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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 8773 occurrences of 3334 keywords
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Results
Found 18073 publication records. Showing 18073 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
19 | Bogdan Carbunar, Ananth Grama, Jan Vitek |
Distributed and Dynamic Voronoi Overlays for Coverage Detection and Distributed Hash Tables in Ad-Hoc Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPADS ![In: 10th International Conference on Parallel and Distributed Systems, ICPADS 2004, Newport Beach, CA, USA, July 7-9, 2004, pp. 549-, 2004, IEEE Computer Society, 0-7695-2152-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Qianbing Zheng, Yongwen Wang, Xicheng Lu |
WCBF: Efficient and High-Coverage Search Schema in Unstructured Peer-to-Peer Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GCC ![In: Grid and Cooperative Computing - GCC 2004: Third International Conference, Wuhan, China, October 21-24, 2004. Proceedings, pp. 487-494, 2004, Springer, 3-540-23564-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Rob Jukna |
To Test or To Inspect, What is the Coverage? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1425, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Kenneth P. Parker |
Board Test Coverage Needs to be Standardized. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1426, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Jay J. Nejedlo |
Functional Test Coverage Effectiveness on the Decline. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1424, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Chandra Chekuri, Amit Kumar 0001 |
Maximum Coverage Problem with Group Budget Constraints and Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APPROX-RANDOM ![In: Approximation, Randomization, and Combinatorial Optimization, Algorithms and Techniques, 7th International Workshop on Approximation Algorithms for Combinatorial Optimization Problems, APPROX 2004, and 8th International Workshop on Randomization and Computation, RANDOM 2004, Cambridge, MA, USA, August 22-24, 2004, Proceedings, pp. 72-83, 2004, Springer, 3-540-22894-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Prasenjit Basu, Pallab Dasgupta, P. P. Chakrabarti 0001, Chunduri Rama Mohan |
Property Refinement Techniques for Enhancing Coverage of Formal Property Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 109-114, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
19 | Avi Ziv |
Cross-Product Functional Coverage Measurement with Temporal Properties-Based Assertions . ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany, pp. 10834-10841, 2003, IEEE Computer Society, 0-7695-1870-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
19 | Seongmoon Wang, Srimat T. Chakradhar |
A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 574-583, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
19 | Shuangfeng Han, Youzheng Wang, Jing Wang 0001, Osamu Kato, Akihiko Nishio |
Capacity and Coverage of TD-SCDMA System with Smart Antenna. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CDMA International Conference ![In: Mobile Communications, 7th CDMA International Conference, CIC 2002, Seoul, Korea, October 29 - November 1, 2002, Revised Papers, pp. 84-93, 2002, Springer, 3-540-00732-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
19 | G. Friedman, Alan Hartman, Kenneth Nagin, T. Shiran |
Projected state machine coverage for software testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the International Symposium on Software Testing and Analysis, ISSTA 2002, Roma, Italy, July 22-24, 2002, pp. 134-143, 2002, ACM, 1-58113-562-9. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
state machine projection., validation, automated test generation, finite state machine modeling |
19 | Irith Pomeranz, Sudhakar M. Reddy |
On the Coverage of Delay Faults in Scan Designs with Multiple Scan Chains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings, pp. 206-209, 2002, IEEE Computer Society, 0-7695-1700-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
19 | Sven Koenig, Yaxin Liu |
Terrain coverage with ant robots: a simulation study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Agents ![In: Proceedings of the Fifth International Conference on Autonomous Agents, AGENTS 2001, Montreal, Canada, May 28 - June 1, 2001, pp. 600-607, 2001, ACM, 1-58113-326-X. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
multi-agent simulation, multi-agent coordination |
19 | Byeong Min, Gwan Choi |
ECC: Extended Condition Coverage for Design Verification Using Excitation and Observation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 8th Pacific Rim International Symposium on Dependable Computing (PRDC 2001), 17-19 December 2001, Seoul, Korea, pp. 183-190, 2001, IEEE Computer Society, 0-7695-1414-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
19 | Ananta K. Majhi, V. D. Agrawak, James Jacob, Lalit M. Patnaik |
Line coverage of path delay faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 8(5), pp. 610-614, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
19 | Yervant Zorian |
Wider Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 17(3), pp. 6-, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
19 | Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri |
Optimizing Memory Tests by Analyzing Defect Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA, pp. 20-28, 2000, IEEE Computer Society, 0-7695-0689-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
19 | Thomas W. Williams, Stephen K. Sunter |
How Should Fault Coverage Be Defined? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 325-328, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
19 | Hira Agrawal |
Efficient Coverage Testing Using Global Dominator Graphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PASTE ![In: Proceedings of the SIGPLAN/SIGSOFT Workshop on Program Analysis For Software Tools and Engineering, PASTE '99, Toulouse, France, September 6, 1999, pp. 11-20, 1999, ACM, 1-58113-137-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
19 | Junichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki |
Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 13-19, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
19 | Jules P. Bergmann, Mark Horowitz |
Improving coverage analysis and test generation for large designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1999 IEEE/ACM International Conference on Computer-Aided Design, 1999, San Jose, California, USA, November 7-11, 1999, pp. 580-583, 1999, IEEE Computer Society, 0-7803-5832-5. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
19 | Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita |
On the Evaluation of Arbitrary Defect Coverage of Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 17th IEEE VLSI Test Symposium (VTS '99), 25-30 April 1999, San Diego, CA, USA, pp. 426-432, 1999, IEEE Computer Society, 0-7695-0146-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Fault Modeling & Simulation, Arbitrary Defects, Vector-Independent and Vector-Dependent Defects |
19 | Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas |
Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 12(3), pp. 239-254, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
statistical fault analysis, fault simulation, delay test, path-delay faults, transition faults |
19 | Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng |
An almost full-scan BIST solution-higher fault coverage and shorter test application time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 1065-1073, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
19 | Nur A. Touba |
Obtaining High Fault Coverage with Circular BIST Via State Skipping. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 410-415, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Circular BIST, Circular Self-Test Path, Conflict Matrix, Column Covering, Built-In Self-Test (BIST), Linear Feedback Shift Register, Pseudo-Random Testing, Digital Testing |
19 | Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das |
Delay Fault Coverage Enhancement Using Multiple Test Observation Times. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India, pp. 106-110, 1997, IEEE Computer Society, 0-8186-7755-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
19 | David Powell, Michel Cukier, Jean Arlat |
On Stratified Sampling for High Coverage Estimations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EDCC ![In: Dependable Computing - EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996, Proceedings, pp. 37-54, 1996, Springer, 3-540-61772-8. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
19 | Martina Marré, Antonia Bertolino |
Unconstrained Duals and Their Use in Achieving All-Uses Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the 1996 International Symposium on Software Testing and Analysis, ISSTA 1996, San Diego, CA, USA, January 8-10, 1996, pp. 147-157, 1996, ACM, 0-89791-787-1. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
19 | William K. C. Lam, Alexander Saldanha, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli |
Delay fault coverage, test set size, and performance trade-offs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(1), pp. 32-44, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
19 | Weiwei Mao, Michael D. Ciletti |
Reducing correlation to improve coverage of delay faults in scan-path design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(5), pp. 638-646, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
19 | Hiralal Agrawal |
Dominators, Super Blocks, and Program Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
POPL ![In: Conference Record of POPL'94: 21st ACM SIGPLAN-SIGACT Symposium on Principles of Programming Languages, Portland, Oregon, USA, January 17-21, 1994, pp. 25-34, 1994, ACM Press, 0-89791-636-0. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
19 | Hideo Fujiwara |
Enhancing random-pattern coverage of programmable logic arrays via masking technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(9), pp. 1022-1025, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
19 | Luca Simoncini, Arthur D. Friedman |
Incomplete Fault Coverage In Modular Miltiprocessor Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Annual Conference (1) ![In: Proceedings 1978 ACM Annual Conference, Washington, DC, USA, December 4-6, 1978, Volume I, pp. 210-216, 1978, ACM, 978-0-89791-000-2. The full citation details ...](Pics/full.jpeg) |
1978 |
DBLP DOI BibTeX RDF |
|
17 | Ali Dasdan, Paolo D'Alberto, Santanu Kolay, Chris Drome |
Automatic retrieval of similar content using search engine query interface. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIKM ![In: Proceedings of the 18th ACM Conference on Information and Knowledge Management, CIKM 2009, Hong Kong, China, November 2-6, 2009, pp. 701-710, 2009, ACM, 978-1-60558-512-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
strong query, coverage, random sampling, keyword extraction, query generation |
17 | Cesare Bartolini, Antonia Bertolino, Sebastian G. Elbaum, Eda Marchetti |
Whitening SOA testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEC/SIGSOFT FSE ![In: Proceedings of the 7th joint meeting of the European Software Engineering Conference and the ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2009, Amsterdam, The Netherlands, August 24-28, 2009, pp. 161-170, 2009, ACM, 978-1-60558-001-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
coverage adequacy criteria, testing web services, service-oriented architecture, white-box testing |
17 | Jian Chen 0008, Jie Jia, Yingyou Wen, Dazhe Zhao, Jiren Liu |
Modeling and extending lifetime of wireless sensor networks using genetic algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GEC Summit ![In: Proceedings of the first ACM/SIGEVO Summit on Genetic and Evolutionary Computation, GEC Summit 2009, Shanghai, China, June 12-14, 2009, pp. 47-54, 2009, ACM, 978-1-60558-326-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
solution granularity, genetic algorithm, wireless sensor network, coverage, network lifetime |
17 | Michele Sama, Julian Harty |
Using code instrumentation to enhance testing on J2ME: a lesson learned with JInjector. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HotMobile ![In: Proceedings of the 10th Workshop on Mobile Computing Systems and Applications, HotMobile 2009, Santa Cruz, California, USA, February 23-24, 2009, 2009, ACM, 978-1-60558-283-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Java 2 micro edition, testing, instrumentation, code coverage |
17 | Stephan Weißleder |
Influencing Factors in Model-Based Testing with UML State Machines: Report on an Industrial Cooperation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MoDELS ![In: Model Driven Engineering Languages and Systems, 12th International Conference, MODELS 2009, Denver, CO, USA, October 4-9, 2009. Proceedings, pp. 211-225, 2009, Springer, 978-3-642-04424-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Industrial Cooperation, Model-Based Testing, State Machines, Mutation Analysis, Coverage Criteria |
17 | Huanglin Zeng, Xiaohui Zeng |
Reasoning Decision Rules of an Uncertain System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RSKT ![In: Rough Sets and Knowledge Technology, 4th International Conference, RSKT 2009, Gold Coast, Australia, July 14-16, 2009. Proceedings, pp. 634-641, 2009, Springer, 978-3-642-02961-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
An uncertain information system, Information coverage, Data mining, Rough sets, Statistical methods, Decision rules |
17 | Kuo-Tay Chen, Jian-Shuen Lian, Yu-Ting Hsieh |
Quantifying News Reports to Proxy "Other Information" in ERC Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PAISI ![In: Intelligence and Security Informatics, Pacific Asia Workshop, PAISI 2009, Bangkok, Thailand, April 27, 2009. Proceedings, pp. 161-168, 2009, Springer, 978-3-642-01392-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
earning response coefficient (ERC) model, textual information, news coverage, news sentiment |
17 | You-Chiun Wang, Chun-Chi Hu, Yu-Chee Tseng |
Efficient Placement and Dispatch of Sensors in a Wireless Sensor Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Mob. Comput. ![In: IEEE Trans. Mob. Comput. 7(2), pp. 262-274, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
wireless sensor networks, connectivity, network management, coverage, topology control, deployment, mobile sensors |
17 | Ming Liu 0002, Jiannong Cao 0001, Yuan Zheng 0001, Hai-gang Gong, Xiaomin Wang |
An energy-efficient protocol for data gathering and aggregation in wireless sensor networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Supercomput. ![In: J. Supercomput. 43(2), pp. 107-125, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Data gathering and aggregation, Intra-cluster coverage, Wireless sensor networks |
17 | Ke Ma 0004, Yanyong Zhang, Wade Trappe |
Managing the Mobility of a Mobile Sensor Network Using Network Dynamics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 19(1), pp. 106-120, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
jamming attack, coverage, Mobile sensor networks, potential fields |
17 | Tai-Hua Lu, Chung-Ho Chen, Kuen-Jong Lee |
A hybrid software-based self-testing methodology for embedded processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008, pp. 1528-1534, 2008, ACM, 978-1-59593-753-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
embedded processor testing, fault coverage, functional testing, software-based self-test |
17 | K. R. Jayaram, Aditya P. Mathur |
On the Adequacy of Statecharts as a Source of Tests for Cryptographic Protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: Proceedings of the 32nd Annual IEEE International Computer Software and Applications Conference, COMPSAC 2008, 28 July - 1 August 2008, Turku, Finland, pp. 937-942, 2008, IEEE Computer Society, 978-0-7695-3262-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
TLS protocol, MC/DC coverage, Security protocol, Statechart, Security Vulnerability |
17 | Markus Strohmaier, Jennifer Horkoff, Eric S. K. Yu, Jorge Aranda, Steve M. Easterbrook |
Can Patterns Improve i* Modeling? Two Exploratory Studies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
REFSQ ![In: Requirements Engineering: Foundation for Software Quality, 14th International Working Conference, REFSQ 2008, Montpellier, France, June 16-17, 2008, Proceedings, pp. 153-167, 2008, Springer, 978-3-540-69060-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
The i* Framework, Model Patterns, Modeling Effort, Model Coverage, Model Complexity |
17 | Hui Zeng, Chenxi Zhu, Wei-Peng Chen |
System performance of self-organizing network algorithm in WiMAX femtocells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WICON ![In: Proceedings of the 4th Annual International Conference on Wireless Internet, WICON 2008, Maui, Hawaii, USA, November 17-19, 2008, pp. 25, 2008, ICST, 978-963-9799-36-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
WiMAX, network capacity, frequency assignment, 802.16, femtocell, network coverage |
17 | Wei-Chieh Ke, Bing-Hong Liu, Ming-Jer Tsai |
Constructing a Wireless Sensor Network to Fully Cover Critical Grids by Deploying Minimum Sensors on Grid Points Is NP-Complete. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 56(5), pp. 710-715, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
wireless sensor networks, NP-Complete, coverage problem |
17 | Cunqing Hua, Tak-Shing Peter Yum |
Asynchronous random sleeping for sensor networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Sens. Networks ![In: ACM Trans. Sens. Networks 3(3), pp. 15, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
random sleeping, Sensor network, event detection, energy conservation, k-coverage |
17 | Xiaoling Wu 0004, Jinsung Cho, Brian J. d'Auriol, Sungyoung Lee |
Sleep Nodes Scheduling in Cluster-Based Heterogeneous Sensor Networks Using AHP. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICESS ![In: Embedded Software and Systems, [Third] International Conference, ICESS 2007, Daegu, Korea, May 14-16, 2007, Proceedings, pp. 437-444, 2007, Springer, 978-3-540-72684-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Sensor networks, coverage, AHP, lifetime, sleep scheduling |
17 | Xiaoling Wu 0004, Jinsung Cho, Brian J. d'Auriol, Sungyoung Lee |
Optimal Deployment of Mobile Sensor Networks and Its Maintenance Strategy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GPC ![In: Advances in Grid and Pervasive Computing, Second International Conference, GPC 2007, Paris, France, May 2-4, 2007, Proceedings, pp. 112-123, 2007, Springer, 978-3-540-72359-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Sensor networks, mobility, fuzzy logic, coverage, deployment |
17 | Emrah Tomur, Y. Murat Erten |
Security and Service Quality Analysis for Cluster-Based Wireless Sensor Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WWIC ![In: Wired/Wireless Internet Communications, 5th International Conference, WWIC 2007, Coimbra, Portugal, May 23-25, 2007, Proceedings, pp. 103-114, 2007, Springer, 978-3-540-72694-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
security, QoS, Sensor networks, coverage, spatial resolution |
17 | Yinying Yang, Mihaela Cardei |
Movement-assisted sensor redeployment scheme for network lifetime increase. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MSWiM ![In: Proceedings of the 10th International Symposium on Modeling Analysis and Simulation of Wireless and Mobile Systems, MSWiM 2007, Chania, Crete Island, Greece, October 22-26, 2007, pp. 13-20, 2007, ACM, 978-1-59593-851-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
sensor mobility, wireless sensor networks, coverage, network lifetime, sensor deployment |
17 | P. D. Mzila, Matthew O. Adigun, Sibusiso S. Xulu |
A Service Supplier Database for Location-Based Mobile Commerce. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDCS Workshops ![In: 27th International Conference on Distributed Computing Systems Workshops (ICDCS 2007 Workshops), June 25-29, 2007, Toronto, Ontario, Canada, pp. 4, 2007, IEEE Computer Society, 0-7695-2881-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
coverage area, service advertisement, Location-Based Services, service discovery, network operators |
17 | James H. Andrews, Felix Chun Hang Li, Tim Menzies |
Nighthawk: a two-level genetic-random unit test data generator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007), November 5-9, 2007, Atlanta, Georgia, USA, pp. 144-153, 2007, ACM, 978-1-59593-882-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
genetic algorithms, randomized testing, test coverage |
17 | Kezhong Lu, XiaoHui Lin 0001, Fengxia Ding |
A Local Voronoi Diagram-Based Approximate Algorithm for Minimum Disc Cover Problem. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PDCAT ![In: Eighth International Conference on Parallel and Distributed Computing, Applications and Technologies (PDCAT 2007), 3-6 December 2007, Adelaide, Australia, pp. 421-425, 2007, IEEE Computer Society, 0-7695-3049-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
minimum disc cover problem, disc cover set, average coverage degree, wireless sensor network, node scheduling |
17 | Hannes Frey, Daniel Görgen |
Geographical Cluster-Based Routing in Sensing-Covered Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 17(9), pp. 899-911, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
sensor networks, Ad hoc networks, topology control, geographic routing, sensing coverage |
17 | Maciej Borkowski, James F. Peters |
Matching 2D Image Segments with Genetic Algorithms and Approximation Spaces. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Trans. Rough Sets ![In: Transactions on Rough Sets V, pp. 63-101, 2006, Springer, 3-540-39382-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
2D matching, genetic algorithm, image segment, rough sets, coverage, image, Approximation space |
17 | Christophe Gaston, Pascale Le Gall, Nicolas Rapin, Assia Touil |
Symbolic Execution Techniques for Test Purpose Definition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom ![In: Testing of Communicating Systems, 18th IFIP TC6/WG6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006, Proceedings, pp. 1-18, 2006, Springer, 3-540-34184-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Input/Output Symbolic Transition Systems, Conformance testing, Symbolic Execution, Coverage Criteria, Test Purposes |
17 | Yangfan Zhou, Haixuan Yang, Michael R. Lyu, Edith C. H. Ngai |
A point-distribution index and its application to sensor-grouping in wireless sensor networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWCMC ![In: Proceedings of the International Conference on Wireless Communications and Mobile Computing, IWCMC 2006, Vancouver, British Columbia, Canada, July 3-6, 2006, pp. 1171-1176, 2006, ACM, 1-59593-306-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
honeycomb structure, point-distribution index, sensor grouping, wireless sensor networks, sensor coverage |
17 | Kenan Xu, Glen Takahara, Hossam S. Hassanein |
On the robustness of grid-based deployment in wireless sensor networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWCMC ![In: Proceedings of the International Conference on Wireless Communications and Mobile Computing, IWCMC 2006, Vancouver, British Columbia, Canada, July 3-6, 2006, pp. 1183-1188, 2006, ACM, 1-59593-306-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
grid-based deployment, misalignment, wireless sensor network, robustness, coverage, random error |
17 | Yunhuai Liu, Hoilun Ngan, Lionel M. Ni |
Power-aware Node Deployment in Wireless Sensor Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SUTC (1) ![In: IEEE International Conference on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC 2006), 5-7 June 2006, Taichung, Taiwan, pp. 128-135, 2006, IEEE Computer Society, 0-7695-2553-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
node deployment, sensing and connectivity coverage, wireless sensor networks |
17 | Nabhendra Bisnik, Alhussein A. Abouzeid, Volkan Isler |
Stochastic event capture using mobile sensors subject to a quality metric. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MobiCom ![In: Proceedings of the 12th Annual International Conference on Mobile Computing and Networking, MOBICOM 2006, Los Angeles, CA, USA, September 23-29, 2006, pp. 98-109, 2006, ACM, 1-59593-286-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
event capture, mobile robot motion planning, reliable coverage, robot sensing systems |
17 | Hongmei Chi, Edward L. Jones, Deidre W. Evans, Martin Brown |
Generating Test Data for Specification-Based Tests Via Quasirandom Sequences. ![Search on Bibsonomy](Pics/bibsonomy.png) |
International Conference on Computational Science (4) ![In: Computational Science - ICCS 2006, 6th International Conference, Reading, UK, May 28-31, 2006, Proceedings, Part IV, pp. 773-780, 2006, Springer, 3-540-34385-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
specification-driven test, functional test coverage, quasirandom numbers, well-distributed sequences, automatic test case generation |
17 | Kristen R. Walcott, Mary Lou Soffa, Gregory M. Kapfhammer, Robert S. Roos |
TimeAware test suite prioritization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2006, Portland, Maine, USA, July 17-20, 2006, pp. 1-12, 2006, ACM, 1-59593-263-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
genetic algorithms, test prioritization, coverage testing |
17 | Habib M. Ammari, Sajal K. Das 0001 |
On computing conditional fault-tolerance measures for k-covered wireless sensor networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MSWiM ![In: Proceedings of the 9th International Symposium on Modeling Analysis and Simulation of Wireless and Mobile Systems, MSWiM 2006, Terromolinos, Spain, October 2-6, 2006, pp. 309-316, 2006, ACM, 1-59593-477-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
k-covered WSNs, conditional connectivity, conditional coverage, conditional fault-tolerance, forbidden faulty set |
17 | Kang Chul Kim, Chang-Gyoon Lim, Jae Hung Yoo, Seok Bung Han |
Simulation Cost Reduction Strategies for Behavioral Model Verification in Bayesian Based Stopping Rule. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUC ![In: Embedded and Ubiquitous Computing, International Conference, EUC 2006, Seoul, Korea, August 1-4, 2006, Proceedings, pp. 692-701, 2006, Springer, 3-540-36679-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
behavioral VHDL model, semi-random variable, Verification, stopping rule, branch coverage |
17 | Mazen Tlais, Frédéric Weis, Carole Bonan |
Distributed Mobility Prediction in a Hierarchical Infostation Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AINA (2) ![In: 20th International Conference on Advanced Information Networking and Applications (AINA 2006), 18-20 April 2006, Vienna, Austria, pp. 361-365, 2006, IEEE Computer Society, 0-7695-2466-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
discontinuous coverage, caching, mobility prediction, Infostations |
17 | Timothy Chklovski |
Designing interfaces for guided collection of knowledge about everyday objects from volunteers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IUI ![In: Proceedings of the 10th International Conference on Intelligent User Interfaces, IUI 2005, San Diego, California, USA, January 10-13, 2005, pp. 311-313, 2005, ACM, 1-58113-894-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
collecting broad-coverage knowledge repositories, generalization in knowledge acquisition, interfaces for knowledge elicitation |
17 | Carlo Bellettini, Alessandro Marchetto 0001, Andrea Trentini |
TestUml: user-metrics driven web applications testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: Proceedings of the 2005 ACM Symposium on Applied Computing (SAC), Santa Fe, New Mexico, USA, March 13-17, 2005, pp. 1694-1698, 2005, ACM, 1-58113-964-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
application design model, stop testing, UML, testing, reverse engineering, metrics, testing coverage, white-box testing |
17 | Edgar Leonardo Romero, Marius Strum, Jiang Chau Wang |
Comparing two testbench methods for hierarchical functional verification of a bluetooth baseband adaptor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CODES+ISSS ![In: Proceedings of the 3rd IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2005, Jersey City, NJ, USA, September 19-21, 2005, pp. 327-332, 2005, ACM, 1-59593-161-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
verification strategy, optimization, functional verification, coverage analysis, hierarchical verification |
17 | Thomas R. Puzak, Allan Hartstein, Philip G. Emma, Viji Srinivasan |
When prefetching improves/degrades performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Conf. Computing Frontiers ![In: Proceedings of the Second Conference on Computing Frontiers, 2005, Ischia, Italy, May 4-6, 2005, pp. 342-352, 2005, ACM, 1-59593-019-1. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
prefetching algorithm, cache, prefetch, coverage, accuracy, timeliness |
17 | Hannes Frey, Daniel Görgen |
Geographical Cluster Based Routing in Sensing-Covered Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDCS Workshops ![In: 25th International Conference on Distributed Computing Systems Workshops (ICDCS 2005 Workshops), 6-10 June 2005, Columbus, OH, USA, pp. 885-891, 2005, IEEE Computer Society, 0-7695-2328-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Sensor Networks, Ad-hoc Networks, Topology Control, Geographic Routing, Sensing Coverage |
17 | Alexander Pretschner, Wolfgang Prenninger, Stefan Wagner 0001, Christian Kühnel, Martin Baumgartner, Bernd Sostawa, Rüdiger Zölch, Thomas Stauner |
One evaluation of model-based testing and its automation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA, pp. 392-401, 2005, ACM. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
abstraction, coverage, test case generation, CASE, model-based development, automotive software |
17 | Yung-Ruei Chang, Suprasad V. Amari, Sy-Yen Kuo |
Computing System Failure Frequencies and Reliability Importance Measures Using OBDD. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 53(1), pp. 54-68, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Failure frequency, reliability importance measure, imperfect coverage, fault tolerance, BDD, system availability |
17 | Amir Rajabzadeh, Seyed Ghassem Miremadi, Mirzad Mohandespour |
Error Detection Enhancement in COTS Superscalar Processors with Performance Monitoring Features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(5), pp. 553-567, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
COTS processors, fault injection, performance monitoring, analytical evaluation, watchdog processor, error detection coverage |
17 | Ruth Yuee Zhang, Laks V. S. Lakshmanan, Ruben H. Zamar |
Extracting relational data from HTML repositories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGKDD Explor. ![In: SIGKDD Explor. 6(2), pp. 5-13, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
coverage estimation, information extraction, pattern, duplication |
17 | Willem Visser, Corina S. Pasareanu, Sarfraz Khurshid |
Test input generation with java PathFinder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2004, Boston, Massachusetts, USA, July 11-14, 2004, pp. 97-107, 2004, ACM, 1-58113-820-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
testing object-oriented programs, model checking, coverage, symbolic execution, red-black trees |
17 | Amie L. Souter, Lori L. Pollock |
The Construction of Contextual Def-Use Associations for Object-Oriented Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 29(11), pp. 1005-1018, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
D.3.2.p Object-oriented languages, D.2.5.m Testing coverage of code, object flow analysis |
17 | Serdar Tasiran, Yuan Yu, Brannon Batson |
Using a formal specification and a model checker to monitor and direct simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pp. 356-361, 2003, ACM, 1-58113-688-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
model checking, specification, abstraction, coverage |
17 | Hairong Sun, James J. Han, Isaac Levendel |
Impact of Fault Management Server and Its Failure-related Parameters on High-Availability Communication Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2002 International Conference on Dependable Systems and Networks (DSN 2002), 23-26 June 2002, Bethesda, MD, USA, Proceedings, pp. 679-686, 2002, IEEE Computer Society, 0-7695-1597-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
coverage ratio, fail-safe ratio, availability, Fault management |
17 | Hairong Sun, James J. Han, Isaac Levendel |
Availability Requirement for a Fault Management Server in High-Availability Communication Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPDPS ![In: 16th International Parallel and Distributed Processing Symposium (IPDPS 2002), 15-19 April 2002, Fort Lauderdale, FL, USA, CD-ROM/Abstracts Proceedings, 2002, IEEE Computer Society, 0-7695-1573-8. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
coverage ratio, fail-safe ratio, availability, Fault management |
17 | Junichi Hirase, Shinichi Yoshimura |
Faster processing for microprocessor functional ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 191-197, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
microprocessor functional ATPG, fault coverage improvement, short test pattern, processing speed increase, logic testing, integrated circuit testing, automatic test pattern generation, identification, test pattern generation, functional testing, microprocessor chips, instruction sets, instruction sets, microprocessor tests |
17 | Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer |
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 151-, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
DO-RE-ME technique, MPG-D model, defective part level prediction, benchmark circuit simulations, stuck-at fault detection tests, bridging surrogate detection, stuck-at fault coverage, predictor accuracy, industrial circuit, test pattern sequences, integrated circuit testing, automatic test pattern generation, ATPG, fault simulation, logic circuit, circuit simulation, integrated logic circuits, correlation coefficient |
17 | Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu |
General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 171-178, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
fixed-coverage fixed-size test set, test generation, BIST, iterative logic arrays |
17 | Biplab K. Sikdar, Kolin Paul, Gosta Pada Biswas, Parimal Pal Chaudhuri, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee |
Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India, pp. 556-561, 2000, IEEE Computer Society, 0-7695-0487-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Extension field, BIST structure, Cellular Automata (CA), VLSI design and RTL, Finite field, DFT, Fault coverage, LFSR |
17 | Marinés Puig-Medina, Gülbin Ezer, Pavlos Konas |
Verification of configurable processor cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 37th Conference on Design Automation, Los Angeles, CA, USA, June 5-9, 2000., pp. 426-431, 2000, ACM. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
configurable processor cores, system-on-chip, test generation, design verification, co-simulation, coverage analysis |
17 | Dariusz Badura, Andrzej Hlawiczka |
Low Cost Bist for Edac Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 410-415, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
CBIST, EDAC, error aliasing, fault coverage, self-test |
17 | Alvin Jee, F. Joel Ferguson |
A methodolgy for characterizing cell testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 384-390, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
cell testability, stuck-at fault coverage, IC quality, physical design for testability, metric, integrated circuit design, integrated circuit design, DPM, manufacturing defects |
17 | Patrick Girard 0001, Christian Landrault, V. Moreda, Serge Pravossoudovitch |
An optimized BIST test pattern generator for delay testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 94-100, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
BIST test pattern generator, robust delay fault coverage, single input change test sequence, compatible inputs, optimization, delays, built-in self-test, fault detection, delay testing, test length, area overhead, circuit under test |
17 | Silvia Chiusano, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda |
Cellular automata for deterministic sequential test pattern generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 60-67, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
deterministic sequential test pattern generation, cellular automaton identification, hardware structure, area occupation, ASIC testing, evolutionary algorithm, cellular automata, BIST, fault coverage, stuck-at faults, FSM, deterministic automata |
17 | Srimat T. Chakradhar, Vijay Gangaram, Steven G. Rothweiler |
Deriving Signal Constraints to Accelerate Sequential Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India, pp. 488-494, 1997, IEEE Computer Society, 0-8186-7755-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
sequential test generation algorithm acceleration, signal constraints, large sequential circuits, deterministic sequential test generation, signal constraint computation technique, line probabilities, line justification techniques, benchmark sequential circuits, test generation time reduction, production sequential circuits, 3-valued signal probabilities, fault diagnosis, fault coverage, symbolic simulation, truth table |
17 | Teruhiko Yamada, Tsuyoshi Sasaki |
On Current Testing of Josephson Logic Circuits Using the 4JL Gate Family. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 189-, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
4JL gate, Josephson logic circuit, current testing, defect coverage |
17 | Li-Ren Huang, Jing-Yang Jou, Sy-Yen Kuo |
An Efficient PRPG Strategy By Utilizing Essential Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 199-204, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
PRPG, essential fault, multiple polynomial, Gauss elimination, pseudorandom test pattern, multivariable linear equation, deterministic test set, random pattern resistant circuit, don't care value, intelligent heuristic, ISCAS-85 benchmark, ISCAS-89 benchmark, built-in self test, BIST, fault coverage, LFSR, test length, hardware overhead, multiple seed |
17 | Nur A. Touba, Edward J. McCluskey |
Test point insertion based on path tracing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 2-8, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
probabilistic techniques, primary inputs, insertion methods, VLSI, VLSI, fault diagnosis, logic testing, logic testing, probability, built-in self test, timing, integrated circuit testing, BIST, automatic testing, fault coverage, test point insertion, path tracing, circuit-under-test |
17 | Krishna B. Rajan, David E. Long, Miron Abramovici |
Increasing testability by clock transformation (getting rid of those darn states). ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 224-230, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
clock transformation, sequential test generation, darn states, easy-to-reach states, logic testing, partitioning, design for testability, sequential circuits, DFT, fault coverage, testability, flip-flops, flip-flops, clocks, logic partitioning |
17 | Ad J. van de Goor, Georgi Gaydadjiev, V. G. Mikitjuk, Vyacheslav N. Yarmolik |
March LR: a test for realistic linked faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 272-280, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
disturb faults, March LR, March LRD, March LRDD, fault diagnosis, integrated circuit testing, fault models, fault coverage, march tests, integrated memory circuits, semiconductor memories, linked faults |
17 | Nur A. Touba, Edward J. McCluskey |
Applying two-pattern tests using scan-mapping. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 393-399, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
scan-mapping, combinational mapping logic, logic testing, built-in self test, built-in self-testing, fault coverage, delay faults, pseudo-random testing, deterministic testing, two-pattern tests |
17 | C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal |
A STAFAN-like functional testability measure for register-level circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 192-198, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model |
17 | Arun Balakrishnan, Srimat T. Chakradhar |
Software transformations for sequential test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 266-, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
sequential test generation, high fault coverage test sets, testability properties, inverse mapping, software engineering, logic testing, timing, design for testability, sequential circuits, sequential circuits, DFT, software model, software transformations |
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