detection of In-field eld Defect Growth in Image Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 305-313, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
47 | Christian F. J. Lange |
Improving the quality of UML models in practice. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 28th International Conference on Software Engineering (ICSE 2006), Shanghai, China, May 20-28, 2006, pp. 993-996, 2006, ACM, 1-59593-375-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
UML, consistency, quality, completeness, defect detection |
46 | Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker 0001 |
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2), pp. 327-338, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
46 | Jacek Ratzinger, Martin Pinzger 0001, Harald C. Gall |
EQ-Mine: Predicting Short-Term Defects for Software Evolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FASE ![In: Fundamental Approaches to Software Engineering, 10th International Conference, FASE 2007, Held as Part of the Joint European Conferences, on Theory and Practice of Software, ETAPS 2007, Braga, Portugal, March 24 - April 1, 2007, Proceedings, pp. 12-26, 2007, Springer, 978-3-540-71288-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Quality Prediction, Machine Learning, Classification, Software Evolution, Regression, Defect Density |
46 | Jin-Cherng Lin, Kuo-Chiang Wu |
Digging High Risk Defects Out in Software Engineering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Intelligent Information Processing ![In: Intelligent Information Processing III, IFIP TC12 International Conference on Intelligent Information Processing (IIP 2006), September 20-23, Adelaide, Australia, pp. 549-554, 2006, Springer, 978-0-387-44639-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Prime Components Analysis (PCA), Discriminate Analysis (DA) |
46 | Christian F. J. Lange, Michel R. V. Chaudron |
Effects of defects in UML models: an experimental investigation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 28th International Conference on Software Engineering (ICSE 2006), Shanghai, China, May 20-28, 2006, pp. 401-411, 2006, ACM, 1-59593-375-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
UML, consistency, completeness, defect detection |
46 | Per Runeson, Anneliese Amschler Andrews |
Detection or Isolation of Defects? An Experimental Comparison of Unit Testing and Code Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 14th International Symposium on Software Reliability Engineering (ISSRE 2003), 17-20 November 2003, Denver, CO, USA, pp. 3-13, 2003, IEEE Computer Society, 0-7695-2007-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Defect isolation, Empirical Study, Unit testing, Controlled Experiment, Defect detection, Code Inspection |
46 | Rani S. Ghaida, Payman Zarkesh-Ha |
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 25(1), pp. 67-77, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Layout sensitivity, Narrow defects, Electromigration, Critical area, Yield prediction, Yield modeling, Spot defects |
43 | Hong-Dar Lin, Singa Wang Chiu |
Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PSIVT ![In: Advances in Image and Video Technology, First Pacific Rim Symposium, PSIVT 2006, Hsinchu, Taiwan, December 10-13, 2006, Proceedings, pp. 442-452, 2006, Springer, 3-540-68297-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
MURA-type defects, Hotelling T2 statistics, Ant colony algorithm, Computer vision system, Back propagation network |
43 | Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker 0001 |
The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 171-178, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Very-Low-Voltage testing, Resistive short defects |
43 | Vitoantonio Bevilacqua, Lucia Cariello, Giuseppe Mastronardi, Vito Palmieri, Marco Giannini |
Defects Identification in Textile by Means of Artificial Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIC (2) ![In: Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence, 4th International Conference on Intelligent Computing, ICIC 2008, Shanghai, China, September 15-18, 2008, Proceedings, pp. 1166-1174, 2008, Springer, 978-3-540-85983-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
texture defects identification, error back propagation algorithm, artificial neural networks, vision system |
43 | Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor |
Test-Pattern Grading and Pattern Selection for Small-Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 233-239, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Small-delay defects, pattern grading, pattern selection, ATPG |
43 | Naouel Moha, Yann-Gaël Guéhéneuc, Anne-Françoise Le Meur, Laurence Duchien |
A Domain Analysis to Specify Design Defects and Generate Detection Algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FASE ![In: Fundamental Approaches to Software Engineering, 11th International Conference, FASE 2008, Held as Part of the Joint European Conferences on Theory and Practice of Software, ETAPS 2008, Budapest, Hungary, March 29-April 6, 2008. Proceedings, pp. 276-291, 2008, Springer, 978-3-540-78742-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
algorithm generation, Java, domain-specific language, detection, code smells, antipatterns, Design defects |
43 | Naouel Moha, Yann-Gaël Guéhéneuc |
Decor: a tool for the detection of design defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007), November 5-9, 2007, Atlanta, Georgia, USA, pp. 527-528, 2007, ACM, 978-1-59593-882-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
algorithm generation, java, domain-specific language, detection, code smells, antipatterns, design defects |
43 | Ketan Mehta, T. J. Jankun-Kelly |
Detection and Visualization of Defects in 3D Unstructured Models of Nematic Liquid Crystals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Vis. Comput. Graph. ![In: IEEE Trans. Vis. Comput. Graph. 12(5), pp. 1045-1052, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
disclination, nematic liquid crystal, feature extraction, scientific visualization, defects, unstructured grid |
43 | Xusheng Yuan, Qingxi Hu, Hanqiang Liu 0002, Chunxiang Dai, Minglun Fang |
Modeling Technology and Application of Repairing Bone Defects Based on Rapid Prototyping. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PROLAMAT ![In: Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management, Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15-17, 2006, Shanghai, China, pp. 643-649, 2006, Springer, 0-387-34402-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
bone defects, bionic scaffold, rapid prototyping, surface reconstruction, tissue engineering |
43 | Naouel Moha, Jihene Rezgui, Yann-Gaël Guéhéneuc, Petko Valtchev, Ghizlane El-Boussaidi |
Using FCA to Suggest Refactorings to Correct Design Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CLA ![In: Concept Lattices and Their Applications, Fourth International Conference, CLA 2006, Tunis, Tunisia, October 30 - November 1, 2006, Selected Papers, pp. 269-275, 2006, Springer, 978-3-540-78920-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Refactoring, Formal Concept Analysis, Design Defects |
43 | Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker 0001 |
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 266-271, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Temperature testing, Resistive defects, Early-life failures, Low-voltage testing |
43 | Zaid Al-Ars, Ad J. van de Goor |
Static and Dynamic Behavior of Memory Cell Array Spot Defects in Embedded DRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 52(3), pp. 293-309, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
dynamic faulty behavior, functional fault models, defect simulation, spot defects, Embedded DRAM, fault primitives |
43 | Yann-Gaël Guéhéneuc, Hervé Albin-Amiot |
Using Design Patterns and Constraints to Automate the Detection and Correction of Inter-Class Design Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TOOLS (39) ![In: 39th International Conference and Exhibition on Technology of Object-Oriented Languages and Systems, TOOLS USA 2001, Santa Barbara, CA, USA, July 29 - August 3, 2001, pp. 296-306, 2001, IEEE Computer Society, 0-7695-1251-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
design patterns, constraints, source code transformation, design defects, OO design |
43 | Srikanth Venkataraman, Scott Brady Drummonds |
A Technique for Logic Fault Diagnosis of Interconnect Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 313-318, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Diagnosis and Debugging, Logic Fault Diagnosis, Interconnect Open Defects, Fault Modeling and Simulation, Dynamic Diagnosis |
43 | Mayuram S. Krishnan, Marc I. Kellner |
Measuring Process Consistency: Implications for Reducing Software Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 25(6), pp. 800-815, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Software process consistency, CMM, software defects, empirical model, software process measurement |
41 | Duncan M. Hank Walker |
K Longest Paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 23-48, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
41 | Sudhakar M. Reddy, Peter Maxwell |
Fundamentals of Small-Delay Defect Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 1-22, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
41 | Mahmut Yilmaz |
Output Deviations-Based SDD Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 119-146, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
41 | Narendra Devta-Prasanna, Sandeep Kumar Goel |
Small-Delay Defect Coverage Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 185-210, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
41 | Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor |
Circuit Path Grading Considering Layout, Process Variations, and Cross Talk. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 95-118, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
41 | Mark Kassab, Benoit Nadeau-Dostie, Xijiang Lin |
Timing-Aware ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ![In: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits., pp. 49-72, 2014, CRC Press, 978-1-439-82941-7. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
41 | Ajit Ashok Shenvi |
Defect prevention with orthogonal defect classification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISEC ![In: Proceeding of the 2nd Annual India Software Engineering Conference, ISEC 2009, Pune, India, February 23-26, 2009, pp. 83-88, 2009, ACM, 978-1-60558-426-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
odc, algorithm, interface, timing, documentation, function, assignment, car, checking |
41 | Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham |
Small-Delay Defect Detection in the Presence of Process Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 711-716, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
41 | Abhishek Singh 0001, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel |
Defect Simulation Methodology for iDDT Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(3), pp. 255-272, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
iDDT, transient current testing, device testing, ATPG, fault simulation, IDDQ, defect simulation, defect-based test |
41 | Beatriz Bernárdez 0001, Marcela Genero, Amador Durán 0001, Miguel Toro |
A Controlled Experiment for Evaluating a Metric-Based Reading Technique for Requirements Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE METRICS ![In: 10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA, pp. 257-268, 2004, IEEE Computer Society, 0-7695-2129-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
requirements verification, metrics, use cases, empirical validation, reading techniques |
40 | Edoardo Ardizzone, Andrea de Polo, Haris Dindo, Giuseppe Mazzola, C. Nanni |
A Dual Taxonomy for Defects in Digitized Historical Photos. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDAR ![In: 10th International Conference on Document Analysis and Recognition, ICDAR 2009, Barcelona, Spain, 26-29 July 2009, pp. 1166-1170, 2009, IEEE Computer Society, 978-0-7695-3725-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
40 | Mario I. Chacon, Juan I. Nevarez, Jose Rivera |
Recognition of Natural and Non-Natural Defects Presented in Ophthalmic Lenses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCNN ![In: Proceedings of the International Joint Conference on Neural Networks, IJCNN 2007, Celebrating 20 years of neural networks, Orlando, Florida, USA, August 12-17, 2007, pp. 789-794, 2007, IEEE, 978-1-4244-1379-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
40 | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
Test Generation for Open Defects in CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 41-49, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Dmitry Chetverikov |
Structural Defects: General Approach and Application to Textile Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR ![In: 15th International Conference on Pattern Recognition, ICPR'00, Barcelona, Spain, September 3-8, 2000., pp. 1521-1524, 2000, IEEE Computer Society, 0-7695-0750-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
40 | Abderrahim Doumar, Hideo Ito |
Design of Switching Blocks Tolerating Defects/Faults in FPGA Interconnection Resources. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings, pp. 134-142, 2000, IEEE Computer Society, 0-7695-0719-0. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
40 | Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey |
On the development of power supply voltage control testing technique for analogue circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 133-139, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
power supply circuits, voltage control, power supply voltage control testing, hard defects, soft defects, simulation, fault diagnosis, integrated circuit testing, data analysis, data analysis, circuit analysis computing, operational amplifiers, operational amplifier, analogue integrated circuits, IC tests, analogue circuits |
39 | Phil Nigh |
Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 86-87, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
latent defects, reliability defects, latent-defect screening, defect acceleration, DPPM, burn-in |
37 | Arbi Ghazarian |
A Case Study of Defect Introduction Mechanisms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CAiSE ![In: Advanced Information Systems Engineering, 21st International Conference, CAiSE 2009, Amsterdam, The Netherlands, June 8-12, 2009. Proceedings, pp. 156-170, 2009, Springer, 978-3-642-02143-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Defects Sources, Defect Root Cause Analysis, Case Study |
37 | Olusegun Akinwale, Sergiu M. Dascalu, Marcel Karam |
DuoTracker: Tool Support for Software Defect Data Collection and Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the International Conference on Software Engineering Advances (ICSEA 2006), October 28 - November 2, 2006, Papeete, Tahiti, French Polynesia, pp. 22, 2006, IEEE Computer Society, 0-7695-2703-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
software anomalies, CMM, software defects, defect classification, ISO-9001, PSP |
37 | Taiga Nakamura, Lorin Hochstein, Victor R. Basili |
Identifying domain-specific defect classes using inspections and change history. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2006 International Symposium on Empirical Software Engineering (ISESE 2006), September 21-22, 2006, Rio de Janeiro, Brazil, pp. 346-355, 2006, ACM, 1-59593-218-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
change history, domain specific defects, inspection, code reading |
37 | Thomas S. Barnett, Adit D. Singh, Victor P. Nelson |
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 29-38, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
infant mortality, negative binomial distribution, clustering, reliability, redundancy, yield, defects, defect tolerance, burn-in |
37 | Naouel Moha, Amine Rouane Hacene, Petko Valtchev, Yann-Gaël Guéhéneuc |
Refactorings of Design Defects Using Relational Concept Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICFCA ![In: Formal Concept Analysis, 6th International Conference, ICFCA 2008, Montreal, Canada, February 25-28, 2008, Proceedings, pp. 289-304, 2008, Springer, 978-3-540-78136-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Relational Concept Analysis, Refactoring, Design Defects |
37 | Keld Raaschou, Austen W. Rainer |
Exposure model for prediction of number of customer reported defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Second International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, October 9-10, 2008, Kaiserslautern, Germany, pp. 306-308, 2008, ACM, 978-1-59593-971-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
estimation of field defects, exposure model, prediction |
37 | Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng |
Automatic Test Pattern Generation for Interconnect Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 181-186, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Interconnect opens, Open-via defects, ATPG |
37 | Fei Su, William L. Hwang, Arindam Mukherjee 0001, Krishnendu Chakrabarty |
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(2-3), pp. 219-233, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
testing, diagnosis, fault modeling, defects, microfluidics, biochips, biosensors |
37 | Naouel Moha, Yann-Gaël Guéhéneuc |
PTIDEJ and DECOR: identification of design patterns and design defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOPSLA Companion ![In: Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada, pp. 868-869, 2007, ACM, 978-1-59593-865-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Java, design patterns, detection, meta-modelling, antipatterns, design defects |
37 | Romeu Ricardo da Silva, Domingo Mery |
Accuracy Estimation of Detection of Casting Defects in X-Ray Images Using Some Statistical Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PSIVT ![In: Advances in Image and Video Technology, Second Pacific Rim Symposium, PSIVT 2007, Santiago, Chile, December 17-19, 2007, Proceedings, pp. 639-650, 2007, Springer, 978-3-540-77128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Casting Defects, Radioscopy, Accuracy Estimation, Image Processing, Bootstrap |
37 | Rao Desineni, R. D. (Shawn) Blanton |
Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 366-373, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
test generation, Diagnosis, defects, failure analysis, yield enhancement |
37 | Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada |
Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 287-, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
supply current test, time-variable electric field, test pattern generation, CMOS IC, open defects |
37 | Said Hamdioui, Ad J. van de Goor |
An experimental analysis of spot defects in SRAMs: realistic fault models and tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 131-138, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
integrated circuit testing, fault models, fault coverage, SRAMs, functional fault models, SRAM chips, spot defects |
37 | H. Zhou, Ashraf A. Kassim, Surendra Ranganath |
A fast algorithm for detecting die extrusion defects in IC packages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 11(1), pp. 37-41, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
IC package inspection, Die extrusion defects, Feature enhancement, Linear feature extraction |
37 | Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras |
Bridging defects resistance in the metal layer of a CMOS process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 8(1), pp. 35-46, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
resistance of the bridge, defect modelling, bridging defects, CMOS process |
36 | Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann 0001, Valentin Dallmeier |
DEFECTS 2008: international workshop on defects in large software systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2008, Seattle, WA, USA, July 20-24, 2008, pp. 307-308, 2008, ACM, 978-1-60558-050-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect localization, empirical studies, faults, bugs, defect prediction, software defects |
35 | Jacek Ratzinger, Thomas Sigmund, Harald C. Gall |
On the relation of refactorings and software defect prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MSR ![In: Proceedings of the 2008 International Working Conference on Mining Software Repositories, MSR 2008 (Co-located with ICSE), Leipzig, Germany, May 10-11, 2008, Proceedings, pp. 35-38, 2008, ACM, 978-1-60558-024-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
software evolution, mining, software analysis |
35 | Abraham Bernstein, Jayalath Ekanayake, Martin Pinzger 0001 |
Improving defect prediction using temporal features and non linear models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWPSE ![In: 9th International Workshop on Principles of Software Evolution (IWPSE 2007), in conjunction with the 6th ESEC/FSE joint meeting, Dubrovnik, Croatia, September 3-4, 2007, pp. 11-18, 2007, ACM, 978-1-59593-722-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
decision tree learner, mining software repository, defect prediction |
35 | Timothy K. Shih, Louis H. Lin, Wonjun Lee 0001 |
Detection and Removal of Long Scratch Lines in Aged Films. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICME ![In: Proceedings of the 2006 IEEE International Conference on Multimedia and Expo, ICME 2006, July 9-12 2006, Toronto, Ontario, Canada, pp. 477-480, 2006, IEEE Computer Society, 1-4244-0367-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
35 | Domingo Mery, Miguel Carrasco |
Automated Multiple View Inspection Based on Uncalibrated Image Sequences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCIA ![In: Image Analysis, 14th Scandinavian Conference, SCIA 2005, Joensuu, Finland, June 19-22, 2005, Proceedings, pp. 1238-1247, 2005, Springer, 3-540-26320-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
defect detection, multiple view geometry, automated visual inspection |
35 | Stefan Biffl, Thomas Grechenig, Monika Köhle |
Evaluation of inspectors' defect estimation accuracy for a requirements document after individual inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APSEC ![In: 7th Asia-Pacific Software Engineering Conference (APSEC 2000), 5-8 December 2000, Singapore, pp. 100-, 2000, IEEE Computer Society, 0-7695-0915-0. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
inspector defect estimation accuracy, formal specification, software quality, project management, project managers, inspection, controlled experiment, software inspection, software requirements specification, requirements document, product quality |
35 | Shanker Sanyal, Ken Aida, Kostas Gaitanos, George Wowk, Sam Lahiri |
Defect tracking and reliability modeling for a new product release. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CASCON ![In: Proceedings of the 1992 Conference of the Centre for Advanced Studies on Collaborative Research, November 9-12, 1992, Toronto, Ontario, Canada, 2 Volumes, pp. 409-422, 1992, IBM. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP BibTeX RDF |
|
34 | Lei He, Juan Li 0001, Qing Wang 0001, Ye Yang |
Predicting Upgrade Project Defects Based on Enhancement Requirements: An Empirical Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSP ![In: Trustworthy Software Development Processes, International Conference on Software Process, ICSP 2009 Vancouver, Canada, May 16-17, 2009 Proceedings, pp. 268-279, 2009, Springer, 978-3-642-01679-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Enhancement Requirement, Information Retrieval, Support Vector Machines, Defect Prediction |
34 | Gursimran Singh Walia, Jeffrey C. Carver |
Evaluation of capture-recapture models for estimating the abundance of naturally-occurring defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Second International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, October 9-10, 2008, Kaiserslautern, Germany, pp. 158-167, 2008, ACM, 978-1-59593-971-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
capture-recapture models, defect estimation, empirical study, requirements, software inspections, validation and verification |
34 | Jing Huang 0001, Mariam Momenzadeh, Fabrizio Lombardi |
On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(2-3), pp. 163-174, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
processing by wire, emerging technologies, defect tolerance, QCA |
34 | Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kypros Constantinides, Valeria Bertacco, Todd M. Austin |
Low-cost protection for SER upsets and silicon defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 1146-1151, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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