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Found 1201 publication records. Showing 1201 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Tadeu Mota Frutuoso, Jose Lugo-Alvarez, Xavier Garros, Laurent Brunet, Joris Lacord, Louis Gerrer, Mikaël Cassé, Edoardo Catapano, Claire Fenouillet-Béranger, François Andrieu, Fred Gaillard, Philippe Ferrari |
Impact of spacer interface charges on performance and reliability of low temperature transistors for 3D sequential integration.  |
IRPS  |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Gang-Jun Kim, Moonjee Yoon, SungHwan Kim, Myeongkyu Eo, Shinhyung Kim, Taehun You, Namhyun Lee, Kijin Kim, Sangwoo Pae |
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | James Palmer, Galor Zhang, Justin R. Weber, Cheyun Lin, Christopher Perini, Rahim Kasim |
Intrinsic Reliability of BEOL interlayer dielectric. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Hai Jiang 0005, Jinju Kim, Kihyun Choi, Hyewon Shim, Hyunchul Sagong, Junekyun Park, Hwasung Rhee, Euncheol Lee |
Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | P. Srinivasan 0002, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall |
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Wangxin He, Wonbo Shim, Shihui Yin, Xiaoyu Sun 0001, Deliang Fan, Shimeng Yu, Jae-sun Seo |
Characterization and Mitigation of Relaxation Effects on Multi-level RRAM based In-Memory Computing. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Liu Yang, Qi Wang 0041, Qianhui Li, Xiaolei Yu, Jing He 0020, Zongliang Huo |
Efficient Data Recovery Technique for 3D TLC NAND Flash Memory based on WL Interference. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yasuyuki Morishita, Satoshi Maeda |
Characterization of NMOS-based ESD Protection for Wide-range Pulse Immunity. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Patrick Fiorenza, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, Clarice Di Martino, Alfio Russo, Mario Saggio, Carlo Venuto, Elisa Vitanza, Edoardo Zanetti, Filippo Giannazzo, Fabrizio Roccaforte |
Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Bruna Mazza, Salvatore Patané, Francesco Cordiano, Massimiliano Giliberto, Giovanni Renna, Andrea Severino, Edoardo Zanetti, Massimo Boscaglia, Giovanni Franco |
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Zhenjun Zhang, Matthias Kraatz, Meike Hauschildt, Seungman Choi, André Clausner, Ehrenfried Zschech, Martin Gall |
Strategy to Characterize Electromigration Short Length Effects in Cu/low-k Interconnects. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Kento Kariya, Atsushi Yumiba, Masaya Ukita, Toru Ikeda, Masaaki Koganemaru, Noriyuki Masago |
Study of the microstructure and the mechanical properties of Pb-2.5Ag-2Sn solder joint. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Sayeef S. Salahuddin |
Ultrathin Ferroelectricity and Its Application in Advanced Logic and Memory Devices. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel |
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | John D. Cressler |
New Developments in SiGe HBT Reliability for RF Through mmW Circuits. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Halid Mulaosmanovic, Patrick D. Lomenzo, Uwe Schroeder, Stefan Slesazeck, Thomas Mikolajick, Benjamin Max |
Reliability aspects of ferroelectric hafnium oxide for application in non-volatile memories. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Eliana Acurio, Lionel Trojman, Brice De Jaeger, Benoit Bakeroot, Stefaan Decoutere |
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar |
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Nilotpal Choudhury, Tarun Samadder, Ravi Tiwari, Huimei Zhou, Richard G. Southwick, Miaomiao Wang 0006, Souvik Mahapatra |
Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash 0007, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan |
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Davide Tierno, Kristof Croes, Arjun Ajaykumar, Siva Ramesh, Geert Van den Bosch, Maarten Rosmeulen |
Reliability of Mo as Word Line Metal in 3D NAND. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | P. Srinivasan 0002, Da Song, David Rose, Maurice LaCroix, Arunima Dasgupta |
Back gate bias effect and layout dependence on Random Telegraph Noise in FDSOI technologies. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Jin-Woo Han, M. Meyyappan, Jungsik Kim |
Single Event Hard Error due to Terrestrial Radiation. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Balraj Arunachalam, Jean-Emmanuel Broquin, Quentin Rafhay, David Roy, Anne Kaminski |
Simulation Study of the Origin of Ge High Speed Photodetector Degradation. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yasunori Tateno, Ken Nakata, Akio Oya, Keita Matsuda, Yoshihide Komatsu, Shinichi Osada, Masafumi Hirata, Shigeyuki Ishiyama, Toshiki Yoda, Atsushi Nitta, Tomio Sato |
Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Xavier Federspiel, Abdourahmane Camara, Audrey Michard, Cheikh Diouf, Florian Cacho |
HCI Temperature sense effect from 180nm to 28nm nodes. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Gaspard Hiblot, Nouredine Rassoul, Lieve Teugels, Katia Devriendt, Adrian Vaisman Chasin, Michiel van Setten, Attilio Belmonte, Romain Delhougne, Gouri Sankar Kar |
Process-induced charging damage in IGZO nTFTs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yan Ouyang, Suhui Yang, Dandan Yin, Xiang Huang, Zhiqiang Wang, Shengwei Yang, Kun Han, Zhongyi Xia |
Excellent Reliability of Xtacking™ Bonding Interface. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Sumy Jose, Chunshan Yin, Yu Chen, Cheong Min Hong, Mehul D. Shroff, Xiaoling Zhao, Fan Zhang |
An efficient methodology to evaluate BEOL and MOL TDDB in advanced nodes. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Seung-Mo Kim, Thi Mi Hanh Nyugen, Jungwon Oh, Yongsu Lee, Soo Cheol Kang, Ho-In Lee, Cihyun Kim, Surajit Some, Hyeon Jun Hwang, Byoung Hun Lee |
Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Ning Duan, Vignesh Subramanian, Edgar Olthof, Paul Eggenkamp, Michiel van Soestbergen, Richard Braspenning |
Moisture diffusion rate in an ultra-low-k dielectric and its effect on the dielectric reliability. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Jifa Hao, Yuhang Sun, Amartya Ghosh |
Charge pumping source-drain current for gate oxide interface trap density in MOSFETs and LDMOS. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Matchima Buddhanoy, Sadman Sakib, Biswajit Ray |
Runtime Variability Monitor for Data Retention Characteristics of Commercial NAND Flash Memory. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | NamHyuk Yang, JinHwan Kim, GeonGu Park, ChulHyuk Kwon, SeungTaek Lee, SangWoo Pae, HooSung Kim, SangWon Hwang |
A Study on System Level UFS M-PHY Reliability Measurement Method Using RDVS. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Robin Degraeve, Taras Ravsher, Shoichi Kabuyanagi, Andrea Fantini, Sergiu Clima, Daniele Garbin, Gouri Sankar Kar |
Modeling and spectroscopy of ovonic threshold switching defects. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Moon Soo Lee, Inhak Baick, Min Kim, Seo Hyun Kwon, Myeong Soo Yeo, Hwasung Rhee, Euncheol Lee |
Chip to Package Interaction Risk Assessment of FCBGA Devices using FEA Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Milan Shah, Yujie Zhou, David LaFonteese, Elyse Rosenbaum |
Considerations in High Voltage Lateral ESD PNP Design. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam |
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Kevin A. Stewart, Keiichi Kimura, Matt Ring, Koen Noldus, Pat Hulse, Rick C. Jerome, Akihiro Hasegawa, Jeff P. Gambino, David T. Price |
Assessing SiCr resistor drift for automotive analog ICs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan |
Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | John Scarpulla |
Guidelines for Space Qualification of GaN HEMTs and MMICs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yongju Zheng, Rahul R. Potera, Tony Witt |
Characterization of Early Breakdown of SiC MOSFET Gate Oxide by Voltage Ramp Tests. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz |
Composition Segregation of Ge-Rich GST and Its Effect on Reliability. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Wonbo Shim, Jian Meng, Xiaochen Peng, Jae-sun Seo, Shimeng Yu |
Impact of Multilevel Retention Characteristics on RRAM based DNN Inference Engine. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Emma R. Schmidgall, Flavio Griggio, George H. Thiel, Sherman E. Peek, Bhargav Yelamanchili, Archit Shah, Vaibhav Gupta, John A. Sellers, Michael C. Hamilton, David B. Tuckerman, Samuel d'Hollosy |
Reliability Characterization of a Flexible Interconnect for Cryogenic and Quantum Applications. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Lixia Han, Yachen Xiang, Peng Huang 0004, Guihai Yu, Runze Han, Xiaoyan Liu, Jinfeng Kang |
Novel Weight Mapping Method for Reliable NVM based Neural Network. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Chao-Yang Chen, Jian-Hsing Lee, Karuna Nidhi, Tzer-Yaa Bin, Geeng-Lih Lin, Ming-Dou Ker |
Study on the Guard Rings for Latchup Prevention between HV-PMOS and LV-PMOS in a 0.15-µm BCD Process. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | W. Y. Yang, E. R. Hsieh, C. H. Cheng, B. Y. Chen, K. S. Li, Steve S. Chung |
A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring Forming-Free and High Immunity to Sneak Path. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Konner E. K. Holden, Gavin D. R. Hall, Michael Cook 0004, Chris Kendrick, Kaitlyn Pabst, Bruce Greenwood, Robin Daugherty, Jeff P. Gambino, Derryl D. J. Allman |
Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | P. Srinivasan 0002, Fernando Guarin |
CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Dongyoung Kim, Nick Yun, Woongje Sung |
Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Abhitosh Vais, Brent Hsu, Olga Syshchyk, Hao Yu, AliReza Alian, Yves Mols, Komal Vondkar Kodandarama, Bernardette Kunert, Niamh Waldron, Eddy Simoen, Nadine Collaert |
A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Vamsi Putcha, Liang Cheng, AliReza Alian, Ming Zhao, Hai Lu, Bertrand Parvais, Niamh Waldron, Dimitri Linten, Nadine Collaert |
On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho |
Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Rakesh Ranjan, Ki-Don Lee, Md Iqbal Mahmud, Mohammad Shahriar Rahman, Pavitra Ramadevi Perepa, Charles Briscoe LaRow, Caleb Dongkyun Kwon, Maihan Nguyen, Minhyo Kang, Ashish Kumar Jha, Ahmed Shariq, Shamas Musthafa Ummer, Susannah Laure Prater, Hyunchul Sagong, HwaSung Rhee |
Systematic Study of Process Impact on FinFET Reliability. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Neel Chatterjee, John Ortega 0002, Inanc Meric, Peng Xiao, Ilan Tsameret |
Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Elena Fabris, Matteo Borga, Niels Posthuma, Ming Zhao, Brice De Jaeger, Shuzhen You, Stefaan Decoutere, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni |
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yang Xiang, Stanislav Tyaginov, Michiel Vandemaele, Zhicheng Wu, Jacopo Franco, Erik Bury, Brecht Truijen, Bertrand Parvais, Dimitri Linten, Ben Kaczer |
A BSIM-Based Predictive Hot-Carrier Aging Compact Model. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | |
IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021 |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung |
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Alicja Lesniewska, Olalla Varela Pedreira, Melina Lofrano, Gayle Murdoch, Marleen H. van der Veen, Anish Dangol, Naoto Horiguchi, Zsolt Tökei, Kris Croes |
Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Ryo Kishida, Ikuo Suda, Kazutoshi Kobayashi |
Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Wei Liu, Yaru Ding, Liang Zhao, Yi Zhao |
Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Balaji Narasimham, Vikas Chaudhary, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva |
Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Rajesh Kashyap |
Silicon lifecycle management (SLM) with in-chip monitoring. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Sagar Premnath Karalkar, Vishal Ganesan, Milova Paul, Kyong Jin Hwang, Robert Gauthier 0002 |
Design Optimization of MV-NMOS to Improve Holding Voltage of a 28nm CMOS Technology ESD Power Clamp. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Tarun Samadder, Satyam Kumar 0003, Karansingh Thakor, Souvik Mahapatra |
A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | M. Monishmurali, Mayank Shrivastava |
A Novel High Voltage Drain Extended FinFET SCR for SoC Applications. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Subrat Mishra, Pieter Weckx, Odysseas Zografos, Ji-Yung Lin, Alessio Spessot, Francky Catthoor |
Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Angeliki Tataridou, Gérard Ghibaudo, Christoforos G. Theodorou |
"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause, Andreas Graff, Michél Simon-Najasek |
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Ooi Michael, Loo Tung Lun, Koay Eng Keong |
Methodology to improve Safety Critical SoC based platform: a case study. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Joel Minguet Lopez, Lucas Hudeley, Laurent Grenouillet, Diego Alfaro Robayo, Jury Sandrini, Gabriele Navarro, Mathieu Bernard, Catherine Carabasse, Damien Deleruyelle, Niccolo Castellani, Marc Bocquet, Jean-Michel Portal, Etienne Nowak, Gabriel Molas |
Elucidating 1S1R operation to reduce the read voltage margin variability by stack and programming conditions optimization. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi |
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Huimei Zhou, Miaomiao Wang 0006, Ruqiang Bao, Tian Shen, Ernest Y. Wu, Richard G. Southwick, Jingyun Zhang, Veeraraghavan S. Basker, Dechao Guo |
TDDB Reliability in Gate-All-Around Nanosheet. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim |
An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Houman Zahedmanesh, Olalla Varela Pedreira, Zsolt Tokei, Kristof Croes |
Electromigration limits of copper nano-interconnects. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Marcello Cioni, Alessandro Bertacchini, Alessandro Mucci, Giovanni Verzellesi, Paolo Pavan, Alessandro Chini |
Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Gokul Krishnan, Jingbo Sun, Jubin Hazra, Xiaocong Du, Maximilian Liehr, Zheng Li 0020, Karsten Beckmann, Rajiv V. Joshi, Nathaniel C. Cady, Yu Cao 0001 |
Robust RRAM-based In-Memory Computing in Light of Model Stability. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Thomas Neyer, Martin Domeij, Hrishikesh Das, Swapna Sunkari |
Is there a perfect SiC MosFETs Device on an imperfect crystal? |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Paul Salmen, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Gerald Rescher, Thomas Aichinger |
A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Milan Pesic, Bastien Beltrando, Andrea Padovani, Shruba Gangopadhyay, Muthukumar Kaliappan, Michael Haverty, Marco A. Villena, Enrico Piccinini, Matteo Bertocchi, Tony Chiang, Luca Larcher, Jack Strand, Alexander L. Shluger |
Variability sources and reliability of 3D - FeFETs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Shudong Huang, Elyse Rosenbaum |
Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Jacopo Franco, Robin Degraeve, Adrian Vaisman Chasin, Zhicheng Wu, Erik Bury, Yang Xiang, Hans Mertens, Guido Groeseneken |
The properties, effect and extraction of localized defect profiles from degraded FET characteristics. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Dimple Kochar, Tarun Samadder, Subhadeep Mukhopadhyay 0003, Souvik Mahapatra |
Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Shy-Jay Lin, Yen-Lin Huang, MingYaun Song, Chien-Ming Lee, Fen Xue, Guan-Long Chen, Shan-Yi Yang, Yao-Jen Chang, I-Jung Wang, Yu-Chen Hsin, Yi-Hui Su, Jeng-Hua Wei, Chi-Feng Pai, Shan X. Wang, Carlos H. Diaz |
Challenges toward Low-Power SOT-MRAM. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Robert L. Bruce, Syed Ghazi Sarwat, Irem Boybat, Cheng-Wei Cheng, Wanki Kim, S. R. Nandakumar, Charles Mackin, Timothy Philip, Zuoguang Liu, Kevin Brew, Nanbo Gong, Injo Ok, Praneet Adusumilli, Katie Spoon, Stefano Ambrogio, Benedikt Kersting, Thomas Bohnstingl, Manuel Le Gallo, Andrew Simon, Ning Li, Iqbal Saraf, Jin-Ping Han, Lynne M. Gignac, John M. Papalia, Tenko Yamashita, Nicole Saulnier, Geoffrey W. Burr, Hsinyu Tsai, Abu Sebastian, Vijay Narayanan, Matthew BrightSky |
Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Shengnan Zhu, Tianshi Liu, Marvin H. White, Anant K. Agarwal, Arash Salemi, David Sheridan |
Investigation of Gate Leakage Current Behavior for Commercial 1.2 kV 4H-SiC Power MOSFETs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Shinhee Han, Junghyuk Lee, Kiseok Suh, Kyungtae Nam, Daeeun Jeong, Sechung Oh, Sohee Hwang, Yongsung Ji, Kilho Lee, Kangho Lee, Yoonjong Song, Yeongki Hong, Gitae Jeong |
Reliability of STT-MRAM for various embedded applications. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Giusy Lama, Mathieu Bernard, Nicolas Bernier, Guillaume Bourgeois, Emmanuel Nolot, Niccolo Castellani, Julien Garrione, Marie Claire Cyrille, Gabriele Navarro, Etienne Nowak |
Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | James Farmer, William Whitehead, Andrew Hall, Dmitry Veksler, Gennadi Bersuker, David Z. Gao, Al-Moatasem El-Sayed, Thomas Durrant, Alexander L. Shluger, Thomas Rueckes, Lee Cleveland, Harry Luan, Rahul Sen |
Mitigating switching variability in carbon nanotube memristors. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Tonmoy Dhar, Jitesh Poojary, Ramesh Harjani, Sachin S. Sapatnekar |
Aging of Current DACs and its Impact in Equalizer Circuits. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Gerhard Rzepa, Markus Karner, Oskar Baumgartner, Georg Strof, Franz Schanovsky, Ferdinand Mitterbauer, Christian Kernstock, Hui-Wen Karner, Pieter Weckx, Geert Hellings, Dieter Claes, Zhicheng Wu, Yang Xiang, Thomas Chiarella, Bertrand Parvais, Jérôme Mitard, Jacopo Franco, Ben Kaczer, Dimitri Linten, Zlatan Stanojevic |
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Zhwen Chen, Young-Suk Kim, Tadashi Fukuda, Koji Sakui, Takayuki Ohba, Tatsuji Kobayashi, Takashi Obara |
Reliability of Wafer-Level Ultra-Thinning down to 3 µm using 20 nm-Node DRAMs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Ming-Liang Wei, Hussam Amrouch, Cheng-Lin Sung, Hang-Ting Lue, Chia-Lin Yang, Keh-Chung Wang, Chih-Yuan Lu |
Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Hao Chang, Longda Zhou, Hong Yang, Zhigang Ji, Qianqian Liu, Eddy Simoen, Huaxiang Yin, Wenwu Wang 0006 |
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Shanmuganathan Palanisamy, Thomas Basler, Josef Lutz, Cesare Künzel, Larissa Wehrhahn-Kilian, Rudolf Elpelt |
Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Salvatore Race, Thomas Ziemann, Shweta Tiwari, Ivana Kovacevic-Badstuebner, Ulrike Grossner |
Accuracy of Thermal Analysis for SiC Power Devices. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Guido T. Sasse, Vignesh Subramanian, Ljubo Radic |
Aging models for n- and p-type LDMOS covering low, medium and high VGS operation. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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| 1 | Aarti Rathi, P. Srinivasan 0002, Fernando Guarin, Abhisek Dixit |
Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications. |
IRPS |
2021 |
DBLP DOI BibTeX RDF |
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