Search results for "IRPS"

Hits ?▲	Authors	Title	Venue	Year	Link
1	Rishabh Kishore, Kavita Vishwakarma, Arnab Datta	Effect of Non-identical Annealing on the Breakdown Characteristics of Sputtered IGZO Films.	IRPS	2022	DBLP DOI BibTeX RDF
1	Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit, Oscar Huerta-Gonzalez, P. Srinivasan 0002, Fernando Guarin	Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	Bhawani Shankar, Zhengliang Bian, Ke Zeng, Chuanzhe Meng, Rafael Perez Martinez, Srabanti Chowdhury, Brendan Gunning, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar	Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.	IRPS	2022	DBLP DOI BibTeX RDF
1	Junjun Zhang, Fanyu Liu, Bo Li 0051, Yang Huang, Siyuan Chen, Yuchong Wang, Jiajun Luo, Jing Wan	Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology.	IRPS	2022	DBLP DOI BibTeX RDF
1	Hiroshi Miki, M. Sagawa, Y. Mori, T. Murata, K. Kinoshita, K. Asaka, T. Oda	Accurate screening of defective oxide on SiC using consecutive multiple threshold-voltage measurements.	IRPS	2022	DBLP DOI BibTeX RDF
1	Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva	Single-Event Latchup Vulnerability at the 7-nm FinFET Node.	IRPS	2022	DBLP DOI BibTeX RDF
1	R. L. Torrisi, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, M. Palmisciano, Elisa Vitanza	Failure Analysis of AlGaN/GaN Power HEMTs through an innovative sample preparation approach.	IRPS	2022	DBLP DOI BibTeX RDF
1	Nicola Modolo, Carlo De Santi, Andrea Minetto, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	Modeling Hot-Electron Trapping in GaN-based HEMTs.	IRPS	2022	DBLP DOI BibTeX RDF
1	Peter M. Asbeck, Sravya Alluri, Narek Rostomyan, Jefy Alex Jayamon	Reliability of CMOS-SOI power amplifiers for millimeter-wave 5G: the case for pMOS (Invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Lorenzo Benatti, Paolo Pavan, Francesco Maria Puglisi	Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions.	IRPS	2022	DBLP DOI BibTeX RDF
1	Wei-Chih Chien, Lynne M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, C. S. Hsu, Robert L. Bruce, Matthew BrightSky, H. L. Lung	Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme.	IRPS	2022	DBLP DOI BibTeX RDF
1	Yaru Ding, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao	Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ned Cahoon, P. Srinivasan 0002, Fernando Guarin	6G Roadmap for Semiconductor Technologies: Challenges and Advances.	IRPS	2022	DBLP DOI BibTeX RDF
1	Artemisia Tsiara, Alicja Lesniewska, Philippe Roussel, Srinivasan Ashwyn Srinivasan, Mathias Berciano, Marko Simicic, Marianna Pantouvaki, Joris Van Campenhout, Kristof Croes	Degradation mechanisms in Germanium Electro-Absorption Modulators.	IRPS	2022	DBLP DOI BibTeX RDF
1	Francesca Chiocchetta, Carlo De Santi, Fabiana Rampazzo, Kalparupa Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, A. Gerosa, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse.	IRPS	2022	DBLP DOI BibTeX RDF
1	Andrea Padovani, Milan Pesic, Federico Nardi, Valerio Milo, Luca Larcher, Mondol Anik Kumar, Zunaid Baten	Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Om Prakash 0007, Kai Ni 0004, Hussam Amrouch	Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing.	IRPS	2022	DBLP DOI BibTeX RDF
1	Navjeet Bagga, Kai Ni 0004, Nitanshu Chauhan, Om Prakash 0007, X. Sharon Hu, Hussam Amrouch	Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.	IRPS	2022	DBLP DOI BibTeX RDF
1	Hyeokjae Lee, Sanggi Ko, Ho-Joon Suh, Gina Jeong, Jung-Han Yeo, Hye-Min Park, Hee-Kyeong Kim, Jong-Kwan Kim, Sung S. Chung, Youngboo Kim, Jisun Park, Hyungsoon Shin	Progressive Degradation Without Physical Failure During Mounting Due to Soft Overstress in Compound HBT for RF, Mobile, and Automotive Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	Evelyn Landman, Alex Burlak, C. Nir Sever, Marc Hutner	Applying Universal Chip Telemetry to Detect Latent Defects and Aging in Advanced Electronics.	IRPS	2022	DBLP DOI BibTeX RDF
1	Lin Hou, Emmanuel Chery, Kristof Croes, Davide Tierno, Soon Aik Chew, Yangyin Chen, Peter Rakbin, Eric Beyne	Reliability Investigation of W2W Hybrid Bonding Interface: Breakdown Voltage and Leakage Mechanism.	IRPS	2022	DBLP DOI BibTeX RDF
1	Alexander Grill, V. John, Jakob Michl, A. Beckers, Erik Bury, Stanislav Tyaginov, Bertrand Parvais, Adrian Vaisman Chasin, Tibor Grasser, Michael Waltl, Ben Kaczer, Bogdan Govoreanu	Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ayse Sünbül, Tarek Ali, Raik Hoffmann, Ricardo Revello, Yannick Raffel, Pardeep Duhan, David Lehninger, Kati Kühnel, Matthias Rudolph, Sebastian Oehler, Philipp Schramm, Malte Czernohorsky, Konrad Seidel, Thomas Kämpfe, Lukas M. Eng	Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions.	IRPS	2022	DBLP DOI BibTeX RDF
1	Pablo Saraza-Canflanca, Héctor Carrasco-Lopez, Andrés Santana-Andreo, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001	A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies.	IRPS	2022	DBLP DOI BibTeX RDF
1	Da Wang, Yong Liu, Pengpeng Ren, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang	Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ping-Yi Hsieh, Artemisia Tsiara, Barry J. O'Sullivan, Didit Yudistira, Marina Baryshnikova, Guido Groeseneken, Bernardette Kunert, Marianna Pantouvaki, Joris Van Campenhout, Ingrid De Wolf	Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon.	IRPS	2022	DBLP DOI BibTeX RDF
1	Joseph P. Kozak, Qihao Song, Jingcun Liu, Ruizhe Zhang 0003, Qiang Li, Wataru Saito, Yuhao Zhang	Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses.	IRPS	2022	DBLP DOI BibTeX RDF
1	Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin H. Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar	Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors.	IRPS	2022	DBLP DOI BibTeX RDF
1	Riccardo Mariani, Karl Greb	Recent Advances and Trends on Automotive Safety : (invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Christian Bogner, Tibor Grasser, Michael Waltl, Hans Reisinger, Christian Schlünder	Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor Arrays.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ethan S. Lee, Jungwoo Joh, Dong-Seup Lee, Jesús A. del Alamo	Impact of Gate Offset on PBTI of p-GaN Gate HEMTs.	IRPS	2022	DBLP DOI BibTeX RDF
1	Houman Zahedmanesh, Ivan Ciofi, Odysseas Zografos, Kristof Croes, Mustafa Badaroglu	System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents.	IRPS	2022	DBLP DOI BibTeX RDF
1	Stephen A. Mancini, Seung Yup Jang, Zeyu Chen, Dongyoung Kim, Justin Lynch, Yafei Liu, Balaji Raghothamachar, Minseok Kang, Anant Agarwal, Nadeemullah Mahadik, Robert Stahlbush, Michael Dudley, Woongje Sung	Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures.	IRPS	2022	DBLP DOI BibTeX RDF
1	M. Hauser, P. Srinivasan 0002, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min	Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability.	IRPS	2022	DBLP DOI BibTeX RDF
1	C. H. Yang, P. S. Chien, Y. S. Cho, W. S. Hung	A Realistic Modeling Approach To Explain the Physical Mechanism of TDDB For Automotive Grade-Zero Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	K. Watanabe, T. Shimada, K. Hirose, H. Shindo, D. Kobayashi, Takaho Tanigawa, Shoji Ikeda, Takamitsu Shinada, Hiroki Koike, Tetsuo Endoh, T. Makino, Takeshi Ohshima	Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability.	IRPS	2022	DBLP DOI BibTeX RDF
1	Vamsi Putcha, Hao Yu, Jacopo Franco, Sachin Yadav, AliReza Alian, Uthayasankaran Peralagu, Bertrand Parvais, Nadine Collaert	Interpretation and modelling of dynamic-RON kinetics in GaN-on-Si HEMTs for mm-wave applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava	Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices.	IRPS	2022	DBLP DOI BibTeX RDF
1	Amartya Ghosh, Osama O. Awadelkarim, Jifa Hao, Samia A. Suliman, Xinyu Wang	Comparison of AC and DC BTI in SiC Power MOSFETs.	IRPS	2022	DBLP DOI BibTeX RDF
1	P. Srinivasan 0002, Fernando Guarin, Enkhbayasgalan Gantsog, Harish Krishnaswamy, Arun Natarajan 0001	Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies.	IRPS	2022	DBLP DOI BibTeX RDF
1	Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida	Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.	IRPS	2022	DBLP DOI BibTeX RDF
1	Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao	Universal Hot Carrier Degradation Model under DC and AC Stresses.	IRPS	2022	DBLP DOI BibTeX RDF
1	Kuan-Ting Ho, Daniel Monteiro Diniz Reis, Karla Hiller	Defect-controlled Resistance Degradation of Sputtered Lead Zirconate Titanate Thin Films.	IRPS	2022	DBLP DOI BibTeX RDF
1	Lauriane Contamin, Mikaël Cassé, Xavier Garros, Fred Gaillard, Maud Vinet, Philippe Galy, André Juge, Emmanuel Vincent 0004, Silvano De Franceschi, Tristan Meunier	Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K.	IRPS	2022	DBLP DOI BibTeX RDF
1	Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum	A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology.	IRPS	2022	DBLP DOI BibTeX RDF
1	K.-Y. Hsiang, C.-Y. Liao, Y.-Y. Lin, Z.-F. Lou, C.-Y. Lin, J.-Y. Lee, F.-S. Chang, Z.-X. Li, H.-C. Tseng, C.-C. Wang, W.-C. Ray, T.-H. Hou, T.-C. Chen, C.-S. Chang, Min-Hung Lee	Correlation between Access Polarization and High Endurance (~ 1012 cycling) of Ferroelectric and Anti-Ferroelectric HfZrO2.	IRPS	2022	DBLP DOI BibTeX RDF
1	Kathy Wei Yan, Po-Yao Lin, Sheng-Liang Kuo	Thermal Challenges for HPC 3DFabricTM Packages and Systems.	IRPS	2022	DBLP DOI BibTeX RDF
1	Tianfang Peng, Zheng You	An Analytical Model of Transient Response of MEMS under High-G shock for Reliability Assessment.	IRPS	2022	DBLP DOI BibTeX RDF
1	L. Fursin, P. Losee, Akin Akturk	Investigation of Terrestrial Neutron Induced Failure Rates in Silicon Carbide JFET Based Cascode FETs.	IRPS	2022	DBLP DOI BibTeX RDF
1	Satyaki Ganguly, Kyle M. Bothe, Alexandre Niyonzima, Thomas Smith, Yueying Liu, Jeremy Fisher, Fabian Radulescu, Donald A. Gajewski, Scott T. Sheppard, Jim W. Milligan, Basim Noori, John W. Palmour	DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Vincent Huard, Francois Jacquet, Souhir Mhira, Lionel Jure, Olivier Montfort, Mathieu Louvat, L. Zaia, F. Bertrand, E. Acacia, O. Caffin, H. Belhadj, O. Durand, Nils Exibard, Vincent Bonnet, A. Charvier, Paolo Bernardi, Riccardo Cantoro	Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ivana Kovacevic-Badstuebner, Salvatore Race, Thomas Ziemann, Shweta Tiwari, Ulrike Grossner, Elena Mengotti, Enea Bianda, Joni P. A. Jormanainen	Power Cycling Reliability of SiC MOSFETs in Discrete and Module Packages.	IRPS	2022	DBLP DOI BibTeX RDF
1	Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros	Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	Bassel Ayoub, Stéphane Moreau, S. Lhostis, P. Lamontagne, H. Combeau, J. G. Mattei, Hélène Frémont	New Method to Perform TDDB Tests for Hybrid Bonding Interconnects.	IRPS	2022	DBLP DOI BibTeX RDF
1	Himanshu Diwakar, Karansingh Thakor, Souvik Mahapatra	Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.	IRPS	2022	DBLP DOI BibTeX RDF
1	Kwang Sing Yew, Ran Xing Ong, Hin Kiong Yap, Wanbing Yi, Jacquelyn Phang, R. Chockalingam, Juan Boon Tan	Insights on Inter-metal Reliability Assessment of High Voltage Interconnects.	IRPS	2022	DBLP DOI BibTeX RDF
1	P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao	Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector.	IRPS	2022	DBLP DOI BibTeX RDF
1	M. Millesimo, Benoit Bakeroot, Matteo Borga, Niels Posthuma, Stefaan Decoutere, Enrico Sangiorgi, Claudio Fiegna, Andrea Natale Tallarico	Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition.	IRPS	2022	DBLP DOI BibTeX RDF
1	M. H. Lin, C. I. Lin, Y. C. Wang, Aaron Wang	Redundancy Effect on Electromigration Failure Time in Power Grid Networks.	IRPS	2022	DBLP DOI BibTeX RDF
1	Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi	The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena.	IRPS	2022	DBLP DOI BibTeX RDF
1	Masato Shiozaki, Takashi Sato	Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and Their Recovery.	IRPS	2022	DBLP DOI BibTeX RDF
1	Y. K. Chang, P. J. Liao, S. H. Yeong, Y.-M. Lin, J. H. Lee, C. T. Lin, Z. Yu, Wilman Tsai, Paul C. McIntyre	The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.	IRPS	2022	DBLP DOI BibTeX RDF
1	Simon Van Beek, Kaiming Cai, Siddharth Rao, Ganesh Jayakumar, Sebastien Couet, Nico Jossart, Adrian Vaisman Chasin, Gouri Sankar Kar	MTJ degradation in SOT-MRAM by self-heating-induced diffusion.	IRPS	2022	DBLP DOI BibTeX RDF
1	M. Hamid, K. O'Connell, J. Bielick, J. Bennett, E. Campbell, A. Alfoqaha	Numerical Simulation and Characterization of PCB Warpage.	IRPS	2022	DBLP DOI BibTeX RDF
1	Salvatore Cimino, J. Singh, J. B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan 0002, O. Gonzales, M. Hauser, Matthew Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib	Optimized LDMOS Offering for Power Management and RF Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Erik Bury, Michiel Vandemaele, Ben Kaczer, Robin Degraeve	A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability.	IRPS	2022	DBLP DOI BibTeX RDF
1	Qihao Song, Joseph P. Kozak, Yunwei Ma, Jingcun Liu, Ruizhe Zhang 0003, Roman Volkov, Daniel Sherman, Kurt V. Smith, Wataru Saito, Yuhao Zhang	GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift and Recovery.	IRPS	2022	DBLP DOI BibTeX RDF
1	Patrick Fiorenza, Corrado Bongiorno, Angelo Alberto Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte	SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage instability in power MOSFETs.	IRPS	2022	DBLP DOI BibTeX RDF
1	Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho	New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes.	IRPS	2022	DBLP DOI BibTeX RDF
1	Y. H. Liu, Y. S. Yang, T. C. Zhan, M. Hu, Z. J. Liu, W. Lin, A. C. Liu, Y. C. Hsu	An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories.	IRPS	2022	DBLP DOI BibTeX RDF
1	Tadeu Mota Frutuoso, Xavier Garros, Jose Lugo-Alvarez, Roméo Kom Kammeugne, L. D. M. Zouknak, Abygaël Viey, W. van den Daele, Philippe Ferrari, Fred Gaillard	Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors.	IRPS	2022	DBLP DOI BibTeX RDF
1	Davide Favero, Carlo De Santi, Kalparupa Mukherjee, Karen Geens, Matteo Borga, Benoit Bakeroot, Shuzhen You, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs.	IRPS	2022	DBLP DOI BibTeX RDF
1	Nicola Lepri, Artem Glukhov, Daniele Ielmini	Mitigating read-program variation and IR drop by circuit architecture in RRAM-based neural network accelerators.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ravi Achanta, V. McGahay, S. Boffoli, C. Kothandaraman, J. Gambino	High-k MIM dielectric reliability study in 65nm node.	IRPS	2022	DBLP DOI BibTeX RDF
1	Kai Ni 0004, Om Prakash 0007, Simon Thomann, Zijian Zhao, Shan Deng, Hussam Amrouch	Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey	Method to evaluate off-state breakdown in scaled Tri-gate technologies.	IRPS	2022	DBLP DOI BibTeX RDF
1	Tahmida Islam, Junkyu Kim, Chris H. Kim, David Tipple, Michael Nelson, Robert Jin, Anis Jarrar	A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal.	IRPS	2022	DBLP DOI BibTeX RDF
1	Andreas Martin 0002	Plasma processing induced charging damage (PID) assessment with appropriate fWLR stress methods ensuring expected MOS reliability and lifetimes for automotive products (Invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Zhan Gao, Francesca Chiocchetta, Carlo De Santi, Nicola Modolo, Fabiana Rampazzo, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Hervé Blanck, H. Stieglauer, D. Sommer, Benoit Lambert, Jan Grünenpütt, O. Kordina, J.-T. Chen, J.-C. Jacquet, Cedric Lacam, S. Piotrowicz	Deep level effects and degradation of 0.15 μm RF AlGaN/GaN HEMTs with Mono-layer and Bi-layer AlGaN backbarrier.	IRPS	2022	DBLP DOI BibTeX RDF
1	Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza	Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer.	IRPS	2022	DBLP DOI BibTeX RDF
1	Majed Valad Beigi, Sudhanva Gurumurthi, Vilas Sridharan	Reliability, Availability, and Serviceability Challenges for Heterogeneous System Design.	IRPS	2022	DBLP DOI BibTeX RDF
1	Stefan Saroiu, Alec Wolman, Lucian Cojocar	The Price of Secrecy: How Hiding Internal DRAM Topologies Hurts Rowhammer Defenses.	IRPS	2022	DBLP DOI BibTeX RDF
1	Masaharu Kobayashi	Monolithic 3D Integration of Oxide Semiconductor FETs and Memory Devices for AI Acceleration (Invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Nam-Hyun Lee, S. Lee, S.-H. Kim, G.-J. Kim, K. W. Lee, Y. S. Lee, Y. C. Hwang, H. S. Kim, S. Pae	Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology.	IRPS	2022	DBLP DOI BibTeX RDF
1	Huimei Zhou, Miaomiao Wang 0006, Ruqiang Bao, Curtis Durfee, Liqiao Qin, Jingyun Zhang	SiGe Gate-All-around Nanosheet Reliability.	IRPS	2022	DBLP DOI BibTeX RDF
1	Fabrizio Masin, Carlo De Santi, Arno Stockman, J. Lettens, F. Geenen, Gaudenzio Meneghesso, Enrico Zanoni, Peter Moens, Matteo Meneghini	Analysis and Modeling of Vth Shift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature.	IRPS	2022	DBLP DOI BibTeX RDF
1	Yong Liu, Pengpeng Ren, Da Wang, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang	New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology.	IRPS	2022	DBLP DOI BibTeX RDF
1	Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida	Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.	IRPS	2022	DBLP DOI BibTeX RDF
1	O. Varela Pedreira, Melina Lofrano, Houman Zahedmanesh, Philippe J. Roussel, Marleen H. van der Veen, Veerle Simons, Emmanuel Chery, Ivan Ciofi, Kris Croes	Assessment of critical Co electromigration parameters.	IRPS	2022	DBLP DOI BibTeX RDF
1	Artem Glukhov, Valerio Milo, Andrea Baroni, Nicola Lepri, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini	Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators.	IRPS	2022	DBLP DOI BibTeX RDF
1	Brecht Truijen, Barry J. O'Sullivan, Md. Nurul Alam, Dieter Claes, M. Thesberg, Philippe Roussel, Adrian Vaisman Chasin, Geert Van den Bosch, Ben Kaczer, Jan Van Houdt	Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks.	IRPS	2022	DBLP DOI BibTeX RDF
1	Yutaka Terao, Takuji Hosoi, Takuma Kobayashi, Takayoshi Shimura, Heiji Watanabe	Characterization of Electron Traps in Gate Oxide of m-plane SiC MOS Capacitors.	IRPS	2022	DBLP DOI BibTeX RDF
1	Jian Meng, Injune Yeo, Wonbo Shim, Li Yang 0009, Deliang Fan, Shimeng Yu, Jae-Sun Seo	Sparse and Robust RRAM-based Efficient In-memory Computing for DNN Inference.	IRPS	2022	DBLP DOI BibTeX RDF
1	William Harris, Allen Gu, Masako Terada	Putting AI to Work: A Practical and Simple Application to Improve 3D X-ray FA.	IRPS	2022	DBLP DOI BibTeX RDF
1	Milan Pesic, Bastien Beltrando, Andrea Padovani, Toshihiko Miyashita, Nam-Sung Kim, Luca Larcher	Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation.	IRPS	2022	DBLP DOI BibTeX RDF
1	Pengpeng Ren, Xinfa Zhang, Junhua Liu, Runsheng Wang, Zhigang Ji, Ru Huang	Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	Bikram Kishore Mahajan, Yen-Pu Chen, Ulisses Alberto Heredia Rivera, Rahim Rahimi, Muhammad Ashraful Alam	Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors.	IRPS	2022	DBLP DOI BibTeX RDF
1	Yinghong Zhao, Ki-Don Lee, Manisha Sharma, Joonah Yoon, Rakesh Ranjan, Md Iqbal Mahmud, Caleb Dongkyan Kwon, Myungsoo Yeo	Polarity Dependence and Metal Density Impact on Multi-Layer Inter-Level TDDB for High Voltage Application.	IRPS	2022	DBLP DOI BibTeX RDF
1	Sourabh Khandelwal, D. Bavi	ASM-ESD - A comprehensive physics-based compact model for ESD Diodes.	IRPS	2022	DBLP DOI BibTeX RDF
1	Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva	Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.	IRPS	2022	DBLP DOI BibTeX RDF

Publications at "IRPS"( http://dblp.L3S.de/Venues/IRPS )