Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
23	Konstantinos Sagonas	Detecting defects in Erlang programs using static analysis.	PPDP	2007	DBLP DOI BibTeX RDF
23	Bekir Dizdaroglu, Ali Gangal	A Spatiotemporal Algorithm for Detection and Restoration of Defects in Old Color Films.	ACIVS	2007	DBLP DOI BibTeX RDF
23	Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee	Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects.	J. Electron. Test.	2006	DBLP DOI BibTeX RDF	IC reliability, reliability simulation, design for reliability, interconnect, electromigration, defect modeling
23	N. G. Shankar, Z. W. Zhong	Improved segmentation of semiconductor defects using area sieves.	Mach. Vis. Appl.	2006	DBLP DOI BibTeX RDF	Area sieve, Discrete wavelet transform, Machine vision, Inspection, Semiconductor
23	Yu Huang 0005, Keith Gallie	Diagnosis of defects on scan enable and clock trees.	DATE	2006	DBLP DOI BibTeX RDF
23	Fredrik Törner, Martin Ivarsson, Fredrik Pettersson, Peter Öhman	Defects in automotive use cases.	ISESE	2006	DBLP DOI BibTeX RDF	use case, automotive, empirical
23	Charles C. Chiang, Jamil Kawa	Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation.	APCCAS	2006	DBLP DOI BibTeX RDF
23	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita	Fault Diagnosis of Physical Defects Using Unknown Behavior Model.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF
23	Chien-Mo James Li, Edward J. McCluskey	Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
23	Nicola Campregher, Peter Y. K. Cheung, George A. Constantinides, Milan Vasilko	Analysis of yield loss due to random photolithographic defects in the interconnect structure of FPGAs.	FPGA	2005	DBLP DOI BibTeX RDF	FPGA redundancy, interconnect faults, fault tolerance, yield enhancement, interconnect model, yield prediction, catastrophic faults, FPGA interconnect
23	Sungshin Kim, Hyeon Bae, Seong-Pyo Cheon, Kwang-Baek Kim	On-line Fabric-Defects Detection Based on Wavelet Analysis.	ICCSA (4)	2005	DBLP DOI BibTeX RDF
23	Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng	Pattern Selection for Testing of Deep Sub-Micron Timing Defects.	DATE	2004	DBLP DOI BibTeX RDF
23	Tobias Lindahl, Konstantinos Sagonas	Detecting Software Defects in Telecom Applications Through Lightweight Static Analysis: A War Story.	APLAS	2004	DBLP DOI BibTeX RDF	Compile-time program checking, software development, software tools, defect detection, software quality assurance
23	Vadim A. Slavin, David H. Laidlaw, Robert Pelcovits, Song Zhang 0004, George Loriot, Andrew Callan-Jones	Visualization of Topological Defects in Nematic Liquid Crystals Using Streamtubes, Streamsurfaces and Ellipsoids.	IEEE Visualization	2004	DBLP DOI BibTeX RDF
23	Chris Schuermyer, Jens Ruffler, W. Robert Daasch	Minimum Testing Requirements to Screen Temperature Dependent Defects.	ITC	2004	DBLP DOI BibTeX RDF
23	Marek Z. Reformat	A Fuzzy-Based Meta-model for Reasoning about Number of Software Defects.	IFSA	2003	DBLP DOI BibTeX RDF
23	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita	Fault Diagnosis for Physical Defects of Unknown Behaviors.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
23	Domingo Mery	Crossing Line Profile: A New Approach to Detecting Defects in Aluminium Die Castings.	SCIA	2003	DBLP DOI BibTeX RDF	X-ray testing, automated visual inspection, Flaw detection
23	William M. Evanco, June M. Verner	Some Architectural Features of Ada Systems Affecting Defects.	Ada-Europe	2003	DBLP DOI BibTeX RDF
23	Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez	Resistance Characterization for Weak Open Defects.	IEEE Des. Test Comput.	2002	DBLP DOI BibTeX RDF
23	Zaid Al-Ars, Ad J. van de Goor	DRAM Specific Approximation of the Faulty Behavior of Cell Defects.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	memory specific fault analysis, approximating dynamic behavior, memory testing, DRAM
23	Zaid Al-Ars, Ad J. van de Goor	Approximating Infinite Dynamic Behavior for DRAM Cell Defects.	VTS	2002	DBLP DOI BibTeX RDF	infinite dynamic faults, memory testing, DRAMs, functional fault models, defect simulation
23	Søren Lauesen, Otto Vinter	Preventing Requirement Defects: An Experiment in Process Improvement.	Requir. Eng.	2001	DBLP DOI BibTeX RDF	Cost/benefit, Usability, Requirements engineering, Scenarios, Process improvement, Market value
23	Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson 0001	An Evaluation of Pseudo Random Testing for Detecting Real Defects.	VTS	2001	DBLP DOI BibTeX RDF
23	Sungju Park, Taehyung Kim	A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects.	DATE	2000	DBLP DOI BibTeX RDF
23	P. Caleb, Michal Steuer	Classification of surface defects on hot rolled steel using adaptive learning methods.	KES	2000	DBLP DOI BibTeX RDF
23	Amir Attarha, Mehrdad Nourani, Caro Lucas	Modeling and simulation of real defects using fuzzy logic.	DAC	2000	DBLP DOI BibTeX RDF	SPICE
23	Gwan-Hyung Kim, Sung-In Kang, Sang-Bae Lee	A study on the estimate of weld bead shape and the compensation of welding parameters by considering weld defects in horizontal fillet welding.	KES	1999	DBLP DOI BibTeX RDF
23	James F. Plusquellic, Amy Germida, Zheng Yan	8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects.	DFT	1999	DBLP DOI BibTeX RDF
23	James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan	Characterization of CMOS Defects using Transient Signal Analysis.	DFT	1998	DBLP DOI BibTeX RDF	transient signal analysis, CMOS defect characterization, defect diagnosis, failure analysis
23	Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong	High volume microprocessor test escapes, an analysis of defects our tests are missing.	ITC	1998	DBLP DOI BibTeX RDF
23	Manoj Sachdev	Open Defects in CMOS RAM Address Decoders.	IEEE Des. Test Comput.	1997	DBLP DOI BibTeX RDF
22	Jimmy-Xuan Shen, Joel Varley	pymatgen-analysis-defects: A Python package for analyzing point defects in crystalline materials.	J. Open Source Softw.	2024	DBLP DOI BibTeX RDF
22	Akond Rahman, Dibyendu Brinto Bose, Raunak Shakya, Rahul Pandita	Come for syntax, stay for speed, understand defects: an empirical study of defects in Julia programs.	Empir. Softw. Eng.	2023	DBLP DOI BibTeX RDF
22	Yaxi Chen, Ruimin Hu, Zheng Wang 0007, Yuke Li	How to Face Unseen Defects? UDGAN for Improving Unseen Defects Recognition.	ICANN (1)	2022	DBLP DOI BibTeX RDF
22	Ankit Gupta 0010, Adrita Barari, Damini, Keerthi Kiran Jagannathachar, Seungwoo Lee, Janghoon Oh, Jungha Kim, Min-Joo Kim	Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering.	VLSID	2022	DBLP DOI BibTeX RDF
22	Jiajun Jiang, Yingfei Xiong 0001	Can defects be fixed with weak test suites? An analysis of 50 defects from Defects4J.	CoRR	2017	DBLP BibTeX RDF
22	Jun Ma 0003, Ying Xu, Jun Tang 0002, Chun-Ni Wang	Defects formation and wave emitting from defects in excitable media.	Commun. Nonlinear Sci. Numer. Simul.	2016	DBLP DOI BibTeX RDF
22	Emad Shihab, Audris Mockus, Yasutaka Kamei, Bram Adams, Ahmed E. Hassan	High-impact defects: a study of breakage and surprise defects.	SIGSOFT FSE	2011	DBLP DOI BibTeX RDF
22	Francisco G. Bulnes, Daniel F. García, Julio Molleda	A Technique for Clustering Individual Defects from Images of Steel Strips with Periodical Defects.	MVA	2011	DBLP BibTeX RDF
22	Narendar Reddy Kancharla, Ananda Rao Akepogu, Gopi Chand Merugu, Kiran Kumar Jogu	A Quantitative Method to Detect Design Defects and to Ascertain the Elimination of Design Defects after Refactoring.	Software Engineering Research and Practice	2008	DBLP BibTeX RDF
22	Catherine Stringfellow, Anneliese Amschler Andrews, Claes Wohlin, Håkan Petersson	Estimating the number of components with defects post-release that showed no defects in testing.	Softw. Test. Verification Reliab.	2002	DBLP DOI BibTeX RDF
20	Dmitry Chetverikov	Residual of Resonant SVD as Salient Feature.	ICCVG	2008	DBLP DOI BibTeX RDF	texture, SVD, defects, video processing, periodicity, saliency
20	Sudhakar M. Reddy, Irith Pomeranz, Chen Liu	On tests to detect via opens in digital CMOS circuits.	DAC	2008	DBLP DOI BibTeX RDF	constrained stuck-at tests, test generation, DFT, open defects
20	Gerard J. Holzmann	Conquering Complexity.	Computer	2007	DBLP DOI BibTeX RDF	Perrow-class failures, software technologies, software defects
20	Jörg Rech, Waldemar Schäfer	Visual support of software engineers during development and maintenance.	ACM SIGSOFT Softw. Eng. Notes	2007	DBLP DOI BibTeX RDF	quality defects, evaluation, software visualization, TAM, software navigation
20	Nathaniel Ayewah, William W. Pugh, J. David Morgenthaler, John Penix, YuQian Zhou	Evaluating static analysis defect warnings on production software.	PASTE	2007	DBLP DOI BibTeX RDF	Java, static analysis, software quality, bugs, false positives, software defects, FindBugs, bug patterns
20	Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Chien-Mo Li	Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies.	ASP-DAC	2007	DBLP DOI BibTeX RDF	systematic defects, cyclic-column parity row selection technique, built-in self tested circuits, cyclic scan chains, masking circuitry, transient errors, circuit under test, nanometer technologies
20	Sheela Ramanna, Rajen Bhatt, Piotr Biernot	Software Defect Classification: A Comparative Study with Rough Hybrid Approaches.	RSEISP	2007	DBLP DOI BibTeX RDF	rough-fuzzy classification trees, neuro-fuzzy decision trees, Classification, rough sets, software defects
20	Philipp V. Panitz, Markus Olbrich, Erich Barke, Jürgen Koehl	Robust wiring networks for DfY considering timing constraints.	ACM Great Lakes Symposium on VLSI	2007	DBLP DOI BibTeX RDF	redundant wiring, timing constraint aware, open defects, design for yield
20	Kwang-Ting (Tim) Cheng	Dealing with early life failures.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	latent defects, embedded systems, technology scaling, IDDQ, burn-in
20	Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton	Multiple-detect ATPG based on physical neighborhoods.	DAC	2006	DBLP DOI BibTeX RDF	N-detect, multiple-detect, ATPG, defects, neighborhoods
20	Scott Davidson 0001	What's the problem?	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	full-scan test, design for testability, delay test, defects, IC
20	William E. Howden	Software Test Selection Patterns and Elusive Bugs.	COMPSAC (1)	2005	DBLP DOI BibTeX RDF	elusive, models, design, Testing, patterns, defects
20	Evanthia Papadopoulou	The Hausdorff Voronoi Diagram of Point Clusters in the Plane.	Algorithmica	2004	DBLP DOI BibTeX RDF	VLSI yield prediction, VLSI Critical Area, Via-blocks, Voronoi diagram, Hausdorff distance, Plane sweep, Manufacturing defects
20	Marek Vokác	Defect Frequency and Design Patterns: An Empirical Study of Industrial Code.	IEEE Trans. Software Eng.	2004	DBLP DOI BibTeX RDF	defect frequency, industrial code, Design patterns, case study, maintenance, defects
20	Bruce C. Hungerford, Alan R. Hevner, Rosann W. Collins	Reviewing Software Diagrams: A Cognitive Study.	IEEE Trans. Software Eng.	2004	DBLP DOI BibTeX RDF	human cognitive theory, software diagrams, verbal protocol methods, software quality, inspections, Defects, software reviews
20	Barry W. Boehm, Jesal Bhuta, David Garlan, Eric Gradman, LiGuo Huang, Alexander Lam, Raymond J. Madachy, Nenad Medvidovic, Kenneth Meyer, Steven Meyers, Gustavo Pérez, Kirk Reinholtz, Roshanak Roshandel, Nicolas Rouquette	Using Empirical Testbeds to Accelerate Technology Maturity and Transition: The SCRover Experience.	ISESE	2004	DBLP DOI BibTeX RDF	SCRover, empirical testbeds, seeded defects, Empirical methods, technology evaluation, software dependability, architecture definition languages
20	Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon	IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	neural networks, VHDL, fault models, fault simulation, CMOS ICs, Bridge defects, IP blocks
20	William M. Evanco	Comments on "The Confounding Effect of Class Size on the Validity of Object-Oriented Metrics".	IEEE Trans. Software Eng.	2003	DBLP DOI BibTeX RDF	defect-proneness, statistical modeling, Object-oriented metrics, software defects
20	Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada	Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.	DELTA	2002	DBLP DOI BibTeX RDF	supply current test, time-variable electric field, test pattern generation, CMOS IC, open defects
20	Guoling Shen, Takis Sakkalis, Nicholas M. Patrikalakis	Analysis of boundary representation model rectification.	Symposium on Solid Modeling and Applications	2001	DBLP DOI BibTeX RDF	CAD model defects, boundary reconstruction, robustness, NP-hardness, data exchange
20	Salvador Mir, Benoît Charlot, Bernard Courtois	Extending Fault-Based Testing to Microelectromechanical Systems.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	nodal simulation, fault modeling, fault simulation, defects, MEMS, HDLs, failure modes
20	Chris Sauer, D. Ross Jeffery, Lesley Pek Wee Land, Philip Yetton	The Effectiveness of Software Development Technical Reviews: A Behaviorally Motivated Program of Research.	IEEE Trans. Software Eng.	2000	DBLP DOI BibTeX RDF	technical reviews, group size, behavioral research, research program, training, theory, groups, Inspections, defects, reading, expertise, defect detection, walkthroughs, group process
20	Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal	Self-Checking Circuits versus Realistic Faults in Very Deep Submicron.	VTS	2000	DBLP DOI BibTeX RDF	Concurrent checking, self–checking circuits, timing faults, very deep submicron, hardware fault tolerance, soft errors, defects, nanometer technologies
20	Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukherjee	Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis.	VTS	2000	DBLP DOI BibTeX RDF	delay defects, delay fault modeling, delay testing, critical paths, statistical timing analysis
20	John W. Stamey Jr., Thomas M. Roth III	Technical documentation and related contractual liability.	SIGDOC	1999	DBLP DOI BibTeX RDF	documentation defects, legal liability, technical documentation, liability
20	Angela Krstic, Kwang-Ting Cheng	Resynthesis of Combinational Circuits for Path Count Reduction and for Path Delay Fault Testability.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	resynthesis for testability, timing defects, delay testing, path delay faults, VLSI testing
20	Ken Posse	A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	fault diagnosis, Boundary-Scan, Multichip Module, MCM, interconnect testing, manufacturing defects
20	Georg Lambert, Franziska Bock	Wavelet methods for texture defect detection.	ICIP (3)	1997	DBLP DOI BibTeX RDF	multiscale wavelet methods, texture defect detection, wavelet bases, texture defects localisation, multiscale wavelet representations, fast dyadic wavelet transform, translation invariant a trous algorithm, feature extraction, image texture, computational costs, defect classification, decomposition algorithms, image texture analysis
20	Hans Schaefer	Tutorial: organizing, managing and optimizing software testing.	APSEC	1997	DBLP DOI BibTeX RDF	serious defects, testing process control, software testing, program testing, cost, philosophy
20	Naim Ben-Hamida, Khaled Saab 0001, David Marche, Bozena Kaminska	A perturbation based fault modeling and simulation for mixed-signal circuits.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	analog circuit fault simulation, perturbation fault model, fault abstraction, structural fault modeling, perturbation estimation, fault observation, hierarchical analog fault simulator, complexity, test generation, CMOS, mixed-signal circuits, mixed analogue-digital integrated circuits, functional fault modeling, physical defects
20	Yu-Yau Guo, Jien-Chung Lo, Cecilia Metra	Fast and area-time efficient Berger code checkers.	DFT	1997	DBLP DOI BibTeX RDF	Berger code checker, ratioed FET circuit, area-time efficiency, resistive breaks, VLSI, defects, error detection codes, bridges, speed, threshold function, 32 bit, 1.2 micron
20	Alvin Jee, F. Joel Ferguson	A methodolgy for characterizing cell testability.	VTS	1997	DBLP DOI BibTeX RDF	cell testability, stuck-at fault coverage, IC quality, physical design for testability, metric, integrated circuit design, integrated circuit design, DPM, manufacturing defects
20	V. Kim, T. Chen	Assessing SRAM test coverage for sub-micron CMOS technologies.	VTS	1997	DBLP DOI BibTeX RDF	submicron CMOS technologies, SRAM test coverage assessment, memory fault probability model, memory array, data retention faults, memory fault coverages, memory test algorithms, functional fault class coverages, 0.5 to 1 mum, stuck-at faults, transition faults, stuck-open faults, coupling faults, physical defects, CMOS memory circuits
20	Jaume Segura 0001, Carol de Benito, Antonio Rubio 0001, Charles F. Hawkins	A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	fault modeling, physical defects, gate oxide short
20	Gordon W. Roberts	Metrics, techniques and recent developments in mixed-signal testing.	ICCAD	1996	DBLP DOI BibTeX RDF	manufacturing environment, measurement setups, quality, mixed-signal testing, mixed analogue-digital integrated circuits, manufacturing defects, product cost
20	K. Vijayananda	Distributed fault detection in communication protocols using extended finite state machines.	ICPADS	1996	DBLP DOI BibTeX RDF	distributed fault detection, run-time fault detection, coding defects, memory problems, protocol faults, vocabulary faults, sequencing faults, parallel decomposition method, multiple observers, distributed fault detection mechanism, fault tolerant computing, finite state machines, transport protocols, encoding, communication protocols, fault coverage, extended finite state machines
20	Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal	Segment delay faults: a new fault model.	VTS	1996	DBLP DOI BibTeX RDF	segment delay faults, delay defect, distributed defect, rising transitions, falling transitions, transition tests, nonrobust tests, VLSI, fault diagnosis, logic testing, delays, integrated circuit testing, fault model, automatic testing, circuit analysis computing, robust tests, integrated circuit modelling, production testing, spot defect, manufacturing defects
20	Hassan Ihs, Christian Dufaza	Tolerance DC bands of CMOS operational amplifier.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	tolerance DC bands, CMOS operational amplifier, DC node voltages, data tolerance bands, foundry process fluctuations, DC branch current, OA, supply voltage, catastrophic defects, transistor connections, optimization, fault diagnosis, integrated circuit testing, fault detection, fault model, fault simulation, circuit optimisation, operational amplifiers, integrated circuit modelling, transistor size, CMOS analogue integrated circuits, design parameters
20	Yung-Yuan Chen, Ching-Hwa Cheng, Jwu-E Chen	An efficient switching network fault diagnosis for reconfigurable VLSI/WSI array processors.	VLSI Design	1995	DBLP DOI BibTeX RDF	switching network fault diagnosis, reconfigurable VLSI/WSI array processors, switching network defects, killing error, testing circuit overhead, diagnosis time, mesh array, VLSI, parallel architectures, fault diagnosis, reconfigurable architectures, multiple faults, switching networks, wafer-scale integration, testing quality
20	Xuanli Lisa Xie, Gerardo Beni	A Validity Measure for Fuzzy Clustering.	IEEE Trans. Pattern Anal. Mach. Intell.	1991	DBLP DOI BibTeX RDF	fuzzy validity criterion, validity function, fuzzy c-partitions, geometric distance measure, cluster centroids, separation index, computer color vision system, IC wafer defects, pattern recognition, fuzzy clustering, fuzzy set theory, minimisation, uniqueness, color image segmentation
18	Gordon Fraser 0001, Andreas Zeller	Mutation-driven generation of unit tests and oracles.	ISSTA	2010	DBLP DOI BibTeX RDF	unit testing, assertions, test case generation, mutation testing, test oracles, mutation analysis, search based testing
18	Anita Gupta, Jingyue Li, Reidar Conradi, Harald Rønneberg, Einar Landre	A case study comparing defect profiles of a reused framework and of applications reusing it.	Empir. Softw. Eng.	2009	DBLP DOI BibTeX RDF	Empirical study, Software reuse, Software defect
18	Muzaffer O. Simsir, Srihari Cadambi, Franjo Ivancic, Martin Rötteler, Niraj K. Jha	A hybrid nano-CMOS architecture for defect and fault tolerance.	ACM J. Emerg. Technol. Comput. Syst.	2009	DBLP DOI BibTeX RDF	nanotechnology, Defect tolerance, nanowires
18	Youngshin Han, Chilgee Lee, Jason J. Jung	Redundancy analysis simulation in semiconductor manufacturing for yield improvement.	SpringSim	2009	DBLP DOI BibTeX RDF	EDS, fail bit map, redundancy analysis simulation, correlation
18	Dragan Bosnacki, Aad Mathijssen, Yaroslav S. Usenko	Behavioural Analysis of an I2C Linux Driver.	FMICS	2009	DBLP DOI BibTeX RDF
18	Jianping Lin, Shuisheng Chen, Ying Cao, Huajun Guan	Parameters optimization on dent around fuel filler of auto rear fender based on intelligent algorithm.	GEC Summit	2009	DBLP DOI BibTeX RDF	RSM, dent, finite element simulation, orthogonal design experiment, parameters optimization, intelligent algorithm
18	Özlem Albayrak	An experiment to observe the impact of UML diagrams on the effectiveness of software requirements inspections.	ESEM	2009	DBLP DOI BibTeX RDF
18	Mangala Gowri Nanda, Saurabh Sinha	Accurate Interprocedural Null-Dereference Analysis for Java.	ICSE	2009	DBLP DOI BibTeX RDF
18	Suresh Thummalapenta, Tao Xie 0001	Mining exception-handling rules as sequence association rules.	ICSE	2009	DBLP DOI BibTeX RDF
18	Suchendra M. Bhandarkar, Xingzhi Luo, Richard F. Daniels, Ernest William Tollner	Automated Planning and Optimization of Lumber Production Using Machine Vision and Computed Tomography.	IEEE Trans Autom. Sci. Eng.	2008	DBLP DOI BibTeX RDF
18	Westley Weimer, George C. Necula	Exceptional situations and program reliability.	ACM Trans. Program. Lang. Syst.	2008	DBLP DOI BibTeX RDF	compensating transactions, linear sagas, linear types, resource management, Error handling
18	Thomas Zimmermann 0001, Nachiappan Nagappan, Andreas Zeller	Predicting Bugs from History.	Software Evolution	2008	DBLP DOI BibTeX RDF
18	David A. McMeekin, Brian R. von Konsky, Elizabeth Chang 0001, David J. A. Cooper	Checklist Based Reading's Influence on a Developer's Understanding.	Australian Software Engineering Conference	2008	DBLP DOI BibTeX RDF	Checklist Based Reading, Inspection, Comprehension, Understanding
18	Ahmed H. Eid, Mohamed N. Ahmed, Edward E. Rippetoe	EP printer jitter characterization using 2D Gabor filter and spectral analysis.	ICIP	2008	DBLP DOI BibTeX RDF
18	Jan Schat	Fault Clustering in deep-submicron CMOS Processes.	DATE	2008	DBLP DOI BibTeX RDF
18	Stephen Thornhill, Nathanael Wu, Zhengfei Wang, Qinwei Shi, Jie Chen 0002	Graphene nanoribbon field-effect transistors.	ISCAS	2008	DBLP DOI BibTeX RDF
18	Nilanjan Mukherjee 0001	Targeting "Zero DPPM" - Can we ever get there?	DFT	2008	DBLP DOI BibTeX RDF
18	Hyunbean Yi, Sandip Kundu	Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing.	DFT	2008	DBLP DOI BibTeX RDF