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Found 1201 publication records. Showing 1201 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks |
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.  |
IRPS  |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Govind Bajpai, Aniket Gupta, Om Prakash 0007, Girish Pahwa, Jörg Henkel, Yogesh Singh Chauhan, Hussam Amrouch |
Impact of Radiation on Negative Capacitance FinFET. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao |
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tom Bonifield, Honglin Guo, Jeff West, Hisashi Shichijo, Talha Tahir |
High Frequency TDDB of Reinforced Isolation Dielectric Systems. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva |
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Luis Soriano, Hector Valencia, Ke-Xun Sun, Ronald Nelson |
Fast Neutron Irradiation Effects on Multiple Gallium Nitride (GaN) Device Reliability in Presence of Ambient Variations. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Bernhard Ruch, Gregor Pobegen, Christian Schleich, Tibor Grasser |
Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jia Hao Lim, Nagarajan Raghavan, Jae Hyun Kwon, Tae Young Lee, Robin Chao, Nyuk Leong Chung, Kazutaka Yamane, Naganivetha Thiyagarajah, Vinayak Bharat Naik, Kin Leong Pey |
Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava |
On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Amartya Ghosh, Jifa Hao, Michael Cook 0004, Chris Kendrick, Samia A. Suliman, Gavin D. R. Hall, Tom Kopley, Osama O. Awadelkarim |
Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Andrew M. Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers |
Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jakob Michl, Alexander Grill, Dieter Claes, Gerhard Rzepa, Ben Kaczer, Dimitri Linten, Iuliana P. Radu, Tibor Grasser, Michael Waltl |
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Longda Zhou, Qingzhu Zhang, Hong Yang, Zhigang Ji, Zhaohao Zhang, Renren Xu, Huaxiang Yin, Wenwu Wang 0006 |
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Assaad El Helou, Marko J. Tadjer, Karl D. Hobart, Peter E. Raad |
Effects of Thermal Boundary Resistance on the Thermal Performance of GaN HEMT on Diamond. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Linglin Jing, Rui Gao, Zhigang Ji, Runsheng Wang |
"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Marc Bocquet, Tifenn Hirtzlin, Jacques-Olivier Klein, Etienne Nowak, Elisa Vianello, Jean-Michel Portal, Damien Querlioz |
Embracing the Unreliability of Memory Devices for Neuromorphic Computing. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava |
How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Changbeom Woo, Shinkeun Kim, Jaeyeol Park, Hyungcheol Shin, Haesoo Kim, Gil-Bok Choi, Moon-Sik Seo, Keum Hwan Noh |
Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Chang Cai, Tianqi Liu, Jie Liu 0032, Gengsheng Chen, Luchang Ding, Kai Zhao, Bingxu Ning, Mingjie Shen |
Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tian Shen, Koji Watanabe, Huimei Zhou, Michael Belyansky, Erin Stuckert, Jingyun Zhang, Andrew Greene, Veeraraghavan S. Basker, Miaomiao Wang 0006 |
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | David C. Zhou, William Li, Jingyu Shen, Leilei Chen, Thomas Zhao, Kent Lin, Martin Zhang, Larry Chen, H. C. Chiu, Jeff Zhang 0003, Roy K.-Y. Wong |
Reliability of 200mm E-mode GaN-on-Si Power HEMTs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Dmitry Goloubev, Shi-Jie Wen, Donald Allen, Ranjani Ram, Firdous Bano, Nithin Guruswamy, James Turman |
Use of Silicon-based Sensors for System Reliability Prediction. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | William A. Hubbard, Zachary Lingley, Jesse Theiss, Miles Brodie, Brendan Foran |
STEM EBIC for High-Resolution Electronic Characterization. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Evelyn Landman, Noam Brousard, Tamar Naishlos |
A novel approach to in-field, in-mission reliability monitoring based on Deep Data. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Yohei Hiura, Shinichi Miyake, Shigetaka Mori, Koichi Matsumoto, Hidetoshi Ohnuma |
Study of Lower Voltage Protection against Plasma Process Induced Damage by Quantitative Prediction Technique. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Aniket Gupta, Kai Ni 0004, Om Prakash 0007, Xiaobo Sharon Hu, Hussam Amrouch |
Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Peng Xiao, Haris Hadziosmanovic, Rong Jiang, Misagh Rostami-asrabad, Stephen Ramey, Ilan Tsamaret |
Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Nikolaos Papandreou, Haralampos Pozidis, Nikolas Ioannou, Thomas P. Parnell, Roman A. Pletka, Milos Stanisavljevic, Radu Stoica, Sasa Tomic, Patrick Breen, Gary A. Tressler, Aaron Fry, Timothy Fisher, Andrew Walls |
Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Michael Waltl |
Defect Spectroscopy in SiC Devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | E. R. Hsieh, H. W. Cheng, Z. H. Huang, C. H. Chuang, S. P. Yang, Steve S. Chung |
A Pulsed RTN Transient Measurement Technique: Demonstration on the Understanding of the Switching in Resistance Memory. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Hai Jiang 0005, Hyun-Chul Sagong, Jinju Kim, Hyewon Shim, Yoohwan Kim, Junekyun Park, Taiki Uemura, Yongsung Ji, Taeyoung Jeong, Dongkyun Kwon, Hwasung Rhee, Sangwoo Pae, Brandon Lee |
Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Mary A. Miller, Edward I. Cole, Garth M. Kraus, Perry J. Robertson |
At-Speed Defect Localization by Combining Laser Scanning Microscopy and Power Spectrum Analysis. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Susanna Yu, Tianshi Liu, Shengnan Zhu, Diang Xing, Arash Salemi, Minseok Kang, Kristen Booth, Marvin H. White, Anant K. Agarwal |
Threshold Voltage Instability of Commercial 1.2 kV SiC Power MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Monishmurali, Milova Paul, Mayank Shrivastava |
Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Anastasiia Kruv, Ben Kaczer, Alexander Grill, Mario Gonzalez, Jacopo Franco, Dimitri Linten, Wolfgang Goes, Tibor Grasser, Ingrid De Wolf |
On the impact of mechanical stress on gate oxide trapping. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor |
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Kalparupa Mukherjee, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Shuzhen You, Karen Geens, Matteo Borga, Benoit Bakeroot, Stefaan Decoutere |
Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Riad Kabouche, Kathia Harrouche, Etienne Okada, Farid Medjdoub |
Short-term reliability of high performance Q-band AlN/GaN HEMTs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tianshi Liu, Shengnan Zhu, Susanna Yu, Diang Xing, Arash Salemi, Minseok Kang, Kristen Booth, Marvin H. White, Anant K. Agarwal |
Gate Oxide Reliability Studies of Commercial 1.2 kV 4H-SiC Power MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Daniel B. Habersat, Aivars J. Lelis, Ronald Green |
Towards a Robust Approach to Threshold Voltage Characterization and High Temperature Gate Bias Qualification. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Somayyeh Rahimi, Christian Schmidt 0026, Joy Y. Liao, Howard Lee Marks, Kyung Mo Shin |
Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Chung-Shuo Lee, Pavan Kumar Vaitheeswaran, Ganesh Subbarayan, Young-Joon Park, Jayhoon Chung, Srikanth Krishnan |
Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Rahul R. Potera, Tony Witt, Yongju Zheng |
Analysis of Transient HTRB Leakage in a SiC Field Ring Termination. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Wataru Mizubayashi, Hiroshi Oka, Koichi Fukuda, Yuki Ishikawa, Kazuhiko Endo |
Analysis of charge-to-hot-carrier degradation in Ge pFinFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Alex Ayling, Shudong Huang, Elyse Rosenbaum |
Sub-nanosecond Reverse Recovery Measurement for ESD Devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Christopher H. Bennett, T. Patrick Xiao, Ryan Dellana, Ben Feinberg, Sapan Agarwal, Matthew J. Marinella, Vineet Agrawal, Venkatraman Prabhakar, Krishnaswamy Ramkumar, Long Hinh, Swatilekha Saha, Vijay Raghavan, Ramesh Chettuvetty |
Device-aware inference operations in SONOS nonvolatile memory arrays. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Chetan Prasad, Sunny Chugh, Hannes Greve, I-chen Ho, Enamul Kabir, Cheyun Lin, Mahjabin Maksud, Steven R. Novak, Benjamin Orr, Keun Woo Park, Anthony Schmitz, Zhizheng Zhang 0006, Peng Bai, Doug B. Ingerly, Emre Armagan, Hsinwei Wu, Patrick N. Stover, Lance Hibbeler, Michael O'Day, Daniel Pantuso |
Silicon Reliability Characterization of Intel's Foveros 3D Integration Technology for Logic-on-Logic Die Stacking. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Kin P. Cheung |
Anomalous accelerated negative-bias- instability (NBI) at low drain bias. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Alicja Lesniewska, Philippe J. Roussel, Davide Tierno, Victor Vega-Gonzalez, Marleen H. van der Veen, Patrick Verdonck, Nicolas Jourdan, Christopher J. Wilson, Zsolt Tökei, Kris Croes |
Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tian Shi Zhao, Chun Zhao, Ivona Z. Mitrovic, Eng Gee Lim, Li Yang, Chenghu Qiu, Ce Zhou Zhao |
Facile Route for Low-temperature Eco-friendly Solution Processed ZnSnO Thin-film Transistors. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang 0005, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida |
Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Vamsi Putcha, Erik Bury, Jacopo Franco, Amey Walke, Simeng Zhao, Uthayasankaran Peralagu, Ming Zhao, AliReza Alian, Ben Kaczer, Niamh Waldron, Dimitri Linten, Bertrand Parvais, Nadine Collaert |
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim 0005, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang 0005, Dongkyun Kwon, HwaSung Rhee, Sangwoo Pae, Brandon Lee |
Reliability on EUV Interconnect Technology for 7nm and beyond. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jian Liu 0027, Divya Acharya, Nathaniel Peachey |
Triggering Optimization on NAND ESD Clamp and Its ESD Protection IO Scheme for CMOS Designs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jose Angel Ortiz Gonzalez, Olayiwola Alatise, Phil Mawby |
Non-Intrusive Methodologies for Characterization of Bias Temperature Instability in SiC Power MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang 0005, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee |
Reliability of Industrial grade Embedded-STT-MRAM. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava |
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Madankumar Sampath, Dallas T. Morisette, James A. Cooper |
Constant-Gate-Charge Scaling for Increased Short-Circuit Withstand Time in SiC Power Devices. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Shifan Gao, Yu Cong, Zeyu Zhang, Xiang Qiu, Choonghyun Lee, Yi Zhao |
Superior Data Retention of Programmable Linear RAM (PLRAM) for Compute-in-Memory Application. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Simon Schlipf, André Clausner, Jens Paul, Simone Capecchi, Laura Wambera, Karsten Meier, Ehrenfried Zschech |
Nanoindentation to investigate IC stability using ring oscillator circuits as a CPI sensor. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Michiel Vandemaele, Kai-Hsin Chuang, Erik Bury, Stanislav Tyaginov, Guido Groeseneken, Ben Kaczer |
The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Sandeep R. Bahl, Francisco Baltazar, Yong Xie |
A Generalized Approach to Determine the Switching Lifetime of a GaN FET. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Nicolò Zagni, Alessandro Chini, Francesco Maria Puglisi, Paolo Pavan, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Giovanni Verzellesi |
Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Cheyun Lin, Uygar E. Avci, M. A. Blount, Rohit Grover, Jeffery Hicks, R. Kasim, A. Kundu, C. M. Pelto, C. Ryder, Anthony Schmitz, K. Sethi, D. Seghete, D. J. Towner, A. J. Welsh, J. Weber, C. Auth |
Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel's 10+ Process. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | John M. McGlone, Guy Brizar, Daniel Vanderstraeten, Dorai Iyer, Sallie Hose, Jeff P. Gambino |
Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Sourov Roy, Abu Hanif, Faisal Khan |
Degradation Detection of Power Switches in a Live Three Phase Inverter using SSTDR Signal Embedded PWM Sequence. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Inanc Meric, Stephen Ramey, Steven R. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks |
Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Tarek Ali, Kati Kühnel, Malte Czernohorsky, Matthias Rudolph, Björn Pätzold, Ricardo Olivo, David Lehninger, Konstantin Mertens, Franz Müller 0001, Maximilian Lederer, Raik Hoffmann, Clemens Mart, Mahsa N. Kalkani, Philipp Steinke, Thomas Kämpfe, Johannes Müller, Jan Van Houdt, Konrad Seidel, Lukas M. Eng |
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jeffrey Zhang 0008, Antai Xu, Daniel Gitlin, Desmond Yeo |
Dynamic vs Static Burn-in for 16nm Production. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Judith Berens, Magdalena Weger, Gregor Pobegen, Thomas Aichinger, Gerald Rescher, Christian Schleich, Tibor Grasser |
Similarities and Differences of BTI in SiC and Si Power MOSFETs. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava |
Threshold Voltage Shift in a-Si: H Thin film Transistors under ESD stress Conditions. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Khai Nguyen, Ernie Opiniano, Randolph Mah |
Backside Die-Edge and Underfill Fillet Cracks Induced by Additional Tensile Stress from Increasing Die-to-Package Ratio in Bare-Die FCBGA. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Ryo Akimoto, Rihito Kuroda, Akinobu Teramoto, Takezo Mawaki, Shinya Ichino, Tomoyuki Suwa, Shigetoshi Sugawa |
Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Charles Mackin, Pritish Narayanan, Stefano Ambrogio, Hsinyu Tsai, Katie Spoon, Andrea Fasoli, An Chen, Alexander M. Friz, Robert M. Shelby, Geoffrey W. Burr |
Neuromorphic Computing with Phase Change, Device Reliability, and Variability Challenges. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho |
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Mireia Bargallo González, Marcos Maestro-Izquierdo, Francesca Campabadal, Samuel Aldana, Francisco Jiménez-Molinos, Juan Bautista Roldán |
Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Nian-Jia Wang, Kuan-Yi Lee, Hsin-Yi Lin, Wei-Hao Hsiao, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, Chih-Yuan Lu |
Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Chen Wu, Adrian Vaisman Chasin, Steven Demuynck, Naoto Horiguchi, Kris Croes |
Conduction and Breakdown Mechanisms in Low-k Spacer and Nitride Spacer Dielectric Stacks in Middle of Line Interconnects. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Rohit Grover, Tony Acosta, C. AnDyke, Emre Armagan, C. Auth, Sunny Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C.-Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, Pinakpani Nayak, A. Neale, D. Nminibapiel, Benjamin Orr, James Palmer, C. M. Pelto, S. S. Poon, I. Post, Tanmoy Pramanik, Anisur Rahman, Stephen Ramey, N. Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh |
A Reliability Overview of Intel's 10+ Logic Technology. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang 0005, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida |
Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Rodolfo A. Rodriguez-Davila, Richard A. Chapman, Massimo Catalano, Manuel Quevedo-Lopez, Chadwin D. Young |
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Jing-Chyi Liao, Paul Ko, M. H. Hsieh, Zheng Zeng |
Self-healing LDMOSFET for high-voltage application on high-k/metal gate CMOS process. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
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| 1 | Yi Ram Kim, Allison T. Osmanson, Hossein Madanipour, Choong-Un Kim, Patrick F. Thompson, Qiao Chen |
Effects of UBM Thickness and Current Flow Configuration on Electromigration Failure Mechanisms in Solder Interconnects. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Venkata Chaitanya Krishna Chekuri, Arvind Singh, Nael Mizanur Rahman, Edward Lee, Saibal Mukhopadhyay |
Aging Challenges in On-chip Voltage Regulator Design. |
IRPS |
2020 |
DBLP DOI BibTeX RDF |
|
| 1 | Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes |
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Miaomiao Wang 0006, Jingyun Zhang, Huimei Zhou, Richard G. Southwick, Robin Hsin Kuo Chao, Xin Miao, Veeraraghavan S. Basker, Tenko Yamashita, Dechao Guo, Gauri Karve, Huiming Bu, James H. Stathis |
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Kevin Matocha, In-Hwan Ji, Xuning Zhang, Sauvik Chowdhury |
SiC Power MOSFETs: Designing for Reliability in Wide-Bandgap Semiconductors. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Norman Chang, Wentze Chuang, Ganesh Kumar Tsavatanalli, Joao Geada, Hao Zhuang, Sankar Ramachandran, Rahul Rajan, Ying-Shiun Li, Yaowei Jia, Mathew Kaipanatu, Suresh Kumar Mantena, Ming-Chih Shih, Anita Yang, Jyh-Shing Roger Jang |
Applying Machine Learning to Design for Reliability Coverage. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Nikolaos Papandreou, Haralampos Pozidis, Thomas P. Parnell, Nikolas Ioannou, Roman A. Pletka, Sasa Tomic, Patrick Breen, Gary A. Tressler, Aaron Fry, Timothy Fisher |
Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Barry J. O'Sullivan, Romain Ritzenthaler, Gerhard Rzepa, Z. Wu, E. Dentoni Litta, O. Richard, T. Conard, V. Machkaoutsan, Pierre Fazan, C. Kim, Jacopo Franco, Ben Kaczer, Tibor Grasser, Alessio Spessot, Dimitri Linten, N. Horiguchi |
Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | J. M. Passage, Nabihah Azhari, J. R. Lloyd |
Stress Migration Followed by Electromigration Reliability Testing. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Khai Nguyen, Geoff Liang |
Modelling Degradation of Matched-Circuits in Operational Conditions: Active and Stand-by Modes. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Nando Kaminski, Sarah Rugen, Felix Hoffmann |
Gaining Confidence - A Review of Silicon Carbide's Reliability Status. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Diang Xing, Tianshi Liu, Susanna Yu, Minseok Kang, Arash Salemi, Marvin H. White, Anant K. Agarwal |
Design Strategies for Rugged SiC Power Devices. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Hai Jiang 0005, Hyun-Chul Sagong, Jinju Kim, Junekyun Park, Sangchul Shin, Sangwoo Pae |
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | A. K. M. Mahfuzul Islam, Ryota Shimizu, Hidetoshi Onodera |
Analysis of Random Telegraph Noise (RTN) at Near-Threshold Operation by Measuring 154k Ring Oscillators. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jian-Hsing Lee, Natarajan Mahadeva Iyer |
Tunable Holding-Voltage High Voltage ESD Devices. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Louise De Conti, Sorin Cristoloveanu, Maud Vinet, Philippe Galy |
Thin-Film FD-SOI BIMOS Topologies for ESD Protection. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Alaleh Tajalli, Eleonora Canato, Arianna Nardo, Matteo Meneghini, Arno Stockman, Peter Moens, Enrico Zanoni, Gaudenzio Meneghesso |
Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-Mode Transistors. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jia Hao Lim, Nagarajan Raghavan, Vinayak Bharat Naik, Jae Hyun Kwon, Kazutaka Yamane, H. Yang, K. H. Lee, Kin Leong Pey |
Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
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