Search results for "Scan"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
153	Kwang-Ting Cheng	Partial scan designs without using a separate scan clock.	VTS	1995	DBLP DOI BibTeX RDF	flip-flop selection method, flip-flop test generation method, scan registers ordering, scan-shifting concept, test vector compaction, delay fault detection, cycle breaking, logic testing, delays, timing, design for testability, logic design, automatic testing, DFT, fault coverage, flip-flops, circuit optimisation, boundary scan testing, scan chain, combinatorial optimization problem, test generation algorithm, partial scan designs, system clock
123	Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen	Peak-power reduction for multiple-scan circuits during test application.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	peak-power reduction, multiple scan chain based circuits, peak periodicity, peak width, power waveforms, scan-based circuits, delay buffers, interleaving scan technique, data output, logic testing, logic testing, delays, integrated circuit testing, application specific integrated circuits, SOC, boundary scan testing
116	Yu Huang 0005, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li	Survey of Scan Chain Diagnosis.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF
106	Abhijit Jas, Bahram Pouya, Nur A. Touba	Virtual Scan Chains: A Means for Reducing Scan Length in Cores.	VTS	2000	DBLP DOI BibTeX RDF	Compression/Decompression, Virtual Scan, Built-In Self-Test, Mapping, Design-for-Testability, LFSR, System Integrator, Integrated Circuits, Integrated Circuits, Scan Chains, Embedded Cores, Digital Testing, Reseeding
102	Kuen-Jong Lee, Tsung-Chu Huang	An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	multiple scan chains, interleaving scan, test power reduction, peak power reduction
101	Xijiang Lin, Yu Huang 0005	Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Scan shift, Low power test, Scan test, Signal probability
101	Chih-Chang Lin, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Kuang-Chien Chen	Cost-free scan: a low-overhead scan path design methodology.	ICCAD	1995	DBLP DOI BibTeX RDF	Testing, DFT, Scan design
96	Dong Xiang, Mingjing Chen, Hideo Fujiwara	Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	Random testability, scan enable signal, weighted random testing, scan-based BIST
96	Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita	Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	scan tree, logic testing, design for testability, sequential circuit
92	Robert B. Norwood, Edward J. McCluskey	Synthesis-for-scan and scan chain ordering.	VTS	1996	DBLP DOI BibTeX RDF	synthesis-for-scan procedure, scan chain ordering, testable circuit design, beneficial scan, VLSI, logic testing, integrated circuit testing, design for testability, logic design, sequential circuits, logic synthesis, flip-flops, integrated circuit design, integrated logic circuits, test strategy, boundary scan testing, functional specifications
90	Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Tien-Chien Lee, Kuang-Chien Chen	Cost-free scan: a low-overhead scan path design.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1998	DBLP DOI BibTeX RDF
87	Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita	Partial scan design and test sequence generation based on reduced scan shift method.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	partial scan circuit, short test sequence, reduced scan shift, scan design, test sequence generation
86	Subhrajit Bhattacharya, Sujit Dey	H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads.	VTS	1996	DBLP DOI BibTeX RDF	H-SCAN, parallel register connectivity, on-chip response, sequential test vectors, combinational test vectors, combinational ATPG program, RT-level design, integrated circuit testing, design for testability, automatic testing, fault simulation, fault coverage, test pattern generation, comparator, boundary scan testing, test application time, high-level design, area overhead, testing methodology
85	Nilabha Dev, Sandeep Bhatia, Subhasish Mukherjee, Sue Genova, Vinayak Kadam	A Partitioning Based Physical Scan Chain Allocation Algorithm that Minimizes Voltage Domain Crossings.	VLSI Design	2008	DBLP DOI BibTeX RDF
85	Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy	Multiple Scan Tree Design with Test Vector Modification.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
85	Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy	On reducing test application time for scan circuits using limited scan operations and transfer sequences.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
85	Dong Xiang, Kaiwei Li, Hideo Fujiwara	Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
85	Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita	Reducing Scan Shifts Using Folding Scan Trees.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
84	Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu	A cost-effective scan architecture for scan testing with non-scan test power and test application cost.	DAC	2003	DBLP DOI BibTeX RDF
83	Irith Pomeranz, Sudhakar M. Reddy	Reducing test application time for full scan circuits by the addition of transfer sequences.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	transfer sequences, primary input vectors, scan-in operation, scan-out operation, static compaction procedure, compaction levels, fault diagnosis, logic testing, design for testability, fault detection, automatic testing, boundary scan testing, test set, test application time, full scan circuits
80	Dong Xiang, Mingjing Chen, Jia-Guang Sun	Scan BIST with biased scan test signals.	Sci. China Ser. F Inf. Sci.	2008	DBLP DOI BibTeX RDF	random testability, test signal, biased random testing, scan-based BIST
80	Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara	Improving test effectiveness of scan-based BIST by scan chain partitioning.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
80	Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita	On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure.	DELTA	2004	DBLP DOI BibTeX RDF
80	Irith Pomeranz, Sudhakar M. Reddy	On the Coverage of Delay Faults in Scan Designs with Multiple Scan Chains.	ICCD	2002	DBLP DOI BibTeX RDF
78	Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda	Scan insertion criteria for low design impact.	VTS	1996	DBLP DOI BibTeX RDF	scan insertion criteria, design impact, flip-flop ordering, capacitance constraints, layout information, Italtel Design Environment, logic testing, integrated circuit testing, sequential circuits, automatic testing, application specific integrated circuits, logic CAD, flip-flops, integrated circuit design, power dissipation, partial scan, design flow, boundary scan testing, scan chain, capacitance, full scan
76	Ozgur Sinanoglu	Low Cost Scan Test by Test Correlation Utilization.	J. Comput. Sci. Technol.	2007	DBLP DOI BibTeX RDF	test correlation, scan architecture design, test data compression, scan-based testing
76	Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-Sadowska, Mike Tien-Chien Lee	Functional Scan Chain Testing.	DATE	1998	DBLP DOI BibTeX RDF	functional scan chain, alternating sequence, scan chain testing, design for testability, test point insertion
76	Dong Xiang, Kaiwei Li, Jiaguang Sun, Hideo Fujiwara	Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	Scan forest, test application cost, test data volume, test power
76	Nur A. Touba, Edward J. McCluskey	Applying two-pattern tests using scan-mapping.	VTS	1996	DBLP DOI BibTeX RDF	scan-mapping, combinational mapping logic, logic testing, built-in self test, built-in self-testing, fault coverage, delay faults, pseudo-random testing, deterministic testing, two-pattern tests
75	Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack	An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.	DFT	2006	DBLP DOI BibTeX RDF
75	Abhijit Jas, Bahram Pouya, Nur A. Touba	Test data compression technique for embedded cores using virtual scan chains.	IEEE Trans. Very Large Scale Integr. Syst.	2004	DBLP DOI BibTeX RDF
75	Irith Pomeranz	Reducing test-data volume using P-testable scan chains in circuits with multiple scan chains.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
73	Hao Zheng, Kewal K. Saluja, Rajiv Jain	Test application time reduction for scan based sequential circuits.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	scan based sequential circuits, single clock configuration, nonscan flip-flops, test vector length, nonatomic two-clock scan method, test generation environment, logic testing, sequential circuits, flip-flops, clocks, partial scan, boundary scan testing, test application time
73	Sridhar Narayanan, Melvin A. Breuer	Asynchronous multiple scan chain.	VTS	1995	DBLP DOI BibTeX RDF	asynchronous multiple scan chains, scan flip-flops, control complexity, I/O pin count, DFT method, logic IC, logic testing, integrated circuit testing, design for testability, logic design, asynchronous circuits, flip-flops, integrated logic circuits, scan designs, boundary scan testing, test application time
72	Seiken Yano	Unified scan design with scannable memory arrays.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	unified scan design, scannable memory arrays, single scan path, scan operation time, scannable register file, fault diagnosis, design for testability, design-for-testability, automatic testing, logic CAD, flip-flops, flip-flops, arrays, shift registers, integrated memory circuits
71	Ozgur Sinanoglu	Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Test power reduction, Scan power reduction, Serial transformations, Scan chain modification, Design for testability, Core-based testing
71	Elizabeth M. Rudnick, Janak H. Patel	A genetic approach to test application time reduction for full scan and partial scan circuits.	VLSI Design	1995	DBLP DOI BibTeX RDF	partial scan circuits, design-for-testability techniques, compact test set generation, genetic algorithms, genetic algorithms, logic testing, design for testability, logic design, sequential circuits, combinational circuits, DFT, flip-flops, test application time reduction, full scan circuits
71	Xiaoxia Wu, Paul Falkenstern, Krishnendu Chakrabarty, Yuan Xie 0001	Scan-chain design and optimization for three-dimensional integrated circuits.	ACM J. Emerg. Technol. Comput. Syst.	2009	DBLP DOI BibTeX RDF	scan-chain design, genetic algorithm, integer linear programming, randomized rounding, LP relaxation, 3D ICs
71	Min Gyung Kang, Juan Caballero, Dawn Xiaodong Song	Distributed Evasive Scan Techniques and Countermeasures.	DIMVA	2007	DBLP DOI BibTeX RDF	scan detection, distributed scanning, information-hiding, evasion
70	Zhen Chen, Dong Xiang, Boxue Yin	A power-effective scan architecture using scan flip-flops clustering and post-generation filling.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	test, low power, design for test, scan design
70	Hideo Fujiwara, Akihiro Yamamoto	Parity-scan design to reduce the cost of test application.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
70	Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia	VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips.	VTS	2007	DBLP DOI BibTeX RDF	scan-based DFT, security, detection probability, low overhead, cryptographic hardware
70	Dong Xiang, Ming-Jing Chen, Kaiwei Li, Yu-Liang Wu	Scan-Based BIST Using an Improved Scan Forest Architecture.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
70	Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara	Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
69	Irith Pomeranz, Sudhakar M. Reddy	Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
67	Seongmoon Wang, Wenlong Wei	A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture.	ASP-DAC	2007	DBLP DOI BibTeX RDF	peak current reduction, average power dissipation, clock tree construction, special scan cells, scan chain reordering, ATPG, scan designs
67	Kee Sup Kim, Charles R. Kime	Partial scan flip-flop selection by use of empirical testability.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	scan flip-flop selection, serial scan, design for testability, testability, partial scan
67	Samantha Edirisooriya, Geetani Edirisooriya	Diagnosis of scan path failures.	VTS	1995	DBLP DOI BibTeX RDF	scan path failures, scan based diagnostic schemes, faulty circuits, logic circuitry, scan chain fault diagnosis, fault diagnosis, logic testing, integrated circuit testing, design for testability, combinational circuits, integrated logic circuits
66	Yong-sheng Cheng, Zhiqiang You, Jishun Kuang	Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction.	DELTA	2008	DBLP DOI BibTeX RDF	full scan testing, scan tree, routing complexity, test response data volume, design-for-testability
66	Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita	Test sequence compaction by reduced scan shift and retiming.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	reduced scan shift, full scan designed circuits, computational complexity, logic testing, timing, transformation, design for testability, sequential circuits, sequential circuit, logic CAD, flip-flops, flip-flops, retiming, computing time, test length, test sequence generation, test sequence compaction
66	Prab Varma, Tushar Gheewala	The economics of scan-path design for testability.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	state retention problem, Design for testability, scan, partial scan, test economics, life-cycle costs
66	Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang 0001	An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.	VTS	2008	DBLP DOI BibTeX RDF	Scan chain based test, Diagnosis, Symbolic Simulation
65	Dong Xiang, Ming-Jing Chen, Hideo Fujiwara	Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF	Test signal, random testability, weighted random testing, scan-based BIST
65	Wei Li 0023, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy	Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage.	VLSI Design	2005	DBLP DOI BibTeX RDF
65	Michael Cogswell, Shazia Mardhani, Kevin Melocco, Hina Arora	A Structured Graphical Tool for Analyzing Boundary Scan Violations.	ITC	2002	DBLP DOI BibTeX RDF
65	Soo Young Lee, Kewal K. Saluja	Test application time reduction for sequential circuits with scan.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
65	Irith Pomeranz, Sudhakar M. Reddy	Autoscan-Invert: An Improved Scan Design without External Scan Inputs or Outputs.	VTS	2007	DBLP DOI BibTeX RDF
65	Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li 0036, Krishnendu Chakrabarty	Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation.	ASP-DAC	2005	DBLP DOI BibTeX RDF
65	Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki	Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumption in Scan Test.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
65	Ozgur Sinanoglu, Alex Orailoglu	Modeling Scan Chain Modifications For Scan-in Test Power Minimization.	ITC	2003	DBLP DOI BibTeX RDF
64	Nicola Nicolici, Bashir M. Al-Hashimi	Scan Latch Partitioning into Multiple Scan Chains for Power Minimization in Full Scan Sequential Circuits.	DATE	2000	DBLP DOI BibTeX RDF
61	Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, Katherine Shu-Min Li	Layout-aware scan chain reorder for launch-off-shift transition test coverage.	ACM Trans. Design Autom. Electr. Syst.	2008	DBLP DOI BibTeX RDF	scan chain ordering, test generation, transition faults, Scan test
61	Yannick Bonhomme, Patrick Girard 0001, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch	Power-Driven Routing-Constrained Scan Chain Design.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	scan chain design, DfT, low power testing, scan testing
61	Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier	Enhanced Reduced Pin-Count Test for Full-Scan Design.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	reduced pin-count test, core test, design for testability, ATE, boundary-scan test, scan test
61	Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic	Securing Designs against Scan-Based Side-Channel Attacks.	IEEE Trans. Dependable Secur. Comput.	2007	DBLP DOI BibTeX RDF	Security and Privacy Protection, Scan-Based Design, Secure Design, Reliability and Testing
61	Lanjia Wang, Hai-Xin Duan, Xing Li 0001	Port Scan Behavior Diagnosis by Clustering.	ICICS	2005	DBLP DOI BibTeX RDF	port scan detection, clustering, network security
61	Bo Yang 0010, Kaijie Wu 0001, Ramesh Karri	Secure scan: a design-for-test architecture for crypto chips.	DAC	2005	DBLP DOI BibTeX RDF	crypto hardware, scan-based DFT, security, testability
61	Xiaodong Zhang 0010, Kaushik Roy 0001	Power Reduction in Test-Per-Scan BIST.	IOLTW	2000	DBLP DOI BibTeX RDF	Test-per-scan, Low Power BIST, Testing, Low Power, BIST, Weighted Random Pattern
61	Jayabrata Ghosh-Dastidar, Nur A. Touba	A Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains.	VTS	2000	DBLP DOI BibTeX RDF	built-in self-test Scan Chains, Design-for-Diagnosis, Multi-Input Signature Register, Design-for-Testability, LFSR, Integrated Circuits, Integrated Circuits, Digital Testing, Design-for-Debug
61	Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik	Integration of partial scan and built-in self-test.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	test points, built-in self-test, design for testability, partial scan
60	Yu-Ze Wu, Mango Chia-Tso Chao	Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes.	VTS	2008	DBLP DOI BibTeX RDF	signal transitions, correlation, reordering, scan-chain
60	Xiaoxia Wu, Paul Falkenstern, Yuan Xie 0001	Scan chain design for three-dimensional integrated circuits (3D ICs).	ICCD	2007	DBLP DOI BibTeX RDF
60	Hadi Esmaeilzadeh, Saeed Shamshiri, Pooya Saeedi, Zainalabedin Navabi	ISC: Reconfigurable Scan-Cell Architecture for Low Power Testing.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
60	Nisar Ahmed, Mohammad Tehranipoor	Improving Transition Delay Fault Coverage Using Hybrid Scan-Based Technique.	DFT	2005	DBLP DOI BibTeX RDF
60	Irith Pomeranz, Sudhakar M. Reddy	Autoscan: a scan design without external scan inputs or outputs.	IEEE Trans. Very Large Scale Integr. Syst.	2005	DBLP DOI BibTeX RDF
60	Shih Ping Lin 0001, Chung-Len Lee 0001, Jwu E. Chen	A Scan Matrix Design for Low Power Scan-Based Test.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
60	Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Kaushik Roy 0001	Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning.	ISQED	2005	DBLP DOI BibTeX RDF
60	Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nicolici	Scan architecture with mutually exclusive scan segment activation for shift- and capture-power reduction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
60	Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar	Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets.	DATE	2004	DBLP DOI BibTeX RDF
60	Irith Pomeranz	Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains.	ITC	2003	DBLP DOI BibTeX RDF
60	Sandeep Bhatia, Niraj K. Jha	Synthesis for parallel scan: applications to partial scan and robust path-delay fault testability.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
56	Roberto Bevacqua, Luca Guerrazzi, Franco Fummi	SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation.	EUROMICRO	1996	DBLP DOI BibTeX RDF	test storage, scan-path techniques, Built-In Self Test, design for testability, Design for Testability, BIST, test pattern generation, SCAN, test sequences
56	Hardy J. Pottinger, Chien-Yuh Lin	Using a reconfigurable field programmable gate array to demonstrate boundary scan with built in self test.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	student experiments, educational aids, reconfigurable FPGA, XC4000 Logic Cell Array Family, IEEE Standard 1149.1, XC4003PC84-6, field programmable gate arrays, field programmable gate array, logic testing, built-in self test, built-in self-test, computer science education, integrated circuit testing, design for testability, logic design, BIST, teaching, fault simulation, integrated circuit design, boundary scan, demonstration, boundary scan testing, Xilinx, electronic engineering education
56	Arun Balakrishnan, Srimat T. Chakradhar	Partial scan design for technology mapped circuits.	VLSI Design	1995	DBLP DOI BibTeX RDF	technology mapped circuits, scan flip-flops selection, multiple memory elements, library block, integer linear program formulation, production VLSI circuits, VLSI, graph theory, linear programming, design for testability, integer programming, logic design, logic CAD, VLSI design, flip-flops, integrated circuit design, circuit CAD, integrated logic circuits, functional specifications, partial scan design
56	Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos	Efficient partial scan cell gating for low-power scan-based testing.	ACM Trans. Design Autom. Electr. Syst.	2009	DBLP DOI BibTeX RDF	partial gating, scan cell gating, Low-power testing, scan-based testing
56	Lifeng He, Yuyan Chao, Kenji Suzuki 0001, Hidenori Itoh	A Run-Based One-Scan Labeling Algorithm.	ICIAR	2009	DBLP DOI BibTeX RDF	label equivalence, raster scan, connected component, run-length encoding, Labeling algorithm
56	Hong-Sik Kim, Sungho Kang 0001, Michael S. Hsiao	A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Keyword System on a chip, Test compression, Low power testing, Scan testing
56	Fan Yang 0060, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz	On the Detectability of Scan Chain Internal Faults - An Industrial Case Study.	VTS	2008	DBLP DOI BibTeX RDF	Faults in scan cells, stuck-at and stuck-on faults
56	Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding	Scan chain clustering for test power reduction.	DAC	2008	DBLP DOI BibTeX RDF	test, low power, design for test, scan design
56	Wei-Lun Wang, Kuen-Jong Lee	An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment.	J. Electron. Test.	2002	DBLP DOI BibTeX RDF	mixed-mode pattern generation, built-in self-test, power consumption, test application time, scan chain
56	Sandeep Bhatia, Prab Varma	Test Compaction in a Parallel Access Scan Environment.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	Test Vector Compaction, Design for Testability, Scan
56	Sándor P. Fekete, Joseph S. B. Mitchell, Christiane Schmidt 0001	Minimum Covering with Travel Cost.	ISAAC	2009	DBLP DOI BibTeX RDF
56	Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang	Broadcasting test patterns to multiple circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
55	Zhen Chen, Boxue Yin, Dong Xiang	Conflict driven scan chain configuration for high transition fault coverage and low test power.	ASP-DAC	2009	DBLP DOI BibTeX RDF
55	Fei Wang, Yu Hu 0001, Huawei Li 0001, Xiaowei Li 0001	A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults.	ASP-DAC	2008	DBLP DOI BibTeX RDF
55	Xiaoding Chen, Michael S. Hsiao	An Overlapping Scan Architecture for Reducing Both Test Time and Test Power by Pipelining Fault Detection.	IEEE Trans. Very Large Scale Integr. Syst.	2007	DBLP DOI BibTeX RDF
55	Li Zhang 0006, Wen Gao 0001, Qiang Wang 0011, Debin Zhao	Macroblock-Level Adaptive Scan Scheme for Discrete Cosine Transform Coefficients.	ISCAS	2007	DBLP DOI BibTeX RDF
55	Irith Pomeranz, Sudhakar M. Reddy	Improved n-Detection Test Sequences Under Transparent Scan.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
55	Yu Huang 0005, Keith Gallie	Diagnosis of defects on scan enable and clock trees.	DATE	2006	DBLP DOI BibTeX RDF
55	Minsik Cho, David Z. Pan	PEAKASO: Peak-Temperature Aware Scan-Vector Optimization.	VTS	2006	DBLP DOI BibTeX RDF