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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
23 | Konstantinos Sagonas |
Detecting defects in Erlang programs using static analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PPDP ![In: Proceedings of the 9th International ACM SIGPLAN Conference on Principles and Practice of Declarative Programming, July 14-16, 2007, Wroclaw, Poland, pp. 37, 2007, ACM, 978-1-59593-769-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Bekir Dizdaroglu, Ali Gangal |
A Spatiotemporal Algorithm for Detection and Restoration of Defects in Old Color Films. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACIVS ![In: Advanced Concepts for Intelligent Vision Systems, 9th International Conference, ACIVS 2007, Delft, The Netherlands, August 28-31, 2007, Proceedings, pp. 509-520, 2007, Springer, 978-3-540-74606-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee |
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(4-6), pp. 471-482, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
IC reliability, reliability simulation, design for reliability, interconnect, electromigration, defect modeling |
23 | N. G. Shankar, Z. W. Zhong |
Improved segmentation of semiconductor defects using area sieves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 17(1), pp. 1-7, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Area sieve, Discrete wavelet transform, Machine vision, Inspection, Semiconductor |
23 | Yu Huang 0005, Keith Gallie |
Diagnosis of defects on scan enable and clock trees. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 436-437, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Fredrik Törner, Martin Ivarsson, Fredrik Pettersson, Peter Öhman |
Defects in automotive use cases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2006 International Symposium on Empirical Software Engineering (ISESE 2006), September 21-22, 2006, Rio de Janeiro, Brazil, pp. 115-123, 2006, ACM, 1-59593-218-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
use case, automotive, empirical |
23 | Charles C. Chiang, Jamil Kawa |
Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS ![In: IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006, pp. 1099-1102, 2006, IEEE, 1-4244-0387-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita |
Fault Diagnosis of Physical Defects Using Unknown Behavior Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Sci. Technol. ![In: J. Comput. Sci. Technol. 20(2), pp. 187-194, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Chien-Mo James Li, Edward J. McCluskey |
Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(11), pp. 1748-1759, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Nicola Campregher, Peter Y. K. Cheung, George A. Constantinides, Milan Vasilko |
Analysis of yield loss due to random photolithographic defects in the interconnect structure of FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPGA ![In: Proceedings of the ACM/SIGDA 13th International Symposium on Field Programmable Gate Arrays, FPGA 2005, Monterey, California, USA, February 20-22, 2005, pp. 138-148, 2005, ACM, 1-59593-029-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
FPGA redundancy, interconnect faults, fault tolerance, yield enhancement, interconnect model, yield prediction, catastrophic faults, FPGA interconnect |
23 | Sungshin Kim, Hyeon Bae, Seong-Pyo Cheon, Kwang-Baek Kim |
On-line Fabric-Defects Detection Based on Wavelet Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (4) ![In: Computational Science and Its Applications - ICCSA 2005, International Conference, Singapore, May 9-12, 2005, Proceedings, Part IV, pp. 1075-1084, 2005, Springer, 3-540-25863-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng |
Pattern Selection for Testing of Deep Sub-Micron Timing Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France, pp. 160, 2004, IEEE Computer Society, 0-7695-2085-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Tobias Lindahl, Konstantinos Sagonas |
Detecting Software Defects in Telecom Applications Through Lightweight Static Analysis: A War Story. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APLAS ![In: Programming Languages and Systems: Second Asian Symposium, APLAS 2004, Taipei, Taiwan, November 4-6, 2004. Proceedings, pp. 91-106, 2004, Springer, 3-540-23724-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Compile-time program checking, software development, software tools, defect detection, software quality assurance |
23 | Vadim A. Slavin, David H. Laidlaw, Robert Pelcovits, Song Zhang 0004, George Loriot, Andrew Callan-Jones |
Visualization of Topological Defects in Nematic Liquid Crystals Using Streamtubes, Streamsurfaces and Ellipsoids. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Visualization ![In: 15th IEEE Visualization Conference, IEEE Vis 2004, Austin, TX, USA, October 10-15, 2004, Proceedings, pp. 21, 2004, IEEE Computer Society, 0-7803-8788-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Chris Schuermyer, Jens Ruffler, W. Robert Daasch |
Minimum Testing Requirements to Screen Temperature Dependent Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 300-308, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Marek Z. Reformat |
A Fuzzy-Based Meta-model for Reasoning about Number of Software Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IFSA ![In: Fuzzy Sets and Systems - IFSA 2003, 10th International Fuzzy Systems Association World Congress, Istanbul, Turkey, June 30 - July 2, 2003, Proceedings, pp. 644-651, 2003, Springer, 3-540-40383-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita |
Fault Diagnosis for Physical Defects of Unknown Behaviors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, pp. 236-241, 2003, IEEE Computer Society, 0-7695-1951-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Domingo Mery |
Crossing Line Profile: A New Approach to Detecting Defects in Aluminium Die Castings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCIA ![In: Image Analysis, 13th Scandinavian Conference, SCIA 2003, Halmstad, Sweden, June 29 - July 2, 2003, Proceedings, pp. 725-732, 2003, Springer, 3-540-40601-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
X-ray testing, automated visual inspection, Flaw detection |
23 | William M. Evanco, June M. Verner |
Some Architectural Features of Ada Systems Affecting Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Ada-Europe ![In: Reliable Software Technologies - Ada-Europe 2003, 8th Ada-Europe International Conference on Reliable Software Technologies, Toulouse, France, June 16-20, 2003, Proceedings, pp. 232-245, 2003, Springer, 3-540-40376-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez |
Resistance Characterization for Weak Open Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 19(5), pp. 18-26, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
23 | Zaid Al-Ars, Ad J. van de Goor |
DRAM Specific Approximation of the Faulty Behavior of Cell Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, pp. 98-103, 2002, IEEE Computer Society, 0-7695-1825-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
memory specific fault analysis, approximating dynamic behavior, memory testing, DRAM |
23 | Zaid Al-Ars, Ad J. van de Goor |
Approximating Infinite Dynamic Behavior for DRAM Cell Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 401-406, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
infinite dynamic faults, memory testing, DRAMs, functional fault models, defect simulation |
23 | Søren Lauesen, Otto Vinter |
Preventing Requirement Defects: An Experiment in Process Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Requir. Eng. ![In: Requir. Eng. 6(1), pp. 37-50, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Cost/benefit, Usability, Requirements engineering, Scenarios, Process improvement, Market value |
23 | Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson 0001 |
An Evaluation of Pseudo Random Testing for Detecting Real Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 404-410, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Sungju Park, Taehyung Kim |
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France, pp. 458-462, 2000, IEEE Computer Society / ACM, 0-7695-0537-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
23 | P. Caleb, Michal Steuer |
Classification of surface defects on hot rolled steel using adaptive learning methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES ![In: Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems & Allied Technologies, KES 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes, pp. 103-108, 2000, IEEE, 0-7803-6400-7. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
23 | Amir Attarha, Mehrdad Nourani, Caro Lucas |
Modeling and simulation of real defects using fuzzy logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 37th Conference on Design Automation, Los Angeles, CA, USA, June 5-9, 2000., pp. 631-636, 2000, ACM. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
SPICE |
23 | Gwan-Hyung Kim, Sung-In Kang, Sang-Bae Lee |
A study on the estimate of weld bead shape and the compensation of welding parameters by considering weld defects in horizontal fillet welding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES ![In: Third International Conference on Knowledge-Based Intelligent Information Engineering Systems, KES 1999, Adelaide, South Australia, 31 August - 1 September 1999, Proceedings, pp. 212-216, 1999, IEEE, 0-7803-5578-4. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
23 | James F. Plusquellic, Amy Germida, Zheng Yan |
8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings, pp. 68-76, 1999, IEEE Computer Society, 0-7695-0325-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
23 | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
Characterization of CMOS Defects using Transient Signal Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings, pp. 93-101, 1998, IEEE Computer Society, 0-8186-8832-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
transient signal analysis, CMOS defect characterization, defect diagnosis, failure analysis |
23 | Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong |
High volume microprocessor test escapes, an analysis of defects our tests are missing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 25-34, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
23 | Manoj Sachdev |
Open Defects in CMOS RAM Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 14(2), pp. 26-33, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
22 | Jimmy-Xuan Shen, Joel Varley |
pymatgen-analysis-defects: A Python package for analyzing point defects in crystalline materials. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Open Source Softw. ![In: J. Open Source Softw. 9(94), pp. 5941, February 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
22 | Akond Rahman, Dibyendu Brinto Bose, Raunak Shakya, Rahul Pandita |
Come for syntax, stay for speed, understand defects: an empirical study of defects in Julia programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 28(4), pp. 93, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
22 | Yaxi Chen, Ruimin Hu, Zheng Wang 0007, Yuke Li |
How to Face Unseen Defects? UDGAN for Improving Unseen Defects Recognition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICANN (1) ![In: Artificial Neural Networks and Machine Learning - ICANN 2022 - 31st International Conference on Artificial Neural Networks, Bristol, UK, September 6-9, 2022, Proceedings, Part I, pp. 183-194, 2022, Springer, 978-3-031-15918-3. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Ankit Gupta 0010, Adrita Barari, Damini, Keerthi Kiran Jagannathachar, Seungwoo Lee, Janghoon Oh, Jungha Kim, Min-Joo Kim |
Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSID ![In: 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, VLSID 2022, Bangalore, India, February 26 - March 2, 2022, pp. 150-155, 2022, IEEE, 978-1-6654-8505-0. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
22 | Jiajun Jiang, Yingfei Xiong 0001 |
Can defects be fixed with weak test suites? An analysis of 50 defects from Defects4J. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1705.04149, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP BibTeX RDF |
|
22 | Jun Ma 0003, Ying Xu, Jun Tang 0002, Chun-Ni Wang |
Defects formation and wave emitting from defects in excitable media. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Commun. Nonlinear Sci. Numer. Simul. ![In: Commun. Nonlinear Sci. Numer. Simul. 34, pp. 55-65, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
22 | Emad Shihab, Audris Mockus, Yasutaka Kamei, Bram Adams, Ahmed E. Hassan |
High-impact defects: a study of breakage and surprise defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGSOFT FSE ![In: SIGSOFT/FSE'11 19th ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE-19) and ESEC'11: 13th European Software Engineering Conference (ESEC-13), Szeged, Hungary, September 5-9, 2011, pp. 300-310, 2011, ACM, 978-1-4503-0443-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
22 | Francisco G. Bulnes, Daniel F. García, Julio Molleda |
A Technique for Clustering Individual Defects from Images of Steel Strips with Periodical Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MVA ![In: Proceedings of the IAPR Conference on Machine Vision Applications (IAPR MVA 2011), Nara Centennial Hall, Nara, Japan, June 13-15, 2011, pp. 283-286, 2011, 978-4-901122-11-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
22 | Narendar Reddy Kancharla, Ananda Rao Akepogu, Gopi Chand Merugu, Kiran Kumar Jogu |
A Quantitative Method to Detect Design Defects and to Ascertain the Elimination of Design Defects after Refactoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Software Engineering Research and Practice ![In: Proceedings of the 2008 International Conference on Software Engineering Research & Practice, SERP 2008, July 14-17, 2008, Las Vegas Nevada, USA, 2 Volumes, pp. 79-85, 2008, CSREA Press, 1-60132-088-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
22 | Catherine Stringfellow, Anneliese Amschler Andrews, Claes Wohlin, Håkan Petersson |
Estimating the number of components with defects post-release that showed no defects in testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Test. Verification Reliab. ![In: Softw. Test. Verification Reliab. 12(2), pp. 93-122, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
20 | Dmitry Chetverikov |
Residual of Resonant SVD as Salient Feature. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCVG ![In: Computer Vision and Graphics, International Conference, ICCVG 2008, Warsaw, Poland, November 10-12, 2008, Revised Papers, pp. 143-153, 2008, Springer, 978-3-642-02344-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
texture, SVD, defects, video processing, periodicity, saliency |
20 | Sudhakar M. Reddy, Irith Pomeranz, Chen Liu |
On tests to detect via opens in digital CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 840-845, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
constrained stuck-at tests, test generation, DFT, open defects |
20 | Gerard J. Holzmann |
Conquering Complexity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 40(12), pp. 111-113, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Perrow-class failures, software technologies, software defects |
20 | Jörg Rech, Waldemar Schäfer |
Visual support of software engineers during development and maintenance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGSOFT Softw. Eng. Notes ![In: ACM SIGSOFT Softw. Eng. Notes 32(2), pp. 1-3, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
quality defects, evaluation, software visualization, TAM, software navigation |
20 | Nathaniel Ayewah, William W. Pugh, J. David Morgenthaler, John Penix, YuQian Zhou |
Evaluating static analysis defect warnings on production software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PASTE ![In: Proceedings of the 7th ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, PASTE'07, San Diego, California, USA, June 13-14, 2007, pp. 1-8, 2007, ACM, 978-1-59593-595-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Java, static analysis, software quality, bugs, false positives, software defects, FindBugs, bug patterns |
20 | Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Chien-Mo Li |
Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007, pp. 835-840, 2007, IEEE Computer Society, 1-4244-0629-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
systematic defects, cyclic-column parity row selection technique, built-in self tested circuits, cyclic scan chains, masking circuitry, transient errors, circuit under test, nanometer technologies |
20 | Sheela Ramanna, Rajen Bhatt, Piotr Biernot |
Software Defect Classification: A Comparative Study with Rough Hybrid Approaches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RSEISP ![In: Rough Sets and Intelligent Systems Paradigms, International Conference, RSEISP 2007, Warsaw, Poland, June 28-30, 2007, Proceedings, pp. 630-638, 2007, Springer, 978-3-540-73450-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
rough-fuzzy classification trees, neuro-fuzzy decision trees, Classification, rough sets, software defects |
20 | Philipp V. Panitz, Markus Olbrich, Erich Barke, Jürgen Koehl |
Robust wiring networks for DfY considering timing constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007, pp. 43-48, 2007, ACM, 978-1-59593-605-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
redundant wiring, timing constraint aware, open defects, design for yield |
20 | Kwang-Ting (Tim) Cheng |
Dealing with early life failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 85, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
latent defects, embedded systems, technology scaling, IDDQ, burn-in |
20 | Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton |
Multiple-detect ATPG based on physical neighborhoods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 1099-1102, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
N-detect, multiple-detect, ATPG, defects, neighborhoods |
20 | Scott Davidson 0001 |
What's the problem? ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 22(4), pp. 392, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
full-scan test, design for testability, delay test, defects, IC |
20 | William E. Howden |
Software Test Selection Patterns and Elusive Bugs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC (1) ![In: 29th Annual International Computer Software and Applications Conference, COMPSAC 2005, Edinburgh, Scotland, UK, July 25-28, 2005. Volume 1, pp. 25-32, 2005, IEEE Computer Society, 0-7695-2413-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
elusive, models, design, Testing, patterns, defects |
20 | Evanthia Papadopoulou |
The Hausdorff Voronoi Diagram of Point Clusters in the Plane. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Algorithmica ![In: Algorithmica 40(2), pp. 63-82, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
VLSI yield prediction, VLSI Critical Area, Via-blocks, Voronoi diagram, Hausdorff distance, Plane sweep, Manufacturing defects |
20 | Marek Vokác |
Defect Frequency and Design Patterns: An Empirical Study of Industrial Code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 30(12), pp. 904-917, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
defect frequency, industrial code, Design patterns, case study, maintenance, defects |
20 | Bruce C. Hungerford, Alan R. Hevner, Rosann W. Collins |
Reviewing Software Diagrams: A Cognitive Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 30(2), pp. 82-96, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
human cognitive theory, software diagrams, verbal protocol methods, software quality, inspections, Defects, software reviews |
20 | Barry W. Boehm, Jesal Bhuta, David Garlan, Eric Gradman, LiGuo Huang, Alexander Lam, Raymond J. Madachy, Nenad Medvidovic, Kenneth Meyer, Steven Meyers, Gustavo Pérez, Kirk Reinholtz, Roshanak Roshandel, Nicolas Rouquette |
Using Empirical Testbeds to Accelerate Technology Maturity and Transition: The SCRover Experience. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2004 International Symposium on Empirical Software Engineering (ISESE 2004), 19-20 August 2004, Redondo Beach, CA, USA, pp. 117-126, 2004, IEEE Computer Society, 0-7695-2165-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
SCRover, empirical testbeds, seeded defects, Empirical methods, technology evaluation, software dependability, architecture definition languages |
20 | Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon |
IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 52(10), pp. 1285-1297, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
neural networks, VHDL, fault models, fault simulation, CMOS ICs, Bridge defects, IP blocks |
20 | William M. Evanco |
Comments on "The Confounding Effect of Class Size on the Validity of Object-Oriented Metrics". ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 29(7), pp. 670-672, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
defect-proneness, statistical modeling, Object-oriented metrics, software defects |
20 | Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada |
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 387-391, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
supply current test, time-variable electric field, test pattern generation, CMOS IC, open defects |
20 | Guoling Shen, Takis Sakkalis, Nicholas M. Patrikalakis |
Analysis of boundary representation model rectification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symposium on Solid Modeling and Applications ![In: Sixth ACM Symposium on Solid Modeling and Applications, Sheraton Inn, Ann Arbor, Michigan, USA, June 4-8, 2001, pp. 149-158, 2001, ACM, 1-58113-366-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
CAD model defects, boundary reconstruction, robustness, NP-hardness, data exchange |
20 | Salvador Mir, Benoît Charlot, Bernard Courtois |
Extending Fault-Based Testing to Microelectromechanical Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 16(3), pp. 279-288, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
nodal simulation, fault modeling, fault simulation, defects, MEMS, HDLs, failure modes |
20 | Chris Sauer, D. Ross Jeffery, Lesley Pek Wee Land, Philip Yetton |
The Effectiveness of Software Development Technical Reviews: A Behaviorally Motivated Program of Research. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 26(1), pp. 1-14, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
technical reviews, group size, behavioral research, research program, training, theory, groups, Inspections, defects, reading, expertise, defect detection, walkthroughs, group process |
20 | Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal |
Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 55-66, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Concurrent checking, self–checking circuits, timing faults, very deep submicron, hardware fault tolerance, soft errors, defects, nanometer technologies |
20 | Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukherjee |
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 97-104, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
delay defects, delay fault modeling, delay testing, critical paths, statistical timing analysis |
20 | John W. Stamey Jr., Thomas M. Roth III |
Technical documentation and related contractual liability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGDOC ![In: Proceedings of the 17th annual international conference on Documentation, SIGDOC 1999, New Orleans, Louisiana, USA, September 12-14, 1999, pp. 105-109, 1999, ACM, 1-58113-072-4. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
documentation defects, legal liability, technical documentation, liability |
20 | Angela Krstic, Kwang-Ting Cheng |
Resynthesis of Combinational Circuits for Path Count Reduction and for Path Delay Fault Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 11(1), pp. 43-54, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
resynthesis for testability, timing defects, delay testing, path delay faults, VLSI testing |
20 | Ken Posse |
A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 119-125, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
fault diagnosis, Boundary-Scan, Multichip Module, MCM, interconnect testing, manufacturing defects |
20 | Georg Lambert, Franziska Bock |
Wavelet methods for texture defect detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP (3) ![In: Proceedings 1997 International Conference on Image Processing, ICIP '97, Santa Barbara, California, USA, October 26-29, 1997, pp. 201-204, 1997, IEEE Computer Society, 0-8186-8183-7. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
multiscale wavelet methods, texture defect detection, wavelet bases, texture defects localisation, multiscale wavelet representations, fast dyadic wavelet transform, translation invariant a trous algorithm, feature extraction, image texture, computational costs, defect classification, decomposition algorithms, image texture analysis |
20 | Hans Schaefer |
Tutorial: organizing, managing and optimizing software testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APSEC ![In: 4th Asia-Pacific Software Engineering and International Computer Science Conference (APSEC '97 / ICSC '97), 2-5 December 1997, Clear Water Bay, Hong Kong, pp. 532-533, 1997, IEEE Computer Society, 0-8186-8271-X. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
serious defects, testing process control, software testing, program testing, cost, philosophy |
20 | Naim Ben-Hamida, Khaled Saab 0001, David Marche, Bozena Kaminska |
A perturbation based fault modeling and simulation for mixed-signal circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 182-187, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
analog circuit fault simulation, perturbation fault model, fault abstraction, structural fault modeling, perturbation estimation, fault observation, hierarchical analog fault simulator, complexity, test generation, CMOS, mixed-signal circuits, mixed analogue-digital integrated circuits, functional fault modeling, physical defects |
20 | Yu-Yau Guo, Jien-Chung Lo, Cecilia Metra |
Fast and area-time efficient Berger code checkers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France, pp. 110-118, 1997, IEEE Computer Society, 0-8186-8168-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Berger code checker, ratioed FET circuit, area-time efficiency, resistive breaks, VLSI, defects, error detection codes, bridges, speed, threshold function, 32 bit, 1.2 micron |
20 | Alvin Jee, F. Joel Ferguson |
A methodolgy for characterizing cell testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 384-390, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
cell testability, stuck-at fault coverage, IC quality, physical design for testability, metric, integrated circuit design, integrated circuit design, DPM, manufacturing defects |
20 | V. Kim, T. Chen |
Assessing SRAM test coverage for sub-micron CMOS technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 24-30, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
submicron CMOS technologies, SRAM test coverage assessment, memory fault probability model, memory array, data retention faults, memory fault coverages, memory test algorithms, functional fault class coverages, 0.5 to 1 mum, stuck-at faults, transition faults, stuck-open faults, coupling faults, physical defects, CMOS memory circuits |
20 | Jaume Segura 0001, Carol de Benito, Antonio Rubio 0001, Charles F. Hawkins |
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 8(3), pp. 229-239, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
fault modeling, physical defects, gate oxide short |
20 | Gordon W. Roberts |
Metrics, techniques and recent developments in mixed-signal testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1996, San Jose, CA, USA, November 10-14, 1996, pp. 514-521, 1996, IEEE Computer Society / ACM, 0-8186-7597-7. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
manufacturing environment, measurement setups, quality, mixed-signal testing, mixed analogue-digital integrated circuits, manufacturing defects, product cost |
20 | K. Vijayananda |
Distributed fault detection in communication protocols using extended finite state machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPADS ![In: 1996 International Conference on Parallel and Distributed Systems (ICPADS '96), June 3-6, 1996, Tokyo, Japan, Proceedings, pp. 310-318, 1996, IEEE Computer Society, 0-8186-7267-6. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
distributed fault detection, run-time fault detection, coding defects, memory problems, protocol faults, vocabulary faults, sequencing faults, parallel decomposition method, multiple observers, distributed fault detection mechanism, fault tolerant computing, finite state machines, transport protocols, encoding, communication protocols, fault coverage, extended finite state machines |
20 | Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal |
Segment delay faults: a new fault model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 32-41, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
segment delay faults, delay defect, distributed defect, rising transitions, falling transitions, transition tests, nonrobust tests, VLSI, fault diagnosis, logic testing, delays, integrated circuit testing, fault model, automatic testing, circuit analysis computing, robust tests, integrated circuit modelling, production testing, spot defect, manufacturing defects |
20 | Hassan Ihs, Christian Dufaza |
Tolerance DC bands of CMOS operational amplifier. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 140-, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
tolerance DC bands, CMOS operational amplifier, DC node voltages, data tolerance bands, foundry process fluctuations, DC branch current, OA, supply voltage, catastrophic defects, transistor connections, optimization, fault diagnosis, integrated circuit testing, fault detection, fault model, fault simulation, circuit optimisation, operational amplifiers, integrated circuit modelling, transistor size, CMOS analogue integrated circuits, design parameters |
20 | Yung-Yuan Chen, Ching-Hwa Cheng, Jwu-E Chen |
An efficient switching network fault diagnosis for reconfigurable VLSI/WSI array processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 349-354, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
switching network fault diagnosis, reconfigurable VLSI/WSI array processors, switching network defects, killing error, testing circuit overhead, diagnosis time, mesh array, VLSI, parallel architectures, fault diagnosis, reconfigurable architectures, multiple faults, switching networks, wafer-scale integration, testing quality |
20 | Xuanli Lisa Xie, Gerardo Beni |
A Validity Measure for Fuzzy Clustering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 13(8), pp. 841-847, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
fuzzy validity criterion, validity function, fuzzy c-partitions, geometric distance measure, cluster centroids, separation index, computer color vision system, IC wafer defects, pattern recognition, fuzzy clustering, fuzzy set theory, minimisation, uniqueness, color image segmentation |
18 | Gordon Fraser 0001, Andreas Zeller |
Mutation-driven generation of unit tests and oracles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the Nineteenth International Symposium on Software Testing and Analysis, ISSTA 2010, Trento, Italy, July 12-16, 2010, pp. 147-158, 2010, ACM, 978-1-60558-823-0. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
unit testing, assertions, test case generation, mutation testing, test oracles, mutation analysis, search based testing |
18 | Anita Gupta, Jingyue Li, Reidar Conradi, Harald Rønneberg, Einar Landre |
A case study comparing defect profiles of a reused framework and of applications reusing it. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 14(2), pp. 227-255, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Empirical study, Software reuse, Software defect |
18 | Muzaffer O. Simsir, Srihari Cadambi, Franjo Ivancic, Martin Rötteler, Niraj K. Jha |
A hybrid nano-CMOS architecture for defect and fault tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM J. Emerg. Technol. Comput. Syst. ![In: ACM J. Emerg. Technol. Comput. Syst. 5(3), pp. 14:1-14:26, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
nanotechnology, Defect tolerance, nanowires |
18 | Youngshin Han, Chilgee Lee, Jason J. Jung |
Redundancy analysis simulation in semiconductor manufacturing for yield improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SpringSim ![In: Proceedings of the 2009 Spring Simulation Multiconference, SpringSim 2009, San Diego, California, USA, March 22-27, 2009, 2009, SCS/ACM. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
EDS, fail bit map, redundancy analysis simulation, correlation |
18 | Dragan Bosnacki, Aad Mathijssen, Yaroslav S. Usenko |
Behavioural Analysis of an I2C Linux Driver. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FMICS ![In: Formal Methods for Industrial Critical Systems, 14th International Workshop, FMICS 2009, Eindhoven, The Netherlands, November 2-3, 2009. Proceedings, pp. 205-206, 2009, Springer, 978-3-642-04569-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Jianping Lin, Shuisheng Chen, Ying Cao, Huajun Guan |
Parameters optimization on dent around fuel filler of auto rear fender based on intelligent algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
GEC Summit ![In: Proceedings of the first ACM/SIGEVO Summit on Genetic and Evolutionary Computation, GEC Summit 2009, Shanghai, China, June 12-14, 2009, pp. 321-328, 2009, ACM, 978-1-60558-326-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
RSM, dent, finite element simulation, orthogonal design experiment, parameters optimization, intelligent algorithm |
18 | Özlem Albayrak |
An experiment to observe the impact of UML diagrams on the effectiveness of software requirements inspections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Third International Symposium on Empirical Software Engineering and Measurement, ESEM 2009, October 15-16, 2009, Lake Buena Vista, Florida, USA, pp. 506-510, 2009, IEEE Computer Society, 978-1-4244-4842-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Mangala Gowri Nanda, Saurabh Sinha |
Accurate Interprocedural Null-Dereference Analysis for Java. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 31st International Conference on Software Engineering, ICSE 2009, May 16-24, 2009, Vancouver, Canada, Proceedings, pp. 133-143, 2009, IEEE, 978-1-4244-3452-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Suresh Thummalapenta, Tao Xie 0001 |
Mining exception-handling rules as sequence association rules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 31st International Conference on Software Engineering, ICSE 2009, May 16-24, 2009, Vancouver, Canada, Proceedings, pp. 496-506, 2009, IEEE, 978-1-4244-3452-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
18 | Suchendra M. Bhandarkar, Xingzhi Luo, Richard F. Daniels, Ernest William Tollner |
Automated Planning and Optimization of Lumber Production Using Machine Vision and Computed Tomography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans Autom. Sci. Eng. ![In: IEEE Trans Autom. Sci. Eng. 5(4), pp. 677-695, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Westley Weimer, George C. Necula |
Exceptional situations and program reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Program. Lang. Syst. ![In: ACM Trans. Program. Lang. Syst. 30(2), pp. 8:1-8:51, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
compensating transactions, linear sagas, linear types, resource management, Error handling |
18 | Thomas Zimmermann 0001, Nachiappan Nagappan, Andreas Zeller |
Predicting Bugs from History. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Software Evolution ![In: Software Evolution, pp. 69-88, 2008, Springer, 978-3-540-76439-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | David A. McMeekin, Brian R. von Konsky, Elizabeth Chang 0001, David J. A. Cooper |
Checklist Based Reading's Influence on a Developer's Understanding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Australian Software Engineering Conference ![In: 19th Australian Software Engineering Conference (ASWEC 2008), March 25-28, 2008, Perth, Australia, pp. 489-496, 2008, IEEE Computer Society, 978-0-7695-3100-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Checklist Based Reading, Inspection, Comprehension, Understanding |
18 | Ahmed H. Eid, Mohamed N. Ahmed, Edward E. Rippetoe |
EP printer jitter characterization using 2D Gabor filter and spectral analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP ![In: Proceedings of the International Conference on Image Processing, ICIP 2008, October 12-15, 2008, San Diego, California, USA, pp. 1860-1863, 2008, IEEE, 978-1-4244-1765-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Jan Schat |
Fault Clustering in deep-submicron CMOS Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 511-514, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Stephen Thornhill, Nathanael Wu, Zhengfei Wang, Qinwei Shi, Jie Chen 0002 |
Graphene nanoribbon field-effect transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA, pp. 169-172, 2008, IEEE, 978-1-4244-1683-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Nilanjan Mukherjee 0001 |
Targeting "Zero DPPM" - Can we ever get there? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 163-163, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | Hyunbean Yi, Sandip Kundu |
Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 412-420, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
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