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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 1091 occurrences of 565 keywords
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Results
Found 1565 publication records. Showing 1565 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
103 | Stefan Andrei, Albert M. K. Cheng |
Verifying Linear Real-Time Logic Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RTSS ![In: Proceedings of the 28th IEEE Real-Time Systems Symposium (RTSS 2007), 3-6 December 2007, Tucson, Arizona, USA, pp. 333-342, 2007, IEEE Computer Society, 0-7695-3062-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
94 | Lin Zhong 0001, Srivaths Ravi 0001, Anand Raghunathan, Niraj K. Jha |
RTL-Aware Cycle-Accurate Functional Power Estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10), pp. 2103-2117, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
88 | Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001 |
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(2), pp. 179-187, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
fault modeling, DFT, TPG, RTL |
86 | Steve Haynal, Timothy Kam, Michael Kishinevsky, Emily Shriver, Xinning Wang |
A System Verilog Rewriting System for RTL Abstraction with Pentium Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 6th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2008), June 5-7, 2008, Anaheim, CA, USA, pp. 79-88, 2008, IEEE Computer Society, 978-1-4244-2417-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
86 | Alfred Kölbl, Jerry R. Burch, Carl Pixley |
Memory Modeling in ESL-RTL Equivalence Checking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 205-209, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
86 | Indradeep Ghosh, Masahiro Fujita |
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 37th Conference on Design Automation, Los Angeles, CA, USA, June 5-9, 2000., pp. 43-48, 2000, ACM. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
80 | Zdenek Kotásek, F. Zboril |
RT level testability analysis to reduce test application time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 23rd EUROMICRO Conference '97, New Frontiers of Information Technology, 1-4 September 1997, Budapest, Hungary, pp. 104-, 1997, IEEE Computer Society, 0-8186-8129-2. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
register transfer level testability analysis, RTL element classification, RTL circuit transformation, labelled directed graph, PROLOG environment, implementation principles, logic testing, test application time reduction |
79 | Lin Zhong 0001, Srivaths Ravi 0001, Anand Raghunathan, Niraj K. Jha |
Power estimation for cycle-accurate functional descriptions of hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2004 International Conference on Computer-Aided Design, ICCAD 2004, San Jose, CA, USA, November 7-11, 2004, pp. 668-675, 2004, IEEE Computer Society / ACM, 0-7803-8702-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
79 | Pascal Urard, Asma Maalej, Roberto Guizzetti, Nitin Chawla |
Leveraging sequential equivalence checking to enable system-level to RTL flows. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 816-821, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
formal verification, high-level synthesis, equivalence checking, system-level models, RTL models |
79 | Stefan Andrei, Albert Mo Kim Cheng |
Faster Verification of RTL-Specified Systems via Decomposition and Constraint Extension. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RTSS ![In: Proceedings of the 27th IEEE Real-Time Systems Symposium (RTSS 2006), 5-8 December 2006, Rio de Janeiro, Brazil, pp. 67-76, 2006, IEEE Computer Society, 0-7695-2761-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
71 | Indradeep Ghosh, Masahiro Fujita |
Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(3), pp. 402-415, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
71 | Alessandro Bogliolo, Luca Benini, Giovanni De Micheli |
Regression-based RTL power modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 5(3), pp. 337-372, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
RTL power modeling, adaptive characterization, functional macros, regression models, RTL design |
71 | Kelvin Ng |
Challenges in using system-level models for RTL verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 812-815, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
simulation, equivalence checking, system-level model, RTL models |
71 | Aloysius K. Mok, Duu-Chung Tsou, Ruud C. M. de Rooij |
The MSP.RTL real-time scheduler synthesis tool. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RTSS ![In: Proceedings of the 17th IEEE Real-Time Systems Symposium (RTSS '96), December 4-6, 1996, Washington, DC, USA, pp. 118-128, 1996, IEEE Computer Society, 0-8186-7689-2. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
MSP RTL real time scheduler synthesis tool, scheduler synthesis algorithm, real time scheduling problem, temporal constraint satisfaction problem, temporal constraint graph, input timing specification, incremental positive cycle detection algorithm, real time scheduling theory, Boeing 777 Integrated Airplane Information Management System, AIMS, constraint satisfaction, processor scheduling, timing constraints, resource constraints, application domains, search strategies, cyclic schedules, feasible schedule, timing semantics, real time logic |
71 | Loganathan Lingappan, Srivaths Ravi 0001, Niraj K. Jha |
Satisfiability-based test generation for nonseparable RTL controller-datapath circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3), pp. 544-557, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
71 | Liang Zhang 0012, Indradeep Ghosh, Michael S. Hsiao |
A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11), pp. 2526-2538, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
71 | Shuqing Zhao, Daniel D. Gajski |
Structural operational semantics for supporting multi-cycle operations in RTL HDLs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 3rd ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2005), 11-14 July 2005, Verona, Italy, Proceedings, pp. 45-53, 2005, IEEE Computer Society, 0-7803-9227-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
71 | Farn Wang, Aloysius K. Mok |
RTL and Refutation by Positive Cycles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FME ![In: FME '94: Industrial Benefit of Formal Methods, Second International Symposium of Formal Methods Europe, Barcelona, Spain, October 24-18, 1994, Proceedings, pp. 659-680, 1994, Springer, 3-540-58555-9. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
64 | Luc Séméria, Renu Mehra, Barry M. Pangrle, Arjuna Ekanayake, Andrew Seawright, Daniel Ng |
RTL c-based methodology for designing and verifying a multi-threaded processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002, pp. 123-128, 2002, ACM, 1-58113-461-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
formal equivalence, design, verification, RTL, checking, C/C++ |
64 | Toshinori Hosokawa, Kenichi Kawaguchi, Mitsuyasu Ohta, Michiaki Muraoka |
A Design for testability Method Using RTL Partitioning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 88-93, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
line-up structure, internally balanced structure, acyclic structure, partitioning, ATPG, DFT, RTL, isolation, balanced structure |
63 | Prasenjit Basu, Sayantan Das 0001, Ansuman Banerjee, Pallab Dasgupta, P. P. Chakrabarti 0001, Chunduri Rama Mohan, Limor Fix, Roy Armoni |
Design-Intent Coverage - A New Paradigm for Formal Property Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10), pp. 1922-1934, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
63 | Simone Medardoni, Davide Bertozzi, Enrico Macii |
Power-optimal RTL arithmetic unit soft-macro selection strategy for leakage-sensitive technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007, pp. 159-164, 2007, ACM, 978-1-59593-709-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
RTL synthesis, leakage-aware, power management, selection strategy |
63 | Shu-Hsuan Chou, Chi-Neng Wen, Yan-Ling Liu, Tien-Fu Chen |
VeriC: A semi-hardware description language to bridge the gap between ESL design and RTL models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 535-540, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
63 | Anmol Mathur, Qi Wang |
Power Reduction Techniques and Flows at RTL and System Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, pp. 28-29, 2009, IEEE Computer Society, 978-0-7695-3506-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
63 | Dongwan Shin, Andreas Gerstlauer, Rainer Dömer, Daniel Gajski |
An Interactive Design Environment for C-Based High-Level Synthesis of RTL Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 16(4), pp. 466-475, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
63 | Nicola Bombieri, Franco Fummi, Valerio Guarnieri |
Accelerating RTL Fault Simulation through RTL-to-TLM Abstraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, pp. 117-122, 2011, IEEE Computer Society, 978-0-7695-4433-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
RTL fault simulation, fault simulation acceleration, RTL-to-TLM abstraction |
57 | Li Shen 0002 |
VFSim: Concurrent Fault Simulation at Register Transfer Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Sci. Technol. ![In: J. Comput. Sci. Technol. 20(2), pp. 175-186, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
concurrent fault simulation, fault model, RTL, Verilog, high-level testing, circuit modeling |
56 | Farnam Jahanian, Aloysius K. Mok |
Modechart: A Specification Language for Real-Time Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 20(12), pp. 933-947, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
Modechart, absolute timing, real-time clock, RTL formulas, RTL assertions, graphical implementation, SARTOR, real-time systems, real-time systems, semantics, specification languages, specification language, rapid prototyping, timing constraints, abstraction levels, logic programming languages, hierarchical organization, real-time logic |
56 | Xiushan Feng, Alan J. Hu |
Early cutpoint insertion for high-level software vs. RTL formal combinational equivalence verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 1063-1068, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
cutpoints, formal equivalence checking, software, RTL |
56 | Loganathan Lingappan, Niraj K. Jha |
Unsatisfiability Based Efficient Design for Testability Solution for Register-Transfer Level Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 418-423, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
56 | Stephen Paynter |
Real-Time Logic Revisited. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FME ![In: FME 2001: Formal Methods for Increasing Software Productivity, International Symposium of Formal Methods Europe, Berlin, Germany, March 12-16, 2001, Proceedings, pp. 300-317, 2001, Springer, 3-540-41791-5. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
56 | Indradeep Ghosh, Srivaths Ravi 0001 |
On automatic generation of RTL validation test benches using circuit testing techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, Washington, DC, USA, April 28-29, 2003, pp. 289-294, 2003, ACM, 1-58113-677-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
OCCOM, RTL ATPG, RTL testing, path coverage, small validation, toggle coverage, test, testing, generation, ATPG, fault coverage, code coverage, test sets, design validation, coverage metrics, universal test sets, testbench, branch coverage |
55 | Amin Asghari, Seied Ahmad Motamedi, Sepehr Attarchi |
Effective RTL Method to Develop On-Line Self-Test Routine for the Processors Using the Wavelet Transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACIS-ICIS ![In: 7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008, 14-16 May 2008, Portland, Oregon, USA, pp. 33-38, 2008, IEEE Computer Society, 978-0-7695-3131-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
On-line low-cost testing, Spectral test pattern generating, Software-based self-testing (SBST), Register transfer level (RTL), Processor testing |
55 | Elif Alpaslan, Yu Huang 0005, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak |
Reducing Scan Shift Power at RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 139-146, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Test Power Reduction, Power-Sensitive Scan Cell, RTL DFT, Timing Closure, Scan Based Test |
55 | Yasuhiro Ito, Yutaka Sugawara, Mary Inaba, Kei Hiraki |
CVC: The C to RTL compiler for callback-based verification model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPL ![In: FPL 2008, International Conference on Field Programmable Logic and Applications, Heidelberg, Germany, 8-10 September 2008, pp. 499-502, 2008, IEEE, 978-1-4244-1961-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
55 | Nicola Bombieri, Franco Fummi, Graziano Pravadelli |
On the evaluation of transactor-based verification for reusing TLM assertions and testbenches at RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 1007-1012, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
55 | Shuqing Zhao, Daniel D. Gajski |
Defining an Enhanced RTL Semantics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, pp. 548-553, 2005, IEEE Computer Society, 0-7695-2288-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
55 | José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira 0001 |
A Probabilistic Method for the Computation of Testability of RTL Constructs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France, pp. 176-181, 2004, IEEE Computer Society, 0-7695-2085-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
55 | Qi Wang, Sumit Roy 0003 |
RTL Power Optimization with Gate-Level Accuracy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2003 International Conference on Computer-Aided Design, ICCAD 2003, San Jose, CA, USA, November 9-13, 2003, pp. 39-45, 2003, IEEE Computer Society / ACM, 1-58113-762-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
55 | Loganathan Lingappan, Srivaths Ravi 0001, Niraj K. Jha |
Test Generation for Non-separable RTL Controller-datapath Circuits using a Satisfiability based Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings, pp. 187-193, 2003, IEEE Computer Society, 0-7695-2025-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
55 | Shuqing Zhao, Daniel Gajski |
Modeling a new RTL semantics in C++. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (5) ![In: Proceedings of the 2002 International Symposium on Circuits and Systems, ISCAS 2002, Scottsdale, Arizona, USA, May 26-29, 2002, pp. 741-744, 2002, IEEE, 0-7803-7448-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
55 | Peer Johannsen |
BooStER: Speeding Up RTL Property Checking of Digital Designs by Word-Level Abstarction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CAV ![In: Computer Aided Verification, 13th International Conference, CAV 2001, Paris, France, July 18-22, 2001, Proceedings, pp. 373-377, 2001, Springer, 3-540-42345-1. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
55 | Vamsi Boppana, Indradeep Ghosh, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita |
Hierarchical Error Diagnosis Targeting RTL Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India, pp. 436-441, 2000, IEEE Computer Society, 0-7695-0487-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Verification, Testing, Debugging, Diagnosis, Fault modeling, Error modeling |
48 | Wei Zhao, Christos A. Papachristou |
Synthesis of reusable DSP cores based on multiple behaviors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1996, San Jose, CA, USA, November 10-14, 1996, pp. 103-108, 1996, IEEE Computer Society / ACM, 0-8186-7597-7. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
RTL components, RTL structure, design process complexity, design time, multiple behaviors, reusable DSP cores synthesis, digital signal processing chips |
48 | George Sobral Silveira, Alisson Vasconcelos de Brito, Elmar U. K. Melcher |
Functional verification of power gate design in SystemC RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 22st Annual Symposium on Integrated Circuits and Systems Design: Chip on the Dunes, SBCCI 2009, Natal, Brazil, August 31 - September 3, 2009, 2009, ACM, 978-1-60558-705-9. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
simulation, SystemC, RTL, functional verification, power gate |
48 | Hyunuk Jung, Hoeseok Yang, Soonhoi Ha |
Optimized RTL Code Generation from Coarse-Grain Dataflow Specification for Fast HW/SW Cosynthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Signal Process. Syst. ![In: J. Signal Process. Syst. 52(1), pp. 13-34, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
VHDL, system level design, RTL, dataflow graph (DFG), HW/SW codesign |
48 | Jens Horstmannshoff, Thorsten Grötker, Heinrich Meyr |
Mapping multirate dataflow to complex RT level hardware models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASAP ![In: 1997 International Conference on Application-Specific Systems, Architectures, and Processors (ASAP '97), 14-16 July 1997, Zurich, Switzerland, pp. 283-, 1997, IEEE Computer Society, 0-8186-7958-1. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
multirate dataflow mapping, complex RT level hardware models, digital signal processing systems, algorithm development phase, data flow specification, RTL target architecture, HDL code generation, cycle based timing model, ASIC design complexity, multirate dataflow graphs, signal processing, hardware architecture |
48 | Christian Dax, Felix Klaedtke, Martin Lange |
On Regular Temporal Logics with Past, . ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICALP (2) ![In: Automata, Languages and Programming, 36th Internatilonal Colloquium, ICALP 2009, Rhodes, Greece, July 5-12, 2009, Proceedings, Part II, pp. 175-187, 2009, Springer, 978-3-642-02929-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
48 | Anand Raghunathan, Sujit Dey, Niraj K. Jha |
High-level macro-modeling and estimation techniques for switching activity and power consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 11(4), pp. 538-557, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
48 | Pradip A. Thaker, Vishwani D. Agrawal, Mona E. Zaghloul |
A test evaluation technique for VLSI circuits using register-transfer level fault modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(8), pp. 1104-1113, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
48 | Ganesh Lakshminarayana, Niraj K. Jha |
High-level synthesis of power-optimized and area-optimized circuits from hierarchical data-flow intensive behaviors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(3), pp. 265-281, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
48 | Ganesh Lakshminarayana, Niraj K. Jha |
Synthesis of Power-Optimized and Area-Optimized Circuits from Hierarchical Behavioral Descriptions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 35th Conference on Design Automation, Moscone center, San Francico, California, USA, June 15-19, 1998., pp. 439-444, 1998, ACM Press, 0-89791-964-5. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
transceiver, spread spectrum communication, RF CMOS, digital radio, ISM frequency band |
47 | Nicola Bombieri, Franco Fummi, Graziano Pravadelli |
Abstraction of RTL IPs into embedded software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010, pp. 24-29, 2010, ACM, 978-1-4503-0002-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
RTL IP reuse, embedded software generation |
47 | Indradeep Ghosh, Anand Raghunathan, Niraj K. Jha |
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 173-179, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
design for hierarchical testability, gate-level sequential test generation, controller data path circuits, large data path bit-widths, minimal test hardware, system-level test set, logic testing, high level synthesis, high level synthesis, integrated circuit testing, design for testability, design for testability, automatic testing, logic CAD, integrated circuit design, behavioral synthesis, logic gates, register-transfer level design, RTL circuits |
47 | Daniel Schwartz-Narbonne, Carven Chan, Yogesh S. Mahajan, Sharad Malik |
Supporting RTL flow compatibility in a microarchitecture-level design framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CODES+ISSS ![In: Proceedings of the 7th International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2009, Grenoble, France, October 11-16, 2009, pp. 343-352, 2009, ACM, 978-1-60558-628-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
microarchitecture level, transactions, formal models, hierarchical design, hardware resources |
47 | Nicola Bombieri, Franco Fummi, Graziano Pravadelli, João Marques-Silva 0001 |
Towards Equivalence Checking Between TLM and RTL Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 5th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2007), May 30 - June 1st, Nice, France, pp. 113-122, 2007, IEEE Computer Society, 1-4244-1050-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
47 | Nitin Yogi, Vishwani D. Agrawal |
Spectral RTL Test Generation for Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 473-478, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
47 | Anmol Mathur, Venkat Krishnaswamy |
Design for Verification in System-level Models and RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 193-198, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
47 | Shujun Deng, Jinian Bian, Weimin Wu, Xiaoqing Yang, Yanni Zhao |
EHSAT: An Efficient RTL Satisfiability Solver Using an Extended DPLL Procedure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007, pp. 588-593, 2007, IEEE. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
47 | Nicola Bombieri, Franco Fummi, Graziano Pravadelli |
A methodology for abstracting RTL designs into TL descriptions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 4th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2006), 27-29 July 2006, Embassy Suites, Napa, California, USA, pp. 103-112, 2006, IEEE Computer Society, 1-4244-0421-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
47 | Liang Zhang 0012, Indradeep Ghosh, Michael S. Hsiao |
Efficient Sequential ATPG for Functional RTL Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 290-298, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
47 | Srivaths Ravi 0001, Anand Raghunathan, Srimat T. Chakradhar |
Efficient RTL Power Estimation for Large Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India, pp. 431-439, 2003, IEEE Computer Society, 0-7695-1868-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
47 | Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira 0001, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras |
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 814-823, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
47 | Nachiketh R. Potlapally, Michael S. Hsiao, Anand Raghunathan, Ganesh Lakshminarayana, Srimat T. Chakradhar |
Accurate Power Macro-modeling Techniques for Complex RTL Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India, pp. 235-241, 2001, IEEE Computer Society, 0-7695-0831-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
47 | Alessandro Bogliolo, Enrico Macii, Virgil Mihailovici, Massimo Poncino |
Power Models for Semi-autonomous RTL Macros. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PATMOS ![In: Integrated Circuit Design, Power and Timing Modeling, Optimization and Simulation, 10th International Workshop, PATMOS 2000, Göttingen, Germany, September 13-15, 2000, Proceedings, pp. 14-23, 2000, Springer, 3-540-41068-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
47 | Samir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie |
Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(9), pp. 1327-1340, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
47 | Pradip A. Thaker, Mona E. Zaghloul, Minesh B. Amin |
Study of Correlation of Testability Aspects of RTL Description and Resulting Structural Implementations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 12th International Conference on VLSI Design (VLSI Design 1999), 10-13 January 1999, Goa, India, pp. 256-259, 1999, IEEE Computer Society, 0-7695-0013-7. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
46 | Phan Cong Vinh, Jonathan P. Bowen |
Semantics of RTL and Validation of Synthesized RTL Designs Using Formal Verification in Reconfigurable Computing Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECBS ![In: 12th IEEE International Conference on the Engineering of Computer-Based Systems (ECBS 2005), 4-7 April 2005, Greenbelt, MD, USA, pp. 247-254, 2005, IEEE Computer Society, 0-7695-2308-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
45 | Shogo Semba, Hiroshi Saito, Masato Tatsuoka, Katsuya Fujimura |
Optimization Methods during RTL Conversion from Synchronous RTL Models to Asynchronous RTL Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 103-A(12), pp. 1417-1426, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
41 | Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira 0001, Salvador Manich, Luz Balado, Joan Figueras |
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(4), pp. 345-355, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
low-power, BIST, RTL, test quality, defects-based test |
40 | Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001 |
RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(3-4), pp. 311-319, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Defect-Oriented Test (DOT), low-energy test, test generation, RTL |
40 | Chunduri Rama Mohan, Srobona Mitra, Partha Pal Chaudhuri |
On Incorporation of BIST for the Synthesis of Easily and Fully Testable Controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India, pp. 547-563, 1997, IEEE Computer Society, 0-8186-7755-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
fully testable controllers, testing scheme, Cadence, target library, built-in self test, cellular automata, VHDL, ATPGs, BIST, testability, FSMs, partial scan, VERILOG, area overhead, RTL designs, SYNERGY, full scan, stuck-at fault model |
40 | Anand Raghunathan, Sujit Dey, Niraj K. Jha |
Register-transfer level estimation techniques for switching activity and power consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1996, San Jose, CA, USA, November 10-14, 1996, pp. 158-165, 1996, IEEE Computer Society / ACM, 0-8186-7597-7. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
gate-level implementation, register-transfer level estimation, logic design, power consumption, switching activity, glitching, RTL designs |
40 | Guillermo Maturana, James L. Ball, Jeffery Gee, Amaresh Iyer, J. Michael O'Connor |
Incas: a cycle accurate model of UltraSPARC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 130-137, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
cycle accurate model, UltraSPARC, Incas, message-passing mechanism, simulating concurrent modules, performance evaluation, C++, virtual machines, logic testing, microprocessor chips, performance estimates, diagnostics, tuning, RTL simulations, processor verification |
40 | Sumit Ahuja, Deepak Mathaikutty, Gaurav Singh 0006, Joe Stetzer, Sandeep K. Shukla, Ajit Dingankar |
Power estimation methodology for a high-level synthesis framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 541-546, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
40 | Hideo Fujiwara, Hiroyuki Iwata, Tomokazu Yoneda, Chia Yee Ooi |
A Nonscan Design-for-Testability Method for Register-Transfer-Level Circuits to Guarantee Linear-Depth Time Expansion Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(9), pp. 1535-1544, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
40 | Wolfgang Ecker, Volkan Esen, Michael Hull |
Execution semantics and formalisms for multi-abstraction TLM assertions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 4th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2006), 27-29 July 2006, Embassy Suites, Napa, California, USA, pp. 93-102, 2006, IEEE Computer Society, 1-4244-0421-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Indradeep Ghosh |
High Level Test Generation for Custom Hardware: An Industrial Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 458, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
40 | Abhijit Ghosh, Srinivas Devadas, A. Richard Newton |
Sequential Test Generation at the Register-Transfer and Logic Levels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, Florida, USA, June 24-28, 1990., pp. 580-586, 1990, IEEE Computer Society Press, 0-89791-363-9. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
39 | Stuart Swan |
SystemC transaction level models and RTL verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 90-92, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
RTL verification, hardware/software co-verification, systemC, hardware/software co-design, transaction level model, TLM |
39 | Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara |
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, pp. 130-135, 2003, IEEE Computer Society, 0-7695-1951-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
test plan grouping, test controllers, partly compacted test plan tables, RTL data paths, test length |
39 | Michael Eiermann, Walter Stechele |
Novel modeling techniques for RTL power estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISLPED ![In: Proceedings of the 2002 International Symposium on Low Power Electronics and Design, 2002, Monterey, California, USA, August 12-14, 2002, pp. 323-328, 2002, ACM, 1-58113-475-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
RTL macromodels, low power, power estimation, power modeling |
39 | Haifeng Zhou, Zhenghui Lin, Wei Cao |
Research on VHDL RTL Synthesis System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 99-103, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
VHDL RTL synthesis, ambiguous grammar, language level optimization, inference, formal semantics, parser |
39 | Zhigang Yin, Yinghua Min, Xiaowei Li 0001 |
An Approach to RTL Fault Extraction and Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 219-224, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
ATPG (Automatic Test Pattern Generation), RTL (Register Transfer Level), Fault |
39 | Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara |
Single-control testability of RTL data paths for BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 210-215, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
single-control testability, RTL data paths, BIST method, response analyzers, DFT method, high fault coverage, low hardware overhead, VLSI, logic testing, built-in self test, integrated circuit testing, design for testability, automatic test pattern generation, ATPG, test pattern generators, delay faults, VLSI circuits, at-speed testing, transition faults, digital integrated circuits, single stuck-at faults, hierarchical test |
39 | Yiorgos Makris, Alex Orailoglu |
RTL Test Justification and Propagation Analysis for Modular Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 13(2), pp. 105-120, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
RTL testability analysis, test justification, test propagation, DFT, modular design |
39 | K. J. Singh, P. A. Subrahmanyam |
Extracting RTL models from transistor netlists. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1995, San Jose, California, USA, November 5-9, 1995, pp. 11-17, 1995, IEEE Computer Society / ACM, 0-8186-7213-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
Switch-level simulation, Formal verification, Extraction, RTL model |
39 | Himanshu Jain, Daniel Kroening, Natasha Sharygina, Edmund M. Clarke |
Word-Level Predicate-Abstraction and Refinement Techniques for Verifying RTL Verilog. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2), pp. 366-379, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
39 | Nicola Bombieri, Nicola Deganello, Franco Fummi |
Integrating RTL IPs into TLM Designs Through Automatic Transactor Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 15-20, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
39 | Tatsuya Koyagi, Masahiro Fukui, Resve A. Saleh |
Delay macromodeling and estimation for RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA, pp. 2430-2433, 2008, IEEE, 978-1-4244-1683-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
39 | Robert Beers |
Pre-RTL formal verification: an intel experience. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 806-811, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
TLC, explicit state enumeration, microarchitecture verification, formal verification, protocol verification, TLA+ |
39 | Kedarnath J. Balakrishnan, Lei Fang |
RTL Test Point Insertion to Reduce Delay Test Volume. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 325-332, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
39 | Loganathan Lingappan, Vijay Gangaram, Niraj K. Jha |
Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 504-512, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
39 | Vinod Viswanath, Jacob A. Abraham, Warren A. Hunt Jr. |
Automatic insertion of low power annotations in RTL for pipelined microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 496-501, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
39 | Panagiotis Manolios, Sudarshan K. Srinivasan, Daron Vroon 0001 |
Automatic memory reductions for RTL model verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2006 International Conference on Computer-Aided Design, ICCAD 2006, San Jose, CA, USA, November 5-9, 2006, pp. 786-793, 2006, ACM, 1-59593-389-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
39 | Pietro Babighian, Luca Benini, Enrico Macii |
A scalable algorithm for RTL insertion of gated clocks based on ODCs computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(1), pp. 29-42, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
39 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Forrest Brewer |
Structural search for RTL with predicate learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005, pp. 451-456, 2005, ACM, 1-59593-058-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
learning, satisfiability, interval arithmetic, predicate abstraction |
39 | Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu |
Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 53(2), pp. 269-278, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
39 | Jean-Pierre David, Etienne Bergeron |
A Step towards Intelligent Translation from High-Level Design to RTL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWSOC ![In: Proceedings of the 4th IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC'04), 19-21 July 2004, Banff, Alberta, Canada, pp. 183-188, 2004, IEEE Computer Society, 0-7695-2182-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
39 | Rohit Jindal, Kshitiz Jain |
Verification of Transaction-Level SystemC models using RTL Testbenches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MEMOCODE ![In: 1st ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2003), 24-26 June 2003, Mont Saint-Michel, France, Proceedings, pp. 199-203, 2003, IEEE Computer Society, 0-7695-1923-7. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
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