Search results for "Coverage"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
19	Bogdan Carbunar, Ananth Grama, Jan Vitek	Distributed and Dynamic Voronoi Overlays for Coverage Detection and Distributed Hash Tables in Ad-Hoc Networks.	ICPADS	2004	DBLP DOI BibTeX RDF
19	Qianbing Zheng, Yongwen Wang, Xicheng Lu	WCBF: Efficient and High-Coverage Search Schema in Unstructured Peer-to-Peer Network.	GCC	2004	DBLP DOI BibTeX RDF
19	Rob Jukna	To Test or To Inspect, What is the Coverage?	ITC	2004	DBLP DOI BibTeX RDF
19	Kenneth P. Parker	Board Test Coverage Needs to be Standardized.	ITC	2004	DBLP DOI BibTeX RDF
19	Jay J. Nejedlo	Functional Test Coverage Effectiveness on the Decline.	ITC	2004	DBLP DOI BibTeX RDF
19	Chandra Chekuri, Amit Kumar 0001	Maximum Coverage Problem with Group Budget Constraints and Applications.	APPROX-RANDOM	2004	DBLP DOI BibTeX RDF
19	Prasenjit Basu, Pallab Dasgupta, P. P. Chakrabarti 0001, Chunduri Rama Mohan	Property Refinement Techniques for Enhancing Coverage of Formal Property Verification.	VLSI Design	2004	DBLP DOI BibTeX RDF
19	Avi Ziv	Cross-Product Functional Coverage Measurement with Temporal Properties-Based Assertions .	DATE	2003	DBLP DOI BibTeX RDF
19	Seongmoon Wang, Srimat T. Chakradhar	A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs.	ITC	2003	DBLP DOI BibTeX RDF
19	Shuangfeng Han, Youzheng Wang, Jing Wang 0001, Osamu Kato, Akihiko Nishio	Capacity and Coverage of TD-SCDMA System with Smart Antenna.	CDMA International Conference	2002	DBLP DOI BibTeX RDF
19	G. Friedman, Alan Hartman, Kenneth Nagin, T. Shiran	Projected state machine coverage for software testing.	ISSTA	2002	DBLP DOI BibTeX RDF	state machine projection., validation, automated test generation, finite state machine modeling
19	Irith Pomeranz, Sudhakar M. Reddy	On the Coverage of Delay Faults in Scan Designs with Multiple Scan Chains.	ICCD	2002	DBLP DOI BibTeX RDF
19	Sven Koenig, Yaxin Liu	Terrain coverage with ant robots: a simulation study.	Agents	2001	DBLP DOI BibTeX RDF	multi-agent simulation, multi-agent coordination
19	Byeong Min, Gwan Choi	ECC: Extended Condition Coverage for Design Verification Using Excitation and Observation.	PRDC	2001	DBLP DOI BibTeX RDF
19	Ananta K. Majhi, V. D. Agrawak, James Jacob, Lalit M. Patnaik	Line coverage of path delay faults.	IEEE Trans. Very Large Scale Integr. Syst.	2000	DBLP DOI BibTeX RDF
19	Yervant Zorian	Wider Coverage.	IEEE Des. Test Comput.	2000	DBLP DOI BibTeX RDF
19	Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri	Optimizing Memory Tests by Analyzing Defect Coverage.	MTDT	2000	DBLP DOI BibTeX RDF
19	Thomas W. Williams, Stephen K. Sunter	How Should Fault Coverage Be Defined?	VTS	2000	DBLP DOI BibTeX RDF
19	Hira Agrawal	Efficient Coverage Testing Using Global Dominator Graphs.	PASTE	1999	DBLP DOI BibTeX RDF
19	Junichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki	Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF
19	Jules P. Bergmann, Mark Horowitz	Improving coverage analysis and test generation for large designs.	ICCAD	1999	DBLP DOI BibTeX RDF
19	Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita	On the Evaluation of Arbitrary Defect Coverage of Test Sets.	VTS	1999	DBLP DOI BibTeX RDF	Fault Modeling & Simulation, Arbitrary Defects, Vector-Independent and Vector-Dependent Defects
19	Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas	Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	statistical fault analysis, fault simulation, delay test, path-delay faults, transition faults
19	Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng	An almost full-scan BIST solution-higher fault coverage and shorter test application time.	ITC	1998	DBLP DOI BibTeX RDF
19	Nur A. Touba	Obtaining High Fault Coverage with Circular BIST Via State Skipping.	VTS	1997	DBLP DOI BibTeX RDF	Circular BIST, Circular Self-Test Path, Conflict Matrix, Column Covering, Built-In Self-Test (BIST), Linear Feedback Shift Register, Pseudo-Random Testing, Digital Testing
19	Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das	Delay Fault Coverage Enhancement Using Multiple Test Observation Times.	VLSI Design	1997	DBLP DOI BibTeX RDF
19	David Powell, Michel Cukier, Jean Arlat	On Stratified Sampling for High Coverage Estimations.	EDCC	1996	DBLP DOI BibTeX RDF
19	Martina Marré, Antonia Bertolino	Unconstrained Duals and Their Use in Achieving All-Uses Coverage.	ISSTA	1996	DBLP DOI BibTeX RDF
19	William K. C. Lam, Alexander Saldanha, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli	Delay fault coverage, test set size, and performance trade-offs.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
19	Weiwei Mao, Michael D. Ciletti	Reducing correlation to improve coverage of delay faults in scan-path design.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
19	Hiralal Agrawal	Dominators, Super Blocks, and Program Coverage.	POPL	1994	DBLP DOI BibTeX RDF
19	Hideo Fujiwara	Enhancing random-pattern coverage of programmable logic arrays via masking technique.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1989	DBLP DOI BibTeX RDF
19	Luca Simoncini, Arthur D. Friedman	Incomplete Fault Coverage In Modular Miltiprocessor Systems.	ACM Annual Conference (1)	1978	DBLP DOI BibTeX RDF
17	Ali Dasdan, Paolo D'Alberto, Santanu Kolay, Chris Drome	Automatic retrieval of similar content using search engine query interface.	CIKM	2009	DBLP DOI BibTeX RDF	strong query, coverage, random sampling, keyword extraction, query generation
17	Cesare Bartolini, Antonia Bertolino, Sebastian G. Elbaum, Eda Marchetti	Whitening SOA testing.	ESEC/SIGSOFT FSE	2009	DBLP DOI BibTeX RDF	coverage adequacy criteria, testing web services, service-oriented architecture, white-box testing
17	Jian Chen 0008, Jie Jia, Yingyou Wen, Dazhe Zhao, Jiren Liu	Modeling and extending lifetime of wireless sensor networks using genetic algorithm.	GEC Summit	2009	DBLP DOI BibTeX RDF	solution granularity, genetic algorithm, wireless sensor network, coverage, network lifetime
17	Michele Sama, Julian Harty	Using code instrumentation to enhance testing on J2ME: a lesson learned with JInjector.	HotMobile	2009	DBLP DOI BibTeX RDF	Java 2 micro edition, testing, instrumentation, code coverage
17	Stephan Weißleder	Influencing Factors in Model-Based Testing with UML State Machines: Report on an Industrial Cooperation.	MoDELS	2009	DBLP DOI BibTeX RDF	Industrial Cooperation, Model-Based Testing, State Machines, Mutation Analysis, Coverage Criteria
17	Huanglin Zeng, Xiaohui Zeng	Reasoning Decision Rules of an Uncertain System.	RSKT	2009	DBLP DOI BibTeX RDF	An uncertain information system, Information coverage, Data mining, Rough sets, Statistical methods, Decision rules
17	Kuo-Tay Chen, Jian-Shuen Lian, Yu-Ting Hsieh	Quantifying News Reports to Proxy "Other Information" in ERC Models.	PAISI	2009	DBLP DOI BibTeX RDF	earning response coefficient (ERC) model, textual information, news coverage, news sentiment
17	You-Chiun Wang, Chun-Chi Hu, Yu-Chee Tseng	Efficient Placement and Dispatch of Sensors in a Wireless Sensor Network.	IEEE Trans. Mob. Comput.	2008	DBLP DOI BibTeX RDF	wireless sensor networks, connectivity, network management, coverage, topology control, deployment, mobile sensors
17	Ming Liu 0002, Jiannong Cao 0001, Yuan Zheng 0001, Hai-gang Gong, Xiaomin Wang	An energy-efficient protocol for data gathering and aggregation in wireless sensor networks.	J. Supercomput.	2008	DBLP DOI BibTeX RDF	Data gathering and aggregation, Intra-cluster coverage, Wireless sensor networks
17	Ke Ma 0004, Yanyong Zhang, Wade Trappe	Managing the Mobility of a Mobile Sensor Network Using Network Dynamics.	IEEE Trans. Parallel Distributed Syst.	2008	DBLP DOI BibTeX RDF	jamming attack, coverage, Mobile sensor networks, potential fields
17	Tai-Hua Lu, Chung-Ho Chen, Kuen-Jong Lee	A hybrid software-based self-testing methodology for embedded processor.	SAC	2008	DBLP DOI BibTeX RDF	embedded processor testing, fault coverage, functional testing, software-based self-test
17	K. R. Jayaram, Aditya P. Mathur	On the Adequacy of Statecharts as a Source of Tests for Cryptographic Protocols.	COMPSAC	2008	DBLP DOI BibTeX RDF	TLS protocol, MC/DC coverage, Security protocol, Statechart, Security Vulnerability
17	Markus Strohmaier, Jennifer Horkoff, Eric S. K. Yu, Jorge Aranda, Steve M. Easterbrook	Can Patterns Improve i* Modeling? Two Exploratory Studies.	REFSQ	2008	DBLP DOI BibTeX RDF	The i* Framework, Model Patterns, Modeling Effort, Model Coverage, Model Complexity
17	Hui Zeng, Chenxi Zhu, Wei-Peng Chen	System performance of self-organizing network algorithm in WiMAX femtocells.	WICON	2008	DBLP DOI BibTeX RDF	WiMAX, network capacity, frequency assignment, 802.16, femtocell, network coverage
17	Wei-Chieh Ke, Bing-Hong Liu, Ming-Jer Tsai	Constructing a Wireless Sensor Network to Fully Cover Critical Grids by Deploying Minimum Sensors on Grid Points Is NP-Complete.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	wireless sensor networks, NP-Complete, coverage problem
17	Cunqing Hua, Tak-Shing Peter Yum	Asynchronous random sleeping for sensor networks.	ACM Trans. Sens. Networks	2007	DBLP DOI BibTeX RDF	random sleeping, Sensor network, event detection, energy conservation, k-coverage
17	Xiaoling Wu 0004, Jinsung Cho, Brian J. d'Auriol, Sungyoung Lee	Sleep Nodes Scheduling in Cluster-Based Heterogeneous Sensor Networks Using AHP.	ICESS	2007	DBLP DOI BibTeX RDF	Sensor networks, coverage, AHP, lifetime, sleep scheduling
17	Xiaoling Wu 0004, Jinsung Cho, Brian J. d'Auriol, Sungyoung Lee	Optimal Deployment of Mobile Sensor Networks and Its Maintenance Strategy.	GPC	2007	DBLP DOI BibTeX RDF	Sensor networks, mobility, fuzzy logic, coverage, deployment
17	Emrah Tomur, Y. Murat Erten	Security and Service Quality Analysis for Cluster-Based Wireless Sensor Networks.	WWIC	2007	DBLP DOI BibTeX RDF	security, QoS, Sensor networks, coverage, spatial resolution
17	Yinying Yang, Mihaela Cardei	Movement-assisted sensor redeployment scheme for network lifetime increase.	MSWiM	2007	DBLP DOI BibTeX RDF	sensor mobility, wireless sensor networks, coverage, network lifetime, sensor deployment
17	P. D. Mzila, Matthew O. Adigun, Sibusiso S. Xulu	A Service Supplier Database for Location-Based Mobile Commerce.	ICDCS Workshops	2007	DBLP DOI BibTeX RDF	coverage area, service advertisement, Location-Based Services, service discovery, network operators
17	James H. Andrews, Felix Chun Hang Li, Tim Menzies	Nighthawk: a two-level genetic-random unit test data generator.	ASE	2007	DBLP DOI BibTeX RDF	genetic algorithms, randomized testing, test coverage
17	Kezhong Lu, XiaoHui Lin 0001, Fengxia Ding	A Local Voronoi Diagram-Based Approximate Algorithm for Minimum Disc Cover Problem.	PDCAT	2007	DBLP DOI BibTeX RDF	minimum disc cover problem, disc cover set, average coverage degree, wireless sensor network, node scheduling
17	Hannes Frey, Daniel Görgen	Geographical Cluster-Based Routing in Sensing-Covered Networks.	IEEE Trans. Parallel Distributed Syst.	2006	DBLP DOI BibTeX RDF	sensor networks, Ad hoc networks, topology control, geographic routing, sensing coverage
17	Maciej Borkowski, James F. Peters	Matching 2D Image Segments with Genetic Algorithms and Approximation Spaces.	Trans. Rough Sets	2006	DBLP DOI BibTeX RDF	2D matching, genetic algorithm, image segment, rough sets, coverage, image, Approximation space
17	Christophe Gaston, Pascale Le Gall, Nicolas Rapin, Assia Touil	Symbolic Execution Techniques for Test Purpose Definition.	TestCom	2006	DBLP DOI BibTeX RDF	Input/Output Symbolic Transition Systems, Conformance testing, Symbolic Execution, Coverage Criteria, Test Purposes
17	Yangfan Zhou, Haixuan Yang, Michael R. Lyu, Edith C. H. Ngai	A point-distribution index and its application to sensor-grouping in wireless sensor networks.	IWCMC	2006	DBLP DOI BibTeX RDF	honeycomb structure, point-distribution index, sensor grouping, wireless sensor networks, sensor coverage
17	Kenan Xu, Glen Takahara, Hossam S. Hassanein	On the robustness of grid-based deployment in wireless sensor networks.	IWCMC	2006	DBLP DOI BibTeX RDF	grid-based deployment, misalignment, wireless sensor network, robustness, coverage, random error
17	Yunhuai Liu, Hoilun Ngan, Lionel M. Ni	Power-aware Node Deployment in Wireless Sensor Networks.	SUTC (1)	2006	DBLP DOI BibTeX RDF	node deployment, sensing and connectivity coverage, wireless sensor networks
17	Nabhendra Bisnik, Alhussein A. Abouzeid, Volkan Isler	Stochastic event capture using mobile sensors subject to a quality metric.	MobiCom	2006	DBLP DOI BibTeX RDF	event capture, mobile robot motion planning, reliable coverage, robot sensing systems
17	Hongmei Chi, Edward L. Jones, Deidre W. Evans, Martin Brown	Generating Test Data for Specification-Based Tests Via Quasirandom Sequences.	International Conference on Computational Science (4)	2006	DBLP DOI BibTeX RDF	specification-driven test, functional test coverage, quasirandom numbers, well-distributed sequences, automatic test case generation
17	Kristen R. Walcott, Mary Lou Soffa, Gregory M. Kapfhammer, Robert S. Roos	TimeAware test suite prioritization.	ISSTA	2006	DBLP DOI BibTeX RDF	genetic algorithms, test prioritization, coverage testing
17	Habib M. Ammari, Sajal K. Das 0001	On computing conditional fault-tolerance measures for k-covered wireless sensor networks.	MSWiM	2006	DBLP DOI BibTeX RDF	k-covered WSNs, conditional connectivity, conditional coverage, conditional fault-tolerance, forbidden faulty set
17	Kang Chul Kim, Chang-Gyoon Lim, Jae Hung Yoo, Seok Bung Han	Simulation Cost Reduction Strategies for Behavioral Model Verification in Bayesian Based Stopping Rule.	EUC	2006	DBLP DOI BibTeX RDF	behavioral VHDL model, semi-random variable, Verification, stopping rule, branch coverage
17	Mazen Tlais, Frédéric Weis, Carole Bonan	Distributed Mobility Prediction in a Hierarchical Infostation Systems.	AINA (2)	2006	DBLP DOI BibTeX RDF	discontinuous coverage, caching, mobility prediction, Infostations
17	Timothy Chklovski	Designing interfaces for guided collection of knowledge about everyday objects from volunteers.	IUI	2005	DBLP DOI BibTeX RDF	collecting broad-coverage knowledge repositories, generalization in knowledge acquisition, interfaces for knowledge elicitation
17	Carlo Bellettini, Alessandro Marchetto 0001, Andrea Trentini	TestUml: user-metrics driven web applications testing.	SAC	2005	DBLP DOI BibTeX RDF	application design model, stop testing, UML, testing, reverse engineering, metrics, testing coverage, white-box testing
17	Edgar Leonardo Romero, Marius Strum, Jiang Chau Wang	Comparing two testbench methods for hierarchical functional verification of a bluetooth baseband adaptor.	CODES+ISSS	2005	DBLP DOI BibTeX RDF	verification strategy, optimization, functional verification, coverage analysis, hierarchical verification
17	Thomas R. Puzak, Allan Hartstein, Philip G. Emma, Viji Srinivasan	When prefetching improves/degrades performance.	Conf. Computing Frontiers	2005	DBLP DOI BibTeX RDF	prefetching algorithm, cache, prefetch, coverage, accuracy, timeliness
17	Hannes Frey, Daniel Görgen	Geographical Cluster Based Routing in Sensing-Covered Networks.	ICDCS Workshops	2005	DBLP DOI BibTeX RDF	Sensor Networks, Ad-hoc Networks, Topology Control, Geographic Routing, Sensing Coverage
17	Alexander Pretschner, Wolfgang Prenninger, Stefan Wagner 0001, Christian Kühnel, Martin Baumgartner, Bernd Sostawa, Rüdiger Zölch, Thomas Stauner	One evaluation of model-based testing and its automation.	ICSE	2005	DBLP DOI BibTeX RDF	abstraction, coverage, test case generation, CASE, model-based development, automotive software
17	Yung-Ruei Chang, Suprasad V. Amari, Sy-Yen Kuo	Computing System Failure Frequencies and Reliability Importance Measures Using OBDD.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF	Failure frequency, reliability importance measure, imperfect coverage, fault tolerance, BDD, system availability
17	Amir Rajabzadeh, Seyed Ghassem Miremadi, Mirzad Mohandespour	Error Detection Enhancement in COTS Superscalar Processors with Performance Monitoring Features.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	COTS processors, fault injection, performance monitoring, analytical evaluation, watchdog processor, error detection coverage
17	Ruth Yuee Zhang, Laks V. S. Lakshmanan, Ruben H. Zamar	Extracting relational data from HTML repositories.	SIGKDD Explor.	2004	DBLP DOI BibTeX RDF	coverage estimation, information extraction, pattern, duplication
17	Willem Visser, Corina S. Pasareanu, Sarfraz Khurshid	Test input generation with java PathFinder.	ISSTA	2004	DBLP DOI BibTeX RDF	testing object-oriented programs, model checking, coverage, symbolic execution, red-black trees
17	Amie L. Souter, Lori L. Pollock	The Construction of Contextual Def-Use Associations for Object-Oriented Systems.	IEEE Trans. Software Eng.	2003	DBLP DOI BibTeX RDF	D.3.2.p Object-oriented languages, D.2.5.m Testing coverage of code, object flow analysis
17	Serdar Tasiran, Yuan Yu, Brannon Batson	Using a formal specification and a model checker to monitor and direct simulation.	DAC	2003	DBLP DOI BibTeX RDF	model checking, specification, abstraction, coverage
17	Hairong Sun, James J. Han, Isaac Levendel	Impact of Fault Management Server and Its Failure-related Parameters on High-Availability Communication Systems.	DSN	2002	DBLP DOI BibTeX RDF	coverage ratio, fail-safe ratio, availability, Fault management
17	Hairong Sun, James J. Han, Isaac Levendel	Availability Requirement for a Fault Management Server in High-Availability Communication Systems.	IPDPS	2002	DBLP DOI BibTeX RDF	coverage ratio, fail-safe ratio, availability, Fault management
17	Junichi Hirase, Shinichi Yoshimura	Faster processing for microprocessor functional ATPG.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	microprocessor functional ATPG, fault coverage improvement, short test pattern, processing speed increase, logic testing, integrated circuit testing, automatic test pattern generation, identification, test pattern generation, functional testing, microprocessor chips, instruction sets, instruction sets, microprocessor tests
17	Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer	On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	DO-RE-ME technique, MPG-D model, defective part level prediction, benchmark circuit simulations, stuck-at fault detection tests, bridging surrogate detection, stuck-at fault coverage, predictor accuracy, industrial circuit, test pattern sequences, integrated circuit testing, automatic test pattern generation, ATPG, fault simulation, logic circuit, circuit simulation, integrated logic circuits, correlation coefficient
17	Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu	General BIST-Amenable Method of Test Generation for Iterative Logic Arrays.	VTS	2000	DBLP DOI BibTeX RDF	fixed-coverage fixed-size test set, test generation, BIST, iterative logic arrays
17	Biplab K. Sikdar, Kolin Paul, Gosta Pada Biswas, Parimal Pal Chaudhuri, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee	Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator.	VLSI Design	2000	DBLP DOI BibTeX RDF	Extension field, BIST structure, Cellular Automata (CA), VLSI design and RTL, Finite field, DFT, Fault coverage, LFSR
17	Marinés Puig-Medina, Gülbin Ezer, Pavlos Konas	Verification of configurable processor cores.	DAC	2000	DBLP DOI BibTeX RDF	configurable processor cores, system-on-chip, test generation, design verification, co-simulation, coverage analysis
17	Dariusz Badura, Andrzej Hlawiczka	Low Cost Bist for Edac Circuits.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	CBIST, EDAC, error aliasing, fault coverage, self-test
17	Alvin Jee, F. Joel Ferguson	A methodolgy for characterizing cell testability.	VTS	1997	DBLP DOI BibTeX RDF	cell testability, stuck-at fault coverage, IC quality, physical design for testability, metric, integrated circuit design, integrated circuit design, DPM, manufacturing defects
17	Patrick Girard 0001, Christian Landrault, V. Moreda, Serge Pravossoudovitch	An optimized BIST test pattern generator for delay testing.	VTS	1997	DBLP DOI BibTeX RDF	BIST test pattern generator, robust delay fault coverage, single input change test sequence, compatible inputs, optimization, delays, built-in self-test, fault detection, delay testing, test length, area overhead, circuit under test
17	Silvia Chiusano, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda	Cellular automata for deterministic sequential test pattern generation.	VTS	1997	DBLP DOI BibTeX RDF	deterministic sequential test pattern generation, cellular automaton identification, hardware structure, area occupation, ASIC testing, evolutionary algorithm, cellular automata, BIST, fault coverage, stuck-at faults, FSM, deterministic automata
17	Srimat T. Chakradhar, Vijay Gangaram, Steven G. Rothweiler	Deriving Signal Constraints to Accelerate Sequential Test Generation.	VLSI Design	1997	DBLP DOI BibTeX RDF	sequential test generation algorithm acceleration, signal constraints, large sequential circuits, deterministic sequential test generation, signal constraint computation technique, line probabilities, line justification techniques, benchmark sequential circuits, test generation time reduction, production sequential circuits, 3-valued signal probabilities, fault diagnosis, fault coverage, symbolic simulation, truth table
17	Teruhiko Yamada, Tsuyoshi Sasaki	On Current Testing of Josephson Logic Circuits Using the 4JL Gate Family.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	4JL gate, Josephson logic circuit, current testing, defect coverage
17	Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo	An Efficient PRPG Strategy By Utilizing Essential Faults.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	PRPG, essential fault, multiple polynomial, Gauss elimination, pseudorandom test pattern, multivariable linear equation, deterministic test set, random pattern resistant circuit, don't care value, intelligent heuristic, ISCAS-85 benchmark, ISCAS-89 benchmark, built-in self test, BIST, fault coverage, LFSR, test length, hardware overhead, multiple seed
17	Nur A. Touba, Edward J. McCluskey	Test point insertion based on path tracing.	VTS	1996	DBLP DOI BibTeX RDF	probabilistic techniques, primary inputs, insertion methods, VLSI, VLSI, fault diagnosis, logic testing, logic testing, probability, built-in self test, timing, integrated circuit testing, BIST, automatic testing, fault coverage, test point insertion, path tracing, circuit-under-test
17	Krishna B. Rajan, David E. Long, Miron Abramovici	Increasing testability by clock transformation (getting rid of those darn states).	VTS	1996	DBLP DOI BibTeX RDF	clock transformation, sequential test generation, darn states, easy-to-reach states, logic testing, partitioning, design for testability, sequential circuits, DFT, fault coverage, testability, flip-flops, flip-flops, clocks, logic partitioning
17	Ad J. van de Goor, Georgi Gaydadjiev, V. G. Mikitjuk, Vyacheslav N. Yarmolik	March LR: a test for realistic linked faults.	VTS	1996	DBLP DOI BibTeX RDF	disturb faults, March LR, March LRD, March LRDD, fault diagnosis, integrated circuit testing, fault models, fault coverage, march tests, integrated memory circuits, semiconductor memories, linked faults
17	Nur A. Touba, Edward J. McCluskey	Applying two-pattern tests using scan-mapping.	VTS	1996	DBLP DOI BibTeX RDF	scan-mapping, combinational mapping logic, logic testing, built-in self test, built-in self-testing, fault coverage, delay faults, pseudo-random testing, deterministic testing, two-pattern tests
17	C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal	A STAFAN-like functional testability measure for register-level circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model
17	Arun Balakrishnan, Srimat T. Chakradhar	Software transformations for sequential test generation.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	sequential test generation, high fault coverage test sets, testability properties, inverse mapping, software engineering, logic testing, timing, design for testability, sequential circuits, sequential circuits, DFT, software model, software transformations