Search results for "Defect"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
121	Qinbao Song, Martin J. Shepperd, Michelle Cartwright, Carolyn Mair	Software Defect Association Mining and Defect Correction Effort Prediction.	IEEE Trans. Software Eng.	2006	DBLP DOI BibTeX RDF	defect association, defect isolation effort, defect correction effort, Software defect prediction
89	Ytzhak H. Levendel	Reliability Analysis of Large Software Systems: Defect Data Modeling.	IEEE Trans. Software Eng.	1990	DBLP DOI BibTeX RDF	defect data modeling, large distributed systems, defect removal, birth-death mathematical model, field failure report data, software development, distributed processing, software reliability, quality, program testing, large-scale systems, reliability analysis, bottleneck
88	Jef Jacobs, J. H. van Moll, Paul J. Krause, Rob J. Kusters, Jos J. M. Trienekens	Effects of Virtual Development on Product Quality: Exploring Defect Causes.	STEP	2003	DBLP DOI BibTeX RDF	Virtual development, Defect injection, Defect Causal Analysis, Defect detection, Product Quality
78	Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier	Influence of Resistive Bridging Fault on Crosstalk Coupling Effects in On-Chip Aggressor-Victim Interconnects.	DFT	2006	DBLP DOI BibTeX RDF	defective interconnects, defect’s severity, fault model, crosstalk, bridging fault
75	Claude Thibeault, Yvon Savaria, Jean-Louis Houle	Test quality of hierarchical defect-tolerant integrated circuits.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	defect level, fault coverage, defect tolerance, defect modeling, Combinatorial analysis
75	Ajit Ashok Shenvi	Defect prevention with orthogonal defect classification.	ISEC	2009	DBLP DOI BibTeX RDF	odc, algorithm, interface, timing, documentation, function, assignment, car, checking
75	Zachary D. Patitz, Nohpill Park	Modeling and Evaluation of Threshold Defect Tolerance.	DFT	2008	DBLP DOI BibTeX RDF
74	Kang Yi, Shih-Yang Cheng, Young-Hwan Park, Fadi J. Kurdahi, Ahmed M. Eltawil	An Alternative Organization of Defect Map for Defect-Resilient Embedded On-Chip Memories.	Asia-Pacific Computer Systems Architecture Conference	2007	DBLP DOI BibTeX RDF	Embedded memory Yield, Defect Map, Memory Error Resilient Design, Video error concealment
72	Anita Gupta, Jingyue Li, Reidar Conradi, Harald Rønneberg, Einar Landre	A case study comparing defect profiles of a reused framework and of applications reusing it.	Empir. Softw. Eng.	2009	DBLP DOI BibTeX RDF	Empirical study, Software reuse, Software defect
72	Hareton K. N. Leung	Improving Defect Removal Effectiveness for Software Development.	CSMR	1998	DBLP DOI BibTeX RDF	defect removal, testing, process improvement, inspection, test process
70	Stuart L. Riley	Limitations to Estimating Yield Based on In-Line Defect Measurements.	DFT	1999	DBLP DOI BibTeX RDF	Defect-limited yield, Yield estimation, In-line defect measurements, Kill ratio estimation, Defect review sampling, Defect classification, Yield prediction
70	Suchendra M. Bhandarkar, Timothy D. Faust, Mengjin Tang	CATALOG: a system for detection and rendering of internal log defects using computer tomography.	Mach. Vis. Appl.	1999	DBLP DOI BibTeX RDF	Automated log inspection, Automated lumber grading, Non-destructive evaluation, Non-destructive quality assessment, Computer tomography
69	Dhamin Al-Khalili, Saman Adham, Côme Rozon, Moazzem Hossain, Douglas Racz	Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits.	DFT	1998	DBLP DOI BibTeX RDF	CMOS Defect Modeling, Defect Analysis
69	Jing Huang 0001, Mehdi Baradaran Tahoori, Fabrizio Lombardi	On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars.	DFT	2004	DBLP DOI BibTeX RDF
66	Marko Jäntti, Tanja Toroi, Anne Eerola	Difficulties in Establishing a Defect Management Process: A Case Study.	PROFES	2006	DBLP DOI BibTeX RDF
65	Stefan Wagner 0001	Defect classification and defect types revisited.	DEFECTS	2008	DBLP DOI BibTeX RDF	defect taxonomy, defect types, faults, defects, bugs, defect classification
65	Mehdi Baradaran Tahoori	Application-independent defect tolerance of reconfigurable nanoarchitectures.	ACM J. Emerg. Technol. Comput. Syst.	2006	DBLP DOI BibTeX RDF	reconfigurable architectures, nanotechnology, Defect tolerance
65	David Russell 0002, Nilesh Patel	Increasing Software Engineering Efficiency Through Defect Tracking Integration.	ICSEA	2006	DBLP DOI BibTeX RDF	testing, quality assurance, integrated development environment (IDE), Defect tracking
65	Nachiappan Nagappan, Thomas Ball	Static analysis tools as early indicators of pre-release defect density.	ICSE	2005	DBLP DOI BibTeX RDF	statistical methods, fault-proneness, defect density, static analysis tools
64	Abhishek Singh 0001, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel	Defect Simulation Methodology for iDDT Testing.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	iDDT, transient current testing, device testing, ATPG, fault simulation, IDDQ, defect simulation, defect-based test
64	Marek Leszak	Software Defect Analysis of a Multi-release Telecommunications System.	PROFES	2005	DBLP DOI BibTeX RDF	software process metrics, errorproneness, Case study, defect prediction, defect density
64	R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah	Analyzing the Effectiveness of Multiple-Detect Test Sets.	ITC	2003	DBLP DOI BibTeX RDF
63	Reza M. Rad, Mohammad Tehranipoor	A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices.	DFT	2006	DBLP DOI BibTeX RDF	Nanoscale Devices, Fault Tolerance, Test, Reconfiguration, Redundancy, Crossbar
61	Vijay K. Jain, Glenn H. Chapman	Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC.	DFT	2006	DBLP DOI BibTeX RDF	3D Heterogeneous sensor, redundancy and reconfiguration, energy economization, heterogeneous SOC, J-platform, defect tolerance
60	Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal	Segment delay faults: a new fault model.	VTS	1996	DBLP DOI BibTeX RDF	segment delay faults, delay defect, distributed defect, rising transitions, falling transitions, transition tests, nonrobust tests, VLSI, fault diagnosis, logic testing, delays, integrated circuit testing, fault model, automatic testing, circuit analysis computing, robust tests, integrated circuit modelling, production testing, spot defect, manufacturing defects
60	Michele Favalli	Delay Fault Detection Problems in Circuits Featuring a Low Combinational Depth.	DFT	2007	DBLP DOI BibTeX RDF
60	Dhruva Acharyya, Jim Plusquellic	Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements.	VTS	2005	DBLP DOI BibTeX RDF
60	Shyue-Kung Lu, Tsung-Ying Lee, Cheng-Wen Wu	Defect Level Prediction Using Multi-Model Fault Coverage.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF
59	Mehdi Baradaran Tahoori	Low-overhead defect tolerance in crossbar nanoarchitectures.	ACM J. Emerg. Technol. Comput. Syst.	2009	DBLP DOI BibTeX RDF	reconfigurable architectures, nanotechnology, Defect tolerance
59	Rudolf Ramler, Klaus Wolfmaier, Erwin Stauder, Felix Kossak, Thomas Natschläger	Key Questions in Building Defect Prediction Models in Practice.	PROFES	2009	DBLP DOI BibTeX RDF	software test management, machine learning, defect prediction
59	Yomi Kastro, Ayse Basar Bener	A defect prediction method for software versioning.	Softw. Qual. J.	2008	DBLP DOI BibTeX RDF	Neural networks, Defect prediction, Software defects
59	Zhanglei Wang, Krishnendu Chakrabarty	Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	nanofabric, CAEN, chemically assembled, reconfiguration, BIST, nanotechnology, defect tolerance, molecular electronics
59	Michael Nicolaidis, Lorena Anghel, Nadir Achouri	Memory Defect Tolerance Architectures for Nanotechnologies.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	word repair, nanotechnologies, BISR, memory repair, high defect densities
59	Yashwant K. Malaiya, Jason Denton	Module Size Distribution and Defect Density.	ISSRE	2000	DBLP DOI BibTeX RDF	Module size, module size Distribution, reliability, defect density
58	Masaru Fukushi, Susumu Horiguchi, Luke Demoracski, Fabrizio Lombardi	An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly.	J. Electron. Test.	2009	DBLP DOI BibTeX RDF	DNA self-assembled networks, Defect isolation, 1-hop wave expansion, Unsafe node detection, Gross defect model, Broadcast
58	Gang Wang 0015, Wenrui Gong, Ryan Kastner	On the use of Bloom filters for defect maps in nanocomputing.	ICCAD	2006	DBLP DOI BibTeX RDF	defect map, nanotechnology, Bloom filter, defect tolerant
56	Michel Renovell, Florence Azaïs, Yves Bertrand	Detection of Defects Using Fault Model Oriented Test Sequences.	J. Electron. Test.	1999	DBLP DOI BibTeX RDF	fault modeling, defect
55	Mangala Gowri Nanda, Monika Gupta 0002, Saurabh Sinha, Satish Chandra 0001, David Schmidt, Pradeep Balachandran	Making defect-finding tools work for you.	ICSE (2)	2010	DBLP DOI BibTeX RDF	defect differencing, defect merging, defect prioritization, defect views, static analysis portal
55	Nobuhiro Tomabechi	Multi-Dimensional Subsystem-Dividing for Yield Enhancement in Defect-Tolerant WSI Systems.	DFT	1999	DBLP DOI BibTeX RDF	subsystem-dividing, yield, defect-tolerant, WSI, multi-dimensional
55	Raymond J. Madachy, Barry W. Boehm	Assessing Quality Processes with ODC COQUALMO.	ICSP	2008	DBLP DOI BibTeX RDF	quality processes, system dynamics, COCOMO, value-based software engineering, defect modeling, orthogonal defect classification, COQUALMO
54	Eun-Ser Lee, Sang Ho Lee 0004	Design Opportunity Tree for Schedule Management and Evaluation by COQUALMO.	ICCSA (4)	2006	DBLP DOI BibTeX RDF	Defect cause prioritization, Defect reduction, Project Schedule Management, Opportunity Tree, Quality, Software Process Improvement, COQUALMO, Defect Management
54	Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee	Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS.	VLSI Design	2008	DBLP DOI BibTeX RDF
54	Toshiyuki Amano	Correlation Based Image Defect Detection.	ICPR (1)	2006	DBLP DOI BibTeX RDF
54	Xiaoliang Bai, Sujit Dey	High-level crosstalk defect Simulation methodology for system-on-chip interconnects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
54	Bernd G. Freimut, Oliver Laitenberger, Stefan Biffl	Investigating The Impact Of Reading Techniques On The Accuracy Of Different Defect Content Estimation Techniques.	IEEE METRICS	2001	DBLP DOI BibTeX RDF
54	Wen-Ben Jone	Defect level estimation of circuit testing using sequential statistical analysis.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
52	Muzaffer O. Simsir, Srihari Cadambi, Franjo Ivancic, Martin Rötteler, Niraj K. Jha	A hybrid nano-CMOS architecture for defect and fault tolerance.	ACM J. Emerg. Technol. Comput. Syst.	2009	DBLP DOI BibTeX RDF	nanotechnology, Defect tolerance, nanowires
52	G. S. Mahalakshmi 0001, T. V. Geetha	Formal Definitions of Reason Fallacies to Aid Defect Exploration in Argument Gaming.	ICLA	2009	DBLP DOI BibTeX RDF	Indian logic, Nyaya Sastra, Reason fallacies, Argumentation, Defect
52	Akif Günes Koru, Khaled El Emam, Dongsong Zhang, Hongfang Liu, Divya Mathew	Theory of relative defect proneness.	Empir. Softw. Eng.	2008	DBLP DOI BibTeX RDF	Size-defect relationship, Planning for software quality assurance, Software testing, Software metrics, Open-source software, Software inspections, Software reviews, Software science
52	Jaidev P. Patwardhan, Vijeta Johri, Chris Dwyer, Alvin R. Lebeck	A defect tolerant self-organizing nanoscale SIMD architecture.	ASPLOS	2006	DBLP DOI BibTeX RDF	self-organizing, SIMD, data parallel, DNA, defect tolerance, nanocomputing, bit-serial
52	Paul Luo Li, Mary Shaw, James D. Herbsleb, Bonnie K. Ray, Peter Santhanam	Empirical evaluation of defect projection models for widely-deployed production software systems.	SIGSOFT FSE	2004	DBLP DOI BibTeX RDF	maintenance resource planning, software insurance, open source software, COTS, empirical research, defect modeling
52	Xiaoliang Bai, Sujit Dey	High-level Crosstalk Defect Simulation for System-on-Chip Interconnects.	VTS	2001	DBLP DOI BibTeX RDF	System-on-Chip, Crosstalk, Interconnect test, Defect simulation, High level
52	S. K. Tewksbury	Challenges Facing Practical DFT for MEMS.	DFT	2001	DBLP DOI BibTeX RDF	Microelectromechanical systems, microsystems technologies, fault tolerance, defect tolerance
52	Marek Leszak, Dewayne E. Perry, Dieter Stoll	A case study in root cause defect analysis.	ICSE	2000	DBLP DOI BibTeX RDF	defect prevention, modification management, root cause analyis, process improvement, quality assurance
51	Youngki Hong, Jongmoon Baik, In-Young Ko, Ho-Jin Choi	A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics.	ACIS-ICIS	2008	DBLP DOI BibTeX RDF	In-process Defect Prediction, Defect Type Distribution, Weibull Function, Software Reliability, Maximum Likelihood Estimation
51	Leendert M. Huisman	Yield fluctuations and defect models.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	chip testing, defect distribution, field failures, clustering, yield, defect coverage
51	Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong	Orthogonal Defect Classification - A Concept for In-Process Measurements.	IEEE Trans. Software Eng.	1992	DBLP DOI BibTeX RDF	in-process measurements, cause-effect relationships, measurement and analysis methods, defect trigger distribution, testing, software development, software quality, software reliability, feedback, completeness, inspection, semantic information, necessary and sufficient conditions, verification processes, orthogonal defect classification
51	Dietmar Winkler 0001, Bernhard Riedl, Stefan Biffl	Improvement of Design Specifications with Inspection and Testing.	EUROMICRO-SEAA	2005	DBLP DOI BibTeX RDF	Usage-Based Testing, Software Product Improvement, Software Inspection, Verification and Validation
50	Tiejun Pan, Leina Zheng, Chengbin Fang	Defect Tracing System Based on Orthogonal Defect Classification.	CSSE (2)	2008	DBLP DOI BibTeX RDF
50	Xiaohong Jiang 0001, Susumu Horiguchi, Yue Hao	Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core.	DFT	2000	DBLP DOI BibTeX RDF
50	Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier	Modeling of Crosstalk Fault in Defective Interconnects.	PATMOS	2006	DBLP DOI BibTeX RDF	defect-based-crosstalk fault model, signal integrity losses, aggres-sor-victim, ABCD-model, crosstalk-hazards
50	Michael Nicolaidis, Nadir Achouri, Lorena Anghel	A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies.	VTS	2004	DBLP DOI BibTeX RDF	ECC codes, word repair, nanotechnologies, memory repair, high defect densities
49	Yuri Chernak	A Statistical Approach to the Inspection Checklist Formal Synthesis and Improvement.	IEEE Trans. Software Eng.	1996	DBLP DOI BibTeX RDF	Defect causal analysis, inspection checklist, software testing, software inspection, defect modeling
47	Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar	Defect Analysis and Defect Tolerant Design of Multi-port SRAMs.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Multi-port SRAMs, Defect/fault tolerant design, Defect analysis
47	Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki	Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns.	ICCV	1995	DBLP DOI BibTeX RDF	printed circuit layout, X-ray applications, real time X-ray inspection, real-time X-ray inspection, 3D defect, 3-D defects, circuit board patterns, three dimensional defects, fine PCB patterns, sphere surface, X-ray detector, defect detection algorithm, heavy shading, real-time systems, feature extraction, feature extraction, signal processing, inspection, circuit analysis computing, X-ray images, printed circuit board, printed circuit testing, perspective transform, intensity variation, defect detection techniques
47	Aleksandar Dogandzic, Benhong Zhang	Bayesian NDE Defect Signal Analysis.	IEEE Trans. Signal Process.	2007	DBLP DOI BibTeX RDF
47	Anu Gupta, Ravinder Kumar Singla	An Empirical Investigation of Defect Management in Free/Open Source Software Projects.	SCSS (1)	2007	DBLP DOI BibTeX RDF
47	Stelios Neophytou, Maria K. Michael	Hierarchical Fault Compatibility Identification for Test Generation with a Small Number of Specified Bits.	DFT	2007	DBLP DOI BibTeX RDF
47	Rahul Jain 0004, Anindita Mukherjee, Kolin Paul	Defect-Aware Design Paradigm for Reconfigurable Architectures.	ISVLSI	2006	DBLP DOI BibTeX RDF
47	Mehdi Baradaran Tahoori	Application-independent defect-tolerant crossbar nano-architectures.	ICCAD	2006	DBLP DOI BibTeX RDF
47	Li Meng, Xiaoyuan He, Sontakke Ashok	Defect Prevention: A General Framework and Its Application.	QSIC	2006	DBLP DOI BibTeX RDF
47	Shi-Yu Huang	On Improving the Accuracy Of Multiple Defect Diagnosis.	VTS	2001	DBLP DOI BibTeX RDF
47	Nohpill Park, Fred J. Meyer, Fabrizio Lombardi	Quality-Effective Repair of Multichip Module Systems.	DFT	2000	DBLP DOI BibTeX RDF
46	Rattikorn Hewett, Phongphun Kijsanayothin	On modeling software defect repair time.	Empir. Softw. Eng.	2009	DBLP DOI BibTeX RDF	Defect report analysis, Data mining, Software testing, Quality assurance, Testing management
46	Chung-Ho Noh, Seok-Lyong Lee, Deok-Hwan Kim, Chin-Wan Chung	Effective defect classification for flat display panel film images.	ICHIT	2009	DBLP DOI BibTeX RDF	flat display panel, image analysis, shape descriptor, defect classification
46	V. Suma 0001, T. R. Gopalakrishnan Nair	Enhanced Approaches in Defect Detection and Prevention Strategies in Small and Medium Scale Industries.	ICSEA	2008	DBLP DOI BibTeX RDF	Defect detection and Prevention, Software Engineering, Testing, Software Quality, Software Process, Inspections
46	Artem Marchenko, Pekka Abrahamsson	Predicting Software Defect Density: A Case Study on Automated Static Code Analysis.	XP	2007	DBLP DOI BibTeX RDF	defect estimation, case study, quality, automation, embedded software, agile software development, static code analysis
46	Per Runeson, Carina Andersson, Thomas Thelin, Anneliese Amschler Andrews, Tomas Berling	What do we know about defect detection methods? [software testing].	IEEE Softw.	2006	DBLP DOI BibTeX RDF	testing, empirical studies, inspection, defect detection, evidence-based software engineering
46	Patrick Knab, Martin Pinzger 0001, Abraham Bernstein	Predicting defect densities in source code files with decision tree learners.	MSR	2006	DBLP DOI BibTeX RDF	decision tree learner, data mining, defect prediction
46	Chintan Patel, Abhishek Singh 0001, Jim Plusquellic	Defect Detection Using Quiescent Signal Analysis.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing
46	Suresh Yadla, Jane Huffman Hayes, Alex Dekhtyar	Tracing requirements to defect reports: an application of information retrieval techniques.	Innov. Syst. Softw. Eng.	2005	DBLP DOI BibTeX RDF	Defect reports, Requirements traceability matrix (RTM), Information retrieval, Requirements, Tracing, Requirements tracing
46	Nachiappan Nagappan, Thomas Ball	Use of relative code churn measures to predict system defect density.	ICSE	2005	DBLP DOI BibTeX RDF	relative code churn, principal component analysis, multiple regression, fault-proneness, defect density
46	Prasanna Sundararajan, Steve Guccione	Run-Time defect tolerance using JBits.	FPGA	2001	DBLP DOI BibTeX RDF	Java, FPGA, cores, defect tolerance, run-time reconfiguration
46	Wen-Ben Jone, K. S. Tsai	Confidence analysis for defect-level estimation of VLSI random testing.	ACM Trans. Design Autom. Electr. Syst.	1998	DBLP DOI BibTeX RDF	defect level analysis, test confidence analysis, random testing, VLSI testing, test quality
46	Wen-Ben Jone, Sunil R. Das	A Stochastic Method for Defect Level Analysis of Pseudorandom Testing.	VLSI Design	1998	DBLP DOI BibTeX RDF	defect level analysis, differential equation, VLSI testing, pseudorandom testing
45	Dan X. Houston, Douglas Buettner, Myron Hecht	Dynamic COQUALMO: Defect Profiling over Development Cycles.	ICSP	2009	DBLP DOI BibTeX RDF	Defect profile, defect introduction and removal, COQUALMO
45	Craig Henderson	Managing software defects: defect analysis and traceability.	ACM SIGSOFT Softw. Eng. Notes	2008	DBLP DOI BibTeX RDF	radial charts, software builds, metrics, software quality, bugs, defect analysis, defect management
45	José T. de Sousa, Vishwani D. Agrawal	Reducing the Complexity of Defect Level Modeling Using the Clustering Effect.	DATE	2000	DBLP DOI BibTeX RDF	defect clustering, defect level, fault clustering, reject ratio, fault coverage
45	Georg Lambert, Franziska Bock	Wavelet methods for texture defect detection.	ICIP (3)	1997	DBLP DOI BibTeX RDF	multiscale wavelet methods, texture defect detection, wavelet bases, texture defects localisation, multiscale wavelet representations, fast dyadic wavelet transform, translation invariant a trous algorithm, feature extraction, image texture, computational costs, defect classification, decomposition algorithms, image texture analysis
45	Anil Gandhi, Stacy Hall, Ron Harris	An examination of empirically derived within-die local probabilities of failure.	DFT	1997	DBLP DOI BibTeX RDF	empirically derived within-die local probabilities, circuit densities, yield sensitivity, in-line defect inspection equipment, back-end sort data, model free approach, defect review sampling, failure, failure analysis
45	Yanhong Li, Daniel P. Lopresti, George Nagy, Andrew Tomkins	Validation of Image Defect Models for Optical Character Recognition.	IEEE Trans. Pattern Anal. Mach. Intell.	1996	DBLP DOI BibTeX RDF	document image defect models, OCR error classification, defect model validation, Optical character recognition
45	Reza M. Rad, Mohammad Tehranipoor	SCT: A novel approach for testing and configuring nanoscale devices.	ACM J. Emerg. Technol. Comput. Syst.	2008	DBLP DOI BibTeX RDF	Configuration and testing, reconfigurable nanoscale devices, fault tolerance, crossbar, nanowire
45	Michel Renovell	Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects.	ISQED	2001	DBLP DOI BibTeX RDF
43	Hongbin Sun 0001, Nanning Zheng 0001, Tong Zhang 0002	Realization of L2 Cache Defect Tolerance Using Multi-bit ECC.	DFT	2008	DBLP DOI BibTeX RDF
43	Konstantin Likharev	Defect-Tolerant Hybrid CMOS/Nanoelectronic Circuits.	DFT	2008	DBLP DOI BibTeX RDF
43	Arvind Kumar, Sandip Tiwari	Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics.	DFT	2004	DBLP DOI BibTeX RDF
43	Chenggang Bai, Kai-Yuan Cai, T. Y. Chen	An Efficient Defect Estimation Method for Software Defect Curves.	COMPSAC	2003	DBLP DOI BibTeX RDF
43	Zhan Chen, Israel Koren	Techniques for Yield Enhancement of VLSI Adders.	ASAP	1995	DBLP DOI BibTeX RDF	VLSI yield, VLSI adder, defect tolerance, VLSI layout
42	Marco Broglia, Giacomo Buonanno, Mariagiovanna Sami, M. Selvini	Designing for Yield: A Defect-Tolerant Approach to High-Level Synthesis.	DFT	1998	DBLP DOI BibTeX RDF	Slice, Defect Tolerance, Data-Path
42	Gerard A. Allan, Anthony J. Walton	Efficient critical area estimation for arbitrary defect shapes.	DFT	1997	DBLP DOI BibTeX RDF	critical area estimation, arbitrary defect shapes, circular defects, elliptical defects, rod shaped defects, arbitrary shaped defects, Edinburgh Yield Estimator, Cadence layout editor, EYE-sampling tool, EYE, EYES, integrated circuit yield, IC layout