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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 2833 occurrences of 878 keywords
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Results
Found 2210 publication records. Showing 2210 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
18 | Lionel C. Briand, Yvan Labiche |
A UML-Based Approach to System Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Syst. Model. ![In: Softw. Syst. Model. 1(1), pp. 10-42, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Testing of object-oriented systems, UML, Testability, Sequence Diagrams, System testing, Use Cases |
18 | Maisaa Khalil, Chantal Robach, Franc Novak |
Diagnosis Strategies for Hardware or Software Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(2), pp. 241-251, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
diagnostic strategies, diagnostic tools, system level diagnostics, testability, fault location |
18 | Frank te Beest, Kees van Berkel 0001, Ad M. G. Peeters |
Adding Synchronous and LSSD Modes to Asynchronous Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASYNC ![In: 8th International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2002), 9-11 April 2002, Manchester, UK, pp. 161-170, 2002, IEEE Computer Society, 0-7695-1540-1. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
design for testability, asynchronous circuits, scan test, LSSD |
18 | Sasha Novakovsky, Shy Shyman, Ziyad Hanna |
High capacity and automatic functional extraction tool for industrial VLSI circuit designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, ICCAD 2002, San Jose, California, USA, November 10-14, 2002, pp. 520-525, 2002, ACM / IEEE Computer Society, 0-7803-7607-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Formal Equivalence Verification (FEV), Hardware Description Languages (HDL), Switch Level Analysis, functional abstraction, satisfiability procedures, synthesis, Design For Testability (DFT), logic simulation, Binary Decision Diagrams (BDDs) |
18 | Muhammad Nummer, Manoj Sachdev |
A Methodology for Testing High-Performance Circuits at Arbitrarily Low Test Frequency. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 68-74, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
high-performance testing, controlled-delay flip-flop, built-in self test, Delay-fault testing, design for delay testability |
18 | Mang Li, Axel Rennoch, Ina Schieferdecker, Dorota Witaszek, O. Halabi, Alain Vouffo, Aihong Yin |
Experience Report on Conformance Tests for CORBA ORBs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APAQS ![In: 2nd Asia-Pacific Conference on Quality Software (APAQS 2001), 10-11 December 2001, Hong Kong, China, Proceedings, pp. 173-184, 2001, IEEE Computer Society, 0-7695-1287-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Static and dynamic analysis, CORBA, Conformance testing, Testability, Testing tools |
18 | Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi |
An Approach for Detecting Multiple Faulty FPGA Logic Blocks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(1), pp. 48-54, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
fault tolerance, FPGA, multiple faults, C-testability, PLD |
18 | Hideo Fujiwara |
A New Class of Sequential Circuits with Combinational Test Generation Complexity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(9), pp. 895-905, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
complexity, test generation, design for testability, sequential circuits, reducibility, partial scan, Balanced structure |
18 | Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara |
A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 16(5), pp. 553-566, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
non-scan design for testability, complete fault efficiency, controllers, at-speed test |
18 | Marly Roncken, Ken S. Stevens, Rajesh Pendurkar, Shai Rotem, Parimal Pal Chaudhuri |
CA-BIST for Asynchronous Circuits: A Case Study on the RAPPID Asynchronous Instruction Length Decoder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASYNC ![In: 6th International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2000), 2-6 April 2000, Eilat, Israel, pp. 62-72, 2000, IEEE Computer Society, 0-7695-0586-4. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
pulse logic, switch-level fault simulation, Cellular Automata, BIST, asynchronous circuits, testability, stuck-at faults, domino logic, self-timed circuits, dynamic circuits |
18 | José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski |
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 96-, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
PWM circuit, compact test vectors, analog VLSI technology, functional fault macromodels, compact test vector construction, open loop gain, CMMR, analog circuit simulation complexity, VLSI, integrated circuit testing, design for testability, automatic test pattern generation, fault modeling, fault simulation, fault simulation, operational amplifiers, operational amplifiers, test pattern, functional fault models, analogue circuits, fault dictionary, pulse width modulation, slew-rate |
18 | Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero, Massimo Violante |
A genetic algorithm-based system for generating test programs for microprocessor IP cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICTAI ![In: 12th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2000), 13-15 November 2000, Vancouver, BC, Canada, pp. 195-198, 2000, IEEE Computer Society, 0-7695-0909-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
industrial property, genetic algorithm based system, test program generation, microprocessor IP cores, digital systems design trend, design-and-reuse paradigm, intellectual property cores, encrypted gate-level netlist, testability problems, automatic approach, processor cores, fault coverage figures, random approach, genetic algorithms, genetic algorithms, microprocessor chips, automatic test software, test program, electronic engineering computing |
18 | Albrecht P. Stroele |
Synthesis for Arithmetic Built-In Self-Tes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 165-170, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
test configuration, built-in self-test, high-level synthesis, synthesis for testability, Accumulator |
18 | Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 14(1-2), pp. 149-158, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
hardware/software, system testability, architecture, metrics, quality assessment |
18 | Ilker Hamzaoglu, Janak H. Patel |
Reducing Test Application Time for Full Scan Embedded Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTCS ![In: Digest of Papers: FTCS-29, The Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing, Madison, Wisconsin, USA, June 15-18, 1999, pp. 260-267, 1999, IEEE Computer Society, 0-7695-0213-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
test generation, design-for-testability, fault simulation, embedded cores, full scan |
18 | Shiyi Xu, Tukwasibwe Justaf Frank |
An Evaluation of Test Generation Algorithms for combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 63-69, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Genetic Algorithm, Test Generation, Forecasting, Testability |
18 | Li Shen 0002 |
Genetic Algorithm Based Test Generation for Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 179-184, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
sequential depth analysis, dynamic testability measure, genetic algorithm, test generation, Sequential testing |
18 | Rohit Sharma, C. P. Ravikumar |
Design Issues in Synthesis of Reusable Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Great Lakes Symposium on VLSI ![In: 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 4-6 March 1999, Ann Arbor, MI, USA, pp. 144-, 1999, IEEE Computer Society, 0-7695-0104-4. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Deign Reuse, CORDIC Arithmetic and Core Testability, Embedded Cores |
18 | Marie-Lise Flottes, R. Pires, Bruno Rouzeyre, Laurent Volpe |
Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 1998 Design, Automation and Test in Europe (DATE '98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France, pp. 921-922, 1998, IEEE Computer Society, 0-8186-8359-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
Scan chain selection, RT and gate levels, Partial scan, Synthesis for testability |
18 | Xiaoming Yu, Yinghua Min |
Design of delay-verifiable combinational logic by adding extra inputs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 332-, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
delay-verifiable combinational logic, delay testability, synthesis, combinational circuits, hardware overhead, temporal behavior |
18 | Michinobu Nakao, Kazumi Hatayama, Isao Higashi |
Accelerated Test Points Selection Method for Scan-Based BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 359-, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Test points, Optimization, BIST, Testability |
18 | Cheng-Wen Wu |
On energy efficiency of VLSI testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 132-137, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
test efficiency models, CMOS power consumption model, high testability, high power dissipation, high-power testing, transition activity factor, fabricated chip, testing energy, VLSI, energy efficiency, fault coverage, design optimization, VLSI testing, testing time, test efficiency, testing power |
18 | Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto |
Random Pattern Testable Design with Partial Circuit Duplication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 353-358, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Partial circuit duplication, Random testing Built-in self test, Design for testability |
18 | Christos A. Papachristou, Mikhail Baklashov |
A test synthesis technique using redundant register transfers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1997, San Jose, CA, USA, November 9-13, 1997, pp. 414-420, 1997, IEEE Computer Society / ACM, 0-8186-8200-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
behavioral variables, conditional statements, redundant register transfers, structural signals, test synthesis technique, testability metrics, graph theory, logic testing, controllability, high level synthesis, VHDL, observability, fault coverage, data path, hardware overhead, behavioral descriptions |
18 | Rolf Drechsler, Martin Keim, Bernd Becker 0001 |
Fault Simulation in Sequential Multi-Valued Logic Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISMVL ![In: 27th IEEE International Symposium on Multiple-Valued Logic, ISMVL 1997, Antigonish, Nova Scotia, Canada, May 28-30, 1997, Proceedings, pp. 145-152, 1997, IEEE Computer Society, 0-8186-7910-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
sequential multi-valued logic networks, multi-valued logic networks, logic testing, sequential circuits, fault models, fault simulator, random pattern testability |
18 | Vladimír Székely, Márta Rencz, Bernard Courtois |
Integrating on-chip temperature sensors into DfT schemes and BIST architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 440-445, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
on-chip low-power small-area CMOS temperature sensor, DfTT, design for thermal testability, safety-critical circuit, integrated circuit testing, BIST, CMOS integrated circuits |
18 | Eduardo J. Peralías, Adoración Rueda, José L. Huertas |
A DFT Technique for Analog-to-Digital Converters with digital correction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 302-307, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Design for Testability of Data Converters, Analog and Mixed Signal Test |
18 | Chen-Yang Pan, Kwang-Ting Cheng, Sandeep Gupta 0001 |
Fault macromodeling and a testing strategy for opamps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 9(3), pp. 225-235, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
catastrophic fault model, operational amplifier design for testability, analog test, macromodeling, parametric faults |
18 | Cheng-Ping Wang, Chin-Long Wey |
Test Generation Of Analog Switched-Current Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 276-281, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
switched current circuits, analog switched-current circuits, current switches, voltage switches, noncatastrophic faults, transistor switches, full testability, current copiers, stray inductance, CMOS switch, BIST design, fault model, circuit simulation, macromodel, switched-capacitor circuits, test sequence generation, catastrophic faults |
18 | Wang-Dauh Tseng, Kuochen Wang |
Testable Design and Testing of MCMs Based on Multifrequency Scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 75-, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
boundary scan architecture, multifrequency test, smart substrate, technology mixed, design for testability, VHDL, multichip module |
18 | Ghassan Al Hayek, Yves Le Traon, Chantal Robach |
Considering Test Economics in the Process of Hardware/Software Partitioning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 22rd EUROMICRO Conference '96, Beyond 2000: Hardware and Software Design Strategies, September 2-5, 1996, Prague, Czech Republic, pp. 28-, 1996, IEEE Computer Society, 0-8186-7487-3. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
hardware/software testing, specifications, logic testing, estimate, testability, co-design, mutation-test, hardware/software partitioning, test economics |
18 | Robert B. Norwood, Edward J. McCluskey |
Synthesis-for-scan and scan chain ordering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 87-92, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
synthesis-for-scan procedure, scan chain ordering, testable circuit design, beneficial scan, VLSI, logic testing, integrated circuit testing, design for testability, logic design, sequential circuits, logic synthesis, flip-flops, integrated circuit design, integrated logic circuits, test strategy, boundary scan testing, functional specifications |
18 | Michel Renovell, Florence Azaïs, Yves Bertrand |
The multi-configuration: A DFT technique for analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 54-59, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
multi-configuration technique, diagnosis facilities, 8/sup th/ order band pass filter, integrated circuit testing, design for testability, integrated circuit design, analog circuits, analogue integrated circuits, band-pass filters, DFT technique |
18 | Debesh Kumar Das, Bhargab B. Bhattacharya |
Does retiming affect redundancy in sequential circuits? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India, pp. 260-263, 1996, IEEE Computer Society, 0-8186-7228-5. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
combinational redundancy, sequential redundancy, fault diagnosis, logic testing, timing, redundancy, test generation, design for testability, sequential circuits, sequential circuit, fault, retiming, logic optimization, operation speed |
18 | Claudio Costi, Micaela Serra, Donatella Sciuto |
A new DFT methodology for sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 7(3), pp. 223-240, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
design for testability, ATPG, fault coverage, scan design, test application time |
18 | Rajesh Gupta 0003, Melvin A. Breuer |
Partial scan design of register-transfer level circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 7(1-2), pp. 25-46, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
serial scan design, I-paths, design for testability, register-transfer level designs, balanced structures, partial scan design |
18 | Rolf Drechsler, Rolf Krieger, Bernd Becker 0001 |
Random Pattern Fault Simulation in Multi-Valued Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISMVL ![In: 25th IEEE International Symposium on Multiple-Valued Logic, ISMVL 1995, Bloomington, Indiana, USA, May 23-25, 1995, Proceedings, pp. 98-103, 1995, IEEE Computer Society, 0-8186-7118-1. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
random pattern fault simulation, multi-valued circuits, multi-valued logic networks, fault diagnosis, logic testing, integrated circuit testing, fault simulator, circuit analysis computing, multivalued logic circuits, random pattern testability |
18 | Junya Kudoh, Toshiro Takahashi, Yukio Umada, Masaharu Kimura, Shigeru Yamamoto, Youichi Ito |
A CMOS gate array with dynamic-termination GTL I/O circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 1995 International Conference on Computer Design (ICCD '95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings, pp. 25-29, 1995, IEEE Computer Society, 0-8186-7165-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
CMOS gate array, dynamic-termination GTL I/O circuits, triple-metal-layer process technology, push-pull output driver, dynamic termination receiver, 250 Mb/s data, stub line, terminated bus line, IDDQ testability, differential receiver, delay time overheads, 0.5 micron, 250 Mbit/s, logic testing, delays, CMOS logic circuits, logic arrays |
18 | Ted Stanion, Carl Sechen |
Quasi-algebraic decompositions of switching functions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARVLSI ![In: 16th Conference on Advanced Research in VLSI (ARVLSI '95), March 27-29, 1995, Chapel Hill, North Carolina, USA, pp. 358-367, 1995, IEEE Computer Society, 0-8186-7047-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
quasi-algebraic decompositions, algebraic product, binary Boolean operation, canonical manner, SSL testable, logic testing, testability, switching functions, switching functions, state assignment, minimisation of switching nets, benchmark circuits, circuit size |
18 | Nilanjan Mukherjee 0001, H. Kassab, Janusz Rajski, Jerzy Tyszer |
Arithmetic built-in self test for high-level synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 132-139, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
arithmetic built-in self test, data path architectures, arithmetic blocks, compact test responses, testable circuit synthesis, logic testing, built-in self test, high level synthesis, high-level synthesis, integrated circuit testing, logic CAD, testability, abstract level, test vectors, state coverage |
18 | Santanu Chattopadhyay, Samir Roy, Parimal Pal Chaudhuri |
Technology mapping on a multi-output logic module built around Cellular Automata Array for a new FPGA architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 57-62, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
multi-output logic module, cellular automata array, design turn-around time, field programmability, rapid circuit realization, logic blocks, AND-XOR based logic, library based technology mapping technique, MCNC benchmarks, field programmable gate arrays, VLSI, cellular automata, logic CAD, testability, technology mapping, multivalued logic circuits, FPGA architecture |
18 | Enrico Macii, Angelo Raffaele Meo |
A test generation program for sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 5(1), pp. 115-119, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
Automatic test pattern generation for sequential circuits, interactive fault simulation, pruning heuristics, circuit partitioning, testability measures |
18 | Bruce F. Cockburn |
Tutorial on semiconductor memory testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 5(4), pp. 321-336, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
Design for testability, fault models, functional test, memory testing, memory design |
18 | Vishwani D. Agrawal |
A tale of two designs: the cheapest and the most economic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 5(2-3), pp. 131-135, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
Benefit-cost trade-off, economics of design for testability, engineering economics, cost analysis |
18 | Srimat T. Chakradhar, Suman Kanjilal, Vishwani D. Agrawal |
Finite state machine synthesis with fault tolerant test function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 4(1), pp. 57-69, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
Design for combinational test generation, finite state machine synthesis, test function embedding, synthesis for testability, fault-tolerant design |
18 | Bernhard Eschermann |
State Assignment for Hardwired VLSI Control Units. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Comput. Surv. ![In: ACM Comput. Surv. 25(4), pp. 415-436, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
coding constraints, VLSI, computer-aided design, synthesis, finite-state machines, logic design, sequential circuits, testability, integrated circuits, built-in tests, state assignment, control design |
18 | Vishwani D. Agrawal, Kwang-Ting Cheng |
Finite state machine synthesis with embedded test function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 1(3), pp. 221-228, 1990. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
VLSI, Computer-Aided Design, Test Generation, Logic Synthesis, Synthesis for Testability |
15 | Xiaojun Ma, Jing Huang 0001, Cecilia Metra, Fabrizio Lombardi |
Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 25(1), pp. 39-54, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Array testing, Nanotechnology, Emerging technology, Reversible computing, QCA |
15 | Syed M. Alam, Robert E. Jones, Scott Pozder, Ankur Jain |
Die/wafer stacking with reciprocal design symmetry (RDS) for mask reuse in three-dimensional (3D) integration technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA, pp. 569-575, 2009, IEEE Computer Society, 978-1-4244-2952-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
15 | Clemente Izurieta, James M. Bieman |
Testing Consequences of Grime Buildup in Object Oriented Design Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: First International Conference on Software Testing, Verification, and Validation, ICST 2008, Lillehammer, Norway, April 9-11, 2008, pp. 171-179, 2008, IEEE Computer Society, 978-0-7695-3127-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Software grime, decay, anti-patterns, testing, object oriented, design patterns |
15 | Hazem El-Gendy, Nabil El-Kadhi, Narayan C. Debnath |
Towards sound development of PIXITP, conformance test suites, and conforming implementations for various Formal Description Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCC ![In: Proceedings of the 13th IEEE Symposium on Computers and Communications (ISCC 2008), July 6-9, Marrakech, Morocco, pp. 643-648, 2008, IEEE Computer Society, 978-1-4244-2702-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Mukesh Agrawal, Sandip Karmakar, Dhiman Saha, Debdeep Mukhopadhyay |
Scan Based Side Channel Attacks on Stream Ciphers and Their Counter-Measures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
INDOCRYPT ![In: Progress in Cryptology - INDOCRYPT 2008, 9th International Conference on Cryptology in India, Kharagpur, India, December 14-17, 2008. Proceedings, pp. 226-238, 2008, Springer, 978-3-540-89753-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Antonio Zenteno Ramírez, Guillermo Espinosa, Víctor H. Champac |
Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 15(5), pp. 572-577, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Jia Di, Parag K. Lala |
Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(2-3), pp. 175-192, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Reed-Muller expression, nanoscale circuit, layout, stuck-at fault, cellular arrays, delay-insensitive circuit |
15 | Teemu Kanstrén |
Towards Trace Based Model Synthesis for Program Understanding and Test Automation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the Second International Conference on Software Engineering Advances (ICSEA 2007), August 25-31, 2007, Cap Esterel, French Riviera, France, pp. 46, 2007, IEEE Computer Society, 0-7695-2937-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Tali Kaufman, Madhu Sudan 0001 |
Sparse Random Linear Codes are Locally Decodable and Testable. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FOCS ![In: 48th Annual IEEE Symposium on Foundations of Computer Science (FOCS 2007), October 20-23, 2007, Providence, RI, USA, Proceedings, pp. 590-600, 2007, IEEE Computer Society, 978-0-7695-3010-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Himanshu Thapliyal, A. Prasad Vinod 0001 |
Designing Efficient Online Testable Reversible Adders With New Reversible Gate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA, pp. 1085-1088, 2007, IEEE, 1-4244-0920-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Francesco Regazzoni 0001, Thomas Eisenbarth 0001, Johann Großschädl, Luca Breveglieri, Paolo Ienne, Israel Koren, Christof Paar |
Power Attacks Resistance of Cryptographic S-Boxes with Added Error Detection Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy., pp. 508-516, 2007, IEEE Computer Society, 0-7695-2885-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz, Sudhakar M. Reddy |
Autoscan-Invert: An Improved Scan Design without External Scan Inputs or Outputs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 416-421, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Peter Wohl, John A. Waicukauski, Sanjay Patel |
Automated Design and Insertion of Optimal One-Hot Bus Encoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 409-415, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Matthias M. Müller |
The Effect of Test-Driven Development on Program Code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
XP ![In: Extreme Programming and Agile Processes in Software Engineering, 7th International Conference, XP 2006, Oulu, Finland, June 17-22, 2006, Proceedings, pp. 94-103, 2006, Springer, 3-540-35094-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre |
Secure Scan Techniques: A Comparison. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, pp. 119-124, 2006, IEEE Computer Society, 0-7695-2620-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Christian Borgs, Jennifer T. Chayes, László Lovász 0001, Vera T. Sós, Balázs Szegedy, Katalin Vesztergombi |
Graph limits and parameter testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
STOC ![In: Proceedings of the 38th Annual ACM Symposium on Theory of Computing, Seattle, WA, USA, May 21-23, 2006, pp. 261-270, 2006, ACM, 1-59593-134-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
convergence of graphs, distance of graphs, graph limit, property testing, graph homomorphism |
15 | Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura |
Current Testable Design of Resistor String DACs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia, pp. 197-200, 2006, IEEE Computer Society, 0-7695-2500-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Shyue-Kung Lu, Ting-Yu Chen, Wei-Yuan Liu |
Efficient Built-In Self-Test Schemes for Video Coding Cores: a Case Study on DCT/IDCT Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 12th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2006), 18-20 December, 2006, University of California, Riverside, USA, pp. 97-104, 2006, IEEE Computer Society, 0-7695-2724-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz, Sudhakar M. Reddy |
Autoscan: a scan design without external scan inputs or outputs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 13(9), pp. 1087-1095, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
15 | Josef Strnadel, Zdenek Kotásek |
Educational Tool for the Demonstration of DfT Principles Based on Scan Methodologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal, pp. 420-427, 2005, IEEE Computer Society, 0-7695-2433-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
15 | Paul Valiant |
The Tensor Product of Two Codes Is Not Necessarily Robustly Testable. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APPROX-RANDOM ![In: Approximation, Randomization and Combinatorial Optimization, Algorithms and Techniques, 8th International Workshop on Approximation Algorithms for Combinatorial Optimization Problems, APPROX 2005 and 9th InternationalWorkshop on Randomization and Computation, RANDOM 2005, Berkeley, CA, USA, August 22-24, 2005, Proceedings, pp. 472-481, 2005, Springer, 3-540-28239-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
15 | Deepali Koppad, Alexandre V. Bystrov, Alexandre Yakovlev |
Off-Line Testing of Asynchronous Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India, pp. 730-735, 2005, IEEE Computer Society, 0-7695-2264-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
15 | José Luis Huertas |
Test and design-for-test of mixed-signal integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 17th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2004, Pernambuco, Brazil, September 7-11, 2004, pp. 4, 2004, ACM. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
15 | David Hély, Marie-Lise Flottes, Frédéric Bancel, Bruno Rouzeyre, Nicolas Bérard, Michel Renovell |
Scan Design and Secure Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal, pp. 219-226, 2004, IEEE Computer Society, 0-7695-2180-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
15 | Sita Ramakrishnan |
VISWAS and on Diagnosability with IEEE Std P1522 and UML2.0 Testing Profile. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FATES ![In: Formal Approaches to Software Testing, Third International Workshop on Formal Approaches to Testing of Software, FATES 2003, Montreal, Quebec, Canada, October 6th, 2003, pp. 236-251, 2003, Springer, 3-540-20894-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
15 | Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira 0001 |
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 18(2), pp. 179-187, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
fault modeling, DFT, TPG, RTL |
15 | Mohammad A. Naal, M. Rakotoar, Emmanuel Simeu, Chouki Aktouf |
Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, pp. 184, 2002, IEEE Computer Society, 0-7695-1641-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
15 | Kamalnayan Jayaraman, Vivekananda M. Vedula, Jacob A. Abraham |
Native Mode Functional Self-Test Generation for Systems-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 3rd International Symposium on Quality of Electronic Design, ISQED 2002, San Jose, CA, USA, March 18-21, 2002, pp. 280-285, 2002, IEEE Computer Society, 0-7695-1561-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
functional self-test, native-mode, signature compression, system-on-chip, at-speed |
15 | Daniela De Venuto, Michael J. Ohletz |
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(3-4), pp. 243-253, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
mixed-signal ASIC, hardware conversion, GO/NOGO test, bias programming, DfT, power consumption, overhead |
15 | Chien-Nan Jimmy Liu, I-Ling Chen, Jing-Yang Jou |
An efficient design-for-verification technique for HDLs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan, pp. 103-108, 2001, ACM, 0-7803-6634-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
15 | Dong Xiang, Yi Xu |
A Multiple Phase Partial Scan Design Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 17-22, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
15 | David W. Flater, K. C. Morris 0001 |
Harmonized Conformance Testing for Product Data Managers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: 25th International Computer Software and Applications Conference (COMPSAC 2001), Invigorating Software Development, 8-12 October 2001, Chicago, IL, USA, pp. 46-54, 2001, IEEE Computer Society, 0-7695-1372-7. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
middleware, testing, databases, standards, harmonization, PDM |
15 | Michael Affenzeller, Franz Pichler, Rudolf Mittelmann |
On CAST.FSM Computation of Hierarchical Multi-layer Networks of Automata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROCAST ![In: Computer Aided Systems Theory - EUROCAST 2001, Las Palmas de Gran Canaria, Spain, February 19-23, 2001, Revised Papers, pp. 36-44, 2001, Springer, 3-540-42959-X. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
15 | Richard M. Chou, Kewal K. Saluja |
Testable Sequential Circuit Design: A Partition and Resynthesis Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 62-67, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
15 | Sameer Sharma, Michael S. Hsiao |
Combination of Structural and State Analysis for Partial Scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India, pp. 134-, 2001, IEEE Computer Society, 0-7695-0831-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
15 | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian |
Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(10), pp. 1083-1099, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Sequential fault modeling, test pattern generation, robust testing, iterative logic arrays |
15 | Irith Pomeranz, Sudhakar M. Reddy |
On the Use of Fully Specified Initial States for Testing of Synchronous Sequential Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(2), pp. 175-181, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
irredundant faults, built-in test generation, test generation, synchronous sequential circuits, Initial states |
15 | Indradeep Ghosh, Niraj K. Jha, Sudipta Bhawmik |
A BIST scheme for RTL circuits based on symbolic testabilityanalysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(1), pp. 111-128, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
15 | Tong Liu 0007, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi |
Testing and testable designs for one-time programmable FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(11), pp. 1370-1375, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
15 | Marcello Dalpasso, Alessandro Bogliolo, Luca Benini, Michele Favalli |
Virtual Fault Simulation of Distributed IP-Based Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France, pp. 99-103, 2000, IEEE Computer Society / ACM, 0-7695-0537-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
15 | A. Bommireddy, Jitendra Khare, Saghir A. Shaikh, S.-T. Su |
Test and Debug of Networking SoCs: A Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 121-126, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
15 | Raghuram S. Tupuri, Jacob A. Abraham, Daniel G. Saab |
Hierarchical Test Generation for Systems On a Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India, pp. 198-, 2000, IEEE Computer Society, 0-7695-0487-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
15 | Ben Mathew, Daniel G. Saab |
Combining multiple DFT schemes with test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(6), pp. 685-696, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Kenneth M. Butler |
Estimating the Economic Benefits of DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 16(1), pp. 71-79, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Thomas W. Williams |
Testing in Nanometer Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 1999 Design, Automation and Test in Europe (DATE '99), 9-12 March 1999, Munich, Germany, pp. 5-, 1999, IEEE Computer Society / ACM, 0-7695-0078-1. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Noga Alon, Michael Krivelevich, Ilan Newman, Mario Szegedy |
Regular Languages Are Testable with a Constant Number of Queries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FOCS ![In: 40th Annual Symposium on Foundations of Computer Science, FOCS '99, 17-18 October, 1999, New York, NY, USA, pp. 645-655, 1999, IEEE Computer Society, 0-7695-0409-4. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
testing, randomized algorithms, regular languages |
15 | Meghanad D. Wagh, Chien-In Henry Chen |
High-level design synthesis with redundancy removal for high speed testable adders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (6) ![In: Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30 - June 2, 1999, pp. 358-361, 1999, IEEE, 0-7803-5471-0. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Majid Sarrafzadeh, Toshihiko Takahashi |
A fast algorithm for routability testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (6) ![In: Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30 - June 2, 1999, pp. 178-181, 1999, IEEE, 0-7803-5471-0. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Xiaowei Li 0001, Paul Y. S. Cheung |
Exploiting Test Resource Optimization in Data Path Synthesis for BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Great Lakes Symposium on VLSI ![In: 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 4-6 March 1999, Ann Arbor, MI, USA, pp. 342-343, 1999, IEEE Computer Society, 0-7695-0104-4. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Jingjing Xu, Rahul Kundu, F. Joel Ferguson |
A Systematic DFT Procedure for Library Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 17th IEEE VLSI Test Symposium (VTS '99), 25-30 April 1999, San Diego, CA, USA, pp. 460-466, 1999, IEEE Computer Society, 0-7695-0146-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi |
Testing configurable LUT-based FPGA's. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 6(2), pp. 276-283, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
15 | Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik |
Efficient test-point selection for scan-based BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 6(4), pp. 667-676, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
15 | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis |
Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 13(3), pp. 315-319, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
cell fault model (CFM), fault simulation, test pattern generation, stuck-at fault model |
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