Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
75	Rudolf Ramler	The impact of product development on the lifecycle of defects.	DEFECTS	2008	DBLP DOI BibTeX RDF	defect lifecycle, product development
70	Norihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue	Retrieving similar code fragments based on identifier similarity for defect detection.	DEFECTS	2008	DBLP DOI BibTeX RDF
69	Mika Mäntylä, Casper Lassenius	What Types of Defects Are Really Discovered in Code Reviews?	IEEE Trans. Software Eng.	2009	DBLP DOI BibTeX RDF
68	Talha Javed, Manzil e Maqsood, Qaiser S. Durrani	A study to investigate the impact of requirements instability on software defects.	ACM SIGSOFT Softw. Eng. Notes	2004	DBLP DOI BibTeX RDF	change request (CR's)1, high/medium/low change requests, pre/post release changes, severity-1/severity-2 defects, defects, requirements change
68	Gerard A. Allan, Anthony J. Walton	Efficient critical area estimation for arbitrary defect shapes.	DFT	1997	DBLP DOI BibTeX RDF	critical area estimation, arbitrary defect shapes, circular defects, elliptical defects, rod shaped defects, arbitrary shaped defects, Edinburgh Yield Estimator, Cadence layout editor, EYE-sampling tool, EYE, EYES, integrated circuit yield, IC layout
67	Ian Pyle	Quality in Software Based Systems.	ECBS	1996	DBLP DOI BibTeX RDF	software, Quality, process, production, risk, defects, checking
66	Stefan Wagner 0001	Defect classification and defect types revisited.	DEFECTS	2008	DBLP DOI BibTeX RDF	defect taxonomy, defect types, faults, defects, bugs, defect classification
66	Nathaniel Ayewah, William W. Pugh	A report on a survey and study of static analysis users.	DEFECTS	2008	DBLP DOI BibTeX RDF	Java, static analysis, software quality, bugs, false positives, software defects, FindBugs, bug patterns
64	Timea Illes-Seifert, Barbara Paech	Exploring the relationship of history characteristics and defect count: an empirical study.	DEFECTS	2008	DBLP DOI BibTeX RDF	defect database, versioning systems, empirical study
64	Haihua Yan, Adit D. Singh	A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects.	VLSI Design	2005	DBLP DOI BibTeX RDF
62	Vinay Dabholkar, Sreejit Chakravarty	Computing stress tests for interconnect defects.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	interconnect defects, reliability screens, infant mortality, gate-oxide defects, integrated circuit testing, stress tests
60	Gertrude Neuman Levine	Defining defects, errors, and service degradations.	ACM SIGSOFT Softw. Eng. Notes	2009	DBLP DOI BibTeX RDF	service degradation, errors, failure, defects
60	Md. Atiqul Islam, Shamim Akhter, Tamnun E. Mursalin, M. Ashraful Amin	A Suitable Neural Network to Detect Textile Defects.	ICONIP (2)	2006	DBLP DOI BibTeX RDF	Textile defects, threshold decision tree, multi-layer neural networks, resilient back propagation, cross validation
58	Per Runeson, Måns Holmstedt Jönsson, Fredrik Scheja	Are Found Defects an Indicator of Software Correctness? An Investigation in a Controlled Case Study.	ISSRE	2004	DBLP DOI BibTeX RDF
57	Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita	On the Evaluation of Arbitrary Defect Coverage of Test Sets.	VTS	1999	DBLP DOI BibTeX RDF	Fault Modeling & Simulation, Arbitrary Defects, Vector-Independent and Vector-Dependent Defects
57	Jaume A. Segura 0001, Miquel Roca 0001, Diego Mateo, Antonio Rubio 0001	An approach to dynamic power consumption current testing of CMOS ICs.	VTS	1995	DBLP DOI BibTeX RDF	dynamic power consumption current testing, logic behavior, parametric defect, quiescent power supply current testing, consumption current testing time, on-chip sensor, static power consumption, fault diagnosis, logic testing, integrated circuit testing, automatic testing, adders, CMOS logic circuits, I/sub DDQ/ testing, CMOS ICs, full adders, open defects, electric current measurement, bridging defects, transient current
57	Jian Liu, Rafic Z. Makki	Power supply current detectability of SRAM defects.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	short-circuit currents, fault currents, power supply circuits, power supply current detectability, SRAM defects, SRAM cell, power supply current, I/sub DDQ/, quiescent power supply current, i/sub DDT/, transient power supply current, shorts, disturb-type pattern sensitivity, total current leakage, SRAM size, current detectability, large circuit effects, simulation, fault diagnosis, leakage currents, transients, SRAM chips, open defects, electric current measurement, physical defect
54	Roberto N. de Mesquita, Daniel K. S. Ting, Eduardo L. L. Cabral, Belle R. Upadhyaya	Classification of Steam Generator Tube Defects for Real-Time Applications Using Eddy Current Test Data and Self-Organizing Maps.	Real Time Syst.	2004	DBLP DOI BibTeX RDF	eddy current, tube defects, nuclear plant, self-organizing map
53	Sylvie Trudel, Alain Abran	Improving Quality of Functional Requirements by Measuring Their Functional Size.	IWSM/Metrikon/Mensura	2008	DBLP DOI BibTeX RDF	inspection, review, FSM, Functional requirements, Functional size measurement, COSMIC
52	Sandeep Kumar Goel, Krishnendu Chakrabarty	Circuit Topology-Based Test Pattern Generation for Small-Delay Defects.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
52	Sandeep Kumar Goel, Narendra Devta-Prasanna	Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
52	Nisar Ahmed, Mohammad Tehranipoor	Faster-than-at-Speed Test for Screening Small-Delay Defects.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
52	Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann 0001 (eds.)	Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008	DEFECTS	2008	DBLP BibTeX RDF
52	Elaine J. Weyuker, Thomas J. Ostrand	Comparing methods to identify defect reports in a change management database.	DEFECTS	2008	DBLP DOI BibTeX RDF
52	Yasuhiro Hayase, Yii Yong Lee, Katsuro Inoue	A criterion for filtering code clone related bugs.	DEFECTS	2008	DBLP DOI BibTeX RDF	defect mining, code clone
52	Chadd C. Williams, Jaime Spacco	SZZ revisited: verifying when changes induce fixes.	DEFECTS	2008	DBLP DOI BibTeX RDF
52	Yue Jiang 0001, Bojan Cukic, Tim Menzies	Can data transformation help in the detection of fault-prone modules?	DEFECTS	2008	DBLP DOI BibTeX RDF
52	Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue	Predicting fault-prone modules based on metrics transitions.	DEFECTS	2008	DBLP DOI BibTeX RDF
52	Min Zhang 0008, Tracy Hall, Nathan Baddoo, Paul Wernick	Do bad smells indicate "trouble" in code?	DEFECTS	2008	DBLP DOI BibTeX RDF	bad smells, open source, faults
52	Burak Turhan, Ayse Basar Bener, Tim Menzies	Nearest neighbor sampling for cross company defect predictors: abstract only.	DEFECTS	2008	DBLP DOI BibTeX RDF
52	Zude Li, Mechelle Gittens, Syed Shariyar Murtaza, Nazim H. Madhavji, Andriy V. Miranskyy, David Godwin, Enzo Cialini	Analysis of pervasive multiple-component defects in a large software system.	ICSM	2009	DBLP DOI BibTeX RDF
52	Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede	Systematic Defects in Deep Sub-Micron Technologies.	ITC	2004	DBLP DOI BibTeX RDF
51	Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki	Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns.	ICCV	1995	DBLP DOI BibTeX RDF	printed circuit layout, X-ray applications, real time X-ray inspection, real-time X-ray inspection, 3D defect, 3-D defects, circuit board patterns, three dimensional defects, fine PCB patterns, sphere surface, X-ray detector, defect detection algorithm, heavy shading, real-time systems, feature extraction, feature extraction, signal processing, inspection, circuit analysis computing, X-ray images, printed circuit board, printed circuit testing, perspective transform, intensity variation, defect detection techniques
48	Naouel Moha	Detection and correction of design defects in object-oriented designs.	OOPSLA Companion	2007	DBLP DOI BibTeX RDF	specification, refactorings, detection, correction, meta-modelling, code smells, antipatterns, design defects
48	Josh Yang, Baosheng Wang, André Ivanov	Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode.	VLSI Design	2004	DBLP DOI BibTeX RDF	6T SRAM, Area Penalty, Write Recovery, Memory testing, Test Time, Open Defects
47	Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren	Automatic Detection of In-field eld Defect Growth in Image Sensors.	DFT	2008	DBLP DOI BibTeX RDF
47	Christian F. J. Lange	Improving the quality of UML models in practice.	ICSE	2006	DBLP DOI BibTeX RDF	UML, consistency, quality, completeness, defect detection
46	Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker 0001	On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
46	Jacek Ratzinger, Martin Pinzger 0001, Harald C. Gall	EQ-Mine: Predicting Short-Term Defects for Software Evolution.	FASE	2007	DBLP DOI BibTeX RDF	Quality Prediction, Machine Learning, Classification, Software Evolution, Regression, Defect Density
46	Jin-Cherng Lin, Kuo-Chiang Wu	Digging High Risk Defects Out in Software Engineering.	Intelligent Information Processing	2006	DBLP DOI BibTeX RDF	Prime Components Analysis (PCA), Discriminate Analysis (DA)
46	Christian F. J. Lange, Michel R. V. Chaudron	Effects of defects in UML models: an experimental investigation.	ICSE	2006	DBLP DOI BibTeX RDF	UML, consistency, completeness, defect detection
46	Per Runeson, Anneliese Amschler Andrews	Detection or Isolation of Defects? An Experimental Comparison of Unit Testing and Code Inspection.	ISSRE	2003	DBLP DOI BibTeX RDF	Defect isolation, Empirical Study, Unit testing, Controlled Experiment, Defect detection, Code Inspection
46	Rani S. Ghaida, Payman Zarkesh-Ha	A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.	J. Electron. Test.	2009	DBLP DOI BibTeX RDF	Layout sensitivity, Narrow defects, Electromigration, Critical area, Yield prediction, Yield modeling, Spot defects
43	Hong-Dar Lin, Singa Wang Chiu	Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays.	PSIVT	2006	DBLP DOI BibTeX RDF	MURA-type defects, Hotelling T2 statistics, Ant colony algorithm, Computer vision system, Back propagation network
43	Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker 0001	The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults.	VTS	2004	DBLP DOI BibTeX RDF	Very-Low-Voltage testing, Resistive short defects
43	Vitoantonio Bevilacqua, Lucia Cariello, Giuseppe Mastronardi, Vito Palmieri, Marco Giannini	Defects Identification in Textile by Means of Artificial Neural Networks.	ICIC (2)	2008	DBLP DOI BibTeX RDF	texture defects identification, error back propagation algorithm, artificial neural networks, vision system
43	Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor	Test-Pattern Grading and Pattern Selection for Small-Delay Defects.	VTS	2008	DBLP DOI BibTeX RDF	Small-delay defects, pattern grading, pattern selection, ATPG
43	Naouel Moha, Yann-Gaël Guéhéneuc, Anne-Françoise Le Meur, Laurence Duchien	A Domain Analysis to Specify Design Defects and Generate Detection Algorithms.	FASE	2008	DBLP DOI BibTeX RDF	algorithm generation, Java, domain-specific language, detection, code smells, antipatterns, Design defects
43	Naouel Moha, Yann-Gaël Guéhéneuc	Decor: a tool for the detection of design defects.	ASE	2007	DBLP DOI BibTeX RDF	algorithm generation, java, domain-specific language, detection, code smells, antipatterns, design defects
43	Ketan Mehta, T. J. Jankun-Kelly	Detection and Visualization of Defects in 3D Unstructured Models of Nematic Liquid Crystals.	IEEE Trans. Vis. Comput. Graph.	2006	DBLP DOI BibTeX RDF	disclination, nematic liquid crystal, feature extraction, scientific visualization, defects, unstructured grid
43	Xusheng Yuan, Qingxi Hu, Hanqiang Liu 0002, Chunxiang Dai, Minglun Fang	Modeling Technology and Application of Repairing Bone Defects Based on Rapid Prototyping.	PROLAMAT	2006	DBLP DOI BibTeX RDF	bone defects, bionic scaffold, rapid prototyping, surface reconstruction, tissue engineering
43	Naouel Moha, Jihene Rezgui, Yann-Gaël Guéhéneuc, Petko Valtchev, Ghizlane El-Boussaidi	Using FCA to Suggest Refactorings to Correct Design Defects.	CLA	2006	DBLP DOI BibTeX RDF	Refactoring, Formal Concept Analysis, Design Defects
43	Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker 0001	On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF	Temperature testing, Resistive defects, Early-life failures, Low-voltage testing
43	Zaid Al-Ars, Ad J. van de Goor	Static and Dynamic Behavior of Memory Cell Array Spot Defects in Embedded DRAMs.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	dynamic faulty behavior, functional fault models, defect simulation, spot defects, Embedded DRAM, fault primitives
43	Yann-Gaël Guéhéneuc, Hervé Albin-Amiot	Using Design Patterns and Constraints to Automate the Detection and Correction of Inter-Class Design Defects.	TOOLS (39)	2001	DBLP DOI BibTeX RDF	design patterns, constraints, source code transformation, design defects, OO design
43	Srikanth Venkataraman, Scott Brady Drummonds	A Technique for Logic Fault Diagnosis of Interconnect Open Defects.	VTS	2000	DBLP DOI BibTeX RDF	Diagnosis and Debugging, Logic Fault Diagnosis, Interconnect Open Defects, Fault Modeling and Simulation, Dynamic Diagnosis
43	Mayuram S. Krishnan, Marc I. Kellner	Measuring Process Consistency: Implications for Reducing Software Defects.	IEEE Trans. Software Eng.	1999	DBLP DOI BibTeX RDF	Software process consistency, CMM, software defects, empirical model, software process measurement
41	Duncan M. Hank Walker	K Longest Paths.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
41	Sudhakar M. Reddy, Peter Maxwell	Fundamentals of Small-Delay Defect Testing.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
41	Mahmut Yilmaz	Output Deviations-Based SDD Testing.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
41	Narendra Devta-Prasanna, Sandeep Kumar Goel	Small-Delay Defect Coverage Metrics.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
41	Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor	Circuit Path Grading Considering Layout, Process Variations, and Cross Talk.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
41	Mark Kassab, Benoit Nadeau-Dostie, Xijiang Lin	Timing-Aware ATPG.	Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits	2014	DBLP BibTeX RDF
41	Ajit Ashok Shenvi	Defect prevention with orthogonal defect classification.	ISEC	2009	DBLP DOI BibTeX RDF	odc, algorithm, interface, timing, documentation, function, assignment, car, checking
41	Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham	Small-Delay Defect Detection in the Presence of Process Variations.	ISQED	2007	DBLP DOI BibTeX RDF
41	Abhishek Singh 0001, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel	Defect Simulation Methodology for iDDT Testing.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	iDDT, transient current testing, device testing, ATPG, fault simulation, IDDQ, defect simulation, defect-based test
41	Beatriz Bernárdez 0001, Marcela Genero, Amador Durán 0001, Miguel Toro	A Controlled Experiment for Evaluating a Metric-Based Reading Technique for Requirements Inspection.	IEEE METRICS	2004	DBLP DOI BibTeX RDF	requirements verification, metrics, use cases, empirical validation, reading techniques
40	Edoardo Ardizzone, Andrea de Polo, Haris Dindo, Giuseppe Mazzola, C. Nanni	A Dual Taxonomy for Defects in Digitized Historical Photos.	ICDAR	2009	DBLP DOI BibTeX RDF
40	Mario I. Chacon, Juan I. Nevarez, Jose Rivera	Recognition of Natural and Non-Natural Defects Presented in Ophthalmic Lenses.	IJCNN	2007	DBLP DOI BibTeX RDF
40	Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz	Test Generation for Open Defects in CMOS Circuits.	DFT	2006	DBLP DOI BibTeX RDF
40	Dmitry Chetverikov	Structural Defects: General Approach and Application to Textile Inspection.	ICPR	2000	DBLP DOI BibTeX RDF
40	Abderrahim Doumar, Hideo Ito	Design of Switching Blocks Tolerating Defects/Faults in FPGA Interconnection Resources.	DFT	2000	DBLP DOI BibTeX RDF
40	Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey	On the development of power supply voltage control testing technique for analogue circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	power supply circuits, voltage control, power supply voltage control testing, hard defects, soft defects, simulation, fault diagnosis, integrated circuit testing, data analysis, data analysis, circuit analysis computing, operational amplifiers, operational amplifier, analogue integrated circuits, IC tests, analogue circuits
39	Phil Nigh	Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	latent defects, reliability defects, latent-defect screening, defect acceleration, DPPM, burn-in
37	Arbi Ghazarian	A Case Study of Defect Introduction Mechanisms.	CAiSE	2009	DBLP DOI BibTeX RDF	Defects Sources, Defect Root Cause Analysis, Case Study
37	Olusegun Akinwale, Sergiu M. Dascalu, Marcel Karam	DuoTracker: Tool Support for Software Defect Data Collection and Analysis.	ICSEA	2006	DBLP DOI BibTeX RDF	software anomalies, CMM, software defects, defect classification, ISO-9001, PSP
37	Taiga Nakamura, Lorin Hochstein, Victor R. Basili	Identifying domain-specific defect classes using inspections and change history.	ISESE	2006	DBLP DOI BibTeX RDF	change history, domain specific defects, inspection, code reading
37	Thomas S. Barnett, Adit D. Singh, Victor P. Nelson	Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.	DFT	2001	DBLP DOI BibTeX RDF	infant mortality, negative binomial distribution, clustering, reliability, redundancy, yield, defects, defect tolerance, burn-in
37	Naouel Moha, Amine Rouane Hacene, Petko Valtchev, Yann-Gaël Guéhéneuc	Refactorings of Design Defects Using Relational Concept Analysis.	ICFCA	2008	DBLP DOI BibTeX RDF	Relational Concept Analysis, Refactoring, Design Defects
37	Keld Raaschou, Austen W. Rainer	Exposure model for prediction of number of customer reported defects.	ESEM	2008	DBLP DOI BibTeX RDF	estimation of field defects, exposure model, prediction
37	Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker 0001, Martin Keim, Wu-Tung Cheng	Automatic Test Pattern Generation for Interconnect Open Defects.	VTS	2008	DBLP DOI BibTeX RDF	Interconnect opens, Open-via defects, ATPG
37	Fei Su, William L. Hwang, Arindam Mukherjee 0001, Krishnendu Chakrabarty	Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	testing, diagnosis, fault modeling, defects, microfluidics, biochips, biosensors
37	Naouel Moha, Yann-Gaël Guéhéneuc	PTIDEJ and DECOR: identification of design patterns and design defects.	OOPSLA Companion	2007	DBLP DOI BibTeX RDF	Java, design patterns, detection, meta-modelling, antipatterns, design defects
37	Romeu Ricardo da Silva, Domingo Mery	Accuracy Estimation of Detection of Casting Defects in X-Ray Images Using Some Statistical Techniques.	PSIVT	2007	DBLP DOI BibTeX RDF	Casting Defects, Radioscopy, Accuracy Estimation, Image Processing, Bootstrap
37	Rao Desineni, R. D. (Shawn) Blanton	Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction.	VTS	2005	DBLP DOI BibTeX RDF	test generation, Diagnosis, defects, failure analysis, yield enhancement
37	Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada	Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.	DFT	2001	DBLP DOI BibTeX RDF	supply current test, time-variable electric field, test pattern generation, CMOS IC, open defects
37	Said Hamdioui, Ad J. van de Goor	An experimental analysis of spot defects in SRAMs: realistic fault models and tests.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	integrated circuit testing, fault models, fault coverage, SRAMs, functional fault models, SRAM chips, spot defects
37	H. Zhou, Ashraf A. Kassim, Surendra Ranganath	A fast algorithm for detecting die extrusion defects in IC packages.	Mach. Vis. Appl.	1998	DBLP DOI BibTeX RDF	IC package inspection, Die extrusion defects, Feature enhancement, Linear feature extraction
37	Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras	Bridging defects resistance in the metal layer of a CMOS process.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	resistance of the bridge, defect modelling, bridging defects, CMOS process
36	Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann 0001, Valentin Dallmeier	DEFECTS 2008: international workshop on defects in large software systems.	ISSTA	2008	DBLP DOI BibTeX RDF	defect localization, empirical studies, faults, bugs, defect prediction, software defects
35	Jacek Ratzinger, Thomas Sigmund, Harald C. Gall	On the relation of refactorings and software defect prediction.	MSR	2008	DBLP DOI BibTeX RDF	software evolution, mining, software analysis
35	Abraham Bernstein, Jayalath Ekanayake, Martin Pinzger 0001	Improving defect prediction using temporal features and non linear models.	IWPSE	2007	DBLP DOI BibTeX RDF	decision tree learner, mining software repository, defect prediction
35	Timothy K. Shih, Louis H. Lin, Wonjun Lee 0001	Detection and Removal of Long Scratch Lines in Aged Films.	ICME	2006	DBLP DOI BibTeX RDF
35	Domingo Mery, Miguel Carrasco	Automated Multiple View Inspection Based on Uncalibrated Image Sequences.	SCIA	2005	DBLP DOI BibTeX RDF	defect detection, multiple view geometry, automated visual inspection
35	Stefan Biffl, Thomas Grechenig, Monika Köhle	Evaluation of inspectors' defect estimation accuracy for a requirements document after individual inspection.	APSEC	2000	DBLP DOI BibTeX RDF	inspector defect estimation accuracy, formal specification, software quality, project management, project managers, inspection, controlled experiment, software inspection, software requirements specification, requirements document, product quality
35	Shanker Sanyal, Ken Aida, Kostas Gaitanos, George Wowk, Sam Lahiri	Defect tracking and reliability modeling for a new product release.	CASCON	1992	DBLP BibTeX RDF
34	Lei He, Juan Li 0001, Qing Wang 0001, Ye Yang	Predicting Upgrade Project Defects Based on Enhancement Requirements: An Empirical Study.	ICSP	2009	DBLP DOI BibTeX RDF	Enhancement Requirement, Information Retrieval, Support Vector Machines, Defect Prediction
34	Gursimran Singh Walia, Jeffrey C. Carver	Evaluation of capture-recapture models for estimating the abundance of naturally-occurring defects.	ESEM	2008	DBLP DOI BibTeX RDF	capture-recapture models, defect estimation, empirical study, requirements, software inspections, validation and verification
34	Jing Huang 0001, Mariam Momenzadeh, Fabrizio Lombardi	On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	processing by wire, emerging technologies, defect tolerance, QCA
34	Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kypros Constantinides, Valeria Bertacco, Todd M. Austin	Low-cost protection for SER upsets and silicon defects.	DATE	2007	DBLP DOI BibTeX RDF