The FacetedDBLP logo    Search for: in:

Disable automatic phrases ?     Syntactic query expansion: ?

Searching for metrology with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1980-1993 (17) 1994-1997 (17) 1998-2000 (16) 2001-2002 (26) 2003-2004 (25) 2005-2006 (32) 2007 (24) 2008 (22) 2009 (26) 2010 (21) 2011 (28) 2012 (23) 2013 (24) 2014 (18) 2015 (39) 2016 (24) 2017 (25) 2018 (72) 2019 (128) 2020 (185) 2021 (217) 2022 (284) 2023 (373) 2024 (9)
Publication types (Num. hits)
article(338) book(1) data(1) incollection(5) inproceedings(1295) phdthesis(24) proceedings(11)
GrowBag graphs for keyword ? (Num. hits/coverage)

Group by:
The graphs summarize 97 occurrences of 83 keywords

Results
Found 1675 publication records. Showing 1675 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
141K. J. Stanley, Timothy D. Stanley, José Maia Wafer fabrication: realizing 300mm fab productivity improvements through integrated metrology. Search on Bibsonomy WSC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
94Yaw-Jen Chang, Yuan Kang, Chin-Liang Hsu, Chi-Tim Chang, Tat Yan Chan Virtual Metrology Technique for Semiconductor Manufacturing. Search on Bibsonomy IJCNN The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
76Fabricio Fishkel, Anath Fischer, Sigal Ar Verification of Engineering Models Based on Bipartite Graph Matching for Inspection Applications. Search on Bibsonomy GMP The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Computational metrology, Reverse engineering, Metrology, Mesh processing, Bipartite graph matching
69José Otero, Luciano Sánchez, Jesús Alcalá-Fdez Fuzzy-genetic optimization of the parameters of a low cost system for the optical measurement of several dimensions of vehicles. Search on Bibsonomy Soft Comput. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Fuzzy uncertainty, Genetic algorithms, Stereoscopic vision, Metrology, Random sets
63Xiaoming Deng 0001, Fuchao Wu, Yihong Wu 0002, Fuqing Duan Visual metrology with uncalibrated radial distorted images. Search on Bibsonomy ICPR The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
63Seong-ho Kang, Mitchell W. Pryor, Delbert Tesar Kinematic Model and Metrology System for Modular Robot Calibration. Search on Bibsonomy ICRA The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
63Yue-Tsang Chen, Chauchin Su Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. Search on Bibsonomy Asian Test Symposium The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
54Christoph Heinzl, Johann Kastner, M. Eduard Gröller Surface Extraction from Multi-Material Components for Metrology using Dual Energy CT. Search on Bibsonomy IEEE Trans. Vis. Comput. Graph. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF DECT image fusion, local surface extraction, Dual Energy CT, dimensional measurement, variance comparison, metrology
47Dongtai Liang, Xuanyin Wang Planar Visual Metrology using Partition-based Camera Calibration. Search on Bibsonomy RAM The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
47Fan-Tien Cheng, Yeh-Tung Chen, Yu-Chuan Su, Deng-Lin Zeng Method for Evaluating Reliance Level of a Virtual Metrology System. Search on Bibsonomy ICRA The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
47Scott C.-H. Huang, Shamila Makki, Niki Pissinou Accusation Resolution Using Security Metrology. Search on Bibsonomy WASA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
47Enrico S. Canuto, Fabio Musso Embedded Model Control: Application to Interferometric Metrology Lines. Search on Bibsonomy ETFA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
47Alain Abran, Asma Sellami, Witold Suryn Metrology, Measurement and Metrics in Software Engineering. Search on Bibsonomy IEEE METRICS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
47B. Muralikrishnan, Kayvan Najarian, J. Raja Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. Search on Bibsonomy ICPR (1) The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
47Robert Wright II, Marlin Shopbell, Kristin Rust, Silpa Sigireddy Wafer fabrication: effects of metrology load port buffering in automated 300mm factories. Search on Bibsonomy WSC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
39Feng Guo 0006, Rama Chellappa Video Metrology Using a Single Camera. Search on Bibsonomy IEEE Trans. Pattern Anal. Mach. Intell. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF Video metrology, mensuration, rectification
39Yisong Chen, Horace Ho-Shing Ip Single view metrology of wide-angle lens images. Search on Bibsonomy Vis. Comput. The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Lens distortion correction, Euclidean measurement, Single view metrology, Error analysis
39Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen Analog signal metrology for mixed signal ICs. Search on Bibsonomy Asian Test Symposium The full citation details ... 1997 DBLP  DOI  BibTeX  RDF Analog signal metrology, multiple period low-rate sampled waveform, high-rate sampled waveform, DSP based testing, on-chip ADC, 20 MHz, mixed analogue-digital integrated circuits, Signal reconstruction, mixed signal IC
39Heikki Ailisto CAD and Vision in Rangefinder-based Dimensional Metrology. Search on Bibsonomy 3DIM The full citation details ... 1997 DBLP  DOI  BibTeX  RDF rangefinder-based dimensional metrology, automated 3D measurement, measurement planning, measurement execution, graphical measurement planning tool, automatic optical measurement systems, sensory feedback, performance criteria, CAD, CAD, vision
33Alessandro Schiavi, Fabrizio Mazzoleni, Alessio Facello, Andrea Prato Metrology for next generation "Phygital Sensors". Search on Bibsonomy MetroInd4.0&IoT The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
33Tamador Salih Saeed Metrology for All: Women in Metrology (WIM): 2022 First Forum. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
33Giada Luppino, Lisa Bosisio, Chiara Conese, Davide Maria Fabris, Marco Tarabini Metrology of a Monocular Vision System for Markers Localization and Tracking. Search on Bibsonomy MetroInd4.0& IoT The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
33Wiebke Heeren, Bernd Müller, Gianfranco Miele, Tuukka Mustapää, Daniel Hutzschenreuter, Clifford Brown, Oksana Baer SmartCom - Key Findings for Digitalisation in Metrology. Search on Bibsonomy MetroInd4.0&IoT The full citation details ... 2021 DBLP  DOI  BibTeX  RDF
33Maximilian Gruber, Sascha Eichstädt, Julia Neumann, Adrian Paschke Semantic Information in Sensor Networks: How to Combine Existing Ontologies, Vocabularies and Data Schemes to Fit a Metrology Use Case. Search on Bibsonomy MetroInd4.0&IoT The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
33Mark Kuster A Measurement Information Infrastructure's Benefits for Industrial Metrology and IoT. Search on Bibsonomy MetroInd4.0&IoT The full citation details ... 2020 DBLP  DOI  BibTeX  RDF
33Roberto Benitez, Roberto Benitez Jr., Cesar Ramirez, Jose A. Vazquez Sensors calibration for Metrology 4.0. Search on Bibsonomy MetroInd4.0&IoT The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
33Richard Davis 0001 Why the Mohs scale remains relevant for metrology [Basic Metrology]. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
33Richard Davis 0001 The center of a souffle-metrology in the kitchen [Basic metrology]. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
33Henry Swofford, Ted Vosk Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
33Annarita Lazzari, Jean-Michel Pou, Christopher DuBois, Laurent Leblond Smart metrology: the importance of metrology of decisions in the big data era. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
33Bryan P. Kibble Everyday instruments from basic metrology [Basic Metrology]. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
33Alessandro Ferrero, Veronica Scotti The story of the right measurement that caused injustice and the wrong measurement that did justice; How to explain the importance of metrology to lawyers and judges [Legal Metrology]. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
33Dongil Kim, Pilsung Kang 0001, Seung-kyung Lee, Seokho Kang 0001, Seungyong Doh, Sungzoon Cho Improvement of virtual metrology performance by removing metrology noises in a training dataset. Search on Bibsonomy Pattern Anal. Appl. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
33Thiago de Castro Martins, Marcos de Sales Guerra Tsuzuki, Rogerio Y. Takimoto, Ahmad Barari, Giulliano B. Gallo, Marcos A. A. Garcia, Hamilton Tiba Algorithmic iterative sampling in coordinate metrology plan for coordinate metrology using dynamic uncertainty analysis. Search on Bibsonomy INDIN The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
33Chun Hung Cheng, Dehong Huo, Xi Zhang, Wei Dai 0005, Paul G. Maropoulos Large Volume Metrology Process Model: Measurability Analysis with Integration of Metrology Classification Model and Feature-Based Selection Model. Search on Bibsonomy DET The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
33Anath Fischer, Raffaello Levi Special Issue on Reverse Engineering and Computational Metrology: Part 2 - Computational Metrology Strategies and Methods. Search on Bibsonomy J. Comput. Inf. Sci. Eng. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
32Tung-Ho Lin, Fan-Tien Cheng, Aeo-Juo Ye, Wei-Ming Wu, Min-Hsiung Hung A novel key-variable sifting algorithm for virtual metrology. Search on Bibsonomy ICRA The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
32Yu-Chuan Su, Wen-Huang Tsai, Fan-Tien Cheng, Wei-Ming Wu Development of a dual-stage virtual metrology architecture for TFT-LCD manufacturing. Search on Bibsonomy ICRA The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
32P. Ravindran, Nicola J. Ferrier, S. M. Park, P. F. Nealey Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures. Search on Bibsonomy ICIP (4) The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
32Bojian Liang, Zezhi Chen, Nick E. Pears Uncalibrated Two-View Metrology. Search on Bibsonomy ICPR (1) The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
32Mohammad Saadatseresht, Farhad Samadzadegan, Ali Azizi ANN-Based Visibility Prediction for Camera Placement in Vision Metrology. Search on Bibsonomy CRV The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
32Guanghui Wang 0001, Yihong Wu 0002, Zhanyi Hu A Novel Approach for Single View Based Plane Metrology. Search on Bibsonomy ICPR (2) The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
32Antonio Criminisi Single-View Metrology: Algorithms and Applications. Search on Bibsonomy DAGM-Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
32Chauchin Su, Yue-Tsang Chen, Chung-Len Lee 0001 Analog Metrology and Stimulus Selection in a Noisy Environment. Search on Bibsonomy Asian Test Symposium The full citation details ... 1999 DBLP  DOI  BibTeX  RDF Mixed Signal and Analog Test
32Ian D. Reid 0001, Andrew Zisserman Goal-directed Video Metrology. Search on Bibsonomy ECCV (2) The full citation details ... 1996 DBLP  DOI  BibTeX  RDF
31Alan M. Lytle, Kamel S. Saidi NIST research in autonomous construction. Search on Bibsonomy Auton. Robots The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Construction visualization, Robotic crane, Indoor positioning and tracking, Parallel kinematic machine, 3D imaging, Construction automation
31Andrea Bondavalli, Andrea Ceccarelli, Lorenzo Falai, Michele Vadursi Foundations of Measurement Theory Applied to the Evaluation of Dependability Attributes. Search on Bibsonomy DSN The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
31Duane S. Boning, Karthik Balakrishnan, Hong Cai, Nigel Drego, Ali Farahanchi, Karen Gettings, Daihyun Lim, Ajay Somani, Hayden Taylor, Daniel Truque, Xiaolin Xie Variation. Search on Bibsonomy ISQED The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
31Erik Novak, Der-Shen Wan, Paul Unruh, Joanna Schmit Dynamic MEMS Measurement Using a Strobed Interferometric System with Combined Coherence Sensing and Phase Information. Search on Bibsonomy ICMENS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
22José R. Villar 0001, Adolfo Otero, José Otero, Luciano Sánchez Taximeter verification with GPS and soft computing techniques. Search on Bibsonomy Soft Comput. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF Vague data, Fuzzy fitness function, Genetic algorithms, GPS, Fuzzy systems, Metrology
22Jeff Klingner The pupillometric precision of a remote video eye tracker. Search on Bibsonomy ETRA The full citation details ... 2010 DBLP  DOI  BibTeX  RDF pupillometry, eye tracking, metrology, pupil
22Tong Tu, Wooi-Boon Goh Using CCD Moiré Pattern Analysis to Implement Pressure-Sensitive Touch Surfaces. Search on Bibsonomy CAIP The full citation details ... 2009 DBLP  DOI  BibTeX  RDF Moiré patterns, Image-based metrology, Surface deformation analysis, Human computer interface, Vision-based interface
22Prosenjit Bose, Pat Morin Testing the Quality of Manufactured Disks and Balls. Search on Bibsonomy Algorithmica The full citation details ... 2004 DBLP  DOI  BibTeX  RDF Tolerancing metrology, Guaranteed quality, Testing, Sampling, Quality assurance, Roundness, Disks, Spheres, Cylinders
22Sotiris Malassiotis, Michael G. Strintzis Stereo vision system for precision dimensional inspection of 3D holes. Search on Bibsonomy Mach. Vis. Appl. The full citation details ... 2003 DBLP  DOI  BibTeX  RDF Knowledge-based vision, Stereoscopic matching, Metallic surfaces, Inspection, Metrology
22John Horst, Thomas R. Kramer, Keith Stouffer, Joseph Falco, Hui-Min Huang, Frederick M. Proctor, Albert Wavering Distributed Testing of an Equipment-Level Interface Specification. Search on Bibsonomy Symposium on Object-Oriented Real-Time Distributed Computing The full citation details ... 2002 DBLP  DOI  BibTeX  RDF coordinate measuring machine, real-time systems, object-oriented, conformance test, test suite, distributed testing, interface specifications, metrology, validation test
22Derek C. Stanford, Adrian E. Raftery Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise. Search on Bibsonomy IEEE Trans. Pattern Anal. Mach. Intell. The full citation details ... 2000 DBLP  DOI  BibTeX  RDF CEM algorithm, spatial point process, visual defect metrology, EM algorithm, smoothing, Hough transform, model-based clustering, earthquake, BIC, Bayes factor
22Olivier Devillers, Franco P. Preparata Evaluating the cylindricity of a nominally cylindrical point set. Search on Bibsonomy SODA The full citation details ... 2000 DBLP  BibTeX  RDF cylindricity, minimum cyclinder, zone cylinder, roundness, metrology
22Wen-Jean Hsueh, Erik K. Antonsson Automatic high-resolution optoelectronic photogrammetric 3D surface geometry acquisition system. Search on Bibsonomy Mach. Vis. Appl. The full citation details ... 1997 DBLP  DOI  BibTeX  RDF Range-finding, Triangulation, Active vision, Photogrammetry, Metrology
22Lawrence O'Gorman Subpixel Precision of Straight-Edged Shapes for Registration and Measurement. Search on Bibsonomy IEEE Trans. Pattern Anal. Mach. Intell. The full citation details ... 1996 DBLP  DOI  BibTeX  RDF fiducial marks, subpixel precision, image processing, Registration, machine vision, precision, metrology
22Aldo Cumani, Antonio Guiducci Geometric camery calibration: the virtual camera approach. Search on Bibsonomy Mach. Vis. Appl. The full citation details ... 1995 DBLP  DOI  BibTeX  RDF Computer vision, Camera calibration, Metrology, Lens distortion
22M. Y. Amirat, Jean Pontnau, Francis Artigue A three-dimensional measurement system for robot applications. Search on Bibsonomy J. Intell. Robotic Syst. The full citation details ... 1994 DBLP  DOI  BibTeX  RDF Robot calibration, vision sensor, 3D dynamic metrology, noncontacting sensor, Euler angles, external position sensor
16Yifan Xie, Tianhui Wang, Young-Seon Jeong 0001, Ali Tosyali, Myong K. Jeong True sparse PCA for reducing the number of essential sensors in virtual metrology. Search on Bibsonomy Int. J. Prod. Res. The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Philipp Euringer, Gerald Hechenblaikner, Francis Soualle, Walter Fichter Performance Analysis of Sequential Carrier- and Code-Tracking Receivers in the Context of High-Precision Spaceborne Metrology Systems. Search on Bibsonomy IEEE Trans. Instrum. Meas. The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Wenwen Tian, Jiong Zhang, Fei Zhao, Gedong Jiang, Xuesong Mei, Guangde Chen, Hao Wang 0048 A Novel Fuzzy Echo State Broad Learning System for Surface Roughness Virtual Metrology. Search on Bibsonomy IEEE Trans. Ind. Informatics The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Mark O. Neisser, Ndubuisi G. Orji, Harry J. Levinson, Umberto Celano, James R. Moyne, Supika Mashiro, Dan Wilcox, Slava Libman How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning. Search on Bibsonomy Computer The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Pavol Kajánek, Alojz Kopácik, Peter Kyrinovic, Ján Erdélyi, Marián Marcis, Marek Frastia Metrology of Short-Length Measurers - Development of a Comparator for the Calibration of Measurers Based on Image Processing and Interferometric Measurements. Search on Bibsonomy Sensors The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Clayton Forssén, Isak Silander, Johan Zakrisson, Eynas Amer, Dávid Szabó, Thomas Bock, André Kussike, Tom Rubin, Domenico Mari, Stefano Pasqualin, Zaccaria Silvestri, Djilali Bentouati, Ove Axner, Martin Zelan Demonstration of a Transportable Fabry-Pérot Refractometer by a Ring-Type Comparison of Dead-Weight Pressure Balances at Four European National Metrology Institutes. Search on Bibsonomy Sensors The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Andrey Tsapalov, Konstantin Kovler Metrology for Indoor Radon Measurements and Requirements for Different Types of Devices. Search on Bibsonomy Sensors The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Kartikay Tehlan, Michele Bissolo, Riccardo Silvioli, Johannes Oberreuter, Andreas Stier, Nassir Navab, Thomas Wendler 0001 Magnetisation Reconstruction for Quantum Metrology. Search on Bibsonomy Bildverarbeitung für die Medizin The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Kunal Sinha, Rajas Dalvi, M. Girish Chandra, Sourav Chatterjee MetQuan - A Comprehensive Toolkit for Variational Quantum Sensing and Metrology. Search on Bibsonomy COMSNETS The full citation details ... 2024 DBLP  DOI  BibTeX  RDF
16Yongjiang Huang, Xixiang Liu, Qiantong Shao, Zixuan Wang Virtual Metrology Filter-Based Algorithms for Estimating Constant Ocean Current Velocity. Search on Bibsonomy Remote. Sens. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Janusz Kaczmarek, Massimo Ortolano, Oliver Power, Jan Kucera 0001, Luca Callegaro, Vincenzo D'Elia, Martina Marzano, Robert Walsh, Miroslaw Koziol, Ryszard Rybski Virtual Training Laboratory for Primary Impedance Metrology. Search on Bibsonomy IEEE Trans. Instrum. Meas. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Simone Donadello, Elio K. Bertacco, Davide Calonico, Cecilia Clivati Embedded Digital Phase Noise Analyzer for Optical Frequency Metrology. Search on Bibsonomy IEEE Trans. Instrum. Meas. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Atasi Chatterjee, Mattias Kruskopf, Martin Götz, Yefei Yin, Eckart Pesel, Pierre Gournay, Benjamin Rolland, Jan Kucera 0001, Stephan Bauer, Klaus Pierz, Bernhard Schumacher, Hansjörg Scherer Performance and Stability Assessment of Graphene-Based Quantum Hall Devices for Resistance Metrology. Search on Bibsonomy IEEE Trans. Instrum. Meas. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Muhammad Azwan Ibrahim, Faizan Qamar, Zarina Shukur, Nasharuddin Zainal, Nazri Marzuki, Maria Ulfah Siregar Formalizing Attack Tree on Security Object for MySANi in Legal Metrology. Search on Bibsonomy Syst. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Daniel Gauder, Johannes Gölz, Niels Jung, Gisela Lanza Development of an adaptive quality control loop in micro-production using machine learning, analytical gear simulation, and inline focus variation metrology for zero defect manufacturing. Search on Bibsonomy Comput. Ind. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Dong-Joon Lim, Sangjin Kim, Uijong Hwang, Sanghun Jeong, Dongwook Kim, Yeolib Kim Development of a virtual metrology system for smart manufacturing: A case study of spandex fiber production. Search on Bibsonomy Comput. Ind. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16David Macii Basics of Industrial Metrology. Search on Bibsonomy IEEE Instrum. Meas. Mag. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Akshay Agarwal, Minxu Peng, Vivek K. Goyal Continuous-Time Modeling and Analysis of Particle Beam Metrology. Search on Bibsonomy IEEE J. Sel. Areas Inf. Theory The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Jia-Xuan Liu, Jing Yang, Hai-Long Shi, Sixia Yu Optimal Local Measurements in Many-body Quantum Metrology. Search on Bibsonomy CoRR The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Jing Yang Theory of Compression Channels for Post-selected Metrology. Search on Bibsonomy CoRR The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray 0002, Sandip Halder Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. Search on Bibsonomy CoRR The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Angzhi Fan, Yu Huang 0017, Fei Xu, Sthitie Bom Soft Sensing Regression Model: from Sensor to Wafer Metrology Forecasting. Search on Bibsonomy CoRR The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Donatien Koulla Moulla, Ernest Mnkandla, Alain Abran Evaluation of IoT Measurement Solutions from a Metrology Perspective. Search on Bibsonomy Comput. Syst. Sci. Eng. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Mankei Tsang Operational meanings of a generalized conditional expectation in quantum metrology. Search on Bibsonomy Quantum The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Masahito Hayashi, Yingkai Ouyang Tight Cramér-Rao type bounds for multiparameter quantum metrology through conic programming. Search on Bibsonomy Quantum The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Anna A. Dedkova, Igor V. Florinsky Geomorphometry and microelectronic metrology: Converged realms. Search on Bibsonomy Trans. GIS The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Naoki Takegawa, Noriyuki Furuichi Traceability Management System Using Blockchain Technology and Cost Estimation in the Metrology Field. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Angzhi Fan, Yu Huang 0017, Fei Xu, Sthitie Bom Soft-Sensing Regression Model: From Sensor to Wafer Metrology Forecasting. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Michael Fahrbach, Min Xu, Wilson Ombati Nyang'au, Oleg Domanov, Christian H. Schwalb, Zhi Li, Christian Kuhlmann 0003, Uwe Brand, Erwin Peiner Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Patrick Frank LiG Metrology, Correlated Error, and the Integrity of the Global Surface Air-Temperature Record. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Jie Wang 0042, Richard Chang 0002, Ziyuan Zhao, Ramanpreet Singh Pahwa Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Carl Johan G. Nielsen, André Preumont Adaptive Petal Reflector: In-Lab Software Configurable Optical Testing System Metrology and Modal Wavefront Reconstruction. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Yonggang Yan, Zhengxing Wu, Jianjun Cui, Kai Chen, Yanhong Tang, Ning Yang Calibration Model Optimization for Strain Metrology of Equal Strength Beams Using Deflection Measurements. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Damir Malnar, Miroslav Vrankic Optimising Time-Frequency Distributions: A Surface Metrology Approach. Search on Bibsonomy Sensors The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Chen-Fu Chien 0001, Tran Hong Van Nguyen, Yi-Chiu Li, Ying-Jen Chen Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study. Search on Bibsonomy Comput. Ind. Eng. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Chia-Yu Hsu, Yi-Wei Lu Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention. Search on Bibsonomy Comput. Ind. Eng. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Richard Chang 0002, Wang Jie, Namrata Thakur, Ramanpreet Singh Pahwa AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans. Search on Bibsonomy World Sci. Annu. Rev. Artif. Intell. The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2023, Brescia, Italy, June 6-8, 2023 Search on Bibsonomy MetroInd4.0&IoT The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
16Marko Esche, Levin Ho, Martin Nischwitz, Reinhard Meyer Risk-Based Continuous Quality Control for Software in Legal Metrology. Search on Bibsonomy FedCSIS The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
Displaying result #1 - #100 of 1675 (100 per page; Change: )
Pages: [1][2][3][4][5][6][7][8][9][10][>>]
Valid XHTML 1.1! Valid CSS! [Valid RSS]
Maintained by L3S.
Previously maintained by Jörg Diederich.
Based upon DBLP by Michael Ley.
open data data released under the ODC-BY 1.0 license