Search results for "BEOL"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
177	Nancy Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li 0001, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi	The impact of BEOL lithography effects on the SRAM cell performance and yield.	ISQED	2009	DBLP DOI BibTeX RDF
75	Greg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green	Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	systematic yield loss, test structure, BEOL, DFM, process monitoring, silicon debug, infrastructure IP
66	Tarek A. El-Moselhy, Ibrahim M. Elfadel, David Widiger	Efficient algorithm for the computation of on-chip capacitance sensitivities with respect to a large set of parameters.	DAC	2008	DBLP DOI BibTeX RDF	sensitivity analysis, capacitance extraction, adjoint method
66	N. S. Nagaraj, Tom Bonifield, Abha Singh, Clive Bittlestone, Usha Narasimha, Viet Le, Anthony M. Hill	BEOL variability and impact on RC extraction.	DAC	2005	DBLP DOI BibTeX RDF	interconnect, process variation, extraction
53	Shyam Parthasarathy, Balaji Swaminathan, Ananth Sundaram, Robert A. Groves	Design Considerations for BEOL MIM Capacitor Modeling in RF CMOS Processes.	VLSI Design	2010	DBLP DOI BibTeX RDF	BEOL MIM Capacitor, Deembedding, Substrate ring
44	Ning Lu	Statistical Models and Frequency-Dependent Corner Models for Passive Devices.	ISQED	2008	DBLP DOI BibTeX RDF	SPICE models, corner models, RF models, passive devices, statistical models
44	Tathagata Srimani, Andrew C. Yu, Robert M. Radway, Dennis Rich, Mark Nelson, S. Wong, Denis Murphy, Samuel Fuller, Gage Hills, Subhasish Mitra, Max M. Shulaker	Foundry Monolithic 3D BEOL Transistor + Memory Stack: Iso-performance and Iso-footprint BEOL Carbon Nanotube FET+RRAM vs. FEOL Silicon FET+RRAM.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
41	Esther Han Beol Jang, Nicola J. Bidwell, Jen Liu, Phoebe Sengers, Naveen Bagalkot, Nervo Verdezoto, Melissa Densmore, Morgan Vigil-Hayes, Shaddi Hasan	Situating Network Infrastructure with People, Practices, and Beyond: A Community Building Workshop.	CSCW Companion	2022	DBLP DOI BibTeX RDF
41	Philip Garrison, Esther Han Beol Jang, Michael A. Lithgow, Nicolás Andrés Pace	"The Network Is an Excuse": Hardware Maintenance Supporting Community.	Proc. ACM Hum. Comput. Interact.	2021	DBLP DOI BibTeX RDF
41	Matthew William Johnson, Esther Han Beol Jang, Frankie O'Rourke, Rachel Ye, Kurtis Heimerl	Network Capacity as Common Pool Resource: Community-Based Congestion Management in a Community Network.	Proc. ACM Hum. Comput. Interact.	2021	DBLP DOI BibTeX RDF
41	Sudheesh Singanamalla, Esther Han Beol Jang, Richard J. Anderson, Tadayoshi Kohno, Kurtis Heimerl	Accept the Risk and Continue: Measuring the Long Tail of Government https Adoption.	Internet Measurement Conference	2020	DBLP DOI BibTeX RDF
41	Esther Han Beol Jang, Philip Garrison, Ronel Vincent Vistal, Maria Theresa D. Cunanan, Maria Theresa Perez, Philip A. Martinez, Matthew William Johnson, John Andrew Evangelista, Syed Ishtiaque Ahmed, Josephine Dionisio, Mary Claire Aguilar Barela, Kurtis Heimerl	Trust and Technology Repair Infrastructures in the Remote Rural Philippines: Navigating Urban-Rural Seams.	Proc. ACM Hum. Comput. Interact.	2019	DBLP DOI BibTeX RDF
41	Galen Weld, Esther Han Beol Jang, Anthony Li, Aileen Zeng, Kurtis Heimerl, Jon E. Froehlich	Deep Learning for Automatically Detecting Sidewalk Accessibility Problems Using Streetscape Imagery.	ASSETS	2019	DBLP DOI BibTeX RDF
41	Esther Han Beol Jang, Mary Claire Barela, Matthew Johnson 0011, Philip A. Martinez, Cedric Festin, Margaret T. Lynn, Josephine Dionisio, Kurtis Heimerl	Crowdsourcing Rural Network Maintenance and Repair via Network Messaging.	CHI	2018	DBLP DOI BibTeX RDF
41	Matthew Johnson 0011, Spencer Sevilla, Esther Han Beol Jang, Kurtis Heimerl	dLTE: Building a more WiFi-like Cellular Network: (Instead of the Other Way Around).	HotNets	2018	DBLP DOI BibTeX RDF
41	Vincent W. S. Chan, Esther Han Beol Jang	Cognitive all-optical fiber network architecture.	ICTON	2017	DBLP DOI BibTeX RDF
41	Esther Han Beol Jang, Matthew Johnson 0011, Edward Burnell, Kurtis Heimerl	Unplanned Obsolescence: Hardware and Software After Collapse.	LIMITS	2017	DBLP DOI BibTeX RDF
31	V. Kheterpal, Andrzej J. Strojwas, Lawrence T. Pileggi	Routing architecture exploration for regular fabrics.	DAC	2004	DBLP DOI BibTeX RDF	BEOL, regularity
22	Andrew B. Kahng	How to get real mad.	ISPD	2008	DBLP DOI BibTeX RDF	design-aware manufacturing, integrated circuit physical design, manufacturing-aware design, performance analysis, design for manufacturability
22	Michael Kropfitsch, Philipp Riess, Gerhard Knoblinger, Dieter Draxelmayr	Dielectric absorption of low-k materials: extraction, modelling and influence on SAR ADCs.	ISCAS	2006	DBLP DOI BibTeX RDF
22	Ibrahim M. Elfadel, Alina Deutsch, Gerard V. Kopcsay, Bradley Rubin, Howard H. Smith	A CAD Methodology and Tool for the Characterization of Wide On-Chip Buses.	DATE	2004	DBLP DOI BibTeX RDF
22	Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu 0001	Test structures for delay variability.	Timing Issues in the Specification and Synthesis of Digital Systems	2002	DBLP DOI BibTeX RDF
22	Kenneth Rose	A comprehensive look at system level model.	SLIP	2001	DBLP DOI BibTeX RDF
22	Doug Malone	Design Validation of .18 um 1 Ghz Cache and Register Arrays.	MTDT	1999	DBLP DOI BibTeX RDF
22	Bing-Xun Song, Ting Xin Lin, Yih-Lang Li	Routability Booster " Synthesize a Routing Friendly Standard Cell Library by Relaxing BEOL Resources.	ISPD	2024	DBLP DOI BibTeX RDF
22	Dominik Wrana, Christopher M. Grötsch, Benjamin Schoch, Lukas Gebert, Thomas Ufschlag, Arnulf Leuther, Robert C. Lozar, Ingmar Kallfass	Methodology to Accurately Replicate a Non-Planar Thin-Film Microstrip BEOL in 3D EM Simulation.	RWS	2024	DBLP DOI BibTeX RDF
22	Bei-Shing Lien, Szu Lin Liu, Wei-Lin Lai, Yi-Chen Lu, Yung-Chow Peng, Kenny Cheng-Hsiang Hsieh	3.8 A 0.65V 900µm² BEoL RC-Based Temperature Sensor with ±1°C Inaccuracy from -25°C to 125°C.	ISSCC	2024	DBLP DOI BibTeX RDF
22	Wenjun Tang, Jialong Liu, Chen Sun 0010, Zijie Zheng, Yongpan Liu, Huazhong Yang, Chen Jiang, Kai Ni 0004, Xiao Gong, Xueqing Li	Low-Power and Scalable BEOL-Compatible IGZO TFT eDRAM-Based Charge-Domain Computing.	IEEE Trans. Circuits Syst. I Regul. Pap.	2023	DBLP DOI BibTeX RDF
22	Laura Bégon-Lours, Mattia Halter, Diana Dávila Pineda, Youri Popoff, Valeria Bragaglia, Antonio La Porta, Daniel Jubin, Jean Fompeyrine, Bert Jan Offrein	A BEOL Compatible, 2-Terminals, Ferroelectric Analog Non-Volatile Memory.	CoRR	2023	DBLP DOI BibTeX RDF
22	Haimanti Chakraborty, Ranga Vemuri	Split Manufacturing Based Secure Hardware Design by BEOL Signal Selection In High Level Synthesis.	MWSCAS	2023	DBLP DOI BibTeX RDF
22	Weiman Yan, Ernest Wu, Alexander G. Schwing, Elyse Rosenbaum	Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions.	IRPS	2023	DBLP DOI BibTeX RDF
22	J. H. Lee, B. W. Woo, Y. M. Lee, N. H. Lee, S. H. Lee, Y. S. Lee, H. S. Kim, S. Pae	Reliability Improvement with Optimized BEOL Process in Advanced DRAM.	IRPS	2023	DBLP DOI BibTeX RDF
22	Y. H. Lin, C. C. Lee, C. Y. Liao, M. H. Lin, W. C. Tu, Robin Chen, H. P. Chen, Winston S. Shue, Min Cao	A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects.	IRPS	2023	DBLP DOI BibTeX RDF
22	Melina Lofrano, Herman Oprins, Xinyue Chang, Bjorn Vermeersch, Olalla Varela Pedreira, Alicja Lesniewska, Vladimir Cherman, Ivan Ciofi, Kristof Croes, Seongho Park, Zsolt Tokei	Towards accurate temperature prediction in BEOL for reliability assessment (Invited).	IRPS	2023	DBLP DOI BibTeX RDF
22	Jorge Mendoza, Jimmy-Bao Le, Choong-Un Kim, Hung-Yun Lin	Advanced Methods of Detecting Physical Damages in Packaging and BEOL Interconnects.	IRPS	2023	DBLP DOI BibTeX RDF
22	Om Prakash 0007, Kai Ni 0004, Hussam Amrouch	Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness.	IRPS	2023	DBLP DOI BibTeX RDF
22	Jackson P. Moody, Jeffrey W. Teng, John D. Cressler	The Impact of BEOL Stress on SiGe HBTs at Cryogenic Temperatures.	BCICTS	2023	DBLP DOI BibTeX RDF
22	Dongqi Zheng, Adam Charnas, Jian-Yu Lin, Jackson Anderson, Dana Weinstein, Peide D. Ye	Ultrathin Atomic-Layer-Deposited In2O3 Radio-Frequency Transistors with Record High fT of 36 GHz and BEOL Compatibility.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Xiaolin Wang, Zijie Zheng, Qiwen Kong, Leming Jiao, Kaizhen Han, Chen Sun 0010, Zuopu Zhou, Long Liu, Yuye Kang, Gan Liu, Dong Zhang, Xiao Gong	First Demonstration of BEOL-Compatible MFMIS Fe-FETs with 3D Multi-Fin Floating Gate: In-situ ALD-deposited MFM, LCH of 50 nm, > 2×109 Endurance, and 58.3% Area Saving.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	J.-Y. Lee, F.-S. Chang, Kuo-Yu Hsiang, P.-H. Chen, Z.-F. Luo, Z.-X. Li, J.-H. Tsai, C. W. Liu, Min-Hung Lee	3D Stackable Vertical Ferroelectric Tunneling Junction (V-FTJ) with on/off Ratio 1500x, Applicable Cell Current, Self-Rectifying Ratio 1000x, Robust Endurance of 10⁹ Cycles, Multilevel and Demonstrated Macro Operation Toward High-Density BEOL NVMs.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Jie Zhang, Zhuocheng Zhang, Zehao Lin, Ke Xu, Hongyi Dou, Bo Yang, Xinghang Zhang, Haiyan Wang, Peide D. Ye	First Demonstration of BEOL-Compatible Atomic-Layer-Deposited InGaZnO TFTs with 1.5 nm Channel Thickness and 60 nm Channel Length Achieving ON/OFF Ratio Exceeding 1011, SS of 68 mV/dec, Normal-off Operation and High Positive Gate Bias Stability.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Gaurav Thareja, Ashish Pal, Xingye Wang, Sefa Dag, Shi You, Shashank Sharma, Qing Zhu, Carmen L. Cervantes, Shinjae Hwang, Matthew Spuller, Ben Ng, Pradeep S. Kumar, Norman Tam, Max Gage, Sameer Deshpande, Zhiyuan Wu, Alexander Jansen, Liton Dey, Feng Chen, Xianjin Xie, Keyvan Kashefizadeh, Vinod Reddy, Andy Lo, Zhebo Chen, Sidney Huey, Jianshe Tang, He Ren, Mehul Naik, Brian Brown, Sree Kesapragada, Buvna Ayyagari-Sangamalli, El Mehdi Bazizi, Xianmin Tang	BEOL Interconnect Innovation: Materials, Process and Systems Co-optimization for 3nm Node and Beyond.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Leming Jiao, Kaizhen Han, Zuopu Zhou, Zijie Zheng, Xiaolin Wang, Qiwen Kong, Yuye Kang, Jishen Zhang, Long Liu, Xiao Gong	First Demonstration of BEOL-Compatible Write-Enhanced Ferroelectric-Modulated Diode (FMD): New Possibility for Oxide Semiconductor Memory Devices.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Zuopu Zhou, Leming Jiao, Qiwen Kong, Zijie Zheng, Kaizhen Han, Yue Chen, Chen Sun 0010, Bich-Yen Nguyen, Xiao Gong	Non-Destructive-Read 1T1C Ferroelectric Capacitive Memory Cell with BEOL 3D Monolithically Integrated IGZO Access Transistor for 4F2 High-Density Integration.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Zijie Zheng, Leming Jiao, Zuopu Zhou, Yuxuan Wang, Long Liu, Kaizhen Han, Chen Sun 0010, Qiwen Kong, Dong Zhang, Xiaolin Wang, Kai Ni, Xiao Gong	First Demonstration of Work Function-Engineered BEOL-Compatible IGZO Non-Volatile MFMIS AFeFETs and Their Co-Integration with Volatile-AFeFETs.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	C. H. Naylor, Kirby Maxey, C. Jezewski, K. P. O'Brien, A. V. Penumatcha, M. S. Kavrik, B. Agrawal, C. V. Littlefield, J. Lux, B. Barley, Justin R. Weber, A. Sen Gupta, C. J. Dorow, N. Arefin, S. King, R. Chebiam, J. Plombon, S. B. Clendenning, U. E. Avci, Mauro J. Kobrinsky, M. Metz	2D Materials in the BEOL.	VLSI Technology and Circuits	2023	DBLP DOI BibTeX RDF
22	Kaizhen Han	BEOL-compatible Oxide Semiconductor Devices.	ICICDT	2023	DBLP DOI BibTeX RDF
22	Zijie Zheng, Jiawei Xie, Yiyuan Sun, Ying Xu, Xiaolin Wang, Leming Jiao, Zuopu Zhou, Qiwen Kong, Yue Chen, Xiao Gong	First Demonstration of BEOL-compatible Amorphous InGaZnOx Channel Antiferroelectric (Hf0.2Zr0.8O2)-Enhanced Floating Gate Memory.	ICICDT	2023	DBLP DOI BibTeX RDF
22	Xianhe Liu, Qiang Wu, Yanli Li, Qi Wang	Improved BEOL Design Rules With 45-Degree Local Interconnection.	ASICON	2023	DBLP DOI BibTeX RDF
22	Abhrajit Sengupta, Mohammed Nabeel 0001, Mohammed Ashraf, Johann Knechtel, Ozgur Sinanoglu	A New Paradigm in Split Manufacturing: Lock the FEOL, Unlock at the BEOL.	Cryptogr.	2022	DBLP DOI BibTeX RDF
22	Nils Kopperberg, Stefan Wiefels, Karl Hofmann, Jan Otterstedt, Dirk J. Wouters, Rainer Waser, Stephan Menzel	Endurance of 2 Mbit Based BEOL Integrated ReRAM.	IEEE Access	2022	DBLP DOI BibTeX RDF
22	Daniel Lizzit, David Esseni	Operation and Design of Ferroelectric FETs for a BEOL Compatible Device Implementation.	CoRR	2022	DBLP DOI BibTeX RDF
22	Yandong Luo, Sourav Dutta, Ankit Kaul, Sung Kyu Lim, Muhannad S. Bakir, Suman Datta, Shimeng Yu	A Compute-in-Memory Hardware Accelerator Design With Back-End-of-Line (BEOL) Transistor Based Reconfigurable Interconnect.	IEEE J. Emerg. Sel. Topics Circuits Syst.	2022	DBLP DOI BibTeX RDF
22	Sukhrob Abdulazhanov, Dang Khoa Huynh, Quang Huy Le, David Lehninger, Thomas Kämpfe, Gerald Gerlach	BEoL integrated hafnium zirconium oxide varactors for tunable mmWave applications.	ESSDERC	2022	DBLP DOI BibTeX RDF
22	Ernest Y. Wu, Baozhen Li	Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics.	IRPS	2022	DBLP DOI BibTeX RDF
22	Ernest Y. Wu, Ron Bolam, Baozhen Li, Tian Shen, Barry P. Linder, Griselda Bonilla, Miaomiao Wang 0006, Dechao Guo	A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation.	IRPS	2022	DBLP DOI BibTeX RDF
22	Hao Yang, Bin Yan, Jianjun Sur, Jian Pang, Guanavao Li, Ouvana Keqing, Shuaiana Zhang	Accurate 3DIC thermal simulation for BEOL influence study.	ICTA	2022	DBLP DOI BibTeX RDF
22	Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Harrison Lee 0002, John D. Cressler	Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers.	BCICTS	2022	DBLP DOI BibTeX RDF
22	Zijie Zheng, Chen Sun 0010, Leming Jiao, Dong Zhang, Zuopu Zhou, Xiaolin Wang, Gan Liu, Qiwen Kong, Yue Chen, Kai Ni, Xiao Gong	Boosting the Memory Window of the BEOL-Compatible MFMIS Ferroelectric/ Anti-Ferroelectric FETs by Charge Injection.	VLSI Technology and Circuits	2022	DBLP DOI BibTeX RDF
22	Pai-Ying Liao, Sami Alajlouni, Mengwei Si, Zhuocheng Zhang, Zehao Lin, Jinhyun Noh, Calista Wilk, Ali Shakouri, Peide D. Ye	Thermal Studies of BEOL-compatible Top-Gated Atomically Thin ALD In2O3 FETs.	VLSI Technology and Circuits	2022	DBLP DOI BibTeX RDF
22	Zehao Lin, Mengwei Si, Peide D. Ye	Ultra-Fast Operation of BEOL-Compatible Atomic-Layer-Deposited In2O3 Fe-FETs: Achieving Memory Performance Enhancement with Memory Window of 2.5 V and High Endurance > 109 Cycles without VT Drift Penalty.	VLSI Technology and Circuits	2022	DBLP DOI BibTeX RDF
22	Abhishek Khanna, Huacheng Ye, Y. Luo, G. Bajpai, M. San Jose, Wriddhi Chakraborty, Shimeng Yu, Patrick Fay, Suman Datta	BEOL Compatible Ferroelectric Routers for Run-time Reconfigurable Compute-in-Memory Accelerators.	VLSI Technology and Circuits	2022	DBLP DOI BibTeX RDF
22	Takeshi Nogami, Oleg Gluschenkov, Yasir Sulehria, Son Nguyen, Brown Peethala, Huai Huang, Hosadurga Shobha, Nick Lanzillo, Raghuveer Patlolla, Devika Sil, Andrew Simon, Daniel Edelstein, Nelson Felix, Junjun Liu, Toshiyuki Tabata, Fulvio Mazzamuto, Sebastien Halty, Fabien Rozé, Yasutoshi Okuno, Akira Uedono	Advanced BEOL Materials, Processes, and Integration to Reduce Line Resistance of Damascene Cu, Co, and Subtractive Ru Interconnects.	VLSI Technology and Circuits	2022	DBLP DOI BibTeX RDF
22	David Lehninger, Hannes Mähne, Tarek Ali, Raik Hoffmann, Ricardo Olivo, Maximilian Lederer, Konstantin Mertens, Thomas Kämpfe, Kati Biedermann, Matthias Landwehr, Andreas Heinig, Defu Wang, Yukai Shen, Kerstin Bernert, Steffen Thiem, Konrad Seidel	Integration of BEoL Compatible 1T1C FeFET Memory Into an Established CMOS Technology.	IMW	2022	DBLP DOI BibTeX RDF
22	Leming Jiao, Zuopu Zhou, Zijie Zheng, Yuye Kang, Chen Sun 0010, Qiwen Kong, Xiaolin Wang, Dong Zhang, Gan Liu, Long Liu, Xiao Gong	BEOL-compatible Ta/HZO/W Ferroelectric Tunnel Junction with Low Operating Voltage Targeting for Low Power Application.	ICICDT	2022	DBLP DOI BibTeX RDF
22	Changho Han, Taewhan Kim	Synthesis of representative critical path circuits considering BEOL variations for deep sub-micron circuits.	Integr.	2021	DBLP DOI BibTeX RDF
22	Juan Valle, Daniel Fernández, Olivier Gibrat, Jordi Madrenas	Manufacturing Issues of BEOL CMOS-MEMS Devices.	IEEE Access	2021	DBLP DOI BibTeX RDF
22	Francesco Bellando, Leandro Julian Mele, Pierpaolo Palestri, Junrui Zhang, Adrian Mihai Ionescu, Luca Selmi	Sensitivity, Noise and Resolution in a BEOL-Modified Foundry-Made ISFET with Miniaturized Reference Electrode for Wearable Point-of-Care Applications.	Sensors	2021	DBLP DOI BibTeX RDF
22	Riccardo Fontanini, Justine Barbot, Mattia Segatto, Suzanne Lancaster, Quang T. Duong, Francesco Driussi, Laurent Grenouillet, François Triozon, Jean Coignus, Thomas Mikolajick, Stefan Slesazeck, David Esseni	Polarization switching and interface charges in BEOL compatible Ferroelectric Tunnel Junctions.	ESSDERC	2021	DBLP DOI BibTeX RDF
22	Andrea Redaelli, Anna Gandolfo, Giulia Samanni, Enrico Gomiero, Elisa Petroni, Luca Scotti, Andrea Lippiello, Paolo Mattavelli, J. Jasse, D. Codegoni, A. Serafini, Rossella Ranica, Christian Boccaccio, Jury Sandrini, R. Berthelon, J. C. Grenier, Olivier Weber, David Turgis, A. Valery, S. Del Medico, V. Caubet, J. P. Reynard, Didier Dutartre, L. Favennec, Antonino Conte, Fabio Disegni, M. De Tomasi, A. Ventre, Matteo Baldo, Daniele Ielmini, Alfonso Maurelli, P. Ferreira, Franck Arnaud, F. Piazza, Paolo Cappelletti, Roberto Annunziata, R. Gonella	Improving Ge-rich GST ePCM reliability through BEOL engineering.	ESSDERC	2021	DBLP DOI BibTeX RDF
22	Daniel Lizzit, David Esseni	Operation and Design of Ferroelectric FETs for a BEOL Compatible Device Implementation.	ESSDERC	2021	DBLP DOI BibTeX RDF
22	Aaron Ruen, Abhijeet Barua, Rashmi Jha, John Marty Emmert	Fully BEOL-Compatible Switch Boxes Using RRAMs and Thin Film Transistors for Reconfigurable and Secure ICs.	MWSCAS	2021	DBLP DOI BibTeX RDF
22	James Palmer, Galor Zhang, Justin R. Weber, Cheyun Lin, Christopher Perini, Rahim Kasim	Intrinsic Reliability of BEOL interlayer dielectric.	IRPS	2021	DBLP DOI BibTeX RDF
22	Sumy Jose, Chunshan Yin, Yu Chen, Cheong Min Hong, Mehul D. Shroff, Xiaoling Zhao, Fan Zhang	An efficient methodology to evaluate BEOL and MOL TDDB in advanced nodes.	IRPS	2021	DBLP DOI BibTeX RDF
22	Diana Mata-Hernandez, Daniel Fernández, Saoni Banerji, Jordi Madrenas	Resonant MEMS Pressure Sensor in 180 nm CMOS Technology Obtained by BEOL Isotropic Etching.	Sensors	2020	DBLP DOI BibTeX RDF
22	Josep Maria Sánchez-Chiva, Juan Valle, Daniel Fernández, Jordi Madrenas	A CMOS-MEMS BEOL 2-axis Lorentz-Force Magnetometer with Device-Level Offset Cancellation.	Sensors	2020	DBLP DOI BibTeX RDF
22	Betting Wehring, Raik Hoffmann, Lukas Gerlich, Malte Czernohorsky, Benjamin Uhlig, Robert Seidel, Tobias Barchewitz, Frank Schlaphof, Lutz Meinshausen, Christoph Leyens	BEoL Reliability, XPS and REELS Study on low-k Dielectrics to understand Breakdown Mechanisms.	IRPS	2020	DBLP DOI BibTeX RDF
22	Ren Li, Dias Azhigulov, Ahmed Allehyani, Hossein Fariborzi	BEOL NEM Relay-Based Inductorless DC-DC Converters.	ISCAS	2020	DBLP DOI BibTeX RDF
22	Abhrajit Sengupta, Mohammed Thari Nabeel, Johann Knechtel, Ozgur Sinanoglu	A New Paradigm in Split Manufacturing: Lock the FEOL, Unlock at the BEOL.	CoRR	2019	DBLP BibTeX RDF
22	Matt Ring, Johan De Greve, Bill Cowell, Darren Moore, Jeff Gambino	BEOL Process Development Using Fast Power Cycling on Test Structures.	IRPS	2019	DBLP DOI BibTeX RDF
22	Lili Cheng, Seungman Choi, Sean P. Ogden, Teck Jung Tang, Robert Fox	Robust BEOL MIMCAP for Long and Controllable TDDB Lifetime.	IRPS	2019	DBLP DOI BibTeX RDF
22	Ernest Y. Wu, Baozhen Li, James H. Stathis, Andrew Kim	Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications.	IRPS	2019	DBLP DOI BibTeX RDF
22	Niaz Mahmud, Nabihah Azhari, J. R. Lloyd	Comparative Study of TDDB Models on BEOL Interconnects for Sub-20 nm Spacings.	IRPS	2019	DBLP DOI BibTeX RDF
22	Abhrajit Sengupta, Mohammed Nabeel 0001, Johann Knechtel, Ozgur Sinanoglu	A New Paradigm in Split Manufacturing: Lock the FEOL, Unlock at the BEOL.	DATE	2019	DBLP DOI BibTeX RDF
22	Takahiko Ishizu, Yuto Yakubo, Kazuma Furutani, Atsuo Isobe, Masashi Fujita, Tomoaki Atsumi, Yoshinori Ando, Tsutomu Murakawa, Kiyoshi Kato, Masahiro Fujita, Shunpei Yamazaki	A 48 MHz 880-nW Standby Power Normally-Off MCU with 1 Clock Full Backup and 4.69-μs Wakeup Featuring 60-nm Crystalline In-Ga-Zn Oxide BEOL-FETs.	VLSI Circuits	2019	DBLP DOI BibTeX RDF
22	Ren Li, Reem Alhadrami, Hossein Fariborzi	BEOL NEM Relay Based Sequential Logic Circuits.	ISCAS	2019	DBLP DOI BibTeX RDF
22	Weijie Wang, Victor Yi-Qian Zhuo, Zhixian Chen, Hock Koon Lee, Minghua Li, Wendong Song	Enabling Neuromorphic Computing: BEOL Integration of CMOS RRAM Chip and Programmable Performance.	SoCC	2019	DBLP DOI BibTeX RDF
22	Shaoyi Peng, Han Zhou 0002, Taeyoung Kim 0001, Hai-Bao Chen, Sheldon X.-D. Tan	Physics-Based Compact TDDB Models for Low-k BEOL Copper Interconnects With Time-Varying Voltage Stressing.	IEEE Trans. Very Large Scale Integr. Syst.	2018	DBLP DOI BibTeX RDF
22	Samuel N. Pagliarini, Mehmet Meric Isgenc, Mayler G. A. Martins, Lawrence T. Pileggi	Application and Product-Volume-Specific Customization of BEOL Metal Pitch.	IEEE Trans. Very Large Scale Integr. Syst.	2018	DBLP DOI BibTeX RDF
22	Satwik Patnaik, Mohammed Ashraf, Johann Knechtel, Ozgur Sinanoglu	Raise Your Game for Split Manufacturing: Restoring the True Functionality Through BEOL.	CoRR	2018	DBLP BibTeX RDF
22	Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Zhijuan Wang	Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	Erik Bury, Ben Kaczer, Simon Van Beek, Dimitri Linten	Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations.	ESSDERC	2018	DBLP DOI BibTeX RDF
22	Jinglin Shi, A. Sidelnicov, Kok Wai J. Chew, Mei See Chin, C. Schippel, J. M. M. dos Santos, Frank Schlaphof, Lutz Meinshausen, John R. Long, David L. Harame	Evolution and Optimization of BEOL MOM Capacitors Across Advanced CMOS Nodes.	ESSDERC	2018	DBLP DOI BibTeX RDF
22	Ren Li, Hossein Fariborzi	Ultra-Low Power Data Converters with BEOL NEM Relays.	MWSCAS	2018	DBLP DOI BibTeX RDF
22	Yi Ching Ong, Shou-Chung Lee, A. S. Oates	Percolation defect nucleation and growth as a description of the statistics of electrical breakdown for gate, MOL and BEOL dielectrics.	IRPS	2018	DBLP DOI BibTeX RDF
22	Seungman Choi, Cathryn Christiansen, Linjun Cao, James Zhang, Ronald Filippi, Tian Shen, Kong Boon Yeap, Sean P. Ogden, Haojun Zhang, Bianzhu Fu, Patrick Justison	Effect of metal line width on electromigration of BEOL Cu interconnects.	IRPS	2018	DBLP DOI BibTeX RDF
22	Chen Wu, O. Varela Pedreira, Alicja Lesniewska, Yunlong Li, Ivan Ciofi, Zsolt Tökei, Kris Croes	Insights into metal drift induced failure in MOL and BEOL.	IRPS	2018	DBLP DOI BibTeX RDF
22	Deniz Kocaay, Philippe Roussel, Kristof Croes, Ivan Ciofi, Alicja Lesniewska, Ingrid De Wolf	Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing.	IRPS	2018	DBLP DOI BibTeX RDF
22	Ernest Y. Wu, Andrew Kim, Baozhen Li, James H. Stathis	Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications.	IRPS	2018	DBLP DOI BibTeX RDF
22	Pin-Shiang Chen, Shou-Chung Lee, A. S. Oates, Chee Wee Liu	BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown.	IRPS	2018	DBLP DOI BibTeX RDF