Search results for "single-event"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
56	Michael Nicolaidis	A Low-Cost Single-Event Latchup Mitigation Sscheme.	IOLTS	2006	DBLP DOI BibTeX RDF	Latchup, Single-event effects, singleevent lathcup, SEL, mitigation of single-event effects
52	Yantu Mo, Suge Yue	An Efficient Design of Single Event Transients Tolerance for Logic Circuits.	DELTA	2008	DBLP DOI BibTeX RDF	integrated circuit, Single Event Upset, Single Event Transients
42	Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis 0001	Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates.	SBCCI	2006	DBLP DOI BibTeX RDF	fault-tolerant microprocessor, soft errors, single event upsets, single event transients
42	Srivathsan Krishnamohan, Nihar R. Mahapatra	Analysis and design of soft-error hardened latches.	ACM Great Lakes Symposium on VLSI	2005	DBLP DOI BibTeX RDF	multiple-upset, single-event, soft errors, single-event upset, latch, radiation hardening
40	Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt	Single event transients in dynamic logic.	SBCCI	2006	DBLP DOI BibTeX RDF	integrated circuits, dynamic logic, single event transients
35	Mahta Haghi, Jeff Draper	The effect of design parameters on single-event upset sensitivity of MOS current mode logic.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	mos current mode logic (mcml), single event upset (seu), design parameters, radiation hardening
35	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt	Single event transients in combinatorial circuits.	SBCCI	2005	DBLP DOI BibTeX RDF	soft errors, integrated circuits, single event transients
34	Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis	Simulating Single Event Transients in VDSM ICs for Ground Level Radiation.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	single fault propagation, fault simulation, soft-errors, single event upsets
33	Alodeep Sanyal, Sandip Kundu	On Derating Soft Error Probability Based on Strength Filtering.	IOLTS	2007	DBLP DOI BibTeX RDF	soft error rate, logic switching threshold voltage, Soft error, single event upset, single event transient
31	Vinod Viswanath	Multi-log Processor - Towards Scalable Event-Driven Multiprocessors.	DSD	2004	DBLP DOI BibTeX RDF
31	Matteo Sonza Reorda, Massimo Violante	A New Approach to the Analysis of Single Event Transients in VLSI Circuits.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	hardware emulation, fault injection, single event transient
31	Tanay Karnik, Peter Hazucha, Jagdish Patel	Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes.	IEEE Trans. Dependable Secur. Comput.	2004	DBLP DOI BibTeX RDF	reliability, High performance, soft error, error tolerance, single event upset
26	Yongbin Zhou, Jun Yang 0026, Yueke Wang	A New Method for Measuring Single Event Effect Susceptibility of L1 Cache Unit.	SSIRI	2008	DBLP DOI BibTeX RDF	Single event effects, Code Emulated Upsets, Heavy ion Beam, cache
26	Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante	Accurate Analysis of Single Event Upsets in a Pipelined Microprocessor.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	fault injection, single event upsets, dependability evaluation
26	Han Liang, Piyush Mishra, Kaijie Wu 0001	Error Correction On-Demand: A Low Power Register Transfer Level Concurrent Error Correction Technique.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	Concurrent error detection, register-transfer level, single-event upsets, hardware redundancy
26	William Heidergott	SEU tolerant device, circuit and processor design.	DAC	2005	DBLP DOI BibTeX RDF	error detection and correction coding, radiation effects, soft error rate, fault tolerant systems, single event upset, fault masking, temporal redundancy, modular redundancy, fault avoidance
24	Rajesh Garg, Charu Nagpal, Sunil P. Khatri	A fast, analytical estimator for the SEU-induced pulse width in combinational designs.	DAC	2008	DBLP DOI BibTeX RDF	single event upset (SEU), model, analysis
22	Harry Hollander, Bradley S. Carlson, Toby D. Bennett	Synthesis of SEU-tolerant ASICs using concurrent error correction.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	radiation hardening (electronics), SEU-tolerant ASIC synthesis, single error correction/double error detection Hamming code, delay overhead, memory element set partitioning, error correction codes, sequential circuits, sequential circuit, application specific integrated circuits, logic CAD, circuit layout CAD, single event upsets, logic partitioning, Hamming codes, fault tolerant design, area overhead, memory elements, design experiments, concurrent error correction
22	Sajid Baloch, Tughrul Arslan, Adrian Stoica	Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices.	ISQED	2006	DBLP DOI BibTeX RDF
21	Mario García-Valderas, Luis Entrena, Raúl Fernández Cardenal, Celia López-Ongil, Marta Portela-García	SET Emulation Under a Quantized Delay Model.	J. Electron. Test.	2009	DBLP DOI BibTeX RDF	Fault emulation, Fault tolerance, Fault injection, Single event transients
21	Luca Sterpone	Timing Driven Placement for Fault Tolerant Circuits Implemented on SRAM-Based FPGAs.	ARC	2009	DBLP DOI BibTeX RDF	fault tolerance, FPGA, Single Event Upset, Triple Modular Redundancy, Timing-driven Placement
21	Marco Lanuzza, Paolo Zicari, Fabio Frustaci, Stefania Perri, Pasquale Corsonello	An Efficient and Low-Cost Design Methodology to Improve SRAM-Based FPGA Robustness in Space and Avionics Applications.	ARC	2009	DBLP DOI BibTeX RDF	FPGA, Space, Reconfigurable System, Single Event Upsets, Avionics
21	Makoto Sugihara	SEU Vulnerability of Multiprocessor Systems and Task Scheduling for Heterogeneous Multiprocessor Systems.	ISQED	2008	DBLP DOI BibTeX RDF	Heterogeneous Multiprocessor Systems, Reliability, Task Scheduling, Soft Error, Single Event Upset
21	Erik Schüler, Marcelo Ienczczak Erigson, Luigi Carro	Functionally Fault-tolerant DSP Microprocessor using Sigma-delta Modulated Signals.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	error tolerant system, single event upset (SEU), Digital SignalProcessing (DSP), fault-tolerance, sigma-delta
21	Arthur Pereira Frantz, Maico Cassel, Fernanda Lima Kastensmidt, Érika F. Cota, Luigi Carro	Crosstalk- and SEU-Aware Networks on Chips.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	fault tolerance. energy-aware systems, network on chip, crosstalk, single-event upset, hardware-software codesign
21	Ying Huang, Chunyuan Zhang, Dong Liu 0022, Yi Li, Sheng-xin Weng	The Design on SEU-Tolerant Information Processing System of the On-Board-Computer.	APPT	2007	DBLP DOI BibTeX RDF	Dual Fault-Tolerant, Triple Module Redundancy, Cost-Off-The-Shelf, Field Programmable Gate Array, Single-Event-Upsets
21	Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski	Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology.	ACM Great Lakes Symposium on VLSI	2007	DBLP DOI BibTeX RDF	critical charge, soft error, single event transient
21	Arthur Pereira Frantz, Fernanda Lima Kastensmidt, Luigi Carro, Érika F. Cota	Evaluation of SEU and crosstalk effects in network-on-chip switches.	SBCCI	2006	DBLP DOI BibTeX RDF	network-on-chip, crosstalk, single-event upset
21	Balkaran S. Gill, Christos A. Papachristou, Francis G. Wolff	Soft Delay Error Effects in CMOS Combinational Circuits.	VTS	2004	DBLP DOI BibTeX RDF	Soft delay, single event upsets (SEUs), soft error rate (SER), soft errors
21	Kenneth Prager, Michael Vahey, William Farwell, James Whitney, Jon Lieb	A Fault Tolerant Signal Processing Computer.	DSN	2000	DBLP DOI BibTeX RDF	distributed crossbar, Fault detection, voting, single event upset, configurable computing, fault recovery
21	Michael Nicolaidis	Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies.	VTS	1999	DBLP DOI BibTeX RDF	Very deep submicron, soft-errors, single event upsets, fault tolerant design
20	François Bry, Michael Eckert	Rule-Based Composite Event Queries: The Language XChangeEQ and Its Semantics.	RR	2007	DBLP DOI BibTeX RDF
20	Thara Rejimon, Sanjukta Bhanja	A Timing-Aware Probabilistic Model for Single-Event-Upset Analysis.	IEEE Trans. Very Large Scale Integr. Syst.	2006	DBLP DOI BibTeX RDF
19	Arumugam Karthigeyan, Sankararajan Radha, Esakkimuthu Manikandan	Single event transient mitigation techniques for a cross-coupled LC oscillator, including a single-event transient hardened CMOS LC-VCO circuit.	IET Circuits Devices Syst.	2022	DBLP DOI BibTeX RDF
19	Georgios Kottaras, Theodoros Sarris, Athanasios M. Psomoulis, Ilias Ioakeimidis, Angelos Papathanasiou, David Pitchford, Ingmar Sandberg	A low-power, radiation-hardened Single Event Effect rate detection System on a Chip for Real Time Monitoring of Single Event Effects on Low Earth Orbit satellites.	VLSI-SoC	2022	DBLP DOI BibTeX RDF
19	Gehad I. Alkady, Beatrice Shokry, S. Khafagy, Z. Zaher, N. Morsy, Fady A. Abouelghit, Hassanein H. Amer, Betim Cico	Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems.	MECO	2022	DBLP DOI BibTeX RDF
19	Ramin Rajaei, Michael T. Niemier, Xiaobo Sharon Hu	Low-Cost Sequential Logic Circuit Design Considering Single Event Double-Node Upsets and Single Event Transients.	ICCD	2021	DBLP DOI BibTeX RDF
19	Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae	SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET.	IRPS	2019	DBLP DOI BibTeX RDF
19	Aibin Yan, Yuanjie Hu, Jie Song, Xiaoqing Wen	Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications.	DATE	2019	DBLP DOI BibTeX RDF
19	Robért Glein, Philipp Mengs, Florian Rittner, Rainer Wansch, Albert Heuberger	BRAM implementation of a single-event upset sensor for adaptive single-event effect mitigation in reconfigurable FPGAs.	AHS	2017	DBLP DOI BibTeX RDF
19	Pengcheng Huang, Shuming Chen, Jianjun Chen	Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology.	Sci. China Inf. Sci.	2016	DBLP DOI BibTeX RDF
19	Marko S. Andjelkovic, Vladimir Petrovic, Zoran Stamenkovic, Goran S. Ristic, Goran S. Jovanovic	Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch.	J. Electron. Test.	2015	DBLP DOI BibTeX RDF
19	Marko S. Andjelkovic, Vladimir Petrovic, Zoran Stamenkovic, Goran S. Ristic, Goran S. Jovanovic	Simulation-Based Analysis of the Single Event Transient Response of a Single Event Latchup Protection Switch.	DDECS	2015	DBLP DOI BibTeX RDF
19	Mahdi Fazeli, Seyed Ghassem Miremadi, Alireza Ejlali, Ahmad Patooghy	Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.	IET Comput. Digit. Tech.	2009	DBLP DOI BibTeX RDF
18	Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto	Single-Event Upset Analysis and Protection in High Speed Circuits.	ETS	2006	DBLP DOI BibTeX RDF
18	Sajid Baloch, Tughrul Arslan, Adrian Stoica	An Efficient Fault Tolerance Scheme for Preventing Single Event Disruptions in Reconfigurable Architectures.	FPL	2006	DBLP DOI BibTeX RDF
18	Sajid Baloch, Tughrul Arslan, Adrian Stoica	An Efficient Technique for Preventing Single Event Disruptions in Synchronous and Reconfigurable Architectures.	AHS	2006	DBLP DOI BibTeX RDF
18	Eishi Ibe, Hideaki Kameyama, Yasuo Yahagi, Hironaru Yamaguchi	Single Event Effects as a Reliability Issue of IT Infrastructure.	ICITA (1)	2005	DBLP DOI BibTeX RDF
18	Han-Saem Park, Sung-Bae Cho	A Fuzzy Rule-Based System with Ontology for Summarization of Multi-camera Event Sequences.	ICAISC	2008	DBLP DOI BibTeX RDF
18	Asaf Adi, Opher Etzion	Amit - the situation manager.	VLDB J.	2004	DBLP DOI BibTeX RDF	Active technology, High-level languages, Active databases, Composite events
17	Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis	New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs.	DFT	2002	DBLP DOI BibTeX RDF
17	Asaf Adi, Ayelet Biger, David Botzer, Opher Etzion, Ziva Sommer	Context Awareness in Amit.	Active Middleware Services	2003	DBLP DOI BibTeX RDF
17	Cristiana Bolchini, Antonio Miele, Fabio Rebaudengo, Fabio Salice, Donatella Sciuto, Luca Sterpone, Massimo Violante	Software and Hardware Techniques for SEU Detection in IP Processors.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Hardware/software techniques, Single-event upset faults, Reliability, Fault injection
17	Pilar Reyes, Pedro Reviriego, Juan Antonio Maestro, Oscar Ruano	Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study.	J. Signal Process. Syst.	2008	DBLP DOI BibTeX RDF	single event upsets (SEUs), multiple bit upsets (MBUs), fault tolerance, redundancy, soft errors, interleaving
17	Yizheng Zhou, Vijay Lakamraju, Israel Koren, C. M. Krishna 0001	Software-Based Failure Detection and Recovery in Programmable Network Interfaces.	IEEE Trans. Parallel Distributed Syst.	2007	DBLP DOI BibTeX RDF	Programmable Network Interface Card (NIC), Single Event Upset (SEU), radiation induced faults, failure detection, self-testing
17	Shlomi Dolev, Yinnon A. Haviv	Self-Stabilizing Microprocessor: Analyzing and Overcoming Soft Errors.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	Self-stabilization, microprocessor, soft errors, single event upset
17	Gyu Sang Choi, Jin-Ha Kim, Deniz Ersoz, Chita R. Das	A multi-threaded PIPELINED Web server architecture for SMP/SoC machines.	WWW	2005	DBLP DOI BibTeX RDF	asynchronous multi-process event-driven, single event-driven process, symmetric multi-processor, system-on-chip, multi-thread, multi-process
17	Alireza Ejlali, Marcus T. Schmitz, Bashir M. Al-Hashimi, Seyed Ghassem Miremadi, Paul M. Rosinger	Energy efficient SEU-tolerance in DVS-enabled real-time systems through information redundancy.	ISLPED	2005	DBLP DOI BibTeX RDF	single event upset (SEU), dynamic voltage scaling (DVS), information redundancy
17	E. Syam Sundar Reddy, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti 0001, Narayanan Vijaykrishnan	Detecting SEU-Caused Routing Errors in SRAM-Based FPGAs.	VLSI Design	2005	DBLP DOI BibTeX RDF	Complex Logic Blocks, Routing Errors, Vertex Coloring problem, Fault Tolerance, Field Programmable Gate Arrays, Graph Theory, Single Event Upset
17	Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante	A New Approach to Software-Implemented Fault Tolerance.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	fault injection, single event upsets, software-implemented fault tolerance
17	Raoul Velazco, Sana Rezgui, Haissam Ziade	Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	fault injection, single event upset, transient error, radiation
17	Pierluigi Civera, Luca Macchiarulo, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante	An FPGA-Based Approach for Speeding-Up Fault Injection Campaigns on Safety-Critical Circuits.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	FPGA-based fault emulation, fault injection, single event upset, dependability evaluation, fault tolerant circuits
17	Douglas W. Caldwell, David A. Rennels	A Minimalist Fault-Tolerant Microcontroller Design for Embedded Spacecraft Computing.	J. Supercomput.	2000	DBLP DOI BibTeX RDF	fault-insertion testing, space radiation, single-event effects (SEE), fault-tolerance, microcontroller, embedded computing, real-time computing
17	Octavian-Dumitru Mocanu, Joan Oliver	Fault-Tolerant Memory Architecture Against Radiation-Dependent Errors: A Mixed Error Control Approach.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	hamming SEC code, latch-up, memory system, single event upset, built-in current sensor
17	Hungse Cha, Elizabeth M. Rudnick, Janak H. Patel, Ravishankar K. Iyer, Gwan S. Choi	A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults.	IEEE Trans. Computers	1996	DBLP DOI BibTeX RDF	transient fault injection, transient fault modeling, transient fault simulation, fault-tolerance, Single event upset
15	Eze Kamanu, Pratapa Reddy, Kenneth Hsu, Marcin Lukowiak	A New Architecture for Single-Event Detection & Reconfiguration of SRAM-based FPGAs.	HASE	2007	DBLP DOI BibTeX RDF
15	Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell	Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation.	ISVLSI	2007	DBLP DOI BibTeX RDF
15	Jawar Singh, Jimson Mathew, Mohammad Hosseinabady, Dhiraj K. Pradhan	Single Event Upset Detection and Correction.	ICIT	2007	DBLP DOI BibTeX RDF
15	Thara Rejimon, Sanjukta Bhanja	Wide Limited Switch Dynamic Logic Circuit Implementations.	VLSI Design	2006	DBLP DOI BibTeX RDF
14	Hao Ying, Feng Lin 0001	Identification of Single-Event Stochastic Fuzzy Discrete Event Systems: An Equation-Systems-Based Approach.	IEEE Trans. Fuzzy Syst.	2024	DBLP DOI BibTeX RDF
14	Junchao Chen 0001, Thomas Lange, Marko S. Andjelkovic, Aleksandar Simevski, Lu Li, Milos Krstic	Solar Particle Event and Single Event Upset Prediction from SRAM-Based Monitor and Supervised Machine Learning.	IEEE Trans. Emerg. Top. Comput.	2022	DBLP DOI BibTeX RDF
14	Shu Liu, Jiayue Sun, Huaguang Zhang, Meina Zhai	Coordination for Lur'e Multiagent Systems: Fully Distributed Event-Driven Approach With Single-Event Monitoring Condition.	IEEE Trans. Circuits Syst. II Express Briefs	2022	DBLP DOI BibTeX RDF
14	Seth Roffe, Himanshu Akolkar, Alan D. George, Bernabé Linares-Barranco, Ryad Benosman	Neutron-Induced, Single-Event Effects on Neuromorphic Event-Based Vision Sensor: A First Step and Tools to Space Applications.	IEEE Access	2021	DBLP DOI BibTeX RDF
14	Kirolosse M. Girgis, Tohru Hada, Shuichi Matsukiyo	Estimation of Single Event Upset (SEU) rates inside the SAA during the geomagnetic storm event of 15 May 2005.	WiSEE	2021	DBLP DOI BibTeX RDF
14	Rui Gong, Wei Chen 0009, Fang Liu 0002, Kui Dai, Zhiying Wang 0003	A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	SEE tolerance, SEU tolerance, SET tolerance, Asynchronous circuit
14	Fan Wang, Vishwani D. Agrawal	Single Event Upset: An Embedded Tutorial.	VLSI Design	2008	DBLP DOI BibTeX RDF
14	Mihir R. Choudhury, Quming Zhou, Kartik Mohanram	Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques.	ICCAD	2006	DBLP DOI BibTeX RDF
14	Melanie Berg	Fault Tolerance Implementation within SRAM Based FPGA Design Based upon the Increased Level of Single Event Upset Susceptibility.	IOLTS	2006	DBLP DOI BibTeX RDF
14	Quming Zhou, Mihir R. Choudhury, Kartik Mohanram	Design Optimization for Robustness to Single Event Upsets.	VTS	2006	DBLP DOI BibTeX RDF
14	Ming Zhang 0017, Naresh R. Shanbhag	An energy-efficient circuit technique for single event transient noise-tolerance.	ISCAS (1)	2005	DBLP DOI BibTeX RDF
14	Luca Sterpone, Massimo Violante	A design flow for protecting FPGA-based systems against single event upsets.	DFT	2005	DBLP DOI BibTeX RDF
14	Matteo Sonza Reorda, Massimo Violante	Accurate and Efficient Analysis of Single Event Transients in VLSI Circuits.	IOLTS	2003	DBLP DOI BibTeX RDF
14	Rolf Johansson 0002	On Single Event Upset Error Manifestation.	EDCC	1994	DBLP DOI BibTeX RDF
14	Baojun Liu, Cheng Li, Chuang Li, Shuang Zhang	Effect of temperature and single event transient on crosstalk in coupled single-walled carbon nanotube (SWCNT) bundle interconnects.	Int. J. Circuit Theory Appl.	2021	DBLP DOI BibTeX RDF
14	Xixi Dai, Haibin Wang, Jiamin Chu, Zhi Liu 0004, Li Cai, Kang Yan	A Single Event Upset Resilient Latch Design with Single Node Upset Immunity.	J. Electron. Test.	2019	DBLP DOI BibTeX RDF
14	Michael Newton, Brook Danger, Li Chen 0001, Ramaswami Sammynaiken, Haibin Wang, David M. Hiemstra, Valeri Kirischian	Single photon absorption laser facility for single event effect testing.	CCECE	2016	DBLP DOI BibTeX RDF
14	Hoda Pahlevanzadeh, Qiaoyan Yu	A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients.	J. Electron. Test.	2014	DBLP DOI BibTeX RDF
14	Garrett R. Yaun, David W. Bauer, Christopher D. Carothers	Sharing event data in optimistically scheduled multicast applications.	WSC	2005	DBLP DOI BibTeX RDF
14	Martin Bernauer, Gerti Kappel, Gerhard Kramler	Composite events for xml.	WWW	2004	DBLP DOI BibTeX RDF	active behavior, event algebra, xml, event-condition-action rule, composite event
14	Sajid Baloch, Tughrul Arslan, Adrian Stoica	Radiation Hardened Coarse-Grain Reconfigurable Architecture for Space Applications.	IPDPS	2007	DBLP DOI BibTeX RDF
14	Ari Virtanen	Radiation Effects Facility RADEF.	IOLTW	2002	DBLP DOI BibTeX RDF
11	Lyndon S. Kennedy, Mor Naaman	Less talk, more rock: automated organization of community-contributed collections of concert videos.	WWW	2009	DBLP DOI BibTeX RDF	synchronization, video, social media, audio fingerprinting
11	Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard	Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.	IOLTS	2007	DBLP DOI BibTeX RDF
11	Chetan Shiva Shankar, Roy H. Campbell	Ordering Management Actions in Pervasive Systems using Specification-enhanced Policies.	PerCom	2006	DBLP DOI BibTeX RDF
11	Chetan Shiva Shankar, Anand Ranganathan, Roy H. Campbell	An ECA-P Policy-based Framework for Managing Ubiquitous Computing Environments.	MobiQuitous	2005	DBLP DOI BibTeX RDF
10	Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda	Safety Evaluation of NanoFabrics.	DFT	2007	DBLP DOI BibTeX RDF
9	Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost 0002	Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation.	IEEE Trans. Reliab.	2024	DBLP DOI BibTeX RDF
9	Chenyu Zhang, Yan Li 0084, Wenfa Zhan, Wenping Geng, Ting Liang, Xiaoyang Zeng	Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology.	Microelectron. J.	2024	DBLP DOI BibTeX RDF
9	Baojun Liu, Xiaokuo Yang, Jing Zhu	Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET.	Microelectron. J.	2024	DBLP DOI BibTeX RDF
9	Xintong Xie, Shuxiang Sun, Zhijia Zhao 0005, Pengfei Zhang, Jie Wei, Xin Zhou, Jingyu Shen, Jinpeng Qiu, Xiaorong Luo	Improvement of reverse conduction characteristic and single event effect for a novel vertical GaN field effect transistor with an integrated MOS-channel diode.	Microelectron. J.	2024	DBLP DOI BibTeX RDF